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Page 1: Numerical Simulation of Resonant Cavity Microwave Plasmas · 2019-12-17 · of Plasma Discharges and Materials Processing, 2nd ed., John Wiley & Sons, Inc., Hoboken, NJ (2005). Figure

Numerical Simulation of Resonant Cavity Microwave PlasmasLizhu Tong

Keisoku Engineering System Co., Ltd., 1-9-5 Uchikanda, Chiyoda-ku, Tokyo, Japan 101-0047

Introduction: The resonant cavity microwaveplasma has become increasing attractive formicrowave electrothermal thrusters as an electricpropulsion device as well as material processingunder high pressures requiring. In this work, asimulation study of microwave plasma sourceswith a resonant cavity is performed usingCOMSOL Multiphysics. Results indicated thevariation of electric field induced by theelectromagnetic wave during the discharge andthe skin effect on the plasma surface. The effectof small amounts of oxygen in Ar/O2 mixtures onthe discharge is examined.

Computational Methods: The research isconducted in a cylindrical resonant cavity, whichoperates at TM011 mode with a frequency of 2.45GHz. The cavity radius is 50 mm and the cavityheight is 175 mm. A 10 mm thick separation plateis placed in the middle of the resonant cavity toseparate the regions of plasma and antenna.Pure argon and Ar/0.5-5%O2 mixtures are usedfor plasma discharges. The power deposited tothe plasma is 100 W. The gas pressures are 40and 80 torr. The basic equations of the plasmasimulations used in this research include a pair ofdrift–diffusion equations for the electrons, amodified Maxwell–Stefan equation for the ionand neutral species, and a Poisson’s equation forthe space charge electric field. The plasmaspecies and the chemical reactions are takenfrom the available literature. The microwave isabsorbed over a collisional skin depth: 𝛿 =2/(𝜔𝜇0𝜎dc)

1/2, where 𝜎dc = 𝑒2𝑛s/𝑚𝜈m.

Conclusions: Results show the microwaveplasma properties of a resonant cavity in pureargon and Ar/O2 mixtures. The skin effect ofmicrowave at the plasma surface and theeffect of the produced negative ions, O- andO2

-, especially for the addition of smallamounts of oxygen are reported.

References:1. M.S. Yildiz and M. Celik, AIP Advances, 7,

045021 (2017).

2. M.A. Lieberman and A.J. Lichtenberg, Principles

of Plasma Discharges and Materials Processing,

2nd ed., John Wiley & Sons, Inc., Hoboken, NJ

(2005).

Figure 1. Distributions of plasma species densities and electric field in an Ar/1%O2 resonant cavity microwave plasma at 40 torr.

Figure 2. Distributions of the electrons and O- ions in an Ar/ 1%O2 resonant cavity microwave plasma at 80 torr.

Results: The calculated results for Ar/1%O2

resonant cavity microwave plasmas at 2.45 GHzat 40 and 80 torr are shown in Figs. 1 and 2. It isshown that the microwave is absorbed near theinsulator. The produced negative ions O- and O2

-,play an important role.

Ar+

Ar2+ O-

O2-

O-e-

e-

Excerpt from the Proceedings of the 2019 COMSOL Conference in Boston

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