*Copyright 2000 Society of Photo-OpticalInstrumentation Engineers.This paper was published in the Proceedings ofSpie’s International Symposium on Optical Science and Technology, SanDiego 2000, and is made available as an electronicreprint with permission of SPIE.One print or electronic copy may be made forpersonal use only. Systematic or multiplereproduction, distribution to multiple locationsvia electronic or other means, duplication of anymaterial in this paper for a fee or for commercialpurposes or modification of the content of thepaper are prohibited