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Meas. Sci. Techno!. 5 (1994) 976-984. Printed in the UK Design of a scanning probe microscope H Olin Department of Physics, Chaimers University of Technology, S-412 96 Goteborg, Sweden Received 17 February 1994, in final form 14 April 1994, accepted for publication 18 AprH 1994 Abstract. A compact scanning probe microscope for operation in air and liquid is described. The probe techniques implemented are scanning tunnelling microscopy and scanning ion conductance microscopy. The software, electronics, mechanical construction and some representative measurements will be presented here. The compact and concentric microscope head is built around a commercial piezoelectric inchworm motor. The scanner is a standard piezo tube. An analogue feedback system is used lor taking images, while digitai controi of the probe-sample distance is used for other experiments, such as measurements of current-voitage characteristics. A Macintosh personal computer is used for controi and presentation of data. A simple method to make scanning tunnelling microscope tips suitable for electrochemical use is described. The microscope has a high resonance frequency (9.6 kHz), low noise (0.01 nm Hz-'i 2 at 10 Hz), low thermal drift (less than 0.1 nm mln-'), and high acoustical noise suppression. The current-distance-dependency of the scanning ion conductance microscope was found to be linear. 1. Introduction Scanning tunnelling microscopes (STM) [1-4J and other scanning probe microscopes (SPM) [4,5J give topographic images by scanning a tip over a sample, with resolution down to atomic dimensions. In the STM a conductive tip is brought close to (about 0.5 nm) the sample. When a small voltage is applied between the tip and the samplc, a tunnelling current starts to flow. This current is strongly dependent on the distance and, by measuring the current, the tip-sample distance can be determined. The tip is then raster-scanned over the sample, while a feedback system keeps the tip-sample distance constant. A picture is generated by plotting this feedback signal. The introduction of the STM in 1982 by Binnig, Rohrer and co-workers [6 J has stimulated the develop- ment of other scanning probe microscopes, in which the tunnelling tip has been replaced by other probes, while keeping the rest of the concept. For example. in the scan- ning force microscope. electrostatic, magnetic or van der Waals forces are measured locally. Other SPMs mea- sure local temperature, Faradaic currents or optical near fields. A great deal of work is being done to improve understanding of these probes and to implement new ones. Another SPM, invented by Hansma and co-workers in 1989 [7J, is the scanning ion conductance microscope (SICM). The probe in the SICM is an electrolyte-filled micropipette. The sample is immersed in an electrolyte and a voltage drives an ion current through the aperture 0957-0233/94/080976+09$19.50 \'1;1 1994 lOP Publishing ltd of the pipette. The current decreases near the surface and the distance is monitorcd by measuring the current. An SPM consists of four main parts: the probe, the mechanical parts, the electronics and the computer. The mechanical part consists of essentiaJly a piezoelectric scanner, with a typical scanning range of a few micrometres, and a coarse positioning device that reduces the tip-sample to make it rcmain within the controlling range of the piezo. While the single piezo tube scanner invented by Binnig and Smith [8] has become a standard choice, a number of coarse positioning mechanisms have been implemented, for example, the early piezo electric walker ('the louse') [61. home-built [9] or commercial inchworms [10, II]. inertial gliders [12], lever reduced screw mechanisms [13] Or differential screws [14[. For more examples and references, see [2, 15J. Because of the mechanical nature of these micro- scopes, one of the major construction problems is vi- bration isolation. The main noise sources are low- frequency building vibrations and sound. The general method [15,16] (0 solve this problem is to construct the SPM with a high resonance frequency and to place it on a low-resonance-frequency damping table. An SPM with a high resonance frequency generally means a stiff and small SPM; the smaller the better. While the piezo scanner is small, the coarse approach mechanism usu- ally adds to the size, and it is often the design of this mechanism that determines the overall vibration sensi- tivity. Thermal drift is another problem that must be considered in designing an SPM. This prohlem can be

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Page 1: Design of a scanning probe microscopeapachepersonal.miun.se/~hakoli/olinref-filer/Olin94MST.pdf · 2009-11-28 · Design of a scanning probe microscope H Olin Department of Physics,

Meas. Sci. Techno!. 5 (1994) 976-984. Printed in the UK

Design of a scanning probe microscope

H OlinDepartment of Physics, Chaimers University of Technology, S-412 96 Goteborg,Sweden

Received 17 February 1994, in final form 14 April 1994, accepted for publication18 AprH 1994

Abstract. A compact scanning probe microscope for operation in air and liquid isdescribed. The probe techniques implemented are scanning tunnelling microscopyand scanning ion conductance microscopy. The software, electronics, mechanicalconstruction and some representative measurements will be presented here.The compact and concentric microscope head is built around a commercialpiezoelectric inchworm motor. The scanner is a standard piezo tube. Ananalogue feedback system is used lor taking images, while digitai controi of theprobe-sample distance is used for other experiments, such as measurementsof current-voitage characteristics. A Macintosh personal computer is used forcontroi and presentation of data. A simple method to make scanning tunnellingmicroscope tips suitable for electrochemical use is described. The microscope hasa high resonance frequency (9.6 kHz), low noise (0.01 nm Hz-'i2 at 10 Hz), lowthermal drift (less than 0.1 nm mln-'), and high acoustical noise suppression. Thecurrent-distance-dependency of the scanning ion conductance microscope wasfound to be linear.

1. Introduction

Scanning tunnelling microscopes (STM) [1-4J andother scanning probe microscopes (SPM) [4,5J givetopographic images by scanning a tip over a sample,with resolution down to atomic dimensions. In the STMa conductive tip is brought close to (about 0.5 nm) thesample. When a small voltage is applied between thetip and the samplc, a tunnelling current starts to flow.This current is strongly dependent on the distance and,by measuring the current, the tip-sample distance canbe determined. The tip is then raster-scanned over thesample, while a feedback system keeps the tip-sampledistance constant. A picture is generated by plotting thisfeedback signal.

The introduction of the STM in 1982 by Binnig,Rohrer and co-workers [6 J has stimulated the develop­ment of other scanning probe microscopes, in which thetunnelling tip has been replaced by other probes, whilekeeping the rest of the concept. For example. in the scan­ning force microscope. electrostatic, magnetic or van derWaals forces are measured locally. Other SPMs mea­sure local temperature, Faradaic currents or optical nearfields. A great deal of work is being done to improveunderstanding of these probes and to implement newones.

Another SPM, invented by Hansma and co-workersin 1989 [7J, is the scanning ion conductance microscope(SICM). The probe in the SICM is an electrolyte-filledmicropipette. The sample is immersed in an electrolyteand a voltage drives an ion current through the aperture

0957-0233/94/080976+09$19.50 \'1;1 1994 lOP Publishing ltd

of the pipette. The current decreases near the surfaceand the distance is monitorcd by measuring the current.

An SPM consists of four main parts: the probe, themechanical parts, the electronics and the computer. Themechanical part consists of essentiaJly a piezoelectricscanner, with a typical scanning range of a fewmicrometres, and a coarse positioning device thatreduces the tip-sample to make it rcmain within thecontrolling range of the piezo. While the singlepiezo tube scanner invented by Binnig and Smith [8]has become a standard choice, a number of coarsepositioning mechanisms have been implemented, forexample, the early piezo electric walker ('the louse')[61. home-built [9] or commercial inchworms [10, II].inertial gliders [12], lever reduced screw mechanisms[13] Or differential screws [14[. For more examples andreferences, see [2, 15J.

Because of the mechanical nature of these micro­scopes, one of the major construction problems is vi­bration isolation. The main noise sources are low­frequency building vibrations and sound. The generalmethod [15,16] (0 solve this problem is to construct theSPM with a high resonance frequency and to place iton a low-resonance-frequency damping table. An SPMwith a high resonance frequency generally means a stiffand small SPM; the smaller the better. While the piezoscanner is small, the coarse approach mechanism usu­ally adds to the size, and it is often the design of thismechanism that determines the overall vibration sensi­tivity. Thermal drift is another problem that must beconsidered in designing an SPM. This prohlem can be

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(a)... 20 mm

TIp Ti holder

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(c)

Design of a scanning probe microscope

(b)

(b)

Figure 1. (a) The compact and axial symmetricmicroscope head is built around an inchworm motor. (b)When the microscope is operated in an electrolyte a smallliquid cell is used. The liquid cell replaces the tip holder in(a).

solved by a symmetrical construction and careful choiceof material '.

In thi paper. we describe a canning probemicroswpe ror operation in air and liquid. Themechanical con truction, electronics oftware, probeand orne representative measurement will be presented.The probes are STM tip and micropipette for SICM u e.

2. Mechanical

2.1. The mechanical loop

The compact micro cope head (figure I(a» i buillaround a 'ommercial piezoelectric inchworm motor(Burleigh Instruments. Inc), which is the coarse approachmechanism. The inchworm motor work by clampingand expan ion/contraction equence (figure 2). Eache pan ion i made in 2048 teps, giving a step size ofI nm. The piezo scanner. with the sample holder is fixedto the moving part of the motor. The tip holder is fixedto a thermal drift compensation tube, which is glued byepoxy re in directly onto the moLOr. This arrangementmakes the mechanical loop very mall.

2.2. Thermal drift

Lateral thermal drift is minimized by the axiallysymmetrical design of the SPM head. In the axialdirection there is no uch symmetry, and another

Figure 2. Principle of operation of the inchworm motor. (a)The inchworm is standing in the stop position. (b) Piezo 3is expanding. (c) The lower piezo is clamped and theupper is released. (d) Piezo 3 is contracted. and the tubeis moving up. The sequence is repeated from (a). Eachcycle moves the tube about 2 /.l m.

approach i nece sary. The piezo tube has a lowerthermal expan ion coefficient than the material u ed inthe inchworm motor (aluminium oxide). To compen atefor this a tube made of Invar is placed between theinchworm and the tip holder. The length of thi thermaldrift compen ation tube ha been calculated to matchwith a 2 mm tungsten tip and a 0.5 mm metal sample.The tip holder i fixed on the compen ation tube by threecrew. For ob 'ervation of the tip and ·ample. the tip

holder has an in pection hole (figure I(a».

2.3. Piezo scanner

The scanner is a tandard ingle piezoelectric tube (PZT­5H [17]), which has an outside diameter of 6.35 mm, alength of 12.7 mm and a wall thicknes of 0.56 mm.The tube has four outer electrode and one innerelectrode. Electrical wire are soldered on the electrodeat ISaaC using an indium older. To improve thetran ient re pon e behaviour. the tube wa' filled withilicon rubber a suggested by Dilella et al [18). The

lube i glued by epoxy re in onto an in ulating gla'sceramic di c (Macor, Coming). This disc is fixed on anexpanding stainless steel mechani m. which i u ed tofix the canner in ide the moving part of the inchworm(figure I(a ).

2.4. The sample holder

The sample holder i imply a 'crew, where the sampleis fixed with conducting glue I' with two small leverpring. To prevent leakage current and capaciti e

coupling from the piezo tube to the sample, a small tack

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H Olin

is glued onto the scanner. The stack consists of Macor,metal foil, Macor and stainless steel. The metal foil isearthed. The teel part has a thread, where the sampleholder is screwed, and it is connected either to the biasvoltage or to the current amplifier.

2.S. The liquid cell

To operate the micro cope in a liquid. a small closedcell is used. The cell consists of a Plexigla tip holderand a Plexiglas tube (3 mm high), onto which a flexiblerubber membrane is glued (figure 1(b)). The membranehas a hole in the centre where the sample holder isplaced and the connection is sealed with a nut on theback side of the membrane. The cell with the sampleholder is screwed into the tube scanner and the cell isfilled with Liquid. The probe holder is placed on the topand three crew eal the package. To prevent leakageof liquid, grease is placed between the probe holder andthe Plexiglas tube. Two small hole are drilled in the tipholder to compensate for pressure change . These holeare usually covered with grease to decrea e evaporationof the liquid. The probe is glued onto the tip holder.

When the cell contains an electrolyte, it must beelectrically shielded. It was found that the ea iest andmost effective way to eliminate electrical disturbanceswas to wrap the entire cell with a grounded or biasedaluminium foil.

2.6. Vibration and sound isolation

For i olation of vibration and sound noi e, the probehead is placed on a vibration damping tack, whichhangs in thin rubber bands inside a closed box (figure 3).The damping stack consists of four stainless steel ringseparated from each other by cut rubber tube. This

stack acts as a multistage mechanical low-pass filter[16, 19,20].

On top of the tack a printed circuit board withelectrical connectors is fixed. The electrical wires to theconnectors are clamped to each ring to absorb vibrations.The SPM head has a similar board with connectors,making it possible to disconnect the head for replacementof sample and probe.

To suppress accoustical noise, it is important to usea clo ed box with thick walls made of a sound-absorbingmaterial [21]. Stainles steel is a good ound-absorberabout half as good as lead which is one of the best.Steel is easier to machine than lead and i al 0 non­toxic, making it a good compromise.

In our case we used a closed cylindrical stainle steel box. The teel box ha a 5 mm thick walls and to

damp out resonance a 3 mm layer of rubber is added tothe inside of aJl wall. The damping box can be used asit is or, better, placed on an additional damping system,which consists of a marble plate suspended from theceiling by bunge cord .

978

10cm

Figure 3. The vibration and sound damping box.

3. Electronics

The electronics consi ts of the current amplifier, thefeedback system the piezo drivers and the inchwormelectronics. An interface card is used for the connectionbetween the electronic and the computer.

3.1. The current amplifier

The current amplifier (figure 4) is a high-impendanceoperational amplifier (OPA 128, Burr-Brown), where thecurrent is converted to a voltage over a high resi tance(1-1000 MQ). The additional 10 kQ resistor is forprotection of the op-amp against accidental high currents.To minimize shunting capacitance contribution from thecable the amplifier is placed on a circular printed circuitboard directly on the SPM head, giving a cable length of5 em.

3.2. The feedback system

The amplifier probe ignal is fed to the feedback systemin ide the main electronics box (figure 4). This signalis amplified I 10 or 100 time by an instrumentamplifier (AD524). A logarithmic amplifier AD755 ,linearizes the exponential behaviour of the tunnellingcurrent. The log-amp ha an internal current ource,which is used for the et point. This et point can beadju ted by the variable input resistor. The log-amprequires a negative input 0 a rectifier is necessary foroperation with both negative and po itive bias voltage.A modulator (AD630) i used as the rectifier [22]. Theoutput from the log-amp is then fed to the integrator. Thetime constant may be adjusted by the variable resistor.Bias voltage is supplied by a 16-bit D/A convertedfrom the card inside the computer. The bias i fed

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Design of lit scanning probe microscope

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Figure 4. Circuit diagram of the feedback system and the current amplifier. The y pleza drivers (not shown) are identical tothe X drivers.

through an instrument amplifier (AD524) to preventground loops and for suppression of common mode noise(this technique was used for all signals between differentparts of the electronics).

When operating in the SICM mode the feedbackoutput has to be reversed, because the signal isdecreasing with decreasing tip-sample distance, notincreasing as in the 8TM mode. This is done by a simpleswitch.

Another switch is used to connect a 16-bit D/Aconverter to the z piezo driver for computer control of thetip-sample distance. This allows computer-controUedfeedback, and pennits measurements of current-voltageand current-distance dependencies. It also permitsalteration of the surface mechanically by gently pushingthe tip into the surface.

3.3. Piezo drivers

The piezo scanner drivers are built around high-voltageoperational amplifiers (CA3583, Butt-Brown), resultingin a simple design (figure 4). To prevent cross talkbetween the vertical and the lateral directions, we usedsymmetrical driving of the piezo tube by applyingopposite voltages to oppose outer electrodes [23]. Thisalso doubles the lateral scan range.

3.4. Inchworm eJectronics

The electronics for the inchworm motor is commerciallyavailable (6000 controller, Burleigh Instruments, Inc).The controller supplies the motor with high voltage(up to 700 V) signals. The controller was connectedto three digital outputs from the interface card insidethe computer to allow change in direction, c1amping­unclamping in a stop position, and for stepping control.

The coarse approach was done by going towardsthe surface using the analogue feedback with the fastestresponse time. After contact, the motor continued tomove until the z value was zero. The approach iscontrolled by the computer. For every 1 nm step, thefeedback signal is checked, until the desired value isreached.

4. Computer and software

4.1. Computer and interface card

A personal computer (Apple Macintosh IIx, Motorola68030 processor, 640 x 420 pixels, 8 bits, colour screen)was used for control of the probe measurement and forprocessing and presentation of data. A combinationanalogue and digital interface card (MacAdios II, with

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H Olin

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Figure 5. The user interface is built up with curtain menus, multiple windows and dialogues. This screendump shows four windows. One is showing a grey scale image of graphite with atomic resolution taken inthe constant current mode. The other three windows show an evaporated film of Au-Pd in three differentviews. The views are grey scale, solid three-dimensional and line plot views.

one 16-bit analogue input and two 16-bit analogue outputbaby board. GW Instruments, Inc) was used for theinterface to the analogue electronics and to the inchwormelectronic . The feedback signal is connected to the 16­bit AID input, which give a resolution of 0.2 A. bit-I inthe z direction. The 16 bit D/A output gives a resolutionof 0.4 A. bit-I in the lateral directions. The conversionrate is 50 kHz.

4.2, The development system

The software was written in Object Pascal usingMacApp and the software development tools in theMacinto h Programmer Workshop (Apple ComputerInc). MacApp i an almost complete, generic Macintoshprogram ready to customize. MacApp could aI 0 beconsidered as a set of reusable Iibrarie upon which tobase the new program. MacApp is written in ObjectPascal. An object i like a small program whichcontains both the data and the routine that operate on thedata. To customize MacApp and build a new program,some objects are changed and new ones are created.The advantage with object oriented programming, ascompared with procedure oriented, is that it is ea y toreuse old codes.

980

4.3, Picture measuring routines

To scan the piezo in the x direction, a voltage ramp fromthe D/A converter is needed. The values of the rampare stored in a memory array, and to make the ramp assmooth as possible all bits are u ed, resulting in stepsize of 0.4 A. An input array, with the ame size asthe output array, i allocated to hold the mea ured data.The output and the imultaneou input are controlledby a clock on the interface card. This aI 0 allow thescan speed to be controlled a parameter better suitedthan the scan frequency, which i commonly u ed. Themea ured information is placed in an allocated picturememory after each can. The y movement is made by asimple loop, with single bit step . The same techniqueis used to offset the tip to another start position.

4.4. Digital feedback

Digital feedback allows more flexible use of themicro cope than doe analogue feedback, but it is alsomore difficult to achieve becau e of the amount ofcomputation involved. A simple routine is implementedfor digital feedback. Depending on the value of thetunnel1jng current, the distance is unchanged or changedby a single bit (corresponding to 0.2 A.). Two currentvalues are defined, a top value and a bottom value.

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When the current exceeds the top value, the tip-sampledistance is increased, and when the current is below thebottom value, the distance is decreased. The top valueis not equal to the bottom value, so there is a windowbetween the two in which the distance is not changed.The reason for this perhaps odd algorithm is that it wasfound to be more stable than an ordinary PI-regulator. Asimilar approach, which was implemented in hardware,has given a much higher speed [24].

Our implementation was found to be too slowfor imagc measuring, but for other purposes, suchas measuring I-V and I-z curves, it was foundto be convenient. This was also necessary becausethere is no sample-and-hold circuit in the electronics.Differentiation of I-V curves was performed by asimplified least squares procedure [25].

4.5. The user interface and picture presentation

The user interface was implemented in the standardMacintosh way with curtain menus, windows (figure 5)and dialogues. Several routines are implemented forpresentation of the pictures. The most useful is the topview in which the height information is put into a greyscale. The grey scale image is complemented with amoving marker, which points to a single image line. Thisline is plotted below the image, giving a cross sectionalview of this particular line.

For three-dimensional image presentation, a hiddenline algorithm and a colour solid surface algorithm areused. The latter is made by simply drawing the linesof the picture with a wide vertical coloured pen, and bydrawing from top to bottom there is no need to hidethe previous lines. The colour of the pen is pickedfrom the slope of the lines, giving the picture a simpleshading. The slope is calculated by the same leastsquares algorithm as mentioned above [25]. The colourscan be selected from a number of predefined colourtables of customized by picking colours from a palette.

4.6. Filtering

A number of filtering and image modification routinesare implemented. The most important one is theplane-adjust algorithm. Another routine, that is usefulwhen there are spikes in the picture, is a line-removalalgorithm. The user picks a bad line and this is replacedby the average of the two nearest lines. A simple low­pass liltcr is implemented, this is done by replacing eachpicture point valuc by the average of the point value andthc values of the nearest neighbours.

4.7. Hard copies

Hard copies of the images were obtained with astandard laser printer. Although the program containsprinter routines, it was found convenient to makescreen dumps. and use the standard Macintosh cut andpaste commands to place images into image processingprograms (namely Adobe Photoshop) or word processorsfor documentation.

Design of a scanning probe microscope

5. Probes

The probes used in this microscope were STM tips foruse in air and in electrolyte, and micropipettes for StCM

use. The tunnelling tips in air were all standard [26.271etched tungsten or etched or cut Pt-Ir tips.

5.1. The STM tips

The tunnelling tips used in water and electrolyte hadto be partly covered by an insulator to prevent highFaradaic currents. For distilled water commerciallyavailable glass and cpoxy covered tips (LongreachScientific Resources Inc) were found to be suitable,The exposed area, however, gave Faradaic currents thatwere too large for proper operation in an electrolyte.Therefore a new method was used that gives a verysmall exposed area, The method is simple: first coverthe entire tip with a low viscous cyanoacrylate glue andthen use the STM to press the tip against a gold film untila tunnelling current is detected. These tips give a verysmall Faradaic current (less than 0.1 nA at 100 mV biasvoltage in I M KClj and are suitable for operation in anelectrolyte. These tips were used successfully to imagea gold tilm and a silver surface. A similar, but morecomplicated, method has been described by Heben et al[28]. They covered the tips by glass or polymer in aspecially designed apparatus.

5.2. Micropipettes

For operation in the SICM mode we used standardmicropipettes. which are used in measurements ofintracellular potentials and in the patch-clampingtechnique. The pipettes were fabricated in a commercialpipette puller. Capillary glass tubes (2 mm outerdiameter, I mm inner) are clamped at both ends andelectrically heated in the middle, the tube is then pulledaside giving two micropipettes. The aperture diameter ofa pipette was estimated by using a light microscope. Atypical aperture diameter was I !Lm and outer diameter21lm, The pipettes were filled with I M KCI by capillaryaction. The liquid cell was also tilled with I M KClto avoid concentration potentials. Reversible AglAgCIelectrodes were used as electrodes both in the pipettesand in the bath. Typical voltages and currents were100 mV and 100 nA.

6. Performance and discussion

We have used this microscope in the STM mode ina number of measurements, for example, on high­temperature superconductor (YBCO) thin films [29] andon oxidized titanium [30]. Characteristic features of themicroscope and measurements in the SICM mode arereported here.

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H Olin

Figure 6. A scanning tunnelling microscopy grey-scale picture of a laser-deposited high-temperaturesuperconductor YBa2Cu307_X thin film. The layeredstructure is visible, with unit cell steps (1.2 nm). The imagesize 100 nmx 100 nm.

6.1. Piezo calibration

We calibrated the piezo scanner in the lateral directionsby imaging graphite atom and in the z direction byimaging the layered structure of laser-deposited high­temperature superconducting YBCO thin films (figure 6).The motion ver us voltage in the vertical direction wa5 nm y-I and in the lateral directions 10 nm y-I.An additional lateral calibration wa done using agold grating, with a 200 nm lattice spacing, givingresult consistent with the graphite measurements.With micrometre- ized offset and scans, however, acon iderable amount of creep was pre ent. Creep anintrin ic property of the e piezo ceramics, i a lowadditional respon e after a voltage step and it continuesin a logarithmic way [31].

6.2. The inchworm motor

When the de ired tip po ilion is found using theinchwonn motor. the upper clamp i suppo ed to becJo ed a in figure 2(a). However when thi stop­clamping wa executed contact between tip and amplewa 10 t in almost all ca e. Till mean a movementof almost I /.Lm in the z direction. The reason forthis malfunction i probably that the tip is movedlaterally. This motion is much faster than the responseof the feedback y tern and a tip cra h is very probable.Therefore, the lOp possibility was eldom used. In teadLhe motor was tanding in the ready po tion and becau eof thi , the noi e in the expansion piezo of the motor(3 in figure 2) wa added to the other noise ources inthe microscope. To overcome this problem, a Ie s noisymotor driving electronics and a smoother clamping couldbe u ed [II].

982

Another way around the problem with the noisemotor is to use a different design of the head. The motorcould be used just to push and pull on a sliding part thatholds the piezo scanner. When the probe is properlypositioned the motor could be lightly retracted and thecontact between the motor and the liding part is broken.Similar de igns have been de cribed by, for example,Bando et at [14J. who used a differential crew as thepusher.

6.3. Instrument noise

The resonance frequency wa measured by exciting thepiezo in the positive x direction with a 10 V sine waveignal and measuring the voltage on the negative x

electrode. The frequency was increased until the piezostarted to resonante. This gave a resonance frequencyof 9.6 kHz. The mechanical noise level was measuredby making a spectrum analysis f the z voltage u inga cut Pt-Ir tip and a gold film as the sample and withthe damping box tanding on an ordinary table. Thetip bias wa 100 mY and the tunnelling current InA.The spectrum analy i program was written in LabView(National Instrument Inc). The noise was found to havea 1/f noi e and a white noi e contribution of about0.01 nm Hz- 1/ 2 . Thi noise level was lowered by about50% when the motor controller was turned off.

6.4. Acoustical noise

Acoustical noise uppres ion wa very high. Thetandard trick of clapping hand had no effect on the

tunnelling current, not even mu ical equipment playingat high volume showed any detectable effect.

We have obtained similar results with the sametechnique using a commercial microscope (Nanoscopeill, Digital Instrument ), which was sen itive to oundnoise. Thi box was larger (about 0.2 m3) and aless good ound ab orbing material (aluminium) wau ed. However the arne technique of di connectingthe microscope head from the walls, by hanging it inrubber bands inside the box, was used.

6.5. Thermal drift

Thennal drift in the z direction was measured by turningoff the driving electronics of the inchwonn motor andthen waiting for I h for the piezoelectric creep in theinchwonn and the piezo scanner to relax. The drift wasless than 0.1 nm min- J

• In one experiment, a gold filmwas investigated for 2 weeks without moving the motorat all. The lateral thermal dri ft was estimated by taking50 nm sized image of the gold film at 10 min interval .The drift was les than 0.1 nm min-I.

6.6. The 81eM

The dependence of conductance on distance in the SICM

had not been mea ured earlier. To measure this, thefeedback loop wa opened and the ion current wa

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Figure 7. Measurement of the ion current versus distancein the scanning ion conductance microscope, showing thelinear dependency, The high constant value is the bathvalue and the low constant value is a background currentwhen the tip is pressed into the sample (a leaf).

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1500 2000

Design of a scanning probe microscope

at [7]. The same group made more stable tips bymicrofabrication techniques, giving openings down to200 nm [32]. We are also working in this direction andhave, using another microfabrication technique, madepipettes with an aperture down to 100m. Work is inprogress to use them in this microscope.

7. Conclusion

A compact, cylindrically symmetric, scanning probemicroscope, with a high resonance frequency (9.6 kHz),low noise level (0.01 om Hz-I/2 at 10 Hz), low thermaldrift (less than 0.1 nm min-I) and high sound noisesuppression, has been constructed. A simple methodto make electrochemical tips, giving a Faradaic currentless than 0.1 nA, has been described,

Operation in the SICM mode was demonstrated, andthe distance-dependency of conductance in the SICM wasfound to be linear.

Acknowledgments

Figure 8. A scanning ion conductance microscopy line plotpicture of a leaf. The aperture diameter of the pipette usedwas 1 p.m, The scan size is 2.8 p.mx2.8 flm.

measured at 100 nm intervals by moving the sample (aleaf in this case) with the motor towards the tip. Theaperture of the pipette had an inner diameter of 1 ttm.The current was found to be linearly dependent on thedistance (figure 7). From the curve it is evident that themost distance-sensitive position of the current is wherethe current is about half the bath value (the value ofcurrent when the tip is far from the surface).

Figure 8 shows a SICM image, taken with a pipettewith an opening diameter of 1 p.m and with the currentset to half the bath value. The resolution of the SICM hasbeen estimated to be of the same order as the aperturediameter (7].

To increase the resolution in the SlCM the diameterof the aperture of the micropipette should be reduced,However, with decreased diameter the pipettes becomefragile and break easily as observed by Hansma et

I thank M Stenberg for close collaboration on the SICM

work. The work was supported by the Swedish Boardfor Industrial and Technical Development and by theTechnical Science Research Council.

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