Analysis Experience of Bin Zhao

Selah Technologies LLC./Lab 21 Inc., 2008-present Senior Scientist (percentage of analysis in overall work: 40-50%) • Hand-on experience of nanomaterial colloidal systems (C, ZnO, ZnS, polymer, etc.) preparation

and characterization: Particle size measurement: TEM (Hitachi H7600T), DLS (Malvern Nanosizer) Concentration and dispersibility: UV-vis (Evolution 60), TGA (TA500), Zeta potential (Malvern Nanosizer) Particle surface functionality: Zeta potential (Malvern Nanosizer), FT-IR, NMR, OPA Optical properties: UV-vis(Evolution 60), fluorescence (PTI) • Purity and chiral enrichment evaluation of single-walled carbon nanotubes: Purity: NIR (Cary 5000), TGA (TA 500) Enrichment: NIR (Cary 5000), Raman, PL Thin film conductivity: 4-point probe • Develop SOP for nanomaterial characterization including material size control, surface functionality

and particle dispersibility measurement, and optical property measurement. Oak Ridge National Laboratory, Oak Ridge, TN 2005-2007 Research Associate, Center of Nanophase Material Science (percentage of analysis in overall work: 60%)• Proficient in purity evaluation and dispersibility characterization of single-walled carbon

nanotubes. Instrumental technique: NIR (Cary 5000), TEM (Hitachi HF2000), SEM (Hitachi S-3400N),

Raman (Renishaw Raman spectrometer), TGA (TA5000) • Experience in preparation and characterization of metal nanoparticles decorated carbon nanomaterials. Instrumental technique: UV-vis (Cary 5000), STEM (Hitachi HD2000), TEM (Hitachi HF2000), SEM/EDS (Hitachi S-3400N), Raman (Renishaw Raman spectrometer), TGA (TA5000), • Experience in solid nanomaterial surface area, pore size, and gas isotherm absorption

measurement by Quantanchrone Absorp1 instrument. Carbon Solutions Inc., Riverside, CA 2001 - 2005 Product Developing Engineer (percentage of analysis in overall work: 40%) • Experience in purity evaluation and dispersibility characterization of single-walled carbon

nanotubes Instrumental techniques: NIR (Cary 500), SEM/EDS (Philips SEM XL-30), Raman (Bruker RFS

100/s spectrometer), TGA (Pyris Diamond Thermal Analyzer), AFM (Digital Instruments Nanoscope IIIA), Zeta potential (Zetaplus analyzer)

University of California, Riverside, CA 2001 - 2005 Graduate Research Assistant, Department of Chemistry (percentage of analysis in overall work: 50%)• Hand-on experience in nanomaterial dispersion preparation and characterization, including

optical and electronic properties, size measurement (diameter, nanotube bundle size and length, and size distribution study), surface functionality and zeta potential.

• Purity evaluation and dispersibility characterization of single-walled carbon nanotubes.

Instrumental techniques: NIR (Cary 500), SEM/EDS (Philips SEM XL-30), Raman (Bruker RFS 100/s spectrometer), TGA (Pyris Diamond Thermal Analyzer), AFM (Digital Instruments Nanoscope IIIA), Zeta potential (Zetaplus analyzer)

The following pictures (graphs) are examples of material characterization by Bin Zhao.

SEM, AFM, and TEM images of single-walled carbon nanotubes.

STEM of Pt decorated carbon nanohorns.

HRTEM of Pt decorated carbon nanohorns.

AFM images of single walled carbon nanotubes and size distribution study.

Spectral study of functionalized carbon nanotubes.

Zeta potential of carbon nanomaterials.

NIR spectra of semi-conducting chiral enriched HiPCO SWNTs.