depth profiling and morphological characterization of aln thin films deposited on si substrates...
DESCRIPTION
Authors: C. Macchi, J. Bürgi, J. García Molleja, S. Mariazzi, M. Piccoli, E. Bemporad, J. Feugeas, R.S. Brusa, A. Somoza. The European Physical Journal - Applied Physics (2014) 67: 21301 (August 1st, 2014) (Only the first page is uploaded because EDP Sciences' copyrigth policy)TRANSCRIPT
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