highly oxygenated fullerene anions c60on− formed by corona discharge ionization in the gas phase
TRANSCRIPT
Chemical Physics Letters 384 (2004) 283–287
www.elsevier.com/locate/cplett
Highly oxygenated fullerene anions C60O�n formed
by corona discharge ionization in the gas phase
Hideki Tanaka a,*, Kazuo Takeuchi a, Yuichi Negishi b,c, Tatsuya Tsukuda b,c
a RIKEN, 2-1 Hirosawa, Wako-shi, Saitama 351-0198, Japanb Research Center for Molecular-Scale Nanoscience, Institute for Molecular Science, Myodaiji, Okazaki 444-8585, Japan
c Department of Photoscience, School of Advanced Sciences, The Graduate University for Advanced Studies, Hayama, Kanagawa 240-0193, Japan
Received 3 September 2003; in final form 18 November 2003
Published online: 29 December 2003
Abstract
Oxygenated fullerenes anions were produced by a vaporization source equipped with a corona discharge ionizer in the presence
of a trace amount of oxygen. In situ mass analysis revealed that the species formulated as C60O�n (n6 30) were formed in the source
and that the degree of oxygenation could be altered by the discharge current. Formation of the epoxide structure in the C60O�n was
suggested by XPS measurements for thin films prepared by deposition of the C60O�n beam. The structures and formation processes
of higher analogues (C60)mO�n (m ¼ 2; 3) are briefly discussed.
� 2003 Elsevier B.V. All rights reserved.
1. Introduction
Recent advances in fullerene chemistry have explored
possible applications of fullerenes as precursors or
building blocks of novel functional materials [1,2].
Chemical modifications of C60 such as oxygenation and
halogenation have yielded various families of fullerene
derivatives denoted as C60Xm [3–5]. Oxygenated fulle-
renes, C60On, attract much attention as a potential
source for elucidation of the oxidative stability of C60
and applications in areas ranging from photoelectric
devices to biological systems [6–9]. While the reported
synthetic routes of C60On include photooxygenation,
ozonolysis, and epoxidation by peroxybenzoic acids
[10–16], the degree n of the oxygenation has yet been
limited more severely than other addition reactions such
as halogenation. The reasons for this situation are (1)
poor solubility of highly oxygenated fullerenes in con-ventional organic solvents and (2) insurmountable en-
ergy barriers for reactions of fullerenes with oxygen
molecules in the ground state [17,18].
* Corresponding author. Fax: +81-48-462-4702.
E-mail address: [email protected] (H. Tanaka).
0009-2614/$ - see front matter � 2003 Elsevier B.V. All rights reserved.
doi:10.1016/j.cplett.2003.11.113
To overcome these difficulties, we have examined the
oxidation reaction of C60 molecules by use of a coronadischarge in the gas phase. The C60 molecules vaporized
into the gas phase were allowed to react with oxygen
species activated by a corona discharge. The degree nwas probed by in situ mass spectrometry in the negative-
ion mode. The chemical identity of the cluster anions
was studied by X-ray photoelectron spectroscopy (XPS)
after deposition onto a substrate. Their structure and
formation process are discussed in this Letter on thebasis of these experimental data, together with the re-
sults of a semi-empirical calculation.
2. Experiment
2.1. Cluster-ion source
The details of the cluster-ion source and the methods
of analysis have been described elsewhere [19–23]. Fig. 1
shows a schematic diagram of the cluster-ion source
equipped with a time-of-flight mass spectrometer. Pow-
der of C60 (purity 99.98%, Matsubo) contained in an
alumina boat was placed in a particle generator made of
stainless steel and vaporized by a furnace heated to 700 K
Fig. 1. Schematic diagram of the experimental setup.
284 H. Tanaka et al. / Chemical Physics Letters 384 (2004) 283–287
in a gas-flowmixture of Ar and O2, whose flow rates were
typically set to 0.99 and 0.01 slm (standard liters per
minute), respectively, by use of digital mass flow con-
trollers (MC-3102E, LINTEC). The vaporized C60 and
the O2 molecules were ionized and/or activated by a
corona discharge ionizer. The corona discharge induced
by applying a negative voltage to an electrode was reg-
ulated by a constant-current power supply (KE2005PN2/100, ME). The pressure monitored by a capacitance
manometer (Baratron Type 622, MKS Instruments) at-
tached to the ionizer was approximately 1.2� 104 Pa at a
total flow rate of 1 slm. The particle generator and
connection tubes were baked before use to minimize
impurities.
2.2. Mass analysis of cluster ions
The cluster ions produced by the corona discharge
ionizer effused through an exit hole 2 mm in diameter
and were admitted to the acceleration region of the mass
spectrometer after passing through two stages of differ-
ential pumping. The cluster anions were extracted per-
pendicularly to the initial-beam axis by applying a
pulsed high voltage ()15 kV, 200 Hz) to a set of elec-trodes. The cluster anions were steered by a set of ion
optics and detected by an inline microchannel plate lo-
cated at the end of the flight path of 1.17 m. Pulsed
signals were counted by a multichannel scaler/averager
(SR430, Stanford Research Systems).
Fig. 2. Negative-ion mass spectrum obtained by a corona discharge
ionizer operated at (a) 100 mA in neat Ar flow. Mass spectra obtained
at (b) 10 mA and (c) 100 mA in Ar flow containing 1% oxygen.
2.3. XPS analysis of clusters collected onto a substrate
XPS measurements were conducted for a thin film of
the clusters prepared by using an ion collector [24] con-
nected downstream from the ion source. The cluster an-
ions produced by the corona discharge ionizer were
electrically collected onto a Si substrate applied with
+200 V. The Si substrate was taken out of the collector
after 1 h of collection and introduced into an X-ray pho-
toelectron spectrometer (ESCALAB250, ThermoVG).
Monochromatic X-ray Al Ka radiation (1486.6 eV)
was used for the measurement. The C 1s peak of pristine
C60 (285 eV) was used as a reference for estimating
the binding energy [25]. Analysis of the spectrum was
carried out by a software package (ECLIPS, ThermoVG).
3. Results and discussion
3.1. Formation of oxygenated fullerene anions C60O�n
Fig. 2a shows a portion of a mass spectrum of
cluster anions produced by the corona discharge ionizer
Fig. 3. C 1s spectra of (a) an oxygenated C60 thin film prepared using
100 mA corona discharge and (b) a pure C60 thin film prepared
without the discharge.
H. Tanaka et al. / Chemical Physics Letters 384 (2004) 283–287 285
at 100 mA in a neat Ar gas flow. The C60 monomer
anion was dominantly observed in this spectrum, while
other ionic species produced by residual oxygen in the
Ar gas were observed as weak peaks. In contrast,
Figs. 2b, c show portions of mass spectra of the clusteranions produced by the ionizer at 10 and 100 mA, re-
spectively, in an Ar flow containing 1% oxygen. While
no C60 monomer anion was practically observed, ex-
tensive production of anions with higher masses was
observed. In both spectra, the observed anions were
composed of mass peaks with an equidistant interval of
16 a.u. This regularity supports that the anions ob-
served dominantly can be assigned to oxygenated ful-lerene anions C60O
�n . We note that interstitial mass
peaks discernible between those of C60O�n (Fig. 2b)
cannot be assigned to species formulated as C60O�n ;
they were possibly originated from impurities such as
N2 and/or H2O molecules present in the connection
tubes. Since the degree of oxygenation n was higher
under higher current conditions where the oxidants
such as O and O3 were expected to be generated moreabundantly [26], we infer that the C60On are formed via
the sequential oxygenation by these reactive species
C60 !O;O3 � � � !O;O3
C60On�1½ �� !O;O3C60On½ �� ð1Þ
The negatively charged oxygenated fullerenes C60O�n
were formed via free-electron capture by C60Om
(06m6 n) and/or the reaction of anionic oxygen species
with C60Om (06m < n) at a certain stage of reaction (1).
3.2. Structures of oxygenated fullerene anions C60O�n
The intensity distributions of Figs. 2b, c appeared to
be uniform without appreciable even–odd alternation or
magic numbers. When the discharge current was in-
creased, the intensity distribution was shifted toward a
higher mass. For example, the distribution recorded at
100 mA, shown in Fig. 2c, started at n � 4, peaked atn � 20, and faded away at n � 30. The absence of an
even–odd alternation in the n-distribution strongly
suggests that the O2 molecules are not physically ad-
sorbed onto the fullerene cage, but the O atoms are
chemically bonded to the cage. It is plausible that the
oxygen atoms are preferentially bonded to the double
bonds between two adjacent hexagonal rings (6/6
bonds) on a C60 molecule, thereby forming epoxidestructures; the existence of these structures is well es-
tablished by extensive experimental and theoretical
studies for neutral C60On molecules [10–16,27]. The
observed maximum number of n (�30) was close to the
number of 6/6 bonds on the C60 molecule. This coinci-
dence also implies the epoxidation of 6/6 bonds on the
C60 molecule.
Fig. 3 shows the C 1s spectra of (a) an oxygenatedC60 thin film prepared using the 100 mA corona dis-
charge and (b) a pure C60 thin film prepared without
the discharge. Upon deposition onto the Si substrate,
the cluster anions C60O�n were neutralized by electron
transfer to the substrate, whose work function (4.9 eV
[28]) is significantly higher than the electron affinity of
the clusters: 2.7 eV for a C60 molecule [17] and 1.6 eV for
a C60O30 estimated by a semi-empirical calculation [29].
While a dominant peak (285 eV) and shake-up satellitepeaks (287–291 eV) due to C60 molecules were observed
in spectrum (b) [30], a new peak was observed at 287 eV
in addition to those associated with the carbons of the
C60 molecules in spectrum (a). The chemical shift of the
additional peak with reference to that for the C60 mol-
ecules (+2 eV) is comparable to that reported for
epoxidized fullerenes [25]. Such a comparison shows
that the deposited oxygenated fullerenes do not formopening structures of the fullerene cages (C@O for-
mation, +4-eV chemical shift), but epoxide structures
(C–O formation, +2-eV chemical shift). Indeed, geom-
etry optimization of C60O30 with semi-empirical PM3
levels yielded a fully epoxidized form of the C60 mole-
cule, as shown in Fig. 4. If we assume that the deposition
of the C60O�n on the substrate does not lead to extensive
rearrangements of the chemical bonding, the presentresults indicate the formation of an epoxide structure for
the gas-phase C60O�n anions.
2100 2400 2700 3000
1400 1700 2000 2300
Inte
nsity
(ar
b. u
nits
)
30 40n = 20
20 30n = 10 40
Mass Number (m/z)
(a)
(b)
Fig. 5. Portions of mass spectra in regions of (a) C120O�n and (b)
C180O�n . Cluster anions were produced under 100 mA discharge in an
Ar flow containing 1% oxygen.
Fig. 4. Energetically optimized geometric structure of fully epoxidized
fullerene C60O30. Open and closed balls represent carbon and oxygen
atoms, respectively.
286 H. Tanaka et al. / Chemical Physics Letters 384 (2004) 283–287
Energetics associated with the formation of C60O�n is
considered here, for which formation of a fully epoxi-
dized fullerene anion is taken as an example,
C60 þ e� þ 30O ! C60O�30 ð2Þ
The heat of reaction of (2) is given by
DH ¼ HfðC60O30Þ � 30HfðOÞ � HfðC60Þ � EaðC60O30Þð3Þ
where Hf and Ea represent the heat of formation and the
electron affinity, respectively. The values of HfðC60Þ,HfðC60O30Þ, and EaðC60O30Þ were calculated to be 35.2,
7.8, and 1.6 eV, respectively, at semi-empirical PM3
levels. The HfðOÞ value has been reported to be 2.6 eV
[28]. By using these values, the heat of reaction DH isestimated to be )107.0 eV. Although reaction (2) over-
simplifies the complex chemical processes in the ionizer,
the overall exothermicity for the C60O�30 formation well
exceeds the energy required to release CO and/or CO2
from the C60O�n [31]. The absence of such fragmentation
channels (Fig. 2) indicates that the excess energy asso-
ciated with the oxidation reaction (1) was effectively
dissipated by inelastic collisions with Ar atoms.
3.3. Polymer anions of oxygenated fullerenes
We found that larger aggregates were formed in the
cluster source in addition to C60O�n . Fig. 5 shows
portions of a mass spectrum of cluster anions in a high-
mass region, which were recorded under the same
conditions as in Fig. 2c. Because the anions observed insuch a mass region were also composed of mass peaks
with an equidistant interval of 16 a.u., the observed
anions can be assigned to C120O�n and C180O
�n . Fig. 5
shows that C120O�25 and C180O
�30 give maximum inten-
sities within the corresponding envelope. The chemical
compositions of (C60)mO�n show that the average
numbers of O atoms per C60 unit decrease with in-
creasing m. This trend suggests that the fullerene cages
of C120O�n and C180O
�n are linked via oxo-bridges; ful-
lerene surfaces that face each other through the oxo-
bridge are not easily oxygenated due to steric hindrance
[31–33]. The oxygenated fullerenes C60On with small n
formed in the early stages of process (1) are allowed to
polymerize with C60 and/or C60On
C60On½ �� !C60On0
C60Onð Þ½ –O– C60On0ð Þ�� !C60On00 � � � ð4Þ
The polymers thus formed are subsequently oxygen-
ated by the oxidants and finally quenched in a manner
similar to that described in Section 3.2. As describedin Section 3.1, the anionic charge was introduced into
the polymer via free electrons and/or anionic oxygen
species at a certain stage of reaction (1) and (4).
4. Summary
Oxygenated fullerene anions C60O�n have been
formed efficiently by the corona discharge ionization of
C60 in the presence of a trace amount of oxygen.
H. Tanaka et al. / Chemical Physics Letters 384 (2004) 283–287 287
Epoxide structure in the C60O�n is suggested by their
uniform intensity distributions and further confirmed by
XPS measurements for the neutralized clusters collected
on the substrate. The degree of epoxidation reported
here is significantly higher than those obtained with wetchemical approaches [10–16]: a fully epoxidized fuller-
ene anion C60O�30 has been detected by mass spectrom-
etry. While it is still unclear whether the ionization of the
clusters is significantly engaged in the formation mech-
anism, the present study demonstrates that gas-phase
reactions involving fullerenes open up a new route for
their chemical modification.
Acknowledgements
We are grateful to Dr. Y. Tajima for helpful discus-
sion and Dr. A. Nakao for XPS measurements. The
present work has been supported in part by a Grant-in-
Aid for Scientific Research (Grant No. 15710098) from
the Ministry of Education, Culture, Sports, Science, and
Technology (MEXT) of Japan and the �Nanotechnology
Support Project� of MEXT, Japan.
References
[1] F. Diederich, C. Thilgen, Science 271 (1996) 317.
[2] P.R. Birkett, P.B. Hitchcock, H.W. Kroto, R. Taylor, D.R.M.
Walton, Nature 357 (1992) 479.
[3] C. Fusco, R. Seraglia, R. Curci, V. Lucchini, J. Org. Chem. 64
(1999) 8363.
[4] M.R. Resmi, S. Ma, R. Caprioli, T. Pradeep, Chem. Phys. Lett.
333 (2001) 515.
[5] K. Fujiwara, K. Komatsu, Chem. Commun. (2001) 1986.
[6] S.-C. Yang, T. Mineo, Jpn. J. Appl. Phys. 40 (2001) 1067.
[7] E.A. Katz, V. Lyubin, D. Faiman, S. Shtutina, A. Shames, S.
Goren, Solid State Commun. 100 (1996) 781.
[8] A. Sz�ucs, M. T€olgyesi, M. Nov�ak, J.B. Nagy, L. Lamberts,
J. Electroanal. Chem. 419 (1996) 39.
[9] T. Hamano, K. Okuda, T. Mashino, M. Hirobe, K. Arakane,
A. Ryu, S. Mashiko, T. Nagano, Chem. Commun. (1997) 21.
[10] K.M. Creegan, J.L. Robbins, W.K. Robbins, J.M. Millar, R.D.
Sherwood, P.J. Tindall, D.M. Cox, A.B. Smith, J.P. McCauley,
D.R. Jones, R.T. Gallagher, J. Am. Chem. Soc. 114 (1992) 1103.
[11] Y. Tajima, S. Osawa, H. Arai, K. Takeuchi, Mol. Cryst. Liq.
Cryst. 340 (2000) 559.
[12] D. Heymann, L.P.F. Chibante, Rec. Trav. Chim. 112 (1993) 639.
[13] R. Malhotra, S. Kumar, A. Satyam, J. Chem. Soc., Chem.
Commun. (1994) 1339.
[14] J.P. Deng, C.Y. Mou, C.C. Han, Fullerene Sci. Technol. 5 (1997)
1033.
[15] A.L. Balch, D.A. Costa, B.C. Noll, M.M. Olmstead, J. Am.
Chem. Soc. 117 (1995) 8926.
[16] Y. Tajima, K. Takeuchi, J. Org. Chem. 67 (2002) 1696.
[17] M.S. Dresselhaus, G. Dresselhaus, P.C. Eklund, Science of
Fullerenes and Carbon Nanotubes, Academic Press, San Diego,
1995.
[18] J. Onoe, K. Takeuchi, K. Ohno, Y. Kawazoe, J. Vac. Sci.
Technol. A 16 (1998) 385.
[19] H. Tanaka, K. Takeuchi, Jpn. J. Appl. Phys. 41 (2002) 922.
[20] H. Tanaka, K. Takeuchi, J. Aerosol, Science 34 (2003) 1167.
[21] Y. Negishi, T. Nagata, T. Tsukuda, Chem. Phys. Lett. 364 (2002)
127.
[22] Y. Negishi, H. Murayama, T. Tsukuda, Chem. Phys. Lett. 366
(2002) 561.
[23] H. Tanaka, J. Onoe, T. Hara, K. Takeuchi, Mol. Cryst. Liq.
Cryst. 340 (2000) 701.
[24] K.S. Seol, S. Tomita, K. Takeuchi, T. Miyagawa, T. Katagiri,
Y. Ohki, Appl. Phys. Lett. 81 (2002) 1893.
[25] M. Wohlers, H. Werner, D. Herein, T. Schedel-Niedrig, A. Bauer,
R. Schl€ogl, Synth. Metals 77 (1996) 299.
[26] N.J. Mason, J.D. Skalny, S. Hadj-Ziane, Czech. J. Phys. 52 (2002)
85.
[27] J.K. Feng, A.M. Ran, W.Q. Tian, M.F. Ge, Z.R. Li, C.C. Sun,
X.H. Zheng, M.C. Zerner, Int. J. Quant. Chem. 76 (2000) 23.
[28] CRC Handbook of Chemistry and Physics, 60th edn., CRC Press,
Boca Raton, 1980.
[29] J.J.P. Stewart, J. Comput. Chem. 10 (1989) 209.
[30] C. Enkvist, S. Lunell, B. Sj€ogren, S. Svensson, P.A. Br€uhwiler, A.
Nilsson, A.J. Maxwell, N. M�artensson, Phys. Rev. B 48 (1993)
14629.
[31] S.G. Penn, D.A. Costa, A.L. Balch, C.B. Lebrilla, Int. J. Mass
Spectrom. Ion Process. 169 (1997) 371.
[32] J.-P. Deng, C.-Y. Mou, C.-C. Han, Chem. Phys. Lett. 256 (1996)
96.
[33] A. Gromov, S. Lebedkin, S. Ballenwag, A.G. Avent, R.
Taylor, W. Kr€atschmer, J. Chem. Soc., Chem. Commun. (1997)
209.