fdp55n06 fdp55n06 / fdpf55n06mosfet ©2005 fairchild semiconductor corporation fdp55n06 / fdpf55n06...

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October 2013 FDP55N06 / FDPF55N06 — N-Channel UniFET TM MOSFET ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0 www.fairchildsemi.com 1 FDP55N06 / FDPF55N06 N-Channel UniFET TM MOSFET 60 V, 55 A, 22 mFeatures R DS(on) = 22 m@V GS = 10 V, I D = 27.5 A Low Gate Charge ( Typ. 30 nC) Low Crss ( Typ. 60 pF) 100% Avalanche Tested Description UniFET TM MOSFET is Fairchild Semiconductor’s high voltage MOSFET family based on planar stripe and DMOS technology. This MOSFET is tailored to reduce on-state resistance, and to provide better switching performance and higher avalanche energy strength. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat panel display (FPD) TV power, ATX and electronic lamp ballasts. TO-220 G D S TO-220F G D S G S D Absolute Maximum Ratings T C = 25°C unless otherwise noted * Drain current limited by maximum junction temperature Thermal Characteristics Symbol Parameter FDP55N06 FDPF55N06 Unit V DSS Drain-Source Voltage 60 V I D Drain Current - Continuous (T C = 25°C) 55 55 * A - Continuous (T C = 100°C) 34.8 34.8 * A I DM Drain Current - Pulsed (Note 1) 220 220 * A V GSS Gate-Source Voltage ± 25 V E AS Single Pulsed Avalanche Energy (Note 2) 480 mJ I AR Avalanche Current (Note 1) 55 A E AR Repetitive Avalanche Energy (Note 1) 11.4 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns P D Power Dissipation (T C = 25°C) 114 48 W - Derate above 25°C 0.9 0.4 W/°C T J , T STG Operating and Storage Temperature Range -55 to +150 °C T L Maximum lead temperature for soldering purposes, 1/8" from case for 5 seconds 300 °C Symbol Parameter FDP55N06 FDPF55N06 Unit R θJC Thermal Resistance, Junction-to-Case, Max. 1.1 2.58 °C/W R θJS Thermal Resistance, Case-to-Sink, Typ. 0.5 -- °C/W R θJA Thermal Resistance, Junction-to-Ambient, Max, 62.5 62.5 °C/W

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  • October 2013

    FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com1

    FDP55N06 / FDPF55N06N-Channel UniFETTM MOSFET60 V, 55 A, 22 mΩ

    Features• RDS(on) = 22 mΩ @VGS = 10 V, ID = 27.5 A

    • Low Gate Charge ( Typ. 30 nC)

    • Low Crss ( Typ. 60 pF)

    • 100% Avalanche Tested

    DescriptionUniFETTM MOSFET is Fairchild Semiconductor’s high voltage MOSFET family based on planar stripe and DMOS technology. This MOSFET is tailored to reduce on-state resistance, and to provide better switching performance and higher avalanche energy strength. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat panel display (FPD) TV power, ATX and electronic lamp ballasts.

    TO-220GDS TO-220F

    GDS

    G

    S

    D

    Absolute Maximum Ratings TC = 25°C unless otherwise noted

    * Drain current limited by maximum junction temperature

    Thermal Characteristics

    Symbol Parameter FDP55N06 FDPF55N06 UnitVDSS Drain-Source Voltage 60 VID Drain Current - Continuous (TC = 25°C) 55 55 * A

    - Continuous (TC = 100°C) 34.8 34.8 * AIDM Drain Current - Pulsed (Note 1) 220 220 * AVGSS Gate-Source Voltage ± 25 VEAS Single Pulsed Avalanche Energy (Note 2) 480 mJIAR Avalanche Current (Note 1) 55 AEAR Repetitive Avalanche Energy (Note 1) 11.4 mJdv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/nsPD Power Dissipation (TC = 25°C) 114 48 W

    - Derate above 25°C 0.9 0.4 W/°CTJ, TSTG Operating and Storage Temperature Range -55 to +150 °C

    TLMaximum lead temperature for soldering purposes, 1/8" from case for 5 seconds

    300 °C

    Symbol Parameter FDP55N06 FDPF55N06 UnitRθJC Thermal Resistance, Junction-to-Case, Max. 1.1 2.58 °C/WRθJS Thermal Resistance, Case-to-Sink, Typ. 0.5 -- °C/WRθJA Thermal Resistance, Junction-to-Ambient, Max, 62.5 62.5 °C/W

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com2

    Package Marking and Ordering InformationDevice Marking Device Package Reel Size Tape Width Quantity

    FDP55N06 FDP55N06 TO-220 Tube N/A 50 unitsFDPF55N06 FDPF55N06 TO-220F Tube N/A 50 units

    Electrical Characteristics TC = 25°C unless otherwise notedSymbol Parameter Test Conditions Min Typ Max UnitsOff Characteristics

    BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA 60 -- -- V

    ∆BVDSS / ∆TJ

    Breakdown Voltage Temperature Coefficient ID = 250 µA, Referenced to 25°C -- 0.05 -- V/°C

    IDSS Zero Gate Voltage Drain Current VDS = 60 V, VGS = 0 V -- -- 1 µA

    VDS = 48 V, TC = 150°C -- -- 10 µA

    IGSSF Gate-Body Leakage Current, Forward VGS = 20 V, VDS = 0 V -- -- 100 nA

    IGSSR Gate-Body Leakage Current, Reverse VGS = -20 V, VDS = 0 V -- -- -100 nA

    On Characteristics

    VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA 2.0 -- 4.0 V

    RDS(on) Static Drain-Source On-Resistance

    VGS = 10 V, ID = 27.5 A -- 0.018 0.022 Ω

    gFS Forward Transconductance VDS = 25 V, ID = 27.5 A -- 33 -- S

    Dynamic Characteristics

    Ciss Input Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz

    -- 1160 1510 pF

    Coss Output Capacitance -- 375 490 pF

    Crss Reverse Transfer Capacitance -- 60 90 pF

    Switching Characteristics

    td(on) Turn-On Delay Time VDD = 30 V, ID = 55 A,RG = 25 Ω

    (Note 4)

    -- 30 65 ns

    tr Turn-On Rise Time -- 130 265 ns

    td(off) Turn-Off Delay Time -- 70 150 ns

    tf Turn-Off Fall Time -- 95 195 ns

    Qg Total Gate Charge VDS = 48 V, ID = 55A,VGS = 10 V

    (Note 4)

    -- 30 37 nC

    Qgs Gate-Source Charge -- 6.5 -- nC

    Qgd Gate-Drain Charge -- 7.5 -- nC

    Drain-Source Diode Characteristics and Maximum Ratings

    IS Maximum Continuous Drain-Source Diode Forward Current -- -- 55 A

    ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 220 A

    VSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = 55 A -- -- 1.4 V

    trr Reverse Recovery Time VGS = 0 V, IS = 55 A,dIF / dt = 100 A/µs

    -- 40 -- ns

    Qrr Reverse Recovery Charge -- 55 -- µC

    Notes:1. Repetitive Rating : Pulse width limited by maximum junction temperature

    2. L = 5.6mH, IAS = 55A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C

    3. ISD ≤ 55A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C

    4. Essentially independent of operating temperature

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com3

    Typical Performance Characteristics

    Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics

    10-1 0 101100

    101

    102

    VGSTop : 15.0 V

    10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V

    Bottom : 4.5 V

    * Notes : 1. 250µs Pulse Test 2. TC = 25

    oC

    I D, D

    rain

    Cur

    rent

    [A]

    10

    VDS, Drain-Source Voltage [V]2 64 10

    100

    101

    102

    150oC

    25oC-55oC

    * otes :1. VDS = 30V2. 250µs Pulse Test

    I D, D

    rain

    Cur

    rent

    [A]

    4

    VGS, Gate-Source Voltage [V]

    Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage Drain Current and Gate Voltage Variation vs. Source Current

    and Temperatue

    0 25 50 75 100 125 150 175 200

    0.02

    0.03

    0.04

    0.05

    VGS = 20V

    VGS = 10V

    * Note : TJ = 25oC

    RD

    S(O

    N) [

    O],

    Dra

    in-S

    ourc

    e O

    n-R

    esis

    tanc

    e

    ID, Drain Current [A]0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8

    100

    101

    102

    150oC

    * Notes :1. VGS = 0V2. 250µs Pulse Test

    25oC

    I DR, R

    ever

    se D

    rain

    Cur

    rent

    [A]

    VSD, Source-Drain voltage [V]

    Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics

    10-1 0 1010

    500

    1000

    1500

    2000

    2500Ciss = Cgs + Cgd (Cds = shorted)Coss = Cds + CgdCrss = Cgd

    * Note :1. VGS = 0 V2. f = 1 MHzCrss

    Coss

    Ciss

    Cap

    acita

    nces

    [pF]

    10

    VDS, Drain-Source Voltage [V]

    0 5 10 15 20 25 300

    2

    4

    6

    8

    10

    12

    VDS = 30V

    VDS = 48V

    * Note : ID = 55A

    VG

    S, G

    ate-

    Sour

    ce V

    olta

    ge [V

    ]

    QG, Total Gate Charge [nC]

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com4

    Figure 7. Breakdown Voltage Variation vs. Temperature

    Figure 8. On-Resistance Variation vs. Temperature

    -100 -50 0 50 100 150 2000.8

    0.9

    1.0

    1.1

    1.2

    * Notes :1. VGS = 0 V2. ID = 250 µA

    BV

    DSS

    , (N

    orm

    aliz

    ed)

    Dra

    in-S

    ourc

    e B

    reak

    dow

    n V

    olta

    ge

    TJ, Junction Temperature [oC]

    -100 -50 0 50 100 150 2000.0

    0.5

    1.0

    1.5

    2.0

    2.5

    3.0

    * Notes :1. VGS = 10 V2. ID = 27.5 A

    RD

    S(O

    N),

    (Nor

    mal

    ized

    )D

    rain

    -Sou

    rce

    On-

    Res

    ista

    nce

    TJ, Junction Temperature [oC]

    Figure 9-1. Maximum Safe Operating Area Figure 9-2. Maximum Safe Operating Areafor FDP55N06 for FDPF55N06

    100 101 10210-2

    10-1

    100

    101

    102

    103

    1 ms

    10 µs

    DC10 ms

    100 µs

    Operation in This Area is Limited by R DS(on)

    * Notes :1. TC = 25

    oC

    2. TJ = 150 oC

    3. Single Pulse

    I D, D

    rain

    Cur

    rent

    [A]

    VDS, Drain-Source Voltage [V]100 101 102

    10-2

    10-1

    100

    101

    102

    103

    100 ms

    1 ms

    10 µs

    DC

    10 ms

    100 µs

    Operation in This Area is Limited by R DS(on)

    * Notes : 1. TC = 25

    oC

    2. TJ = 150 oC

    3. Single Pulse

    I D, D

    rain

    Cur

    rent

    [A]

    VDS, Drain-Source Voltage [V]

    Figure 10. Maximum Drain Current vs. Case Temperature

    25 50 75 100 125 1500

    10

    20

    30

    40

    50

    60

    I D, D

    rain

    Cur

    rent

    [A]

    TC, Case Temperature [oC]

    Typical Performance Characteristics (Continued)

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com5

    Typical Performance Characteristics (Continued)

    Figure 11-1. Transient Thermal Response Curve for FDP55N06

    t1, Square W ave Pulse Duration [sec]

    Figure 11-2. Transient Thermal Response Curve for FDPF55N06

    10-5 10-4 10-3 10-2 10-1 100 101

    10-2

    10-1

    100

    * Notes : 1. Z? JC(t) = 1.1

    oC/W Max. 2. Duty Factor, D=t1/t2 3. TJM - TC = PDM * Z? JC(t)

    single pulse

    D=0.5

    0.02

    0.2

    0.05

    0.1

    0.01

    10-5 10-4 10-3 10-2 10-1 100 101

    10-2

    10-1

    100

    * Notes : 1. Z? JC(t) = 2.58

    oC /W Max. 2. Duty Factor, D=t1/t2 3. T JM - T C = P DM * Z? JC(t)single pulse

    D=0.5

    0.02

    0.2

    0.05

    0.1

    0.01

    t1, Square W ave Pulse Duration [sec]

    Z JC

    (t), T

    herm

    al R

    espo

    nse

    [oC

    /W]

    Z JC

    (t), T

    herm

    al R

    espo

    nse

    [oC

    /W]

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com6

    Figure 12. Gate Charge Test Circuit & Waveform

    Figure 13. Resistive Switching Test Circuit & Waveforms

    Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms

    VGS

    VDS

    10%

    90%

    td(on) tr

    t on t off

    td(off) tf

    VDD

    10V

    VDSRL

    DUT

    RGVGS

    VGS

    VDS

    10%

    90%

    td(on) tr

    t on t off

    td(off) tf

    VDD

    10V

    VDSRL

    DUT

    RGVGS

    VGS

    Charge

    VGS

    10VQg

    Qgs Qgd

    3mA

    VGS

    DUT

    VDS

    300nF

    50KΩ

    200nF12V

    Same Typeas DUT

    Charge

    VGS

    10VQg

    Qgs Qgd

    3mA

    VGS

    DUT

    VDS

    300nF

    50KΩ

    200nF12V

    Same Typeas DUT

    EAS = L IAS2----21 --------------------

    BVDSS - VDD

    BVDSS

    VDD

    VDS

    BVDSS

    t p

    VDD

    IAS

    VDS (t)

    ID (t)

    Time

    10V DUT

    RG

    L

    I D

    t p

    EAS = L IAS2----21EAS = L IAS2----21----21 --------------------

    BVDSS - VDD

    BVDSS

    VDD

    VDS

    BVDSS

    t p

    VDD

    IAS

    VDS (t)

    ID (t)

    Time

    10V DUT

    RG

    LL

    I DI D

    t p

    VGSVGS

    IG = const.

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com7

    Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms

    DUT

    VDS

    +

    _

    DriverRG

    Same Type as DUT

    VGS • dv/dt controlled by RG• ISD controlled by pulse period

    VDD

    LI SD

    10VVGS

    ( Driver )

    I SD( DUT )

    VDS( DUT )

    VDD

    Body DiodeForward Voltage Drop

    VSD

    IFM , Body Diode Forward Current

    Body Diode Reverse Current

    IRM

    Body Diode Recovery dv/dt

    di/dt

    D =Gate Pulse WidthGate Pulse Period

    --------------------------

    DUT

    VDS

    +

    _

    DriverRG

    Same Type as DUT

    VGS • dv/dt controlled by RG• ISD controlled by pulse period

    VDD

    LLI SD

    10VVGS

    ( Driver )

    I SD( DUT )

    VDS( DUT )

    VDD

    Body DiodeForward Voltage Drop

    VSD

    IFM , Body Diode Forward Current

    Body Diode Reverse Current

    IRM

    Body Diode Recovery dv/dt

    di/dt

    D =Gate Pulse WidthGate Pulse Period

    --------------------------D =Gate Pulse WidthGate Pulse Period

    --------------------------

  • Mechanical Dimensions

    Dimension in Millimeters

    TO-220 3L

    Figure 16. TO-220, Molded, 3Lead, Jedec Variation ABPackage drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-ically the warranty therein, which covers Fairchild products.

    Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:

    http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT220-003

    FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com8

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com9

    Mechanical Dimensions

    Dimension in Millimeters

    TO-220F 3L

    Figure 17. TO220, Molded, 3LD, Full Pack, EIAJ SC91, Straight LeadPackage drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-ically the warranty therein, which covers Fairchild products.

    Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:

    http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TF220-003

  • FDP55N

    06 / FDPF55N

    06 — N

    -Channel U

    niFETTM M

    OSFET

    ©2005 Fairchild Semiconductor Corporation FDP55N06 / FDPF55N06 Rev. C0

    www.fairchildsemi.com10

    TRADEMARKSThe following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.

    *Trademarks of System General Corporation, used under license by Fairchild Semiconductor.

    DISCLAIMERFAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.

    LIFE SUPPORT POLICYFAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.As used here in:1. Life support devices or systems are devices or systems which, (a) are

    intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.

    2. A critical component in any component of a life support, device, orsystem whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety oreffectiveness.

    PRODUCT STATUS DEFINITIONSDefinition of Terms

    AccuPower™AX-CAP®*BitSiC™Build it Now™CorePLUS™CorePOWER™CROSSVOLT™CTL™Current Transfer Logic™DEUXPEED®Dual Cool™EcoSPARK®EfficentMax™ESBC™

    Fairchild®Fairchild Semiconductor®FACT Quiet Series™FACT®FAST®FastvCore™FETBench™FPS™

    F-PFS™FRFET®Global Power ResourceSMGreenBridge™Green FPS™Green FPS™ e-Series™Gmax™GTO™IntelliMAX™ISOPLANAR™Marking Small Speakers Sound Louder and Better™MegaBuck™MICROCOUPLER™MicroFET™MicroPak™MicroPak2™MillerDrive™MotionMax™mWSaver®OptoHiT™OPTOLOGIC®OPTOPLANAR®

    PowerTrench®PowerXS™Programmable Active Droop™QFET®QS™Quiet Series™RapidConfigure™

    Saving our world, 1mW/W/kW at a time™SignalWise™SmartMax™SMART START™Solutions for Your Success™SPM®STEALTH™SuperFET®SuperSOT™-3SuperSOT™-6SuperSOT™-8SupreMOS®SyncFET™

    Sync-Lock™®*

    TinyBoost®TinyBuck®TinyCalc™TinyLogic®TINYOPTO™TinyPower™TinyPWM™TinyWire™TranSiC™TriFault Detect™TRUECURRENT®*SerDes™

    UHC®Ultra FRFET™UniFET™VCX™VisualMax™VoltagePlus™XS™

    ®

    Datasheet Identification Product Status Definition

    Advance Information Formative / In Design Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.

    Preliminary First ProductionDatasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.

    No Identification Needed Full Production Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.

    Obsolete Not In Production Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.

    ANTI-COUNTERFEITING POLICYFairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support.Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.

    Rev. I66

    tm

    ®

    /ColorImageDict > /JPEG2000ColorACSImageDict > /JPEG2000ColorImageDict > /AntiAliasGrayImages false /CropGrayImages true /GrayImageMinResolution 300 /GrayImageMinResolutionPolicy /OK /DownsampleGrayImages true /GrayImageDownsampleType /Bicubic /GrayImageResolution 300 /GrayImageDepth -1 /GrayImageMinDownsampleDepth 2 /GrayImageDownsampleThreshold 1.50000 /EncodeGrayImages true /GrayImageFilter /DCTEncode /AutoFilterGrayImages true /GrayImageAutoFilterStrategy /JPEG /GrayACSImageDict > /GrayImageDict > /JPEG2000GrayACSImageDict > /JPEG2000GrayImageDict > /AntiAliasMonoImages false /CropMonoImages true /MonoImageMinResolution 1200 /MonoImageMinResolutionPolicy /OK /DownsampleMonoImages true /MonoImageDownsampleType /Bicubic /MonoImageResolution 1200 /MonoImageDepth -1 /MonoImageDownsampleThreshold 1.50000 /EncodeMonoImages true /MonoImageFilter /CCITTFaxEncode /MonoImageDict > /AllowPSXObjects false /CheckCompliance [ /None ] /PDFX1aCheck false /PDFX3Check false /PDFXCompliantPDFOnly false /PDFXNoTrimBoxError true /PDFXTrimBoxToMediaBoxOffset [ 0.00000 0.00000 0.00000 0.00000 ] /PDFXSetBleedBoxToMediaBox true /PDFXBleedBoxToTrimBoxOffset [ 0.00000 0.00000 0.00000 0.00000 ] /PDFXOutputIntentProfile () /PDFXOutputConditionIdentifier () /PDFXOutputCondition () /PDFXRegistryName () /PDFXTrapped /False

    /CreateJDFFile false /Description > /Namespace [ (Adobe) (Common) (1.0) ] /OtherNamespaces [ > /FormElements false /GenerateStructure false /IncludeBookmarks false /IncludeHyperlinks false /IncludeInteractive false /IncludeLayers false /IncludeProfiles false /MultimediaHandling /UseObjectSettings /Namespace [ (Adobe) (CreativeSuite) (2.0) ] /PDFXOutputIntentProfileSelector /DocumentCMYK /PreserveEditing true /UntaggedCMYKHandling /LeaveUntagged /UntaggedRGBHandling /UseDocumentProfile /UseDocumentBleed false >> ]>> setdistillerparams> setpagedevice