hipims: technology, physics and thin film applications

41
HiPIMS: technology, physics and thin film applications Tiberiu MINEA Laboratoire de Physique des Gaz et Plasmas LPGP UMR 8578 CNRS, Université Paris-Sud, 91405 Orsay Cedex, France [email protected]

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Invited lecture of the Simposium N "Surface Engineering - functional coatings and modified surfaces" at the XIII SBPMat (Brazilian MRS) meeting, in João Pessoa (Brazil). The lecture took place on September 29th, 2014. The speaker was Tiberiu Minea, Professor at Université Paris-Sud (France), President of the French Federation of Scientific Societies and President of the Scientific and Technical Committee at the French Vacuum Society.

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Page 1: HiPIMS: technology, physics and thin film applications

HiPIMS: technology, physics and

thin film applications

Tiberiu MINEA

Laboratoire de Physique des Gaz et Plasmas – LPGP

UMR 8578 CNRS, Université Paris-Sud,

91405 Orsay Cedex, France [email protected]

Page 2: HiPIMS: technology, physics and thin film applications

PARIS

SACLAY

PALAISEAU Triangle of

Physics

ORSAY

Université Paris-Sud

T. Minea 2 PSE 2012 // September 12, 2012

Université Paris-Saclay

ORSAY

Page 3: HiPIMS: technology, physics and thin film applications

Diffusion and residence time: example

The residence time were determined by placing individual monomers on different sites (islands/terrace).

By repeating the experiments 600

times it was found that τs is much

larger at step edges (stronger bonding)

R. Ganapathy et al., Science 327, 445 (2010)

3 XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

Page 4: HiPIMS: technology, physics and thin film applications

Kinetic roughening

The ideal step flow (layer-by-layer) growth is seldom found in experiments, instead we often encounter islands leading to surface roughening.

H. Huang et al., J. Appl. Phys. 84, 3636 (1998)

Simulation of Al deposited on a flat foreign

substrate for two different microstructures: (top)

{111}, (bottom) {100}. An area of 20x20 nm is

shown (dep. rate 10 μm/min)

Kinetic roughening in an MBE experiment

Pt/Pt(111). Very slow dep. rate 2.7 Å/min at

167°C. An area of 390x390 nm is shown.

J. Krug et al., Phys. Rev B 61, 14037 (2000)

XIII Brazilian MRS - Symposium N / 29 September 2014 4 T. Minea

Page 5: HiPIMS: technology, physics and thin film applications

Microstructure: structure zone models

In order to be able to say if we have good film quality or not we need to

look at the microstructure and use our understanding of film formation.

A schematic representation of the microstructure can be found using structure zone models (SZM), where the use of reduced temp. scale makes the model generally applicable for different materials.

Zone I: Columnar and porous structure with a rough surface, due to low adatom mobility

Zone T: Columnar, quite dense structure with a smoother surface, increased adatom mobility: competitive grain growth (but little grain boundary mobility)

Zone II: Columnar, dense structure with a rather smooth surface; both adatom and grain boundary mobility (recrystallization)

Ts =300 K

Ts =100 K

F.H. Baumann et al., MRS Bulletin 26, 182 (2001) I. Petrov et al., J. Vac. Sci. Technol. A 21, S117 (2003)

XIII Brazilian MRS - Symposium N / 29 September 2014 5 T. Minea

Page 6: HiPIMS: technology, physics and thin film applications

Low surface mobility

Ts = 500 °C

P = 38 mTorr

Ji/JTi = 0.5 Ei = 100 eV

Ts = 300 °C

P = 5 mTorr

Ji/JTi = ~1 Ei = 20 eV

6

Zone 1: Zone T:

XIII Brazilian MRS - Symposium N / 29 September 2014 6 T. Minea

Page 7: HiPIMS: technology, physics and thin film applications

Results of ion bombardment

Let us start with the end results first in order to see the bigger picture. Stepwise we will break down the physics and learn how to tailor and optimize the ion bombardment.

Ts = 350 °C

P = 20 mTorr

Ji/JTa = 1.3 Ei = 20 eV

Ts = 350 °C

P = 20 mTorr

Ji/JTa = 10.7 Ei = 20 eV

Ex) TaN grown by

DCMS in a UHV

system.

The ratio of incoming

ions (no distinction

between gas and metal

ions!) to incoming metal

neutrals was changed

while maintaining the

energy of the incoming

ions.

In these bright-field

plan-view TEM images

of 500 nm thick coatings

we observe dramatic

changes in

microstructure.

XIII Brazilian MRS - Symposium N / 29 September 2014 7 T. Minea

Page 8: HiPIMS: technology, physics and thin film applications

Precursor ionization, is it possible?

XIII Brazilian MRS - Symposium N / 29 September 2014 8

1. Electrostatic confinement; e.g. hallow cathode

2. Magnetic confinement; e.g. magnetic bottle

3. Magnetron plasma

T. Minea

YES, if precursors are ionized BEFORE deposition!

How?

Increasing plasma density!

Inspired by A. Anders, 2013

Page 9: HiPIMS: technology, physics and thin film applications

Outline

XIII Brazilian MRS - Symposium N / 29 September 2014 9

1. HiPIMS technology

2. HiPIMS magnetron plasma modelling

(OHIPIC, I-OMEGA)

3. Thin Films by HiPIMS

4. Conclusions

T. Minea

Page 10: HiPIMS: technology, physics and thin film applications

XIII Brazilian MRS - Symposium N / 29 September 2014

From Conventional Magnetron to HiPIMS

Film

growth

Particle

transport

D.J. Christie, J V S T A 23, 330 (2005) D Lundin et al., P S S T 18, 045008 (2009)

Ionization

of

sputtered

spieces

Gas

dynamics

10 T. Minea

Sputtering

+

Page 11: HiPIMS: technology, physics and thin film applications

V. Kouznetsov , U. S. Patent No. 6,296, 742 B 1 (2001)

Pulsed power supply: 0.1 – 1 kHz, 200 A, 1 kV

Pulse width: ~100 s

Pulse power: 50 kW

Typical mean power: 500 W

HiPIMS power supply

HiPIMS

First Pulsed generator concept

DC - CMS

11 XIII Brazilian MRS - Symposium N / 29 September 2014

SINEX 3 power supply by PlasmAdvance

T. Minea

HiPIMS = High Voltage & High Current!

High Power Impulse Magnetron Sputtering

Page 12: HiPIMS: technology, physics and thin film applications

HiPIMS pulses in reactive gas mixture

XIII Brazilian MRS - Symposium N / 29 September 2014 12

Current waveforms for long pulses

Ar/O2 mixture, 0.5 Pa

Pulse width 200 µs

(a) 50 Hz

(b) 5 sccm

M. Hála et al., J. Phys. D: Appl. Phys (2012)

(b)

T. Minea

Page 13: HiPIMS: technology, physics and thin film applications

Self-sputtering high current, but… limited deposition rate!

Very long pulses (> 300 µs)

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014 13

A. Anders et al., J. Appl. Phys. 103 (2008)

Argon

Page 14: HiPIMS: technology, physics and thin film applications

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014 14

Back-attraction & self-sputtering

Strong Ez → Steep potential hill for M+ A. Mishra et al., Plasma Sources Sci. Technol. 19, 045014 (2010)

M +

Ez

Page 15: HiPIMS: technology, physics and thin film applications

How couple the HiPIMS power?

XIII Brazilian MRS - Symposium N / 29 September 2014 15 T. Minea

DC – overshot of the voltage at the beginning, called breakdown voltage (Vbk > Vdisch)

RF – impedance matching system

HiPIMS: Pulsed, keeping high voltage and high current

Pre-ionization before pulse

Why pre-ionization? Plasma gas conductivity is already established,

i.e. no impedance jump

Fast current rise possibility to operate with narrow pulses

Page 16: HiPIMS: technology, physics and thin film applications

Pulse time [µs]

Ganciu et al, US Patent No. 7, 927, 466 B2 (19 April 2011)

Fast HiPIMS with pre-ionization

Average Power 80 W

Pulse width ~10 μs

Frequency < 1kHz

Umax ~ 1kV

Imax ~ 100 A 16

SHORT & FAST Pulsed generator concept [2]; developed 2004

XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

Page 17: HiPIMS: technology, physics and thin film applications

Effect of reactive gases

XIII Brazilian MRS - Symposium N / 29 September 2014 17

Current waveforms for short pulses

D. Benzeggouta et al., P S S T (2009)

T. Minea

5 Pa 0.5Pa

Ar/O2 mixture; HiPIMS with pre-ionization; 10 µs, 50 Hz

Page 18: HiPIMS: technology, physics and thin film applications

HiPIMS advantages and drawbacks

advantages drawbacks

• Back-attraction to the target of ionized sputtered species

• Lower deposition rate with respect to DC, at equivalent average power

• Start and operation at very low pressure are difficult issues (p < 0.2 Pa)

High plasma density => high ionization degree of the sputtered material

Fast rise-up of both high voltage and high current 10 Aµs-1

Operation at low pressure (p > 0.4 Pa)

High sputtering yield, despite the low duty-cycle, « time on » / « time off »

18 T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

Page 19: HiPIMS: technology, physics and thin film applications

19

Other types of pulses

Modulated Pulse Power (MPP)

P.M. Barker et al., JVST A31 (2013)

t

J. Lin et al., Surf. Coat. Technol. 203,(2009)

O. Antonin et al., J Phys. D: Appl. Phys (submitted)

chopped HiPIMS

(c-HiPIMS) multi HiPIMS

(m-HiPIMS)

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

Page 20: HiPIMS: technology, physics and thin film applications

20

c-HiPIMS versus m-HiPIMS

choped-HiPIMS

P.M. Barker et al., JVST A31 (2013)

Single pulse 1x50 µs

Single pulse 1x250 µs

Multi-pulse 5x50 µs

O. Antonin et al., J Phys. D: Appl. Phys (submitted)

multi-HiPIMS

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

𝑰𝒑𝒖𝒍𝒔𝒆(𝟓𝟎µ𝒔)

𝟓

𝒊=𝟏

> 𝑰𝒔𝒊𝒏𝒈𝒍𝒆 (𝟓 × 𝟓𝟎µ𝒔)

Page 21: HiPIMS: technology, physics and thin film applications

m-HiPIMS specificities

COST Action MP-0804, HIPP Processes, O.Antonin, V.Tiron, C.Costin, G.Popa, T.Minea, 2013

21 T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

t

-1kV

-200V

TOFF

Afterglow

ion

diffusion

Pulse

ON

Dense

Plasma

Periodic Sequence characterized by the

triplet (tµon , tµoff , n)

pulse width, time off number of pulses between pulses in the sequence

P.M. Barker et al., JVST A31 (2013)

O. Antonin et al., J Phys. D: Appl. Phys (submitted)

Page 22: HiPIMS: technology, physics and thin film applications

Dual magnetron HiPIMS/RF

Challenges

• Clean room operation

• Very low pressure operation (< 0.1 Pa, UHV)

• No perturbation of the RF system

• Homogeneous thin film

• Uniform on 4” Si substrate

22 T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

N. Holtzer et al., Surf. Coat. & Technol. 250 (2014) 32

Page 23: HiPIMS: technology, physics and thin film applications

Dual HiPIMS/RF advantage

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014 23

N. Holtzer et al., Surf. Coat. & Technol. 250 (2014) 32

Pressure effect, without RF RF effect at 0.1 Pa

HiPIMS is always taking advantage of gas (pre-)ionization, here induced by the RF

Dual HiPIMS/RF deposition process can operate at lower pressures than HiPIMS alone (e.g. 0.05 Pa)

HiPIMS/RF successful operation in reactive atmosphere (Ar/N2)

RF assisted HiPIMS requires lower or even no pre-ionization

Page 24: HiPIMS: technology, physics and thin film applications

Outline

XIII Brazilian MRS - Symposium N / 29 September 2014 24

1. HiPIMS technology

2. HiPIMS magnetron plasma modelling

(OHIPIC, I-OMEGA)

3. Thin Films by HiPIMS

4. Conclusions

T. Minea

Page 25: HiPIMS: technology, physics and thin film applications

Magnetron target - 2D configuration

Tiberiu MINEA, Adrien REVEL, Claudiu COSTIN

Geometry (x, z)

Simulation volume: 2 x 2.5 cm2

Grids: 201 x 512 ÷ 401 x 2048

Cell dimensions: Dx, Dz = 10 m !!!

8 million simulation particles

Control parameters

Time step: Dt = 5 x 10-12 s ÷ 5 x 10-13 s

Simulated real time: 15 µs !!!

25 XIII Brazilian MRS - Symposium N / 29 September 2014

Debye length ne > 1013 cm-3 > 1019 m-3

le 10 µm (Te = 4eV)

T. Minea

Page 26: HiPIMS: technology, physics and thin film applications

HiPIMS current

XIII Brazilian MRS - Symposium N / 29 September 2014 26

0 2 4 6 8 10 Pulse time [µs]

OHIPIC: Orsay HIgh density plasma Particle-In-Cell model

Experiment using fast pre-ionization HiPIMS

OHIPIC model simulated discharge current

0 1 2 3 4 5 6 Pulse time [µs]

0 -300 - 600

Vo

ltag

e (

V) Current

T. Minea et al, Surf. Coat. Tech. 255, (2014) 52

T. Minea

Page 27: HiPIMS: technology, physics and thin film applications

T. Minea et al, Surf. Coat. Tech. (2014), Available online 5 December 2013

2D maps of charged particles by OHIPIC

XIII Brazilian MRS - Symposium N / 29 September 2014 27

20 15 10 5 0 5 10 15 200

5

10

15

20

25

e- density (cm

-3)

1.0E6 1.7E10 3.4E10 5.1E10 6.8E10 8.5E10

x (mm)

z (

mm

)

Ar+ density (cm

-3)

20 15 10 5 0 5 10 15 200

5

10

15

20

25

Ar+ density (cm

-3) e

- density (cm

-3)

1.0E6 1.6E11 3.3E11 4.9E11 6.6E11 8.2E11

x (mm)

z (

mm

)

20 15 10 5 0 5 10 15 200

5

10

15

20

25

Ar+ density (cm

-3)

1.0E6 9.4E11 1.9E12 2.8E12 3.8E12 4.7E12

e- density (cm

-3)

x (mm)

z (

mm

)

A (75 ns); ne = 8 x 1016 m-3 B (2 µs); ne = 8 x 1017 m-3 C (3 µs); ne = 5 x 1018 m-3

Electron density increases x 100 in 3 µs !!!

Much localized high density

Larger dense plasma=> larger race-track

T. Minea

Page 28: HiPIMS: technology, physics and thin film applications

a posteriori Monte Carlo - code OMEGA

1. Define a domain (sputter chamber)

2. Generate sputtered particles one by one randomly from a probability distribution (SED + SAD)

3. DCMS: Particle collision with process gas

4. Analyze the particle’s velocity, direction, …

OMEGA summary

3D treatment of elastic collisions

Ti/Ar DCMS discharge

No Ti-Ti collisions

No gas rarefaction

3D Metal modelling

OMEGA: Orsay MEtal transport in GAses model

XIII Brazilian MRS - Symposium N / 29 September 2014 28 T. Minea

Page 29: HiPIMS: technology, physics and thin film applications

T. Minea et al, Surf. Coat. Tech. 255, (2014) 52

0 1 2 3 4 5 6

-600

-400

-200

0

C (3.0 s)

B (2.0 s)

Ca

tho

de

vo

lta

ge

(V

)

t (s)

A (75 ns)

Short pulse Pre-ionization

A (75 ns)

B (2 µs)

C (3 µs)

Degree of Metal Ionization in HiPIMS

XIII Brazilian MRS - Symposium N / 29 September 2014 29

HiPIMS self-consistent simulated by OHIPIC code

Density maps for the three representative instants of the pulse

a posteriori MC very useful and powerful

Fast estimation of the ionization fraction of

sputtered vapour and metal ion back-attraction

I-OMEGA for HiPIMS

T. Minea

Page 30: HiPIMS: technology, physics and thin film applications

Outline

XIII Brazilian MRS - Symposium N / 29 September 2014 30

1. HiPIMS technology

2. HiPIMS magnetron plasma modelling

(OHIPIC, I-OMEGA)

3. Thin Films by HiPIMS

4. Conclusions

T. Minea

Page 31: HiPIMS: technology, physics and thin film applications

HiPIMS thin film deposition @ LPGP

31

-

Ti/TiN; Ta/TaN

Ta3N5

XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

straddles H2 and O2 evolution potential

Maeda et al., J. Phys. Chem. C 111, 2007. Archer, J. Appl. Electrochem. 5, 1975.

Energy storage applications

Page 32: HiPIMS: technology, physics and thin film applications

Ta-N films for photoelectrolysis

32

Early saturation at Ta3N5 at low N2 partial pressure in Ar

N

Ta

O

Rutherford BackScattering (Coulombic collisions)

Nuclear Reaction Analysis

RBS / NRA

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

by HiPIMS

Page 33: HiPIMS: technology, physics and thin film applications

HiPIMS Ta-N films for photoelectrolysis

Film density

Low pressure samples

Transition from ρTa, ρTaN to ρTa3N5

Dense film

High pressure samples

constant density below ρTa3N5

Porous film

33

200 nm Porous, columnar

~ 13 nm

200 nm Dense, homogeneous

M.Rudolph and al, EMRS 2014; M.Rudolph and al., IAP 2014

T. Minea XIII Brazilian MRS - Symposium N / 29 September 2014

Page 34: HiPIMS: technology, physics and thin film applications

Atomic shadowing

Conventional magnetron experiment using Cu target, where:

(left) Ar is used as sputtering gas, i.e. low ratio of metal ions compared to neutrals, resulting in atomic shadowing and bad wall coverage.

(right) Cu is sputtering Cu (self-sputtering) meaning a much higher ratio of Cu ions. Here better wall coverage is achieved and one needs less material to completely cover the trench with a Cu coating.

Cu neutrals Cu ions

Z. J. Radzimski, J. Vac. Sci. Technol. B 16, 1102 (1998)

XIII Brazilian MRS - Symposium N / 29 September 2014 34 T. Minea

Microelectronics applications

Page 35: HiPIMS: technology, physics and thin film applications

Metal tranches filling by HiPIMS

HiPIMS Conventional magnetron

© LPGP

XIII Brazilian MRS - Symposium N / 29 September 2014 35

HiPIMS is really efficient !!!

T. Minea

Page 36: HiPIMS: technology, physics and thin film applications

Ultravacuum Co-sputtering reactor

36

Si/Nb Dual HiPIMS/RF

XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

Bolometer matrixes

• High sensitivity calorimeters

• Superconducting transition edge sensors coupled to calorimeter

amorphous

Page 37: HiPIMS: technology, physics and thin film applications

Superconducting transition of Si/Nb

37

by Dual HiPIMS/RF

XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

Bolometer matrixes

• NbSi thin films alloy perform excellent transition edge at 3 mK with Tc and Resistance adjustable with temperature.

• Promising alternative to both e-beam evaporation and MS-PVD for large area bolometers applications in astrophysics.

N. Holtzer et al., Surf. Coat. & Technol. 250 (2014) 32

Page 38: HiPIMS: technology, physics and thin film applications

Conclusions

HiPIMS is an emerging technology with very high applicative

potential:

- particle and film nano-structuring

- better control of the energy deposited during the growth

- better stability and stoichiometry control, etc.

Diagnostic and modelling give today a better understanding of the

HiPIMS physics, space and time evolution of plasmas species and

energy carried to the growing film

Compatible with Clean Room requirements and already successful

38 XIII Brazilian MRS - Symposium N / 29 September 2014 T. Minea

Page 39: HiPIMS: technology, physics and thin film applications

Claudiu COSTIN

Catalin VITELARU

Vasile TIRON

Contributors

France

Romania

Lise CAILLAULT

Marie-Christine HUGON

Brigitte BOUCHER

Jean BRETAGNE

Daniel LUNDIN

Adrien REVEL

Martin RUDOLF

Olivier ANTONIN

Nils BRENING

Daniel LUNDIN

39 XIII Brazilian MRS - Symposium N / 29 September 2014

Sweden

Thanks you all for your attention!

T. Minea

Page 40: HiPIMS: technology, physics and thin film applications

XIII Brazilian MRS - Symposium N / 29 September 2014 40 T. Minea

December 9-11 2015 Paris, France

4th MIATEC – Magnetron, Ion processing & Arc Technologies European Conference

14th RSD - International Conference on Reactive Sputter Deposition

DC - CMS

Scientific joint event in Paris at the CNAM Conservatoire National des Arts et Métiers

since 1794

Social event: Visit of the « Arts and Science Museum »

Page 41: HiPIMS: technology, physics and thin film applications

Many THANKS to

41 XIII Brazilian MRS - Symposium N / 29 September 2014

Interuniversity Attraction Poles (IAP)

Phase VII - P7/34

T. Minea