k-shell jump ratios and jump factors for platinum and lead
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MEASUREMENT OF K-SHELL JUMP RATIOS AND JUMP FACTORS
FOR PLATINUM AND LEAD BY USING 2-GEOMETRICAL
CONFIGURATION AND A WEAK GAMMA SOURCE
L. Francis Maria Anand, S. B. Gudennavar*
and S. G. Bubbly
Department of Physics, Christ University, Bangalore-560 029, Karantaka.
* Correspondence: [email protected]
Abstract - ISBN 978-93-81104-23-1 NSNMRN-2012 (SEP 12-14) -
OOTY
The article presents a simple method of measuring K- shell absorption jump ratios and jump factors for elementsand compounds in the field of x-ray spectroscopy. The K- shell jump ratios and jump factors for Platinum and
Lead are measured by adopting 2-geometrical configuration and a weak gamma source. The K x-ray photonsare excited in the targets using 123.6 keV weighted average energy gamma photons from a weak 57Co
radioactive source and the fluorescent K x-ray photons are detected using low energy HPGe x-ray detector
coupled to a 16k multichannel analyser. The total atomic attenuation cross section for the elements is measuredexperimentally from the incident and the transmitted spectra whereas the K x-ray intensity ratios from x-ray
fluorescent spectrum. The total atomic scattering cross sections are calculated using WinXcom software. The K-
shell jump factor and jump ratio are computed using the measured K x-ray intensity ratios and total atomicattenuation cross section, and the calculated K x-ray production cross section and total atomic scattering cross
sections. The computed values of K- shell jump factor and jump ratio for platinum and lead are compared withthe theoretical values and others experimental data, and we found a good agreement between them. Thus, from
the present study we conclude that our 2- geometrical configuration method with weak gamma source can be analternative simple method to measure various atomic parameters in the field of x-ray spectroscopy.
Keywords:2-geometrical configuration, total atomic absorption cross section, intensity ratios, jump ratio, jump factor.
1. Introduction
K x-ray intensity ratios, the K-shellabsorption jump factors and rK, jump ratios
are of great significance in the field of
interaction of gamma-rays and x-rays with
matter [1]. They too find applications in
the other areas such as medical physics
and material science [2]. Several
researchers have adopted various methods
to measure these parameters, namely; the
gamma ray attenuation method [3], the
Compton peak attenuation method [4-6],
the energy dispersive x-ray fluorescencemethod (EDXRF) [7-9] and the
bremsstrahlung transmission method [10].
These methods have their own advantages
and disadvantages. For example, the
gamma ray attenuation method requires
many monoenergetic gamma sources and
thin foils of given element, while the
EDXRF method requires strong
radioactive sources of the order 100mCi or
more. For details refer the research article
by Bennal and Badiger [1]. In the presentwork, we measure these parameters for
platinum and lead using a simple method
proposed by Gudennavar et al. [11] to
measure K x-ray fluorescence parameters,which employs a weak gamma source and
a 2-geometrical configuration.
2. Theory
The total atomic attenuation cross section
for gamma photons in a material target of
thickness t is given by
(1)where A is the atomic weight of the target
element, N0 is the Avogadro number, I0 is
intensity of incident gamma photons and Itis the transmitted intensity. The plot of tversus photon energy gives a saw-tooth
curve around the binding energy of the K-
shell of the target atom, which has three
regions: a lower energy branch, a sudden
increase in the K-shell binding energy and
an upper energy branch. The lower energy
branch corresponds to the total atomic
photoelectric cross section due to L-, M-
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and higher shells. The upper energy branch
corresponds to the total atomic
photoelectric cross section due to K-, L-,
M- and higher shells. The sudden rise is
essentially due to the onset of the K-shell
photoelectric cross section. The ratio of theabsorption cross section at the upper
energy branch and that at lower energy
branch gives the K-shell jump ratio, rK, and
is given by [12]
(2)
where t is the total absorption cross
section and K, L, M are the photoelectric
absorption cross sections for the K-, L-,M-shells respectively.
The K-shell absorption jump factor, JK, is
related to the K-shell jump ratio, rK, and is
defined as the probability that an electron
is ejected from the of K-shell of the target
element other than any other shells,
(3)
It must be noted that the jump factors, JK,
can also be determined if we measure the
K x-ray parameters such as K x-ray
fluorescence yield, K x-ray production
cross section and K to K x-ray intensity
ratio using the relation [7],
(4)
where K is K x-ray production cross
section, t is the total atomic attenuationcross section, ts is the (coherent +
incoherent) atomic scattering cross section,
IK/IK is the intensity ratio of the K and
K x-rays at photon energy E and K is the
K-shell fluorescence yield of the target
atom.
The K x-ray intensity ratios are the ratios
of the intensities of K to K. The ratio of
the intensity of the characteristic x-ray of
type i to type j is given by
(5)
where i = K and j = K, and are the
measured K x-ray intensities of type i and j
respectively, i and j are the efficiencies
of the detector for the K x-ray of type i and
j respectively, i and j are the self-
absorption correction factors for the K x-
ray of type i and type j respectively in the
target material and are calculated using the
eqn. (6), exp(-xiwtw) and exp(-xjwtw) are
the window attenuation correction factors
for the K x-ray of type i and j respectively;
here xiw and xjw are the mass attenuation
coefficients for the K x-ray of type i and jin the detector window of thickness tw.
Taking into account the isotropic emission
of K x-rays and the fact that we are
measuring the intensity of x-ray photons
emerging from the target in all the forward
directions, that is, emitting into a solid
angle of 2 sr., we use the correction
factor without involving the scattering
angles:
)t())texp(-(-1
ei
ei
+
+= (6)
where i and e are the mass attenuation
coefficients of the incident and emitted K
x-ray photons respectively in the target and
are computed using WinXcom software
[13].
The total number of K x-ray photons of
given type (i = K and K) emitted from
the target in all directions is given by
)texp(
I2I
wxwx
'
i
i
= (7)
where'
iI is the measured intensity of K x-
ray of type i.
3. Experimental
The Experimental setup adopted in the
present investigation is shown in Fig. 1.
The gamma photons of energy 123.6 keV,
i.e. the weighted average of 122 and 136keV, from 57Co source (~104 Bq) are used
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to produce the K x-rays in the target and
these x-rays are detected with a HPGe
detector (active area 500 mm2, 10 mm
thickness, Be window of thickness 0.6
mm) connected to a DSA-1000 (a built-in
amplifier and 16k MCA). The energyresolution of the detector is 200 eV at 5.9
keV and the efficiency is nearly 100% for
3-500 keV. The spectrometer is calibrated
using various gamma sources. The target
materials are pure elements procured in the
form of thin foils from Alfa Aesar A
Johnson Matthey Company UK.
Fig. 1. Experimental arrangement.
3.1 Measurement of total atomic
attenuation cross section
The incident source spectrum (source plus
background spectrum) was acquired for
2400s by placing just the weak57Co source
on the window of the detector. The
intensity of 122 and 136 keV was carefully
estimated from the background corrected
source spectrum (Fig. 2) and the two
together give I0. Now by sandwiching the
respective target between the source and
the detectors window, the transmittedspectrum (transmitted spectrum plus
background) is obtained for the same
interval of time (Fig. 3). The transmitted
intensity It is estimated for the same 122
and 136 keV photons from the the
transmitted spectrum. Knowing I0 and It,
the total atomic attenuation cross section tfor gamma photons of energy 123.6 keV in
a target of thickness t is calculated using
eqn. (1). The total atomic scattering cross
section t is calculated using WinXcomsoftware [13].
3.2 Measurement of K x-ray intensities
By subtracting the source spectrum plus
background from the transmitted
Fig. 2. Source plus background spectrum
Fig. 3. Transmitted spectrum plus
background
spectrum plus background, we get a clean
fluorescence K x-ray spectrum that
corresponds to the target element under
investigation. The K x-ray fluorescence
spectrum for platinum is shown in Fig. 4.
The area under each peak gives'
iI , the
measured intensity of K x-ray of type i
(where i = K and K); which is corrected
for self-attenuation in the target ( factor),
attenuation in the window and efficiency
of the detector.
The K x-ray production cross section for a
given element is calculated using the
relation,
(8)
where fK is the fractional emission rate
and is given as, fK = (1+IK/IK)
-1
. The Kvalues are taken from Hubbell [14] and K
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values at 123.6 keV are taken from
Scofield [15].
Fig. 4. K x-ray fluorescence spectrum of
platinum
4. Results, Discussion and conclusions
The measured values of K x-ray intensity
ratios, K shell jump ratios and jump
factors determined for platinum and lead
are presented in Table 1. These values are
compared with the theoretical and others
experimental values in the same table.
Table 1. Measured values of K x-ray
intensity ratios, jump ratios and jump
factors for platinum and lead
K XRF
Parameters
Platinum
(Z = 78)
Lead
(Z = 82)
K 0.9593 [14] 0.9634 [14]
t (Exptl.) 991 1138
t (Theor) 964 [16] 1120 [16]
K using
eqn (8)
527.68 621.02
IK/IK(Exptl)
0.2700.005 0.2800.002
IK/IK(Theor)
0.263 [15] 0.270 [15]
IK/IK(Others
values) 0.259 [18]
0.28220.007
[19]
0.2750.021
[20]
rK(Exptl.) 4.24 4.61
rK(Theor) 4.95 [16] 4.74 [16]
rK(Others
values)
4.63 [17] 5.11 [17]
JK(Exptl.) 0.764 0.778
JK(Theor) 0.798 [16] 0.789 [16]JK(Others 0.784 [17] 0.804 [17]
values)
From the table, we see that the measured
values of K x-ray intensity ratios for
platinum and lead agree well with
theoretical and others values. While the
measured values of K jump ratios and
jump factors are systematically lower than
the theoretical and others values. This
may be due to the uncertainty in the
estimation of t, which are systematically
higher than the theoretical values.
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