final report 5thed - semantic scholar...junaid aslam lith-isy-ex-3597-2005 supervisor: professor...
TRANSCRIPT
Study and Comparison of On-Chip LC Oscillators for Energy Recovery Clocking
Master thesis performed in Electronic Devices by
Junaid Aslam
LiTH-ISY-EX-3597-2005
Study and Comparison of On-Chip LC Oscillators for Energy Recovery Clocking
Master thesis performed in
Electronic Devices, Dept. of Electrical Engineering,
at Linköping University by
Junaid Aslam LiTH-ISY-EX-3597-2005
Supervisor: Professor Atila Alvandpour
Examiner: Professor Atila Alvandpour
Linköping 2005-02-16
Avdelning, Institution Division, Department Institutionen för systemteknik 581 83 LINKÖPING
Datum Date 2005-02-16
Språk Language
Rapporttyp Report category
ISBN
Svenska/Swedish X Engelska/English
Licentiatavhandling X Examensarbete
ISRN LITH-ISY-EX-3597-2005
C-uppsats D-uppsats
Serietitel och serienummer Title of series, numbering
ISSN
Övrig rapport ____
URL för elektronisk version http://www.ep.liu.se/exjobb/isy/2005/3597/
Titel Title
Study and Comparison of On-Chip LC Oscillators for Energy Recovery Clocking
Författare Author
Junaid Aslam
Sammanfattning Abstract This thesis deals with the study and comparison of on-chip LC Oscillators, used in energy recovery clocking, in terms of Power, Area of Inductor and change in load capacitance. Simulations show how the frequency of the two oscillators varies when the load capacitance is changed from 5pF to 105pF for a given network resistance. A conventional driver is used as a reference for comparisons of power consumptions of the two oscillators. It has been shown that the efficiency of the two oscillators can exceed that of a conventional driver provided the distribution network resistance is low and the on-chip inductor has a high enough Q value. Conclusions drawn from the simulations, using network resistances varying from 0Ω to 4Ω, show that the selection of the oscillator would depend on the network resistance and the amount of area available for the inductors.
Nyckelord Keyword On-chip oscillators, LC oscillators, energy recovery clocking, on-chip inductor
- 1 -
ABSTRACT
This thesis deals with the study and comparison of on-chip LC Oscillators, used in
energy recovery clocking, in terms of Power, Area of Inductor and change in load
capacitance. Simulations show how the frequency of the two oscillators varies
when the load capacitance is changed from 5pF to 105pF for a given network
resistance. A conventional driver is used as a reference for comparisons of power
consumptions of the two oscillators. It has been shown that the efficiency of the
two oscillators can exceed that of a conventional driver provided the distribution
network resistance is low and the on-chip inductor has a high enough Q value.
Conclusions drawn from the simulations, using network resistances varying from
0Ω to 4Ω, show that the selection of the oscillator would depend on the network
resistance and the amount of area available for the inductors.
- 2 -
- 3 -
ACKNOWLEDGEMENTS
I would like this opportunity to thank my advisor Prof. Atila Alvandpour for all of
his help and useful advice and for providing the resources to work on this Thesis. I
would also like to thank Behzad Mesgarzadeh for helping me during my work on
Dual Phase LC Oscillators, Peter Caputa and Martin Hansson for helping with
interconnect parasitics and Rebecca Källsten for commenting on the report. I
would also like to thank my parents Mr. and Mrs. Aslam for their support
throughout this crucial period and Janina Eidam for the inspiration. Last but not
least I would like to thank God for giving me the will to work.
- 4 -
- 5 -
TABLE OF CONTENTS
ABSTRACT....................................................................................................................- 1 - ACKNOWLEDGEMENTS............................................................................................- 3 - TABLE OF CONTENTS................................................................................................- 5 - 1. INTRODUCTION ..................................................................................................- 7 - SECTION1: INTRODCUTION TO AND SELECTION OF OSCILLATORS ............- 8 - 2. INTRODUCTION TO OSCILLATORS................................................................- 9 -
2.1. Oscillator Types ..........................................................................................- 9 - 2.2. Focus on LC On-Chip Oscillators.............................................................- 11 - 2.3. Resonance of RLC Circuits ......................................................................- 12 - 2.3.1. Parallel LC Resonance..........................................................................- 13 - 2.3.2. Series LC Resonance ............................................................................- 14 - 2.3.3. Quality Factor – Q ................................................................................- 14 - 2.4. Basic Oscillator Model .............................................................................- 16 - 2.5. Negative Resistance ..................................................................................- 18 - 2.6. LC Oscillators ...........................................................................................- 20 - 2.7. Integration of LC Oscillators ....................................................................- 21 - 2.8. Energy Recovery Clocking .......................................................................- 21 - 2.9. Oscillator Selection...................................................................................- 23 - 2.9.1. Hartley Oscillator..................................................................................- 26 - 2.9.2. Colpitts Oscillator .................................................................................- 27 - 2.9.3. Tuned-input Tuned-output Oscillator ...................................................- 29 - 2.9.4. Cross-coupled Inverter Pair Oscillator..................................................- 30 - 2.9.5. 2 Inductor Differential Oscillator..........................................................- 31 - 2.10. Frequency of Operation ........................................................................- 32 -
SECTION2: ON-CHIP INDUCTORS – SCHEMATIC MODEL AND QUALITY FACTOR.......................................................................................................................- 33 - 3. ON-CHIP SPIRAL INDUCTORS........................................................................- 34 -
3.1. Square Spiral Inductor ..............................................................................- 34 - 3.2. Schematic Model ......................................................................................- 35 - 3.3. Q................................................................................................................- 38 - 3.3.1. Effect of width on Q .............................................................................- 39 - 3.3.2. Effect of frequency on Q.......................................................................- 41 - 3.3.3. Combined effect of width and frequency..............................................- 42 - 3.4. Conclusion ................................................................................................- 43 -
SECTION3: SIMULATIONS OF SELECTED OSCILLATORS AND RESULTS ...- 44 - 4. SIMULATION OF DUAL PHASE LC OSCILLATORS IN ENERGY RECOVERY CLOCKING ...........................................................................................- 45 -
4.1. Introduction...............................................................................................- 45 - 4.2. Simulation Setup.......................................................................................- 45 - 4.3. Current Mirror...........................................................................................- 47 - 4.4. Cross-Coupled Inverter Pair Dual Phase Oscillator..................................- 49 -
- 6 -
4.4.1. Effect of Transistor Size on Voltage Swing .........................................- 51 - 4.4.2. Effect of Network Resistance on Transistor Sizes................................- 53 - 4.4.3. Effect of change in load capacitance and network resistance on the frequency of oscillation.........................................................................................- 54 - 4.4.4. Area of the inductor verses Q of Inductor ............................................- 55 - 4.4.5. Power Consumption vs Q of the inductor and Network Resistance.....- 57 - 4.5. 2 Inductor Oscillator .................................................................................- 61 - 4.5.1. Effect of Transistor size on Voltage Swing ..........................................- 62 - 4.5.2. Effect of Network resistance on Transistor Sizes .................................- 63 - 4.5.3. Effect of change in load capacitance and network resistance on the frequency of oscillation.........................................................................................- 64 - 4.5.4. Area of the inductor verses Q of Inductor ............................................- 66 - 4.5.5. Power Consumption vs Q of the inductor.............................................- 67 - 4.6. Comparison ...............................................................................................- 70 -
5. CONCLUSIONS...................................................................................................- 79 - REFERENCES .............................................................................................................- 80 -
- 7 -
1. INTRODUCTION Oscillators are used in digital systems to derive the timing clock. There are
many different oscillators in use today. The focus of the thesis was to do a survey
of oscillators and select ones that can be used on-chip in an energy recovery
clocking scheme and do some comparison simulations on the oscillators. The
break-up of the report is done as follows:-
• Section 1 gives some background on oscillators and deals with the study of
oscillator configurations and discusses the reasons behind the selection or
rejection of oscillators for on-chip integration in an energy-recovery
clocking scheme.
• Section 2 deals with on-chip inductors. The definition of quality factor and
the factors that affect the quality factor of the inductor.
• Section 3 deals with the simulations and results of the two oscillators that
were selected. It shows comparison in terms of change in frequency vs
change in load capacitance, area requirement for inductance and power
consumption.
- 8 -
SECTION1: INTRODCUTION TO AND SELECTION OF OSCILLATORS
- 9 -
2. INTRODUCTION TO OSCILLATORS
Oscillators play an essential role in analog and digital systems. They are used
for mixers and modulators in RF electronics and as clocks in digital electronics.
Design of an oscillator is a non-trivial task and requires a lot of skill and
experience. Difficulty arises because of the fact that we use an inherently non-
linear behavior that cannot be completely described with linear system tools.
Furthermore, oscillators might have to provide power to many circuits (e.g. as a
clock in a digital system). This can make their oscillation frequency dependent on
output load. In the high-frequency area, 1GHz and above, parasitic components
highly impact the performance of the oscillator.
2.1. Oscillator Types
There are basically two types of oscillators widely in use:-
2.1.1. Sinusoidal Oscillators e.g.
• RC Based
• Switched Capacitor Based
• LC Based
• Crystal Oscillator
2.1.2. Square wave Oscillators e.g.
• Ring Oscillator
- 10 -
Figure 2-1: Oscillator classification. This thesis focuses on LC Oscillators
In digital CMOS technology, oscillators are used to generate clocks for the digital
circuitry and can be classified as follows:-
• Off-chip: if the oscillator circuit is fabricated separately and the
signal is brought to the chip via the external contacts. The oscillator
might be made in a different technology.
• On-chip: if the oscillator circuit is on the same chip as the rest of the
circuit and uses the same technology.
Oscillators
Square Wave Sinusoidal
Ring Oscillator
Switched Cap RC LC Crystal
- 11 -
2.2. Focus on LC On-Chip Oscillators
Since there are many different applications of oscillators, their selection
depends on the application in which they are used. It is therefore essential to
narrow down the oscillators based on the application.
This thesis focuses on LC based on-chip Oscillators in CMOS Technology.
The motivations for using such a configuration are:-
• Study of an LC based oscillator requires study of LC tank circuits and
their implementation in CMOS Technology. LC tank circuits have
various applications of interest in digital CMOS technologies most
importantly in clock distribution networks [2] [3].
• LC oscillators can be modified to work in an Energy Recovery Clocking
scheme [4]. Such a scheme is used to reduce the power consumption
due to clocking.
• Though on-chip Oscillators are difficult to design they are preferred
over Off-chip Oscillators because when a clock signal is sent through
the external pins, the signal sees a lot of bond-wire inductance. This
adversely affects the clock signal.
- 12 -
2.3. Resonance of RLC Circuits
Resonance is a term used to describe the property whereby a network
presents maximum or minimum impedance at a particular frequency, for example,
an open circuit or a short circuit. One important resonator is the lumped element
RLC circuit. This is also called a tank circuit. An LC resonator can store energy in
the form of a sinusoid. It works like a pendulum, converting Electrical energy into
Magnetic Energy and vice versa.
The resonance of a RLC circuit occurs when the inductive and capacitive
reactances are equal in magnitude but cancel each other because they are 180
degrees apart in phase. When the circuit is at its resonant frequency, the combined
imaginary component of the admittance is zero, and only the resistive component
is observed. The sharpness of the minimum depends on the value of R and is
characterized by the Q or Quality of the circuit.
The reactance of a capacitor with capacitance C farads is given as
fCX c π2
1= at frequency f. The reactance of an inductor with inductance L Henry is
given as fLX L π2= at frequency f.
As can be seen from these two equations at lower frequencies the inductor
acts as a short circuit while at higher frequencies the capacitor acts as a short
circuit. At the resonance frequency the reactances are equal to each other which
gives us the following equation
fCfL
XX CL
ππ
212 =
= (Eq 2.1)
- 13 -
Solving for f we get the equation for the resonance frequency as
LCf
π21
= (Eq 2.2)
2.3.1. Parallel LC Resonance
Resonance for a parallel RLC circuit is the frequency at which the
impedance is maximum. With values of 1 nH and 1 pF, the resonance frequency
will be approx 5 GHz. Here the circuit behaves like a perfect open circuit. At
frequencies higher or less than 5GHz, the ideal parallel LC presents a short circuit.
Figure 2-2: Parallel LC Tank Circuit with Resistance
Using equation. 2.2 the resonance frequency can be calculated.
- 14 -
2.3.2. Series LC Resonance
Resonance for a series RLC circuit is the frequency at which the impedance
is minimum. With values of 1 nH and 1 pF, the resonant frequency is around 5
GHz. Here the circuit behaves like a perfect short circuit. At frequencies higher or
less than 5GHz, the ideal parallel LC presents an open circuit.
Figure 2-3: Series LC Tank Circuit with Resistance
2.3.3. Quality Factor – Q
Q can be defined as follows [5]
patedpowerdissiavgedenergystorQ
.ω= (Eq 2.3)
For the parallel LC tank circuit, the peak energy stored in either the capacitor
or the inductor is the total energy that is resonating back and forth between the
inductor and the capacitor. The peak capacitor voltage at resonance is Vpk = IpkR
where Ipk is the peak current and the R is the resistance of the network in ohms as
- 15 -
shown in Figure 2-2. Therefore the total energy stored in the tank circuit can be
written as [5]
2)(21 RICE pk= (Eq 2.4)
At resonance the circuit in Figure 2-1 degenerates to a simple resistance.
The avg. power dissipated can therefore be written as [5]
RIP pkavg2
21
= (Eq 2.5)
Using equation 2.4 and 2.5 and substituting in equation 2.3 we get the Q for
a parallel LC tank as [5]
CLRQ = (Eq 2.6)
or
fRCfL
RQ ππ
22
== (Eq 2.7)
The quality factor of a series LC Network can also be derived similarly and
is given as follows
RC
LQ = (Eq 2.8)
or
fRCRfLQ
ππ
212
== (Eq 2.9)
- 16 -
2.4. Basic Oscillator Model
The most important part of an oscillator is a positive feedback loop circuit.
Figure 2-4 shows the generic loop representation of such a circuit [1].
Figure 2-4: Basic Oscillator Configuration
HA(ω) is the transfer function of the amplification stage. HF(ω) is the
transfer function of a feedback stage. The closed-loop transfer function [1] of the
configuration shown in Figure 2-4 is:
( )( ) ( )ωωω
FA
A
HHH
VinVout
−=
1 (Eq 2.10)
Since there is no input to an oscillator [1] Vin = 0, this would require a non-
zero output voltage, Vout. This brings us to the Barkhausen Criterion which states
that for Vin = 0, the following relationship should hold for stable oscillations:-
( ) ( ) 1=ωω AF HH (Eq 2.11)
The amplifier transfer function has a real valued gain i.e. HA(ω) = HA0(ω).
Further dividing HF(ω) into real and imaginary parts HFr(ω) and HFi(ω)
HA(ω)
HF(ω)
+Vin
Vf
Vout
- 17 -
respectively the following initial condition should hold for an oscillator circuit to
start oscillating [1]
1)()( >ωω AFr HH (Eq. 2.12)
Under stable operation the following condition should hold [1]
0)(1)()(
==
ωωω
Fi
AFr
HHH
(Eq. 2.13)
- 18 -
2.5. Negative Resistance
The idea of negative resistance can be explained from the circuit [1] shown
in Figure 2-5. The circuit consists of a series resonance circuit consisting of
resistance R, inductance L, and capacitance C. The figure also shows a current-
controlled voltage source. This voltage can represent the output of a CMOS
device. The equation of the circuit in terms of current can be written as [1]
]
dtidvti
CdttdiR
dttidL )()(1)()(
2
2
−=++ (Eq 2.14)
When the oscillator reaches steady-state and the voltage amplitude is stable, the
right hand side of equation 2.14 can be set to zero. The provides us with the
following solution to the equation [1]
)()( 21tjtjt eIeIeti ωω −∂ += (Eq 2.15)
where L
R2
−=∂
and 2
21
⎟⎠⎞
⎜⎝⎛−=
LR
LCω
Figure 2-5: Series resonance circuit
R L Cv(i)
- 19 -
Since ∂ is a negative quantity, as time progresses the harmonic response of the
circuit will reduce to zero because of the ohmic losses in the resistance. If the
value of R reaches zero, the sinusoid that is obtained is undamped and there are no
ohmic losses, such that the energy resonates between the inductor and the
capacitor.
The goal of a CMOS device in an oscillator is to generate a source response
that compensates for this resistance. This is achieved by providing a negative
resistance [1]. If the device that we include in the oscillator has a voltage current
response that is described by the following equation [1]
2
210)( iRiRviv ++= (Eq 2.16)
The terms can be adjusted to compensate for the resistance in the circuit. If
the first to terms of equation 2.16 are substituted into equation 2.14 we obtain the
following equation [1]
dttdiR
dtidvti
CdttdiR
dttidL )()()(1)()(
12
2
−=−=++ (Eq 2.17)
If the terms of the first derivative are combined then we will see that
R1 + R = 0 (Eq 2.18)
Equation 2.18 is the requirement to have an undamped sinusoid response
from the oscillator. Therefore the negative resistance that the device or devices
attached to the LC tank circuits will be
R1 = -R (Eq 2.19)
- 20 -
2.6. LC Oscillators
LC oscillators such as the one shown in Figure 4-5 can be modeled as
shown in Figure 2-6 [10]. The right side block represents a differential input
transconductor. The tank losses are lumped together in a resistor R. The tank
losses can be measured in terms of Q factor of the tank as well. The losses are
compensated by the differential transconductor connected in a positive feedback
which acts as negative resistance [10]. The circuit oscillation is defined by the
value of inductance L and capacitance C used in the circuit.
The output amplitude of the oscillator depends upon the current that passes
through the active devices used in the oscillator. In our case the devices used to
produce negative resistance are CMOS devices. The width of these CMOS devices
dictates the current passing through them and consequently the output amplitude.
For high enough amplitudes differential pairs such as the one showed in Figure 2-
10 switch almost ideally. Using a PMOS differential pair allows more efficient use
of the bias current.
Figure 2-6: LC Oscillator Model
transconductor
I tank
RtankCL
Sinusoid Output
- 21 -
2.7. Integration of LC Oscillators
On-chip LC resonant circuits in CMOS technologies are made using square
spiral inductors such as the one shown in Figure 3-1. As will be described later
when we describe energy recovery clocking, the capacitance is the parasitic
capacitance of the load. This is generally in the pF range. The draw-back of a fully
integrated approach of making LC Oscillators is the low quality factor of the
inductor especially due to series resistance and the parasitic capacitances present
in the inductor and also due to the resistance present in the distribution network.
This increases the power dissipation required to achieve the desirable amplitude
seen at the load. Since the capacitance comes from the load, there is no knowledge
of the quality factor of the capacitance. However, the quality factor of the inductor
is available and also there is some idea into how much network resistance is
present. Therefore, on-chip inductors and their quality factors have been discussed
in Chapter 3. In chapter 4 simulations of two oscillator circuits have been done
using network resistance and an on-chip inductor model.
2.8. Energy Recovery Clocking
Energy recovery clocking has been introduced in [2], [3] and [4].
Depending on the type of oscillator used LC resonance circuit is formed with the
inductor that has been fabricated on-chip and the parasitic load capacitance. The
frequency depends upon the values of the on-chip inductance and the amount of
parasitic load capacitance that is present. If the oscillator shown in Figure 4-5 is
used then energy recovery clocking is achieved as shown in Figure 2-7.
- 22 -
Logic
Logic
Logic
Logic
Logic
Logic
Logic
Logic
Figure 2-7:- Energy recovery clocking using cross coupled inverter pair oscillator
Cload is the parasitic capacitance of the load and is used as part of the LC tank
circuit. Rnw is the resistance of the distribution network. This resistance has to be
kept as small as possible because a large amount of energy is lost is due to this
resistance. L is the on-chip inductor. If the oscillator shown in Figure 4-14 is used
then energy recovery clocking is achieved as shown in Figure 2-8.
VDD
L
Cload
Cload
Rnw
Rnw
Clk
Clk bar
- 23 -
Logic
Logic
Logic
Logic
Logic
Logic
Logic
Logic
Figure 2-8:- Energy recovery clocking using 2inductor oscillator
Using energy recovery clocking scheme, power savings of up to 30% have been
reported [3]. Therefore energy recovery clocking shows potential for low power
clocking. Two oscillators have been simulated and compared using a test-bench
and the results have been discussed in chapter 4.
2.9. Oscillator Selection
There are different types of oscillator configurations that are used. The
oscillators can be qualified upon what type of LC circuit is used and also on how
the negative resistance is created. The LC circuit can have different types of
topologies. These different topologies have been shown in Figure 2-9. Different
topologies have different names.
Cload
Rnw
L
VDD
Cload
Rnw
L
Clk
Clkbar
- 24 -
Figure 2-9: Different LC networks used in oscillators
There are also different types of differential negative resistances that can be
created. Figure 2-10 a) and b) show two different ways to create negative
resistance. If we look closely at Figure 2-10 a) we see that this is actually a cross-
coupled inverter structure. Using differential PMOS along with differential NMOS
gives the oscillator more gain but at the expense of more power consumption,
increase in number of devices and area.
a) Hartley b) Colpitts
c) Parallel LC d) Clapp
e) Series LC
L1 L2
C
C1 C2
L
L CC1 C2
C3 L
L
C
- 25 -
Figure 2-10: Negative resistance by using differential cross-coupled PMOS and NMOS devices
Selecting which type of oscillator would be suitable for on-chip integration
is based on the application that we are interested. As mentioned before the
application of interest is to integrate an LC Oscillator on chip in an energy
recovery clocking scheme. The selection therefore depends upon a number of
factors. The most important factor that was considered for selection was whether
or not the oscillator can be used in the energy recovery clocking scheme. To be
a) Differential PMOS and NMOS or Cross-Coupled Inverter Pair
b) Differential NMOS
- 26 -
usable in such a scheme, there should be at least one capacitance in the LC
network that has one port connected to the ground. This capacitance is then
replaced by the load capacitance. The other factors include capacitance
requirement and the effect of change in load capacitance on the functionality of
the oscillator. A number of oscillators were surveyed and based upon the above
mentioned criteria were selected or rejected. Some of these oscillators are shown
as follows:-
2.9.1. Hartley Oscillator
This oscillator is shown in Figure 2-11 [1]. The LC network has two
inductors and one capacitance. The NMOS amplifier is connected in a common
gate configuration. Looking at the figure it can be seen that this oscillator fails the
first and most important criteria. It cannot be used in energy recovery clocking.
The capacitance C3 has one port connected to L1 and the other port connected to
L2. There is no way to replace this capacitance with the load capacitance. This
oscillator was therefore rejected for simulations.
- 27 -
Figure 2-11: NMOS Hartley Oscillator
2.9.2. Colpitts Oscillator
This oscillator is shown in Figure 2-12 [5]. This oscillator has a capacitively
tapped resonator, with a positive feed-back provided by an active device. The
resistance R shown in Figure 2-12 represents loading due to finite Q. From the
figure it can be seen that capacitor C2 can be replaced by a load capacitance and
hence this oscillator can be used for our application. Investigating this oscillator
further we see that [5]
nVtVout = (Eq 2.20)
where ( )211CC
Cn+
= (Eq 2.21)
VDD
L1 L2
C3
- 28 -
From equation 2.20 we see that in order to increase the amplitude of Vout,
the amplitude of Vt has to be increased. The n factor is the ratio between Vt and
Vout. The n factor has to be made as close to one as possible to ensure that Vout
and Vt have similar amplitudes. The need to have similar amplitudes is expressed
by the following example. Suppose the n factor is 0.3. In order to have an
amplitude of 900mV on Vout, the amplitude of Vt has to be 2700mV. On the other
hand if the n factor is 0.95 then the amplitude of Vt has to be 947mV. Clearly if
the n factor is too low, there will be unnecessary power consumption due to the
high amplitude on Vt. From equation 2.21 it is seen that in order to have an n
factor as close to one as possible, C1 has to be much larger than C2. This would
mean that if we replace C2 with the load capacitance, then a capacitance much
larger than the load that is being driven has to be made with in the oscillator. A lot
of area is consumed to make this capacitance. Furthermore, the larger the
capacitance, the larger will be the power consumption of the oscillator. This makes
this oscillator unsuitable for use in our application. This oscillator was therefore
rejected.
Figure 2-12: Colpitts Oscillator
VDD
V Bias
L R
C1
C2
Vt
Vout
- 29 -
2.9.3. Tuned-input Tuned-output Oscillator
This oscillator is shown in Figure 2-13. It can be used in an energy
recovery scheme by replacing capacitance C3 by the load capacitance. This
oscillator has the same problems as discussed for the Colpitts oscillator. It requires
its own capacitance along with the capacitance of the load to work. An additional
strike against this oscillator is the need for careful tuning of the two tank circuits
for proper oscillation. From [3] we know that the load capacitance is not constant
and changes with the change in data activity. Since the load capacitance is
changing, the oscillator would require continuous tuning for proper operation. This
has a lot of performance overhead. Two inductors are being used just to generate a
single phase. As will be discussed in chapter 3, inductors consume a lot of area.
Therefore using this oscillator for our application is not feasible.
Figure 2-13: Tuned-input Tuned-output Oscillator
VDD
L1 C1
C2
L2 C3
- 30 -
2.9.4. Cross-coupled Inverter Pair Oscillator
This is a dual phase oscillator and is shown in Figure 2-14 [9], [10], [11]. It
uses a cross-coupled inverter structure to create negative resistance. This is the
same structure as the cross-coupled differential structure shown in Figure 2-10.
Looking at Figure 2-14 we see that it can be used in an energy recovery clocking
scheme by replacing capacitances C1 and C2 with the load. The oscillator
generates a sinusoid using one inductor whose both ends are connected to the
output of the two inverters. The capacitance is used entirely from the parasitic
capacitance of the load and it does not require any capacitance of its own to
operate. Furthermore it does not require careful tuning like the Tuned-Input
Tuned-Output oscillator mentioned in 2.9.3. It has at least two devices operating at
the same time and therefore has a high gain. This means that the oscillator can
handle large amounts of load. This oscillator is highly suited to our application.
This oscillator was therefore used for simulations, for energy recovery clocking.
Figure 2-14: Cross-coupled Inverter Pair Dual Phase Oscillator
VDD
C1 C2
L
- 31 -
2.9.5. 2 Inductor Differential Oscillator
This is also a dual phase oscillator and is shown in Figure 2-15 [3], [12],
[13],[14]. It uses a cross-coupled NMOS structure to create negative resistance.
This is the same as the cross-coupled NMOS structure shown in Figure 2-10.
Looking at Figure 2-15 we see that it can also be used in an energy recovery
clocking scheme by replacing capacitances C1 and C2 with the load. The
oscillator generates a sinusoid using two inductors, one for each phase. The
capacitance is used entirely from the parasitic capacitance of the load and it does
not require any capacitance of its own to operate. It also does not require careful
tuning. As compared to the cross-coupled inverter oscillator in 7.4, this oscillator
has lesser amount of gain and therefore comparatively can take lesser amount of
load at the output. It is also suited for our application. It was therefore used for
simulations, for energy recovery clocking.
Figure 2-15: 2 Inductor Dual Phase Oscillator with differential NMOS structure
VDD
L1 L2
C1 C2
- 32 -
2.10. Frequency of Operation
Though simulations have been performed at various frequencies, the frequency
of interest is 1GHz. This frequency is feasible for sinusoidal clocking of Logic
Blocks. Furthermore, parasitics such as Resistance of the Inductor and the
Resistance of the distribution network hinder the use of higher frequencies.
- 33 -
SECTION2: ON-CHIP INDUCTORS – SCHEMATIC MODEL AND QUALITY FACTOR
- 34 -
3. ON-CHIP SPIRAL INDUCTORS
3.1. Square Spiral Inductor
The most widely used on-chip inductor design is the square spiral inductor
as shown in Figure 3-1 [9]. Although a circular spiral has been known to
provide more inductance, the square version has been chosen because it is
supported by most CMOS technologies. It is best to make the inductor in the
top-most layer of the process since most of the logic is in lower layers and that
higher layers have lesser sheet resistance. Calculation of L (inductance in H) of
on-chip inductors is based on the value of width, the number of turns, the outer
and inner diameters etc.
Figure 3-1: On-chip Spiral Inductor in MET6. To bring the inner contact out, a separate metal layer (MET5) is needed (Figure 3-1, Port2).
Port 1 Port 2
IL
Port 2
OL
D
W
Met6 Met5
- 35 -
The different labels in Figure 3-1 can be explained as follows:-
Port 1 and Port 2 are the places where the inductor is connected.
W is the width of the interconnects. Using greater width means lesser resistance
and hence less losses. The width greatly affects the quality factor of the inductor
as will be shown when Q is discussed
D is the spacing between the interconnects
IL is the inner dimension of the inductor
OL is the outer dimension of the inductor
3.2. Schematic Model In general terms the spiral inductor is a distributed structure. There is
capacitive and inductive coupling between the metal strips and the substrate.
Series resistance is distributed over the entire circuit. The best and the fastest way
to simulate an on-chip inductor at the frequency of interest is to use a lumped
schematic model [7],[8],[15],[16] which accurately models the parasitics that are
present in the spiral inductor. The schematic is shown in Figure 3-2.
Figure 3-2: Lumped Schematic Model of on-chip Inductor
- 36 -
L(ls in the Figure) is the inductance of the coil and can be calculated by using
a Modified Wheeler Formula [6] :-
ρµ
2
2
01 1 KdN
KL avg
+= (Eq 3.1)
where N is the number of turns of the inductor while davg = 0.5(OL+IL). K1 and
K2 are dependent on the shape of the inductor [6]. ρ is the fill ratio and is
defined as ρ = (OL - IL)/(OL + IL). ρ represents how hollow the inductor is.
For a smaller value of ρ we have a more hollow inductor (value of OL is
comparable to IL). For larger values of ρ the inductor is fuller. Two inductors
with the same davg but different fill ratios will have different inductance values.
The full inductor has lesser inductance because its inner turns are closer to the
centre of the spiral and hence contribute with less positive mutual inductance
and more negative mutual inductance.
Cp is the lumped overlap capacitance between the metal 6 layer and the part of
the metal 5 layer that has been routed underneath Metal 6 to provide an output
port as shown in Figure3-2. Cp can be calculated by using equation 3.2.
56
2 **ox
oxp t
WNCε
= (Eq 3.2)
Where N is the no of turns. W is the width of the interconnect. oxε is the
permittivity of the oxide. 56oxt is the thickness of the oxide between Metal 6
and Metal 5.
Cox is the lumped capacitance between the Metal 6 layer and the substrate and
can be calculated using equation 3.3.
ox
oxox t
WlCε
***21
= (Eq 3.3)
- 37 -
Where l is the length of the inductor and oxt is the thickness of the oxide layer
between Met 6 and Substrate.
rs is the resistance of the interconnect and can be calculated by using the sheet
resistance of Met 6.
r1 is a parameter that models substrate losses. The ohmic loss in r1 signifies the
energy dissipation in the silicon substrate and can be calculated using equation
3.4 [15].
GSUBlWr
**2
1 = (Eq 3.4)
Where GSUB is substrate conductance per unit area
c1 is a parameter that models substrate capacitive effects and can be calculated
using equation 3.5.
2**
1CSUBlWc = (Eq 3.5)
CSUB is substrate capacitance per unit area.
The effect of inter-turn fringing capacitance is small because the adjacent turns
are almost equipotential and therefore ignored for this model. The overlap
capacitance Cp is more significant because a large potential difference exists
between the inductor and the underpass [15].
- 38 -
3.3. Q As can be seen from the schematic in Figure 3-2, an on-chip inductor is not
ideal. The series resistance rs in the inductor is the cause of ohmic losses which
have to be compensated. Compared to an ideal inductor, more Power is consumed
when sustaining oscillations in an LC tank circuit when an on-chip inductor is
used. The other parasitics shown in the schematic also contribute to losses. An
adequate way to evaluate the losses of an inductor is the Quality factor which is
defined in equation 3.6.
Q of the on-chip Inductor can be defined as follows [7]:-
⎥⎥⎦
⎤
⎢⎢⎣
⎡⎟⎟⎠
⎞⎜⎜⎝
⎛++−
⎥⎥⎥⎥⎥⎥
⎦
⎤
⎢⎢⎢⎢⎢⎢
⎣
⎡
⎟⎟
⎠
⎞
⎜⎜
⎝
⎛+⎟⎟
⎠
⎞⎜⎜⎝
⎛+
=L
rLCc
rLrr
rrLQ s
pp
ssp
p
s
22
2)(1
1
ωω
ω (Eq. 3.6)
where ( )2
211
122
1
ox
ox
oxp C
cCrrC
r+
+=ω
and ( )( ) 2
12
12
2111
2
11
rcCrccC
Ccox
oxoxp
++
++=
ωω
In equation 3.6 srLω corresponds the magnetic energy stored and the losses
in the series resistance in rs. The second factor in equation 3.6 represents the
substrate loss factor representing the energy dissipated in the semi conducting
silicon substrate. The last factor is the self-resonance factor describing the
reduction in Q due to the increase in the peak electric energy stored in the parasitic
capacitances of the inductor [15]. The only useful energy stored in the inductor is
the magnetic energy stored in the coil. The electric energy stored in the parasitic
capacitances is counterproductive.
- 39 -
At a frequency of 1GHz, most of the losses in an inductor are caused by the
series resistance rs. Resistance of a conductor is inversely proportional to its cross-
sectional area. Increasing the cross-sectional area will decrease the resistance
through the wire. This cross-sectional area is dependent on the thickness and the
width of the wire. In our particular situation the technology is fixed. This means
the thickness of the metal layers and the substrate capacitance and conductance per
unit area are fixed. Therefore the most significant factor that can affect Q is the
width of the wire. As can be seen from equation 3.2 to equation 3.5 the parasitics
are dependent on the dimensions of the inductor. Making an inductor wider
reduces the series resistance but on the other hand increases the parasitic
capacitances.
The higher the Q, the less losses will be encountered which translates to less
Power Consumption. Important factors that affect Q are:-
1. Width W of the inductor
2. Frequency at which the LC tank circuit is resonating
3.3.1. Effect of width on Q Making an inductor wider decreases the series resistance. Series resistance
is the most significant factor affecting Q. Therefore, making a wider inductor can
increase the Q factor at a particular frequency to a certain extent. The effect of W
at a frequency of 1GHz can be seen from Table 3-1, Figure 3-3 and 3-4. The
inductor value is 0.78nH. It has 2 turns and a spacing of 1µm. The outer diameter
OL of the inductor depends on how wide the inductor wire is. Table 3-1: Effect of Width on Q and outer dimension of the inductor
W µm
OL µm
Q
18 159 1.42 38 233 2.31 58 300 2.96 78 363 3.45 98 423 3.85
- 40 -
Effect of W on Q
00.5
11.5
22.5
33.5
44.5
18 38 58 78 98
W(µm)
Q
Figure 3-3:Effect of the width of the inductor on Q at 1GHz.
From Figure 3-3 we can see that at a frequency of 1GHz and a spacing of
1µm, making an inductor with a width of 98µm provides a higher Q value than the
narrower options. One big consequence of using wider inductors is that they cover
more area. Since area on a chip is limited we cannot make an inductor infinitely
wide. Figure 3-4 illustrates how the outer dimension increases as the width of the
inductor increases.
The greater the outer dimension, the more area the inductor covers.
- 41 -
Outer Dimension vs Width
050
100150200250300350400450
18 38 58 78 98
W (µm)
OL
(µm
)
Figure 3-4: Effect of the width on the outer dimension of the inductor OL.
3.3.2. Effect of frequency on Q Incase of ideal inductors the Q value increases with the increase in
frequency infinitely. This is however not the case for on-chip Inductors because
the parasitic capacitance and substrate losses show their significance at higher
frequencies. The effect of frequency on the Q value can be seen in Table 3-3. The
inductance is 0.78nH. Width of the inductor is 58µm.
Table 3-3: Frequency vs Q
F GHz
Q
0.2 0.61 0.5 1.52 1 2.93
1.5 4.01 2 4.35
2.5 3.36 3 0.25
- 42 -
Frequency vs Q
0
2
4
6
8
10
0.2 0.5 1 1.5 2 2.5 3
Frequency GHz
Q
Considering Cap and Res Considering Res only
Figure 3-5: Shows the effect of resonance frequency on Q From Figure 3-5 it can be see from the solid line that the Q value first
increases with frequency and then decreases. The second and third factor in
equation 3.6 begin to show their effects at higher frequencies and adversely affect
the Quality factor. For this particular situation, the highest Q is obtained at a
frequency of 2GHz. If we would ignore the second and third terms in equation 3.6
then the quality factor would be affected by frequency in the way shown by the
dotted line in Figure 3-5.
3.3.3. Combined effect of width and frequency
Figure 3-6 shows the combined effect of width and frequency on the Q
factor with a 3D Mesh. The conclusion that can be made from this figure is that
although increasing the width increases the Q factor, by decreasing the series
resistance, there is a limit on how wide an inductor can be made. This is because
the parasitic capacitances and substrate losses also begin to increase as the width is
increased. As the frequency increases we can see from Figure 3-6 that the effects
begin to be more obvious as the Q factor is decreasing with the increase of width.
- 43 -
Figure 3-6: 3D Mesh that shows the combined effect of width and frequency
3.4. Conclusion It can be seen from the simulations that inductors of many different Q
values can be made on-chip. Using wider inductors decreases the series resistance
and has a positive effect on Q. On the other hand if the inductor is too wide, the
inductor will cover a lot of area and the parasitic capacitance and substrate losses
will increase. Therefore, an inductor has to be made keeping in mind the required
Power Consumption, Available Area and Oscillation Frequency of interest.
Q
Width µm F GHz
- 44 -
SECTION3: SIMULATIONS OF SELECTED OSCILLATORS AND RESULTS
- 45 -
4. SIMULATION OF DUAL PHASE LC OSCILLATORS IN ENERGY RECOVERY CLOCKING
4.1. Introduction Energy recovery clocking schemes have been discussed in some research
papers [2], [3] and [4] and has been introduced in Ch-2. Such power-saving
clocking schemes show some potential and power consumption reduction of 35%
has been reported [3]. Comparison of two dual phase cross-coupled oscillator
structures that can be used for energy recovery clocking has been done. The two
oscillators have been compared in terms of power consumption, change in
frequency vs change in load capacitance and area requirements for the inductors
that each requires. All the oscillators need a start-up pulse in the beginning but
once started up the oscillations are self-sustaining and a clock is not required.
Before giving some introduction to the oscillators themselves, it is important to
give some understanding to what the application is and in which environment the
oscillators have been used and according to what standard the total power
consumption of the oscillators has been compared.
4.2. Simulation Setup An LC oscillator sees a lot of resistance when it is connected to the
distribution network. When the energy stored in the LC tank resonates back and
forth between the load capacitance and the inductance of the oscillator, a large
amount of energy is lost in the resistance of the distribution network. For these
simulations this resistance has been lumped together as one big resistance
connected between the output of the oscillator and the load capacitance. This
simulation setup has been shown in Figure 4-1.
- 46 -
Figure 4-1: Simulation Setup. The outputs of the two oscillators are connected to a resistance and a load Capacitance. The oscillators entirely use the load capacitance as part of the LC tank, just
as they would be used in an energy recovery clocking scheme. Since the logic sees
the sinusoid after going through the resistance of the network, the voltage swing
and frequency are measured after it has passed through the resistance. The power
is calculated by first measuring the average current that is being drawn from the
power supply and multiplying that with the voltage.
For comparison purposes a conventional driver such as the one shown in
Figure 4-2 is used. There is a chain of four inverters. A square wave clock is
generated and given as an input to the first inverter. The first two inverters are
sized such that they slightly reduce the edge rate because in reality when a
conventional driver receives a clock its edge rate is also not perfectly sharp. The
last two drivers are progressively sized, with the second last inverter being 1/5th of
the last inverter. The inverters are sized such that they give a bad edge rate which
is as close as possible to the sinusoid generated by the oscillators. There is no
resistance connected to the output of the conventional driver since it does not
significantly affect the power consumption of the conventional driver. The total
load capacitance that has been connected is 60pF because the total capacitance that
- 47 -
the LC oscillators see at both phases is also 60pF. The power consumption
measured for comparison is only that of the last two inverters.
Figure 4-2: Schematic of conventional driver
4.3. Current Mirror If the load capacitance and resistance is too high for the oscillators, a
current mirror circuit [10] [12] can be used to assist the oscillators and ease
transistor sizing. Instead of connecting the source of the NMOS transistors in the
oscillators to ground, it is connected to the drain of M5 in the mirror circuit which
is shown in Figure 4-3. The drain of transistor M4 is then connected to a separate
voltage supply. The current mirror circuit assists by providing more current to the
oscillators. This however comes at the expense of power consumption. The
amount of current can be adjusted by changing the width of the NMOS transistors.
Over-sizing the transistors will result in unnecessary power consumption. Figure
4-4 demonstrates how the current mirror circuit is connected to the cross-coupled
inverter pair oscillator described in section 4.
- 48 -
Figure 4-3: Current Mirror Circuit
Figure 4-4: Current mirror circuit connected to the cross coupled inverter pair oscillator
M5M4
- 49 -
4.4. Cross-Coupled Inverter Pair Dual Phase Oscillator This oscillator is shown in Figure 4-5 [9], [10], [11]. It has a cross coupled
inverter structure where the outputs of the two inverters are connected to each
others inputs. The oscillator therefore requires two PMOS transistors labeled M1
and M2 in Figure 4-5 and two NMOS transistors labeled M0 and M3 to operate.
The oscillator generates a sinusoid using one inductor whose both ends are
connected to the output of the two inverters. The capacitance used is entirely the
parasitic capacitance of the load.
During the instant when output vout is at its peak voltage and voutbar is at
its minimum, transistor M1 and M3 are turned on which then forms a parallel LC
Tank circuit with inductance L0 and the load capacitance shown in Figure 4-1
which is connected to Vout. When voutbar is at its maximum voltage then a tank
circuit is formed with inductance and the load Capacitance connected to voutbar.
- 50 -
Figure 4-5: Cross-Coupled Inverter Pair Dual Phase LC Oscillator
- 51 -
4.4.1. Effect of Transistor Size on Voltage Swing Increasing the size of the transistors increases the voltage swing. This
occurs because when the width of the transistors is increased, the resistance of the
transistors decreases, resulting in more current passing through the transistor
which consequently increases the voltage swing. This however comes at the
expense of increased power consumption. Hence a trade off has to be made of the
voltage swing verses the power consumption.
The size of the PMOS transistor dictates how high the voltage is in the
positive cycle and the size of the NMOS transistor dictates how low the voltage is
in the negative cycle. Using a PMOS to NMOS ratio of approx 2 makes the
sinusoid symmetric. The effect of transistor sizes on peak to peak voltage of the
sinusoid and power consumption of the oscillator is illustrated in Table 4-1. The
table shows how the peak to peak voltage and power increase with the increase in
transistor size when the oscillator is operating at a frequency of 1GHz and using
ideal inductors. The width of the PMOS and NMOS transistors is wp and wn
respectively. Figure 4-6 is the peak to peak voltage swing versus the normalized
widths of the PMOS and NMOS transistors. A normalized width of 1 is equal to
100µm for an NMOS and 200µm for a PMOS transistor. Similarly Figure 4-7
shows the power consumption of the oscillator vs the normalized width of the
NMOS transistors.
Table 4-1: Transistor sizes vs peak to peak voltage of the signal and power consumption of the oscillator using ideal inductors
wp µm
wn µm
Voltage Swing mV
Power mW
800 400 980.12 39.42 400 200 845.89 30.62 200 100 586.13 19.8
- 52 -
Peak to Peak Voltage vs Normalized Width
550600650700750800850900950
10001050
1 2 4
Normalized width of transistors
Pk to
Pk
Vol
tage
V
Figure 4-6: Peak to Peak voltage of the sinusoid as seen at the load vs the normalized transistor width. Normalized width of 1 stands for a width of 200µm for a PMOS transistor and 100µm for an NMOS transistor.
Power Consumption of the Oscillator vs Normalized Width
18
23
28
33
38
43
1 2 4
Normalized Width
Pow
er C
onsu
mpt
ion
mW
Figure 4-7: Power consumption of the oscillator vs normalized width of the transistor. Normalized width of 1 stands for a width of 200µm for a PMOS transistor and 100µm for an NMOS transistor.
- 53 -
4.4.2. Effect of Network Resistance on Transistor Sizes When the distribution network resistance increases, this decreases the
voltage swing that is seen at the load because of losses in the resistance. Therefore
in order to compensate for this loss in voltage swing the widths of the transistors
have to be increased. This is shown in Table 4-2 which shows how the transistor
size is affected when the network resistance is increased. Rnw is the resistance of
the network in ohms and the voltage swing is 700mV. Figure 4-8 shows the
normalized widths of the transistors vs the network resistance. A normalized width
of 1 stands for a width of 75µm for a PMOS transistor and 37.5µm for an NMOS
transistor. The figures give us an idea of how to compensate for the decrease in
voltage swing seen at the load due to increase of the network resistance by making
the transistors larger.
Table 4-2: Transistor sizes vs network resistance using ideal inductors wp µm
wn µm
Rnw Ω
75 37.5 0.5 150 75 1 200 100 1.5 300 150 2
- 54 -
Normalized Transistor width vs Network resistance
00.5
11.5
22.5
33.5
44.5
0.5 1 1.5 2
Network resistance Ω
Norm
aliz
ed tr
ansi
stor
wid
th
Figure 4-8: Effect of change in network resistance on transistor sizes for a fixed voltage swing and frequency. Normalized width of 1 stands for a PMOS width of 75µm and an NMOS width of 37.5µm
4.4.3. Effect of change in load capacitance and network resistance on the frequency of oscillation
To see the effects of change in load capacitance on the LC oscillator, the
load capacitance has been changed from 5pF to 135pF on both phases with an
inductance value of 1.2nH. How the change in load capacitance affects the
frequency when the network resistance is changed between 0.01Ω and 5Ω can be
seen in Figure 4-9. The figure shows the load capacitance versus frequency. Width
of PMOS is 500µm, width of NMOS is 250µm, the inductor has a value of 1.2nH
and has a resistance of 1.7Ω. The power supply voltage is 0.9V.
- 55 -
Frequency vs load Capacitance with a resistance of 0.01 to 5 Ohms
0.400
0.900
1.400
1.900
2.400
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y
0.01 1 5 3
Figure 4-9: Effect of change in capacitance on the frequency of oscillation for different resistance values
For a resistance of 1Ω the same trend continues until a capacitance of
120pF and then the oscillator stops oscillating. With the resistance of 0.01Ω the
trend continues until a capacitance of 405pF. For resistance values of 3Ω the
frequency decreases with the increase in load capacitance until it reaches 45pF and
then increases until it reaches 65pF after which there are no sustainable
oscillations. At 5Ω the frequency decreases with the increase in load capacitance
until it reaches 25pF and then increases with the increase in load capacitance until
2nF. It can be seen from the figure that lesser the network resistance, the closer is
the frequency response of an oscillator to an LC Tank circuit.
4.4.4. Area of the inductor verses Q of Inductor As was discussed in chapter 3, the quality of an inductor can be increased
by increasing the width of the inductor wire. Increasing the width also increases
the dimensions of the inductor. Consequently, in order to increase the Q of an
inductor we need to cover more area. Also, the greater the number of inductors
Ω
- 56 -
used in the oscillator, the more area will be covered by the inductances for a given
Q value. Table 4-3 and Figure 4-10 show the total area covered by the inductor for
different Q values to attain a frequency of approx 1GHz when a load capacitance
of 30pF is present.
Table 4-3: Approximate area covered by the inductors for a given Q value of inductor
Approx Q Area µm2
2.5 90,0003.3 160,0004.2 360,0004.9 490,000
Inductor Area vs Inductor Q
0
100000
200000
300000
400000
500000
600000
2.8 3.5 4.2 4.9
Q
Are
a (s
quar
e µm
)
Figure 4-10: Approximate area covered by the inductors for a given Q value of inductor
- 57 -
4.4.5. Power Consumption vs Q of the inductor and Network Resistance
The power consumption for a fixed voltage swing and frequency depends
mainly on the network resistance, the amount of load capacitance and the quality
of the inductors. For a fixed load capacitance and network resistance, the power
consumption depends on the Q value of the inductor. Lower Q values mean
greater losses in the inductor and hence the power consumption of the oscillator is
increased. Network resistance has a big impact on the power consumption of the
oscillator as well. The network resistance should be properly estimated in order to
know how efficient the oscillator will be when it is placed in the application
environment. Table 4-4 illustrates how the power consumption is affected by the
change in Q value of the inductor and network resistance. The inductance value
lies between 1.2~1.4nH. Table 4-4: The power consumption of the oscillator vs the quality factor of the inductor for 0.01 to 4Ω network resisance
QL
Quality of
Inductor
Rnw Ω Network
Res.
wp(µm) width of
PMOS
wn (µm)
width of
NMOS
wbias (µm)
width of current mirror bias
Supply Voltage
V
Power Consumption
mW
1.6 0.01 1000 500 - 1 82.81 2.7 0.01 400 200 - 0.9 21.32
4 0.01 250 125 - 0.9 12.64 4.6 0.01 200 100 - 0.9 10.62 5.4 0.01 150 75 - 0.9 5.056 1.6 1 1000 500 - 1 85.21 2.7 1 600 310 - 1 47.21
4 1 360 180 - 1 28.89 4.6 1 320 160 - 1 26.27 5.4 1 270 135 - 1 22.23 1.6 2 1000 500 - 1 86.46 2.7 2 950 475 - 1 68.68
4 2 700 350 - 1 50.69 4.6 2 580 290 - 1 44.81 5.4 2 500 250 - 1 37.36 1.6 3 - - - 1 - 2.7 3 1200 800 400 1 120.41
4 3 1000 800 400 1 102.95
- 58 -
QL
Quality of
Inductor
Rnw Ω Network
Res.
wp(µm) width of
PMOS
wn (µm)
width of
NMOS
wbias (µm)
width of current mirror bias
Supply Voltage
V
Power Consumption
mW
4.6 3 1000 800 400 1 102.31 5.4 3 1000 800 350 1 91.44 1.6 4 - - - 1 - 2.7 4 1200 1000 500 1 147.8
4 4 1000 800 500 1 122.804 4.6 4 1000 800 500 1 122.138 5.4 4 1000 800 450 1 115.27
Figure 4-11: Power consumption LC oscillator vs network resistance and quality factor of the inductor. Rnw stands for network resistance while Q is the quality factor of the inductor For network resistances of 3Ω and 4Ω a current mirror circuit was used.
This had a big impact on the efficiency of the oscillator. For network resistance of
3 and 4 Ω and quality factor of 1.6, there were no oscillations and hence no data
taken. Figure 4-11 illustrates how the power consumption of the oscillator changes
P mW
Q Rnw Ω
- 59 -
for different Q values and network resistances. Clearly the efficiency of the
oscillator improves when the quality factor of the inductor is increased and the
network resistance is decreased. Figures 4-12 and 4-13 show the wave form output
of the conventional inverter driver and the cross-coupled inverter pair oscillator
for which the different readings were taken.
Figure 4-12: Output wave form of the conventional inverter driver at 1GHz
- 60 -
Figure 4-13: Output wave form of the Cross coupled Inverter Pair Oscillator 1GHz
- 61 -
4.5. 2 Inductor Oscillator This oscillator is shown in Figure 4-14 [3], [12], [13],[14]. This oscillator
has a cross-coupled NMOS structure as shown in the figure. It uses two inductors
L0 and L1 as labeled in the figure and parasitic capacitance from the load as part
of the LC circuit. When vout is at its maximum voltage and voutbar is at its
minimum voltage transistor M1 will be turned on and M0 will be turned of. A
series tank circuit is created between inductor L0 and the parasitic load
capacitance that is connected to output vout. The opposite is true when voutbar is
at its maximum and a tank circuit is made with inductor L1 and the parasitic load
capacitance that is connected to output voutbar.
Figure 4-14: 2 Inductor Dual Phase LC Oscillator
- 62 -
4.5.1. Effect of Transistor size on Voltage Swing As with the cross-coupled inverter pair oscillator discussed previously the
voltage swing increases when the transistors are made wider. The different peak to
peak voltages and corresponding power consumptions that occur with different
transistor sizes have been shown in table 4-5 when ideal inductors are used and
further graphically shown in Figure 4-15 and 4-16.
Table 4-5: Transistor sizes vs peak to peak voltage of the signal and power consumption of the Oscillator
wn µm
Voltage Swing mV
Power mW
500 1200 50.06 300 1000 44.03 200 800 36.00
Peak to Peak Voltage vs Normalized Width
750800850900950
100010501100115012001250
1 1.5 2.5
Normalized width of transistors
Pk
to P
k Vo
ltage
V
Figure 4-15: Peak to Peak voltage of the sinusoid as seen at the load vs the normalized transistor width. Normalized width of 1 stands for an NMOS width of 200µm
- 63 -
Power Consumption of the Oscillator vs Normalized Width
30
35
40
45
50
55
1 1.5 2.5
Normalized Width
Pow
er C
onsu
mpt
ion
mW
Figure 4-16: Power consumption of the oscillator vs normalized width of the transistor. Normalized width of 1 stands for a width of 200µm for the NMOS transistor.
4.5.2. Effect of Network resistance on Transistor Sizes As with the cross-coupled inverter pair oscillator, greater network
resistance translates to greater losses in the LC tank circuit. The sizes of the
NMOS transistors have to be increased to compensate for these losses. The
different transistor sizes vs the network resistance, when the voltage swing is fixed
to 1.2V and frequency is fixed to 1GHz, are shown in table 4-6 and Figure 4-17.
Table 4-6: Transistor sizes vs network resistance and power consumption of the oscillator
wn µm
Rnw Ω
Power mW
90 0.5 13.05 150 1 23.03 250 1.5 35.14 350 2 46.29
- 64 -
Normalized Transistor width vs Network resistance
0.000.501.001.502.002.503.003.504.004.50
0.5 1 1.5 2
Network resistance Ω
Norm
aliz
ed tr
ansi
stor
wid
th
Figure 4-17: Effect of change in network resistance on transistor sizes for a fixed voltage swing and frequency. Normalized width of 1 stands for an NMOS width of 90µm
4.5.3. Effect of change in load capacitance and network resistance on the frequency of oscillation
To see the effects of change in load capacitance on the LC oscillator, the
load capacitance has been changed from 5pF to135pF on both phases with an
inductance of 0.78nH. How this change in load capacitance affects the frequency
when the network resistance is changed between 0.01Ω and 3Ω can be seen in
Figure 4-18. The figure shows the normalized load capacitance verses normalized
frequency. The inductor has a value of 0.78nH and has a resistance of 0.41Ω. The
size of the NMOS transistors is 350µm. Voltage at the power supply is 0.5V.
- 65 -
Frequency vs load Capacitance with a resistance of 0.01 to 5 Ohms
0.400
0.900
1.400
1.900
2.400
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y
0.01 1 5 3
Figure 4-18: Effect of change in capacitance on the frequency of oscillation with different network resistances
For resistances of 0.01 Ω and 1Ω, the frequency response of the oscillator
to increase in load capacitance is the same. With the resistance of 0.01Ω, the trend
continues until a capacitance of 325pF and with a resistance of 1Ω the trend
continues until a value of 105pF. For resistance value of 3Ω, the frequency
decreases until a maximum load capacitance of 45pF. With a resistance of 5Ω, the
frequency first reduces with the increase in load capacitance until a value of 15pF
and then increases until a capacitance of 45pF after which there are no sustained
oscillations.
Ω
- 66 -
4.5.4. Area of the inductor verses Q of Inductor Table 4-7 and Figure 4-19 show the total area covered by the inductor for
different Q values, for a frequency of approx 1GHz, when a load capacitance of
30pF is present.
Table 4-7: Approximate area covered by the inductors for a given Q value of inductor
Approx Q Area µm2
2.5 125,0003.3 245,0004.2 605,0004.9 720,000
Area vs Approx Q
0100000200000
300000400000500000600000
700000800000
2.8 3.5 4.2 4.9
Q
Are
a (s
quar
e µm
)
Figure 4-19: Approximate area covered by the inductors for a given Q value of inductor
- 67 -
4.5.5. Power Consumption vs Q of the inductor As discussed for the cross-coupled inverter oscillator, power consumption
for a fixed voltage swing and frequency depends mainly on the network resistance,
the amount of load capacitance and the quality of the inductors. For a fixed load
capacitance and network resistance, the power consumption depends on the Q
value of the inductors. Lower Q values mean more losses in the inductor and
hence the power consumption of the oscillator is increased. Table 4-8 illustrates
how the power consumption is affected by the change in Q for inductance and
network resistance. The inductance value varies between 0.7nH to 0.78nH. Table 4-8: The power consumption of the oscillator vs the Quality factor of the inductor
QL
Quality of
Inductor
Rnw Ω Network Res.
wn (µm) width of NMOS
Supply Voltage
V
Power Consumption
mW
2.03 0.01 900 0.6 75.71 2.93 0.01 200 0.6 30.99
3.9 0.01 170 0.5 14.86 4.7 0.01 140 0.5 11.82 5.4 0.01 90 0.5 7.93
2.03 1 1200 0.6 79.71 2.93 1 330 0.6 46.05
3.9 1 200 0.6 34.83 4.7 1 175 0.6 30.23 5.4 1 140 0.6 25.26
2.03 2 1500 0.6 82.38 2.93 2 600 0.6 63.18
3.9 2 310 0.6 51.97 4.7 2 280 0.6 44.47 5.4 2 230 0.6 39.31
2.03 3 - 0.6 - 2.93 3 900 0.6 79.14
3.9 3 530 0.6 65.52 4.7 3 470 0.6 62.88 5.4 3 410 0.6 58.17
2.03 4 - 0.6 - 2.93 4 1000 0.65 101.27
3.9 4 900 0.6 82.92 4.7 4 900 0.58 73.37 5.4 4 720 0.58 70.56
- 68 -
Figure 4-20: Power consumption LC oscillator vs quality factor of the inductor and network resistance. Rnw stands for network resistance while Q is the quality factor of the inductor Figure 4-20 illustrates how the power consumption of the oscillator changes
for different Q values and network resistances. The efficiency of the oscillator
improves when the quality factor of the inductor is increased and the network
resistance is decreased. Figure 4-21 shows the output wave form from the
2inductor oscillator for which the power readings have been taken.
P mW
Q
Rnw Ω
- 69 -
Figure 4-21: Output wave form of the 2Inductor Oscillator at 1GHz
- 70 -
4.6. Comparison The first comparison of the two oscillators indicates how the change in load
capacitance affects the two oscillators when network resistance is changed from
0.01 to 5Ω is present. The load capacitance is changed from 5pF to135pF. Figure
4-22, 4-23, 4-24, 4-25 show the results of the simulations.
Frequrncy vs load Capacitance with a resistance of 0.01 Ohms
0.4000.6000.8001.0001.2001.4001.6001.8002.000
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y G
Hz
CCIP2L
Figure 4-22: Effect of change in capacitance on the frequency of oscillation with 0.01Ω resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator
Frequrncy vs load Capacitance with a resistance of 1 Ohms
0.4000.6000.8001.0001.2001.4001.6001.8002.000
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y G
Hz
CCIP2L
Figure 4-23: Effect of change in capacitance on the frequency of oscillation with 1Ω resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator
- 71 -
Frequrncy vs load Capacitance with a resistance of 3 Ohms
1.100
1.300
1.500
1.700
1.900
2.100
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y G
Hz
CCIP2L
Figure 4-24: Effect of change in capacitance on the frequency of oscillation with 3Ω resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator
Frequrncy vs load Capacitance with a resistance of 5 Ohms
1.3501.4501.5501.6501.7501.8501.9502.0502.150
5 15 25 35 45 55 65 75 85 95 105
Cload pF
Freq
uenc
y G
Hz
CCIP2L
Figure 4-25: Effect of change in capacitance on the frequency of oscillation with 3Ω resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator.
Figure 4-26 shows how the two oscillators compare in terms of inductor
area coverage vs quality of the inductor. The graph shows that the two inductor
oscillator requires more area for the inductor for the same value of Q as compared
to the cross-coupled inverter pair oscillator.
- 72 -
Inductor Area vs Inductor Q
0100000200000300000400000
500000600000700000800000
2.8 3.5 4.2 4.9
Q
Are
a (s
quar
e µm
)
CCIP2L
Figure 4-26: Approximate area covered by the inductors for a given Q value of inductor. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator Figures 4-27 to 4-31 show the ratio of the power consumption of the
conventional driver shown in Figure 4-2 to the power consumptions of both LC
oscillators under simulation vs the quality of the inductor for different values of
the network resistance. For network resistances of 3 and 4Ω, a current mirror
circuit such as the one shown in Figure 4-3 has been used for the cross-coupled
inverter pair oscillator to ease transistor sizing. This came at the expense of power
consumption and hence there is a big difference in power consumption of the
2inductor oscillator and the cross-coupled inverter pair oscillator for these
resistance values.
- 73 -
Power consumption of Oscillator vs Q of inductor with 0.01Ohm resistance
0123456789
2 3 4 5
Q
Pc/
Po CCIP2L
Figure 4-27: Ratio of Power consumption of conventional inverter driver to the power consumption of LC oscillator vs quality factor of the inductor when there is 0.01Ω network resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator. Pc is the power consumption of the conventional driver while Po is for the LC oscillator
Power consumption of Oscillator vs Q of inductor with 1 Ohm resistance
0.4
0.9
1.4
1.9
2.4
2.9
2 3 4 5
Q
Pc/P
o CCIP2L
Figure 4-28: Ratio of Power consumption of conventional inverter driver to the power consumption of LC oscillator vs quality factor of the inductor when there is 1Ω network resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator. Pc is the power consumption of the conventional driver while Po is for the LC oscillator
- 74 -
Power consumption of Oscillator vs Q of inductor with 2 Ohms resistance
0.4
0.6
0.8
1
1.2
1.4
1.6
2 3 4 5
Q
Pc/P
o CCIP2L
Figure 4-29: Ratio of Power consumption of conventional inverter driver to the power consumption of LC oscillator vs quality factor of the inductor when there is 2Ω network resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator. Pc is the power consumption of the conventional driver while Po is for the LC oscillator
Power consumption of Oscillator vs Q of inductor with 3 Ohms resistance
0.4
0.5
0.6
0.7
0.8
0.9
1
2 3 4 5
Q
Pc/
Po CCIP
2L
Figure 4-30: Ratio of Power consumption of conventional inverter driver to the power consumption of LC oscillator vs quality factor of the inductor when there is 3Ω network resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator. Pc is the power consumption of the conventional driver while Po is for the LC oscillator
- 75 -
Power consumption of Oscillator vs Q of inductor with 4 Ohms resistance
00.10.20.30.40.50.60.70.80.9
2 3 4 5
Q
Pc/
Po CCIP2L
Figure 4-31: Ratio of Power consumption of conventional inverter driver to the power consumption of LC oscillator vs quality factor of the inductor when there is 4Ω network resistance. CCIP stands for Cross-coupled inverter pair oscillator and 2L stands for 2 Inductor Oscillator. Pc is the power consumption of the conventional driver while Po is for the LC oscillator
Transistor Sizes vs Network Resistance
0
200
400
600
800
1000
1200
0.01 1 2 3
Network Resistance Ohm
Tran
sist
o W
idth
µm
wp-CCIPwn-CCIPwn-2L
Figure 4-32: Transistor Widths vs the Network Resistance for a Q factor of inductors of 4.6. Figures 4-22 to 4-32 show how the two oscillators compare with each other
in terms of change in load frequency, the inductor area requirements and power
consumption. Figure 4-22 and Figure 4-23 suggest that when the network
resistance is low (0 to 1Ω), the frequency response of both oscillators is similar to
- 76 -
an LC tank circuit. For a load capacitance of 5pF we see that the 2inductor
oscillator is operating at a higher frequency than the cross-coupled inverter
oscillator. This difference is due to the capacitive loading of the PMOS transistors
in the cross coupled inverter oscillator which causes this oscillator to see more
load capacitance than the 2inductor oscillator. This difference in frequency
continues until a load capacitance of 20pF after which the capacitive load of the
PMOS transistor is smaller compared to the load capacitance and hence there is no
significant difference in operation frequency between the two oscillators. Figure 4-
24 shows that for network resistance of 3Ω the operation frequency of the
2inductor oscillator decreases with the increase in load capacitance until a a value
of 45pF after which there are no sustainable oscillations. The operation frequency
of the cross-coupled inverter oscillator decreases with the increase in load
capacitance until a value of 45pF and then increases until a value of 65pF after
which there are no sustainable oscillations. The cross-coupled inverter oscillator
can operate with more load because of the additional gain provided by the PMOS
transistors. Figure 4-25 shows that at 5Ω in the 2inductor oscillator, the frequency
first decreases until a value of 20pF and then increases until a value of 45pF after
which there are no sustainable oscillations. For the cross-coupled inverter
oscillator the frequency decreases with the increase in load capacitance until a
value of 25pF and then increases with the increase in load capacitance until a
value of 2nF. We can also conclude from these figures that as the network
resistance increases there is a larger difference between the operation frequencies
of the oscillators. As the resistance increases the 2inductor oscillator requires more
inductance to match the frequency of the cross-coupled inverter oscillator or
conversely, the cross-coupled inverter oscillator requires lesser inductance to
match the frequency of the 2inductor oscillator.
Figure 4-28 shows that at a network resistance of 1Ω the power efficiency
of the cross-coupled inverter pair oscillator is greater compared to the 2indctor
oscillator. This is because from the AC point of view, the two inductors are in
- 77 -
series with each other and the capacitance. When two schematic π models of the
inductors are placed in series, the effective Q is reduced. This is not the case with
the cross-coupled inverter pair oscillator which has just one inductor and requires
lesser inductance to operate at the same frequency for the same load. At a
resistance of 2Ω in Figure 4-29 we see that the efficiencies of the two oscillators
are equal. The reason for this can be explained with the help of Figure 4-32 which
shows that the size of the transistors in the cross-coupled inverter oscillator at this
resistance value is much larger than the size of the transistors in the 2inductor
oscillator. Since the size of the transistors is much larger, its differential cross-
coupled structure consumes more power than the cross-coupled structure of the
2inductor oscillator. The power consumption of the cross-coupled inverter
oscillator therefore becomes comparable to the 2inductor oscillator. Figures 4-30
and 4-31 show that at higher network resistances there is a big difference between
the performance of the two oscillators because the sizes of the transistors used in
the cross-coupled inverter pair oscillator are much larger than the sizes of the
transistors used in the 2inductor oscillator and a current mirror circuit has to be
used in the cross-coupled inverter pair oscillator to keep the sizes of the PMOS
transistors in check. This however gives a large efficiency penalty as the current
mirror circuit draws a lot of current from the supply. Even with the use of the
current mirror circuit, the sizes of the transistors are quite large. At network
resistances between 3 and 4Ω, the 2inductor oscillator shows much better
performance.
Selection of one oscillator depends highly on the application. Suppose there
are a number of constraints. The area for the inductance is limited to 500,000µm2
(707µm X 707µm). The network resistance is 1Ω. With the given area the highest
Q value of the inductor that can be achieved when a 2Inductor oscillator is used is
approx 4, according to Figure 4-26. Since there are two inductors, they will share
the space that is provided. Compare this to the Q value of the inductor that can be
attained if a Cross-Coupled inverter pair oscillator is used. This is 4.9 according to
- 78 -
Figure 4-26. If we look at Figure 4-28 and at how much power the two oscillators
consume with these Q values we can see that the ratio for the 2 inductor oscillator
is 1.5 while for the cross-coupled inverter oscillator it is 2.3. With this given
situation the cross-coupled inverter oscillator uses 23% less power than the 2
inductor oscillator. Therefore, for these particular constraints the cross-coupled
inverter pair oscillator is more suitable for the application.
- 79 -
5. CONCLUSIONS In the second section a study of on-chip Inductors has been done. Inductors
of many different Q values can be made on-chip. Using wider inductor wires
decreases the series resistance and this has a positive effect on Q. On the other
hand if the inductor wire is too wide, parasitic capacitances begin to increase and
have an adverse effect on Q. Furthermore, if the inductor wire is wider it will
require more Area. Therefore, an inductor has to be made keeping in mind the
required Power Consumption, Available Area and the Oscillation Frequency of
interest. The third section shows a study and comparison of the two oscillators in
terms of effect of change in load capacitance on frequency, the power efficiency of
the two oscillators, the transistor sizes required and the approx area required for
the inductance. Simulation results suggest that for network resistances from 3 to
4Ω the two inductor oscillator is more efficient. Between resistances of 0 and 1Ω
the cross-coupled inverter oscillator is more effecient. We can also conclude that
in order to increase the efficiency of the oscillators compared to a conventional
driver the quality factor of the inductor needs to be maximized and the network
resistance needs to be minimized. Finally, we conclude that the selection of one
oscillator depends on the amount of network resistance and the area available for
the on-chip inductor. For a given area of 500,000µm2 and a fixed network
resistance of 1Ω the cross-coupled inverter pair oscillator is 23% more efficient
than the two inductor oscillator. However for the given inductance area and a
network resistance of 3 to 4Ω the 2 inductor oscillator is much more efficient.
- 80 -
REFERENCES [1] Reinhold Ludwig; Pavel Bretchko, “RF Circuit Design Theory and Applications”, Prentice Hall, 2000 [2] Chan, S.C.; Restle, P.J.; Shepard, K.L; James, N.K.; Franch, R.L.; “A 4.6GHz resonant global clock distribution network”, Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International , 15-19 Feb. 2004 Pages:342 - 343 Vol.1 [3] Drake, A.J.; Nowka, K.J.; Nguyen, T.Y.; Burns, J.L.; Brown, R.B.;” Resonant clocking using distributed parasitic capacitance”,Solid-State Circuits, IEEE Journal of ,Volume: 39 , Issue: 9 , Sept. 2004 Pages:1520 – 1528 [4] Cooke, M.; Mahmoodi-Meimand, H.; Roy, K.;”Energy recovery clocking scheme and flip-flops for ultra low-energy applications”, Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on , 25-27 Aug. 2003 Pages:54 – 59 [5] Thomas H. Lee, “The Design of CMOS Radio-Frequency Integrated Circuits”, Cambridge University Press, 1998. [6] Mohan, S.S.; del Mar Hershenson, M,; Boyd, S.P.; Lee, T.H;”Simple accurate expressions for planar spiral inductances”, Solid-State Circuits, IEEE Journal of ,Volume: 34 , Issue: 10 , Oct. 1999 Pages:1419 – 1424 [7] Wang Tao; Wang Yong; Cao Ming; Chen Kangsheng; “A novel technique fast optimizing the layout parameters of planar spiral inductor” ASIC, 2003. Proceedings. 5th International Conference on, Volume: 1 , 21-24 Oct. 2003 Pages:302 - 305 Vol.1 [8] Shwetabh Verma, Jose M. Cruz “On-Chip Inductors and Transformers”, SML Technical Report Series, Sun Microsystems, 1999.
- 81 -
[9] Mostafa, A.H.; El-Gamal, M.N.; Rafla, R.A.; “A Sub-1-V 4-GHz CMOS VCO and a 12.5-GHz oscillator for low-voltage and high-frequency applications” Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on [see also Circuits and Systems II: Express Briefs, IEEE Transactions on], Volume: 48 , Issue: 10 , Oct. 2001 Pages:919 – 926 [10] Samori, C.; Levantino, S.; Lacaita, A.L.;”Integrated LC oscillators for frequency synthesis in wireless applications”, Communications Magazine, IEEE, Volume: 40 , Issue: 5 , May 2002 Pages:166 – 171 [11] Levantino, S.; Samori, C.; Bonfanti, A.; Gierkink, S.L.J.; Lacaita, A.L.; Boccuzzi, V.;”Frequency dependence on bias current in 5 GHz CMOS VCOs: impact on tuning range and flicker noise upconversion”, Solid-State Circuits, IEEE Journal of , Volume: 37 , Issue: 8 , Aug. 2002 Pages:1003 – 1011 [12] Tiebout, M.; Wohlmuth, H.-D.; Simburger, W.;”A 1 V 51GHz fully-integrated VCO in 0.12 µm CMOS”, Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International , Volume: 1 , 3-7 Feb. 2002 Pages:300 - 468 vol.1 [13] Gabara, T.; Fischer, B.; “Multi-GHz CMOS oscillators”, ASIC Conference and Exhibit, 1994. Proceedings., Seventh Annual IEEE International , 19-23 Sept. 1994 Pages:41 – 43 [14] Hsiao, C.C.; Kuo, C.W.; Chan, Y.J.;”6.8 GHz monolithic oscillator fabricated by 0.35 µm CMOS technologies”, Electronics Letters, Volume: 36, Issue: 23 , 9 Nov. 2000 Pages:1927 – 1928 [15] Yue, C.P.; Wong, S.S.;”On-chip spiral inductors with patterned ground shields for Si-based RF ICs”, Solid-State Circuits, IEEE Journal of, Volume: 33, Issue: 5, May 1998 Pages: 743 – 752 [16] Yue, C.P.; Ryu, C.; Lau, J.; Lee, T.H.; Wong, S.S.;”A physical model for planar spiral inductors on silicon”, Electron Devices Meeting, 1996., International, 8-11 Dec. 1996 Pages:155 - 158
På svenska Detta dokument hålls tillgängligt på Internet – eller dess framtida ersättare – under en längre tid från publiceringsdatum under förutsättning att inga extra-ordinära omständigheter uppstår.
Tillgång till dokumentet innebär tillstånd för var och en att läsa, ladda ner, skriva ut enstaka kopior för enskilt bruk och att använda det oförändrat för ickekommersiell forskning och för undervisning. Överföring av upphovsrätten vid en senare tidpunkt kan inte upphäva detta tillstånd. All annan användning av dokumentet kräver upphovsmannens medgivande. För att garantera äktheten, säkerheten och tillgängligheten finns det lösningar av teknisk och administrativ art.
Upphovsmannens ideella rätt innefattar rätt att bli nämnd som upphovsman i den omfattning som god sedkräver vid användning av dokumentet på ovan beskrivna sätt samt skydd mot att dokumentet ändras eller presenteras i sådan form eller i sådant sammanhang som är kränkande för upphovsmannens litterära eller konstnärliga anseende eller egenart.
För ytterligare information om Linköping University Electronic Press se förlagets hemsida http://www.ep.liu.se/ In English The publishers will keep this document online on the Internet - or its possible replacement - for a considerable time from the date of publication barring exceptional circumstances.
The online availability of the document implies a permanent permission for anyone to read, to download, to print out single copies for your own use and to use it unchanged for any non-commercial research and educational purpose. Subsequent transfers of copyright cannot revoke this permission. All other uses of the document are conditional on the consent of the copyright owner. The publisher has taken technical and administrative measures to assure authenticity, security and accessibility.
According to intellectual property law the author has the right to be mentioned when his/her work is accessed as described above and to be protected against infringement.
For additional information about the Linköping University Electronic Press and its procedures for publication and for assurance of document integrity, please refer to its WWW home page: http://www.ep.liu.se/ © Junaid Aslam