fds6690as
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©2008 Fairchild Semiconductor Corporation FDS6690AS Rev A2(X)
FDS6690AS 30V N-Channel PowerTrench® SyncFET™
General Description
The FDS6690AS is designed to replace a single SO-8 MOSFET and Schottky diode in synchronous DC:DC power supplies. This 30V MOSFET is designed to maximize power conversion efficiency, providing a low RDS(ON) and low gate charge. The FDS6690AS includes an integrated Schottky diode using Fairchild’s monolithic SyncFET technology. The performance of the FDS6690AS as the low-side switch in a synchronous rectifier is close to the performance of the FDS6690A in parallel with a Schottky diode.
Applications
• DC/DC converter
• Low side notebooks
Features
• 10 A, 30 V. RDS(ON) max= 12 mΩ @ VGS = 10 V RDS(ON) max= 15 mΩ @ VGS = 4.5 V
• Includes SyncFET Schottky diode
• Low gate charge (16nC typical)
• High performance trench technology for extremely low RDS(ON)
• High power and current handling capability
S
D
SSSO-8
DD
D
G
4
3
2
1
5
6
7
8
Absolute Maximum Ratings TA=25oC unless otherwise noted Symbol Parameter Ratings UnitsVDSS Drain-Source Voltage 30 V VGSS Gate-Source Voltage ±20 V ID Drain Current – Continuous (Note 1a) 10 A – Pulsed 50
Power Dissipation for Single Operation (Note 1a) 2.5 (Note 1b) 1.2
PD
(Note 1c) 1
W
TJ, TSTG Operating and Storage Junction Temperature Range –55 to +150 °C
Thermal Characteristics RθJA Thermal Resistance, Junction-to-Ambient (Note 1a) 50 °C/W RθJC Thermal Resistance, Junction-to-Case (Note 1) 25 °C/W
Package Marking and Ordering Information Device Marking Device Reel Size Tape width Quantity
FDS6690AS FDS6690AS 13’’ 12mm 2500 units
tm
May 2008
FDS
6690AS
30V N
-Ch
ann
el Po
werTren
ch® S
yncF
ET
™
FDS6690AS Rev A2 (X)
Electrical Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics BVDSS Drain–Source Breakdown Voltage VGS = 0 V, ID = 1 mA 30 V ∆BVDSS ∆TJ
Breakdown Voltage Temperature Coefficient ID = 10 mA, Referenced to 25°C 30 mV/°C
IDSS Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V 500 µA IGSS Gate–Body Leakage VGS = ±20 V, VDS = 0 V ±100 nA
On Characteristics (Note 2) VGS(th) Gate Threshold Voltage VDS = VGS, ID = 1 mA 1 1.6 3 V ∆VGS(th)
∆TJ Gate Threshold Voltage Temperature Coefficient
ID = 10 mA, Referenced to 25°C –4 mV/°C
RDS(on) Static Drain–Source On–Resistance
VGS = 10 V, ID = 10 A VGS = 4.5 V, ID = 8.5 A VGS=10 V, ID =10A, TJ=125°C
10 12 15
12 15 19
mΩ
ID(on) On–State Drain Current VGS = 10 V, VDS = 5 V 50 A gFS Forward Transconductance VDS = 15 V, ID = 10 A 45 S
Dynamic Characteristics Ciss Input Capacitance 910 pF Coss Output Capacitance 270 pF Crss Reverse Transfer Capacitance
VDS = 15 V, V GS = 0 V, f = 1.0 MHz
100 pF RG Gate Resistance VGS = 15 mV, f = 1.0 MHz 2.0 Ω
Switching Characteristics (Note 2) td(on) Turn–On Delay Time 8 16 ns tr Turn–On Rise Time 5 10 ns td(off) Turn–Off Delay Time 25 40 ns tf Turn–Off Fall Time
VDS = 15 V, ID = 1 A, VGS = 10 V, RGEN = 6 Ω
6 12 ns td(on) Turn–On Delay Time 11 20 ns tr Turn–On Rise Time 11 20 ns td(off) Turn–Off Delay Time 15 27 ns tf Turn–Off Fall Time
VDS = 15 V, ID = 1 A, VGS = 4.5 V, RGEN = 6 Ω
8 16 ns
Qg(TOT) Total Gate Charge at Vgs=10V 16 23 nC Qg Total Gate Charge at Vgs=5V 9 13 nC Qgs Gate–Source Charge 2.3 nC Qgd Gate–Drain Charge
VDD = 15 V, ID = 10 A
3.0 nC
FD
S6690A
S 30V
N-C
han
nel P
ow
erTrench
® Syn
cFE
T™
FDS6690AS Rev A2 (X)
Electrical Characteristics TA = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units
Drain–Source Diode Characteristics and Maximum Ratings IS Maximum Continuous Drain–Source Diode Forward Current 3.5 A
VSD Drain–Source Diode Forward Voltage
VGS = 0 V, IS = 3.5 A (Note 2)
0.6 0.7 V
Trr Diode Reverse Recovery Time IF = 10A, 16 nS
Qrr Diode Reverse Recovery Charge diF/dt = 300 A/µs (Note 3) 9 nC
Notes: 1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the
drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a) 50°/W when mounted on a 1 in2 pad of 2 oz copper
b) 105°/W when mounted on a .04 in2 pad of 2 oz copper
c) 125°/W when mounted on a minimum pad.
Scale 1 : 1 on letter size paper 2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0% 3. See “SyncFET Schottky body diode characteristics” below.
FDS
6690AS
30V N
-Ch
ann
el Po
werTren
ch® S
yncF
ET
™
FDS6690AS Rev A2 (X)
Typical Characteristics
0
10
20
30
40
50
0 0.5 1 1.5 2VDS, DRAIN-SOURCE VOLTAGE (V)
I D, D
RA
IN C
UR
REN
T (A
)
4.0V
4.5V
3.0V
2.5V
VGS = 10V
6.0V
0.6
1
1.4
1.8
2.2
0 10 20 30 40 50ID, DRAIN CURRENT (A)
RD
S(O
N),
NO
RM
ALI
ZED
DR
AIN
-SO
UR
CE
ON
-RES
ISTA
NC
E
VGS = 4.0V
6.0V
4.0V
10V
5.0V4.5V
3.5V
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with Drain Current and Gate Voltage.
0.7
0.85
1
1.15
1.3
1.45
1.6
-50 -25 0 25 50 75 100 125 150TJ, JUNCTION TEMPERATURE (oC)
RD
S(O
N),
NO
RM
ALI
ZED
DR
AIN
-SO
UR
CE
ON
-RES
ISTA
NC
E
ID = 10AVGS = 10V
0
0.01
0.02
0.03
0.04
0.05
0.06
2 4 6 8 10VGS, GATE TO SOURCE VOLTAGE (V)
RD
S(O
N),
ON
-RES
ISTA
NC
E (O
HM
)
ID = 5A
TA = 125oC
TA = 25oC
Figure 3. On-Resistance Variation with Temperature.
Figure 4. On-Resistance Variation with Gate-to-Source Voltage.
0
10
20
30
40
50
1 1.5 2 2.5 3 3.5 4VGS, GATE TO SOURCE VOLTAGE (V)
I D, D
RA
IN C
UR
REN
T (A
)
TA = 125oC
25oC
-55oC
VDS = 5V
0.001
0.01
0.1
1
10
0 0.2 0.4 0.6 0.8VSD, BODY DIODE FORWARD VOLTAGE (V)
I S, R
EVER
SE D
RA
IN C
UR
REN
T (A
)
TA = 125oC
25oC
-55oC
VGS = 0V
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature.
FDS
6690AS
30V N
-Ch
ann
el Po
werTren
ch® S
yncF
ET
™
FDS6690AS Rev A2(X)
Typical Characteristics
0
2
4
6
8
10
0 3 6 9 12 15 18 21Qg, GATE CHARGE (nC)
V GS,
GA
TE-S
OU
RC
E VO
LTA
GE
(V) ID =10A
VDS = 10V
15V
20V
0
200
400
600
800
1000
1200
1400
0 5 10 15 20 25 30VDS, DRAIN TO SOURCE VOLTAGE (V)
CA
PAC
ITA
NC
E (p
F) Ciss
Crss
Coss
f = 1MHzVGS = 0 V
Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics.
0.01
0.1
1
10
100
0.1 1 10 100VDS, DRAIN-SOURCE VOLTAGE (V)
I D, D
RA
IN C
UR
REN
T (A
)
DC10s
1s
100ms
100µs
RDS(ON) LIMIT
VGS = 10VSINGLE PULSERθJA = 125oC/W
TA = 25oC
10ms1ms
0
10
20
30
40
50
0.001 0.01 0.1 1 10 100 1000t1, TIME (sec)
P(pk
), PE
AK
TR
AN
SIEN
T PO
WER
(W) SINGLE PULSE
RθJA = 125°C/WTA = 25°C
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum Power Dissipation.
0.001
0.01
0.1
1
0.0001 0.001 0.01 0.1 1 10 100 1000
t1, TIME (sec)
r(t),
NO
RM
ALI
ZED
EFF
ECTI
VE
TRA
NSI
ENT
THER
MA
L R
ESIS
TAN
CE
RθJA(t) = r(t) * RθJA
RθJA = 125 °C/W
TJ - TA = P * RθJA(t)Duty Cycle, D = t1 / t2
P(pk)
t1t2
SINGLE PULSE
0.010.02
0.05
0.1
0.2
D = 0.5
Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design.
FDS
6690AS
30V N
-Ch
ann
el Po
werTren
ch® S
yncF
ET
™
FDS6690AS Rev A2(X)
Typical Characteristics (continued)
SyncFET Schottky Body Diode Characteristics
Fairchild’s SyncFET process embeds a Schottky diode in parallel with PowerTrench MOSFET. This diode exhibits similar characteristics to a discrete external Schottky diode in parallel with a MOSFET. Figure 12 shows the reverse recovery characteristic of the FDS6690AS.
Figure 12. FDS6690AS SyncFET body diode reverse recovery characteristic.
For comparison purposes, Figure 13 shows the reverse recovery characteristics of the body diode of an equivalent size MOSFET produced without SyncFET (FDS6690A).
Figure 13. Non-SyncFET (FDS6690A) body diode reverse recovery
characteristic.
Schottky barrier diodes exhibit significant leakage at high temperature and high reverse voltage. This will increase the power in the device.
0.000001
0.00001
0.0001
0.001
0.01
0.1
0 5 10 15 20 25 30VDS, REVERSE VOLTAGE (V)
I DSS
, REV
ERSE
LEA
KA
GE
CU
RR
ENT
(A)
TA = 125oC
TA = 25oC
TA = 100oC
Figure 14. SyncFET body diode reverse leakage versus drain-source voltage and temperature.
10nS/DIV
3A/D
IV
10nS/DIV
3A/D
IV
0V
FDS
6690AS
30V N
-Ch
ann
el Po
werTren
ch® S
yncF
ET
™
FDS6690AS Rev A2(X)
Typical Characteristics
VDS L
Figure 15. Unclamped Inductive Load Test Circuit
Figure 16. Unclamped Inductive Waveforms
Figure 20. Switching Time Waveforms
RGE DUTVGS
IAS
0.01Ω
VDD
+
-tp
0V
vary tP to obtain required peak IAS
VGS
tAV
tPIAS
VDS
VDD
BVDSS
Figure 19. Switching Time Test Circuit
VDS RL
RGEN DUT VDD
VGS
Pulse Width ≤ 1µs Duty Cycle ≤ 0.1%
VGS
+
-
tr tftd(ON) td(OFF
)
tON tOFF
Pulse Width10%
10%
90%
10%
90%
50%
90%
50%
0V
0V
VGS
VDS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveform
VGS QGS QGD
QG(TOT)
10V
Charge, (nC)
DUT
VDD
VGS
Ig(REF
+
-
+
-
Same type as
Drain Current
1µF 10µ
F 10V
50kΩ
FD
S6690A
S 30V
N-C
han
nel P
ow
erTrench
® Syn
cFE
T™
Rev. I34
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Datasheet Identification Product Status Definition
Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Preliminary First ProductionThis datasheet contains preliminary data; supplementary data will be pub-lished at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Obsolete Not In Production This datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
FDS6690AS Rev.A2(X)