electrical and optical properties of tco–cu2o heterojunction devices
TRANSCRIPT
![Page 1: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/1.jpg)
www.elsevier.com/locate/tsf
Thin Solid Films 469–4
Electrical and optical properties of TCO–Cu2O heterojunction devices
Hideki Tanakaa,b, Takahiro Shimakawaa, Toshihiro Miyataa, Hirotoshi Satob,
Tadatsugu Minamia,*
aOptoelectronic Device System R&D Center, Kanazawa Institute of Technology, 7-1 Ohgigaoka, Nonoichi, Ishikawa 921-8501, JapanbResearch and Development Center, Gunze Limited, 163 Morikawara, Moriyama, Shiga 524-8501, Japan
Available online 11 September 2004
Abstract
This report describes the electrical and photovoltaic properties in heterojunction devices consisting of a cuprous oxide (Cu2O) sheet
and a transparent conducting oxide (TCO) thin film, such as In2O3, ZnO, In2O3:Sn (ITO), ZnO:Al (AZO) or AZO–ITO (AZITO)
multicomponent oxide, prepared by pulsed laser deposition (PLD). Undoped In2O3–Cu2O heterojunctions prepared by PLD exhibited
ohmic current–voltage (I–V) characteristics. The ZnO–Cu2O and AZO–Cu2O devices exhibited better rectifying I–V characteristics and
photovoltaic properties than the ITO–Cu2O devices. It was found that the obtainable I–V characteristics and photovoltaic properties were
considerably affected by the TCO film deposition conditions. An open-circuit voltage (VOC) of 0.4 V, a short-circuit current density ( JSC)
of 7.1 mA/cm2, a fill factor (F.F.) of 0.4 and an energy conversion efficiency (g) of 1.2% were obtained in an AZO–Cu2O device under
AM2 solar illumination. The VOC, JSC, F.F. and g obtained in AZITO–Cu2O heterojunctions increased as the Zn/(Zn+In) atomic ratio was
increased.
D 2004 Elsevier B.V. All rights reserved.
Keywords: Cu2O; Cuprous oxide; Pulsed laser deposition; Solar cell; Heterojunction; Transparent conducting oxide; Thin films; Oxide semiconductor; AZO;
ZnO; Multicomponent oxide
1. Introduction
Cuprous oxide (Cu2O) is an attractive material for
photovoltaic devices because it is a direct-gap semi-
conductor with a bandgap energy of 2.0 eV [1,2]. There
are many reports on solar cells based on a thick Cu2O
sheet [1–6] with a thin film [7,8] prepared by various
techniques. For example, various metal-Cu2O solar cells
consisting of a Cu2O sheet and a metal element such as
Cu, Yb, Mg, Mn, Al and Tl have been reported [1–4,6,9].
In addition, transparent conducting oxide (TCO)–Cu2O
heterojunction solar cells consisting of a combination of a
Cu2O thin film or sheet with a TCO thin film, such as
ZnO, In2O3, SnO2 or CdO, have been prepared by various
deposition methods such as magnetron sputtering
0040-6090/$ - see front matter D 2004 Elsevier B.V. All rights reserved.
doi:10.1016/j.tsf.2004.06.180
* Corresponding author. Tel./fax: +81 76 294 0695.
E-mail address: [email protected] (T. Minami).
[1,5,10,11]. Although the theoretical energy conversion
efficiency of a Cu2O solar cell is on the order of 20%
under AM1 solar illumination, with the exception of Cu–
Cu2O solar cells (maximum efficiency (g) of 1.76%), an gover 1% has yet to be attained in any reported Cu2O solar
cells [1]. The g obtained in solar cells fabricated using
Cu2O sheets prepared by oxidizing copper at a high
temperature was always found to be higher than that
obtained when using Cu2O thin films [1,8]. The above
reports suggest that the photovoltaic properties of Cu2O
solar cells are significantly affected by the surface treat-
ment and the crystallinity of Cu2O [1,3,5]. In particular,
the deposition method and conditions are important when
depositing a thin film on Cu2O sheets.
In this paper, we describe the electrical and optical
properties of photovoltaic heterojunction devices fabricated
by depositing various TCO thin films on a Cu2O sheet using
a pulsed laser deposition (PLD) method. An energy
conversion efficiency above 1% was obtained in an Al-
70 (2004) 80–85
![Page 2: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/2.jpg)
Fig. 1. I–V characteristics of IO– and ITO–Cu2O heterojunctions.
H. Tanaka et al. / Thin Solid Films 469–470 (2004) 80–85 81
doped ZnO (AZO)–Cu2O heterojunction solar cell under
AM2 solar illumination.
Fig. 2. J–V and P–V characteristics of an ITO–Cu2O solar cell under AM2
illumination.
2. Experimental
Solar cells were fabricated by forming TCO–Cu2O
heterojunctions on the surface of Cu2O sheets with an Au
ohmic back side electrode; the Cu2O sheets function as the
active layer as well as the substrate in the devices. N-type
semiconducting TCO films such as In2O3, ZnO, In2O3:Sn
(ITO), ZnO:Al (AZO) or ZnO–In2O3 (ZIO) multicompo-
nent oxides [12] were deposited by PLD using an ArF
excimer laser. The ArF excimer laser (193 nm) beam
(repetition rate, 20 Hz; pulse width, 20 ns; and fluence,
350 mJ/cm2) was focused onto a rotating target using a
lens. The deposition was carried out under the following
conditions: atmosphere, vacuum (below 1.0�10�4 Pa) or
O2 gas (0.1–12 Pa); deposition temperature, room temper-
ature to 300 8C; target–substrate (T–S) distance, 40 mm;
and target, sintered oxide pellet. The oxide pellet targets
were prepared by cold pressing a mixture of oxide
powders followed by sintering in air at 1300 to 1400
8C. The ITO and AZO pellets were prepared by sintering
a mixture of In2O3 and SnO2 (5 wt.%) powders and a
mixture of ZnO and Al2O3 (2 wt.%), respectively. In order
to evaluate the electrical and optical properties of the TCO
films, they were also simultaneously deposited on OA-2
glass (Nippon Electric Glass) substrates. The Cu2O sheets
were prepared by oxidizing approximately 0.2-mm-thick
copper (Cu) sheets with a heat treatment carried out in air
at a temperature of 1000 8C for 2–3 h [1,13]. The
prepared Cu2O sheets were a polycrystalline p-type
semiconductor with a hole concentration of approximately
4�1014 cm�3 and a Hall mobility of approximately 90
cm2/V s. The photovoltaic properties of the solar cells
were measured under AM2 solar illumination with a
power of 100 mW/cm2.
3. Results and discussion
3.1. In2O3–Cu2O heterojunctions
Fig. 1 shows current–voltage (I–V) characteristics of
heterojunctions prepared by depositing various In2O3 thin
films (area of 3.14�10�2 cm2) on Cu2O sheets and
measured without illumination. The I–V characteristics of
undoped In2O3(IO)–Cu2O heterojunctions using IO films
deposited at an O2 pressure of 5 and 12 Pa and a deposition
temperature of 150 8C are shown in (a) and (b), respectively:
their resistivities (carrier concentrations) were 2.3�10�3
(1.1�1020) and 2.1 V cm (2.7�1018 cm�3), respectively.
Fig. 1c shows the I–V characteristic of an Sn-doped In2O3
(ITO)–Cu2O heterojunction using an ITO film deposited at
an O2 pressure of 0.1 Pa and a temperature of 150 8C using
an ITO pellet. The resistivity and carrier concentration of the
ITO film were 2.9�10�4 V cm and 5.9�1020 cm�3,
respectively. It should be noted that the IO–Cu2O junctions
exhibited only an ohmic I–V characteristic as well as no
photovoltage; not even the ITO–Cu2O heterojunction
exhibited a good rectifying I–V characteristic. Fig. 2 shows
typical output power–voltage (P–V) and current density
( J)–V characteristics of an ITO–Cu2O heterojunction cell
under AM2 solar illumination. This device exhibited poor
photovoltaic properties: open-circuit voltage (VOC) of 0.034
V, short-circuit current density ( JSC) of 3.7 mA/cm2, fill
factor (F.F.) of 0.26 and g of 0.03% under AM2 solar
illumination. Only poor rectifying I–V characteristics and
photovoltaic properties were obtained in all ITO–Cu2O
heterojunctions deposited by the PLD method used in this
work.
On the contrary, many photovoltaic cells have been
previously demonstrated using heterojunctions prepared by
depositing an ITO thin film on Cu2O substrates [1,5] or by
depositing a Cu2O film on ITO coated glass substrates [7,8].
The photovoltaic properties and I–V characteristics of these
previously reported heterojunctions were considerably
![Page 3: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/3.jpg)
Fig. 3. O2 pressure dependence of I–V characteristics for ZO–Cu2O
heterojunctions.
H. Tanaka et al. / Thin Solid Films 469–470 (2004) 80–8582
dependent on the deposition conditions as well as the
deposition methods of the ITO films. In addition, it also has
been reported that the degradation in photovoltaic properties
of CuInSe2-based solar cells is caused by plasma irradiation
and/or particle bombardment when TCO films are deposited
by magnetron sputtering, the most popular TCO film
deposition method [14,15]. In contrast, a PLD method that
is free of particle bombardment could result in less damage
during deposition than d.c. and/or r.f. magnetron sputtering.
It is also well known that the electrical and optical properties
of TCO thin films are affected by not only the deposition
conditions but also the deposition methods of the TCO films
[16]. In addition to damage-free depositions, various TCO
films recently prepared by the PLD method, such as ITO
and AZO, featured a low resistivity on the order of 10�5 V
cm [17,18]. However, IO– or ITO–Cu2O heterojunctions
prepared by depositing In2O3 films on Cu2O sheets by PLD
have yet to be reported, so far as we know.
As mentioned above, however, it has been previously
reported that ITO–Cu2O heterojunctions prepared using ITO
films deposited by other methods such as sputtering exhibit
good rectifying I–V characteristics [1,5,7,8]. Therefore, the
fact that heterojunctions consisting of undoped In2O3 or ITO
films deposited on p-type semiconducting Cu2O by PLD do
Fig. 4. J–V and P–V characteristics of the ZO–Cu2O
not exhibit a good rectifying I–V characteristic may be
explained by the low level of damage occurring during the
PLD film depositions. The ohmic I–V characteristics
obtained in IO–Cu2O heterojunctions, as shown in Fig. 1,
may be attributed to the fact that the work function of
undoped In2O3 (approximately 4.8 to 5 eV) is usually larger
than that of ITO [19]. It has been reported that the work
function of TCO films with a carrier concentration was
increased [19,20]. The smaller work function of ITO relative
to that of IO may be attributed to a larger Fermi energy
resulting from the carrier concentration of ITO films being
higher than that of the IO films used, as described above.
3.2. ZnO–Cu2O heterojunctions
All ZnO–Cu2O heterojunctions prepared by depositing
undoped ZnO(ZO) and AZO films on Cu2O sheets exhibited
rectifying I–V characteristics, irrespective of the deposition
conditions. For example, Fig. 3 shows the I–V character-
istics of ZO–Cu2O heterojunctions prepared using ZO thin
films (area of 3.14�10�2 cm2) deposited at different O2
pressures and measured without illumination. The ZO–
Cu2O devices shown in (a), (b) and (c) were prepared with
ZO films deposited at a temperature of 150 8C and an O2
pressure of 1, 5 and 12 Pa, respectively; the resistivities
(carrier concentrations) were 1.3�10�2 (1.3�1019),
2.6�10�1 (3.8�1018) and 6.2 V cm (1.0�1018 cm�3),
respectively. The increase of resistivity was attributed to
decreases of both carrier concentration and Hall mobility. As
can be seen in Fig. 3, the obtained rectifying I–V character-
istics improved as the O2 pressure was increased. Fig. 4
shows the photovoltaic properties of the ZO–Cu2O devices
shown in Fig. 3. It should be noted that the photovoltaic
properties measured under AM2 solar illumination also
improved as the O2 pressure was increased. In addition, a
high efficiency of 0.9% was obtained in a ZO–Cu2O
heterojunction cell prepared with a high resistivity ZnO
film.
Herion et al. [10] have reported an efficiency of 0.21% in
a ZnO–Cu2O heterojunction solar cell prepared using an
undoped ZnO thin film deposited by sputtering. The
photovoltaic property of the device was attributed to ZnO
reducing Cu2O to copper at the boundary [1,10]. Never-
solar cells shown in Fig. 3: AM2 illumination.
![Page 4: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/4.jpg)
Fig. 6. Electrical properties of Cu2O sheets as a function of heat treatment
temperature.
H. Tanaka et al. / Thin Solid Films 469–470 (2004) 80–85 83
theless, the O2 pressure dependence of the ZO–Cu2O
devices described above is unlikely to have been a result
of the ZO film deposition reducing the Cu2O to copper at
the boundary.
The photovoltaic properties of AZO–Cu2O heterojunc-
tion cells had not been previously reported, to the best of our
knowledge. Fig. 5 shows typical I–V characteristics of
AZO–Cu2O heterojunctions prepared with AZO thin films
(area of 3.14�10�2 cm2) deposited on Cu2O sheets at a
temperature of RT, 150 and 300 8C and measured without
illumination. The AZO films were deposited in vacuum
using an AZO pellet. Resistivities (carrier concentrations) of
the AZO films deposited at RT, 150, 200 and 300 8C were
1.0�10�3 (6.6�1020), 3.2�10�4 (8.1�1020), 1.9�10�4
(6.9�1020) and 4.2�10�4 V cm (6.5�1020 cm�3), respec-
tively. The deposition temperature dependence of resistivity
of the AZO films is mainly related to that of Hall mobility;
the improvement of mobility is attributed to the fact that
crystallinity improved as the temperature was increased. As
can be seen in Fig. 5, the rectifying I–V characteristics of the
AZO–Cu2O devices were also affected by the deposition
temperature. The series resistance of devices increased
markedly as the deposition temperature was increased. This
was caused by the resistivity increase within the Cu2O
sheets since the resistivity of AZO films showed a tendency
to decrease as the deposition temperature was increased, as
described above. In addition, the resistivity of Cu2O sheets
was found to have increased after they were heated in
vacuum to a temperature in the range from about 150 to 300
8C, as shown in Fig. 6. The resistivity (q), Hall mobility (l)and carrier concentration (n) indicated in Fig. 6 were
measured at RT after the Cu2O sheets were heated to each
treatment temperature for 75 min. The initial resistivity of
all Cu2O sheets used was on the order of 2�10�2 V cm. The
increase in resistivity is mainly attributed to a decrease of
carrier concentration. As a result, the photovoltaic properties
of AZO–Cu2O devices were considerably affected by the
Fig. 5. Deposition temperature dependence of I–V characteristics for AZO–
Cu2O heterojunctions.
deposition temperature of AZO films, as shown in Fig. 7.
The degradation of photovoltaic properties of AZO–Cu2O
devices fabricated with an AZO film deposited at 300 8C is
Fig. 7. VOC, JSC, F.F. and g as functions of deposition temperature for
AZO–Cu2O solar cells under AM2 illumination.
![Page 5: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/5.jpg)
H. Tanaka et al. / Thin Solid Films 469–470 (2004) 80–8584
ascribed to the marked increase of resistivity of the Cu2O
sheet.
It should be noted that the maximum VOC of 0.4 V, JSC of
7.1 mA/cm2, F.F. of 0.44 and g of 1.2% were obtained in
AZO–Cu2O devices prepared using AZO films deposited at
a deposition temperature of 150 to 200 8C and measured
under AM2 solar illumination. In comparison with In2O3–
Cu2O heterojunctions, the better rectifying I–V character-
istics and photovoltaic properties obtained in ZO– and
AZO–Cu2O heterojunctions may be attributed to the differ-
ence of work function between ZnO and In2O3; the work
function of ZnO is slightly smaller than that of In2O3
[19,20], as described above.
3.3. ZIO–Cu2O heterojunctions
As can be seen in Fig. 7, when heterojunctions are
prepared by depositing thin films on the surface of Cu2O, it
is necessary to conduct the depositions at temperatures
below 300 8C. Recently, TCO thin films using multi-
component oxides composed of ZnO and In2O3 have been
newly developed [20]. In particular, in ZnO–In2O3 (ZIO)
films with a Zn content (Zn/(Zn+In) atomic ratio) in the
range from 10 to 20 at.%, a low resistivity can be obtained
Fig. 8. VOC, JSC, F.F. and g as functions of Zn content for AZITO–Cu2O
solar cells under AM2 illumination.
even in a low temperature deposition [21,22]. Thus, we
prepared ZIO–Cu2O and AZITO–Cu2O heterojunctions by
depositing ZnO–In2O3 and AZO–ITO (AZITO) multicom-
ponent oxide thin films, respectively, on Cu2O sheets. As an
example, photovoltaic properties as functions of the Zn
content in deposited films are shown in Fig. 8 for AZITO–
Cu2O heterojunctions measured under AM2 solar illumina-
tion. The AZITO thin films were deposited with an O2
pressure of 0.1 Pa at a deposition temperature of 150 8Cusing AZITO pellets. The AZITO pellets were prepared by
sintering a powder mixture of SnO2 (5 wt.%) added to In2O3
and Al2O3 (1 wt.%) added to ZnO. The resistivity of AZITO
films showed a tendency to increase as the Zn content was
increased up to about 80 at.% before decreasing with a
further increase of the Zn content. In contrast, the VOC, JSC,
F.F. and g obtained in AZITO–Cu2O heterojunctions
increased as the Zn content was increased. The Zn content
dependence of the electrical properties of AZITO films was
not correlated to that of the photovoltaic properties obtained
in AZITO–Cu2O devices. Nevertheless, it should be noted
that the increase in VOC as the Zn content was increased
from 0 to 100 at.% suggests that the Zn content dependence
of the photovoltaic properties in AZITO–Cu2O devices is
mainly attributable to that of the work function of AZITO
films.
4. Conclusions
Various transparent conducting oxide (TCO)–cuprous
oxide (Cu2O) heterojunctions were prepared by depositing
TCO thin films on Cu2O sheets. The electrical and
photovoltaic properties were measured on these hetero-
junction devices prepared by a pulsed laser deposition
(PLD) method with TCO films such as In2O3, ZnO,
In2O3:Sn (ITO), ZnO:Al (AZO) and AZO–ITO (AZITO)
multicomponent oxides. Neither a good rectifying current–
voltage (I–V) characteristic nor a high photovoltage were
obtained in the In2O3–Cu2O and ITO–Cu2O devices. The
ZnO–Cu2O and AZO–Cu2O devices exhibited better I–V
characteristics and photovoltaic properties than the ITO–
Cu2O devices. This improvement may be attributed to the
difference of the work function between ZnO and In2O3. It
was found that the obtainable I–V characteristics and
photovoltaic properties were considerably affected by the
TCO film deposition conditions. An open-circuit voltage
of 0.4 V, a short-circuit current density of 7.1 mA/cm2, a
fill factor of 0.4 and an energy conversion efficiency of
1.2% were obtained in an AZO–Cu2O device prepared
with an AZO film deposited at 150 8C and measured under
AM2 solar illumination. The I–V characteristics and
photovoltaic properties in AZITO–Cu2O heterojunctions
changed as the Zn content was varied. The Zn content
dependence of the photovoltaic properties in AZITO–Cu2O
devices is mainly attributed to that of the work function of
AZITO films.
![Page 6: Electrical and optical properties of TCO–Cu2O heterojunction devices](https://reader031.vdocuments.us/reader031/viewer/2022020513/575020851a28ab877e9b2bf0/html5/thumbnails/6.jpg)
H. Tanaka et al. / Thin Solid Films 469–470 (2004) 80–85 85
Acknowledgments
The authors wish to acknowledge Mr. K. Suzuki, E. Iida
and G. Sato for their technical assistance in the experiments.
References
[1] A.E. Rakhshani, Solid-State Electronics 29 (1986) 7–17.
[2] B.P. Rai, Solar Cells 25 (1988) 265–272.
[3] L.C. Olsen, R.C. Bohara, M.W. Urie, Applied Physics Letters 34
(1979) 47–49.
[4] L.C. Olsen, F.W. Addis, W. Miller, Solar Cells 7 (1982–1983)
247–279.
[5] W.M. Sears, E. Fortin, J.B. Webb, Thin Solid Films 103 (1983)
303–309.
[6] T. Suehiro, T. Sasaki, Y. Hiratate, Thin Solid Films 383 (2001)
318–320.
[7] M. Fujinaka, A.A. Berezin, Journal of Applied Physics 54 (1983)
3582–3588.
[8] V. Georgieva, M. Ristov, Solar Energy Materials and Solar Cells 73
(2002) 67–73.
[9] R.N. Briskman, Solar Energy Materials and Solar Cells 27 (1992)
361–368.
[10] J. Herion, E.A. Niekisch, G. Scharl, Solar Energy Materials 4 (1980)
101–112.
[11] L. Papadimitriou, N.A. Economou, D. Trivich, Solar Cells 3 (1981)
73–80.
[12] T. Minami, MRS Bulletin 25 (2000) 38–42.
[13] J. Li, G. Vizkelethy, P. Revesz, J.W. Mayer, Journal of Applied
Physics 69 (1991) 1020–1029.
[14] Y. Hagiwara, T. Nakada, A. Kunioka, Solar Energy Materials and
Solar Cells 67 (2002) 267–271.
[15] T. Nakada, M. Mizutani, Japanese Journal of Applied Physics 41
(2002) L165–167.
[16] H.L. Hartnagel, A.L. Dawar, A.K. Jain, C. Jagadish, Semiconducting
Transparent Thin Films, Institute of Physics Publishing, IOP, Bristol,
1995.
[17] A. Suzuki, T. Matsushita, T. Aoki, A. Mori, M. Okuda, Thin Solid
Films 411 (2002) 23–27.
[18] H. Agura, A. Suzuki, T. Matsushita, T. Aoki, M. Okuda, Thin Solid
Films 445 (2003) 263–267.
[19] T. Minami, T. Miyata, T. Yamamoto, Surface and Coatings
Technology 108–109 (1998) 583–587.
[20] T. Minami, Journal of Vacuum Science and Technology, A 17 (4)
(1999) 1765–1772.
[21] T. Minami, H. Sonohara, T. Kakumu, S. Takata, Japanese Journal of
Applied Physics 34 (1995) L971–L973.
[22] T. Minami, T. Kakumu, Y. Takeda, S. Takata, Thin Solid Films 290/
291 (1996) 1–5.