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Detection of oxygen vacancy migrations in Fe- doped SrTiO 3 by second harmonic generation and photoluminance Yuhang Ren and Steve Greenbaum Physics and Astronomy Hunter College, City University of New York 1 Collaboration with Clive Randall and Russell Maier from PSU

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  • Detection of oxygen vacancy migrations in Fe-

    doped SrTiO3 by second harmonic

    generation and photoluminance

    Yuhang Ren and Steve Greenbaum

    Physics and Astronomy

    Hunter College, City University of New York

    1

    Collaboration with Clive Randall and Russell Maier from PSU

  • Outline

    • Defect physics of oxygen migrations in Fe doped SrTiO3

    • Principles and setups based on second harmonics generation (SHG) to detect defects in Fe:STO near the interface

    • SHG signals from intrinsic, reduced, and oxidized Fe:STO samples with and without an applied electric field.

    • Analysis of SHG results and discussions.

    • Photoluminance in Fe:STO samples

    • Future plan

    2

  • Ferroelectric Perovskites

    • Applications in capacitor, piezoelectric devices and sensors

    • Excellent performances under high electric fields and high

    temperature (high electrical resistivity, efficient supporter of

    electrostatic fields)

    • Defects play a fundamental role in determining failure mechanisms

    Fe

  • Role of Interfaces and Defects

    • Grain boundaries, domain walls and/or electrode interfaces contribute to the degradation and thermal breakdown process.

    • Surfaces and interfaces in dielectric structures determine the underlying polarization switching and ionic properties that in turn, determine the overall ionic degradation and thermal breakdown processes in ferroelectric devices.

    R. Sarathi, et al., Microstructure and Processing 2007; E. Pop, 2008.

    Metal electrode

    Metal electrode

    Dielectric ceramic layer

    at least 5-7 grains

    P type n type Intrinsic

    With applied voltage

    + -

  • Reduced and Oxidized SrTiO3 doped Fe

    Both reduced and oxidized samples were annealed and equilibrated

    under the conditions marked by the grey bar below. They have been

    quenched to freeze-in the defect concentrations.

    Oxidized Reduced

    From Russell and Clive @PSU

  • Types of Iron Centers in SrTiO3

    tetragonal distortion defect complex

    a

    a

    c

    a

    a

    c

    a

    a

    c

    Jahn-Teller

    TiFe

    TiFe Ti OFe V

    non-centrosymmetric non-centrosymmetric centrosymmetric

    From Russell and Clive @PSU

    6

  • Second Harmonic Generation (SHG)

    Contrast is found at interfaces or defect locations due to broken symmetry

    2

    𝑃𝑘 = 𝜀0(𝜒𝑖𝑘1

    𝐸𝑖 + 𝜒𝑖𝑗𝑘2

    𝐸𝑖𝐸𝑗 + 𝜒𝑖𝑗𝑘𝑙3

    𝐸𝑖𝐸𝑗𝐸𝑙 + ⋯ )

    The interface sensitivity of the SHG process

    results from its coupling to the broken inversion

    symmetry at the interface (e.g. defect induced),

    while contributions from the centrosymmetric

    bulk material are suppressed!

    7

  • Polarization-dependent SHG set up

    to extract 𝜒𝑧𝑥𝑥 𝜒𝑥𝑥𝑧 𝜒𝑧𝑧𝑧

    𝜆/2 wave plate

    polarizer

    Apply a 𝜆/2 wave plate to continuously change polarization of the incident beam

    Apply a polarizer to choose the SHG signals from three fixed output polarizations: p, s and d.

    The SHG experimental apparatus: Ti:Sapphire pulsed laser (Tsunami, Spectra Physics)

    is employed as the light source. The laser beam is sent to the SrTiO3 doped with 0.01%

    Fe to create the SHG signal.

    𝜒𝑧𝑥𝑥 𝜒𝑥𝑥𝑧 𝜒𝑧𝑧𝑧 are SHG components directly related oxygen vacancy migrations, defect clusters, and Jahn-Teller distortions

    8

  • Symmetry in STO crystal is 4mm with z

    as the fourfold axis perpendicular to the

    interface. This symmetry allows only

    three independent nonzero contributions

    to the SHG susceptibility compared to 27

    components in 𝜒𝑖𝑗𝑘:

    (i) 𝜒𝑧𝑥𝑥= 𝜒𝑧𝑦𝑦,

    (ii) 𝜒𝑥𝑥𝑧= 𝜒𝑥𝑧𝑥= 𝜒𝑦𝑦𝑧= 𝜒𝑦𝑧𝑦,

    (iii) 𝜒𝑧𝑧𝑧. Allowed O(2p)-Ti(3d) 2ω transitions for

    all three 𝜒𝑖𝑗𝑘 components within the 4mm

    symmetry group

    The three nonzero contributions 𝜒𝑧𝑥𝑥 𝜒𝑥𝑥𝑧 𝜒𝑧𝑧𝑧 are associated with symmetry-allowed O(2p)-Ti(3d) 2ω transitions relevant to defects

    and they contribute to the second harmonic signals.

    9

  • From A4-A7, we obtained the SHG vs. alpha

    and we can subtract 𝜒𝑥𝑥𝑧, 𝜒𝑧𝑥𝑥, 𝜒𝑧𝑧𝑧 components by placing p, d, and s polarizations to understand the nature of

    defects. 𝜒𝑧𝑧𝑧:

    : orbital reconstruction, 𝜒𝑧𝑥𝑥, 𝜒𝑥𝑥𝑧: underlying polarization switching and ionic

    properties. 𝜒𝑧𝑧𝑧 is much bigger than 𝜒𝑥𝑥𝑧 , 𝜒𝑧𝑥𝑥 .

    10

    Theoretical analysis of the SHG signal in perovskite oxides

    A. Rubano, M. Fiebig et al., Phys. Rev. B 83, 155405 (2011). E. D. Mishina et al., JAP 93, 6216 (2003).

    Multidomains

  • 0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    3.0

    3.5

    4.0

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0.0

    0.5

    1.0

    1.5

    2.0

    2.5

    3.0

    3.5

    4.0

    xxz

    =0.0039

    zzz

    =0.32139

    SH

    G s

    ign

    al (a

    .u.)

    p_out fit

    p_out sample

    d_out fit

    d_out sample

    zxx

    =-0.23759

    Intrinsic STO

    Theoretical analysis of the intrinsic STO sample to subtract three important fitting parameters

    11

  • Our results show that the defects in the reduced sample have affected the SHG signals through 𝜒𝑥𝑥𝑧, 𝜒𝑧𝑥𝑥, 𝜒𝑧𝑧𝑧.

    SHG of intrinsic (SrTiO3), oxidized, and reduced

    SrTiO3:Fe (0.01wt%) Samples

    0

    2

    4

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    2

    4

    SH

    G s

    ignal (a

    .u.)

    p-out

    d-out

    s-out

    intrinsic STO

    0

    5

    10

    15

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    reduced STO

    SH

    G s

    ign

    al (a

    .u.)

    p-out

    d-out

    s-out

    0

    5

    10

    15

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    oxidized STO

    Pola

    riza

    tio

    n o

    f in

    cid

    en

    t be

    am

    (d

    eg

    ree

    )

    p-out

    d-out

    s-out

    12

  • 0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    reduced STO

    p-out

    SH

    G s

    ign

    al (a

    .u.)

    900 V

    0

    5

    10

    15

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    reduced STO

    p-out

    SH

    G s

    igna

    l (a

    .u.)

    1000 V

    0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    reduced STO

    p-out

    SH

    G s

    igna

    l (a

    .u.)

    1200 V

    0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    reduced STO

    p-out

    SH

    G s

    igna

    l (a

    .u.)

    1400 V

    0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    reduced STO

    p-out

    SH

    G s

    igna

    l (a

    .u.)

    1500 V

    0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    SH

    G s

    ign

    al (a

    .u.)

    0 V

    reduced STO

    p-out

    Second symmetry/phase was introduced due to oxygen ion (O2-) migrations

    when an electric filed is applied at the reduced Fe:STO anode: SHG phase

    shift appears due to the appearance of a new distorted phase ( a rhombohedral

    phase or monoclinic phase)

    13

  • 0

    5

    10

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    reduced STO

    p-out

    SH

    G s

    ign

    al (a

    .u.)

    0 V

    900 V

    1200 V

    1500 V

    Oxygen ion/vacancy migration dynamics

    (1) When enough voltage is applied, oxygen vacancy begins to move and

    accumulate in the STO side of interface resulting in additional asymmetry

    observed in the SHG signal (phase shift); (2) Each oxygen ion/vacancy is

    associated with a local dipole. The SHG intensity is then applied to describe as

    the local dipole field.

    14

    Oxygen ion moving towards

    anode side under applied

    voltage Oxygen ion

    accumulation induces the

    formation of a distorted T/R

    phase (SHG phase shift)

    Further increase of applied

    field introduces local dipole

    field into the anode side

  • 0

    5

    10

    15

    20

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    20

    oxidized STO

    p-out

    Pola

    rization o

    f in

    cid

    ent beam

    (degre

    e)

    0 V

    0

    5

    10

    15

    20

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    20

    oxidized STO

    p-out

    Pola

    rization o

    f in

    cid

    ent beam

    (degre

    e)

    900 V

    0

    10

    20

    30

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    10

    20

    30

    oxidized STO

    p-out

    Pola

    rization o

    f in

    cid

    ent beam

    (degre

    e)

    1000 V

    0

    10

    20

    30

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    10

    20

    30

    oxidized STO

    p-out

    Po

    lari

    za

    tio

    n o

    f in

    cid

    en

    t b

    ea

    m (

    de

    gre

    e)

    1200 V

    0

    10

    20

    30

    40

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    10

    20

    30

    40

    oxidized STO

    p-out

    Pola

    riza

    tio

    n o

    f in

    cid

    en

    t be

    am

    (d

    eg

    ree

    ) 1500 V

    Oxidized sample consists of mixtures of all three types of defect centers. But only

    SHG intensity changes are observed in the oxidized sample (due to crystal distortion

    and formation of clusters (Prosandeev’s model): the SHG intensity is proportional to

    oxygen vacancy/surface ion concentration and therefore the distributions of these

    defects) 15

    0

    10

    20

    30

    40

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    10

    20

    30

    40

    oxidized STO

    p-out

    Pola

    riza

    tio

    n o

    f in

    cid

    en

    t be

    am

    (d

    eg

    ree

    )

    0 V

    900 V

    1200 V

    1500 V

  • 0 400 800 1200 160010

    15

    20

    25

    30

    35

    Am

    plit

    ud

    e o

    f S

    HG

    (a

    .u.)

    Voltage Applied (V)

    reduced STO

    oxidized STO

    16

    Our observations: (1) the anode side of a reduced sample becomes more and more

    oxidized with increasing applied field. But only small oxygen surface states are

    formed; (2) Oxygen surface states in the oxidized sample show a significant change

    with the oxygen accumulation at the anode side.

    For the reduced sample,

    the SHG intensity is

    slightly decreased with

    increasing applied

    voltage. In contrast, the

    SHG increases about

    75% within the same

    region of voltage for the

    oxidized sample.

  • 0 400 800 1200 1600

    0

    5

    10

    15

    20

    25

    30

    reduced STO

    oxidized STO

    Pha

    se c

    ha

    ng

    e o

    f S

    HG

    (de

    gre

    e)

    Voltage Applied (V)

    17

    We attribute that (1) a new distorted phase is introduced into the anode side of the

    reduced sample with increasing applied field. The distortion of the crystal structure

    due to oxygen accumulation near the surface changes the spontaneous polarization

    away from the [001] direction; (2) the distortion in the oxidized sample is almost

    negligible with adding more oxygen ions at anode surface.

    For the oxidized sample,

    the SHG phase is only

    slightly changed with the

    applied voltage. In contrast,

    the SHG increases about 25

    degree within the same

    region of voltage for the

    reduced sample.

  • Wavelength dependence of SHG in oxidized STO

    0

    5

    10

    15

    0

    30

    60

    90

    120

    150

    180

    210

    240

    270

    300

    330

    0

    5

    10

    15

    Pola

    riza

    tio

    n o

    f in

    cid

    en

    t be

    am

    (d

    eg

    ree

    ) 710 nm 1.74 eV 750 nm 1.65 eV

    810 nm 1.53 eV

    870 nm 1.42 eV

    oxidized STO

    SHG intensity in oxidized STO decreases with decreasing photon energy which is

    the same as the results from PL measurements indicating a peak near 350 nm in

    oxidized Fe(0.01wt%):STO (different excitation bands + resonant effect!).

    18

  • Some important observations from SHG

    • Oxygen vacancy/ion migration dynamics: oxygen ion moving under applied voltage the reduced/oxidized samples may be separated into p-type, n-type, and intrinsic regions (phase localization) charge gradient formation at high applied fields

    • Crystal distortions under applied fields: coexistence of tetragonal and rhombohedral phases due to imposed epitaxial strains in both reduced and oxidized samples.

    • Electronic structure mapping by a wavelength dependent SHG and photoluminescence studies.

    19

  • A broad luminescence band is present in the range of 380–600 nm with a maximum

    at 520 nm. The spectrum is interpreted as a disordered surface creating several

    localized bandgap states. Two weak shoulders locate at 430 and 595 nm. The signal

    at 595 nm originates from the Fe4+ ionization/oxygen surface states. The shoulder at

    430 nm is attributed to surface point defects related to oxygen vacancies and

    surface states. 20

    Xu et al., J. Appl. Phys. 114, 154106 (2013). Hanzig et al., J. Appl. Phys. 110, 064107 (2011).

    Oxygen vacancy state

    Fe4+ state

  • Before the degradation, the oxygen vacancy/surface state can be observed in PL spectra both for reduced and oxidized samples. The peak is more significant in the oxidized sample than that in the reduced sample because of the surface oxygen population.

    21

    2.53.03.54.0

    Pt-O Charge Transfer

    (3.51eV)

    Oxygen vacancy/Electron PCCD (2.97eV)

    Self-Trapped Excitons (2.67eV)

    Cumulative Fit

    PL

    In

    ten

    sit

    y (

    CP

    S)

    Emission Energy (eV)

    Excitation @ 280nm

    Reduced Fe(0.01):STO

    BL: Oxygen vacancy/

    Surface states

    Yang et al., J. Am. Ceram. Soc., 94, 1811–1816 (2011)

  • 22

    With the applied field, the PL intensity for the surface oxygen states increases significantly and the Pt/oxygen cluster states are clearly identified at the anode side for the reduced samples. The peak is more significant in higher applied fields because of the increase of extrinsic defect population.

    2.5 3.0 3.5 4.0

    PL

    In

    ten

    sit

    y (

    CP

    S)

    Surface oxygen states

    Pt-O Charge Transfer States

    Emission Energy (eV)

    Reduced

    Degraded Reduced

    Oxidized

    Pt/O

    Anode with applied field

    PCCD: principal charge

    compensating defect

    Yang et al., J. Am. Ceram. Soc., 94, 1811–1816 (2011)

    + -

  • 23

    After degradation, the 2.9 eV peak doesn’t show significant changes with applied field in both the cathode and anode sides in reduced sample. This is due to the degradation of Fe:STO structures. The degradation finally causes the diffusion of defects from anode to cathode side.

    2.4 2.7 3.0 3.3 3.60.0

    0.2

    0.4

    0.6

    0.8

    1.0

    No

    rmali

    zed

    PL

    In

    ten

    sit

    y [

    a.u

    .]

    Photon Energy (eV)

    0 V

    700 V

    1000 V

    1300 V

    Fe(0.01wt%):STO

    Reduced Cathode

    after degradation

    Wojtyniak et al. J. Appl. Phys.

    113, 083713 (2013)

  • Consistent results in photoluminescence (PL)

    • Reduced sample: The oxygen vacancy and surface defect states around 2.9 eV are identified. The peak increases significantly at anode side when a high field was applied. Reduced oxidized transition

    • Oxidized sample: The oxygen surface states are identified around 2.9 eV at both electrode sides. The peak gets more and more pronounced with an increasing applied field. Accumulation of surface oxygen ions.

    Both oxygen vacancy and surface states are identified and the peak shows significant changes with the applied field before degradation, but do not change much after degradation

    24

  • )22

    4)(2

    ( 22424 DkM

    K

    M

    KMHDk

    M

    KH

    Ultrafast probing magnetic inhomogeneity in manganites

    Y.Gong, Z. Zhang, D. Ascienzo, Y. Abranyos, H. B. Zhao, G. Lupke, Qi Li, Y. H. Ren, Europhysics Letters 108, 17010 (2014).

  • Outlooks:

    26

    Publications: (AFOSR support acknowledged) • Y.Gong, Z. Zhang, D. Ascienzo, Y. Abranyos, H. B. Zhao, G. Lupke, Qi Li, Y. H. Ren, Europhysics

    Letters 108, 17010 (2014).

    • “Experimental demonstration of 55-fs spin canting in photoexcited iron nanoarrays”, Yuhang Ren*, Wei

    Lai, Zehra Cevher, Yu Gong, and G. P. Zhang, Nature Photonics (under review) 2015.

    • “Optimization of the defects and nonradiative lifetime of undoped GaAs/AlGaAs double

    heterostructures”, Z. Cevher, P. Folkes, H. Hier, B. VanMil, B. C. Connelly, W. Beck, and Y. H. Ren*,

    (submitted).

    • “Second harmonic detection of electric field induced oxygen migrations in Fe doped SrTiO3”, Haochen

    Yuan, David Ascienzo, Onur Kurt, Steve Greenbaum, Russel Maier, Clive Randall, Yuhang Ren*, (in

    preparation).

    • “Probing the coupled breakdown processes near interfaces in dielectrics”, David Ascienzo, Onur Kurt,

    Steve Greenbaum, Russel Maier, Clive Randall, Yuhang Ren*, (in preparation).

    • Coupled breakdown dynamics by SHG and PL: imaging nanoscopic textures, crystallographic grains, and t the size and shape of the space charge regions

    • Perovskite bicrystals for idealized grain boundary type behavior

    • Ultrafast detection of elastic and magnetic clusters in dielectrics

  • Thanks for your attention

  • 31

    0 300 600 900 1200 1500

    No

    nlin

    ea

    r p

    ara

    me

    ters

    Applied Voltage (V)

    d31

    d15

    d33

    Oxidized Fe: STO