development of an automated measurement system for led...
TRANSCRIPT
2010 Annual Conference and Business MeetingMay 9-11, 2010May 9 11, 2010Las Vegas, NV
Development of an Automated Measurement System for LED Lifetime Testfor LED Lifetime Test
Yuqin Zong1, Cameron Miller1, Yoshi Ohno1
Jeff Hulett2, and Greg McKee3
1 N ti l I tit t f St d d d T h l G ith b M l d
, g
1 National Institute of Standards and Technology, Gaithersburg, Maryland2 Vektrex, San Diego, California
3 Labsphere, North Sutton, New Hampshire
Motivation
Lifetime of an LED (L70)i d f E St lifi ti- required spec for Energy Star qualification
- believed to be long (eg. 50 K hours = 5.5 years!)- time-consuming and costly testing- time-consuming and costly testing
Possible solutions:
Perform a "short" period of time test (eg. 6000 hours (250
Perform accelerated test, but no acceptable approach yet.
days) in the IESNA LM-80-08), and extrapolate data to predict lifetime – requires a method/model (IES TM-21).
NIST Plan
Develop a fully automated measurement system by following LM 80 guidance
Select LEDs from the market.
following LM-80 guidance.
Add new unit(s) in the future if necessary
Perform lifetime test for 3-5 years.
Generate a database automatically with a large amount of
Add new unit(s) in the future if necessary.
data with assigned measurement uncertainties.
A typical workflow for a LED lifetime test
Mount LEDson a MCPCB
Measure LEDs(25 °C in a Lab)
Age LEDs, unattended(Hot in a Thermal Chamber)
Per 40 daysManually(25 C in a Lab) ( )Manually
Measure LEDs(25 °C in a Lab)
Analyze Datay
Typically instruments/equipment
ThermalThermal Chamber
LED MCPCB
X-Y ScanningLED
Power Supply,
Measurement System
Switching Unit
A new, fully automated system being developed at NIST
TE CoolerWarm airventing port
Automatic measurement under in-situ Calibration
condition and at 25 °C room temp.Can be very
Quartz fiber bundle
port
ALED
frequent!
ArraySpectrometer
Filtered cold air
LEDs on a MCPCB board
Aux. lamp
ComputerTE
controllerPowersupply
Filtered cold airintake port
Elec. Meas.Unit pcontrollersupply Unit
Key Component - Large temp-controlled heat sink
400 W input power.
6” x 8.5” cold plate.
280 W cooling power at 25 °C ambient temp.
Very affordable.
Key Component - Large 6” x 6” MCPCB board
Eight 10 LED arraysEight 10 LED arrays.
Total 80 LEDs.
Key Component - Power supply and switch unit
0-5A, 0-200 V
DC and pulsed operation<10 μs pulsing for junction
8 channels to power up the i ht LED
temperature measurement.
eight LED arrays.
Ability to turn on/off one LED at i f i la time for optical measurement.
Built-in multi-layer LED protections.
Key Component - Integrating sphere
80 cm diameter.Warm airventing port Fiber
BaSO4 coating with LED
Intake and venting ports to avoid contamination
venting portport 90 % reflectance.
Calibration port
LED port
to avoid contamination.source-detector adjacent geometry (by P. Hanselaer) to g y ( y )reduce the error due to change of spatial nonuniformity.
Aux lamp
Filtered cold air
Detachable LED & TE-cooler assembly for
Aux. lamp
Filtered cold airintake port measurement verification.
Multiple units, expandable
120 °C55 °C 85 °C
120 °C
“8 t 1”
ArraySpectrometer
“8 to 1” quartz fiber bundle or a fiber switch.
Computer
LED samples
- One model per manufacturerOne model per manufacturer,- Three operating currents per model,
Three case temperatures per model- Three case temperatures per model,- 10 LEDs per test condition.
Total 90 LEDs per model to be tested
Timeline (preliminary)
2010 June - overall design completed
2010 September – purchasing contract awarded
2010 November - system delivered
2011 January - system integration at NIST completed
2011 March - testing starts
Acknowledgements
Melissa Ford, VektrexDan Scharpf and Joe Jablonski LabsphereDan Scharpf and Joe Jablonski, Labsphere
US Department of EnergyUS Department of Energy
THANK YOUTHANK YOU