ee130/230a discussion 7 peng zheng. minority-carrier charge storage under forward bias (v a > 0),...
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EE130/230A Discussion 7
Peng Zheng
Minority-Carrier Charge Storage• Under forward bias (VA > 0), excess minority carriers are
stored in the quasi-neutral regions of a pn junction:
Pnn
x nP
LxpqA
dxxpqAQn
)(
)(
Npp
x pN
LxnqA
dxxnqAQp
)(
)(
EE130/230A Fall 2013 Lecture 13, Slide 2
Charge Control Model Summary• Under forward bias, minority-carrier charge is stored in the
quasi-neutral regions of a pn diode.
– Long base:
– Narrow base:
PkTqV
D
iP Le
N
nqAQ A 1/
2
NkTqV
A
iN Le
N
nqAQ A 1/
2
PkTqV
A
iN We
N
nqAQ A 1
2
1 /2
NkTqV
D
iP We
N
nqAQ A 1
2
1 /2
Lecture 13, Slide 3EE130/230A Fall 2013
• The steady-state diode current can be viewed as the charge supply required to compensate for charge loss via recombination (for long base) or collection at the contacts (for narrow base).
– Long base (both sides):
– Narrow base (both sides):
where and
p
P
n
N QQI
ττ
ptr
P
ntr
N QQI
,, ττ
P
P
p
P
N
N
n
N
L
DL
L
DL
τ and
τNote that
N
Pntr D
W
2τ
2
,
P
Nptr D
W
2τ
2
,
Lecture 13, Slide 4EE130/230A Fall 2013
Sample Problem-Charge Control Model
Sample Problem-Charge Control ModelSince the minority carrier concentrations (np and pn) are enhanced within the quasi-neutral regions, the diode is forward biased. The majority carrier concentrations (pp and nn) are not significantly enhanced, however, so low-level injection conditions prevail. a) Since low-level injection conditions prevail, the “Law of the Junction” holds: within the depletion region and at
the edges of the depletion region, np=ni2 exp{qVA/kT}.
np and pn each are enhanced by a factor 1010 at the edges of the depletion region, so 1010 = exp{qVA/kT} VA = (kT/q) ln(1010) = 10 × (kT/q) ln(10) = 10 × (60 mV) = 0.6 V.
b) pp = NA = 1016 cm-3 and nn = ND = 1018 cm-3 c) np(-xp) = np(-xp) – np0(-xp) = 1014 – 104 1014 cm-3. pn(xn) = pn(xn) – pn0(xn) = 1012 – 102 1012 cm-3
The majority carrier concentrations (pp and nn) are not significantly enhanced within the quasi-neutral regions, so low-level injection conditions prevail.
d) From Lecture 4, Slide 17 the electron mobility for NA =1016 cm-3 is n =1200 cm2/Vs and the hole mobility for ND =1018 cm-3 is p =150 cm2/Vs. The electron diffusion constant Dn= n (kT/q)=1200×0.026=31.2 cm2/s. The hole diffusion constant, Dp= p (kT/q)=150×0.026=3.9 cm2/s.
The electron minority carrier diffusion length
Small-Signal Model Summary
qkT
IG DC
/
qkT
IC
/
τ DCD
W
AC s
J
)1( /0
A kTqVDC eII
DJ CCC
Depletion capacitance
Diffusion capacitance
Conductance
Lecture 13, Slide 7EE130/230A Fall 2013R. F. Pierret, Semiconductor Device Fundamentals, p. 302
Sample Problem-Small Signal ModelFrom the previous problem, IDC= 8.9×10-8 A. The small-signal resistance R = 1/G =(kT/q)/ IDC=0.026/8.9×10-8
=2.9×105 . Since the n-type side is degenerately doped (ND = 1018 cm-3), we should find the reduction in band gap energy on the n side:
8 1 3 3003.5 10GE N
T =35meV
The built-in potential is then
ln( )2
G G Abi
i
E E kT NV
q q n
= (1.12-0.035)/2 + 0.026×ln(1016/1010)=0.902V
The depletion width 12
19 16
2 ( ) 2 10 (0.902 0.6)0.194
1.6 10 10s bi A
A
V VW m
qN
Depletion capacitance 12 8
145
10 100 105.15 10
1.94 10s
j
AC F
W
Diffusion capacitance
In your HW, it is not degenerately doped.
Transient Response of pn Diode
Lecture 13, Slide 9
• Suppose a pn-diode is forward biased, then suddenly turned off at time t = 0. Because of CD, the voltage across the pn junction depletion region cannot be changed instantaneously.
The time delay in switching between
the FORWARD-bias and REVERSE-bias states is due to the time required to change the amount of excess minority carriers stored in the quasi-neutral regions.
EE130/230A Fall 2013R. F. Pierret, Semiconductor Device Fundamentals, Fig. 8.2
Decay of Stored ChargeConsider a p+n diode (Qp >> Qn):
t
i(t)
t
vA(t)
ts
ts0 pxx
n
qAD
i
dx
dp
n
For t > 0:
pn(x)
Lecture 13, Slide 10EE130/230A Fall 2013
R. F. Pierret, Semiconductor Device Fundamentals, Fig. 8.3
Qualitative Examples
t
i(t)
ts
Increase IF
t
i(t)
ts
Increase IR
t
i(t)
ts
Decrease tp
EE130/230A Fall 2013 Lecture 13, Slide 21
Illustrate how the turn-off transient response would change: