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CSC-211 Multifunction Protection IED Engineering and Operation Manual

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CSC-211

Multifunction Protection IED

Engineering and Operation

Manual

Version:V1.00

Doc. Code: 0SF.461.046(E)

Issued Date:2012.8

Copyright owner: Beijing Sifang Automation Co., Ltd

Note: The company keeps the right to perfect the instruction. If equipments do not agree with

the instruction at anywhere, please contact our company in time. We will provide you with

corresponding service.

® is registered trademark of Beijing Sifang Automation Co., Ltd.

We reserve all rights to this document, even in the event that a patent is issued and a different commercial proprietary right is registered. Improper use, in particular reproduction and dissemination to third parties, is not permitted.

This document has been carefully checked. If the user nevertheless detects any errors, he is asked to notify us as soon as possible.

The data contained in this manual is intended solely for the IED description and is not to be deemed to be a statement of guaranteed properties. In the interests of our customers, we constantly seek to ensure that our products are developed to the latest technological standards as a result it is possible that there may be some differences between the hardware/software product and this information product.

Manufacturer: Beijing Sifang Automation Co., Ltd.

Tel: +86 10 62962554, +86 10 62961515 ext. 8998 Fax: +86 10 82783625 Email: [email protected] Website: http://www.sf-auto.com

Add: No.9, Shangdi 4th Street, Haidian District, Beijing, P.R.C.100085

Preface

Purpose of this manual

This manual describes operation, installation, commissioning, protection test

and putting the IED into service. The manual includes the following chapters:

Introduction, this chapter presents the basic content and have a brief

introduction of this manual

Local human machine interface, this chapter presents the configuration

of HMI interface and how to use the HMI

Installing the IED, this chapter introduces the procedure to install IED and

how to check that the IED is properly connected to the protection system

Read and change setting, this chapter introduces how to read and

change the setting value via LHMI or software tool, and switch the setting

value group

Testing the communication connection and time synchronization, this

chapter presents how to test the communication port connection and

introduces how to test time synchronization

IED testing, this chapter contains that what should be tested and how to

test the IED

Operating maintenance, this chaper describes the items for maintenance

and how to maintain the IED when operating

Transportion and storage, this chapter presents how to transport and

store the IED

Appendix, this chapter presents the significant data and diagram of the

IED

Target audience

This manual mainly face to installation engineer, commissioning engineer and

operation engineer with perfessional electric and electrical knowledge, rich

experience in protection function, using protection IED, test IED, responsible

for the installation, commissioning, maintenance and taking the protection

IED in and out of normal service.

Applicability of this manual

This manual is valid for CSC-211 Multifunction Protection IED.

Technical support

In case of further questions concerning the CSC family, please contact Sifang

compay or your local Sifang representative.

Safety information

Strictly follow the company and international safety regulations.

Working in a high voltage environment requires serious approch to

aviod human injuries and damage to equipment

Do not touch any circuitry during operation. Potentially lethal

voltages and currents are present

Avoid to touching the circuitry when covers are removed. The IED

contains electirc circuits which can be damaged if exposed to static

electricity. Lethal high voltage circuits are also exposed when covers

are removed

Using the isolated test pins when measuring signals in open circuitry.

Potentially lethal voltages and currents are present

Never connect or disconnect wire and/or connector to or from IED

during normal operation. Dangerous voltages and currents are

present. Operation may be interrupted and IED and measuring

circuitry may be damaged

Always connect the IED to protective earth regardless of the

operating conditions. Operating the IED without proper earthing may

damage both IED and measuring circuitry and may cause injuries in

case of an accident.

Do not disconnect the secondary connection of current transformer

without short-circuiting the transformer’s secondary winding.

Operating a current transformer with the secondary winding open will

cause a high voltage that may damage the transformer and may

cause injuries to humans.

Do not remove the screw from a powered IED or from an IED

connected to power circuitry. Potentially lethal voltages and currents

are present

Using the certified conductive bags to transport PCBs (modules).

Handling modules with a conductive wrist strap connected to

protective earth and on an antistatic surface. Electrostatic discharge

may cause damage to the module due to electronic circuits are

sensitive to this phenomenon

Do not connect live wires to the IED, internal circuitry may be

damaged

When replacing modules using a conductive wrist strap connected to

protective earth. Electrostatic discharge may damage the modules

and IED circuitry

When installing and commissioning, take care to avoid electrical

shock if accessing wiring and connection IEDs

Changing the setting value group will inevitably change the IEDs

operation. Be careful and check regulations before making the

change

Contents

Chapter 1 IED Introduction ............................................................................................................... 1

Chapter 2 Local human machine interface .................................................................................... 3

1 Introduction ....................................................................................................................................... 4

2 Liquid crystal display (LCD) ........................................................................................................... 5

3 LED .................................................................................................................................................... 6

4 Keyboard ........................................................................................................................................... 7

5 IED menu .......................................................................................................................................... 8

5.1 Menu construction ........................................................................................................... 8

5.2 Operation status ............................................................................................................. 10

5.3 Operation configuration ................................................................................................ 10

5.4 Settings ........................................................................................................................... 10

5.5 Report .............................................................................................................................. 10

5.6 Communication configuration ...................................................................................... 11

5.7 Testing ............................................................................................................................. 11

5.8 Device setup ................................................................................................................... 11

5.9 Device information ......................................................................................................... 13

Chapter 3 Installing IED .................................................................................................................. 15

1 Unpacking and checking the IED ................................................................................................ 16

2 Installing the IED ............................................................................................................................ 17

3 IED connection ............................................................................................................................... 18

3.1 IED connector ................................................................................................................. 18

3.1.1 Introduction ............................................................................................................. 18

3.1.2 Terminals of Analogue Input Module (AIM) ........................................................ 19

3.1.3 Terminals of Fast binary Input & Output Module (FIO) .................................... 23

3.1.4 Terminals of Fast binary Output Module (FOM) ................................................ 24

3.1.5 Terminals of Binary Input & Output module (BIO)............................................. 25

3.1.6 Terminals of CPU module (CPU) ......................................................................... 26

3.1.7 Terminals of Power Supply Module (PSM) ........................................................ 27

3.1.8 RS232 port .............................................................................................................. 28

3.2 Connecting to protective earth ..................................................................................... 28

3.3 Connecting the power supply module ........................................................................ 28

3.4 Connecting to CT and VT circuits ............................................................................... 28

3.5 Connecting the binary inputs and outputs.................................................................. 28

3.6 Making the screen connection ..................................................................................... 29

3.7 RS485 and RS232 ports connection .......................................................................... 29

3.7.1 RS485 port connection ......................................................................................... 29

3.7.2 RS232 port connection ......................................................................................... 30

3.8 Connecting the GPS...................................................................................................... 30

4 Checking before energizing ......................................................................................................... 32

4.1 Introduction ..................................................................................................................... 32

4.2 Checking the protective earth connection ................................................................. 32

4.3 Checking the power supply connection ..................................................................... 32

4.4 Checking the CT and VT circuits connection ............................................................ 32

4.4.1 Checking the CT circuits connection .................................................................. 32

4.4.2 Checking the VT connection ................................................................................ 33

4.5 Checking the binary input and output connection .................................................... 33

4.5.1 Checking the binary input connection ................................................................ 33

4.5.2 Checking the binary output connection .............................................................. 34

4.6 Checking the screened cables connection ................................................................ 34

4.7 Checking the S485 and RS232 port connectios ....................................................... 34

4.7.1 Checking the RS485 port connection ................................................................. 34

4.7.2 Checking RS232 port connection ....................................................................... 34

4.8 Checking GPS connection ........................................................................................... 34

4.9 Checking the insulation voltage and insulation resistance ..................................... 34

4.9.1 Checking the insulation voltage .......................................................................... 34

4.9.2 Checking the insulation resistance ..................................................................... 35

5 Checking after energizing ............................................................................................................ 36

5.1 Introduction ..................................................................................................................... 36

5.2 Test LCD ......................................................................................................................... 36

5.3 Test the keyboard .......................................................................................................... 36

5.4 Setting the IED time ...................................................................................................... 36

5.5 Checking the software and hardware version ........................................................... 37

Chapter 4 Read and change setting ............................................................................................. 39

1 Read and change the setting vaule ............................................................................................ 40

1.1 Read and change the setting value via LHMI ........................................................... 40

1.1.1 Introduction ............................................................................................................. 40

1.1.2 Communication parameter ................................................................................... 40

1.1.3 Setting values, binary settings and soft connetors for protection function ... 41

2 Switching the setting group .......................................................................................................... 43

2.1 Introduction ..................................................................................................................... 43

2.2 Method for switching setting group via LHMI ............................................................ 43

2.3 Method for switching setting group via binary input ................................................. 43

Chapter 5 Testing the communication connection and time synchronization ......................... 45

1 Testing the communication connection ...................................................................................... 46

1.1 Testing the Ethernet communication .......................................................................... 46

1.1.1 Testing the electrical Ethernet communication ................................................. 46

1.1.2 Testing the optical Ethernet communication ...................................................... 46

1.2 Testing the RS485 port................................................................................................. 46

1.3 Testing the RS232 port................................................................................................. 46

2 Testing the time synchronization ................................................................................................. 48

2.1 Network mode ................................................................................................................ 48

2.2 IRIG-B mode .................................................................................................................. 48

Chapter 6 IED testing ...................................................................................................................... 49

1 Introduction ..................................................................................................................................... 50

2 Points for attention during testing................................................................................................ 52

3 Preparing for test ........................................................................................................................... 54

3.1 Introduction ..................................................................................................................... 54

3.2 Connecting test equipment to IED .............................................................................. 54

4 Testing the power supply .............................................................................................................. 56

4.1 Checking the self-startup performance ...................................................................... 56

4.2 DC power on and power off testing............................................................................. 56

4.3 Checking the expiry date of power supply ................................................................. 56

5 Checking the analog channel ...................................................................................................... 57

5.1 Checking and adjusting the zero drift ......................................................................... 57

5.2 Checking and calibrating .............................................................................................. 57

6 Testing binary input ....................................................................................................................... 59

7 Testing binary output ..................................................................................................................... 60

8 Verifying the IED functions ........................................................................................................... 61

8.1 Overcurrent protection .................................................................................................. 61

8.1.1 Verifying the settings ............................................................................................. 61

8.1.2 Completing the test ................................................................................................ 68

8.1.3 Reference setting list for test ............................................................................... 68

8.2 Earth fault protection ..................................................................................................... 70

8.2.1 Verifying the settings ............................................................................................. 70

8.2.2 Completing the test ................................................................................................ 76

8.2.3 Reference setting list for test ............................................................................... 76

8.3 Sensitive earth fault protection .................................................................................... 78

8.3.1 Verifying the settings ............................................................................................. 78

8.3.2 Completing the test ................................................................................................ 83

8.3.3 Reference setting list for test ............................................................................... 83

8.4 Negative sequence overcurrent protection ................................................................ 85

8.4.1 Verifying the settings ............................................................................................. 85

8.4.2 Completing the test ................................................................................................ 88

8.4.3 Reference setting list for test ............................................................................... 88

8.5 Switch-onto-fault protection .......................................................................................... 89

8.5.1 Verifying the settings ............................................................................................. 89

8.5.2 Completing the test ................................................................................................ 92

8.5.3 Reference setting list for test ............................................................................... 92

8.6 Overload protection ....................................................................................................... 92

8.6.1 Verifying the settings ............................................................................................. 93

8.6.2 Completing the test ................................................................................................ 95

8.6.3 Reference setting list for test ............................................................................... 95

8.7 Overvoltage protection .................................................................................................. 95

8.7.1 Verifying the settings ............................................................................................. 96

8.7.2 Completing the test .............................................................................................. 100

8.7.3 Reference setting list for test ............................................................................. 100

8.8 Undervoltage protection .............................................................................................. 101

8.8.1 Verifying the settings ........................................................................................... 101

8.8.2 Completing the test ............................................................................................. 107

8.8.3 Reference setting list for test ............................................................................. 107

8.9 Thermal overload protection ...................................................................................... 108

8.9.1 Verifying the settings ........................................................................................... 108

8.9.2 Completing the test ............................................................................................. 113

8.9.3 Reference setting list for test ............................................................................. 113

8.10 Displacement voltage protection ............................................................................... 114

8.10.1 Verifying the settings ........................................................................................... 114

8.10.2 Completing the test ............................................................................................. 117

8.10.3 Reference setting list for test ............................................................................. 118

8.11 Circuit breaker failure protection ............................................................................... 118

8.11.1 Verifying the settings of stage 1 of CBF protection ........................................ 119

8.11.2 Completing the test ............................................................................................. 122

8.11.3 Reference setting list for test ............................................................................. 123

8.12 Dead zone protection .................................................................................................. 123

8.12.1 Verifying the settings ........................................................................................... 124

8.12.2 Completing the test ............................................................................................. 125

8.12.3 Reference setting list for test ............................................................................. 125

8.13 Synchro-check and energizing check function ....................................................... 125

8.13.1 Verifying the settings ........................................................................................... 125

8.13.2 Completing the test ............................................................................................. 132

8.13.3 Reference setting list for test ............................................................................. 132

8.14 Auto-recloser ................................................................................................................ 134

8.14.1 Verifying the settings ........................................................................................... 134

8.14.2 Completing the test ............................................................................................. 134

8.14.3 Reference setting list for test ............................................................................. 135

8.15 Low(under) frequency load shedding protection .................................................... 137

8.15.1 Verifying the settings ........................................................................................... 137

8.15.2 Completing the test ............................................................................................. 141

8.15.3 Reference setting list for test ............................................................................. 141

8.16 Low voltage load shedding protection ...................................................................... 142

8.16.1 Verifying the settings ........................................................................................... 142

8.16.2 Completing the test ............................................................................................. 146

8.16.3 Reference setting list for test ............................................................................. 146

8.17 Overload load shedding protection ........................................................................... 147

8.17.1 Verifying the settings ........................................................................................... 147

8.17.2 Completing the test ............................................................................................. 150

8.17.3 Reference setting list for test ............................................................................. 151

8.18 Unbalance protection .................................................................................................. 151

8.18.1 Verifying the settings ........................................................................................... 152

8.18.2 Completing the test ............................................................................................. 155

8.18.3 Reference setting list for test ............................................................................. 155

8.19 Under current monitoring ........................................................................................... 156

8.19.1 Verifying the settings ........................................................................................... 156

8.19.2 Completing the test .............................................................................................. 158

8.19.3 Reference setting list for test ............................................................................. 158

8.20 Current overload monitoring....................................................................................... 158

8.20.1 Verifying the settings ........................................................................................... 158

8.20.2 Completing the test .............................................................................................. 161

8.20.3 Reference setting list for test ............................................................................. 161

8.21 Control circuit faulty supervising ................................................................................ 162

8.21.1 Verifying the settings ........................................................................................... 162

8.21.2 Completing the test .............................................................................................. 163

8.21.3 Reference setting list for test ............................................................................. 163

8.22 Current transformer secondary circuit supervision ................................................. 164

8.22.1 Verifying the settings ........................................................................................... 164

8.22.2 Completing the test .............................................................................................. 165

8.22.3 Reference setting list for test ............................................................................. 165

8.23 Voltage transformer secondary circuit supervision ................................................. 165

8.23.1 Verifying the settings ........................................................................................... 166

8.23.2 Completing the test .............................................................................................. 173

8.23.3 Reference setting list for test ............................................................................. 173

8.24 Monitoring function ...................................................................................................... 174

8.24.1 Auxiliary contact of circuit breaker monitoring ................................................. 174

9 Checking before operation ......................................................................................................... 176

9.1 Checking the LED ........................................................................................................ 176

9.2 Checking the display on LCD..................................................................................... 176

9.3 Checking the clock ...................................................................................................... 176

9.4 Checking the voltage and current ............................................................................. 176

9.5 Checking the setting group ........................................................................................ 176

9.6 Checking the setting .................................................................................................... 176

9.7 Checking the binary input ........................................................................................... 177

9.8 Checking the normal operation mode ....................................................................... 177

9.8.1 Trip and close test with the circuit breaker ....................................................... 177

9.9 Put into operation ......................................................................................................... 177

Chapter 7 Operating maintenance .............................................................................................. 179

1 Attentions during operating ........................................................................................................ 180

2 Routine checking ......................................................................................................................... 182

3 Periodical checking ..................................................................................................................... 183

4 The alarm information ................................................................................................................. 184

4.1 Alarm information class I and the description .......................................................... 184

4.2 Alarm information class II and the description for M1 ............................................ 184

Chapter 8 Transportation and storage ........................................................................................ 189

1 Transportion.................................................................................................................................. 190

2 Storage .......................................................................................................................................... 191

Chapter 9 Appendix ....................................................................................................................... 193

1 Arrangement diagram of modules ............................................................................................. 194

2 Typical diagram ............................................................................................................................ 195

错误!未找到引用源。 IED Introduction

1

Chapter 1 IED Introduction

About this chapter

This chapter presents the overview of the operation and

engineering about the IED.

错误!未找到引用源。 IED Introduction

2

The Human Machine Interface (HMI) on the IED provides an ideal

mechanism for the day to day operation and even advanced use of the IED.

The keyboard, LCD and LEDs on the front of the IED are what constitute the

HMI. Troubleshooting, monitoring, setting and configuring are all possible via

this interface. Through the screens and menu elements available, as well as

the keypad, the user is able to navigate throughout the menu structure and

move from screen to screen.

The IED is unpacked and visually checked. The connection to the protection

system has to be checked in order to verify that the installation is successful.

The settings for each function must be calculated before the commissioning

task. The functions setting menu have been listed in detail so that the user

can find and change the required settings directly and correctly. For the

different application, the IED can be performed conveniently through

switching the setting group.

For the functions included in the IED can be tested by users, the testing

procedure have been listed as reference to verify that protection function

operate correctly.

After the IED is in service, some checking items also need to be done for

maintenance in order to ensure that the IED is in good condition during

operation, some suggestions have been preset as reference and the user can

perform some other checking items according to the relevant regulations.

错误!未找到引用源。 Local human machine interface

3

Chapter 2 Local human machine

interface

About this chapter

This chapter describes the structure of human-machine

interface (HMI), LCD, LED, keyboard, RS232 and IED menu.

Instruction on how to operate with keys, how to configure the

LED and menu information introduction.

错误!未找到引用源。 Local human machine interface

4

1 Introduction

The HMI is simple and easy to be used for routine operation, the front panel

of the HMI consists of LCD, LED and keyboard. As shown in the following

picture, the setting, configuration, monitoring, maintenance and fault analysis

can be performed in HMI.

2

1

3

4

5 6

7

CSC-211

Figure 1 Front plate

1. Liquid crystal display (LCD)

2. LEDs

3. Arrow keys

4. Reset key

5. Quit key

6. Set key

7. RS232 communication port

错误!未找到引用源。 Local human machine interface

5

2 Liquid crystal display (LCD)

When operating keys are pressed or in the case of IED alarming or operating

report appearance, the back light will turn on automatically until the preset

time delay elapse after the latest operation or alarm.

错误!未找到引用源。 Local human machine interface

6

3 LED

There are 11 LEDs on the left side of the LCD. The definition for each LED is

shown as following table.

Table 1 HMI keys on the front of the IED

NO. Definition Color Explanation

1. Run/Alarm Green The IED operate nomally

Red The alarm is issued

2. OC Green The overcurrent protection is enabled

Red The overcurrent protection has operated

3. EF Green The earth fault protection is enabled

Red The earth fault protection has operated

4. SEF Green The sensitive earth fault protection is enabled

Red The sensitive earth fault protection has operated

5. NSOC

Green The negative sequence overcurrent protection is enabled

Red The negative sequence overcurrent protection has

operated

6. CBF/DZ

Green The circuit breaker failure or dead zone protection is

enabled

Red The circuit breaker failure or dead zone protection has

operated

7. Themal OL Green The thermal overload protection is enabled

Red The thermal overload protection has operated

8. 3V0 Green The displacement voltage protection is enabled

Red The displacement voltage protection has operated

9. OV/UV Green The overvoltage or undervoltage protection is enabled

Red The overvoltage or undervoltage protection has operated

10. Load SHED Green The load shedding protection is enabled

Red The load shedding protection has operated

11. AR/MC Green The autorecloser or manual reclose function is enabled

Red The autorecloser or manual reclose function has operated

错误!未找到引用源。 Local human machine interface

7

4 Keyboard

The keyboard is used to monitor and operate IED. The keyboard has the

same look and feel in CSC family. As shown in Figure 1, keyboard is divided

into Arrow keys, Reset key, Quit key and Set key. The specific instructions on

the keys as the following table described:

Table 2 HMI keys on the front of the IED

Key Function

Up arrow key Move up in menu

Page up between screens

Increase value in setting

Down arrow key Move down in menu

Page down between screens

Decrease value in setting

Left arrow key Move left in menu

Right arrow key Move Right in menu

Reset key Reset the LEDs

Return to normal scrolling display state directly

Set key Enter main menu or submenu

Confirm the setting change

Quit key Back to previous menu

Cancel the current operation and back to previous menu

Return to scrolling display state

Lock or unlock current display in the scrolling display state (the

lock state is indicated by a "solid diamond" type icon on the botton

right corner of the LCD)

错误!未找到引用源。 Local human machine interface

8

5 IED menu

5.1 Menu construction

OpStatus

OpConfig

Settings

Report

ComConf

Testing

DevSetup

DevInfo

Analog BI

Connect

GOOSEINF

Metering

Energy

Switch Time

Connect

Read Switch

Event

Remote

BO

BI

Zero

LED Test

Eth 1#

Operation

Version OpInfo

Serial

MainMenu

Eth 2#

Print

GOO Ctrl GOOSESUB

GOO Ctrl

Write Delete

Alarm Clear

Wave

Monitor

Label

Accuracy

TestMode

Metering

Module

Remote

SysParam Backlit

错误!未找到引用源。 Local human machine interface

9

Table 3 Full name for the menu

Sub-menu Full name Sub-sub menu Full name

OpStatus Operation status

Analog Analog

Metering Metering

Energy Energy

GOO Ctrl GOOSE control

BI Binary input

Connect Connector

GOOSEINF COOSE information

GOOSESUB GOOSE subscribe

OpConfig Operation

configuration

Switch Switch

Connect Connector

Time Time

GOO Ctrl GOOSE control

Settings Settings

Read Read

Write write

Switch Switch

Delete Delete

Report Report

Event Event

Alarm Alarm

Wave Wave

Operation Operation

Clear Clear

ComConf Communication

configuration

Eth 1# Ethernet port 1

Eth 2# Ethernet port 2

Monitor Monitor

Serial Serial port

Label Label

Testing Testing

BO Binary output

BI Binary input

LED Test LED Test

Accuracy Accuracy

Zero Zero drift

Remote Remote

TestMode Test mode

DevSetup Device setup

Module Module

Remote Remote

SysParam System parameter

Print Print

Metering Metering

Backlit Back light

DevInfo Device Version Version

错误!未找到引用源。 Local human machine interface

10

Sub-menu Full name Sub-sub menu Full name

information OpInfo Operation information

5.2 Operation status

Sub menu Sub-sub menu Explanation

OpConfig

Analog Read the analog input of the IED

Metering Read the measurement analog input of the IED

Energy Read the energy inputs of the IED

GOO Ctrl Read the status of the GOOSE connector

BI Read the status of binary inputs

Connect Read the status of the connector

GOOSEINF Read the transmission of the report

GOOSESUB Read the information of the GOOSE

5.3 Operation configuration

Sub menu Sub-sub menu Explanation

OpConfig

Switch Switching setting group

Connect Enable or disable the protection function

Time Setting the current time of the IED

GOO Ctrl Function related GOOSE ON/OFF

5.4 Settings

Sub menu Sub-sub menu Explanation

Settings

Read Read the settings

Write Set the settings

Switch Switch setting group

Delete Delete settings

5.5 Report

Sub menu Sub-sub menu Explanation

Report

Event Display latest 40 event records

Alarm Display latest 40 alarm records

Wave Display latest 10 recording wave

Operation Display latest 40 IED operation records

Clear Clear all history reports saved by the IED and delete

错误!未找到引用源。 Local human machine interface

11

Sub menu Sub-sub menu Explanation

unnecessary test records before IED operation.

5.6 Communication configuration

Sub menu Sub-sub menu Explanation

ComConf

Eth 1# Set Ethernet port 1 in CPU module.

Eth 2# Set Ethernet port 2 in CPU module.

Monitor Set parameter related BIO module

Serial Serial 1 is used for SIO in panel, serial 2 is used for 485

port in CPU module and Serial 3 is reserved for dual

485 CPU module.

Label Set IED address (hex), STA name and Bay name

5.7 Testing

Sub menu Sub-sub

menu

Sub-sub-sub

menu

Explanation

Testing

BO Test the binary outputs

BI Test the binary inputs

LED Test Test the panel LED

Accuracy Test the analog quantites precision and

linearity

Zero View the zero drift

Remote

Event Report event report to monitor and SCADA

Alarm Report alarm report to monitor and SCADA

Signal Report the virtual SOE event to the monitor

and SCADA

Metering Report virtual remote measurement

over-limit event to the monitor and SCADA

TestMode

The IED enters/exit test state, and it will not

send the event information to the local

monitor and remote communication under

the test state. The IED should exit the test

status after the test completed

5.8 Device setup

Sub menu Sub-sub

menu

Sub-sub-sub

menu

Explanation

错误!未找到引用源。 Local human machine interface

12

Sub menu Sub-sub

menu

Sub-sub-sub

menu

Explanation

DevSetup

Module

NetConf

Hardware support is necessary, the setup

must be consistent with the hardware, and

LON/485/Ethernet are optional

Connect

The default is the soft connector mode, for

soft and hard combined mode, only the

specific protection hard contact is provided,

the other protection hard connector starts up

by default

BIO BIO module setup depends on the practical

equipment

sql AI module setup depends on the practical

equipment

Remote

CSC2000 Setup of CSC2000 protocol, identify the communication requirement of this station and practical hardware configuration

Prot103

Setup of 103 protocol, identify the

communication requirement of this station

and practical hardware configuration

IEC61850

Setup of 61850 protocol, identify the

communication requirement of this station

and practical hardware configuration

Signal

Setup of signal, protocol version, report

parameter and time synchronization, identify

the external condition of this station

SysParam

Modify Setup of the related parameters for external

conditions

Default Load the default value when upgrade CPU

program

Print Set network printer address

Metering

Zero

Adjust the compensation coefficient of the

measurement module under the zero input

status

Scale Scale adjustment

Save Confirm and save zero setup and scale

setup

Reset

Clear the current memorized operation value

of the measurement module (power and

impulse counter)

Backlit

Set the back light to keep constant on or

automatically turn off when the keyboard is

free

错误!未找到引用源。 Local human machine interface

13

5.9 Device information

Sub menu Sub-sub

menu

Sub-sub-sub

menu

Explanation

DevInfo

Version

Display the version of protection program,

protection scheme, MMI program, and IED

firmware.

OpInfo

BIO Com Display operation statistical data of the BIO

communication.

MMI Display operation statistical data of the MMI

communication.

错误!未找到引用源。 Local human machine interface

14

错误!未找到引用源。 Installing IED

15

Chapter 3 Installing IED

About this chapter

This chapter describes how to install the protection IED,

introduces connection of the contactor, analogue quantities,

binary inputs and outputs and power supply, and what should to

do before and after energizing.

错误!未找到引用源。 Installing IED

16

1 Unpacking and checking the IED

Procedure:

1. Remove the transporting case

2. Visually inspect the IED

3. Check all items included in accordace with the delivery documents. Once

the IED has been started make sure that the software functions ordered

have been included in the delivery

4. Check for transport damages

If transport damage is discovered appropriate action must be taken

against the latest carrier and the latest SiFang office or representative

should be informed. If there are any discrepancies in relation to the

delivery documents, the SiFang company should be notified immediately

5. If the protection IED is repacked for transport again, the storage packing

of the IED must provide proper degree of protection against possible

damage, in accordance with the standard of IEC 60255-21-1 class 1 and

IEC 60255-21-2 class 1

错误!未找到引用源。 Installing IED

17

2 Installing the IED

Procedure:

1. Insert the IED into cabinet and the bottom of the IED should be supported

on the frame of cabinet

2. Fix the IED by tightening all screws against the cabinet. The IED should

be fixed in the cabinet and each screw should be firmed

3. Connect the earthing screw on the rear panel to the nearest protective

earthing point in the cubicle. The protective earth cables should be green

or yellow conductors with cross-sectional area 2.5mm2 according to

electrical regulations and electrical standards requirement

The cubicle must be properly connected to station earthing system, using

the conductor with cross-sectional area of at least 4mm2.

4. Power supply module connection

The wiring from the cubicle terminal block to the IED terminals must be

connected in accordance with the established guidelines for this type of

IED. The wires from binary inputs and outputs and the auxiliary power

supply must be routed separated from the current transformer cables

between the terminal blocks of the cubicle and the IEDs connections.

5. Connection to CT and VT circuits

CT and VT are connected to the analogue input module on the rear side

of the IED.

6. Connecting the binary input and output signals

Auxiliary power supply and binary input and output signals are connected

using female connectors. Signal wires are connected to a female

connector, which is then plugged into the corresponding male connector,

located at the rear of the IED.

错误!未找到引用源。 Installing IED

18

3 IED connection

3.1 IED connector

3.1.1 Introduction

The quantity and designation of connectors depend upon the ordering

information and application. The rear cover plates are prepared with enough

space for each configuration in ordering information.

错误!未找到引用源。 Installing IED

19

3.1.2 Terminals of Analogue Input Module (AIM)

A. Terminals of Analogue Input Module A series

I01

I02

I03

I04

I05

I06

I07

I08

I09

I10

I11

I12

Pro

tectio

nM

ete

rin

g

Figure 2 Terminals arrangement of AIM A

series

Table 4 Description of terminals of AIM A

series

Terminal Analogue

Input Remark

I01 I1 Star point

I02 I’1

I03 Null

I04 Null

I05 Null

I06 Null

I07 Null

I08 Null

I09 Null

I10 Null

I11 ImB Star point,

for metering

I12 I’mB For

metering

错误!未找到引用源。 Installing IED

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B. Terminals of Analogue Input Module B series

I01

I02

U03

U04

U05

U06

U07

U08

I09

I10

I11

I12

Pro

tectio

nM

ete

rin

g

Figure 3 Terminals arrangement of AIM B

series

Table 5 Description of terminals of AIM B

series

Terminal Analogue

Input Remark

I01 I1 Star point

I02 I’1

U03 UC1 Star point

U04 U’C1

U05 UC2 Star point

U06 U’C2

U07 UC3 Star point

U08 U’C3

I09 Null

I10 Null

I11 ImB Star point,

for metering

I12 I’mB For

metering

错误!未找到引用源。 Installing IED

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C. Terminals of Analogue Input Module C series

I01

I02

I03

I04

I05

I06

I07

I08

I09

I10

I11

I12

Pro

tection

Me

terin

g

Figure 4 Terminals arrangement of AIM C

series

Table 6 Description of terminals of AIM C

series

Terminal Analogue

Input Remark

I01 I1 Star point

I02 I’1

I03 IC1 Star point

I04 I’C1

I05 IC2 Star point

I06 I’C2

I07 IC3 Star point

I08 I’C3

I09 Null

I10 Null

I11 ImB Star point,

for metering

I12 I’mB For

metering

错误!未找到引用源。 Installing IED

22

D. Terminals of Analogue Input Module C series

I01

I02

I03

I04

I05

I06

I07

I08

I09

I10

I11

I12

U01

U02

U03

U04

U05

U06

Pro

tectio

nM

ete

rin

g3

Ph

vo

lta

ge

1P

h v

olta

ge

Figure 5 Terminals arrangement of AIM D

series

Table 7 Description of terminals AIM D-1 of

AIM D series

Terminal Analogue

Input Remark

I01 IA Star point

I02 I’A

I03 IB Star point

I04 I’B

I05 IC Star point

I06 I’C

I07 I0 Star point

I08 I’0

I09 ImA Star point

For metering

I10 I’mA For metering

I11 ImC Star point For

metering

I12 I’mC For metering

Table 8 Description of terminals AIM D-2 of

AIM D series

Terminal Definition Remark

U01 UA Star point

U02 UB Star point

U03 UC Star point

U04 UN

U05 U4 Star point

U06 U’4

错误!未找到引用源。 Installing IED

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3.1.3 Terminals of Fast binary Input & Output Module (FIO)

01

02

03

05

06

07

08

09

10

11

12

04

13

14

15

16

17

18

19

20

DC -

Relay 7

Relay 6

Relay 5

Relay 4

Relay 3

Relay 2

Relay 1

Bin

ary

in

pu

tsB

ina

ry o

utp

uts

Figure 6 Terminals arrangement of FIO

Table 9 Definition of terminals of FIO

Terminal Definition Output

relay

01 Binary input 1

02 Binary input 2

03 Binary input 3

04 Binary input 4

05

Common terminal

for all binary

inputs above,

connect with DC

negative terminal

06 Null

07 Trip contact 1-1 Relay 1

08 Trip contact 1-0 Relay 1

09 Trip contact 2-1 Relay 2

10 Trip contact 2-0 Relay 2

11 Trip contact 3-1 Relay 3

12 Trip contact 3-0 Relay 3

13 Trip contact 4-1 Relay 4

14 Trip contact 4-0 Relay 4

15 Trip contact 5-1 Relay 5

16 Trip contact 5-0 Relay 5

17 Trip contact 6-1 Relay 6

18 Trip contact 6-0 Relay 6

19 Trip contact 7-1 Relay 7

20 Trip contact 7-0 Relay 7

错误!未找到引用源。 Installing IED

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3.1.4 Terminals of Fast binary Output Module (FOM)

Relay 5

Relay 4

Relay 3

Relay 2

Relay 1

06

07

08

09

10

11

12

13

14

15

16

17

18

19

20

01

02

03

04

05

Bin

ary

ou

tpu

ts

Figure 7 Terminals arrangement of FOM

Table 10 Definition of terminals of FOM

Terminal Definition Output

relay

01 Trip contact 1-1-1 Relay 1

02 Trip contact 1-1-0 Relay 1

03 Trip contact 1-2-1 Relay 1

04 Trip contact 1-2-0 Relay 1

05 Trip contact 2-1-1 Relay 2

06 Trip contact 2-1-0 Relay 2

07 Trip contact 2-2-1 Relay 2

08 Trip contact 2-2-0 Relay 2

09 Trip contact 3-1-1 Relay 3

10 Trip contact 3-1-0 Relay 3

11 Trip contact 3-2-1 Relay 3

12 Trip contact 3-2-0 Relay 3

13 Trip contact 4-1-1 Relay 4

14 Trip contact 4-1-0 Relay 4

15 Trip contact 4-2-1 Relay 4

16 Trip contact 4-2-0 Relay 4

17 Trip contact 5-1-1 Relay 5

18 Trip contact 5-1-0 Relay 5

19 Trip contact 5-2-1 Relay 5

20 Trip contact 5-2-0 Relay 5

错误!未找到引用源。 Installing IED

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3.1.5 Terminals of Binary Input & Output module (BIO)

08

09

10

11

12

13

14

15

16

17

18

19

Relay 1

Relay 2

Relay 3

Relay 4

Relay 5

Relay 6

Relay 7

Relay 8

Relay 9

01

02

03

05

04

DC -

06

07

20

21

22

Bin

ary

ou

tpu

tsB

ina

ry in

pu

ts

Figure 8 Terminals arrangement of BIO

Table 11 Definition of terminals of BIO

Terminal Definition Remark

01 Contact group 1-0 Common

terminal

02 Contact group 1-1 Relay 1

03 Contact group 1-2 Relay 2

04 Contact 2-0 Relay 3

05 Contact 2-1 Relay 3

06 Contact group 3-0 Common

terminal

07 Contact group 3-1 Relay 4

08 Contact group 3-2 Relay 5

09 Contact group 4-0 Common

terminal

10 Contact group 4-1 Relay 6

11 Contact group 4-2 Relay 7

12 Contact group 5-0 Common

terminal

13 Contact group 5-1 Relay 8

14 Contact group 5-2 Relay 9

15 Binary input 1

16 Binary input 2

17 Binary input 3

18 Binary input 4

19 Binary input 5

20 Binary input 6

21 Binary input 7

22

Common terminal

for all binary

inputs, connect

with AUX.DC

negative terminal

错误!未找到引用源。 Installing IED

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3.1.6 Terminals of CPU module (CPU)

Eth

ern

et p

ort

sC

OM

Tim

e

Syn

ch

roB

ina

ry in

pu

ts

01

02

03

05

06

07

08

09

10

04

11

12

Figure 9 Terminals arrangement of CPU

Table 12 Definition of terminals of CPU

Terminal Definition

01 Binary input 1

02 Binary input 2

03 Binary input 3

04 Binary input 4

05 Binary input 5

06 Binary input 6

07 Binary input 7

08

Common terminal for all

binary inputs above, connect

with DC -24V. terminal

09 Time synchronization

10 Time synchronization GND

11 RS485 port - 1B

12 RS485 port - 1A

Ethernet

Port A

Optional optical fiber or RJ45

port for station automation

system

Ethernet

Port B

Optional optical fiber or RJ45

port for station automation

system

错误!未找到引用源。 Installing IED

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3.1.7 Terminals of Power Supply Module (PSM)

01

02

03

05

06

07

08

09

10

11

12

04

13

14

15

16

17

18

19

20

DC

24V +

DC

24V -

DC+

input

DC -

Relay 1

Bin

ary

in

pu

tsD

C 2

4V

ou

tpu

tA

larm

Po

we

r in

pu

t

DC-

input

Figure 10 Terminals arrangement of PSM

Table 13 Definition of terminals of PSM

Terminal Definition

01 Binary input 1

02 Binary input 2

03 Binary input 3

04 Binary input 4

05 Binary input 5

06 Binary input 6

07 Binary input 7

08 Binary input 8

09 Binary input 9

10

Common terminal for all

binary inputs above, connect

with AUX.DC negative

terminal

11 AUX.DC 24V+ output

12 AUX.DC 24V- output

13 Alarm contact (NC) 0

14 Alarm contact (NC) 1

15 Isolated terminal, not wired

16 AUX. power input 1, DC +

17 Isolated terminal, not wired

18 AUX. power input 2, DC -

错误!未找到引用源。 Installing IED

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3.1.8 RS232 port

RS232 serial port is located on front panel, the software tool in PC can be

connected with the IED via this port to make setting, testing and cofiguration,

etc.

3.2 Connecting to protective earth

Connect the earthing screw on the rear panel to the nearest protective

earthing point in the cubicle. The protective earth cables should be green or

yellow conductors with cross-sectional area 2.5mm2 according to electrical

regulations and electrical standards requirement.

The cubicle must be properly connected to station earthing system, using the

conductor with cross-sectional area of at least 4mm2.

3.3 Connecting the power supply module

The wiring from the cubicle terminal block to the IED terminals must be

connected in accordance with the established guidelines for this type of IED.

The wires from binary inputs and outputs and the auxiliary power supply must

be routed separated from the current transformer cables between the terminal

blocks of the cubicle and the IEDs connections.

3.4 Connecting to CT and VT circuits

CT and VT are connected to the analogue input module on the rear side of

the IED.

Using solid conductor with cross-sectional 2.5-6mm2 (AWG14-10) or stranded

conductor with cross-sectional 2.5-4mm2 (AWG14-12). The screws used for

fixation conductor should be tightened.

3.5 Connecting the binary inputs and outputs

Auxiliary power supply and binary input and output signals are connected

using female connectors. Signal wires are connected to a female connector,

which is then plugged into the corresponding male connector, located at the

错误!未找到引用源。 Installing IED

29

rear of the IED.

Procedure:

1. Connect signals to the female connector

All wiring to the female connector should be done before it is plugged into

the male part and screwed to the case. The conductors can be of rigid

type (solid, stranded) or of flexible type.

The female connectors accept conductors with a cross section area of

0.2-1.5 mm2 (AWG 24-15). If two conductors are used in the same

terminal, the maximum permissible cross section area is 0.2-0.8 mm2

(AWG 24-18, each conductor corresponding to one cross section area).

If two conductors, each with area 1.5 mm2 (AWG 15) need to be

connected to the same terminal, a ferrule must be used to combine the

two conductors, no soldering is needed. Wires with a smaller gauge can

be inserted directly into the female connector receptacle and the

fastening screw shall be tightened.

2. Plug the connector to the corresponding back-side mounted male

connector

3. Lock the connector by fastening the lock screws

3.6 Making the screen connection

When using screened cables always make sure screens are earthed and

connected according to applicable engineering methods. This may include

checking for appropriate earth points near the IED, for instance, in the cubicle

and/or near the source of measuring. Ensure that earth connections are

made with short conductors of an adequate cross section, at least 6 mm2

(AWG10) for single screen connections.

3.7 RS485 and RS232 ports connection

3.7.1 RS485 port connection

The RS485 interface is capable of half-duplex service with the signals A/A'

and B/B' to transmit signals.

错误!未找到引用源。 Installing IED

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The network topology of RS485 adopts bus type of terminal matched, do not

support ring or star network. Use the single and continuous channel as bus.

The terminating resistance is located on beginning and terminal of the bus

cable. The other ports do not need the terminating resistance.

As shown in Figure 9, RS485 port located on the rear side of communication

module. The IED provides two electrical isolation RS485 ports, the two ports

can work at the same time with IEC60870-5-103 protocol supported.

3.7.2 RS232 port connection

One RS232 serial port is provided and located on front panel, which is used to

connect personal computer. The RS232 port adopts half-dupex

communication mode, usually which is connected with 9-pin D-subminiature

female connectors

Connection method: direction connection cable for serial port, the IED

terminal is pins and the PC termianl is female connector. The terminal of 2, 3,

4 and 5 is connected directly. As shown in the following picture:

Figure 11 Example for serial port connection

The line 4 must be connected directly

3.8 Connecting the GPS

Mount the GPS antenna on the building roof or the place of visibility to all

direction is obtained, top of the antenna should be horizontal. Mount the

antenna to console and fix the console on the building roof with expansion

bolts. The turning radius should not be too small when laying the cables. The

length of antenna cables is designed strictly based on antenna gain, so, it is

not allowed to lengthen, shorten or add connectors that will affect signal

reception or can't receive any signals.

错误!未找到引用源。 Installing IED

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The principle for mounting GPS antenna is that the position is visible

completely to all directions in 360°, however, for some special conditions,

mount the antenna at the place with best visibility as far as possible.

The GPS port is located on the rear side of communication module, as shown

in Figure 9, which can be connected with screened twist-pair cable.

错误!未找到引用源。 Installing IED

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4 Checking before energizing

4.1 Introduction

After completing the IED connections, the related connections need to be

checked, this section descirbes what should be checked before energizing.

This is done with IED and all connected circuits de-energized.

4.2 Checking the protective earth connection

Check the protective earthing connection of IED is connected reliably in

accordance with the related electrical regulations and standards.

4.3 Checking the power supply connection

Check that the auxiliary power supply voltage remains within the permissible

input voltage range under all operating conditions. Check that the polarity is

correct.

4.4 Checking the CT and VT circuits connection

4.4.1 Checking the CT circuits connection

Check that the wiring is in strict accordance with the supplied connection

diagram. If any errors appearance, do not continue before any errors are

corrected. The following tests shall be performed on every primary CT

connected to IED:

Primary injection test to verify the current change ratio of the CT, the

correct wiring up to the protection IED and correct phase sequence

connection (i.e. A, B, C)

Polarity checking to prove that the predicted direction of secondary

current flow is correct for a given direction of primary current flow

CT secondary loop resistance measurement in order to confirm that the

current transformer secondary loop DC resistance is within specification

and that there are no high resistance joints in the CT winding or wiring

错误!未找到引用源。 Installing IED

33

CT excitation test in order to confirm that the current transformer is of the

correct accuracy rating and that there are no shorted turns in the current

transformer windings. Manufacturer's design curves should be available

for the current transformer in order to compare the actual results

Check the earthing of the individual CT secondary circuits to verify that

each three-phase set of main CTs is properly connected to the station

earth and only at one electrical point

Checking the insulation resistance

Phase identification of CT shall be made

Both primary and secondary sides must be disconnected from the

line and IED when plotting the excitation characteristics

If the CT secondary circuit earth connection is removed without the

current transformer primary being de-energized, dangerous voltages

may result in the secondary CT circuits

4.4.2 Checking the VT connection

Check that the wiring is in strict accordance with the supplied connection

diagram. If any errors appearance, do not continue before any errors are

corrected.

The following tests are recommended:

Polarity check

VT circuit voltage measurement (primary injection test)

Grounding check

Phase relationship

Insulation resistance check

4.5 Checking the binary input and output connection

4.5.1 Checking the binary input connection

错误!未找到引用源。 Installing IED

34

When checking the binary inputs, it's better to disconnect the binary input

connector from binary input module. Check all connected signals in order to

make sure that both the input level and polarity of voltage are in accordance

with the IEDs specifications.

4.5.2 Checking the binary output connection

When checking the binary outputs, it's better to disconnect the binary output

connector from binary output module. Check all connected signals in order to

make sure that both the input level and polarity of voltage are in accordance

with the IEDs specifications.

4.6 Checking the screened cables connection

Check that the screened cables are connected correctly.

4.7 Checking the S485 and RS232 port connectios

4.7.1 Checking the RS485 port connection

Check that the RS485 port connections are correct.

4.7.2 Checking RS232 port connection

Check that the RS232 serial port connections are correct.

4.8 Checking GPS connection

Check that the GPS connections are correct.

4.9 Checking the insulation voltage and insulation

resistance

4.9.1 Checking the insulation voltage

错误!未找到引用源。 Installing IED

35

Using the withstand voltage tester to apply correspondung level voltage

between tested circuit and earth, and between circuits (e.g. 2000VAC

/2800VDC), lasting 1 min. No flashover and breakdown apperance, the

leakage current is less than 10mA.

4.9.2 Checking the insulation resistance

Using a rotating meter with 500V to test insulation resistance in turn between

analog circuits and earth, and the circuits to each other. Every resistance

must not be less than 100 MΩ. And the lasting time for resistance test is not

less than 5s to ensure that the value of insulation resistance is read in a

steady state.

错误!未找到引用源。 Installing IED

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5 Checking after energizing

5.1 Introduction

After completing of the external circuits connection, checking all connections

and energizing the IED, LCD and keyboard should be tested. Check that the

software version, serial number and the installed modules are in accordance

with ordering information. The IED time need to be set to ensure that the IED

time is synchronized with local time. The self-supervision function should also

be checked to verify that the IED operates properly.

5.2 Test LCD

After energizing the IED, the blue back light of LCD light up, operate the keys

to turn pages to check that the LCD display is correct.

5.3 Test the keyboard

All the keys on front panel including Arrow keys, Reset key, Set key and Quit

key can be operated to check that these keys satisfy with the correpsonding

function, the detail functions of each key are described in Table 2.

5.4 Setting the IED time

This procedure describes how to set the IED time from the local HMI.

1. Enter into the time setting menu: OpConfig/Time, press the Set button to

enter into the setting menu

2. Set the date and time

Use the Left and Right arrow buttons to move between the time and date

values (year, month, day, hours, minutes and seconds). Use the Up and

Down arrow buttons to change the value.

3. Confirm the setting

Press the Set button to set the data and clock to the new values.

错误!未找到引用源。 Installing IED

37

5.5 Checking the software and hardware version

Enter into menu: DevInfo/Version

Checking the software version: In this menu, to check the protection

programm and protection scheme and HMI program version.

Check the hardware version: In this menu, to check the equipment code.

错误!未找到引用源。 Installing IED

38

错误!未找到引用源。 Read and change setting

39

Chapter 4 Read and change setting

About this chapter

This chapter describes how to set and read the setting values

and parameters either through LHMI or software tool, and how

to switch the setting value group.

This chapter does not contain instructions on how to calculate

the setting value, for the detail setting calculation information

please refer to the Technical application manual.

错误!未找到引用源。 Read and change setting

40

1 Read and change the setting vaule

1.1 Read and change the setting value via LHMI

1.1.1 Introduction

All the function settings, binary settings and connectors can be read and set

through LHMI. The user can browse to the desired settings and enter into the

appropriate vaules. The parameters for each function can be found in the

LHMI. See the Technical applciation manual for a complete list of setting

parameters for each function.

1.1.2 Communication parameter

1.1.2.1 Ethernet address

Enter into menu: ComConf/Eth 1#

Enter into menu: ComConf/Eth 2#

The address of Ethernet port 1and Ethernet 2 can be modified in this setting.

1.1.2.2 BIO parameter

Enter into menu: ComConf/Monitor

The related parameter about BIO module can be modified in this setting.

1.1.2.3 Serial port parameter

Enter into menu: ComConf/Serial

In this menu, the parameter for RS232 and RS485 port can be set, such as

baud rate, transmission protocol, etc.

1.1.2.4 Label parameter

Enter into menu: ComConf/Label

In this menu, the LON address, STA name and Bay name can be set.

错误!未找到引用源。 Read and change setting

41

1.1.2.5 Time synchronization mode

Network mode

Enter into menu: DevSetup/Remote/Signal/SynType

The time synchronization mode can be changed into network time mode via

this setting.

IRIG-B Mode

Enter into menu: DevSetup/Remote/Signal/SynType

The time synchronization mode can be changed into IRIG-B time mode via

this setting.

1.1.3 Setting values, binary settings and soft connetors for

protection function

1.1.3.1 Protection setting

Enter into menu: Settings/Write/Select

The menu of protection setting is used to check and modify every function

setting, using left and right button to chose the vaule and the up and down

buttons are used to modify the value, the upper and lower limits of setting

value will be displayed when the cursor move to corresponding setting items.

1.1.3.2 Protection binary setting

Enter into menu: Settings/Write/Select

The protection binary settings are used to enable or disable each function.

Two ways for modifying the binary setting via LHMI:

1. Modify the value of hex format displayed in this menu to enable or disable

the corresponding function.

2. Press the right button for a while, the detail information for this binary

setting will be displayed, using up and down button to select the required

function and the left and right button to enable or disable this function.

错误!未找到引用源。 Read and change setting

42

1.1.3.3 Protection soft connector

Enter into menu: OpConfig/Connect

The protection soft connectors are used to enable or disable each function,

On means enable and Off means disable. Use the up and down button to

select the required connector and the left and right button to enable or disable

this function.

错误!未找到引用源。 Read and change setting

43

2 Switching the setting group

2.1 Introduction

There are 16 setting groups with same setting items in the IED, for each

group settings can be set and saved separately, the different setting groups

can be switched according to different application.

2.2 Method for switching setting group via LHMI

Enter into the menu: Settings/Switch

Enter into the menu: Opconfig/Switch

The current setting group number and the chosen setting group number are

displayed in the LCD, change the setting group number by up and down

button, comfirm the result by Set button after the setting group number is

chosen.

After setting group switching success, the information about switching

success will be reported.

Note: the functions are related with setting value, binary setting as well as

connector, so, the group number for setting value and connector should be

consistent in order to make sure the IED operate normally.

2.3 Method for switching setting group via binary

input

Enter into the menu: Settings/Switch

The binary setting "BI SetGrp Switch" in the menu described above is used

for switching setting group via binary input, when this binary setting is set to 1,

and the corresponding binary input is active, the setting group is switched

from group 1 to group 2. If the binary setting is set to 1 and the binary input is

inactive, the setting group is switched from group 2 to group 1.

Note: The method for swithing setting group via binary input is only available

for switching between group 1 and group2.

错误!未找到引用源。 Read and change setting

44

错误!未找到引用源。 Testing the communication

connection and time synchronization

45

Chapter 5 Testing the communication

connection and time

synchronization

About this chapter

This chapter describes how to test each communication port and

the function of time synchronization.

错误!未找到引用源。 Testing the communication connection and time synchronization

46

1 Testing the communication connection

1.1 Testing the Ethernet communication

1.1.1 Testing the electrical Ethernet communication

Connect the IED with automation system to check the connection is

successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the

simulation point information to automation system, check the information and

compare with IED information, if the automation system does not receive any

information or the information received is not true, check the automation

system configuration.

1.1.2 Testing the optical Ethernet communication

Connect the IED with automation system to check the connection is

successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the

simulation point information to automation system, check the information and

compare with IED information, if the automation system does not receive any

information or the information received is not true, check the automation

system configuration.

1.2 Testing the RS485 port

Connect the IED with automation system to check the connection is

successful, if connection fail, check the communication network.

If connection successes, in the menu: Testing/Remote/Signal, send the

simulation point information to automation system, check the information and

compare with IED information, if the automation system does not receive any

information or the information received is not true, check the automation

system configuration.

1.3 Testing the RS232 port

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47

Using the dedicated cable for serial port to connect the PC with IED, if

connection fail, check the corresponding configuration of IED is true or not. If

all configurations are true, and the connection is still unsuccessful, please

check the connection cable and communication port.

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2 Testing the time synchronization

2.1 Network mode

Select time synchronization mode:

DevSetup/Remote/Signal/SynType

Change the IED time to any other time

Wait for a period of time

Check that the IED time is changed automatically in accordance with time

synchronization source

2.2 IRIG-B mode

Select time synchronization mode:

DevSetup/Remote/Signal/SynType

Change the IED time to any other time

Wait for a period of time

Check that the IED time is changed automatically in accordance with time

synchronization source

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Chapter 6 IED testing

About this chapter

This chapter describes the method of hardware testing, such as

power supply, binary input and output, analog quantities and all

functions testing method and testing procedure.

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1 Introduction

IED test requirements:

Setting value list

The IED setting value must be completed before the testing can start.

Application configuration diagram

Terminal diagram

The terminal diagram and module arrangement diagram, available in the

Technical reference manual, is a general diagram of the IED. but note

that the same diagram is not always applicable to each specific delivery

(especially for the configuration of all the binary inputs and outputs).

Therefore, before testing, check that the available terminal diagram

corresponds to the IED.

Technical application maunal

The Technical application manual contains application and functionality

summaries, function block, logic diagram, input and output signals,

setting parameters and technical data sorted per function.

The three-phase test equipment

The test equipment should be able to provide a three-phase supply of

voltages and currents. The magnitude of voltage and current as well as

the phase angle between voltage and current must be variable. The

voltages and currents from the test equipment must be obtained from the

same source and they must have minimal harmonic content. If the test

equipment cannot indicate the phase angle, a separate phase-angle

measuring instrument is necessary.

Prepare the IED for test before testing a function. Consider the logic diagram

of the tested protection function when perform the test. All included functions

in the IED are tested according to the corresponding test instrunctions in this

chapter.

The response from a test can be viewed in different ways:

Binary output signals

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Display value in HMI

All setting groups that are used should be tested.

The IED is designed for a maximum continuous current of three

times the rated current

Please observe the measuring accuracy of the IED, the test

equipment and angular accuracy for both of them

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2 Points for attention during testing

Be familiar with the engineering drawings, engineering and operation

manual and technical application manual

Before testing, check that the short-circuited wire used to avoid CT

secondary circuit opening is connected correctly and firmly. The

short-circuited phenomenon of VT secondary circuit does not exist

It is allowed to plug-in and pull out each module after the power supply

disconnection. Aviod AC current circuit opened when plug in and pull out

the modules

Keep cleaning and pay attention to dust prevention for each module

Adoption the measure of the human body electrostatic grounding

prevention to make sure that the IED is not damaged by hunam

electrostatic

In principle, the electric iron can't be used in field, if the electric iron need

to be used for welding during testing, the welding can be performed after

the power disconnection or using the electric iron with earthed wire

During testing, do not insert the module into the wrong position. When

plug in and pull out the module apply appropriate force instead of

overexerting to avoid pins bending or damage the fastening components

of module

Short-circuited or disconnected terminals temporarily for checking, it

should be recorded one by one and return to original state after the

testing is completed

Using the electronic devices (e.g. oscillograph, etc.) with AC power

supply to measure the circuit parameters, the case of the device should

be earthed in the same grounding with protection IED cabinet

During testing, consider the safety measure between the IED and other

running equipment and the safety measure of related circuit between

external running equipment and the IED

During testing, if the current magnitude that is input into IED is large than

three times of rated current, it should be noticed that the time should not

be too long

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When energizing the IED in the first time, using multimeter to check the

power supply, the circuit of voltages and currents are connected correcly

to avoid short circuit or open circuit

Tighten all the screws of all terminals again for the new project in order to

prevent improper connection, and plug in and pull out all the modules

again to aovid the modules loosing result from operation or installation

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3 Preparing for test

3.1 Introduction

Please read the corresponding manuals that is provided by manufacturer

in detail before testing, try best to understand the basic operation,

protection principle and the relevant capabilities. If have any questions in

this procedure, please inquire the field service engineer or the technical

support engineer of SiFang.

All checking should be done before energizing, inspection well and no

damage on the surface, all modules are inserted firmly, the insulation of

the power circuit are satisfied the specified requirement.

Disconnect the external circuit before testing to avoid safety accident or

injuries to the human

If the modules are needed to be plugged in or pulled out, make sure that

the power is disconnected, and the measure of prevention electrostatic

should be done in order to avoid the damage to module or performance

degradation

The opened or short-circuited terminal temporarily should be recorded in

detail in order to return to original state reliably

3.2 Connecting test equipment to IED

Before testing, connect the test equipment according to the IED specific

connection diagram. Pay special attention to the correct connection of the

input and output current terminals. Check that the input and output logical

signals in the logic diagram for the function under test are connected to the

corresponding binary inputs and outputs of the IED. The testing connection

diagram is shown in Figure 12.

The user must verify that the connections are correct and the analog signals

are measured correctly after connection completed.

Procedure:

1. Inject a symmetrical three-phase current and voltage at rated value

2. Inject a phase-to-phase voltage and phase-to-phase current at rated

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value

3. Check that the magnitude and phasor of analog quantities displayed in

LHMI are in accordance with the input values

4. Inject an asymmetrical three-phase current and voltage at rated value in

two phases

5. Check that the magnitude and phasor of analog quantities displayed in

LHMI are in accordance with the input values

6. If the compared value is consistent, perform the testing, if the compared

value is different, check the analog circuit connections

IA

IB

IC

IN

UA

UB

UC

UN

IA

IB

IB

IN

UA

UB

UC

UN

I’A

I’B

I’C

I’N

Trip A

Trip B

Trip C

Tester IED

Figure 12 Testing connection diagram

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4 Testing the power supply

4.1 Checking the self-startup performance

Power on the IED, in order to check the self-startup performance of the IED,

energizing the IED with the voltage rised slowly from zero to 80% rated

voltage, at this time, observe the green “Run” LED on the front panel that

should be lighted continuously. After the DC power disappears, the normal

closed contact should be disconnected, which can be tested using the

multimeter, the contact is show in Figure 10.

4.2 DC power on and power off testing

Changing the DC power to 80% rated voltage, power off and power on the

power supply some times, the “Run” LED on the front panel should turn off

and turn on correspondingly. The normal closed contact should be in the “on”

or “off” state. The contact is show in Figure 10.

4.3 Checking the expiry date of power supply

When period checking, check the expiry date of the power supply module, if

the power supply module has been used more than 5 years, please replace it.

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5 Checking the analog channel

5.1 Checking and adjusting the zero drift

MainMenu/Testing/Zero

In this menu, the zero drift values of all analog channels have been listed in

detail, check that the zero drift is met the requirement. Generally, the

requirement of the current channels is <0.01In, the voltage channels is <0.5V.

If the zero drift value is not satisfied the requirement, adjust the corresponding

zero drift.

MainMenu/DevSetup/Zero

MainMenu/DevSetup/Save

It is allowed to check zero drift after energizing the IED for 5 minutes, when

adjusting the zero drift, disconnect electrical connection of the IED, test

equipment, standard source and external circuit, make sure that there are no

any inputs to analog terminals, select the menu and adjust zero drift. After

zero drift adjustment succeed, enter into the " Save " menu to complete the

adjustment.

5.2 Checking and calibrating

MainMenu/OpConfig/Analog

MainMenu/OpConfig/Metering

The analog quantities scale for protection function is not used to be adjusted,

the accuracy is guaranteed by hardware. For the scale adjustment, Only the

measurement channel is adjusted.

Before testing, disable all of the connectors and binary settings in order to

avoid the protection function startup or maloperation.

Using the test equipment with 0.1 grade, connect the voltages and currents of

test equipment to the corresponding input terminals to check the magnitude

and phase angle of voltage and current. The magnitude tolerance of IED

displaying value and external injected value should be less than ±2.5%

(phase voltage vaule tolerance <0.2V when voltage channel is 1V, zero

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sequence voltage tolerance <0.2V when voltage channel is 3V; current value

tolerance <0.02In when current channel is 0.08 In).

MainMenu/DevSetup/Scale

MainMenu/DevSetup/Save

Make sure that zero adjustment have been completed before scale

adjustment, and then inject rated voltage and current, after the standard

source output steadily, enter into the menu described above to adjust scale.

After scale adjustment succeed, enter into the " Save " menu to complete the

adjustment. And then check the measurement value, the accuracy

requirement is: tolerance of voltage and current should be less than ±0.2%

and tolerance of power should be less than ±0.5%.

Note: during testing, if the measuring tolerance of the analog quantities are

large than the required range, check that the testing connection, testing

method and external measurement meter is correct, the testing source has

not wave distortion, before all of the exteral equipments are checked, it

should not adjust or change the components of the IED immediately.

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6 Testing binary input

MainMenu/Testing/BI

Check the binary input status in this menu, all the binary input status should

be displayed as "empty circle" icon. Make sure that the circuit of binary input

is in good condition, the power of binary input have been connected (24V,

110V or 220V). Test the binary input one by one according to the engineering

drawing, the tested binary input status displayed in HMI should be displayed

as "solid circle" icon.

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7 Testing binary output

MainMenu/Test BO

Testing binary output in this menu to verify the correctness of signal circuit

and output circuit.

During testing the binary output, the corresponding relay contact operate, the

irrelevant contacts should not operate. Use the multimeter to measure the

corresponding output contacts of the tripping and signal.

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8 Verifying the IED functions

Procedure:

1. Enable the protection function binary setting via software tool or LHMI

2. Input the corresponding settings value via software tool or LHMI

3. Input the rated currents and voltages to make the IED operating

normally for 20s

4. Active the binary input for the corresponding protection function

5. Simulate the fault occurance

6. Observe the testing result

7. Stop the output from test equipment and restore to original state

8. Continue to test another function or complete the test

8.1 Overcurrent protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.1.1 Verifying the settings

8.1.1.1 Verifying the settings of stage 1 of overcurrent protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 14 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

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Test item Description

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 15 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.3 Verifying the direction angle setting

Table 16 Direction angle setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

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Test item Description

as 1

Settings/Write/Select/Ctr Word 1/OC1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: ±3° from operating boundary setting value

Fault current: 200% of the setting value

Fault voltage: 85% rated voltage

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

1.4 Verifying the low voltage setting

Table 17 Low voltage setting verifying

Test item Description

95% of the voltage blocking setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 V_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Phase-to-phase voltage value: 95% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 V_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A, instantanuous

Phase-to-phase voltage value: 105% of setting value

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Test item Description

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.5 Verifying the inrush restraint setting

Table 18 Inrush restraint setting verifying

Test item Description

95% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 95% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 105% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

Table 19 Cross-blocking setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

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Test item Description

as 1

Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Harmonic phase: phase B or phase C

Ratio of I2/I1: 200% of the setting value

Fault current: 200% of the setting value

Cross-blocking time: the same as setting value

Fault time: longer than (cross-blocking time + operate setting value)

Test result

The corresponding output contacts should be closed, the operate

time meet the requirement of technical data (cross-blocking time +

operate time)

Table 20 The maximum inrush current setting verifying

Test item Description

95% of the maximum inrush current restraint setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 200% of the setting value

Fault current: 95% of the maximum inrush current restraint setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

105% of the maximum inrush current restraint setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/OC1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A, instantanuous

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Test item Description

Ratio of I2/I1: 200% of the setting value

Fault current: 105% of the maximum inrush current restraint setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.1.1.2 Verifying the settings of stage 2 of overcurrent protection

The test method and test items of verifying the stage 2 of overcurrent

portection are same as stage 1, only need to change the corresponding test

conditions and settings into the conrresponding stage 2 required.

8.1.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 21 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 22 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OC Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/OC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result

The corresponding output contacts should be closed, the operate

time meet the requirement of calculated by inverse time stage

equation of technical data

Table 23 Inverse time stage characteristic

Inverse time stage characteristic

IEC

Normal inverse

Very inverse

Extremely inverse

Long inverse

ANSI

Normal Inverse

Short inverse

Long inverse

Moderately inverse

Very inverse

Extremely inverse

Definite inverse

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Inverse time stage characteristic

User-defined characteristic

Time factor of inverse time, A

Delay of inverse time, B

Index of inverse time, P

Set time Multiplier for step n: k

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time

stage are same as phase A, only need to change the corresponding test

conditions and settings into the conrresponding other phase required.

8.1.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.1.3 Reference setting list for test

Table 24 Overcurrent protection connector list

NO. Default Abbr. Explanation

1. On Func_OC1 Enable or disable the stage 1 of overcurrent protection

2. On Func_OC2 Enable or disable the stage 2 of overcurrent protection

3. On Func_OC Inv Enable or disable the inverse time stage of overcurrent

protection

Table 25 Overcurrent protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_OC1 Current setting for stage 1 A 0.05In 20.00In

2. 0.4 T_OC1 Time setting for stage 1 S 0.00 60.00

3. 1.5In I_OC2 Current setting for stage 2 A 0.05In 20.00In

4. 0.1 T_OC2 Time setting for stage 2 S 0.00 60.00

5. 90.0 U_OC_UnBlk Low voltage setting for V 1.00 120.0

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NO. Default Abbr. Explanation Unit Min. Max.

blocking overcurrent

protection

6. 0.5In I_OC Inv Current setting for inverse

time stage A 0.05In 20.00In

7. 0.056 AK_OC Inv Time factor for inverse time

stage S 0.001 1000

8. 0.02 P_OC Inv Index for inverse time stage 0.01 10.00

9. 0 BK_OC Inv Delay time for inverse time

stage S 0.00 60.00

10. 30 Angle_OC Direction characteristic angle degree 0.00 90.00

11. In I_2H_UnBlk Maximum inrush current

setting A 0.25In 20.00In

12. 0.15 Ratio_I2/I1

Ratio for second harmonic

current to fundamental

component

0.07 0.50

13. 0.2 T2h_Cross_Blk Time setting for

cross-blocking function S 0.00 60.00

Table 26 Overcurrent protection binary setting list

Bit Default “0” “1” Explanation

1.0 1 OC1 Dir Off OC1 Dir On Enable or disable the direction

for stage 1

1.1 1 OC1 V_Blk Off OC1_V Blk On Enable or disable the low

voltage blocking for stage 1

1.2 1 OC1 2H_Blk Off OC1 2H_Blk On Enable or disable the inrush

restraint for stage 1

1.3 1 OC2 Dir Off OC2 Dir On Enable or disable the direction

for stage 2

1.4 1 OC2 V_Blk Off OC2 V_Blk On Enable or disable the low

voltage blocking for stage 2

1.5 1 OC2 2H_Blk Off C2 2H_Blk On Enable or disable the inrush

restraint for stage 2

1.6 1 OC Inv Dir Off OC Inv Dir On Enable or disable the direction

for inverse stage

1.7 1 OCInv 2H_Blk Off OCInv 2H_Blk On Enable or disable the inrush

restraint for inverse stage

2.9 0 3Ph V Connect 1Ph V Connect Select voltage connection way

by single phase or three phase

2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail Enable the function of VT fail

blocking

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Bit Default “0” “1” Explanation

4.0 1 OC1 Alarm OC1 Trip Stage 1 of overcurrent

protection alarm or trip

4.1 1 OC Inv Alarm OC Inv Trip Inverse stage of overcurrent

protection alarm or trip

8.2 Earth fault protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.2.1 Verifying the settings

8.2.1.1 Verifying the settings of stage 1 of earth fault protection

1 Verifying the phase A setting

1.1 Verifying the zero-sequence current setting

Table 27 Zero-sequence current setting verifying

Test item Description

105% of the zero-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the zero-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A, instantanuous

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Test item Description

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 28 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.3 Verifying the direction angle setting

Table 29 Zero-sequence direction angle setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 Dir, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: ±3° from operating boundary setting value

Zero sequence current: 200% of the setting value

Zero sequence voltage: 85% rated voltage

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

Table 30 Negative-sequence direction angle setting verifying

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Test item Description

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 Dir, set the binary setting as

1

Settings/Write/Select/Ctr Word 1/EF U2/I2 Dir, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: ±3° from operating boundary setting value

Negative sequence current: 200% of the setting value

Zero sequence voltage: 0 V

Negative sequence voltage: 85% rated voltage

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

1.4 Verifying the inrush restraint setting

Table 31 Inrush restraint I2/I1 setting verifying

Test item Description

95% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 95% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

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Test item Description

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 105% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

Table 32 Inrush restraint I02/I01 setting verifying

Test item Description

95% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I02/I01: 95% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the inrush restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I02/I01: 105% of setting value

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

Table 33 The maximum inrush current setting verifying

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Test item Description

95% of the maximum inrush current restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 200% of the setting value

Fault current: 95% of the maximum inrush current restraint setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

105% of the maximum inrush current restraint setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/EF1 2H_Blk, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Ratio of I2/I1: 200% of the setting value

Fault current: 105% of the maximum inrush current restraint setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.2.1.2 Verifying the settings of stage 2 of earth fault protection

The test method and test items of verifying the stage 2 of earth fault

portection are same as stage 1, only need to change the corresponding test

conditions and settings into the conrresponding stage 2 required.

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8.2.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 34 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_EF Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_EF Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 35 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_EF Inv, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/EF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A

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Test item Description

Fault current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result

The corresponding output contacts should be closed, the operate

time meet the requirement of calculated by inverse time stage

equation of technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time

stage are same as phase A, only need to change the corresponding test

conditions and settings into the conrresponding other phase required.

8.2.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.2.3 Reference setting list for test

Table 36 Earth fault protection connector list

NO. Default Abbr. Explanation

1. On Func_EF1 Enable or disable the stage 1 of earth fault

protection

2. On Func_EF2 Enable or disable the stage 2 of earth fault

protection

3. On Func_EF Inv Enable or disable the inverse time stage of earth

fault protection

Table 37 Earth fault protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In 3I0_EF1 Zero-sequence current

setting for stage 1 A 0.05In 20.00In

2. 0.4 T_EF1 Time delay for stage 1 S 0.00 60.00

3. 1.5In 3I0_EF2 Zero-sequence current

setting for stage 2 A 0.05In 20.00In

4. 0.1 T_EF2 Delay time for stage 2 S 0.00 60.00

5. 0.5In 3I0_EF Inv

Zero-sequence current

setting for inverse time

stage

A 0.05In 20.00In

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NO. Default Abbr. Explanation Unit Min. Max.

6. 12 AK_EF Inv Time factor for inverse

time stage S 0.001 1000

7. 1 P_EF Inv Index for inverse time

stage 0.01 10.00

8. 0 BK_EF Inv Delay time for inverse

time stage S 0.000 60.00

9. 30 Angle_EF Characteristic angle for

zero-sequence direction degree 0.00 90.00

10. 30 Angle_Neg

Characteristic angle for

negative-sequence

direction

degree 0.00 90.00

11. In I_2H_UnBlk Maximum inrush phase

current setting A 0.25In 20.00In

12. In 3I0_2H_UnBlk

Maximum inrush zero

sequence current

setting

A 0.25In 20.00In

13. 0.15 Ratio I2/I1

Ratio for second

harmonic current to

fundamental component

0.07 0.50

14. 0.15 Ratio I02/I01

Ratio for zero sequence

second harmonic

current to zero

sequence fundamental

component

0.07 0.50

Table 38 Earth fault protection binary setting list

Bit Default “0” “1” Explanation

1.8 1 EF1 Dir Off EF1 Dir On Enable or disable the

direction for stage 1

1.9 1 EF1 2H_Blk Off EF1 2H_Blk On Enable or disable the inrush

restraint for stage 1

1.10 1 EF2 Dir Off EF2 Dir On Enable or disable the

direction for stage 2

1.11 1 EF2 2H_Blk Off EF2 2H_Blk On Enable or disable the inrush

restraint for stage 2

1.12 1 EF Inv Dir Off EF Inv Dir On Enable or disable the

direction for inverse stage

1.13 1 EFInv 2H_Blk Off EFInv 2H_Blk On Enable or disable the inrush

restraint for inverse stage

1.14 1 EF Chk I2/I1 EF Chk I02/I01 Enable or disable inrush

restraint by I2/I1 or I02/I01

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Bit Default “0” “1” Explanation

1.15 0 EF U2/I2 Dir Off EF U2/I2 Dir On Enable or disable the

negative sequence direction

2.7 0 3I0 Measured 3I0 Calculated 3I0 measured or calculated

2.8 1 3U0 Measured 3U0 Calculated 3U0 measured or calculated

2.11 0 Blk EF_CT Fail UnBlk EF_CT Fail Enable or disable the function

of CT fail blocking

2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail Enable or disable the function

of VT fail blocking

4.2 1 EF1 Alarm EF1 Trip Stage 1 of overcurrent

protection alarm or trip

4.3 1 EF Inv Alarm EF Inv Trip Inverse stage of overcurrent

protection alarm or trip

8.3 Sensitive earth fault protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.3.1 Verifying the settings

8.3.1.1 Verifying the settings of sensitive earth fault protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 39 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_SEF1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Sensitive current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

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Test item Description

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_SEF1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Sensitive current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 40 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_SEF1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Sensitive current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.3 Verifying the direction setting

1.3.1 U0/I0-Φ measurement

Table 41 Direction angle setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_SEF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: ±3° from operating boundary setting value

Sensitive current: 200% of the setting value

Zero sequence voltage: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

Table 42 Displacement voltage setting verifying

Test item Description

105% of the displacement voltage setting verifying

Binary setting

OpConfig/Connect/Func_SEF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: same as default setting in setting list

Sensitive current: 200% of the setting value

Zero sequence voltage: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the displacement voltage setting verifying

Binary setting

OpConfig/Connect/Func_SEF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

Direction angle: same as default setting in setting list

Sensitive current: 200% of the setting value

Zero sequence voltage: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.3.2 CosΦ measurement

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Table 43 Direction angle setting verifying

Test item Description

105% of the IsCosΦ setting value

Binary setting

OpConfig/Connect/Func_SEF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

IsCosΦ value: 105% of the setting value

Sensitive current: 200% of the setting value

Zero sequence voltage: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the IsCosΦ setting value

Binary setting

OpConfig/Connect/Func_SEF1, set the connecotr as "On"

Settings/Write/Select/Ctr Word 4/SEF1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 1/SEF1 Dir, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous, forward direction

IsCosΦ value: 95% of the setting value

Sensitive current: 200% of the setting value

Zero sequence voltage: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.3.1.2 Verifying the settings of stage 2 of sensitive earth fault protection

The test method and test items of verifying the stage 2 of sensitive earth fault

portection are same as stage 1, only need to change the corresponding test

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conditions and settings into the conrresponding stage 2 required.

8.3.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 44 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_SEF Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Sensitive current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_SEF Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Sensitive current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the current setting

Table 45 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_SEF Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/SEF Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input None

Fault simulation

Fault type: phase A

Sensitive current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result

The corresponding output contacts should be closed, the operate

time meet the requirement of calculated by inverse time stage

equation of technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time

stage are same as phase A, only need to change the corresponding test

conditions and settings into the conrresponding other phase required.

8.3.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.3.3 Reference setting list for test

Table 46 Sensitive earth fault protection connector list

NO. Default Abbr. Explanation

1. On Func_SEF1 Enable or disable the stage 1 of sensitive earth fault

protection

2. On Func_SEF2 Enable or disable the stage 2 of sensitive earth fault

protection

3. On Func_SEF Inv Enable or disable the inverse time stage of sensitive

earth fault protection

Table 47 Sensitive earth fault protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_SEF1 Sensitive current

setting for stage 1 A

0.005

(SEF)

0.05In

(Normal)

1.00

(SEF)

20.00In

(Normal)

2. 0.4 T_SEF1 Time delay for stage 1 S 0.00 60.00

3. 1.5In I_SEF2 Sensitive current A 0.005

(SEF)

1.00

(SEF)

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NO. Default Abbr. Explanation Unit Min. Max.

setting for stage 2 0.05In

(Normal)

20.00In

(Normal)

4. 0.1 T_SEF2 Time delay for stage 2 S 0.00 60.00

5. 0.5In I_SEF Inv

Sensitive current

setting for inverse

stage

A

0.005

(SEF)

0.05In

(Normal)

1.00

(SEF)

20.00In

(Normal)

6. 12 AK_SEF Inv Time factor for inverse

time stage S 0.001 1000

7. 1 P_SEF Inv Index for inverse time

stage 0.01 10.00

8. 0 BK_SEF Inv Delay time for inverse

time stage S 0.000 60.00

9. 30 Angle_SEF

Characteristic angle

for U0/I0-Φ

measurement

degree 0.00 90.00

10. 0.01 IsCOS_SEF

Sensitve current for

direction determination

of IsCosΦ

measurement

A 0.005 1.00

11. 20 U_3V01

Displacement voltage

for stage 1 of

displacement voltage

protection

V 2.00 100.0

Table 48 Sensitive earth fault protection binary setting list

Bit Default “0” “1” Explanation

2.1 1 SEF1 Dir Off SEF1 Dir On Enable or disable the

direction for stage 1

2.2 1 SEF2 Dir Off SEF2 Dir On Enable or disable the

direction for stage 2

2.3 1 SEF Inv Dir Off SEF Inv Dir On Enable or disable the

direction for inverse stage

2.4 1 SEF Chk Iscos SEF Chk U0/I0

Direction determination by

U0/I0-Φ measurement or

IsCosΦ measurement

2.8 1 3U0 Measured 3U0 Calculated 3U0 measured or calculated

2.14 1 UnBlk Fun_VT Fail Blk Fun_VT Fail Enable or disable the function

of VT fail blocking

4.4 1 SEF1 Alarm SEF1 Trip Stage 1 of sensitive earth

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Bit Default “0” “1” Explanation

fault protection alarm or trip

4.5 1 SEF2 Alarm SEF2 Trip Stage 2 of sensitive earth

fault protection alarm or trip

4.6 1 SEF Inv Alarm SEF Inv Trip

Inverse stage of sensitive

earth fault protection alarm or

trip

8.4 Negative sequence overcurrent protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.4.1 Verifying the settings

8.4.1.1 Verifying the settings of negative sequence overcurrent

protection

1 Verifying the phase A setting

1.1 Verifying the negative sequence current setting

Table 49 Negative sequence current setting verifying

Test item Description

105% of the negative sequence current setting verifying

Binary setting

OpConfig/Connect/Func_NSOC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the negative sequence current setting verifying

Binary setting

OpConfig/Connect/Func_NSOC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

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Test item Description

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 50 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_NSOC1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC1 Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.4.1.2 Verifying the settings of stage 2 of negative sequence overcurrent

protection

The test method and test items of verifying the stage 2 of negative sequence

overcurrent portection are same as stage 1, only need to change the

corresponding test conditions and settings into the conrresponding stage 2

required.

8.4.1.3 Verifying the settings of inverse time stage

1 Verifying the phase A setting

1.1 Verifying the current setting

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Table 51 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_NSOC Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_NSOC Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 52 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_NSOC Inv, set the connector as "On"

Settings/Write/Select/Ctr Word 4/NSOC Inv Trip, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result

The corresponding output contacts should be closed, the operate

time meet the requirement of calculated by inverse time stage

equation of technical data

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2 Verifying the settings of other phase

The test method and test items of verifying the other phase of inverse time

stage are same as phase A, only need to change the corresponding test

conditions and settings into the other phase required.

8.4.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.4.3 Reference setting list for test

Table 53 Negative sequence overcurrent protection connector list

NO. Default Abbr. Explanation

1. On Func_NSOC1 Enable or disable the stage 1 of negative sequence

protection

2. On Func_NSOC2 Enable or disable the stage 2 of negative sequence

protection

3. On Func_NSOC Inv Enable or disable the inverse time stage of negative

sequence protection

Table 54 Negative sequence overcurrent protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In 3I2_NSOC1 Negative sequence current

setting for stage 1 A 0.05In 20.00In

2. 0.4 T_NSOC1 Time delay for stage 1 S 0.00 60.00

3. 1.5In 3I2_NSOC2 Negative sequence current

setting for stage 2 A 0.05In 20.00In

4. 0.1 T_NSOC2 Time delay for stage 2 S 0.00 60.00

5. 0.5In 3I2_NSOC Inv Negative sequence current

setting for inverse stage A 0.05In 20.00In

6. 0.056 AK_NSOC Inv Time factor for inverse time

stage S 0.001 1000

7. 0.02 P_NSOC Inv Index for inverse time stage 0.01 10.00

8. 0 BK_NSOC Inv Delay time for inverse time

stage S 0.000 60.00

Table 55 Negative sequence overcurrent protection binary setting list

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Bit Default “0” “1” Explanation

4.7 1 NSOC1 Alarm NSOC1 Trip

Stage 1 of negative sequence

overcurrent protection alarm

or trip

4.8 1 NSOC Inv Alarm NSOC Inv Trip

Inverse stage of negative

sequence overcurrent

protection alarm or trip

8.5 Switch-onto-fault protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.5.1 Verifying the settings

8.5.1.1 Verifying the overcurrent element of switch-onto-fault protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 56 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

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Test item Description

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

1.2 Verifying the time setting

Table 57 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OC1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

Settings/Write/Select/Ctr Word 4/OC1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, the operate

time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.5.1.2 Verifying the earth fault element of switch-onto-fault protection

1 Verifying the phase A setting

1.1 Verifying the zero-sequencecurrent setting

Table 58 Current setting verifying

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Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_EF1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

1.2 Verifying the time setting

Table 59 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_EF1, set the connector as "On"

Settings/Write/Select/Ctr Word 2/SOFT On, set the binary setting

as 1

Settings/Write/Select/Ctr Word 4/EF1 Trip, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of manual reclosure

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

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Test item Description

Test result The corresponding output contacts should be closed, the operate

time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.5.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.5.3 Reference setting list for test

Table 60 SOFT protection connector list

NO. Default Abbr. Explanation

1. On Func_OC1 Enable or disable the stage 1 of overcurrent protection

2. On Func_EF1 Enable or disable the stage 1 of earth fault protection

Table 61 SOTF protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_OC1 Current setting for stage 1 A 0.05In 20.00In

2. In 3I0_EF1 Zero-sequence current setting

for stage 1 A 0.05In 20.00In

Table 62 SOTF protection binary setting list

Bit Default “0” “1” Explanation

2.0 0 SOTF Off SOTF On Enable or disable the SOFT

protection

8.6 Overload protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

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8.6.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 63 Current setting for trip verifying

Test item Description

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

Table 64 Current setting for alarm verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The alarm should be issued

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Test item Description

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The alarm should not be issued

1.2 Verifying the time setting

Table 65 Time setting for trip verifying

Test item Description

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the alarm

time meet the requirement in technical data

Table 66 Time setting for alarm verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the setting value

Test result The alarm should be issued, and the alarm time meet the

requirement in technical data

2 Verifying the settings of other phase

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The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.6.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.6.3 Reference setting list for test

Table 67 Overload protection connector list

NO. Default Abbr. Explanation

1. On Func_OL Enable or disable the overload protection

Table 68 Overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 1.5In I_OL Alarm Current setting for alarm of

overload protection A 0.05In 20.00In

2. 5 T_OL Alarm Time setting for alarm of

overload protection s 0.10 6000.0

3. 1.2In I_OL Trip Current setting for trip of

overload protection A 0.05In 20.00In

4. 10 T_OL Trip Time setting for trip of overload

protection s 0.10 6000.0

Table 69 Overload protection binary setting list

Bit Default “0” “1” Explanation

4.7 1 OL Alarm Off OL Alarm On Enable or disable the alarm

function of overload protection

8.7 Overvoltage protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

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8.7.1 Verifying the settings

8.7.1.1 Verifying the settings of stage 1 of overvoltage protection

1 Phase-to-earth voltage discrimination

1.1 Verifying the phase A settings

1.1.1 Verifying the voltage setting

Table 70 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase A

Overvoltage value: 105% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase A

Overvoltage value: 95% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should not close

1.1.2 Veritying the time setting

Table 71 Time setting verifying

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Test item Description

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase A

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.1.3 Veritying the dropout ratio setting

Table 72 Dropout ratio setting verifying

Test item Description

101% of the dropout ratio setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase A

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Dropout ratio: 101% of the setting value

Test result The protection function does not dropout

99% of the voltage setting verifying

Binary setting

Settings/ProtContwd/Pls Input SetGrNo/Voltage/Func_OV1, set

the binary setting as 1

Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV PE, set the

binary setting as 1

Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV1 Trip, set

the binary setting as 1

Setting value Settings/ProtSet/Pls Input SetGrNo/Current, the detail setting list

refer to the “Reference setting list for test” in this section

Binary input None

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Test item Description

Fault simulation

Overvoltage phase: phase A

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Dropout ratio: 99% of the setting value

Test result The protection function dropout

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

2 Phase-to-phase voltage discrimination

2.1 Verifying the phase AB settings

2.1.1 Verifying the voltage setting

Table 73 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase AB

Overvoltage value: 105% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

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Test item Description

Fault simulation

Overvoltage phase: phase AB

Overvoltage value: 95% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should not close

2.1.2 Veritying the time setting

Table 74 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase AB

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

2.1.3 Veritying the dropout ratio setting

Table 75 Dropout ratio setting verifying

Test item Description

101% of the dropout ratio setting verifying

Binary setting

OpConfig/Connect/Func_OV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/OV PP, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase AB

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Dropout ratio: 101% of the setting value

Test result The protection function does not dropout

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Test item Description

99% of the voltage setting verifying

Binary setting

Settings/ProtContwd/Pls Input SetGrNo/Voltage/Func_OV1, set

the binary setting as 1

Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV PE, set the

binary setting as 0

Settings/ProtContwd/Pls Input SetGrNo/Voltage/OV1 Trip, set

the binary setting as 1

Setting value Settings/ProtSet/Pls Input SetGrNo/Current, the detail setting list

refer to the “Reference setting list for test” in this section

Binary input None

Fault simulation

Overvoltage phase: phase AB

Overvoltage value: 120% of the setting value

Overvoltage time: longer than the setting value

Dropout ratio: 99% of the setting value

Test result The protection function dropout

2.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.7.1.2 Verifying the settings of stage 2 of overvoltage protection

The test method and test items of verifying the stage 2 of overvoltage

protection are same as stage 1, only need to change the corresponding test

conditions and settings into the conrresponding stage 2 required.

8.7.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.7.3 Reference setting list for test

Table 76 Overvoltage protection connector list

NO. Default Abbr. Explanation

1. On Func_OV1 Enable or disable the stage 1 of overvoltage protection

2. On Func_OV2 Enable or disable the stage 2 of overvoltage protection

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Table 77 Overvoltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 70 U_OV1 Voltage setting for stage 1 of

overvoltage protection V

40.00

(PE)

80.00

(PP)

100.0

(PE)

200.0

(PP)

2. 0.1 T_OV1 Time setting for stage 1 of

overvoltage protection s 0.00 60.00

3. 70 U_OV2 Voltage setting for stage 2 of

overvoltage protection V

40.00

(PE)

80.00

(PP)

100.0

(PE)

200.0

(PP)

4. 0.1 T_OV2 Time setting for stage 2 of

overvoltage protection s 0.00 60.00

5. 0.95 Dropout_OV Dropout ratio for overvoltage

protection 0.90 0.99

Table 78 Overvoltage protection binary setting list

Bit Default “0” “1” Explanation

3.3 1 OV PP OV PE

Phase-to-phase or

phase-to-earth discrimination

for overvoltage protection

4.12 1 OV1 Alarm OV1 Trip Stage 1 of overvoltage

protection alarm or trip

8.8 Undervoltage protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.8.1 Verifying the settings

8.8.1.1 Verifying the settings of stage 1 of undervoltage protection

1 Phase-to-earth voltage discrimination

1.1 Verifying the phase A settings

1.1.1 Verifying the voltage setting

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Table 79 Voltage setting verifying

Test item Description

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 95% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 105% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should not close

1.1.2 Verifying the time setting

Table 80 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.1.3 Verifying the current setting

Table 81 Current setting verifying

Test item Description

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 95% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should not close

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 105% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

1.1.4 Verifying the auxiliary contact of circuit breaker

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Table 82 Auxiliary contact supervision verifying

Test item Description

CB closed

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three-phase CB state is “On”

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

CB opened

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three-phase CB stage is “Off”

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting valu

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should not close

1.1.5 Verifying dropout ration setting

Table 83 Dropout ratio setting verifying

Test item Description

101% of the dropout ratio setting value

Binary setting OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

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Test item Description

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Dropout ratio: 101% of the setting value

Test result The undervoltage protection function should dropout

99% of the dropout ratio setting value

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk CB On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A

Undervoltage value: 80% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Dropout ratio: 99% of the setting value

Test result The undervoltage protection function should not dropout

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

2 Phase-to-earth voltage discrimination

The test method and test items of verifying the phase-to-phase voltage

discrimination are same as phase-to-earth voltage discrimination, only need

to change the corresponding test conditions and settings into the

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conrresponding phase-to-phase voltage discrimination required.

3 Undervoltage for three phases discrimination

Table 84 Three-phase undervoltage verifying

Test item Description

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk All Phase, set the

binary setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: phase A, B, C

Undervoltage value: 95% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UV1, set the connector as "On"

Settings/Write/Select/Ctr Word 4/UV1 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 3/UV PE, set the binary setting as

1

Settings/Write/Select/Ctr Word 3/UV Chk All Phase, set the

binary setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Undervoltage phase: any one or two or three phase of phase A, B, C

Undervoltage value: 105% of the setting value

Current value: 200% of the setting value

Undervoltage time: longer than the setting value

Test result The corresponding output contacts should not close

8.8.1.2 Verifying the settings of stage 2 of undervoltage protection

The test method and test items of verifying the stage 2 of undervoltage

protection are same as stage 1, only need to change the corresponding test

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conditions and settings into the conrresponding stage 1 required.

8.8.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.8.3 Reference setting list for test

Table 85 Undervoltage protection connector list

NO. Default Abbr. Explanation

3. On Func_UV1 Enable or disable the stage 1 of undervoltage

protection

4. On Func_UV2 Enable or disable the stage 2 of undervoltage

protection

Table 86 Undervoltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 40 U_UV1 Voltage setting for stage 1 of

undervoltage protection V

5.00

(PE)

10.00

(PP)

75.0

(PE)

150.0

(PP)

2. 0.1 T_UV1 Time setting for stage 1 of

undervoltage protection s 0.00 120.0

3. 40 U_UV2 Voltage setting for stage 2 of

undervoltage protection V

5.00

(PE)

10.00

(PP)

75.0

(PE)

150.0

(PP)

4. 0.1 T_UV2 Time setting for stage 2 of

undervoltage protection s 0.00 120.0

5. 1.05 Dropout_UV Dropout ratio for undervoltage

protection 1.01 2.00

6. 0.2In I_Chk Current setting for

undervoltage protection A 0.00In 2.00In

Table 87 Undervoltage protection binary setting list

Bit Default “0” “1” Explanation

2.9 0 3Ph V Connect 1Ph V Connect Single phase or three phase

voltage connection

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Bit Default “0” “1” Explanation

3.0 1 UV Chk CB Off UV Chk CB On Enable or disable the function

of checking CB status

3.1 1 UV Chk All Phase UV Chk One Phase

Enable or disable the function

of checking single phase or

three phase voltage

3.2 1 UV PP UV PE Phase-to-phase or

phase-to-earth discrimination

4.11 1 UV1 Alarm UV1 Trip Stage 1 of undervoltage

protection alarm or trip

8.9 Thermal overload protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.9.1 Verifying the settings

8.9.1.1 Verifying the Hot Curve of thermal overload protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 88 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

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Test item Description

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 89 Time setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.3 Verifying the cool ratio setting

Table 90 Cool ratio setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

First thermal accumulation phase:

Fault type: phase A

Fault current: 80% of the setting value

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Test item Description

Accumulation time: for a certain time

Cooling phase:

Fault type: phase A

Fault current: 0

Accumulation time: for a certain time

First thermal accumulation phase:

Fault type: phase A

Fault current: 120% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

1.4 Verifying the alarm ratio setting

Table 91 Alarm ratio setting verifying

Test item Description

105% of the alarm ratio setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The alarm should be issued

95% of the alarm ratio setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Hot Curve, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

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Test item Description

Test result The alarm should not be issued

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.9.1.2 Verifying the Cold Curve of thermal overload protection

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 92 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 93 Time setting verifying

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Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 200% of the setting value

Fault time: longer than the time calculated by the equation

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

1.3 Verifying the alarm ratio setting

Table 94 Alarm ratio setting verifying

Test item Description

105% of the alarm ratio setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 105% of the setting value

Fault time: longer than the time calculated by the equation

Test result The alarm should be issued

95% of the alarm ratio setting verifying

Binary setting

OpConfig/Connect/Func_ThermOL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/Cold Curve, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Therm Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Fault current: 95% of the setting value

Fault time: longer than the time calculated by the equation

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Test item Description

Test result The alarm should not be issued

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.9.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.9.3 Reference setting list for test

Table 95 Thermal overload protection connector list

NO. Default Abbr. Explanation

1. On Func_ThermOL Enable or disable the thermal overload protection

Table 96 Thermal overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_Therm OL Current setting for thermal

overload protection A 0.10In 10.00In

2. 60 T_Const Therm Time constant for thermal

overload protection S 6.0 9999

3. 1 Ratio_Cool Cool ratio for Hot Curve of

thermal overload protection

0.100 10.00

4. 0.9 Ratio_Alarm Alarm ratio for thermal

overload protection

0.500 1.000

Table 97 Thermal overload protection binary setting list

Bit Default “0” “1” Explanation

2.5 1 Therm Alarm Off Therm Alarm On

Enable or disable the alarm

function of thermal overload

protection

2.6 1 Hot Curve Cold Curve Enable or disable the Hot

Curve or Cold Curve

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8.10 Displacement voltage protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.10.1 Verifying the settings

8.10.1.1 Verifying the settings of stage 1 of displacement voltage

protection

1 Verifying the phase A settings

1.1 Verifying the voltage setting

Table 98 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Displacement voltage phase: phase A

Displacement voltage value: 105% of the setting value

Displacement voltage time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

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Test item Description

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Displacement voltage phase: phase A

Displacement voltage value: 95% of the setting value

Displacement voltage time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Veritying the time setting

Table 99 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Displacement voltage phase: phase A

Displacement voltage value: 120% of the setting value

Displacement voltage time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.10.1.2 Verifying the settings of stage 2 of overvoltage protection

The test method and test items of verifying the stage 2 of overvoltage

protection are same as stage 1, only need to change the corresponding test

conditions and settings into the conrresponding stage 2 required.

8.10.1.3 Verifying the settings for determining the fault phase

1 Verifying the phase A settings

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1.1 Verifying the low voltage setting

Table 100 Low-voltage setting verifying

Test item Description

105% of the low voltage setting verifying

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Low voltage phase: phase A

Low voltage value: 105% of the low voltage setting value

Phase B and phase C: large than the high voltage setting value

Low voltage time: longer than the setting value

Test result The corresponding fault pahse should not be reported

95% of the low voltage setting verifying

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Low voltage phase: phase A

Low voltage value: 95% of the low voltage setting value

Phase B and phase C: 120% the high voltage setting value

Low voltage time: longer than the setting value

Test result The corresponding fault pahse should be reported

1.2 Verifying the low voltage setting

Table 101 High-voltage setting verifying

Test item Description

105% of the high voltage setting verifying

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Test item Description

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Low voltage phase: phase A

Low voltage value: 80% of the low voltage setting value

Phase B: 105% of the high voltage setting value

phase C: 120% of the high voltage setting value

High voltage time: longer than the setting value

Test result The corresponding fault pahse should be reported

95% of the high voltage setting verifying

Binary setting

OpConfig/Connect/Func_3V01, set the connector as "On"

Settings/Write/Select/Ctr Word 4/3V01 Trip, set the binary setting

as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: three phase-ground voltages connected to IED in

grounded wye configuration

Low voltage phase: phase A

Low voltage value: 80% of the low voltage setting value

Phase B: 95% of the high voltage setting value

phase C: 120% of the high voltage setting value

High voltage time: longer than the setting value

Test result The corresponding fault pahse should not be reported

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.10.2 Completing the test

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Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.10.3 Reference setting list for test

Table 102 Displacement voltage protection connector list

NO. Default Abbr. Explanation

1. On Func_3V01 Enable or disable the stage 1 of displacement voltage

protection

2. On Func_3V02 Enable or disable the stage 2 of displacement voltage

protection

Table 103 Displacement voltage protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 20 U_3V01 Voltage setting for stage 1 of

displacement voltage protection V 2.00 100.0

2. 1 T_3V01 Time setting for stage 1 of

displacement voltage protection S 0.00 60.00

3. 30 U_3V02 Voltage setting for stage 2 of

displacement voltage protection V 2.00 100.0

4. 0.5 T_3V02 Time setting for stage 2 of

displacement voltage protection S 0.00 60.00

5. 20 U_Phase low Low voltage setting for

determining fault phase V 10.00 100.0

6. 45 U_Phase up High voltage setting for

determining fault phase V 10.00 100.0

Table 104 Displacement voltage protection binary setting list

Bit Default “0” “1” Explanation

2.8 1 3U0 Measured 3U0 Calculated 3U0 is measured or

calculated

4.9 1 3V01 Alarm 3V01 Trip

Stage 1 of displacement

voltage protection alarm or

trip

4.10 1 3V02 Alarm 3V02 Trip

Stage 2 of displacement

voltage protection alarm or

trip

8.11 Circuit breaker failure protection

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Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.11.1 Verifying the settings of stage 1 of CBF protection

8.11.1.1 Verifying the settings of stage 1 of CBF protection

1 Verifying the phase A settings

1.1 Verifying the current setting

Table 105 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 105% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 95% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the zero-sequence current setting

Table 106 Zero-sequence current setting verifying

Test item Description

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Test item Description

105% of the zero-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 200% of the setting value

Zero-sequence current value: 105% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the zero-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 200% of the setting value

Zero-sequence current value: 95% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should not close

1.3 Verifying the negative-sequence current setting

Table 107 Negative-sequence current setting verifying

Test item Description

105% of the negative-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

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Test item Description

Fault simulation

CBF phase: phase A

Current value: 200% of the setting value

Negative-sequence current value: 105% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the negative-sequence current setting verifying

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk I0/2 On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 200% of the setting value

Negative-sequence current value: 95% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should not close

1.4 Verifying the CB status

Table 108 CB status verifying

Test item Description

The CB status is “On”

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk CB On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

The CB status is “On”

Fault simulation

CBF phase: phase A

Current value: 70% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should be closed

The CB status is “Off”

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 3/CBF Chk CB On, set the binary

setting as 1

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Test item Description

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

The CB status is “Off”

Fault simulation

CBF phase: phase A

Current value: 70% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should not close

1.5 Verifying the time setting

Table 109 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_CBF, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3U0 calculated, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of initiation circuit breaker failure protection

Fault simulation

CBF phase: phase A

Current value: 200% of the setting value

CBF time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operate time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the settings of other phase

protection are same as phase A, only need to change the corresponding test

conditions and settings into the conrresponding phase A required.

8.11.1.2 Verifying the settings of stage 2 of CBF protection

The test method and test items of verifying the stage 2 of CBF protection are

same as stage 1, only need to change the corresponding test conditions and

settings into the conrresponding stage 2 required.

8.11.2 Completing the test

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Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.11.3 Reference setting list for test

Table 110 CBF protection connector list

NO. Default Abbr. Explanation

1. On Func_CBF Enable or disable the circuit breaker failure protection

Table 111 CBF protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_CBF Phase current setting for CBF

protection A 0.05In 20.00In

2. In 3I0_CBF Zero-sequence current setting

for CBF protection A 0.05In 20.00In

3. In 3I2_CBF Negative-sequence current

setting for CBF protection A 0.05In 20.00In

4. 0 T_CBF1 Delay time for stage 1 of CBF

protection s 0.00 60.00

5. 0.2 T_CBF2 Delay time for stage 2 of CBF

protection s 0.10 60.00

Table 112 CBF protection binary setting list

Bit Default “0” “1” Explanation

2.7 1 3I0 Measured 3I0 Calculated 3U0 is measured or

calculated

3.6 1 CBF Chk I0/2 Off CBF Chk I0/2 On

Enable or disable the function

for checking zero or negative

sequence current

3.7 1 CBF Chk CB Off CBF Chk CB On Enable or disable the function

for checking CB status

8.12 Dead zone protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

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8.12.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 113 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “Off”

Active the binary input of initiation circuit breaker failure protection

Fault simulation

Fault type: phase A, instantanuous

Fault current: 105% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “Off”

Active the binary input of initiation circuit breaker failure protection

Fault simulation

Fault type: phase A, instantanuous

Fault current: 95% of the setting value

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 114 Time setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_DZ, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “Off”

Active the binary input of initiation circuit breaker failure protection

Fault simulation

Fault type: phase A, instantanuous

Fault current: 200% of the setting value

Fault time: longer than the setting value

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Test item Description

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.12.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.12.3 Reference setting list for test

Table 115 Dead zone protection connector list

NO. Default Abbr. Explanation

1. On Func_DZ Enable or disable the dead zone protection

Table 116 Dead zone protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 0.2 T_Dead Zone Time delay for dead zone

protection s 0.00 60

2. In I_CBF Phase current setting for CBF

protection A 0.05In 20In

8.13 Synchro-check and energizing check function

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.13.1 Verifying the settings

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UA

UB

UC

UN

U4

UA

UB

UC

UN

U4

Tester IED

Figure 13 Connection example of synchro-check function

If the tester can't provide the reference voltage U4, the wiring connection is

shown in Figure 14.

UA

UB

UC

UN

UA

UB

UC

UN

U4

Tester IED

Figure 14 Connection example of synchro-check function

8.13.1.1 Synchro-check function

1 Verifying the phase A of synchro-check

1.1 Verifying the voltage difference

Table 117 Voltage difference setting verifying

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Test item Description

≤ 1 V of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Synchronism condition

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: less than (rated voltage value – voltage

difference setting + 1 V)

Frequence difference: 0

Angle difference: 0

Checking time: longer than the setting value

Test result The report of synchronazation OK is issued

> 1 V of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Fault simulation

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: large than (rated voltage value – voltage

difference setting + 1 V)

Frequence difference: 0

Angle difference: 0

Checking time: longer than the setting value

Test result The report of voltage difference failure is issued

1.2 Verifying the frequency difference

Table 118 Frequency difference setting verifying

Test item Description

≤ 20 mHz of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

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Test item Description

Synchronism condition

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: rated voltage

Voltage difference: 0

Frequence difference: less than (setting value + 20 mHz)

Angle difference: 0

Checking time: longer than the setting value

Test result The report of synchronazation OK is issued

> 20 mHz of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Fault simulation

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: rated voltage

Voltage difference: 0

Frequence difference: large than (setting value + 20 mHz)

Angle difference: 0

Checking time: longer than the setting value

Test result The report of frequency difference failure is issued

1.3 Verifying the angle difference

Table 119 Angle difference setting verifying

Test item Description

≤ 3° of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Synchronism condition

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: rated voltage

Voltage difference: 0

Frequence difference: 0

Angle difference: less than (setting value + 3°)

Checking time: longer than the setting value

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Test item Description

Test result The report of synchronazation OK is issued

> 3° of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Fault simulation

Synchro-check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: rated voltage

Voltage difference: 0

Frequence difference: 0

Angle difference: large than (setting value + 3°)

Checking time: longer than the setting value

Test result The report of angle difference failure is issued

1.4 Verifying the minimum voltage for synchro-check

Table 120 Minimum voltage for synchro-check setting verifying

Test item Description

105% of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Synchronism condition

Synchro-check phase: phase A

Three-phase voltage: 120% of the setting value

Reference voltage: 105% of the setting value

Voltage difference: less than the voltage difference setting value

Frequence difference: 0

Angle difference: 0

Checking time: longer than the setting value

Test result The report of synchro-check meet is issued

95% of the setting value

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input Active the binary input of synchronization request

Fault simulation

Synchro-check phase: phase A

Three-phase voltage: 120% of the setting value

Reference voltage: 95% of the setting value

Voltage difference: less than the voltage difference setting value

Frequence difference: 0

Angle difference: 0

Checking time: longer than the setting value

Test result The report of synchro-check failure is issued

2 Verifying the synchro-check settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.13.1.2 Energizing check

1 Verifying the phase A setting

1.1 Checking the dead line live busbar

Table 121 Maximum energizing voltage setting verifying

Test item Description

98% of the setting verifying

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkDLLB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of synchronization request

Voltage condition

Energizing check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: 98% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check meet is issued

102% of the setting verifying

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkDLLB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input Active the binary input of three-phase initiation reclosure

Fault simulation

Energizing check phase: phase A

Three-phase voltage: rated voltage

Reference voltage: 102% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check failure is issued

1.1.1 Checking the live line dead busbar

Table 122 Maximum energizing voltage setting verifying

Test item Description

98% of the setting verifying

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkLLDB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of three-phase initiation reclosure

Voltage condition

Energizing check phase: phase A

Three-phase voltage: 0

Reference voltage: 98% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check meet is issued

102% of the setting verifying

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkLLDB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of three-phase initiation reclosure

Fault simulation

Energizing check phase: phase A

Three-phase voltage: 0

Reference voltage: 102% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check failure is issued

1.1.2 Checking the dead line dead busbar

Table 123 Maximum energizing voltage setting verifying

Test item Description

98% of the setting verifying

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Test item Description

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of three-phase initiation reclosure

Voltage condition

Energizing check phase: phase A

Three-phase voltage: 0

Reference voltage: 98% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check meet is issued

102% of the setting verifying

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/EnergChkDLDB, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input of three-phase initiation reclosure

Fault simulation

Energizing check phase: phase A

Three-phase voltage: 0

Reference voltage: 102% of the setting value

Checking time: longer than the setting value

Test result The report of energizing check failure is issued

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.13.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.13.3 Reference setting list for test

Table 124 Synchro-check and energizing check function connector list

NO. Default Abbr. Explanation

1. On Func_AR Enable or disable the synchronization check function

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NO. Default Abbr. Explanation

2. On Func_MC Enable or disable the synchronization check function

Table 125 Synchro-check and energizing check function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 500 T_Syn Chk Time for synchro-check

function S 0.05 60.00

2. 0.1 T_MaxSynExt Maximum time for exiting

synchronization check S 0.05 60.00

3. 0.1 T_MaxSynReq Maximum time for

synchronization check S 0.05 60.00

4. 1 Phase_UL Phase determination setting 1.00 6.00

5. 10 Angle_Syn Diff

Angle difference for

synchro-check function

Degree 1.00 80.00

6. 5 U_Syn Diff

Voltage difference for

synchro-check function

V 1.00 40.00

7. 0.02 Freq_Syn Diff Frequency difference for

synchro-check function HZ 0.02 2.00

8. 43 Umin_Syn Minimum voltage for

synchronization check V 60.00 130.0

9. 17 Umax_Energ Maximum voltage for

Energizing check V 20.00 100.0

Table 126 Synchro-check and energizing check binary setting list

Bit Default “0” “1” Explanation

3.8 1

Selection of AR check mode

Synchrozination check mode

Energizing for DLLB check

mode

Energizing for LLDB check

mode

Energizing for DLDB check

mode

Override mode

3.9 0

3.10 0

3.11 1

Selection of MC check mode

Synchrozination check mode

Energizing for DLLB check

mode

Energizing for LLDB check

mode

Energizing for DLDB check

mode

3.12 0

3.13 0

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Bit Default “0” “1” Explanation

Override mode

8.14 Auto-recloser

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.14.1 Verifying the settings

8.14.1.1 Verifying the shot 1 of autoreclosure function

1 Three-phase autoreclosure mode

Table 127 Three phase autoreclosing verifying

Test item Description

Binary setting

OpConfig/Connect/Func_AR, set the connector as "On"

Settings/Write/Select/Ctr Word 3/AR_Syn Check, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input The binary input of three phase autoreclosure initiation from 1 to 0

Active the binary input of synchronization request

Autoreclosure

condition

Precondition: the time of autoreclosure reset is met

Synchronism: synchro-check is satisfied

Current: no current of phase ABC

Time: longer than the setting value

Test result The corresponding contact of autoreclosure is colsed

8.14.1.2 Verifying the other shots of autoreclosure function

The test method of verifying the other short is same as shot 1, only need to

change the corresponding test conditions and settings into the

conrresponding shot 1 required.

8.14.2 Completing the test

Continue to test another function or end the test. Restore connections and

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settings to their original values, if they were changed for testing purposes.

8.14.3 Reference setting list for test

Table 128 Auto-recloser function connector list

NO. Default Abbr. Explanation

1. On Func_AR Enable or disable the auto-recloser function

Table 129 Auto-recloser function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 0.5 T_3P AR1 Time delay setting for shot 1

of three phase autoreclosure S 0.05 60.00

2. 0.5 T_3P AR2 Time delay setting for shot 2

of three phase autoreclosure S 0.05 60.00

3. 0.5 T_3P AR3 Time delay setting for shot 3

of three phase autoreclosure S 0.05 60.00

4. 0.5 T_3P AR4 Time delay setting for shot 4

of three phase autoreclosure S 0.05 60.00

5. 4 Times_AR Pulse length setting for

autoreclosure 1.00 4.00

6. 3 T_Reclaim Time setting for

autoreclosure succeed S 0.05 60.00

7. 3 T_AR Reset Time setting for spring

charging S 0.05 60.00

8. 0.1 T_Max. CB Open Maximum time setting for CB

open S 0.05 60.00

9. 500 T_Syn Chk Time for synchro-check

function S 0.05 60.00

10. 0.1 T_MaxSynExt Maximum time for exiting

synchronization check S 0.05 60.00

11. 1 Phase_UL Phase determination setting 1.00 6.00

12. 10 Angle_Syn Diff Angle difference for

synchro-check function Degree 1.00 80.00

13. 5 U_Syn Diff Voltage difference for

synchro-check function V 1.00 40.00

14. 0.02 Freq_Syn Diff Frequency difference for

synchro-check function HZ 0.02 2.00

15. 43 Umin_Syn Minimum voltage for

synchronization check V 60.00 130.0

16. 17 Umax_Energ Maximum voltage for

Energizing check V 20.00 100.0

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NO. Default Abbr. Explanation Unit Min. Max.

17. 10 T_CB Faulty Time setting for CB faulty S 0.10 60.00

Table 130 Auto-recloser function binary setting list

Bit Default “0” “1” Explanation

3.8 1

Selection of AR check mode

Synchrozination check mode

Energizing for DLLB check

mode

Energizing for LLDB check

mode

Energizing for DLDB check

mode

Override mode

3.9 0

3.10 0

5.0 0 OC1 Init AR Off

Enable or disable the AR

function is initiated by stage 1

of overcurrent protection

5.1 0 OC2 Init AR Off

Enable or disable the AR

function is initiated by stage 2

of overcurrent protection

5.2 0 OC Inv Init AR Off

Enable or disable the AR

function is initiated by inverse

stage of overcurrent

protection

5.3 0 EF1 Init AR Off

Enable or disable the AR

function is initiated by stage 1

of earth fault protection

5.4 0 EF2 Init AR Off

Enable or disable the AR

function is initiated by stage 2

of earth fault protection

5.5 0 EF Inv Init AR Off

Enable or disable the AR

function is initiated by inverse

stage of earth fault protection

5.6 0 SEF1 Init AR Off

Enable or disable the AR

function is initiated by stage 1

of sensitive earth fault

protection

5.7 0 SEF2 Init AR Off

Enable or disable the AR

function is initiated by stage 2

of sensitive earth fault

protection

5.8 0 SEF Inv Init AR Off

Enable or disable the AR

function is initiated by inverse

stage of sensitive earth fault

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Bit Default “0” “1” Explanation

protection

5.9 0 NSOC1 Init AR Off

Enable or disable the AR

function is initiated by stage 1

of negative sequence

overcurrent protection

5.10 0 NSOC2 Init AR Off

Enable or disable the AR

function is initiated by stage 2

of negative sequence

overcurrent protection

5.11 0 NSOC Inv Init AR Off

Enable or disable the AR

function is initiated by inverse

stage of negative sequence

overcurrent protection

5.15 0 3P Fault Init AR 3P Fault Blk AR

Enable or disable the AR

function is initiated by single

phase fault or three phase

fault

8.15 Low(under) frequency load shedding protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.15.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the frequency setting

Table 131 Frequency setting verifying

Test item Description

95% of the frequency setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation Fault type: phase A

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Test item Description

Frequency value: 105% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the frequency setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 95% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 132 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

1.3 Verifying the voltage setting

Table 133 Voltage setting verifying

Test item Description

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Test item Description

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 95% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 105% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.4 Verifying the current setting

Table 134 Current setting verifying

Test item Description

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 95% of the current checking seeting

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Test item Description

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 105% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.5 Verifying the dF/dt setting

Table 135 dF/dt setting verifying

Test item Description

105% of the dF/dt setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

dF/dt value: 105% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the dF/dt setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

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Test item Description

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Frequency value: 70% of the low frequency setting

Voltage value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

dF/dt value: 95% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.15.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.15.3 Reference setting list for test

Table 136 Low frequency load shedding protection connector list

NO. Default Abbr. Explanation

1. On Func_LF LS Enable or disable the low frequency load shedding

protection

Table 137 Low frequency load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 49.5 F_LF LS Frequency setting for low frequency

load shedding protection HZ 45.00 60.00

2. 0.5 T_LF LS Time setting for low frequency load

shedding protection S 0.05 60.00

3. 3 dF/dt_LS dF/dt setting for low frequency load

shedding protection HZ/S 1.00 10.00

4. 70 U_Chk Voltage checking setting for low

frequency load shedding protection V 10.00 120.0

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5. 0.2In I_Chk Current checking setting for low

frequency load shedding protection A 0 2.00In

Table 138 Low frequency load shedding protection binary setting list

Bit Default “0” “1” Explanation

2.9 0 3Ph V Connect 1Ph V Connect Single phase or three phase

voltage connection

3.4 1 dF(dU)/dt Off dF(dU)/dt On Enable or disable the binary

setting of dF(dU)/dt

8.16 Low voltage load shedding protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.16.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the voltage setting

Table 139 Voltage setting verifying

Test item Description

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 95% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage setting verifying

Binary setting OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

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Test item Description

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 105% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 140 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

1.3 Verifying the voltage checking setting

Table 141 Voltage checking setting verifying

Test item Description

95% of the voltage checking setting verifying

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation Fault type: phase A

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Test item Description

Voltage value: 70% of the voltage setting

Voltage checking value: 95% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage checking setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 105% of the voltage checking setting

Current value: 70% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.4 Verifying the current setting

Table 142 Current setting verifying

Test item Description

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 95% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_LF LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 105% of the current checking seeting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.5 Verifying the dU/dt setting

Table 143 dF/dt setting verifying

Test item Description

105% of the dU/dt setting verifying

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

dU/dt value: 105% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the dU/dt setting verifying

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 70% of the voltage setting

Voltage checking value: 70% of the voltage checking setting

Current value: 70% of the current checking seeting

dU/dt value: 95% of the setting

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Test item Description

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.16.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.16.3 Reference setting list for test

Table 144 Low frequency load shedding protection connector list

NO. Default Abbr. Explanation

1. On Func_LV LS Enable or disable the low voltage load shedding

protection

Table 145 Low frequency load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 100 U_LV LS Voltage setting for low voltage load

shedding protection V 50.00 110.00

2. 1 T_LV LS Time setting for low voltage load

shedding protection S 0.05 60.00

3. 5 dU/dt_LS dF/dt setting for low voltage load

shedding protection HZ/S 1.00 10.00

4. 70 U_Chk Voltage checking setting for low

voltage load shedding protection V 10.00 120.0

5. 0.2In I_Chk Current checking setting for low

voltage load shedding protection A 0 2.00In

Table 146 Low frequency load shedding protection binary setting list

Bit Default “0” “1” Explanation

2.9 0 3Ph V Connect 1Ph V Connect Single phase or three phase

voltage connection

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Bit Default “0” “1” Explanation

3.4 1 dF(dU)/dt Off dF(dU)/dt On Enable or disable the binary

setting of dF(dU)/dt

8.17 Overload load shedding protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.17.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 147 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

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1.2 Verifying the time setting

Table 148 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 200% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

1.3 Verifying the voltage checking setting

Table 149 Voltage checking setting verifying

Test item Description

95% of the voltage checking setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/OL LS Chk V On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

Voltage value: 95% of the voltage checking setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the voltage checking setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/OL LS Chk V On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

Voltage value: 105% of the voltage checking setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.4 Verifying the dF/dt setting

Table 150 dF/dt setting verifying

Test item Description

105% of the dF/dt setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

dF/dt value: 105% of the setting

dU/dt value: 120% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the dF/dt setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

dF/dt value: 95% of the setting

dU/dt value: 120% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

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1.5 Verifying the dU/dt setting

Table 151 dU/dt setting verifying

Test item Description

105% of the dU/dt setting verifying

Binary setting

OpConfig/Connect/Func_OL LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

dF/dt value: 120% of the setting

dU/dt value: 105% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the dU/dt setting verifying

Binary setting

OpConfig/Connect/Func_LV LS, set the connector as "On"

Settings/Write/Select/Ctr Word 2/3Ph V Connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 3/dF(dU)/dt On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 120% of the current setting

dF/dt value: 105% of the setting

dU/dt value: 95% of the setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.17.2 Completing the test

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Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.17.3 Reference setting list for test

Table 152 Overload load shedding protection connector list

NO. Default Abbr. Explanation

1. On Func_Lv LS Enable or disable the low voltage load shedding

protection

Table 153 Overload load shedding protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. In I_OL LS Current setting for over load load

shedding protection V 50.00 110.00

2. 1 T_OL LS Time setting for over load load

shedding protection S 0.05 60.00

3. 5 dU/dt_LS dU/dt setting for over load load

shedding protection V/S 1.00 10.00

4. 3 dF/dt_LS dF/dt setting for over load load

shedding protection HZ/S 1.00 10.00

5. 70 U_Chk Voltage checking setting for low

voltage load shedding protection V 10.00 120.0

Table 154 Overload load shedding protection binary setting list

Bit Default “0” “1” Explanation

2.9 0 3Ph V Connect 1Ph V Connect Single phase or three phase

voltage connection

3.4 1 dF(dU)/dt Off dF(dU)/dt On Enable or disable the binary

setting of dF(dU)/dt

3.5 1 OL LS Chk V Off OL LS Chk V On Enable or disable the function

of checking voltage

8.18 Unbalance protection

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

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8.18.1 Verifying the settings

8.18.1.1 Verifying the setting for tripping

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 155 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the voltage setting

Table 156 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 105% of the voltage setting

Fault time: longer than the setting value

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Test item Description

Test result The corresponding output contacts should be closed

95% of the voltage setting verifying

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 105% of the voltage setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.3 Verifying the time setting

Table 157 Time setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 200% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.18.1.2 Verifying the setting for alarming

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 158 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_UBL, set the connector as "On"

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Test item Description

Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_UBL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the voltage setting

Table 159 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UBL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 105% of the voltage setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the voltage setting verifying

Binary setting

OpConfig/Connect/Func_UBL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

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Test item Description

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Voltage value: 105% of the voltage setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.3 Verifying the time setting

Table 160 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_UBL, set the connector as "On"

Settings/Write/Select/Ctr Word 2/UBL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 200% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.18.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.18.3 Reference setting list for test

Table 161 Unbalance protection connector list

NO. Default Abbr. Explanation

1. On Func_UBL Enable or disable the unbalance protection

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Table 162 Unbalance protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. U_UBL Alarm Voltage setting for alarm of

unbalance protection V 0.50 100.0

2. I_UBL Alarm Current setting for alarm of

unbalance protection A 0.10 20.0

3. T_UBL Alarm Time setting for alarm of

unbalance protection S 0.10 60.00

4. U_UBL Trip Voltage setting for tripping of

unbalance protection V 0.50 100.0

5. I_UBL Trip Current setting for tripping of

unbalance protection A 0.10 20.0

6. T_UBL Trip Time setting for tripping of

unbalance protection S 0.00 60.00

Table 163 Unbalance protection binary setting list

Bit Default “0” “1” Explanation

4.8 UBL Alarm Off UBL Alarm On

Enable or disable the alarm

function of unbalance

protection

8.19 Under current monitoring

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.19.1 Verifying the settings

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 164 Current setting verifying

Test item Description

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_UC, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

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Test item Description

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 95% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_UC, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 165 Time setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_UC, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 70% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

1.3 Verifying the inhibition time setting

Table 166 Inhibition time setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_UC, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Three phase CB status is “On”

Fault simulation

Fault type: phase A

Current value: 70% of the current setting

Fault time: longer than the setting value

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Test item Description

Test result The corresponding output contacts should be closed, and the

inhibition time meet the requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.19.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.19.3 Reference setting list for test

Table 167 Under current protection connector list

NO. Default Abbr. Explanation

1. On Func_UC Enable or disable the under current protection

Table 168 Unbalance protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. I_UC Current setting for under current

protection A 0.50In 20.00In

2. T_UC Time setting for tripping of under

current protection S 0.10 60.00

3. T_Inhibition Time setting for inhibition of under

current protection S 30.00 6000.0

8.20 Current overload monitoring

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.20.1 Verifying the settings

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8.20.1.1 Verifying the setting for tripping

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 169 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed

95% of the current setting verifying

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Current value: 95% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should not close

1.2 Verifying the time setting

Table 170 Time setting verifying

Test item Description

Binary setting OpConfig/Connect/Func_OL, set the connector as "On"

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Current value: 200% of the current setting

Fault time: longer than the setting value

Test result The corresponding output contacts should be closed, and the

operated time meet the requirement in technical data

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8.20.1.2 Verifying the setting for alarming

1 Verifying the phase A setting

1.1 Verifying the current setting

Table 171 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Current value: 105% of the current setting

Fault time: longer than the setting value

Test result The alarm should be issued

95% of the current setting verifying

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Fault type: phase A

Current value: 95% of the current setting

Fault time: longer than the setting value

Test result The alarm should not be issued

1.2 Verifying the time setting

Table 172 Time setting verifying

Test item Description

Binary setting

OpConfig/Connect/Func_OL, set the connector as "On"

Settings/Write/Select/Ctr Word 4/OL Alarm On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A

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Test item Description

Current value: 200% of the current setting

Fault time: longer than the setting value

Test result The alarm should be issued, and the alarm time meet the

requirement in technical data

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.20.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.20.3 Reference setting list for test

Table 173 Current overload protection connector list

NO. Default Abbr. Explanation

1. On Func_OL Enable or disable the current overload protection

Table 174 Current overload protection function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. I_OL Alarm Current setting for alarm of current

overload protection A 0.50In 20.00In

2. T_OL Alarm Time setting for alarm of current

overload protection S 0.10 6000.0

3. I_OL Trip Current setting for tripping of

current overload protection A 0.50In 20.00In

4. T_OL Trip Time setting for tripping of current

overload protection S 0.10 6000.0

Table 175 Current overload protection binary setting list

Bit Default “0” “1” Explanation

4.7 OL Alarm Off OL Alarm On

Enable or disable the alarm

function of current overload

protection

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8.21 Control circuit faulty supervising

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.21.1 Verifying the settings

8.21.1.1 Verifying the CB status

Table 176 CB status verifying

Test item Description

Active One of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/CB Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “3Ph CB Open” or “3Ph CB Close”

Fault simulation Active time: longer than the setting value

Test result The alarm should not be issued

Active both of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/CB Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “3Ph CB Open” and “3Ph CB Close”

Fault simulation Active time: longer than the setting value

Test result The alarm should be issued

8.21.1.2 Verifying the DS(Disconnection switch) status

Table 177 DS status verifying

Test item Description

Active One of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/DS Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “DS Open” or “DS Close”

Fault simulation Active time: longer than the setting value

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Test item Description

Test result The alarm should not be issued

Active both of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/DS Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “DS Open” and “DS Close”

Fault simulation Active time: longer than the setting value

Test result The alarm should be issued

8.21.1.3 Verifying the ES(Earth switch) status

Table 178 ES status verifying

Test item Description

Active One of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/ES Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “ES Open” or “ES Close”

Fault simulation Active time: longer than the setting value

Test result The alarm should not be issued

Active both of the two binary input

Binary setting Settings/Write/Select/Ctr Word 4/ES Faulty On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input Active the binary input “ES Open” and “ES Close”

Fault simulation Active time: longer than the setting value

Test result The alarm should be issued

8.21.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.21.3 Reference setting list for test

Table 179 Control circuit faulty supervising function setting list

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NO. Default Abbr. Explanation Unit Min. Max.

1. 10 T_CB POS Time setting for supervising the

CB status S 0.10 60.00

2. 10 T_DS POS Time setting for supervising the

DS status S 0.10 60.00

3. 10 T_ES POS Time setting for supervising the

ES status S 0.10 60.00

Table 180 Control circuit faulty supervising binary setting list

Bit Default “0” “1” Explanation

4.13 1 CB Faulty Off CB Faulty On Enable or disable the function

of supervising the CB status

4.14 1 DS Faulty Off DS Faulty On Enable or disable the function

of supervising the DS status

4.15 1 ES Faulty Off ES Faulty On Enable or disable the function

of supervising the ES status

8.22 Current transformer secondary circuit

supervision

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.22.1 Verifying the settings

1 Verifying the phase A setting

Table 181 Zero-sequence current setting verifying

Test item Description

105% of the zero-sequence current setting verifying

Binary setting Settings/Write/Select/Ctr Word 2/CT Fail On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A

Fault current: 105% of the setting value

Test result The CT failure alarm is reported

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Test item Description

95% of the zero-sequence current setting verifying

Binary setting Settings/Write/Select/Ctr Word 2/CT Fail On, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation Fault type: phase A

Fault current: 95% of the setting value

Test result The CT failure alarm is reported

2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.22.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.22.3 Reference setting list for test

Table 182 CT failure supervision function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 0.5In 3I0_CT Fail Maximum zero-sequence current for

detecting CT failure A 0.05In 2.00In

Table 183 CT failure supervision binary setting list

Bit Default “0” “1” Explanation

2.13 1 CT Fail Off CT Fail On Enable or disable the function

of CT fail supervising

8.23 Voltage transformer secondary circuit

supervision

Before starting the test, please make sure that the protection function setting

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values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.23.1 Verifying the settings

8.23.1.1 Three-phase VT failure surpervision

1 Verifying the phase-to-earth voltage setting

Table 184 Phase-to-earth voltage setting verifying

Test item Description

95% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 95% of the phase-to-earth setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 70% of the phase-to-earth setting value

Test result The VT failure alarm is reported

105% of the phase-to-earth voltage setting verifying

Binary setting Settings/ProtContwd/Pls Input SetGrNo/Common/VT Fail, set

the binary setting as 1

Setting value Settings/ProtSet/Pls Input SetGrNo/Common, the detail setting

list refer to the “Reference setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 105% of the phase-to-earth setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 70% of the phase-to-earth setting value

Test result The VT failure alarm is not reported

Table 185 Phase-to-earth voltage setting for zero-sequence voltage verifying

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Test item Description

95% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the phase-to-earth setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 95% of the phase-to-earth setting value

Test result The VT failure alarm is reported

105% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the phase-to-earth setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 105% of the phase-to-earth setting value

Test result The VT failure alarm is not reported

2 Verifying the current setting

2.1 Verifying the phase current setting

Table 186 Current setting verifying

Test item Description

105% of the current setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

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Test item Description

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the setting value

Current value: 105% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 70% of the setting value

Test result The VT failure alarm is reported

95% of the current setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the setting value

Current value: 95% of the setting value

Zero/negative sequence current value: 150% of the setting value

Zero-sequence voltage: 70% of the setting value

Test result The VT failure alarm is not reported

2.2 Verifying the zero/negative sequence current setting

Table 187 Current setting verifying

Test item Description

105% of the Zero/negative sequence current setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the setting value

Current value: 150% of the setting value

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Test item Description

Zero/negative sequence current value: 105% of the setting value

Zero-sequence voltage: 70% of the setting value

Test result The VT failure alarm is reported

95% of the Zero/negative sequence current setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A, B, C

Voltage value: 80% of the setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 95% of the setting value

Zero-sequence voltage: 70% of the setting value

Test result The VT failure alarm is not reported

8.23.1.2 Single/ two phases VT failure surpervision

1 Solid earthed system

1.1 Verifying the phase A setting

1.1.1 Verifying the phase-to-earth voltage setting

Table 188 Phase-to-earth voltage setting verifying

Test item Description

105% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Solid earthed, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 105% of the phase-to-earth setting

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Test item Description

value

Test result The VT failure alarm is reported

95% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Solid earthed, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 95% of the phase-to-earth setting

value

Test result The VT failure alarm is not reported

1.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

2 Isolated system

2.1 Verifying the phase A setting

2.1.1 Verifying the phase-to-earth voltage setting

Table 189 Phase-to-earth voltage setting verifying

Test item Description

105% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

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Test item Description

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 105% of the phase-to-earth setting

value

Max(Uab, Ubc, Uca) –Min(Uab, Ubc, Uca): 120% of the phase-to-phase

setting value

Test result The VT failure alarm is reported

95% of the phase-to-earth voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 95% of the phase-to-earth setting

value

Max(Uab, Ubc, Uca) –Min(Uab, Ubc, Uca): 120% of the phase-to-phase

setting value

Test result The VT failure alarm is not reported

2.1.2 Verifying the phase-to-phase voltage setting

Table 190 phase-to-phase voltage setting verifying

Test item Description

105% of the phase-to-phase voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 120% of the phase-to-earth setting

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Test item Description

value

Max(Uab, Ubc, Uca) –Min(Uab, Ubc, Uca): 105% of the phase-to-phase

setting value

Test result The VT failure alarm is reported

95% of the phase-to-phase voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/Isolate/Resist, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: no protection startup

Phase failure: phase A

Zero-sequence voltage value: 105% of the phase-to-earth setting

value

Max(Uab, Ubc, Uca) –Min(Uab, Ubc, Uca): 95% of the phase-to-phase

setting value

Test result The VT failure alarm is not reported

2.2 Verifying the settings of other phase

The test method and test items of verifying the other phase are same as

phase A, only need to change the corresponding test conditions and settings

into the conrresponding other phase required.

8.23.1.3 Verifying the voltage restoring setting

1 Verifying the voltage setting

Table 191 Voltage setting verifying

Test item Description

105% of the voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

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Test item Description

Fault simulation

Precondition: VT failure

Voltage value: 105% of the setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Test result The information of voltage restoring should be reported

95% of the voltage setting verifying

Binary setting

Settings/Write/Select/Ctr Word 2/VT Fail On, set the binary

setting as 1

Settings/Write/Select/Ctr Word 2/3Ph V connect, set the binary

setting as 1

Setting value Settings/Write/Select, the detail setting list refer to the “Reference

setting list for test” in this section

Binary input None

Fault simulation

Precondition: VT failure

Voltage value: 95% of the setting value

Current value: 150% of the setting value

Zero/negative sequence current value: 150% of the setting value

Test result The information of voltage restoring should not be reported

8.23.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

8.23.3 Reference setting list for test

Table 192 VT failure supervision function setting list

NO. Default Abbr. Explanation Unit Min. Max.

1. 0.2In I_VT Fail Maximum current for detecting VT

failure A 0.05In 0.25In

2. 0.2In 3I02_VT Fail

Maximum zero- and negative-

sequence current for detecting VT

failure

A 0.05In 0.25In

3. 8 Upe_VT Fail Maximum phase to earth voltage

for detecting VT failure V 7.00 20.0

4. 16 Upp_VT Fail Maximum phase to phase voltage

for detecting VT failure V 10.00 30.0

5. 40 Upe_VT Normal Minimum normal phase to earth

for VT restoring V 40.00 65.00

错误!未找到引用源。 IED testing

174

Table 193 VT failure supervision function setting list

Bit Default “0” “1” Explanation

2.9 0 3Ph V Connect 1Ph V Connect Single phase or three phase

voltage connection

2.10 0 Isolate/ Resist Solid earthed Solid earthed system or

isolated system

2.15 1 VT Fail Off VT Fail On Enable or disable the function

of VT failure

8.24 Monitoring function

8.24.1 Auxiliary contact of circuit breaker monitoring

Before starting the test, please make sure that the protection function setting

values and parameters are correct, refer to section Introduction, Points for

attention during testing and Preparing for test in this chapter.

8.24.1.1 Testing the function

1 Checking the auxiliary contact of CB of phase A

Table 194 Auxiliary contact of circuit breaker verifying

Test item Description

Binary setting None

Setting value None

Binary input The position of phase A of circuit breaker is “Off”

Fault simulation Current: input the rated current into the phase A

Test result The alarm is issued

2 Checking the auxiliary contact of CB of other phase

The test method of checking the other phase are same as phase A, only need

to change the corresponding test conditions into the conrresponding other

phase required.

8.24.1.2 Completing the test

Continue to test another function or end the test. Restore connections and

settings to their original values, if they were changed for testing purposes.

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错误!未找到引用源。 IED testing

176

9 Checking before operation

Note: The following items are only for reference. Users should make the

proper operation guideline based on the actual site conditions

9.1 Checking the LED

Power on the IED, the LED “Run” is lit steadily in green, other LEDs should be

extinguished.

9.2 Checking the display on LCD

In normal operation condition, the information of “year-month-day, hour :

minute : second, magnitude and angle of analog quantities, measurement

value, the function connectors status and the current setting group” should be

scrolling displayed on the LCD.

9.3 Checking the clock

After setting the date and time of the IED, power on and off the IED with five

times in short time, checking the tolerance of date and time is within the

permissible range.

9.4 Checking the voltage and current

Inject system currents (load current must be larger than 0.08In) and voltages

into the IED, and then check whether the magnitude, phase angle, polarity

and phase sequence of each measuring analog value are correct or not.

9.5 Checking the setting group

Make sure the active setting group is correct.

9.6 Checking the setting

Checking the settings one by one of each group which are possibly used in

the actual operation modes.

错误!未找到引用源。 IED testing

177

9.7 Checking the binary input

Check the state of all binary inputs. Particularly ensure that the IED is not in

test mode, meaning that the green “Run” LED is not flash continuously

9.8 Checking the normal operation mode

9.8.1 Trip and close test with the circuit breaker

9.8.1.1 Switching the circuit breaker state by local command

Trip and close the circuit breaker, the corresponding feedback state of circuit

breaker injected via binary inputs should be read out and compared with the

actual state of circuit breaker, the displayed state should be in accordance

with the actual state.

9.8.1.2 Switching the circuit breaker state from remote control center

If the IED is connected to a remote substation via SCADA, the corresponding

switching tests may also be checked from the substation.

9.9 Put into operation

If all the checking items described above and the other checking items need to be

performed according to the site condition have been checked and correct, the IED can be

put into operation.

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错误!未找到引用源。 Operating maintenance

179

Chapter 7 Operating maintenance

About this chapter

This chapter introduces attentions and the required checking,

operation after updating software or replacing modules and the

measure for alarm information.

错误!未找到引用源。 Operating maintenance

180

1 Attentions during operating

Warning

Do not disconnect the secondary circuit connection of current

transformer without short-circuiting the transformer's secondary

winding. Operating a current transformer with the secondary

winding open will cause a masssive potential that may damage the

current transformer and may cause injuries to humans.

Caution

Never connect or disconnect a wire and/or a connector to or from a

IED during normal operation. Dangerous voltages and currents are

present that may be lethal. Operation may be disrupted and IED and

measuring circuitry may be damaged.

Note

Strictly follow the power system operation maintenance instruction

or regulations, the following items for reference:

During operating, prohibition the following operation manually:

Touch the parts of IED with electricity

Plug in and pull out each module

Manually operation to the HMI menu:

Testing binary output

Changing setting value

Set setting value

Set systme parameter

Change the IP address

Fault occurrence during operation, if the protection IED tripping, the

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181

corresponding LED in front panel will be lighted, and the event reports

will be displayed in HMI; if the autoreclosure function operate, the

corresponding LED will be lighted and the reports will be displayed in

HMI

If the alarming class I appearance during operation, stop running the IED,

record the alarm information and inform the responsible engineer, at this

time, it is not allowed to press the Reset button. If the alarming class II

appearance, record the alarm information and inform the responsible

engineer to analyse and deal with.

错误!未找到引用源。 Operating maintenance

182

2 Routine checking

Checking the LEDs status

Checking scroll display information in HMI

Checking the setting group number

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183

3 Periodical checking

Check that the inside and outside of the IED are cleanly and no ash

deposition

All components (including the chips, transformer and relay, etc.) of the

IED are fixed well, no loosing phenomenon, the IED apperance is regular

and no damage and distortion phenomenon

The buttons are operated flexibly with good feeling and fixed reliably

All the IED terminals for connection are firmd without loosing

phenomenon, and the marked number are clear and correct

Energizing the IED with DC power supply for several seconds, the green

“Run” LED and protection function LED that connector have been

enabled will be lighted without any alarm or operation lED lighted (if

lighted, press Reset button to reset), the analog quantities is displayed in

HMI

Check the zero drift and scale

Check the operation setting values

Measure the output voltage of power supply

Check the alarm circuit

Check the binary input

Check the tripping and closing circuit

Test the insulation resistance

错误!未找到引用源。 Operating maintenance

184

4 The alarm information

4.1 Alarm information class I and the description

Table 195 Alarm information class I and the description

Information Description

RAM Error RAM is abnormal

EPROM Error EPROM is abnormal

Flash Error Flash is abnormal

BO Abnormal Binary output is abnormal

AD Error AD is abnormal

Zero Offset Zero drift is out of limitation

Invalid SetGr Pointer of setting group is error

Setting Chk ERR Setting value is error

Logic Scheme ERR Logic file and CPU file do not cooperate

4.2 Alarm information class II and the description for

M1

Table 196 Alarm information class II and the description for M1

Information Description

File ERR Read configuration files wrong

BIO OUT ERR Fail to response the BO in BIO module

BIO COM ERR Communication failure in BIO module

GOO_A_COMMU_ERR Communication failure in GOOSE A

GOO_A_CFG_ERR Configuration failure in GOOSE A

GOO_B_COMMU_ERR Communication failure in GOOSE B

GOO_B_CFG_ERR Configuration failure in GOOSE B

VT Fail VT failure in circuit of voltage transformer

V1P VT Fail VT failure in circuit of the forth voltage transformer

CB Faulty “3Ph CB Open” and “3Ph CB Close” are both active or inactive

DS Faulty “DS Open” and “DS Close” are both active or inactive

ES Faulty “ES Open” and “ES Close” are both active or inactive

Trip Fail Trip command is issued lasting for more than 9s

MMI Com Fail Communication failure between HMI and CPU module

CB Not Ready BI2 is active to indicate CB is not ready

Frequency Differ Frequency difference measured from software and hardware is

0.5Hz

错误!未找到引用源。 Operating maintenance

185

Information Description

OC1 Alarm Overcurrent protection stage 1 issues an alarm signal

OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal

EF1 Alarm Earth fault protection stage 1 issues an alarm signal

EF Inv Alarm Earth fault protection inverse stage issues an alarm signal

NSOC1 Alarm Negative sequence overcurrent protection stage 1 issues an alarm

signal

NSOC Inv Alarm Negative sequence overcurrent protection inverse stage issues an

alarm signal

SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal

SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal

SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal

3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal

3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal

PhA Grounded Phase A is grounded

PhB Grounded Phase B is grounded

PhC Grounded Phase C is grounded

UV1 Alarm Undervoltage protection stage 1 issues an alarm signal

OV1 Alarm Overvoltage protection stage 1 issues an alarm signal

Therm OL Alarm Thermal overload protection issues an alarm signal

CT Fail Failure in circuit of current transformer

BI Set SetGr2 Setting group switches to 1 when binary input is 0

BI Set SetGr1 Setting group switches to 2 when binary input is 1

Table 197 Alarm information class II and the description for M6

Information Description

File ERR Read configuration files wrong

BIO OUT ERR Fail to response the BO in BIO module

BIO COM ERR Communication failure in BIO module

GOO_A_COMMU_ERR Communication failure in GOOSE A

GOO_A_CFG_ERR Configuration failure in GOOSE A

GOO_B_COMMU_ERR Communication failure in GOOSE B

GOO_B_CFG_ERR Configuration failure in GOOSE B

CB Faulty “3Ph CB Open” and “3Ph CB Close” are both active or inactive

DS Faulty “DS Open” and “DS Close” are both active or inactive

ES Faulty “ES Open” and “ES Close” are both active or inactive

Trip Fail Trip command is issued lasting for more than 9s

MMI Com Fail Communication failure between HMI and CPU module

Frequency Differ Frequency difference measured from software and hardware is

0.5Hz

OC1 Alarm Overcurrent protection stage 1 issues an alarm signal

OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal

错误!未找到引用源。 Operating maintenance

186

Information Description

EF1 Alarm Earth fault protection stage 1 issues an alarm signal

EF Inv Alarm Earth fault protection inverse stage issues an alarm signal

SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal

SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal

SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal

CT Fail Failure in circuit of current transformer

BI Set SetGr2 Setting group switches to 1 when binary input is 0

BI Set SetGr1 Setting group switches to 2 when binary input is 1

Table 198 Alarm information class II and the description for C1

Information Description

File ERR Read configuration files wrong

BIO OUT ERR Fail to response the BO in BIO module

BIO COM ERR Communication failure in BIO module

GOO_A_COMMU_ERR Communication failure in GOOSE A

GOO_A_CFG_ERR Configuration failure in GOOSE A

GOO_B_COMMU_ERR Communication failure in GOOSE B

GOO_B_CFG_ERR Configuration failure in GOOSE B

VT Fail VT failure in circuit of voltage transformer

V1p VT Fail VT failure in circuit of the forth voltage transformer

CB Faulty “3Ph CB Open” and “3Ph CB Close” are both active or inactive

DS Faulty “DS Open” and “DS Close” are both active or inactive

ES Faulty “ES Open” and “ES Close” are both active or inactive

Trip Fail Trip command is issued lasting for more than 9s

MMI Com Fail Communication failure between HMI and CPU module

Frequency Differ Frequency difference measured from software and hardware is

0.5Hz

OC1 Alarm Overcurrent protection stage 1 issues an alarm signal

OC Inv Alarm Overcurrent protection inverse stage issues an alarm signal

EF1 Alarm Earth fault protection stage 1 issues an alarm signal

EF Inv Alarm Earth fault protection inverse stage issues an alarm signal

SEF1 Alarm Sensitive earth fault protection stage 1 issues an alarm signal

SEF2 Alarm Sensitive earth fault protection stage 2 issues an alarm signal

SEF Inv Alarm Sensitive earth fault protection inverse stage issues an alarm signal

3V01 Alarm Displacement Voltage protection stage 1 issues an alarm signal

3V02 Alarm Displacement Voltage protection stage 2 issues an alarm signal

PhA Grounded Phase A is grounded

PhB Grounded Phase B is grounded

PhC Grounded Phase C is grounded

UV1 Alarm Undervoltage protection stage 1 issues an alarm signal

OV1 Alarm Overvoltage protection stage 1 issues an alarm signal

错误!未找到引用源。 Operating maintenance

187

Information Description

UBL Alarm Unbalance protection issues an alarm signal

OL Alarm Over load protection issues an alarm signal

Inhibit close Drive a contact to inhibit reconnection of capacitor

CT Fail Failure in circuit of current transformer

BI Set SetGr2 Setting group switches to 1 when binary input is 0

BI Set SetGr1 Setting group switches to 2 when binary input is 1

错误!未找到引用源。 Operating maintenance

188

错误!未找到引用源。 Transportation and storage

189

Chapter 8 Transportation and storage

About this chapter

This chapter describes how to transport and store the IED.

错误!未找到引用源。 Transportation and storage

190

1 Transportion

The IED can be transported by means of conveyance, such as car, train, ship, etc. In order to ensure the perfect performance of the IED, prevent the IED from rain, snow, vibration, shock and bump.

错误!未找到引用源。 Transportation and storage

191

2 Storage

If the IED is to be stored before installation, this is must be done in the original

transport casing in a dry and dust free place. The packed IED should be

stored in a waterproof and snow proof place without acid or alkaline or other

corrosive gas and explosive gas. The storage temperature is from -25°C to

+40°C, and the relative humidity does not exceed 80%. Observe the

environmental requirements stated in the technical data.

错误!未找到引用源。 Transportation and storage

192

Chapter 9 Appendix

193

Chapter 9 Appendix

About this chapter

This chapter contains the diagram of modules arrangement,

typical connection, glossary and the protocol data table.

Chapter 9 Appendix

194

1 Arrangement diagram of modules

X1

AIM

X2

AIM

X3

BIO

X4

CPU

X5

FIO

X6

FOM

X7

PSM

Figure 15 The arrangement diagram of modules

Chapter 9 Appendix

195

2 Typical diagram

A. For incoming or outgoing feeder protection or line

backup protection

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

Figure 16 Application of feeder protection to measure three phase and earth currents

IA

IB

IC

UB

UA

UC

IN

UN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

U01

U02

U03

U04

AIM2

Chapter 9 Appendix

196

Figure 17 Application of feeder protection to measure three phase and earth currents and three phase

voltages (bus side)

IA

IB

IC

UB

UA

UC

IN

UN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

U01

U02

U03

U04

AIM2

Figure 18 Application of feeder protection to measure three phase and earth currents and three phase

voltages (line side)

Chapter 9 Appendix

197

IA

IB

IC

UB

UA

UC

IN

UN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

U01

U03

AIM2

U02

U04

Figure 19 Application of feeder protection to measure three phase and earth currents and single phase

voltage (Ph-Ph) (bus side)

Chapter 9 Appendix

198

IA

IB

IC

UB

UA

UC

IN

UN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

U01

U03

AIM2

U02

U04

Figure 20 Application of feeder protection to measure three phase and earth currents and single phase

voltage (Ph-E) (bus side)

Chapter 9 Appendix

199

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02

*

I1

Figure 21 Application of feeder protection to measure three phase currents, earth current, and

sensitive earth current

Chapter 9 Appendix

200

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02

*

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

I1

Figure 22 Application of feeder protection to measure three phase currents, earth current and sensitive

earth current, and three phase voltages (bus side)

Chapter 9 Appendix

201

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02

*

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

I1

Figure 23 Application of feeder protection to measure three phase currents, earth current and sensitive

earth current, and three phase voltages (line side)

Chapter 9 Appendix

202

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02

*

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

I1

Figure 24 Application of feeder protection to measure three phase currents, earth current and sensitive

earth current, and single phase voltage (Ph-Ph) (bus side)

Chapter 9 Appendix

203

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02

*

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

I1

Figure 25 Application of feeder protection to measure three phase currents, earth current, and

sensitive earth current, and single phase voltage (Ph-E) (bus side)

Chapter 9 Appendix

204

B. For transformer backup protection

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02I1

*

Figure 26 Application of transformer backup protection to measure three phase currents, earth

current, and neutral current

Chapter 9 Appendix

205

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02 I1

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

*

Figure 27 Application of transformer backup protection to measure three phase currents, earth current

and neutral current, and three phase voltages (bus side)

Chapter 9 Appendix

206

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02 I1

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

*

Figure 28 Application of transformer backup protection to measure three phase currents, earth current

and neutral current, and three phase voltages (line side)

Chapter 9 Appendix

207

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02 I1

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

*

Figure 29 Application of transformer backup protection to measure three phase currents, earth current

and neutral current, and single phase voltage (Ph-Ph) (bus side)

Chapter 9 Appendix

208

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

I01

AIM1

I02 I1

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

*

Figure 30 Application of transformer backup protection to measure three phase currents, earth current

and neutral current, and single phase voltage (Ph-E) (bus side)

Chapter 9 Appendix

209

C. For synch-check function

A

B

C

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

U4

U05

U06

A

B

C

Figure 31 Typical connection for synch-check on bus coupler applications

Chapter 9 Appendix

210

IA

IB

IC

IN

AIM2

A

B

C

* * *

I01

I03

I05

I07

I02

I04

I06

I08

UB

UA

UC

UN

U01

U02

U03

U04

AIM2

U4

U05

U06

Figure 32 Typical connection for synch-check and feeder current protection

Chapter 9 Appendix

211

D. For capacitor bank protection

A

B

C

Capacitor bank

IC1

IC2

IC3

AIM1

*

*

* I03

I05

I07

I04

I06

I08

Figure 33 Typical connection for capacitor bank unbalanced current protection with three current

inputs

A

B

C

Capacitor bank

UC1

U03

U05

U07

AIM1

U04

U06

U08

UC2

UC3

Figure 34 Typical connection for capacitor bank unbalanced voltage protection with three voltage

inputs

Chapter 9 Appendix

212

A

B

C

Capacitor bank

*IC1

IC2

IC3

AIM1I03

I05

I07

I04

I06

I08

Figure 35 Typical connection for capacitor bank unbalanced current protection with one current input

UC1

A

B

C

U03

U05

U07

AIM1Capacitor bank

U04

U06

U08

UC2

UC3

Figure 36 Typical connection for capacitor bank unbalanced voltage protection with one voltage input

I1

ABC

Figure 37 Unbalanced current detection for

grounded capacitor bank

I1

ABC

Chapter 9 Appendix

213

Figure 38 Neutral current differential protection

for grounded Split-Wye capacitor bank

I1

ABC

Figure 39 Neutral current protection for

ungrounded split-Wye capacitor bank

I1I2I3

ABC

Figure 40 Three unbalanced currents detection

for capacitor bank

U1

ABC

Figure 41 Neutral voltage unbalanced protection

for unrounded Wye capacitor bank

U1

ABC

Figure 42 Neutral voltage unbalanced detection

for ungrounded split-Wye capacitor bank

Chapter 9 Appendix

214

U1

ABC

Figure 43 Summation of Intermediate tap-point

voltage for grounded Wye capacitor bank

U1

ABC

Figure 44 Neutral voltage unbalance detection by

3VTs for unrounded Wye capacitor bank

U1

ABC

Figure 45 Neutral voltage protection for

ungrounded split-Wye capacitor bank

U1

U2

U3

ABC

Figure 46 Three unbalanced voltages detection

for Capacitor Bank

Chapter 9 Appendix

215

E. For Load shedding function

CSC-211 CSC-211 CSC-211 CSC-211 CSC-211

Figure 47 Typical connection for load shedding function