electronics, microelectronics, nanoelectronics, … part ii

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Budapest University of Technology and Economics Department of Electron Devices eet.bme. hu Electronics, microelectronics, nanoelectronics, … Part II Mizsei, János www.eet.bme.hu

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Electronics, microelectronics, nanoelectronics, … Part II. Mizsei , János www.eet.bme.hu. Outline. nanoscale effects 3-2-1-0 dimensions atomic scales : different transport mechanisms ( thermal , electrical , mechanical ) technology at nanoscale lithography by nanoballs nanoimprint - PowerPoint PPT Presentation

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Page 1: Electronics, microelectronics, nanoelectronics, … Part II

Budapest University of Technology and Economics

Department of Electron Devices

eet.bme.hu

Electronics, microelectronics, nanoelectronics, …

Part II

Mizsei, János www.eet.bme.hu

Page 2: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu February 6, 2013

Page 3: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu February 6, 2013

Page 4: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu February 6, 2013

Page 5: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu February 6, 2013

Outlinenanoscale effects•3-2-1-0 dimensions•atomic scales: different transport mechanisms (thermal, electrical, mechanical)

technology at nanoscale•lithography by nanoballs•nanoimprint•Langmuir-Blodgett technology•MBE – molecular beam epitaxy•FIB – focused ion beam •AFM, STM processes

nanoscale devices•QWFET•single electron devices•nanotubes •nanorelays •organic molecular integrated circuits •vacuum-electronics•spintronics •kvantum-computing•oxide electronics •thermal computing

Page 6: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Nanoscale effects

February 6, 2013

• density of states for 3

2 1 0 dimension objects

• tunnelling

• surface/interface scattering

• ballistic transport

Page 7: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Technologies at nanoscale

February 6, 2013

•lithography by nanoballs•nanoimprint•Langmuir-Blodgett technology•MBE – molecular beam epitaxy•FIB – focused ion beam •AFM, STM processes

Page 8: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Lithography by nanoballs

Page 9: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Nanoimprint

February 6, 2013

Page 10: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Nanoimprint

Page 11: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Langmuir-Blodgett technology

February 6, 2013

for molecular monolayer

Page 12: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

MBE – molecular beam epitaxy

February 6, 2013

Computer controlled evaporation (PVD)

Page 13: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

MBE – molecular beam epitaxy

Page 14: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

FIB – focused ion beam

Page 15: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

FIB – focused ion beamApplications of FIB:

•cross-sectional imaging through semiconductor devices (or any layered structure)•modification of the electrical routing on semiconductor devices•failure analysis•preparation for physico-chemical analysis•preparation of specimens for transmission electron microscopy (TEM) or other analysis•micro-machining•mask repair

Page 16: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

FIB – focused ion beam

FIB drilled nanohole for thermal nanoswitch with Pt overlayer

Page 17: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

AFM processes

February 6, 2013

Hotplate for AFM excited agglomeration and peel off

Nanostructures by AFM tip excitation of hot (120 oC) silver nanolayers

Page 18: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

AFM processes

February 6, 2013

Quantum corall by AFM tip (Fe on Cu surface)

Page 19: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

AFM processes: anodic oxidation by AFM tip

February 6, 2013

Page 20: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Microscopic charges on SiO2

surfaces

100 nm native oxideoxide

Si: P type, <100>, 10 ohmcm

Page 21: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Charging process:(AFM, “conducting wire”)

Measuring process:Measuring process:(Kelvin electric force microscopy)(Kelvin electric force microscopy)

Low resolution, compared to the charging process !

Page 22: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

11:30:29 AM Fri Aug 19 2005

04:11:07 PM Thu Aug 18 2005 04:11:07 PM Thu Aug 18 2005 3 V

2

1

-1

-2

-3

3 V

2

1

-1

-2

-3

Page 23: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

04:11:07 PM Thu Aug 18 2005 04:11:07 PM Thu Aug 18 2005

11:30:29 AM Fri Aug 19 2005

3 V

2

1

-1

-2

-3

3 V

2

1

-1

-2

-3

Only after 300 C heat treatment !

Page 24: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Microscopic charge on the SiO2

surface

Extremely high and inhomogeneous electric field:

700000V/m

Page 25: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Nanoscale devices

February 6, 2013

• QWFET• single electron devices• nanotubes • nanorelays • organic molecular

integrated circuits • vacuum-electronics• spintronics • oxide electronics • thermal computing

Page 26: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

QWFET – quantum well fet• low bandgap enables

lower supply voltage• higher bangap substrate

helps to keep electrons in the channel

• higher mobility results in higher current

Schottky-barrier type (depletion) device

Page 27: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

QWFET

Problematic point: compound semiconductor in Si based technology

Page 28: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Advantages of QWFET

higher speed at lower power dissipation

Page 29: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Single electron transistor - SET

Page 30: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Fabrication of SET by STM tip anodisation

Page 31: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Single electron devices: charge-memorySET read-out

February 6, 2013

•50 nm head-surface distance

•~10 nm grain size

•~10 Terabit/inch2

Page 32: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Carbon

diamond

graphite

February 6, 2013

Page 33: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Graphene, carbon nanotubes

Page 34: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Carbon nanotubes as quantum wires

density of states depending of chirality

Page 35: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Carbon nanotube devices: CNT

Page 36: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Micro-, and nanorelays

Nanorelaysnanorelays: instable mechanical movement, stick down

Page 37: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Atom relay transistor (ART)

Molecular single electron switching transistor (MOSES)

Page 38: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Organic molecular integrated circuits

Page 39: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Organic molecular integrated circuits

~100 nm2

Page 40: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Organic molecular integrated circuits

Problems with the organic molecular ICs: • technology (it has not been realised until now) • metal contacts and wires (atomic contact)• chemical instability• slow operation depending on number of

electrons/bit ratio

Page 41: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Vacuum-electronics: nanosised „Vacuum tube”

Vertical field emission: Lateral field emission:

MOSFET- likegated devices

Page 42: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Field emissionby gate control

Page 43: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Technology

resist plasma treatment and reflow

Page 44: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Characteristics of the nanosised „Vacuum tube”

Page 45: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Spintronics, Stern-Gerlach experiment

February 6, 2013

Page 46: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Spin: Einstein–de Haas effect

Switch on and off with the resonance frequency of the suspended mass

Page 47: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

GMR - giant magnetoresistance

February 6, 2013

Low resistance high resistance

Page 48: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Spin- valve MRAM

Page 49: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Spin- transistor on

February 6, 2013

Page 50: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Spin- transistor off

February 6, 2013

Page 51: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Quantum dot (QD) logika

Inverter

Page 52: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Oxide electronics

February 6, 2013

Page 53: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Page 54: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu 54

S. D. Ha and S. Ramanathan J. Appl. Phys. 110, 071101 (2011)

Page 55: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Page 56: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

(A) In high resistance state, there is a lack ofoxygen vacancies at the interface. Carriers must overcome Schottky barrierto contribute to current. (B) In low resistance state, oxygen vacancies accumulateat the interface, reducing depletion width such that tunneling is possible

Oxygen vacancy drift bipolar switching mechanismfor representative n-type oxide

Page 57: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Switchable Pt/TiOx/Pt rectifier

February 6, 2013

Opposite polarityvoltage pulses control location of oxygen vacancies, which determineswhich contact is rectifying and which is Ohmic

Page 58: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Experimental demonstration of spike-timing dependentplasticity (STDP) in Pt/Cu2O/W device

Appl. Phys. A, S.-J. Choi, G.-B. Kim, K. Lee, K.-H. Kim, W.-Y.Yang, S. Cho, H.-J. Bae, D.-S. Seo, S.-I. Kim, and K.-J. Lee, Synapticbehaviors of a single metal–oxide–metal resistive device, 102, 1019, 2011

(A) I-V curves of MIM deviceshowing bipolar resistive switching.

(B) For t>0 (pre-synaptic pulsefires before post-synaptic pulse), the synaptic weight increases, while for t<0, the synaptic weight decreases, in accordance with STDP.

Page 59: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Page 60: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

„Nothing beats scaled silicon but nanotechnology can complement”

Page 61: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Ethical issues concerning the nanotechnology

- „nano” is a good idea and a good word to get money from the government or from the EU

- many nanoobject have not fully been tested, some of them could be dangerous for health (?)

- self replicating nanomachines may live their own life -> catastrophe ?

- …

Page 62: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Problems with CMOS

device limits (6 or even more interfaces)

scale down: depletion layers, gate-tunnel current -> direct tunnel distance: 2 nm)

Page 63: Electronics, microelectronics, nanoelectronics, … Part II

© BME Department of Electron Devices, 2012.eet.bme.hu

Problems with the nano self-replicated machines

Page 64: Electronics, microelectronics, nanoelectronics, … Part II

Budapest University of Technology and Economics

Department of Electron Devices

eet.bme.hu

End of part II

www.eet.bme.hu