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CERN Div./Group or Supplier/Contractor Document No.

TE/MSC/MDT

EDMS Document No.

1264529

Date: 2013-01-29

the

Large Hadron Collider project

CERN CH-1211 Geneva 23 Switzerland

Design and test guidelines

TE-MSC group

GUIDELINES FOR THE INSULATION DESIGN

AND ELECTRICAL TEST OF SUPERCONDUCTING ACCELERATOR

MAGNETS DURING DESIGN ASSEMBLY AND TEST PHASE.

Abstract

This document summarises the guidelines to be taken into account dimensioning the

insulation for a new superconducting magnet and it provides a template for the test

sequence to be applied. The test sequence and the acceptance values can be modified

by the project engineers, but reasons for the change shall be clearly motivated by

written in the QC documents and they shall guarantee the magnets are compatible with

LHC quality standards and test levels (i.e. EDMS 788197).

Prepared by :

P. Fessia G. Kirby J.C. Perez

F.O. Pincot

Checked by :

L. Grand-Clement R. Lopez

D. Tommasini

R. Mompo G. Dangelo

K. Dahlerup-Petersen

Approved by :

Amalia Ballarino

Davide Tommasini

Frederic Savary

Gijs De Rijk

Jean Philippe Tock

Marta Bajko

Paolo Fessia

Stephan Russenschuck

Vittorio Parma Ludovic Grand-

Clement

Roberto Lopez

Juan Carlos Perez

Glyn Kirby

TE-MSC-MDT EDMS No:1264529

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History of Changes

Rev. No. Date Pages Description of Changes


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Table of Contents

1. INTRODUCTION ....................................................................................... 5

2. AVAILABLE TECHNICAL DOCUMENTATION .............................................. 5

3. DEFINITIONS OF KEY PARAMETERS AND APPROACH TO THE TEST PLAN5 3.1.1 MAXIMUM MAGNET QUENCH VOLTAGE (Vq) ........................................................... 5 3.1.2 EXTRACTION VOLTAGE (Vee) ................................................................................ 6 3.1.3 MAXIMUM VOLTAGE REACHED DURING A QUENCH (Veeq) ........................................ 6 3.1.4 VOLTAGE REACHED DURING GENERAL POWER ABORT (VGPA) .................................. 6 3.1.5 MAXIMUM REFERENCE VOLTAGE (Vmaxr) ................................................................ 7 3.1.6 DESIGN WITHSTAND VOLTAGE (Vds) .................................................................... 7 3.1.7 TEST VOLTAGE FOR CIRCUIT QUALIFICATION (Vtql) ................................................ 7 3.1.8 TEST VOLTAGE FOR MAGNET FINAL QUALIFICATION (Vtaf) ...................................... 7 3.1.9 TEST VOLTAGE FOR MAGNET DURING ASSEMBLY .................................................. 8 3.1.10 VOLTAGE COMPARISONS .................................................................................. 9

4. DISCHARGE TEST (VdisBA, VdisAC) ............................................................. 10

4.1 OBSERVATIONS CONCERNING THE INTER-LAYER VOLTAGE .......................... 10

5. QUENCH HEATERS (Q.H.) TEST .............................................................. 10

5.1 Q.H.: HIGH VOLTAGE TEST TO THE COIL .................................................... 10

5.2 Q.H.: DISCHARGE TEST ............................................................................ 12

6. USEFUL INFORMATIONS ........................................................................ 13

7. TEST SEQUENCE .................................................................................... 16

7.1 LEGEND AND TERMINOLOGY ..................................................................... 16

7.2 LAW FOR VOLTAGE REDUCTION ALONG THE TEST CHAIN. ............................ 16

8. IDENTIFICATION CODES FOR TEST EQUIPEMENT ................................. 17

9. OTHER REMARKS ................................................................................... 17


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1. INTRODUCTION

This document summarises

1) The reference value of breakdown voltage to be taken into account in designing

new magnet insulations/components/assembly (according to the LHC

specifications)

2) The sequence of tests to be adopted to perform the electrical qualification of the

magnets during its assembly. This document provides reference test voltages.

2. AVAILABLE TECHNICAL DOCUMENTATION

The following documents have to be taken as valid specification till new documents are

published:

1) Engineering Specification “GENERAL PARAMETERS FOR ENERGY

EXTRACTION OF THE LHC SUPERCONDUCTING CIRCUITS”. LHC-DQ-ES-

0001, EDMS 338035

2) Engineering specification “Voltage Withstand Levels for Electrical

Insulation Tests on Components and Bus Bar Cross Sections for the

Different LHC Machine Circuits”, LHC-PM-ES-0001, EDMS 90327

3) Engineering Specification GENERAL PARAMETERS FOR EQUIPMENT

INSTALLED IN THE LHC”, LHC-PM-ES-0002, EDMS 100513

4) Test Procedure “ELQA QUALIFICATION OF THE SUPERCONDUCTING

CIRCUITS DURING HARDWARE COMMISSIONNING”, LHC-DE-TP-0007 rev

1.2, EDMS 788197

3. DEFINITIONS OF KEY PARAMETERS AND APPROACH TO THE

TEST PLAN

Figure 1 provides a schematic how to deduce the various voltage levels described in

this chapter

3.1.1 MAXIMUM MAGNET QUENCH VOLTAGE (Vq)

Vq is the maximum voltage developed in the superconducting magnet during quench.


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Figure 1: schematic of the High Voltage test chain

3.1.2 EXTRACTION VOLTAGE (Vee)

When a quench is detected, the QPS system will open the circuit interlock loop and the

energy extraction switches. The maximum voltage seen in the circuit versus ground

will be at the extremity of the electric chain Vee.

3.1.3 MAXIMUM VOLTAGE REACHED DURING A QUENCH (Veeq)

Veeq=Vq+Vee. If there is no energy extraction Veeq=Vq. If not known Vee is to be

assumed to be equal to 450 V. This value is based on present LHC design practice.

3.1.4 VOLTAGE REACHED DURING GENERAL POWER ABORT (VGPA)

In the case of a global power abort, all the circuits of a powering sector are switched

off almost simultaneously and the energy extraction (ee) is activated in the entire

subsector. The maximum voltage, between two circuits running along the same path,

is reached at the bus-bars and may be the sum of the individual voltages for both

circuits Vee. In this document it is assumed that the voltage rises during a magnet

quench is not propagated through the bus-bar lines and it is limited to the magnet.

Vq • Starting point: quench voltage

Vmaxr

• Maximum reference voltage: assumed to be Vq plus 450 V+150 V (difference voltage between circuits/and or extraction voltage)

Vtql • Voltage for test qualification in liquid helium =1.2 Vmaxr

Vtqgas • Voltage for test qualification in He gas = 0.5 X Vtql

Vtfdel • Voltage in air equivalent to Vtqgas: Vtfdel = 3 X Vtqgas

ΔVcryo, ΔVcold

• Difference in voltage between 1st and last test during cold test and cryostating =0.1 X Vmaxr

Vtaf • voltage for final assembly test= Vtfdel+ ΔVcryo+ ΔVcold

Vtai • Voltage for initial assembly test= Vtaf+ 0.2 X Vmaxr


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This voltage can be calculated directly by the ultimate current and the value of the ee

resistors. The max voltage reached during the General Power Abort is referred here as

VGPA. As for magnets under development it is not possible to determine the proximity

of other circuits, it is proposed here to increase the Veeq of an average constant value

(ΔVGPA). According to the present LHC experience (Table 6, page 23 of EDMS 788197)

in the worst cases the increase of test voltage, due the proximity of another circuit,

are of 200 V for the MQ circuit and more frequently 120 V for many N line circuits.

Therefore, on the base of the data reported in the previous mentioned document, it is

proposed here to assume constant value ΔVGPA equal to 150 V.

3.1.5 MAXIMUM REFERENCE VOLTAGE (Vmaxr)

The maximum reference voltage (Vmaxr) is therefore Vmaxr= Vq+Vee+ ΔVGPA . If the Vee

and ΔVGPA are not known, applying the assumptions proposed in the previous

paragraphs we get Vmaxr= Vq + 450 V+150 V. It has to be underlined that in this

scenario no faults of the QPS or of extraction system are taken into consideration,

faults that could bring to a further increase of the maximum reference voltage.

3.1.6 DESIGN WITHSTAND VOLTAGE (Vds)

The Design Withstand Voltage Vds is the reference minimum breakdown voltage for

which all magnet components, the magnets and their assembly (including later on

cryostat) shall be designed for. It shall be assumed that the voltage Vds shall be

withstood in pure He atmosphere, pressure 1 bar absolute and temperature 75 K.

The temperature has been assumed looking at which typical temperature the

maximum voltage is reached. Two cases (MQXC and HQ, Glyn Kirby and E. Todesco

private communications) have been taken into account. They provide a window

between 60 K and 90 K.

Single components shall be possibly tested in respect with this design value.

Vds=3 X Vmaxr +500 V (EDMS 90327)

In practice a single component (and not a magnet) to withstand Vds, in the above

mentioned He conditions, shall be able to withstand a breakdown voltage in air equal

to Vdsair=3.5 X Vds. Vdsair is therefore Design Withstand Voltage in Air

3.1.7 TEST VOLTAGE FOR CIRCUIT QUALIFICATION (Vtql)

Vtql is the test voltage chosen as test voltage in the document LHC-DE-TP-0007 for the

LHC circuit qualification in the step TP4-E (liquid Helium). Vtql=1.2 X Vmaxr

For the TP4-B and the TP4-D (He gas 5.5 bar 293 K and 80 K respectively) the test

voltage in gas (Vtqgas) is Vtqgas≤0.5 X Vtql. In order to be conservative we assume here

Vtqgas=0.5 X Vtql (coefficient applied for the presently installed Low Beta Quads)

3.1.8 TEST VOLTAGE FOR MAGNET FINAL QUALIFICATION (Vtaf)

As the magnets are tested in air, for their final qualification at the end of assembly,

(before delivery to cryostating and later to the cold test station), the final voltage test

after assembly Vtaf (Voltage test assembly final) shall be at least as severe, in air

condition, as the most severe test performed during the LHC qualification. The most

severe test in the machine is performed at a pressure of 5.5 bar pure He gas at 293 K.

The ratio between the dielectric strength of the He in that condition and air at 1 bar

293 K is 3.

As consequence Vtaf>=3 X Vtqgas.

It shall be taken into account that


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1) after final magnet assembly the unit is submitted to cold test and possibly

cryostating

2) it is normal procedure to have the voltage test performed step after step at

decreasing voltage

In this document 3 main range of voltage are specified:

a) Vtai and Vtaf are respectively the initial test voltage during magnet assembly and

the final test voltage during magnet assembly. Vtai> Vtaf

b) ΔVcryo is the range of voltage between the first and the last voltage test during

cryostating

c) ΔVcold is the range of voltage between the first and the last voltage test during cold

testing

We propose to assume

1) Vtaf=3 X Vtqgas + ΔVcryo + ΔVcold

2) ΔVcryo = ΔVcold = 10% Vmaxr

3.1.9 TEST VOLTAGE FOR MAGNET DURING ASSEMBLY

During magnet assembly several high voltage tests are repeated and they shall be

performed at decreasing voltage. It is assumed that the 1st initial assembly test is

performed at Vtai= Vtaf+20% Vmaxr


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3.1.10 VOLTAGE COMPARISONS

The following lines demonstrate that the test voltage is just a fraction of the design

voltage in air

Vtaf= 3 X Vtqgas + ΔVcryo + ΔVcold= 3X 0.5 X Vtql + ΔVcryo + ΔVcold =3 X 0.5 X 1.2 X Vmaxr +

0.1 Vmaxr + 0.1 Vmaxr =

= 2 Vmaxr= 2 X Vdsair/10.5 -2 X 500/3≈ 0.19X Vdsair -340

Vtai= Vtaf+0.2 Vmaxr= 2.2 X Vmaxr= 0.21 X Vdsair-340

Here below a table for few selected cases for Vq and the conceptual scheme to

extrapolate the various test voltages. Test voltages are underlined.

Vq Vq Vq Vq Vq Vq

250 V 350 V 500 V 1000 V 1500 V 2000 V

Vee 450 450 450 450 450 450

Veeq 700 800 950 1450 1950 2450

Vmaxr 850 950 1100 1600 2100 2600

Vtql 1020 1140 1320 1920 2520 3120

Vtqgas 510 570 660 960 1260 1560

Vtfdel 1530 1710 1980 2880 3780 4680

ΔVcryo,

ΔVcold 85 95 110 160 210 260

Vtaf 1700 1900 2200 3200 4200 5200

Vtai 1870 2090 2420 3520 4620 5720

Table I: Magnet key and test voltages computed in function of different Vq


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4. DISCHARGE TEST (VdisBA, VdisAC)

The aim of the discharge test is to locate possible inter-turn weaknesses. It has to be

taken into account that, under the effect of the magnetic forces, the coil turns will be

compressed. This could lead to the deterioration into short of weak insulations spots

with large induced damages (see case of MB 3004).

In this document we propose to use the following indicative test voltage per coil turn

1) Single coil, pole and any tests before mechanical assembly of the coils:

a. 120 V/Turn if NturnX120V/Turn= VdisBA <5KV.

b. 5kV/Nturn if NturnX120V/Turn>5KV then we assume a global discharge

voltage of VdisBA=5 kV.

2) Pole before collaring with structure around poles and poles after collaring:

a. 100 V/Turn if NturnX100V/Turn= VdisAC <4.25KV.

b. 4.25 kV/Nturn if NturnX100V/Turn=VdisAC >4.25KV

It is important to perform coil tests at VdisAC also in the previous stages and before

applying VdisBA. This will allow recording the discharge curves, useful for the

understanding of later tests.

The test voltage decreases from step 1 to step 2 in order to perform tests at

decreasing voltages during the magnet assembly history.

4.1 OBSERVATIONS CONCERNING THE INTER-LAYER VOLTAGE

In a typical multi-layers cosΘ pole the coils are counter wounded. This brings in

contacts, near the pole mid plane, the first and the last turn of the winding. The

voltage difference during the discharge test in this point will be equal to the full

discharge voltage (2 layers pole). This implies that, when poles are tested, it is

mandatory to verify that all the components that are foreseen in the magnet

assembly, to insulate the inner from the outer layer, are already assembled and if not,

to add an extra layer of insulation during the test. Reducing the discharge voltage is

not an option because it would reduce the inter-turn test voltage making the test

useless (Chart IV: air dielectric). It has to be remarked that during quench the same

turns will also see the maximum voltage difference Vq. If between the layers there is

not extra insulation foreseen in the design the discharge test shall be reduced to a

value comparable to Vq scaled to air: typically Vdis=3.5 (ratio dielectric air/He gas)X

1.2 (safety factor) X Vq. i.e. for Vq=250 V, Vdis= 1kV. Max value 5 kV

5. QUENCH HEATERS (Q.H.) TEST

5.1 Q.H.: HIGH VOLTAGE TEST TO THE COIL

According to the document EDMS 788197 the voltage for the High voltage test of the

Quench Heaters vs. coil on liquid helium Vmic-c is given by

Vmic-c=1.2X(Vq+900V)

In this test coil and ground are shortened together

The Vmic-c value is limited for practical reasons to a max level of 2 kV

The indicated 900 V is the voltage provided by standard LHC Q.H. power supply (The

voltage seen by a quench heater in case of a discharge is +/- 450 V, but in case of

failure of a DQHDS, it could be 900 V and this value it has been assumed as reference

for the tests).


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For the warm test in He atmosphere, 5.5 bar, 293 K the value Vmic-w is limited to 600 V

and generally is 1/3 of the Vmic-c.

The test value in air shall therefore be 3.5 time the test value Vmic-w. This value is

reported below as VQH-coil.

Following the same scheme applied before this test voltage shall be increased in order

to cover the full assembly chain. Following this scheme it is possible to build the table

here below where (starting from the last test and coming back on the magnet

assembly line)

VtfQHdel : is the test voltage applied to the cryo-assembly before delivery to the

installation. It is assumed to be equal to VQH-coil

ΔVcryo, ΔVcold: these are the difference in voltage between the 1st and the last test

during cryostating and cold test respectively. They are assumed to be 10% of the

voltage applied by the Q.H. power supply and therefore 90 V

VtQHaf: this is the voltage to be applied for the last test along the magnet assembly

chain

VtQHai: this is the voltage to be applied for the 1st test along the magnet assembly

chain (VtQHaf- VtQHai is twice the ΔVcryo or ΔVcold therefore equal to 180 V)

Vq Vq Vq Vq Vq Vq

250 V 350 V 500 V 1000 V 1500 V 2000 V

Vmic-c 1380 1500 1680 2000 2000 2000

Vmic-w 455 495 554 660 660 660

VQH-coil 1366 1485 1663 1980 1980 1980

VtfQHdel 1366 1485 1663 1980 1980 1980

ΔVcryo, ΔVcold 90 90 90 90 90 90

VtQHaf 1546 1665 1843 2160 2160 2160

VtQHai 1726 1845 2023 2340 2340 2340

Table II: Quench Heaters Key and test voltages computed in function of different Vq

We assume

ΔVcryo= ΔVcold= 0.5X(VtQHaf- VtQHai)=10%(900V)

In addition we propose to assume the design voltage and the component test voltage for the quench heaters as it follows:

1) Maximum test voltage at 5.5 bar 293 K: 660 V

2) Equivalent voltage to be withstood at 1 bar 75 K: 1000 V

3) Equivalent voltage to be withstood in air 1 bar: 3500 V (3.5 X 1000 V)

4) Design voltage in air: 2 times the voltage to be withstood in air: 7000 V

5) Component test voltage 5000 V


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5.2 Q.H.: DISCHARGE TEST

The Q.H shall be discharged with the same power supply as foreseen for the future

magnet operation. If the foreseen discharge voltage is higher than 900 V to be added

to the Vq then the voltage test of point 5.1 shall be accordingly increased.


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6. USEFUL INFORMATIONS

Useful information to compare He dielectric behaviours between room and cryogenic

temperature and in function of pressure are reported in the following attached charts

I, II and III. These charts are derived from the curve of the He breakdown voltage in

function of the product density by distance [“Paschen Curve of Helium” J. Gerhold

T.W. Dakin Electra, Vol. 52, pages 80-86 1977]. Then the density is derived in

function temperature and pressure from the He phase diagram, no approximation of

the ideal gas equation is used here. In the following table please find the He gas

density in a selected series of temperature and pressure pairs. In green the area

where the ideal gas approximation would be applicable.

Density [g/cm^3]

T [K] P 0.1 bar P 0.5 bar P 1 bar P 2 bar P 5 bar P 6 bar P 10 bar

4.5 1.09 6.00 14.23

10 0.48 2.40 4.95 10.20 28.00 34.00 61.00

20 0.24 1.20 2.40 4.82 12.11 14.55 24.28

75 0.06 0.32 0.64 1.28 3.18 3.81 6.30

275 0.02 0.09 0.17 0.35 0.87 1.05 1.74

300 0.02 0.08 0.16 0.32 0.80 0.96 1.60


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Chart I Helium breakdown voltage vs. electrode distance at 275 K and with varying pressure

Chart II Helium breakdown voltage vs. electrode distance at 10 K and with varying pressure

100

1000

10000

0.001 0.01 0.1 1 10 100 1000

Bre

kad

wo

wn

vo

ltag

e [

V]

Electrode distance [mm]

Helium Breakdown voltage in function of electrode distance at 275 K and varying pressure

275 K P 0.5 bar

275 K P 0.1 bar

275 K P 1 bar

275 K P 2 bar

275 K P 5 bar

275 K 6 bar

275 K 10 bar

P 293 1 bar other source

100

1000

10000

0.00001 0.0001 0.001 0.01 0.1 1 10 100

Bre

kad

wo

wn

vo

ltag

e [V

]



10 K P 0.1 bar

10 K P 0.5 bar

10 K P 1 bar

10 K P 2 bar

10 K P 5 bar

10 K 6 bar

10 K 10 bar


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Chart III Helium breakdown voltage vs. electrode distance at 75 K and with varying

pressure

Chart IV Helium and Air breakdown voltage vs. electrode distance in selected conditions

100

1000

10000

0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000

Bre

kad

wo

wn

vo

ltag

e [

V]



75 K P 0.1 bar

75 K P 0.5 bar

75 K P 1 bar

75 K P 2 bar

75 K P 5 bar

75 K 6 bar

75 K 10 bar

100

1000

10000

0.001 0.01 0.1 1 10 100

Bre

kad

wo

wn

vo

ltag

e [

V]


Helium and Air Breakdown voltage in function of electrode distance in few selected pressure and temperature conditions

275 K P 1 bar

75 K P 1 bar

275 K P 5 bar

275 K AIR 1 bar


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7. TEST SEQUENCE

7.1 LEGEND AND TERMINOLOGY

1) TEST CODE : an identification code for the test

2) TITLE : Test short name

3) TYPE : Type of measure

4) OBJECT : component tested

SH = spot heater, BSH = beam simulation heater, QH = quench heater, TT =

temperature sensor

5) SHORT DESCRIPTION: short description of test if necessary

6) PRIORITY of test :

a. Mandatory Q.C. [MQC]: the test shall be performed

b. Optional [Opt] : the test can be performed

c. Investigative [Inv]: the test shall be performed as preparatory test of a

mandatory Q.C.

7) TEST CONDITION: i.e. voltage. Two values will be given a set value and a formula

to compute the voltage according to previous philosophy above

8) TIME: duration of test if necessary

9) TOLERANCE: values inside which the test is considered to be ok

10) EQUIPMENT: equipment used for the test

7.2 LAW FOR VOLTAGE REDUCTION ALONG THE TEST CHAIN.

Values shall be rounded to the nearest upper decade

Vtaf : voltage for final assembly test

Vtai : Voltage for initial assembly test

Vtaf < Vtai

N : number of test serie

n є [0;N]

During a test serie Vtestn = Vtai - n(Vtai-Vtaf)/N = Ttestn-1 - (Vtai-Vtaf)/N


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8. IDENTIFICATION CODES FOR TEST EQUIPEMENT

Electrical test Equipment

A DMM as KEITHLEY 2000 multimeter

B Stabilized DC current supply as Agilent 6631B

C MEGGER BM21 / MEGGER S1-1052

D Oscilloscope as Tektronix TDS 3014

E LCR Meter 879B BK Precision / equipment F

F LCR meter as HP 4263B LCR meter

G SEITZ Impulse tester

H EFACEC Heater discharge Power Supply

I Labview data transfert software

J Press of Young modulus

K Tektronix probe P6015A

L Connection cable and/or specific rack

9. OTHER REMARKS

1) RDC: resistance measurement in direct current shall be always reported at values

scaled to 20º C

2) All instrumentation tests are submitted to the verification that the instrumentation

to be tested (i.e. temperature probes) would withstand the test current and

voltages

CERN Div./Group or Supplier/Contractor Document No.

TE/MSC/MDT

EDMS Document No.

1264529

Date: 2013-01-29

the

Large Hadron Collider project

CERN CH-1211 Geneva 23 Switzerland

Summary of tests and of voltages to be applied

type of magnet

test phase code

Coil/Pole/Aperture Insulation and

dielectric to ground

Q.H. Insulation and dielectric to pole and to ground together

Insulation/dielectric instrumentation

Pole Discharge Q.H. discharge

Serie

s o

f te

st

Nb-T

i

L 200 V NA >=1 kV 120V/turn 5kVmax NA

BYM NA VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

AYM NA VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

P 200 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

Nb

3S

n

PBR 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

PAR 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

PBI 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

PAIM VT[i] Table I VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

PAI VT[i] Table I VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A

PHE NA From VQH[i] /10 to VQH[i] /3 >=1 kV 120V/turn 5kVmax 900V 80A

All

ma

gnets

BC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A

APC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A

AC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A

AI VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A

FINAL Vtaf Table I VtQHaf Table II >=1 kV 100V/turn 4.25kVmax 900V 80A


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L : Test of single layer, Nb-Ti, after curing splice version - L

BYM : Test of pole : 2 layers, Nb-Ti, splice version, before Young modulus – BYM

AYM : Test of pole : 2 layers, Nb-Ti, splice version, after Young modulus – AYM

P : Test of pole : 1 layer test, Nb-Ti, no splice version – P

PBR : Test of pole : Nb3Sn, before reaction – PBR

PAR : Test of pole : Nb3Sn, after reaction – PAR

PBI : Test of pole : Nb3Sn, before impregnation – PBI

PAIM : Test of pole : Nb3Sn, after impregnation still in the mould - PAIM

PAI : Test of pole : Nb3Sn, after impregnation still out of the mould – PAI

PHE : Test of pole : Nb3Sn, after impregnation still out of the mould 0.1 bar He – PHE

BC : Test of collared coil before collaring or pre-collaring – BC

APC : Test of collared coil after pre-collaring – APC

AC : Test of collared coil after collaring – AC

AI : Test of the magnet after interconnection – AI

FINAL : Final Test of the magnet before delivery – FINAL

VQH[i]: Test voltage for the High Voltage test of the Quench Heater to be applied to the ith test

VT[i] : Test voltage for the High Voltage test of the windings to be applied to the ith test


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Test of single layer, Nb-Ti, after curing splice version - L

Test code Title Type Object Short description Priority Test condition Time [sec]

Tolerances Equipment

Lop1 Coil to copper wedge

Insulation Coil Insulation coil to copper wedge Opt 200 V 60 sec C

L1 Coil to ground Insulation Coil Insulation of the coil in its curing mould to ground

MQC 200 V 60 sec > 1000 MΩ C

L2 RDC Resistance Coil Resistance measurement of coil MQC 6A NA Ref coil +/- 3% A, B

L2_XXXX RDC Resistance Resistance measurement of instrumentation

MQC 1A / 4 wires NA Reference value for future measurements

A, B

L3 Inductance Inductance Coil Coil inductance test MQC 100 Hz, 1 KHz,

10 KHz

NA L[ref coil] +/- 2% E

L4 Coil inter-turn discharge

Discharge Coil Discharge test to identify turn to turn problems

Inv 30 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K

Inv 60 V/turn

MQC 120 V/turn

Lop2 Discharge under stress SP

Discharge Coil Discharge while putting the straight part in an insulation mould at P=80MPa

Opt 120 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K

Lop3 Discharge under stress ends

Discharge Coil Discharge while putting the ends in an insulation mould at P=80MPa decreasing to 0 MPa over the heads



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Test of pole : 2 layers, Nb-Ti, splice version, Before Young Modulus measurements - BYM



BYM 1 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly

MQC 1A NA Compare to previous component measurement +/- 2%

A, B

To be applied if Q.H are under coils and already assembled

BYM 2_XXXX RDC instrumentation

Resistance RDC of each component MQC 1A / 4 wires NA Compare to previous component measurement +/- 2%

A, B

BYM 3 Inductance Inductance Pole Pole inductance measurement MQC 100 Hz, 1 KHz, 10 KHz

NA L[ref pole] +/- 2% E

BYM 4 Dielectric Current leakage

Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil

INV VQH[i] /2 30 sec 5 min

>1000 MΩ; < (2 × VQH[i]/900)μA

C

MQC VQH[i] >500 MΩ; < (5 × VQH[i]/900) μA

BYM 5 Coil discharge

test

Discharge Pole Discharge test to identify turn to

turn problems

INV 30 V 10 puls Ref coil τ +/- 1% D, G, I, K

INV 60 V

MQC 120 V

BYM 6 Q.H. discharge Discharge QH To be applied if Q.H are between

coils and already assembled

INV 450 V (or 40A) Compare initial I and

tau with reference

D, H, I

MQC 900 V (or 80A)

BYM 7 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B


BYM 8 Dielectric Current leakage


INV VQH[i]/2 5 min < (2 × VQH[i]/900) μA C

MQC VQH[i] < (5 × VQH[i]/900) μA


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Test of pole : 2 layers, Nb-Ti, splice version, after Young modulus - AYM



AYM1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Inner layer +outer layer +/- 2%

A, B

AYM2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B


AYM3_XXXX RDC instrumentation

Resistance RDC of each component MQC 1A / 4 wires NA Compare to previous component measurement +/- 2%

A, B

AYM4 Inductance Inductance Pole Pole inductance measurement MQC 100 Hz, 1 KHz, 10 KHz

NA L[ref pole] +/- 2% E

AYM5 Dielectric Current leakage


INV VQH[i] /2 30 sec 5 min

>1000 MΩ; < (2 × VQH[i]/900) μA

C

MQC VQH[i] >500 MΩ; < (5 × VQH[i]/900) μA

AYM6 Coil discharge test

Discharge Pole Discharge test to identify turn to turn problems

INV 30 V 10 puls Ref coil τ +/- 1% D, G, I, K

INV 60 V

MQC 120 V

AYM7 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled

INV 450 V (or 40A) Compare initial I and tau with reference

D, H, I

MQC 900 V (or 80A)

AYM8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B


AYM9 Dielectric Current leakage


INV VQH[i]/2 5 min < (2 × VQH[i]/900) μA C

MQC VQH[i] < (5 × VQH[i]/900) μA


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Test of pole : 1 layer test, Nb-Ti, no splice version - P



Pop1 Pole to copper wedge

Insulation Pole Insulation pole to copper wedge Opt 200 V 30 sec > 1000 MΩ C

P1 Pole to ground

Insulation Pole Insulation of the pole in its curing mould to ground

MQC 200 V 30 sec > 1000 MΩ C

P2 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

P3 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B


P4_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

P5 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


P6 Coil inter-turn discharge



Inv 60 V/turn

MQC 120 V/turn

Pop2 Discharge under stress SP

Discharge Pole Discharge while putting the straight part in an insulation mould at P=80MPa


Pop3 Discharge under stress ends

Discharge Pole Discharge while putting the ends in an insulation mould at P=80MPa decreasing to 0 MPa over the ehads


P7 Dielectric Q.H. to coil pre-test

Current leakage


INV VQH[i] /4 V 30 sec. 5 min

>1000 MΩ; <

(VQH[i]/900) μA

C

INV VQH[i] /2 V >1000 MΩ; < (2 × VQH[i]/900) μA

MQC VQH[i] V >500 MΩ; < (5 × VQH[i]/900) μA

P8 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled

INV Max [(850V, 80A)/2]

Compare initial I and tau with reference

D, H, I

MQC Max [850V, 80A]

P9 Dielectric Q.H. to coil

Current leakage

Pole, QH To be applied if Q.H are between coils and already assembled QH->

INV VQH[i] /4 V 30 sec. 5 min

>1000 MΩ; <

(VQH[i]/900) μA

C


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pre-test coil INV VQH[i] /2 V >1000 MΩ; < (2 ×

VQH[i]/900) μA

MQC VQH[i] V >500 M0Ω; < (5 VQH[i]/900) μA


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Test of pole : Nb3Sn, before reaction - PBR



PBR1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

PBR2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are under coils and already assembled before reaction

PBR3_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

PBR4 Pole to ground

Insulation Pole Insulation of the pole in its reaction mould to ground

Inv 50 V 60 sec > 1000 MΩ C

PBR5 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PBR6 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before reaction

Inv VQ[i] 30 sec. 5 min

>1000 MΩ; < (2X VQH[i]/900) µA

C

PBR7 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled and completed before reaction


D, H, I

MQC 900 V (or 80A)

PBR8 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled before reaction

MQC VQ[i] 30 sec. 5 min

>1000 MΩ; < (2 × VQH[i]/900]) µA

C

PBR9 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are under coils and already assembled before reaction


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Test of pole : Nb3Sn, after reaction - PAR



PAR1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

PAR2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are under coils and already assembled after reaction

PAR2_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

PAR3 Pole to ground

Insulation Pole Insulation of the pole in its reaction mould to ground

Inv 50 V 60 sec > 1000 MΩ C

PAR4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PAR5 Insulation resistance Q.H. to coil



>1000 MΩ; < (2 × VQH[i]/900) µA

C

PAR6 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled and completed before reaction


D, H, I

MQC 900 V (or 80A)

PAR7 Insulation resistance Q.H. to coil



>1000 MΩ; < (2 × VQH[i]/900) µA

C

PAR8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are between coils and already assembled and completed before reaction


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Test of pole : Nb3Sn, before impregnation - PBI



PBI1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

PBI2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are under coils and already assembled before impregnation

PBI2_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

PBI3 Pole to ground

Insulation Pole Insulation of the pole in its impregnation mould to ground

Inv 50 V 60 sec > 1000 MΩ C

PBI4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PBI5 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before impregnation


>1000 MΩ; < (2 × VQH[i]/900) µA

C

PBI6 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled and completed before impregnation


D, H, I

MQC 900 V (or 80A)

PBI7 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before impregnation


>1000 MΩ; < (2 × VQH[i]/900) µA

C

PBI8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are between coils and already assembled and completed before impregnation


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Test of pole : Nb3Sn, after impregnation still in the mould - PAIM



PAIM1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

PAIM2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B


PAIM2_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

PAIM3 Pole to ground

Insulation Pole Insulation of the pole in its impregnation mould to ground

Inv VT[i] 30 sec > 1000 MΩ C

PAIM4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PAIM5 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled before impregnation


>1000 MΩ; < (2 × VQH[i]/900) µA

C

PAIM6 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled before impregnation


D, H, I

MQC 900 V (or 80A)

PAIM7 Insulation resistance Q.H. to coil

Insulation Pole, QH To be applied if Q.H are between coils and already assembled before impregnation


>1000 MΩ; < (2 × VQH[i]/900) µA

C

PAIM8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B



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Test of pole : Nb3Sn, after impregnation out of the mould - PAI



PAI1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B

PAI2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

To be applied if Q.H are under coils and already assembled before

impregnation

PAI2_XXXX RDC Resistance Resistance measurement of instrumentation


A, B

PAI3 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PAI4 Pole inter-turn discharge



Inv 60 V/ turn

MQC 120 V/turn

PAI5 Dielectric Q.H. to coil pre-test

Current leakage


INV VQ[i]/4 30 sec. 5 min

>1000 MΩ; < (2X VQH[i]/900) μA

C

INV VQ[i]/2 >1000 MΩ; < (5 × VQH[i]/900) μA

MQC VQ[i] >500 MΩ; < (10 × VQH[i]/900) μA

PAI6 Q.H. discharge

Discharge QH To be applied if Q.H are between coils and already assembled before impregnation


D, H, I

MQC 900 V (or 80A)

PAI7 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly


A, B

PAI8 Dielectric Q.H. to coil pre-test

Current leakage


INV VQ[i]/4 30 sec. 5 min

>1000 MΩ; < (2 × VQH[i]/900) μA

C

INV VQ[i]/2 >1000 MΩ; < (5 × VQH[i]/900) μA

MQC VQ[i] >500 MΩ; < (10 × VQH[i]/900) μA


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Test of pole : Nb3Sn, after impregnation 0.1 bar He - PHE



PHE1 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz


PHE5 Dielectric Q.H. to coil pre-test

Current leakage


INV VT[i]/10 30 sec. 5 min

>1000 MΩ; < 1 μA C

INV VT[i]/5 >1000 MΩ; < 2.5 μA

MQC VT[i]/3 >500 MΩ; < 10 μA

PHE2 Pole inter-turn discharge


MQC 10 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K

MQC 20 V/turn

MQC 40 V/turn

PHE3 Pole inter-turn discharge


MQC 60 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K

PHE5 Dielectric Q.H. to coil pre-test

Current leakage


INV VT[i]/10 30 sec. 5 min

>1000 MΩ; < 1 μA C

INV VT[i]/5 >1000 MΩ; < 2.5 μA

MQC VT[i]/3 >500 MΩ; < 10 μA


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Test of collared coil before collaring or pre-collaring - BC

Test code Title Type Object Short description Priority

Test condition Time [sec]


BC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%

A, B

BC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%

A, B

BC3_XXXX RDC instrumentation

Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%

A, B

BC4 Capacitance Capacitance Pole, QH

Q.H. to its pole on which they are assembled

MQC NA NA Compare single poles among them and to previous assembly

E

Single pole to ground

Single pole to single pole

All poles to ground

BC5_XXXX Capacitance Capacitance Instrumentation to poles between which they are

MQC NA NA Compare single result among them and to previous assembly

E

BC6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz

Compare single poles among them and to previous assembly

E

L of all poles temporarily in series

BC7 Dielectric Current leakage

Pole, QH

Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min

>1000 MΩ; < (10 × VQH[i]/900) μA

C

All poles to all Q.H.

Single pole to each other pole VT[i]

BC8_XXXX Dielectric Current leakage

All Poles + instrumentation to ground MQC VT[i]

30 sec. 5 min

>1000 MΩ; < (

10 × VQH[i]/900) μA

C

All poles to instrumentation

BC9 Discharge test Discharge Pole Single poles all poles temporarily in series

INV 30 V/turn Previous test D, G, I, K

INV 60 V/turn

MQC 100 V/turn

BC10 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B

BC11 Q.H. Dielectric Current leakage

QH Q.H. to ground MQC VQH[i] 30 sec. 5 min

>1000 MΩ; < (10 × VQH[i]/900) μA

C

Q.H. to poles

Strip to strip if on different circuits

BC12_XXXX insulation Insulation instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C


of 40

resistance instrumentation to its poles

BC13 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled


D, H, I

MQC 900 V (or 80A)

BC14 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with BC10 results

A, B

BC15 Q.H. Dielectric Current leakage


>1000 MΩ; < (10 × VQH[i]/900) μA

C

Q.H. to poles



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Test of collared coil after pre-collaring - APC




APC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%

A, B

APC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%

A, B

APC 3_XXXX RDC instrumentation


A, B

APC 4 Capacitance Capacitance Pole, QH



E



All poles to ground

APC 5_XXXX Capacitance Capacitance Instrumentation to poles between which they are


E

APC 6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz


E


APC 7 Dielectric Current leakage

Pole, QH


>1000 MΩ; < (10 X VQH[i]/900) μA

C


APC 8 Dielectric Current leakage

Pole, QH

Single pole to each other pole MQC VT[i] 30 sec. 5 min

>1000 MΩ; < (10 X VT[i]/5000) μA

C

APC 9_XXXX Dielectric Current leakage


30 sec. 5 min

>1000 MΩ; < (10 X VT[i]/5000) μA

C


APC 10 Discharge test Discharge Pole Single poles all poles temporarily in series


INV 60 V/turn

MQC 100 V/turn

APC 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B

APC 12 Q.H. Dielectric Current leakage


>1000 MΩ; < (10 x VQH[i]/900) μA

C

Q.H. to poles


APC insulation Insulation instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C


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13_XXXX resistance instrumentation to its poles

APC 14 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled


D, H, I

MQC 900 V (or 80A)

APC 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with APC11 A, B

APC 16 Q.H. Dielectric Current leakage


>1000 MΩ; < (10 x VQH[i]/900) μA

C

Q.H. to poles



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Test of collared coil after collaring - AC




AC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%

A, B

AC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%

A, B

AC 3_XXXX RDC instrumentation


A, B

AC 4 Capacitance Capacitance Pole, QH



E



All poles to ground

AC 5_XXXX Capacitance Capacitance Instrumentation to poles between which they are


E

AC 6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz


E


AC 7 Dielectric Current leakage

Pole, QH


>1000 MΩ; < (10 × VQH[i]/900) μA

C


AC 8 Dielectric Current leakage

Pole, QH

Single pole to each other pole MQC VT[i] 30 sec. 5 min

>1000 MΩ; < (10 ×5000/ VT[i]) μA

C

AC 9_XXXX Dielectric Current leakage


30 sec. 5 min

>1000 MΩ; < (10 ×5000/ VT[i]) μA

C


AC 10 Discharge test Discharge Pole Single poles all poles temporarily in series


INV 60 V/turn

MQC 100 V/turn

AC 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B

AC 12 Q.H. Dielectric Current leakage


>1000 MΩ; < (10 × VQH[i]/900) μA

C

Q.H. to poles


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AC 13_XXXX insulation resistance

Insulation BSH instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C

instrumentation to its poles

AC 14 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled


D, H, I

MQC 900 V (or 80A)

AC 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with AC11 results

A, B

AC 16 Q.H. Dielectric Current leakage


>1000 MΩ; < (10 × VQH[i]/900) μA

C

Q.H. to poles



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Test of the magnet after interconnection - AI



AI1 RDC Resistance Pole RDC of poles in serie and Vtaps MQC 6 A NA Previous measured value +/- 1%

A, B

AI2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%

A, B

AI3_XXXX RDC instrumentation


A, B

AI4 Capacitance Capacitance Pole, QH Q.H. to poles MQC NA NA Compare to previous assembly

E

All poles to ground

AI5_XXXX Capacitance Capacitance Instrumentation to poles between which they are

MQC NA NA Compare to previous assembly

E

AI6 Inductance Inductance Pole L of all poles in series MQC 100 Hz, 1 KHz, 10 KHz

Compare to previous assembly

E

AI7 Dielectric Current leakage

Pole, QH Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min

>1000 MΩ; < (10 × VQH[i]/900) μA

C


AI8 Dielectric Current leakage

Pole, QH All Poles to ground MQC VT[i] 30 sec. 5 min

>1000 MΩ; < (10 × VT[i]/5000) μA

C

AI9_XXXX Dielectric Current leakage

All Poles + All instrumentation to ground

MQC VT[i] 30 sec. 5 min

>1000 MΩ; < (10 × VQH[i]/5000) μA

C

AI10 Discharge test Discharge Pole All poles in series INV 60 V/ turn Previous test D, G, I, K

MQC 100 V/ turn

AI11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B

AI12 Q.H. insulation resistance

Insulation QH Q.H. to ground MQC VQH[i] 30 sec. > 1000 MΩ C

Q.H. to poles


AI13_XXXX Insulation resistance

Insulation instrumentation to ground MQC 1 kV 30 sec. > 1000 MΩ C

instrumentation to poles

AI14 Q.H. discharge Discharge QH Discharge each single Q.H. MQC 900 V (or 80A) Compare initial I and tau with reference

D, H, I


of 40

AI15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with AI11 A, B

AI16 Q.H. insulation resistance

Insulation QH Q.H. to ground MQC VQH[i] 30 sec. Compare with AI12 C

Q.H. to poles



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Final Test of the magnet before delivery - FINAL



FINAL 1 RDC Resistance Pole RDC of poles in serie and Vtaps MQC 6 A NA Previous measured value +/- 1%

A, B

FINAL 2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%

A, B

FINAL 3_XXXX

RDC instrumentation


A, B

FINAL 4 Capacitance Capacitance Pole, QH Q.H. to poles MQC NA NA Compare to previous assembly

E

All poles to ground

FINAL 5_XXXX

Capacitance Capacitance Instrumentation to poles between which they are

MQC NA NA Compare to previous assembly

E

FINAL 6 Inductance Inductance Pole L of all poles in series MQC 100 Hz, 1 KHz, 10 KHz

Compare to previous assembly

E

FINAL 7 Dielectric Current leakage

Pole, QH Poles + Q.H to ground MQC VtQHaf 30 sec. 5 min

>1000 MΩ; < (10 ×

VtQHaf /900) μA

C


FINAL 8 Dielectric Current leakage

Pole, QH All poles to ground MQC VTaf 30 sec. 5 min

>1000 MΩ; < (10 ×

VTaf /5000) μA

C

FINAL 9_XXXX

Dielectric Current leakage

All Poles + All instrumentation to ground

MQC VTaf 30 sec. 5 min

>1000 MΩ; < (10 ×

VTaf /5000) μA

C

FINAL 10 Discharge test Discharge Pole All poles in series INV 60 V/ turn Previous test D, G, I, K

MQC 100 V/ turn

FINAL 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B

FINAL 12 Q.H. insulation resistance

Insulation QH Q.H. to ground MQC VtQHaf 30 sec. > 1000 MΩ

< (10 × VtQHaf /900)

μA

C

Q.H. to poles


FINAL Insulation Insulation instrumentation to ground MQC 1 kV 30 sec. > 1000 MΩ C


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13_XXXX resistance instrumentation to poles

FINAL 14 Q.H. discharge Discharge QH Discharge each single Q.H. MQC 900 V Compare initial I and tau with reference

D, H, I

FINAL 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with FINAL 11

A, B

FINAL 16 Q.H. insulation resistance

Insulation QH Q.H. to ground MQC VtQHaf 30 sec. Compare with FINAL 12

C

Q.H. to poles


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