TestStation Software and Hardware Release Information
Software Versions 5.6.1, 5.7.0, and 5.8.0
Active Life End Of LifeLimited SupportFull Support
Last Production
No Software Enhancements
Reasonable Effort
SSASoftware Support Agreement
Product Support Life Cycle
Product Support Life Cycle Map
TestStation TSM
Stinger
TestStation 12X
Accelerate
TestStation 8x
228Xi Series
228Xe w/ ICA
228Xe Series
228X(VMS and Unix based systems)
TestStation(Standard,
LH, LX and TSR)
TestStation/228X Support Status Effective Q1, 2005
Notes:
Release 5.8.0 was the last software version that supports Combo based TestStation 8x and 2228x i-Series systems.
Release 5.7.0 was the last software release that supports non-ICA based 228X testers
Continuous Product Enhancements...
• Valuable Features have been added to the TestStation software in the last three Releases
• Choice of GR228X Monitor Pages or new Navigate Development environment
• Some older GR228X tester models are no longer supported
– Refer to TestStation Product Support Status Document on the web
– PC- Upgrade and Trade-In Programs Available
TestStation Software Release Information
Software Version 5.6.1
TestStation Version 4.6.1 / 5.6.1
• Features-At-A Glance – Optional Navigate Development Environment
– Integrated D2B/Alchemist CAD Preparation Software
– Test Quality Tools
– ICA Auto-Calibration
– New modeling tools and model updates
– Over 125 miscellaneous software improvements
Released in March of 2002:
Optional Navigate Development Environment
• Intuitive User Interfaces
• Fixture, Product, and Message Databases
• Node-Based Test Program Development
• Test Project Management Features
• Automatic Conversion Software
Integrated D2B CAD Preparation
• CAD Translators
• Board and Schematic Viewers
• SmartBOM Importer
• Automatic Component and Package Identification
• Powerful Data Editor
• Fast and Accurate Probe Placement Solution
• Test Equipment File Exporters
Test Quality Toolset• Test Quality Tools
– Autodebug - Automatically Adjust Test Parameters
– Adjust Limits - Automatically Shift and Widen Test Limits
– Analyze (Allfault) - Record Analog Statistics and Digital Fault Information
– Throughput Optimizer - Adjust Test Parameters and Runtime Settings to Decrease Test Time
• Customizable based on user defined quality criteria– User specifies metrics for both accuracy and
stability per test type
AutoDebug Test Quality Tool
• Selects Solution Based On Quality Of Results
• Debugs Passing as well as Failing Components
• New Guarding Algorithm
• Intelligence Added To Command File Format
• Optimized Speed
Adjust Limits Test Quality Tool
• Automatically Adjusts Test Limits according to Test Quality Criteria
Analyze Test Quality Tool
• Analyzes Test Program Quality
• Reports Analog and Digital Fault Coverage
• Reports measurement Stability and Accuracy
• Identifies measurements that Pass when UUT is Lifted
• Identifies tests that require excessive Backdrive Currents
Throughput Optimizer Test Quality Tool
• Optimizes Throughput
• Reduces sample counts
• Reduces settling time
• Selects fast Shorts Test
• Reduces program Delays
• Minimizes Autoranging
Test Quality Tools - Example Results
PCB Statistics
• Components: 3034
Nets: 4027
Technology: 6 different power voltages (5V,
2.5V, 3V, 5V, 12V, 48V DC)
6 DC-DC Regulators
54 Digital Logic components
965 Resistors, 332 Resistor Packs, 1578 Capacitors, 11 Inductors
Results
• Pre-Adjust Limits
– 91.3% Passing
– 08.6% Marginal
– 00.2% Failing
• Pre-Optimizer
– 51.71 seconds
• Post-Adjust Limits
– 98.5% Passing
– 01.5% Marginal
• Post-Optimizer
– 39.32 seconds
(24% time savings)
AutoFLASH Tool
Automatically generates Hybrid Test Models to program and test FLASH devices
New Device Library Models
NS16C552
PC16C552
93C46
93C56
PCF8574
PCF8574A
PCF8594
TC59S1616AFT
MAX303
82371AB
82371EB
82443GX
82443MX
82555
82558A
82801BA
82810
82441
82442
82093
TDK78Q2120
IntelNational Semiconductor
Philips
Toshiba
MaximTDK
AM29DL162DB
AM29DL162DT
AM29DL163DB
AM29DL163DT
AM29DL164DB
AM29DL164DT
AM29DL322DB
AM29DL322DT
AM29DL323DB
AM29DL323DT
AM29LV017D
28F004S3
28F004S5
28F008S3
28F320B3TA
28F320C3TA
AT45DB041
AT49LV002
AM29DL324DB
AM29DS323DT
AM29F010B
AM29F016B
AM29F016D
AM29F017D
AM29F032B
AM29F080B
AM29F800BB
AM29F800BT
AM29LV400B
28F320J5
28F160BXB
28F160FXB
28F160BXT
28F160FXT
AM29LV116DB
AM29LV116DT
AM29LV160DB
AM29LV160DT
AM29F002
AM29F010
AM29F016
AM29F040B
AM29DL163
28F160SX
28F016SX
AMD
Intel
Atmel
TestStation Software Release Information
Software Version 5.7.0
GRNavigate Release 4.7.0 / 5.7.0
• Features-At-A Glance – Support for TestStation LH Tester Models
– Retest-On-Fail Runtime Feature
– Automatic Runtime Overvoltage Detection
– Automatic ICA Calibration
– Single Fault Coverage Report Tool
– Support for Windows XP Operating System
– Over 250 miscellaneous software improvements
Released in January of 2003:
Note: 4.7.0/5.7.0 is the last TestStation software release that supports non-ICA testers!
– 20-40% lower price than equivalent TestStation 12X/LX tester models
– 52% smaller footprint
– Scalable test features
– Up to 4096 test points
– Test program and fixture compatible with most GR228X and TestStation 12X tester models
– Combines HSC, MTG, CST, DSM, and FTI boards on single System Control Card
– Dedicated Accessory board slot for CFB, DSM, or AFTM
TestStation LH - New for 2003
A new member of Teradyne’s family of In-Circuit Tester products...
• Increased Memory Behind the Pin
– Support for 64K unique test vectors per Burst in both low-speed and high-speed test modes
• Supports Windows XP Operating System
– Windows NT or XP Operating Systems are supported
• Mandarin User Interface option – Increased convenience for Chinese Production Test Operators
• Enhanced Programming Language
– System Frequency Test Module programmable using standard test language commands
TestStation LH Software Enhancements
Retest-On-Fail Feature
• Automatically re-tests components if they fail
• Can be applied globally or to individual tests using RTOF command
• Option to cycle fixture before re-test
• Option to capture Retest-On-Fail statistics
• Helps eliminate false failures due to intermittent fixture contact or marginal tests
Automatic Overvoltage Detection Option
• Automatically detects On-Board Voltages that could damage tester pin electronics
• Protects tester pin boards and reduces repair costs
• Safe Voltage range for non-UltraPin testers is -6V to +10V
• Safe Voltage range for UltraPin testers is -2.5V to +5.5V
Automatic ICA Calibration
• Automatically calibrates ICA when ambient temperature changes by more than 10 degrees C
• Reduces measurement drift due to environmental conditions
• Improves system to system measurement compatibility
• Option set by Running 228Xcfg.exe
• Test system must contain MXI-2 Card
Single Fault Coverage Report Generator
• Fault coverage information stored in database
• Contains Combined Fault coverage information from ATG, BSCAN, ALLFAULT, and Vectorless tests
• Users can customize report content
• Information can be viewed with HTML browser
TestStation Software Release Information
Software Version 5.8.0
TestStation Version 4.8.0 / 5.8.0
• Features-At-A Glance– New TestStation LX Tester Model – Support for D2B Version 3.2– Program Prep Support for SafeTest Features– Improved Vectorless Test Capabilities– New Test Program # INCLUDE Keyword– Support for Intel® Socket Test Technology Solution– Enhanced Power and Capacitor Discharge Routines– New Hybrid Test Models– Support for new TestStation Licenses– New TestStation LH Fixture Converters and Adapters
Released in May of 2004:
Note: 4.8.0/5.8.0 is the last TestStation software release that supports non-UltraPin Combo-based testers!
– New mechanical frame and smaller footprint
– Up to 7680 test points
– Test program and fixture compatible with all existing GR228X and TestStation12X tester models
– Consolidated System Controller
– New Frequency Test Instrument
– Shipments begin July 2004
– Current TestStation 12X frame effectively discontinued in July 2004
New TestStation LX for 2004
Updated Design for TS12X and TS12XL Tester Models...
Ultra Pin 124128 pins2:8 Mux
Ultra Pin 124128 pins2:8 Mux
Ultra Pin 121128 pins1:1 All Real
Ultra Pin 121128 pins1:1 All Real
Ultra Pin 128L256 pins2:8 - 2:16 Mux
Ultra Pin 128L256 pins2:8 - 2:16 Mux
Ultra Pin 124LX256 pins2:4 - 2:8 Mux
Ultra Pin 124LX256 pins2:4 - 2:8 Mux
Ultra Pin 128128 pins2:16 Mux
Ultra Pin 128128 pins2:16 Mux
TestStation LX30 Card Chassis
3840 pins TS128
TS 124
TS 121
7680 pins TS 128L
TS 124L
TestStation LX30 Card Chassis
3840 pins TS128
TS 124
TS 121
7680 pins TS 128L
TS 124L
Pin Card OptionsDifferent Multiplexing Options to match your product technology requirements, development preferences, and test equipment budget...
TestStation UltraPin Product FamilyTesStation LH
16 Card Chassis
2048 pins TSLH 128
TSLH 124
TSLH 121
4096 pins TSLH 128L
TSLH 124L
TesStation LH16 Card Chassis
2048 pins TSLH 128
TSLH 124
TSLH 121
4096 pins TSLH 128L
TSLH 124L
• Latest Windows XP Operating System
– Windows NT Operating System is still supported
• Consolidated System Controller– Five board control set (HSC, MTG, CST, DSM, and FTI) reduced to a single System Control
Card
– Same System Controller as used in the TestStation LH
• New System/Frequency Time Measurement Instrument– Programmable using standard test language commands
– Lower cost alternative to AFTM and FTI instruments
• Smaller Footprint and Ergonomic Design– 66” Width x 44.5” Depth x 33.25” Height
– Faster Repair and Maintenance
• Dedicated Accessory Slot– Maintain pin capacity when adding optional CFB, AFTM, or DSM instruments
• Increased Memory Behind the Pin
– Supports 64K unique test vectors in both low-speed and high-speed test modes
New TestStation LX Enhancements
• Same 3840 pin Standard and 7680 pin Large Receiver Interfaces
– Accepts all small, half-size, standard, and large GR228X and TestStation fixture kits
• Same System Controller as used on TestStation LH– Proven compatible test execution
– Simplified support and spares
• Same UltraPin D/S Boards as used on TestStation LH and 12X– No fixture or program changes required
• Same ICA (In-Circuit Analog) Instrument– High quality compatible analog component measurements
• Accepts Older Optional CFB, AFTM, FTI and DSM Instruments– No fixture or program changes required
• Selectable Programmer and Operator Software Environments– Use traditional GR228X or new Navigate development environments
New TestStation LX: Protects your Investments...
Support for D2B Version 3.2
• Create Panels from a Single Board
• Enhanced electrical probe placement rules
• Support for Tecnomatix CAD Translators
• D2B/ECO software compares fixture, design, and BOM data
• FLEXlm supports floating, node-locked, and WAN licensing
Program Prep Support for SafeTest
• Technology Data Library– Stores key parametric information– Voltage logic levels, slew rates, and output currents
• Updated Test Library Models – TECHNOLOGY keyword associates device pins with Technology Names in the
Technology Data Library
• New Assign Logic Test Generator– Automatically creates ASSIGN LGC statements with accurate voltage, current, and
slew rate settings for each net on the board
• Backdrive Current Learn and Create Commands – /LEARN option learns the maximum backdrive currents associated with each logic
lamily and automatically updates Burst
– /CREATE option creates a backdrive data file that contains the maximum backdrive current measured on each net of the board
Technology Data Library and Technology Model Keyword
• Common Technology Types Defined in System Technology Data Library
• User defined Technology Types defined in Site and User Technology Data Libraries
• Technology Data Editor allows user to view and modify technology data
• Digital and Hybrid Models associate device pins to defined Technologies
.HEAD;…
/* Default Pin Technology is AHCT */ .TECHNOLOGY AHCT; .TECHNOLOGY RSL(5,18,22,24);.END HEAD;
New Assign Logic Test Generator• Analyzes technologies
on each net and assigns compatible logic levels
• Optionally uses Backdrive Learn Data File to assign Backdrive limits
• Generates Assign Logic Program and Report
• Assign Logic Program automatically merged with Digital, Hybrid, and BSCAN test programs
• Warning and Errors written to Report file
Sample Assign Logic Files
/* Backdrive Data File: GRdemo.bdd *//* OBC File: D:\8X\Tests\grdemo\binary\TS124sys\GRdemo.obc *//* Date: Thursday, April 22, 2004 15:52 *//* Node Name Imax Backdrive Burst Label */ CLK 76 mA; /* U12_FUNC_DIGITAL */ RESETL 129 mA; /* U10 */ P5V 401 mA; /* U12_C2 */ PCENAL 212 mA; /* U12_FUNC_DIGITAL */ CERAML 56 mA; /* U12_FUNC_DIGITAL */ MISO 52 mA; /* U4 */ MOSI 521 mA; /* U10 */ IMEAS 321 mA; /* U16 */ NC9 89 mA; /* U4 */ RXV 93 mA; /* RAM32KX8 */ SCK 58 mA; /* U4 */ SS 388 mA; /* U9 */ TXD 64 mA; /* U5 */ VFILTER 110 mA; /* U8 */ VGAIN 123 mA; /* U7_C2*/ VPEAK 137 mA; /* U4 */
/* Assign Logic Program generated Thursday, April 01, 2004 14:57 */GLOBAL_ASSIGN_LOGICS:ASSIGN LGC VCDH=1.45 VCDL=0.40 VCST=0.92 VTT=0.92 VOHA=2.40 VOLA=0.40 VIHA=3.50 VILA=0.40 SLEWA=100.00 BDIA=100.00M BDTA=10.00M LVLA(A20GATE,ANAGND,APIC,AUD_LINK,AUD_LINK_RST...)
VOHB=2.00 VOLB=0.60 VIHB=2.46 VILB=0.12 SLEWB=50.00 BDIB=50.00M BDTB=10.00M HIACCURACYB LVLB(CK_M_133M,CK_MN_DDR1…)
VOHC=2.40 VOLC=0.40 VIHC=3.25 VILC=0.25 SLEWC=100.00 BDIC=50.00M BDTC=10.00M LVLC(CORE_HS,CORE_VS,GLUE4_3V,GLUE4_CSDA_3V...)
VOHD=1.28 VOLD=0.11 VIHD=1.45 VILD=0.08 SLEWD=100.00 BDID=50.00M BDTD=0.18M HIACCURACYD LVLD(GMCH_FSB,HI0,HI1,HI2,HI3,HI4…)
VOHE=1.15 VOLE=0.60 VIHE=1.50 VILE=0.20 SLEWE=100.00 BDIE=50.00M BDTE=0.05M HIACCURACYE LVLE(G_AD0,G_AD1,G_AD11,G_AD12…)
VOHF=1.30 VOLF=0.80 VIHF=1.50 VILF=0.20 SLEWF=100.00 BDIF=50.00M BDTF=0.05M HIACCURACYF LVLF(H_ADSTB0_,H_ADS_,H_A_10…);
Improved Vectorless Test Capabilities
• New FrameScan Capacitive Opens Technique
• Active Probe improves pin coverage of low measurement signals
• New User Interface simplifies Vectorless Test Debug Activities
• Also Supports Opens Xpress and Junction Xpress Techniques
/* Main Test Program*/U16A: CLEAR CLOCK;SET CLOCK /* CLOCK NAME IS TCK */ AT(CDA=2) NINC=10,5 TINC=100N SIGNAL(CDA=L0),(CDA=L0,H2,L4) DST(D1,S4),(D0,S4) VCDH=4.0 VCDL=0.2 OFF;
/* Start of Burst for U16_A */U16_A:#INCLUDE "burstu16a.txt"/* End of Burst for U16_A */
Test Language #INCLUDE Keyword• Allows test programs to
be stored as separate files
• Separate files can be combined into single OBC by Translator
• Simplifies test program management and debug activities
• Reduces editing time of large test program files
• Simplifies support for multiple board revisions
• #INCLUDEs replaced with WRITE message and FAIL bit if not selected
Intel® Socket Test Technology• A special module for testing Intel mPGA478 and
LGA775 processor socket and ball-grid array interconnect components
– Designed by Intel– Licensed to Teradyne– Special test model created by Teradyne
• Allows testing for open solder joints of all balls of the mPGA478 or LGA775 processor sockets
– Including signal, power, and ground balls
– Ensures that all CPU connections through the socket to the circuit board are electrically correct across all three primary pin types
– Historical test solutions have only provided coverage for signal pin connections
• Module is an array of N-Channel FET pairs– Module plugs directly into the Board Under Test Processor
socket– Processor must be removed from the Board under test
Enhanced Power and Capacitor Discharge Routines
• Analog Test Library and Power Supply Editor have new Capacitor and Power Discharge code
• Support for older non-ICA power supplies (UPS, SVS, PVS, HCS) removed from Discharge routine
• Discharge time is 28% to 53% faster compared to code generated in previous software release
• Less relay stress during discharge increases longevity of pin board relays
• Requires users to re-generate their Analog and Power Test Programs using 5.8.0 and paste into their existing programs
New Hybrid Device Models
L293
L298
L6203
MAX202
MAX206
MAX22
MC145406
TS2P8V
Hybrid Models
Created by Teradyne application engineers to demonstrate how the analog and digital subsystems can be used together to test Digital/Analog devices that exceed the voltage range of the UltraPin sensor (voltages greater than 5.5 volts or less than -2.5V).
New TestStation Licenses
• 580 License allows users to run TestStation 5.8.0 software
• CST License allows TSLH testers to execute Bursts that use Clock and Trigger resources
• Backdrive License allows tester to use Backdrive Measurement and Control features
• Backdrive and CST licenses are optional for TSLH testers, standard on other TS
New TSLH Fixture Converters and Adapters
• New fixture converter makes it possible to run existing TestStation 12X 33 slot fixtures and programs on the TestStation LH 19 slot receiver
– refer to the TSLH Standard Size Fixture Converter document located in the C:\Teradyne\228x\applications directory
• A new Adapter is also available for TestStation L/LX large 33 slot receivers. This adapter can be used to put a large TSLH 19 slot fixture on the TestStation L/LX large 33 slot receivers
Summary:Benefits of 580 Features...
• TestStation 12X Enhanced Controller Testers– Smaller Footprint and ergonomic design – Consolidated control cards and Accessory slot increase tester pin capacity– Lower cost built-in DSM and Frequency Test instruments– Increased memory behind the pin
• D2B Version 3.2– Improved Probe Placement Solutions– Support for all Tecnomatix CAD Translators– D2B ECO software simplifies Board Revision changes and fixture modifications– Floating software licenses support cost-effective collaborative program development
• SafeTest Program Prep Support– Automatic generation of ASSIGN LGC statements saves hours of development time– Automatic selection of optimum Backdrive Current and Duration limits– Reduces chances of exposing components to Electrical Over-Stress conditions
• Improved Vectorless Test– New FrameScan technique with active probes improve fault coverage of low signal pins– Simple user interface allows faster Vectorless Test generation and debug
• #INCLUDE Test Language Keyword– Reduces editing time of large test program files– Simplifies support for multiple board revisions
• Intel Socket Test Technology– Increased ICT Coverage for boards with Intel Processor Sockets– Detects opens on individual power and ground socket pins
• Enhanced Voltage Discharge Routines– Reduces test times by seconds– Tiered discharge technique produces less stress on pin board relays
• New Hybrid Device Models– Automatic generation of mixed signal tests– Tests use Analog subsystem to measure digital voltages that exceed range of Ultrapin
• New Fixture Converters and Adapters– Run 33 slot GR228X/TS12X programs and fixtures on 19 slot TS LH testers
– Run 19 slot slot TS LH fixtures on TS12X L/LX testers
Summary:Benefits of 580 Features...
Special 5.8.0 Promotion Program
• Visit Teradyne Web site for details on the promotion– URL: http://www.teradyne.com/ict/grteststation-in-circuit-test/prod_teststation.html
Questions?