keysight technologies multiport and multi-site test optimization techniques · 2015-06-04 · page...
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Keysight Technologies Multiport and Multi-Site Test Optimization Techniques
June 2015
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Today’s Presenter
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• Graduate of Oregon State University
with an MSEE
• Ph.D. from Leeds University
• Keysight Technologies (formerly Agilent
and Hewlett-Packard)
• One of only five Keysight Fellows
• Senior R&D engineer in the Component
Test Division
• Principle contributor to the HP 8753
and PNA VNA family
• He has received 25 patents related to
this work
• Author or the “Handbook of Microwave
Component Measurements”
Dr. Joel Dunsmore Keysight Fellow
Component Test Division R&D
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Agenda
– Introduction
– Optimizing Multiport Testing
• Types of Multiport Solutions
• Comparing Multiport Solutions
• Multiport Calibration
– Multi-Site Techniques for Improving Throughput
• Hardware Considerations and Limitations
• Accelerating Multiport Testing
• Multi-Display / Multi-User
– Summary
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Industry Trends
• Multiple functions integrated into a single component
• Increasing need to drive down costs while increasing throughput
• Multiport testing without sacrificing accuracy
Markets Wireless Aerospace & Defense
Segments High-volume manufacturing test Maintenance, depot-level testing
Applications Handset
component test
Device Test Cellular ATE Systems MilCom
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Defining Multiport and Multi-Site
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Key Features
• Simultaneous measurement of
different DUTs
• Parallel testing for higher
throughput
Multi-Site Testing
DUT #1 DUT #2
DUT #3
Key Features
• Greater than 4 ports
• Single connection to device-
under-test (DUT)
Multiport Testing
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Agenda
– Introduction
– Optimizing Multiport Testing
• Types of Multiport Solutions
• Comparing Multiport Solutions
• Multiport Calibration
– Multi-Site Techniques for Improving Throughput
• Hardware Considerations and Limitations
• Accelerating Multiport Testing
• Multi-Display / Multi-User
– Summary
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Types of Multiport Solutions
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Simple Switching Test Sets
Simple Switching
Block Diagram Features
• VNA Signals distributed via RF
switches in an external switch
matrix.
• Sequential 2-port measurements
with VNA receivers.
• Either solid-state switches or
electro-mechanical switches
• Low-cost multiport solution
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Types of Multiport Solutions
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Full Crossbar Switching Test Sets
Full Crossbar
Block Diagram Features
• Similar to simple switching test
set except:
o Any 2 ports on DUT may be
tested
o Full 2 x N port error
correction
o Unused ports must be
terminated
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Types of Multiport Solutions
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Extension Test Sets
Extension Test Set
Block Diagram Features
• Directional coupler on every port
• Only Source and receiver
switching
• Full N x N port error correction
• Better stability and performance
• Switches still impact dynamic
range
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Keysight M937xA PXIe VNA
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Drive Down the Size of Test
2-port VNA in one slot
32-port Configuration
Features
• Full 2-port VNA in one PXI slot.
• World’s fastest PXI VNA
• 300 kHz up to 26.5 GHz
• Same measurement science as
the trusted PNA/ENA
• Up to 16 VNA modules in a single
chassis for up to 32-port fully
corrected multiport measurements
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Types of Multiport Solutions
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True Multiport w/ PXI VNA
True Multiport
Block Diagram Features
• Synchronized signals distributed
and captured with multiple
receivers.
• Simultaneous measurements
using multiple VNA receivers.
• No degradation in performance
as external switching not
required Port 1
R1
A
Port 2
R2
B
Source
Port 3
R1
A
Port 4
R2
B
Port 5
R1
A
Port 6
R2
B
…
Synchronized
Module #1 Module #2 Module #3
Synchronized
Source Source
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Example 6-Port Measurement of 2x4 Way Splitter
Keysight
Confidential 12
Isolation depends on good match on all ports
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Flexible, Scalable, Re-Configurable
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What You Need, Where You Need It
• Increase the number of
test ports or frequency
anytime you need
• Easily reconfigure your
test environment
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Flexible, Scalable, Re-Configurable
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No need to reboot or reconnect to re-configure.
Just select the
number of
modules you want
to use.
Multiport modules
have to be in
sequential slots.
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Comparing Multiport Solutions
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Number of Measurement Sweeps for 8-Port DUT
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Comparing Multiport Solutions
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Number of Measurement Sweeps
Improve throughput by reducing the number of required sweeps
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Comparing Multiport Solutions
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Dynamic Range
20-dB wider dynamic range allows for a 100-times faster speed
(with 100-times wider IFBW) for the same measurement result
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Comparing Multiport Solutions
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Temperature Stability
Good stability may reduce or eliminate the need for periodic recalibration;
total measurement time can be dramatically reduced.
Switched test set based VNA True Multiport VNA
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Multiport Calibration
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Calibration Can be Time Consuming & Confusing
# of Paths = (𝑁−1)(𝑁)
2
Electronic Calibration (ECal)
Mechanical Calibration
Where N = # of
DUT ports
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Multiport Calibration
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ECal Simplifies Calibration – 10-Port Example
4-Port ECal
Connection: 4
Disconnection: 3
Connection: 3
Disconnection: 3
Connection: 3
Disconnection: 4
Total of 10x connections & disconnections of test cables
2-Port ECal
Connection: 2
Disconnection: 1
Connection: 1
Disconnection: 6
Connection: 6
Disconnection: 2
Disconnection: 1
Connection: 1
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Multiport Calibration
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Combining ECal with a Switch Matrix
• ECal characterized at the test ports
• Single connection calibration (but
with same # connects/disconnects)
• Adding switches creates similar
issues as switching test sets:
o Degraded performance at
higher frequencies
o Potential stability issues
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QSOLT Cal Reduces Reflection Cal Steps
– Makes mechanical calibration kits very easy to use (e.g. waveguide,
specialized connectors like blind mate).
– Your cal kit needs to have a known-thru defined to mate all the ports
to 1 port.
– Very simple to add a female-female thru to a cal kit if all the test
ports have male connectors.
– Just do a 1-port cal at port 1
– Then known-thrus from port 1 to each other port.
– That’s it!
Keysight
Confidential 22
One 1-port and N-1 Thru steps
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Agenda
– Introduction
– Optimizing Multiport Testing
• Types of Multiport Solutions
• Comparing Multiport Solutions
• Multiport Calibration
– Multi-Site Techniques for Improving Throughput
• Hardware Considerations and Limitations
• Accelerating Multiport Testing
• Multi-Display / Multi-User
– Summary
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Multi-Site Techniques for Improving Throughput
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Who Uses Multi-Site?
Application Examples
• High-volume manufacturing of
passive components
• SAW devices for mobile
handsets
• General-purpose components
(antennas, filters, cables, etc.)
• Full automated test equipment
(ATE)
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Multi-Site Parallel Testing Capability
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2-Port, 4-Port and Multiport
Key Features
• Simultaneous measurement of
multiple DUTs
• Configure multiple independent
VNAs in a single PXI chassis
• Each VNA can be 2 or more ports
• Synchronous or asynchronous
triggering
DUT
#1
DUT
#2
DUT
#3
DUT
#4
DUT
#1
DUT
#2 DUT
#3
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Hardware Considerations and Limitations
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• PXI Chassis – Each PXI VNA module
requires either hybrid or PXIe slot
• Controller – Embedded or external
not a bottleneck issue
• CPU / # of Cores – Depending on IF
bandwidth, this can become the
limiting throughput factor (next slide)
• Backplane Speed – Typicals of 4
GB/s easily handle the 100’s of MB/s
for VNA measurements
• Memory – Typically not a limitation
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Hardware Considerations and Limitations
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# of Cores vs. VNAs – Affect Depends on IFBW
Dual Core CPU, 100 kHz IFBW Dual Core CPU, 1 kHz IFBW
Quad Core CPU, 100 kHz IFBW Quad Core CPU, 1 kHz IFBW
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Accelerating Multiport Testing
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Example Multi-Site Application
S21
Sweep
PXI VNA (M937xA)
VNA with Switch Matrix
S21 Sweep
S43
Sweep
S65
Sweep
Switching
S43 Sweep
S65 Sweep
#1 #2
#3
6-port DUT
S21 S43
S65
Time
Multi-Site Operation with PXI VNA Cycle Time Comparison
Multi-site testing provides simultaneous sweeps of different measurement
paths (i.e. high-band & low-band) of multiport components
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Multi-Display / Multi-User
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Example Multi-Site Application
Key Features
• One controller, multi-site VNAs,
multiple test operators
• Configure multiple independent
VNAs in a single PXI chassis
• Example application: filter tuning
manufacturing
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Multi-Display / Multi-User
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Example Hardware Configuration
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Multi-Display / Multi-User
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Typical Microsoft Windows Multi-Display Setup
Setup Multiple Displays on Computer
Assign VNAs to
Displays
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Multi-Display / Multi-User
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Typical Microsoft Windows Limitations
Create Macros to Minimize
Operator / PC Interaction
Only One Click or Touch at a Time
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Summary
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• Keysight offers a broad range of multiport solutions that accurately
test your products while enabling you to drive down your costs and
increase throughput
• New multi-site capabilities and techniques further increase efficient
use of capital resources and test personnel
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For More Information
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www.keysight.com/find/pxivna
Available Literature
Multiport and Multi-site Test Optimization
Techniques Application Note 5992-0681EN
PXI VNA Brochure 5992-0098EN
PXI VNA Data Sheet M9370-90002
Multi-site
Installation & Demo
Multiport
PXI VNA Overview
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