ieee design test report report no. td 01 26 e00 type pvi-lp … · 2017-01-29 · procedures of...

47
IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP Intermediate Class Surge Arrester This report records the results of the design tests made on Type PVI-LP Intermediate Class surge arresters in accordance with IEEE Standard C62.11- 2012 “IEEE Standard for Metal Oxide Surge Arresters for AC Power Circuits (> 1kV)”. To the best of our knowledge and within the usual limits of testing practices, tests performed on the Type PVI-LP arresters demonstrate full compliance with the relevant clauses of the referenced standard. This is an updated version of EU1464. Dennis Lenk Saroni Brahma Principal Engineer Design Engineer Date: 07/03/2014 Separate reports provide details of the tests, according to the following table: Report No. Description Clause Issue Date TD 01 26 E01 Insulation Withstand 8.1 07/03/2014 TD 01 26 E02 Discharge Voltage 8.2 07/03/2014 TD 01 26 E03 MOV Disc Accelerated Aging 8.5 07/03/2014 TD 01 26 E04 Salt Fog Accelerated Aging 8.7 07/03/2014 TD 01 26 E05 Thermal Equivalency 7.2.2 07/03/2014 TD 01 26 E06 Partial Discharge 8.11 07/03/2014 TD 01 26 E07 Switching Surge Energy Rating 8.14 07/03/2014 TD 01 26 E08 Single-Impulse Withstand Rating 8.15 07/03/2014 TD 01 26 E09 Duty Cycle 8.16 07/03/2014 TD 01 26 E10 Temporary Overvoltage 8.17 07/03/2014 TD 01 26 E11 Short Circuit Pressure Relief 8.18 07/03/2014 TD 01 26 E12 MDCL and Moisture Ingress 8.22 07/03/2014

Upload: others

Post on 06-Apr-2020

0 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE DESIGN TEST REPORT

Report No. TD 01 26 E00 Type PVI-LP Intermediate Class

Surge Arrester This report records the results of the design tests made on Type PVI-LP Intermediate Class surge arresters in accordance with IEEE Standard C62.11-2012 “IEEE Standard for Metal Oxide Surge Arresters for AC Power Circuits (> 1kV)”. To the best of our knowledge and within the usual limits of testing practices, tests performed on the Type PVI-LP arresters demonstrate full compliance with the relevant clauses of the referenced standard. This is an updated version of EU1464.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014 Separate reports provide details of the tests, according to the following table:

Report No. Description Clause Issue Date TD 01 26 E01 Insulation Withstand 8.1 07/03/2014 TD 01 26 E02 Discharge Voltage 8.2 07/03/2014

TD 01 26 E03 MOV Disc Accelerated Aging 8.5 07/03/2014

TD 01 26 E04 Salt Fog Accelerated Aging 8.7 07/03/2014

TD 01 26 E05 Thermal Equivalency 7.2.2 07/03/2014

TD 01 26 E06 Partial Discharge 8.11 07/03/2014

TD 01 26 E07 Switching Surge Energy Rating 8.14 07/03/2014

TD 01 26 E08 Single-Impulse Withstand Rating 8.15 07/03/2014

TD 01 26 E09 Duty Cycle 8.16 07/03/2014

TD 01 26 E10 Temporary Overvoltage 8.17 07/03/2014

TD 01 26 E11 Short Circuit Pressure Relief 8.18 07/03/2014

TD 01 26 E12 MDCL and Moisture Ingress 8.22 07/03/2014

Page 2: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TYPE TEST REPORT No. TD 01 26 E01

Insulation Withstand Tests on PVI-LP Arrester Housing CERTIFICATION This is to certify the insulation withstand test capability of the Ohio Brass Type PVI-LP Intermediate Class surge arresters.

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 3: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E01 2

DESIGN TEST REPORT

Type PVI-LP Intermediate Class Surge Arrester TITLE: Arrester Insulation Withstand Tests: OBJECTIVE: To demonstrate that the voltage withstand capability of the arrester housing external insulation meets the requirements as specified in Section 8.1.2.1 of IEEE C62.11-2012 Standard. CONCLUSION: Table 1 lists PVI-LP arrester minimum strike distance and leakage distance as well as required 1.2/50 impulse withstand and 10 second wet withstand capabilities. All PVI-LP arrester ratings meet or exceed these required levels of withstand voltage.

Table 1 Summary Data - Insulation Withstand Test

Required Actual Required Actual Arrester Arrester 1.2/50 1.2/50 60 HZ 60 HZ Rated Strike Leakage Impulse Impulse 10

second 10

second Catalog MCOV Voltage Distance Distance Withstand Withstand Wet W/S Wet

W/S No. (kVrms) (kVrms) (in) (in) (kVc) (kVc) (kVrms) (kVrms)

300803 2.55 3 5.6 15.4 12 100 5 20

300805 5.1 6 5.6 15.4 25 100 10 20

300808 7.65 9 5.6 15.4 38 100 15 20

300809 8.4 10 5.6 15.4 42 100 16 20

300610 10.2 12 5.6 15.4 50 100 19 20

300813 12.7 15 10.8 30.8 63 160 24 40

300815 15.3 18 10.8 30.8 76 160 29 40

300817 17 21 10.8 30.8 83 160 32 40

300620 19.5 24 10.8 30.8 100 160 37 40

300822 22 27 16.1 46.2 113 210 42 61

300824 24.4 30 16.1 46.2 125 210 46 61

300629 29 36 16.1 46.2 150 210 55 61

300831 31.5 39 21.3 61.6 159 230 60 80

300636 36.5 45 21.3 61.6 184 230 69 80

300639 39 48 21.3 61.6 200 230 74 80

300642 42 54 26.5 77 217 260 80 95

300648 48 60 26.5 77 242 260 91 95

300657 57 72 31.7 92.4 292 310 108 110

Page 4: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TYPE TEST REPORT No. TD 01 26 E02

Discharge Voltage Characteristic

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 5: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 2

DESIGN TEST REPORT Type PVI-LP Intermediate Class Surge Arrester

TITLE: Discharge-voltage characteristic TEST OBJECTIVE: These measurements are used to obtain the maximum discharge voltages at various current magnitudes and wave shapes. TEST PROCEDURE: Discharge voltage tests were performed on three single disc test samples. Tests were conducted in accordance with clause 8.3 of IEEE Standard C62.11-2012. Test samples were subjected to 8/20 current waves with magnitudes ranging from 1.5 kA through 20 kA. In addition, switching surge and front-of-wave (FOW) discharge voltage tests were performed. FOW tests results included the L di/dt inductive voltage drop of the arrester. TEST SAMPLES: Arresters are assembled from discs accumulated within 10 kA IR ranges as specified for each arrester rating. To verify catalog maximum IR levels were not exceeded, a discharge voltage ratio was established at each current level based on the test sections 10 kA IR (Table 1). That ratio was multiplied by the maximum allowed 10 kA IR accumulation specified for each rating. As summarized on Table 2, the IR calculated based on the prorated test sections do not exceed the maximum declared catalog levels. TEST RESULTS: Table 1 summarizes the results of residual voltage tests performed on three MOV test samples. Table 2 lists the claimable catalog IRs foe each rated arrester versus its actual measured values. Note that the total FOW value includes L di/dt arrester inductive voltage drop. In attached Annex, Figures 1-11 contain oscillograms of residual voltage test samples at each current and wave shape.

Table 1 Sample Discharge Voltage Data Summary

Discharge Voltage (kV) Discharge Voltage Ratio

Impulse Current (A)

Wave Shape Sample 1

Sample 2

Sample 3

Sample 1

Sample 2

Sample 3

125 60/100 12.310 12.283 12.323 0.816 0.814 0.815 500 60/100 13.009 13.009 13.023 0.862 0.862 0.861

1,500 8/20 13.830 13.884 13.884 0.916 0.920 0.918 3,000 8/20 14.422 14.422 14.449 0.955 0.955 0.955 5,000 8/20 15.095 15.095 15.122 1.000 1.000 1.000 10,000 8/20 16.332 16.359 16.386 1.082 1.084 1.084 20,000 8/20 17.758 17.731 17.893 1.176 1.175 1.183 40,000 8/20 19.965 19.965 20.045 1.323 1.323 1.326 5,000 .5 FOW 16.01 16.124 16.075 1.061 1.068 1.063 10,000 .5 FOW 17.495 17.511 17.479 1.159 1.160 1.156

Page 6: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 3

Table 2: Type PVI-LP Arrester Discharge Voltage Summary

IR Multiplier 0.797 0.849 0.883 0.924 1 1.092 0.986

Waveshape 60/100 8/20 8/20 8/20 8/20 8/20

Disc 0.5usec

Total FOW

MCOV

Rating I (kA) 0.5 1.5 3 5 10 20 5 5 2.55 3 Measured IR 6.4 6.8 7.1 7.4 8 8.7 7.9 8.8

Catalog IR 6.5 6.9 7.2 7.5 8.1 8.8 8.0 8.9 5.1 6 Measured IR 12.8 13.7 14.2 14.9 16.1 17.6 15.9 16.7 Catalog IR 12.9 13.8 14.3 15.0 16.2 17.7 16.0 16.8

7.65 9 Measured IR 19.4 20.6 21.5 22.5 24.3 26.5 24.0 24.8

Catalog IR 19.4 20.7 21.5 22.5 24.4 26.6 24.1 24.9

8.4 10 Measured IR 21.4 22.8 23.7 24.8 26.8 29.3 26.4 27.3

Catalog IR 21.4 22.8 23.8 24.9 26.9 29.4 26.5 27.4

10.2 12 Measured IR 25.7 27.3 28.4 29.8 32.2 35.2 31.7 32.6

Catalog IR 25.7 27.4 28.5 29.8 32.3 35.3 31.8 32.7

12.7 15 Measured IR 32.2 34.3 35.7 37.3 40.4 44.1 39.8 41.4

Catalog IR 32.4 34.5 35.8 37.5 40.6 44.3 40.0 41.6

15.3 18 Measured IR 38.7 41.3 42.9 44.9 48.6 53.1 47.9 49.5

Catalog IR 38.9 41.4 43.1 45.1 48.8 53.3 48.1 49.7

17 21 Measured IR 42.7 45.5 47.3 49.5 53.6 58.5 52.8 54.4

Catalog IR 42.9 45.7 47.5 49.7 53.8 58.7 53.0 54.6

19.5 24 Measured IR 51.3 54.7 56.9 59.5 64.4 70.3 63.5 65.0

Catalog IR 51.5 54.8 57.0 59.7 64.6 70.5 63.7 65.2

22 27 Measured IR 58.1 61.9 64.4 67.4 72.9 79.6 71.9 74.1

Catalog IR 58.3 62.1 64.6 67.6 73.2 79.9 72.2 74.4

24.4 30 Measured IR 64.1 68.3 71.0 74.3 80.4 87.8 79.3 81.5

Catalog IR 64.3 68.5 71.3 74.6 80.7 88.1 79.6 81.8

29 36 Measured IR 77.0 82.0 85.3 89.3 96.6 105.5 95.2 97.5

Catalog IR 77.2 82.3 85.6 89.5 96.9 105.8 95.5 97.8

31.5 39 Measured IR 81.5 86.8 90.2 94.4 102.2 111.6 100.8 103.7

Catalog IR 81.8 87.1 90.6 94.8 102.6 112.0 101.2 104.1

36.5 45 Measured IR 94.0 100.2 104.2 109.0 118.0 128.9 116.3 119

Catalog IR 94.4 100.5 104.5 109.4 118.4 129.3 116.7 120

39 48 Measured IR 102.7 109.4 113.7 119.0 128.8 140.6 127.0 130

Catalog IR 103.0 109.7 114.1 119.4 129.2 141.1 127.4 130

42 54 Measured IR 111.1 118.4 123.1 128.8 139.4 152.2 137.4 141

Catalog IR 111.5 118.8 123.5 129.3 139.9 152.8 137.9 142

48 60 Measured IR 124.0 132.1 137.4 143.8 155.6 169.9 153.4 157

Catalog IR 124.4 132.5 137.8 144.2 156.1 170.5 153.9 158

57 72 Measured IR 149.6 159.4 165.7 173.4 187.7 205.0 185.1 189

Catalog IR 150.2 160.0 166.4 174.1 188.4 205.7 185.8 190

Page 7: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 4

ANNEX

Oscillograms

Page 8: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 5

Figure 1 Sample #2

125 A, 12.283 kV, 52/91 Wave Shape

Figure 2 Sample #2

500 A, 13.009 kV, 52/96 Wave Shape

Page 9: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 6

Figure 3

Sample #2 1.5 kA, 13.884 kV, 8.4/20 Wave Shape

Figure 4

Sample #1 3 kA, 14.422 kV, 8.5/20 Wave Shape

Page 10: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 7

Figure 5

Sample #2 5 kA, 15.095 kV, 8.5/18.7 Wave Shape

Figure 6 Sample #1

10 kA, 16.332 kV, 8.4/18.4 Wave Shape

Page 11: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 8

Figure 7

Sample #2 20 kA, 17.731 kV, 8.4/19.7 Wave Shape

Figure 8 Sample #3

40 kA, 20.045 kV, 8.6/20.2 Wave Shape

Page 12: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E02 9

Figure 9

Sample #1 5 kA FOW, 16.010 kV @ .5 microseconds to voltage crest

Figure 10 Sample #2

10 kA FOW, 17.511 kV @ .5 microseconds to voltage crest

Page 13: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TYPE TEST REPORT No. TD 01 26 E03

Disc Accelerated Aging PVI-LP Arrester

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 14: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E03 2

DESIGN TEST REPORT

PVI-LP Intermediate Class Surge Arrester TITLE: MOV Disc Accelerated aging procedure TEST PROCEDURE: Tests were performed to verify that the varistors remain stable and do not increase in power dissipation at MCOV during their expected lifetime. TEST SAMPLES: Six arrester sections were prepared. Three sections consisted of the shortest 48mm diameter disc and three consisted of the longest 48mm diameter disc. Each section also consisted of a spring, end terminals, barrier film and fiberglass/epoxy wrap using standard module construction. TEST PROCEDURE: Tests were performed per section 8.5 of IEEE Standard C62.11-2012. Samples were placed inside a 115 °C ±2 °C. oven and energized at a voltage level greater than MCOV for 1,000 hours. TEST RESULTS: Watts loss for each sample was measured at MCOV two hours after energization and at the completion of the 1000 hour test duration. The table below summarizes test data.

Accelerated aging test data Section No. Watts Loss at 2 hours @ MCOV Watts Loss at 1000 hours @ MCOV

1 4.31 1.74 2 3.91 1.64 3 4.26 1.68 4 14.92 4.24 5 20.17 4.26 6 13.72 4.35

CONCLUSION: Each test section demonstrated continually declining watts loss at MCOV during the 1000 hour test duration confirming stability.

Page 15: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E04

Type EVP Station Class Arrester

Salt Fog Accelerated Aging Test

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 16: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E04 2

Type PVI-LP Intermediate Class Surge Arrester

Salt Fog Accelerated Aging INTRODUCTION: The polymer housing accelerated aging tests were performed per Section 8.7 of the IEEE C62.11-2012 standard. The purpose of this test was to verify the electrical integrity of the arrester polymer housing after being subjected to 1000 hours in a salt fog environment. SAMPLE PREPARATION: A 48 kV rated PVI-LP arrester was assembled for this test. TEST PROCEDURE: The 1000 hour weathering test was performed per Section 8.7.3 of the IEEE C62.11-2012 standard. TEST RESULTS: The test arrester successfully withstood the 1000 hour salt fog exposure test with no evidence of surface tracking, erosion, or puncturing. Per Section 8.7.4, the reference voltage change, as a result of the 1000 hour test, was less than the allowed 5%. In addition, the partial discharge measured at the completion of the test was less than the allowed 10pC. TEST CONCLUSIONS: The 48 kV rated PVI-LP Intermediate Class arrester design successfully passed the 1000 hour salt fog test, as defined in Section 8.7 of the IEEE C62.11-2012 standard.

Page 17: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E05

Type PVI-LP Intermediate Class Arrester

Thermal Equivalency

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 18: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E05 2

Type PVI-LP Station Class Surge Arrester Thermal Equivalency

INTRODUCTION: The polymer housing accelerated aging tests were performed per Section 7.2.2.3 of the IEEE C62.11-2012 standard. PURPOSE: The purpose of this test is to verify that the thermal cooling curve for the Type PVI-LP prorated section, when internally heated, will cool slower than that of a full size PVI-LP arrester unit. PROCEDURE: The full size arrester and the prorated section were heated up by applying a temporary overvoltage to the test samples. The test procedure is defined in Section 7.2.2.3 of IEEE C62.11-2012 Standard. The full size arrester section was instrumented with (1) internal thermocouple located in the middle of the MOV disc stack. The temperature of the arrester thermocouple was monitored at 5 minute intervals to develop the arrester unit cooling curve. The prorated section was instrumented with a single thermocouple and its cooling rated was also monitored at 5 minute intervals. The cooling rate during the 1st 15 minutes was slower for the PVI-LP section than the arrester. To assure thermal equivalency, as allowed by the standard, the starting temperature of the section cooling curve was raised from the targeted 140 ºC point (for the arrester) to 144 ºC for the prorated section. SUMMARY: The following cooling curve confirms that the cooling rate of the PVI-LP prorated section is slower than that of the full size PVI-LP arrester unit, confirming the thermal equivalency of the prorated section to the full size arrester.

Page 19: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E05 3

0

20

40

60

80

100

120

140

160

0 20 40 60 80 100 120

Tem

pera

ture

deg

rees

C

Time- Minutes

Corrected Cooling Curve for PVI-LP Prorated Section Vs Arrester

Prorated Section Arrester

+4

Page 20: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E06

Type PVI-LP Intermediate Class Arrester

Partial Discharge

This report summarizes the results of design tests made on the Type PVI-LP Intermediate arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 21: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E06 2

Type PVI-LP Intermediate Class Surge Arrester Partial Discharge

INTRODUCTION: The polymer housing partial discharge test was performed per Section 8.11 of the IEEE C62.11-2012 standard. The test was performed on a 57 kV MCOV PVI-LP arrester. TEST EQUIPMENT: Equipment and test methods conformed to the IEEE 454-1979 standard. TEST RESULTS: The arrester with grading ring was energized at 1.05 times MCOV. The arrester’s partial discharge level measured 2.0 pC, with an ambient 6.0 pC background level. CONCLUSION: In addition to successfully passing the partial discharge design test, all PVI-LP arresters are routinely tested on partial discharge to insure that all arresters meet the required 10 pc limit.

Page 22: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E07

Type PVI-LP Intermediate Class Arrester

Switching Surge Energy Rating

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 23: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 2

Type PVI-LP Intermediate Class Surge Arrester

Switching Surge energy Rating INTRODUCTION: Switching surge energy rating tests were performed per section 8.14 of the IEEE C62.11-2012 standard. Tests were performed per Station Class arrester requirements. The main objective of this test is to claim an energy class as per Table 13 of the above mentioned standard. TEST SAMPLE: As required by the standard, three prorated sections were tested. TEST PROCEDURE: The test sections were conditioned with six groups of three current impulses corresponding to energy class D (7.5 kJ/kV). The assigned conditioning level testing was followed by two 65kA, 4/10 impulses, spaced 50 to 60 seconds apart. The prorated sections were then placed into an oven until the temperature stabilized at 64°C. After stabilization, test samples were subjected to long duration current impulses (2000 to 3000 µs). Within 100ms from the application of the second discharge the duty cycle rated voltage was applied for 10s followed by power frequency recovery voltage for 30mins to demonstrate thermal recovery. TEST RESULTS: The targeted energy class for this design was Class D with a 2-shot energy rating of 7.5 kJ per kV MCOV. As such, all test sections were subjected to 18 shots having a 3.75 kJ per kV MCOV energy rating. Figure 1 shows a typical 2200 microsecond duration Class D conditioning impulse while Figure 2 shows an oscillogram of a typical 65 kA high current impulse.

Page 24: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 3

Figure 1: Conditioning impulse at class D

Figure 2: Example of 65kA (4/10) impulse waveform

Page 25: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 4

During the thermal recovery portion of the switching surge energy rating test, it was discovered that the prorated test sections could not thermally recover after exposure to the required Class D 7.5 kJ per kV MCOV energy discharges, followed by 10 seconds at rated voltage. The thermal recovery testing was repeated at the Class C 2-shot energy rating level of 6.0 kJ per kV MCOV. Figure 3 shows an oscillogram of the 2nd energy discharge followed by 10 seconds at rated voltage on section 2, while Figures 4, 5, and 6 demonstrate the thermal stability of that test section during the recovery voltage portion of the test.

Figure 3: Class C energy shot on Section 2 (34.2 kJ/shot)

Page 26: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 5

Figure 4: Recovery Oscillogram on Section 2 @ Recovery Time = 0

Figure 5: Recovery Oscillogram on Section 2 @ Recovery Time = 1 minute

Figure 6: Recovery Oscillogram on Section 2 @ Recovery Time = 30 minute

Page 27: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 6

Table 1 summarizes the results of the 2-shot energy rating test performed on the three sections preheated to 64 degree C. Table 2 records the 10 second Ur grading current, while Table 3 summarizes section watts during the 30 minute recovery test.

Table 1- 2-Shot Energy Section # MCOV-kVrms Shot No. AMPS KJ/Shot KJ/MCOV kVrms

1 11.32 1 538.1 34.33 3.03

2 532.3 34.74 3.07

2 11.32 1 544.2 34.28 3.03 2 533.2 34.31 3.03 3 11.32 1 538.1 34.33 3.03 2 532.3 34.74 3.07

Table 2- 10 Second Ur Data

Section #1 Section #2 Section #3

Time (sec) 60Hz (mA) 60Hz (mA) 60Hz (mA) 0.07 89.2 80.8 90.8 1.01 79.2 79.6 90.4 2.04 72.1 76.3 87.5 3.05 70.4 72.1 77.5 4.03 68.3 69.2 77.5 5.01 66.7 67.5 77.9 6.05 66.3 66.3 75.0 7.00 65.4 62.9 73.3 8.00 63.3 62.5 75.4 9.13 62.5 60.8 71.7

10.20 62.1 60.0 72.9

Table 3- 30 Minute Thermal Stability Recovery Test

Section #1 Section #2 Section #3

Elapsed Time- Minutes Watts Watts Watts 0:00:00 30.47 29.96 26.90 0:00:30 21.32 20.03 18.80 0:01:00 16.20 16.14 15.25 0:02:00 12.86 11.99 11.53 0:05:00 9.06 9.12 8.15 0:10:00 7.27 7.42 6.13 0:20:00 5.36 5.41 4.43 0:30:00 4.17 4.06 3.42

Page 28: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E07 7

Per the test evaluation procedure as specified in Section 8.14.5 of the standard, the switching surge voltage of each test section was measured before and after the energy surge duty testing. Table 4 summarizes the results of this testing. Additionally, each test section showed no evidence of physical damage.

Table 4: .5 kA Switching Surge IRs before and after

Section # .5 kA IR Before (kVc) .5 kA IR After (kVc) % Change 1 25.454 25.857 1.58% 2 25.454 25.884 1.69% 3 25.508 25.938 1.69%

CONCLUSION: The Type PVI-LP prorated sections successfully passed the switching surge energy requirements of Energy Class C as specified in Table 13 of IEEE C62.11-2012.

Page 29: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

65

IEEE Design Test Report Report No. TD 01 26-E08

Type PVI-LP Intermediate Class Arrester

Single Impulse Withstand Rating

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 30: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E08 2

Type PVI-LP Intermediate Class Surge Arrester Single Impulse Withstand rating test

INTRODUCTION: The single-impulse withstand rating test was performed per Section 8.15 of the IEEE C62.11-2012 standard, on ten MOV blocks. TEST PROCEDURE: Test was performed on 10 of the longest MOV blocks used in the PVI-LP product line. The discharge voltage (5kA, 8/20) and the reference voltage (at 7.0 mA) were measured before and after the long duration impulses for evaluation. Each sample was then subjected to ten groups of two long duration impulses of 2.22 ms and a charge content of 2.2 C. Figure 1 shows the long duration impulse waveform applied on each of the MOV discs.

Figure 1: Wave shape of long duration impulse wave form Test Results: Ten of (10) MOV discs successfully withstood the 20 shot durability test performed at 2.2 coulomb charge. Per section 8.15.3, the MOV discs were examined and found to have no physical damage. Additionally, each MOV disc was tested for 10 kA IR and 7ma Uref reference voltage. The results of this testing is summarized in Table 1.

Sample No

10 kA IR Before (kVc)

10 kA IR

After (kVc)

% Change

Vref @ 7 mA

Before (kVc)

Vref @ 7 mA After (kVc)

% Change

1 16.12 16.19 +0.43 9.82 9.93 +1.1 2 16.12 16.16 +0.25 9.82 9.94 +1.2 3 16.12 16.19 +0.43 9.84 9.97 +1.3 4 16.07 16.12 +0.31 9.80 9.92 +1.2 5 16.08 16.14 +0.37 9.80 9.91 +1.1 6 16.09 16.12 +0.19 9.76 9.87 +1.1 7 16.06 16.11 +0.31 9.77 9.89 +1.2 8 16.08 16.11 +0.19 9.76 9.88 +1.2 9 16.09 16.14 +0.31 9.77 9.88 +1.1 10 16.09 16.13 +0.25 9.78 9.91 +1.3

Table 1: Before and After Discharge Voltages and Reference Voltages

Page 31: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E08 3

Conclusion: The test was successfully completed as per the IEEE C.62.11-2012 requirements. The change in discharge voltage and reference voltage were well within 5% of initial value. The claimed single-impulse withstand rating for the Type PVI-LP arrester is 2.0 C.

Page 32: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TYPE TEST REPORT No. TD 01 26 E09

DUTY CYCLE TEST Type PVI-LP Intermediate Class Arrester

CERTIFICATION This is to certify that the duty cycle design test has been successfully performed on the Ohio Brass Type PVI-LP Intermediate Class surge arrester per Clause 8.16 of IEEE C62.11-2012 Standard.

Saroni Brahma Design Engineer

Dennis W. Lenk P.E. Principal Engineer

07/03/2014 Attachments

Page 33: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E09 2

DESIGN TEST REPORT PVI-LP Intermediate Class Surge Arrester

Duty Cycle Test INTRODUCTION: Duty cycle tests were performed per clause 8.16 of IEEE Standard C62.11-2012. Tests were performed on three PVI-LP prorated sections assembled per clause 8.16.1 requirements. TEST PROCEDURE: The room temperature prorated test section was energized at its rated voltage and subjected to twenty 10 kA, 8/20 μs discharges spaced at 1 minute intervals. Following the twentieth impulse, the test section was placed in an oven at 64°C. After reaching 64°C, the sample was subjected to two additional 10 kA, 8/20 μs discharges. Within 5 minutes after the second high current discharge, the sample was energized at the prorated section recovery voltage. Watts loss was monitored over a 30 minute period demonstrating thermal stability. TEST RESULTS: Tests were successfully completed on three prorated sections. The following data summarizes the results of tests performed on prorated section #1. The following data summarizes the results of the duty cycle test performed on prorated section #1. Figures 1 and 2 show the 1st and 20th shot performed during the rated voltage portion of the duty cycle test.

Figure 1 1st Shot @ Rated Voltage

Page 34: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E09 3

Figure 2 20th Shot @ Rated Voltage

Figure 3 shows the oscillogram for the 2nd 10 kA impulse applied to the previously preheated prorated section #1 during the recovery portion of the duty cycle test.

Figure 3 2nd 10 kA Discharge Prior to Recovery

Page 35: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E09 4

Figures 4 and 5 show oscillograms of the prorated section #1 grading current through the test section at time zero and 30 minutes after application of recovery voltage, demonstrating thermal recovery has occurred.

Figure 4

Recovery @ Time = 0 Minutes

Figure 5

Recovery @ Time = 30 Minutes

Page 36: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E09 5

Table #1 summarizes the results of the duty cycle test performed on the three test sections.

Table 1 Shot No. Section #1 Watts Section #2 Watts Section #3 Watts

1 29.26 24.68 27.02 2 31.71 27.41 27.99 3 32.73 32.82 31.30 4 34.09 37.21 35.58 5 33.78 37.82 36.92 6 35.04 41.57 38.33 7 36.37 37.58 40.53 8 36.16 38.14 39.01 9 38.06 38.55 40.25 10 38.54 39.92 42.96 11 40.92 39.92 45.37 12 44.86 43.46 44.38 13 46.49 40.68 50.56 14 48.94 43.40 51.64 15 57.08 48.01 55.37 16 61.31 55.75 58.60 17 67.63 62.55 67.71 18 77.70 65.55 76.47 19 92.38 75.24 81.44 20 99.58 88.81 98.09

Samples Preheated to 64 Deg C. Shot No. Section #1 Watts Section #2 Watts Section #3 Watts

21 3.69 3.86 3.68 22 4.46 4.93 4.53

Within 100 msec, Recovery Voltage Applied Elapsed Time minutes Section #1 Watts Section #2 Watts Section #3 Watts

0:00:00 4.15 4.74 4.31 0:00:30 3.56 3.56 3.53 0:01:00 3.35 3.32 3.37 0:02:00 3.15 3.16 3.12 0:05:00 2.87 2.90 2.91 0:10:00 2.67 2.62 2.68 0:20:00 2.27 2.29 2.31 0:30:00 2.09 2.05 2.16

Prior to and after the duty cycle test, the 10 kA, 8/20 μs discharge voltage was measured on the three prorated sections. Table 2 summarizes this test data.

Page 37: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E09 6

Table 1

Section # 10 kA IR kVc (Before) 10 kA IR kVc (After) 10 kA IR % Change 1 32.557 32.611 0.2% 2 32.557 32.638 0.3% 3 32.557 32.665 0.3%

CONCLUSION: The Type PVI-LP prorated test samples successfully completed Duty Cycle testing and demonstrated thermal stability during the recovery test. The 10 kA discharge voltage increased 0.2-0.3%, less than the allowed 10% limit specified in Section 8.16.4 of the IEEE C62.11-2012 standard. Disassembly revealed no evidence of physical damage to the test samples. The Type PVI-LP arrester successfully met the Intermediate Class arrester Duty Cycle requirements.

Page 38: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E10

Type PVI-LP Intermediate Class Surge Arrester

Temporary Overvoltage Test CERTIFICATION This is to certify that the Temporary Overvoltage test has been successfully performed on Ohio Brass Type PVI-LP Intermediate Class surge arrester.

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 39: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E10 2

Temporary Overvoltage Test INTRODUCTION: Temporary over-voltage tests were performed per clause 8.17 of IEEE Standard C62.11-2012. Tests were performed per Intermediate Class arrester requirements using four prorated test sections TEST SAMPLE: Nominally 6 and 12 kV rated prorated sections were used to facilitate testing across the designated a) thru f) time ranges. The short time data points were generated using 6 kV rated sections while the longer time data points used 12 kV rated sections. As both sizes of arresters were thermally equivalent prorated sections, the results of these tests apply to all PVI-LP arrester ratings. TEST PROCEDURE: Testing was performed per procedures specified in clause 8.17.3. The No Prior Duty testing conformed to clause 8.17.3.1 while the Prior duty testing conformed to clause 8.17.3.2. All prorated test sections were preheated in an oven to 64 degrees C. prior to testing. For the Prior Duty test, energy was inputted via two long duration impulses spaced 1 minute apart. Within 100 milliseconds of the 2nd discharge, the targeted temporary overvoltage was applied to the test section, followed immediately by recovery voltage. The recovery voltage was applied by 30 minutes, monitoring sample watts loss to verify the test section remained thermally stable. The total energy inputted by the two long duration impulses exceeded 6 kJ per kV MCOV, as claimed in the switching surge energy rating test. TEST RESULTS: Table 1 summarizes the results of the tests successfully performed on the No Prior Duty and Prior Duty Test Sections.

Table 1

Time-Seconds Prior Duty TOV Per Unit Times MCOV

No Prior Duty TOV Per Unit Times MCOV

.01 1.535 1.560 .1 1.450 1.480 1 1.365 1.400 10 1.295 1.340

100 1.240 1.282 1000 1.205 1.245 10000 1.195 1.230

After successfully passing TOV duty tests, the 10 kA 8/20 discharge was measured and the results compared with test values measured prior to TOV testing. The results of the 10 kA discharge testing for each section is summarized in table 2.

Page 40: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E10 3

Table 2

Sample No. 10 kA IR Before 10 kA IR After 10 kA IR % Change 2 32.530 32.907 1.2 4 32.665 32.826 0.5 9 32.530 32.853 1.0 14 32.665 32.799 0.4 15 32.665 32.826 0.5 16 32.611 62.530 -0.2 17 16.575 16.521 -0.3 19 16.601 16.601 0.0 22 16.548 16.548 0.0

Figure 1 shows the plotted TOV capability curve data points, including actual test data points verified by laboratory testing.

Figure 1

Page 41: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E10 4

Figure 2 shows the plotted TOV capability curves for the No Prior Duty and Prior Duty TOV Curves. The Prior Duty testing was performed in compliance with the Class C Energy rating confirmed in the switching surge energy rating test.

Figure 2

CONCLUSION: Tests were successfully completed per Clause 8.17 of IEEE C62.11-2012 Standard. For both the No prior Duty and Prior Duty tests, each sample demonstrated thermal stability after TOV exposure. Residual voltage at 10 kA measured prior to and after the TOV test series changed much less than the allowed 10%. There was no evidence of physical damage to the test sections, validating the PVI-LP arrester TOV capability claims.

Page 42: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TYPE TEST REPORT No. TD 01 26 E11

SHORT CIRCUIT TEST PVI-LP Intermediate Class Arrester

CERTIFICATION This is to certify that the short circuit design test has been successfully performed on Ohio Brass Type PVI-LP Intermediate Class surge arrester.

Saroni Brahma Design Engineer

Dennis W. Lenk P.E. Principal Engineer

07/03/2014 Attachments

Page 43: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E11 2

DESIGN TEST REPORT

PVI-LP Intermediate Class Surge Arrester Short-Circuit Test

OBJECTIVE: Short circuit tests were performed on the Type PVI-LP Intermediate Class arrester per section 8.18 of IEEE Standard C62.11-2012. Tests were performed in compliance with Table 14 of the referenced standard. Additional short circuit tests were performed as shown. TEST SAMPLE: Fault current tests were performed on the longest mechanical section, as required in Section 8.18.1 of the standard. As required in Section 8.18.1, two test samples were tested (one at 40 kArms/12 cycle high current and one at 600 amp/ 1 second) using the specified 2-source failure method. One additional 2-source and two additional test samples for the high current test were assembled with a fuse wire oriented axially between the mov disc stack and the fiberglass-epoxy wrap. The fuse wire samples were subjected to the full offset current test. In addition, two samples were tested per the 2-source method at 20 kArms. These samples were failed using the specified 2-source failure mode procedure. TEST RESULTS: The following table summarizes the results these tests which validated the claimed maximum 40 kArms symmetrical, 12 cycle fault current withstand capability of this design, with an applied ratio of 1.55 between total asymmetrical to symmetrical rms currents. This corresponds to a 2.6 ratio, in the first half loop of fault current, between the crest asymmetrical to rms symmetrical current, i.e., full offset. In addition to testing at the claimed maximum capability, tests were also performed, using the 2-source procedure, at half the claimed capability and at 600 amps as specified in Table 14 of the standard. All tests were performed at full voltage. Therefore, the prospective fault current, as measured during the bolted fault test on the generator, is the claimable fault current capability of the design. Calibration Test 41.0 kArms Symmetrical 107 kApeak Asymmetrical

Sample #

Failure Mode

Minimum Test Duration-seconds

Condition of Module/Polymer Housing After Test

1 Fuse Wire .21 Module Intact/Housing Separated 2 Fuse Wire .21 Module Intact/Housing Separated 3 2-Source .21 Module Intact/Hsg Torn but in Place 4 2-Source .21 Module Intact/Hsg Torn but in Place

Page 44: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E11 3

Calibration Test 19.9 kArms Symmetrical No Asymmetrical Requirement

Sample #

Failure Mode

Minimum Test Duration-seconds

Condition of Module/Polymer Housing After Test

5 2-Source .2 Module Intact/Hsg Torn but in Place 6 2-Source .2 Module Intact/Hsg Torn but in Place

Calibration Test 600 Arms Symmetrical No Asymmetrical Requirement

Sample #

Failure Mode

Minimum Test Duration-seconds

Condition of Module/Polymer Housing After Test

7 2-Source 1.0 Module Intact/Hsg Torn but in Place 8 2-Source 1.0 Module Intact/Hsg Torn but in Place

CONCLUSION: The eight test arresters assembled with the longest mechanical unit met the test evaluation criteria as specified in Section 8.18.3 of IEEE C62.11-2012 Standard. In all tests, the arrester module remained intact on the insulating support bracket after the completion of each test. The flexible polymer housing wall section split, as intended, on all samples to allow venting of internal arcing gases to the outside of the arrester. In all cases, flames associated with the fault current test extinguished immediately after completion of the test, well within the allowed 2 minute duration. These tests have demonstrated the capability of the PVI-LP arrester design to discharge a maximum claimable 40 kArms symmetrical fault current using the test procedure defined in Section 8.18 of IEEE C62.11-2012 Standard.

Page 45: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

IEEE Design Test Report Report No. TD 01 26 E12

Type PVI-LP Intermediate Class Surge Arrester

MDCL and Moisture Ingress Test CERTIFICATION This is to certify that the MDCL and Moisture Ingress design test has been successfully performed on Ohio Brass Type PVI-LP Intermediate Class surge arrester.

This report summarizes the results of design tests made on the Type PVI-LP Intermediate Class arrester design. Tests were performed in accordance with procedures of IEEE Std C62.11-2012, “IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1 kV).” To the best of our knowledge and within the usual limits of testing practice, tests performed on these arresters demonstrate compliance with the relevant clauses of the referenced standard.

Dennis Lenk Saroni Brahma Principal Engineer Design Engineer

Date: 07/03/2014

Page 46: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E12 2

Design Test Report PVI-LP Intermediate Class Surge Arrester

Title: Maximum design cantilever load (MDCL) and moisture ingress test for polymer-housed arresters INTRODUCTION: Tests were performed in accordance with section 8.22 of IEEE C62.11-2012 Standard. The purpose of this test was to verify the seal integrity of the polymer-housed PVI-LP arrester after being subjected to a terminal torque and thermomechanical test, followed by the boiling water immersion test. TEST SAMPLE: A 19.5 kV MCOV arrester was assembled for this test. TEST PROCEDURE: The test arrester was subjected to PD, watts loss, and discharge voltage tests prior to the bending moment and boiling water immersion test. The mechanical portion of the test consisted of first applying a 40 ft-lb torque to the arrester end terminals for 30 second duration. The test arrester was then placed inside a thermal cycling oven and mechanically loaded to its 1,600 in-lb continuous cantilever rating. The load application and test temperature cycles are shown on Figure 1

Figure 1

After completion of the mechanically loading portion of the test procedure, the water immersion portion of the bending moment test was performed per section 8.22.3.3 and consists of placing the mechanically stressed arrester into a boiling salt water bath for 42 hours, after which the same is cooled to room temperature and electrical tests are repeated.

Page 47: IEEE DESIGN TEST REPORT Report No. TD 01 26 E00 Type PVI-LP … · 2017-01-29 · procedures of IEEE Std C62.112012, “IEEE Standard for Metal- -Oxide Surge Arresters for AC Power

TD 01 26 E12 3

TEST RESULTS: Subsequent to the bending moment test, the test arrester was subjected to 42 hours immersion in the specified salt water bath. After removal from the bath, the arrester was electrically tested. The following table shows the results of the final electrical testing, compared with initial measurements.

Sample No.

Initial Watts @

Uc

Final Watts @

Uc

Initial PD @ 1.05

times Uc (pC)

Final PD @ 1.05

times Uc (pC

Initial 10 kA

Residual Voltage

kVc

Final 10 kA

Residual Voltage

kVc 1 1.04 1.20 <1 <1 55.8 55.9

CONCLUSION: Visual inspection confirmed that there was no damage to the arrester as a result of the 1,600 in-lb thermomechanical conditioning, followed by the water immersion test. Electrical tests performed before and after testing also confirmed the electrical integrity of the test arrester. The 15% watts loss increase was below the allowed 20% limit. Partial discharge was unchanged at less than 1 pC, below the allowed 10 pC limit. The measured 10 kA residual voltage was almost unchanged, below the allowed 5% limit. Therefore, the Type PVI-LP base mounted arrester design successfully passed the MDCL and moisture ingress test, as defined in IEEE C62.11-2012 standard.