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Puvaneswaran ChelvanathanP65212
Principal Supervisor: Professor Dr. Nowshad Amin
Transmission Electron Microscopy (TEM)
Basic Principles & Application in Thin Film
Photovoltaic Materials
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Presentation Outline
Introduction : Limitation of Visible Light Microscopy (VLM) Electron Wave-Like Nature TEM Components & Working Principle TEM Image Generation Interpretation of TEM ImagesApplication in PV Research Field TEM Facility : Hi-Tech Ltd. Conclusion
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Limitation of Light Microscopy
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Resolution Illustration
Diffraction Barrier Phenomena
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Visible Light & λ
“ It is a poor comfort to hope that human ingenuity will find ways and means of overcoming this limit”
Abbe’s Diffraction Limit :
20 years later…….
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Particle-Wave DualityP.E K.E
Taking Relativistic Effect into account:
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Accelerating Voltage Vs. λ
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Light Vs. Electrons
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Wave-Matter Interaction
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Introduction to Electron Microcopy
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Optical vs. TEM vs. SEM vs. CRT
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TEM Working Principle
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Electron Gun
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Electron Gun Types
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Electron Gun Types
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Electron Lens
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Electron Lens
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Optical Lens vs. Electron Lens
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Principle of Electron Lens
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Electron Beam Alignment
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Electron Beam Focusing
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Imaging: “Seeing The Electrons”
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Imaging vs. Diffraction Pattern (DP)
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Imaging : Bright Field vs. Dark Field
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Imaging : Bright Field vs. Dark Field
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Imaging : Bright Field
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Imaging : Bright Field
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Diffraction Pattern
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Diffraction Pattern
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Diffraction Pattern
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Diffraction Pattern
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Diffraction Pattern
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Diffraction Pattern
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Application in PV Device/Materials
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Application in PV Device/Materials
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Application in PV Device/Materials
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Application in PV Device/Materials
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Application in PV Device/Materials
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Application in PV Device/Materials
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Application in PV Device/Materials
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TEM Facility : Hitech, Puchong
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Some Results…. MoS2
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Some Results…. MoS2
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XRD vs. SAED
XRD SAED
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Conclusion
TEMFundamental Limitation of VLMTEM Main components & operating principlesImage generation: BF, DF and DP Interpretation of DP Application in PV research
Jeol Electron Microscopy 1.25 MeV HVEM
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* RemarksTopics Not covered:
TEM Sample Preparation
Convergent Beam Electron Microscopy (CBED) Analytical Electron Microscopy (AEM) - Electron Energy Loss Spectroscopy (EELS) - Cathodoluminescence (CL)