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2009 IEEE BTW Update
Fort Collins, Colorado
September 16, 2009
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2
IEEE Board Test Workshop UpdateIEEE Board Test Workshop Update
• Agenda
– iNEMI Test TIG Update
– 2010 Test Projects
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Introductions Introductions
Board & Systems Test TIG
• Chair: Rosa Reinosa (HP)
• Co-Chair: James Grealish (Intel)
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Objective & Scope Objective & Scope
Test
• To improve the effectiveness of the test process and the quality of electronic products in a global manufacturing environment
• Scope includes test technology and process improvement for boards and systems (e.g. automated inspection, electrical test, boundary scan, functional test, system test)
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Test TIG Projects 2010
Board Flexure Initiative
Chair: Rosa Reinosa (HP)
Co-Chair: Alan McAllister (Intel)
TEST TIG
Chair: Rosa Reinosa
Co-Chair: JJ Grealish
Boundary Scan (Phase II)
Chair: Phil Geiger (Dell)
Co-Chair: Steve Butkovitch (Cisco)
BIST
Chair: Zoe Conroy
Co-Chair: TBD
Test Economic Model (Phase II)
Chair: TBD
Co-Chair: TBD
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Summary of 2009 activities
Accomplishments• Completion of iNEMI 5 Year Test Technology Roadmap to
be published by iNEMI
• Completed gap analysis
• Identified and reviewed proposals for 2010 projects
• Completed Functional Test Coverage project
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Board Flexure Initiative Project
2009 Update
• New Spherical Bend Test Method Standard (IPC/JEDEC 9707) is being completed
• Feedback from JEDEC and IPC 6-10d committees has been gathered
• Proposal will go for ballot in IPC & JEDEC in Oct 2009
Phase II
• Starting in 2010
• Goal: Update IPC 9702 (Monotonic Bend Test Method) and IPC 9704 (Strain Gauge Standard)
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Boundary Scan Project
2009 Update
• Industry Survey (completed)
• Survey analysis (completed)
• ITC paper (To be published)
• Move forward recommendations
Phase II
• To be determined
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Functional Test Coverage Project
2009 Update
• Project has been completed
• Webinar held on 8/12/09 (hosted by iNEMI)
• Results will be made available to iNEMI participating companies
• Completed in 2009
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BIST Project
New in 2010• Currently in project definition phase• Need more companies to join• Chair: Zoe Conroy from Cisco ([email protected])• Introduced by Huawei
Potential Project Steps:• Survey (current state of BIST in the industry)• BIST as an ICT alternative Investigation• Development of Related Standards• New BIST Board Level Standard Proposal• White Paper
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iNEMI Test Cost Model (Phase II)
New in 2010
• Seeking to optimize iNEMI Test Cost Model
• Currently in project definition phase
• Need more companies to join
• Contact: Haley Fu if interested ([email protected])
• Introduced by Huawei