k-shell jump ratios and jump factors for platinum and lead

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  • 7/22/2019 K-SHELL JUMP RATIOS AND JUMP FACTORS FOR PLATINUM AND LEAD

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    MEASUREMENT OF K-SHELL JUMP RATIOS AND JUMP FACTORS

    FOR PLATINUM AND LEAD BY USING 2-GEOMETRICAL

    CONFIGURATION AND A WEAK GAMMA SOURCE

    L. Francis Maria Anand, S. B. Gudennavar*

    and S. G. Bubbly

    Department of Physics, Christ University, Bangalore-560 029, Karantaka.

    * Correspondence: [email protected]

    Abstract - ISBN 978-93-81104-23-1 NSNMRN-2012 (SEP 12-14) -

    OOTY

    The article presents a simple method of measuring K- shell absorption jump ratios and jump factors for elementsand compounds in the field of x-ray spectroscopy. The K- shell jump ratios and jump factors for Platinum and

    Lead are measured by adopting 2-geometrical configuration and a weak gamma source. The K x-ray photonsare excited in the targets using 123.6 keV weighted average energy gamma photons from a weak 57Co

    radioactive source and the fluorescent K x-ray photons are detected using low energy HPGe x-ray detector

    coupled to a 16k multichannel analyser. The total atomic attenuation cross section for the elements is measuredexperimentally from the incident and the transmitted spectra whereas the K x-ray intensity ratios from x-ray

    fluorescent spectrum. The total atomic scattering cross sections are calculated using WinXcom software. The K-

    shell jump factor and jump ratio are computed using the measured K x-ray intensity ratios and total atomicattenuation cross section, and the calculated K x-ray production cross section and total atomic scattering cross

    sections. The computed values of K- shell jump factor and jump ratio for platinum and lead are compared withthe theoretical values and others experimental data, and we found a good agreement between them. Thus, from

    the present study we conclude that our 2- geometrical configuration method with weak gamma source can be analternative simple method to measure various atomic parameters in the field of x-ray spectroscopy.

    Keywords:2-geometrical configuration, total atomic absorption cross section, intensity ratios, jump ratio, jump factor.

    1. Introduction

    K x-ray intensity ratios, the K-shellabsorption jump factors and rK, jump ratios

    are of great significance in the field of

    interaction of gamma-rays and x-rays with

    matter [1]. They too find applications in

    the other areas such as medical physics

    and material science [2]. Several

    researchers have adopted various methods

    to measure these parameters, namely; the

    gamma ray attenuation method [3], the

    Compton peak attenuation method [4-6],

    the energy dispersive x-ray fluorescencemethod (EDXRF) [7-9] and the

    bremsstrahlung transmission method [10].

    These methods have their own advantages

    and disadvantages. For example, the

    gamma ray attenuation method requires

    many monoenergetic gamma sources and

    thin foils of given element, while the

    EDXRF method requires strong

    radioactive sources of the order 100mCi or

    more. For details refer the research article

    by Bennal and Badiger [1]. In the presentwork, we measure these parameters for

    platinum and lead using a simple method

    proposed by Gudennavar et al. [11] to

    measure K x-ray fluorescence parameters,which employs a weak gamma source and

    a 2-geometrical configuration.

    2. Theory

    The total atomic attenuation cross section

    for gamma photons in a material target of

    thickness t is given by

    (1)where A is the atomic weight of the target

    element, N0 is the Avogadro number, I0 is

    intensity of incident gamma photons and Itis the transmitted intensity. The plot of tversus photon energy gives a saw-tooth

    curve around the binding energy of the K-

    shell of the target atom, which has three

    regions: a lower energy branch, a sudden

    increase in the K-shell binding energy and

    an upper energy branch. The lower energy

    branch corresponds to the total atomic

    photoelectric cross section due to L-, M-

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    and higher shells. The upper energy branch

    corresponds to the total atomic

    photoelectric cross section due to K-, L-,

    M- and higher shells. The sudden rise is

    essentially due to the onset of the K-shell

    photoelectric cross section. The ratio of theabsorption cross section at the upper

    energy branch and that at lower energy

    branch gives the K-shell jump ratio, rK, and

    is given by [12]

    (2)

    where t is the total absorption cross

    section and K, L, M are the photoelectric

    absorption cross sections for the K-, L-,M-shells respectively.

    The K-shell absorption jump factor, JK, is

    related to the K-shell jump ratio, rK, and is

    defined as the probability that an electron

    is ejected from the of K-shell of the target

    element other than any other shells,

    (3)

    It must be noted that the jump factors, JK,

    can also be determined if we measure the

    K x-ray parameters such as K x-ray

    fluorescence yield, K x-ray production

    cross section and K to K x-ray intensity

    ratio using the relation [7],

    (4)

    where K is K x-ray production cross

    section, t is the total atomic attenuationcross section, ts is the (coherent +

    incoherent) atomic scattering cross section,

    IK/IK is the intensity ratio of the K and

    K x-rays at photon energy E and K is the

    K-shell fluorescence yield of the target

    atom.

    The K x-ray intensity ratios are the ratios

    of the intensities of K to K. The ratio of

    the intensity of the characteristic x-ray of

    type i to type j is given by

    (5)

    where i = K and j = K, and are the

    measured K x-ray intensities of type i and j

    respectively, i and j are the efficiencies

    of the detector for the K x-ray of type i and

    j respectively, i and j are the self-

    absorption correction factors for the K x-

    ray of type i and type j respectively in the

    target material and are calculated using the

    eqn. (6), exp(-xiwtw) and exp(-xjwtw) are

    the window attenuation correction factors

    for the K x-ray of type i and j respectively;

    here xiw and xjw are the mass attenuation

    coefficients for the K x-ray of type i and jin the detector window of thickness tw.

    Taking into account the isotropic emission

    of K x-rays and the fact that we are

    measuring the intensity of x-ray photons

    emerging from the target in all the forward

    directions, that is, emitting into a solid

    angle of 2 sr., we use the correction

    factor without involving the scattering

    angles:

    )t())texp(-(-1

    ei

    ei

    +

    += (6)

    where i and e are the mass attenuation

    coefficients of the incident and emitted K

    x-ray photons respectively in the target and

    are computed using WinXcom software

    [13].

    The total number of K x-ray photons of

    given type (i = K and K) emitted from

    the target in all directions is given by

    )texp(

    I2I

    wxwx

    '

    i

    i

    = (7)

    where'

    iI is the measured intensity of K x-

    ray of type i.

    3. Experimental

    The Experimental setup adopted in the

    present investigation is shown in Fig. 1.

    The gamma photons of energy 123.6 keV,

    i.e. the weighted average of 122 and 136keV, from 57Co source (~104 Bq) are used

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    to produce the K x-rays in the target and

    these x-rays are detected with a HPGe

    detector (active area 500 mm2, 10 mm

    thickness, Be window of thickness 0.6

    mm) connected to a DSA-1000 (a built-in

    amplifier and 16k MCA). The energyresolution of the detector is 200 eV at 5.9

    keV and the efficiency is nearly 100% for

    3-500 keV. The spectrometer is calibrated

    using various gamma sources. The target

    materials are pure elements procured in the

    form of thin foils from Alfa Aesar A

    Johnson Matthey Company UK.

    Fig. 1. Experimental arrangement.

    3.1 Measurement of total atomic

    attenuation cross section

    The incident source spectrum (source plus

    background spectrum) was acquired for

    2400s by placing just the weak57Co source

    on the window of the detector. The

    intensity of 122 and 136 keV was carefully

    estimated from the background corrected

    source spectrum (Fig. 2) and the two

    together give I0. Now by sandwiching the

    respective target between the source and

    the detectors window, the transmittedspectrum (transmitted spectrum plus

    background) is obtained for the same

    interval of time (Fig. 3). The transmitted

    intensity It is estimated for the same 122

    and 136 keV photons from the the

    transmitted spectrum. Knowing I0 and It,

    the total atomic attenuation cross section tfor gamma photons of energy 123.6 keV in

    a target of thickness t is calculated using

    eqn. (1). The total atomic scattering cross

    section t is calculated using WinXcomsoftware [13].

    3.2 Measurement of K x-ray intensities

    By subtracting the source spectrum plus

    background from the transmitted

    Fig. 2. Source plus background spectrum

    Fig. 3. Transmitted spectrum plus

    background

    spectrum plus background, we get a clean

    fluorescence K x-ray spectrum that

    corresponds to the target element under

    investigation. The K x-ray fluorescence

    spectrum for platinum is shown in Fig. 4.

    The area under each peak gives'

    iI , the

    measured intensity of K x-ray of type i

    (where i = K and K); which is corrected

    for self-attenuation in the target ( factor),

    attenuation in the window and efficiency

    of the detector.

    The K x-ray production cross section for a

    given element is calculated using the

    relation,

    (8)

    where fK is the fractional emission rate

    and is given as, fK = (1+IK/IK)

    -1

    . The Kvalues are taken from Hubbell [14] and K

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    values at 123.6 keV are taken from

    Scofield [15].

    Fig. 4. K x-ray fluorescence spectrum of

    platinum

    4. Results, Discussion and conclusions

    The measured values of K x-ray intensity

    ratios, K shell jump ratios and jump

    factors determined for platinum and lead

    are presented in Table 1. These values are

    compared with the theoretical and others

    experimental values in the same table.

    Table 1. Measured values of K x-ray

    intensity ratios, jump ratios and jump

    factors for platinum and lead

    K XRF

    Parameters

    Platinum

    (Z = 78)

    Lead

    (Z = 82)

    K 0.9593 [14] 0.9634 [14]

    t (Exptl.) 991 1138

    t (Theor) 964 [16] 1120 [16]

    K using

    eqn (8)

    527.68 621.02

    IK/IK(Exptl)

    0.2700.005 0.2800.002

    IK/IK(Theor)

    0.263 [15] 0.270 [15]

    IK/IK(Others

    values) 0.259 [18]

    0.28220.007

    [19]

    0.2750.021

    [20]

    rK(Exptl.) 4.24 4.61

    rK(Theor) 4.95 [16] 4.74 [16]

    rK(Others

    values)

    4.63 [17] 5.11 [17]

    JK(Exptl.) 0.764 0.778

    JK(Theor) 0.798 [16] 0.789 [16]JK(Others 0.784 [17] 0.804 [17]

    values)

    From the table, we see that the measured

    values of K x-ray intensity ratios for

    platinum and lead agree well with

    theoretical and others values. While the

    measured values of K jump ratios and

    jump factors are systematically lower than

    the theoretical and others values. This

    may be due to the uncertainty in the

    estimation of t, which are systematically

    higher than the theoretical values.

    References

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    [2] Veigele W. M. J. 1973. At. Data Tables5,51.

    [3] Mallikarjuna M. L., Appaji Gowda S.B., Gowda R. and Umesh T. K. 2002.Radiat. Phys. Chem.65,217.

    [4] Ayala A. P. and Mainardi R. T. 1996.Radiat. Phys. Chem. 47,177.

    [5] Polat R., Orchan I. and Budak G.2004. Anal. Chem. Acta 505,307.

    [6] Budak G. and Polat R. 2004. J.Quant. Spectrosc. Radiat. Transfer88,525.

    [7] Ertugrul M., Karabulut A. and BudakG. 2002. Radiat. Phys. Chem. 64,1.

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    2003. Radiat. Meas. 37, 103-107.[9] Polat R., Budak G., Gurul A.,

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    [10] Nayak S. V. and Badiger N. M. 2006. J. Phys.

    B: At. Mol. Opt. Phys. 39, 2893-2900.[11] Gudennavar S. B., Badiger N. M.,

    Thontadarya S. R. and Hanumaih B. 2003.Radiat. Phys. Chem. 68, 721.

    [12] Tertian R. and Claisse F. 1982. CamelotPress, Southampton, UK, p.20.

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    [14] Hubbell J. H., 1989. NISTIR. 89.[15] Scofield J. H., 1973. Laboratory Report

    UCRL-51326.[16] Berger M. J., Hubbell J. H. and Seltzer S. M.,

    Chang J., Coursey J. S., Sukumar R. andZucker D. S., 2005. XCOM: Photon Cross

    Section Database (version 1.3). NationalInstitute of Standards and Technology,

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    [17] Kaya N., Apaydin G. and Tirasolu E., 2011.Radiat. Phys. Chem. 80, 677.

    [18] Cengiz E., Traolu E., Apaydn G., Aylikci

    V., Kp Aylikci N. and Aksoy C., 2011.Radiat. Phys. Chem. 80(3), 328.

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    [19] Ertural B., Apaydin G., Cevik U., ErturulM. and Kobya A. I., 2007. Radiat. Phys.

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