collaborative research: wavelet analysis of periodic error ... · parasitic motion and hysteresis....
TRANSCRIPT
Collaborative Research: Wavelet Analysis of Periodic Error for
Improved Displacement Metrology (NSF#: 1265824)
PI: Jonathan D. Ellis, PhD (University of Rochester)
Collaborative Research: Wavelet Analysis of Periodic Error for
Improved Displacement Metrology (NSF#: 1265824)
PI: Jonathan D. Ellis, PhD (University of Rochester)
Precision Engineering Internship ProgramEight students from three different academic institutions took part in the
inaugural Precision Engineering Internship Program at the University of
Rochester. This program is intended to provide a two-week, applied learning
experience for students who have little-to-none prior experience with
instrumentation, calibration, and metrology. The goal of the program is to: 1)
provide the participants with practical concepts and skills that are typically only
taught from a theoretical standpoint in courses, 2) entice them to pursue
careers in the world of precision engineering and displacement interferometry,
and 3) have the PI available has a future point-of-contact for other internship
opportunities. This year’s participants included students from Finger Lakes
Community College (www.flcc.edu) and Monroe Community College
(www.monroecc.edu) as well as the University of Rochester from 6/2/2014 –
6/13/2014. For next year, the program will seek to expand to include more
students as well as have the University of Rochester provide additional housing
support. Details on the program can be found here:
http://www.me.rochester.edu/projects/jdellis-lab/outreach.php
Precision Engineering Internship ProgramEight students from three different academic institutions took part in the
inaugural Precision Engineering Internship Program at the University of
Rochester. This program is intended to provide a two-week, applied learning
experience for students who have little-to-none prior experience with
instrumentation, calibration, and metrology. The goal of the program is to: 1)
provide the participants with practical concepts and skills that are typically only
taught from a theoretical standpoint in courses, 2) entice them to pursue
careers in the world of precision engineering and displacement interferometry,
and 3) have the PI available has a future point-of-contact for other internship
opportunities. This year’s participants included students from Finger Lakes
Community College (www.flcc.edu) and Monroe Community College
(www.monroecc.edu) as well as the University of Rochester from 6/2/2014 –
6/13/2014. For next year, the program will seek to expand to include more
students as well as have the University of Rochester provide additional housing
support. Details on the program can be found here:
http://www.me.rochester.edu/projects/jdellis-lab/outreach.php
Program TopicsProgram Topics
� Day 1: Flexure Stages using MOTUS prototyping stages
� Day 2: Instrumentation basics, Fourier Domain analysis,
Matlab introduction
� Day 3: Data Acquisition with Labview
� Day 4: LVDT sensors, noise, sensitivity, hysteresis
� Day 5: Capacitance sensors
� Day 6: MOTUS stage calibration
� Day 7: Parasitic motion
� Day 8: Data analysis, linearity, Data fitting
� Day 9: Fizeau interferometry demo, White Light
interferometry demo
� Day 10: Piezo stage calibration
� Day 1: Flexure Stages using MOTUS prototyping stages
� Day 2: Instrumentation basics, Fourier Domain analysis,
Matlab introduction
� Day 3: Data Acquisition with Labview
� Day 4: LVDT sensors, noise, sensitivity, hysteresis
� Day 5: Capacitance sensors
� Day 6: MOTUS stage calibration
� Day 7: Parasitic motion
� Day 8: Data analysis, linearity, Data fitting
� Day 9: Fizeau interferometry demo, White Light
interferometry demo
� Day 10: Piezo stage calibration
Students learning the basics
with function generators and
oscilloscopes.
The PI discussing the concepts of
parasitic motion and hysteresis.
John and Kris aligning capacitance
sensors for calibrating the MOTUS
stages.
Students on a tour of the PI’s lab to
give demonstrations of ongoing
projects and other systems.
Jacob and Jessica testing the
sensitivity of the capacitance sensor
mounts to external forces.
ParticipantsParticipants
� Kris Moore, FLCC ([email protected])
� Jacob Blacksberg, UR ([email protected])
� Dan Poehlein, FLCC ([email protected])
� Dr. Jonathan D. Ellis, UR ([email protected]), PI
� Jessica Bernstein, UR ([email protected])
� Bobby Datta, FLCC ([email protected])
� Karen Martino, MCC ([email protected])
� John Ndukwe, UR ([email protected])
� Kathleen Dupre, UR ([email protected])
� Sam Samanta, FLCC POC ([email protected]) (not shown)
� Kris Moore, FLCC ([email protected])
� Jacob Blacksberg, UR ([email protected])
� Dan Poehlein, FLCC ([email protected])
� Dr. Jonathan D. Ellis, UR ([email protected]), PI
� Jessica Bernstein, UR ([email protected])
� Bobby Datta, FLCC ([email protected])
� Karen Martino, MCC ([email protected])
� John Ndukwe, UR ([email protected])
� Kathleen Dupre, UR ([email protected])
� Sam Samanta, FLCC POC ([email protected]) (not shown)
Left to Right: