formfactor inc. | semiconductor test and measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 ccc (amp)...

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Page 1: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 2: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 3: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 4: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 5: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 6: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force
Page 7: FormFactor Inc. | Semiconductor Test and Measurement1.5 1.0 0.0 02 04 06 0.8 1.0 1.2 14 16 CCC (Amp) Figure 1. Typical plot resulting from the SEMI methodology; a 20% contact force