es 240 project: finite element modeling of nano- indentation of thin film materials
TRANSCRIPT
1. Introduction to Nanoindentation Process2. Model Description3. Model Validation4. Results and Discussion5. Effect of Substrates6. Conclusion and Future Work
Outline
Displacement Sensor
Force Sensor
Film
Substrate
Indenter
Displacement of Indenter h Ap
plie
d L
oa
d o
n I
nd
en
ter
P
LoadingUnloading
dP/dh
1. Introduction to Nanoindentation Process
100 nm
100 nm
1000 nm
900 nm
Indenter: Diamond
Film: Copper
Substrate: 1. Copper 2. Sapphire 3. Silicon 4. Glass 5. Polymer
2. Model Description-Dimensions and Materials of The Model
3.70
Elastic
Materials
E (GPa)
v (-)
Diamond 1147 0.3
Sapphire 440 0.3
Silicon 172 0.3
Glass 73 0.3
Polymer 30 0.3
Elastic/Plastic
Mateirial
E
(GPa)
V(-) Y
(GPa)
Plastic Constitutive
Copper 130 0.3 1.3 nK
0 0.01 0.02 0.03 0.04 0.050
0.5
1
1.5
2
2.5
3
(-)
(G
Pa
) Elastic Plastic
2. Model Description -Materials Properties
Indenter
Film
Substrate
Element Type: 4-Noded Axisymmetric
Element Size (Edge length):~2 nm (Indentation region)~10 nm (Other region)
Mesh Sensitivity:Refined-mesh model gives similar results.
2. Model Description -Mesh and Element
cA
unloadingcr dh
dP
AE
2/12/11
4
Experimental :
Theoretical:
i
i
s
s
r
Ev
Ev
E22 11
1
rE : Reduced Modulus
sE sv : Film’s E and v
sE sv : Indenter’s E and v
: Indenter and film’s contact area
3. Model Validation-Reduced Modulus (copper substrate)
0 5 10 15 20 25 30
0
2
4
6
8
10
12
14x 104
Displacement of Indenter h (nm)
Ap
plie
d Lo
ad o
n I
nden
ter
P (
nN
)
Simulated P vs. hTheoretical P vs. h
Pa)128.6056(GrESimulated:
Theoretical: Pa)128.2340(GrE
3. Model Validation-Theoretical and Simulated Results (copper substrate)
0 5 10 15 20 25 30 3502468
1012141618
x 104
Displacement of Indenter h (nm)
Fo
rce
on I
nden
ter
P (
nN
)
coppersapphiresiliconglasspolymer
E reducing
Model’s Prediction Experimental Results (W, Nix et al, Acta Materialia, 50, 23, 2002)
5. Effect of Substrates- Load vs. Displacement
0 50 100 150 200 250 300 350 400 450 50060
80
100
120
140
160
180
200
220
Substrate Youngs Modulus Es(GPa)
Re
duce
d Y
oun
gs
Mod
ulus
Er
(GP
a)
coppersappsiliconglasspolymerTheoretical Er
y=-0.00090793*x2
+0.75727*x+46.0508
Model’s Prediction Experimental Results (W, Nix et al, Acta Materialia, 50, 23, 2002)
5. Effect of Substrates- Reduced Modulus
0 100 200 300 400 500 600 700 800 900 1000-12
-10
-8
-6
-4
-2
0
X (nm)
De
flect
ion
of S
ubs
trat
e T
op
Sur
face
(nm
)
coppersappsiliconglasspolymer
5. Effect of Substrates- Deflection of Substrate
1. Nanoindentation process can be simulated using finite element method.
2. The reduced modulus predicted by the finite-element model is very close to analytical results.
3. Stiff substrate tends to overestimate thin film’s modulus, and compliant substrate tends to underestimate thin film’s modulus.
5. Conclusion