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1 CMOS Model’s FLAG Control System Tigran Petrosyan PhD student of “Microelectronic Circuits and Systems“ Interdepartmental Chair of State Engineering University of Armenia (SEUA), R&D Engineer of “SYNOPSYS Armenia” CJSC

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1

CMOS Model’s FLAG Control System

Tigran PetrosyanPhD student of “Microelectronic Circuits and Systems“Interdepartmental Chair of State Engineering University of Armenia (SEUA),

R&D Engineer of “SYNOPSYS Armenia” CJSC

2Contest

• Evolution of CMOS transistors models • Results of CMOS transistors models evolution • Drawbacks of existing approaches• Proposed approaches for model speed and accuracy increase • Target function definition for CMOS model speed and accuracy increase• Proposed flow for model speed and accuracy increase• Example Accuracy and speed increase flow application • Accuracy and speed increase flow application results• CMOS model speed and accuracy increase software structure and functionality• FLAG software graphical interface• FLAG efficiency estimation

3CMOS transistors models evolution (1)

N+ N+

P- bulk

drain

gate

source

Gate oxide

BSIM1

⎪⎪⎪⎪

⎪⎪⎪⎪

⎟⎟⎠

⎞⎜⎜⎝

⎛⋅

=

==

++==

=

q

nomTBKtm0V

nomTT at, i0n

Nlntm0V2s

s1KsFbVth0

VThideal.V

thV chΦ

ΦΦ

4CMOS transistors models evolution (2)

BSIM4

th.(6)V

th.(5)V

th.(4)V

th.(3)V

th(2)V

th(1)V

thidealV=

thV ΔΔΔΔΔΔ ++++++

bseffV

oxmT

oxT

2_K

bseffV-

soxm

Tox

T

1K=

th(1)V ⋅⋅⋅⋅ ΦΔ

bm.V-

s2K2-

2=

1K Φγ ⋅⋅

bx.V)

s-

bx.V-

s(

s2

)s

-bx.

V-s

()2

-1

(=

2K

+⋅

ΦΦΦ

ΦΦγγ

ûxC

chN

siq2

=1

⋅⋅⋅ εγ

ûxC

ch.N

siq2

=2

⋅⋅⋅ εγ

si2

2t

Xch

Nq-

s=

tX

εΦ ⋅

⋅⋅

( ) ⎥⎦⎤

⎢⎣⎡ ⋅⋅⋅

bcV

14-2

1-

bcV-

bsV+

1-

bcV-

bsV0.5+

bcV=Vbseff δδδ

22K*4

21K

+s0.9=bcV Φ⋅

seffL

effLN+1

ûxmT

ûxT

1K=

th(2)V ΦΔ ⋅⋅⋅⋅

( ) ( )sbiVtwLeffLeffW

VT1D2etw2L

effLeffWVT1D

eVTOD4thV φΔ −−

+−

= ⋅⎟⎟⎟

⎜⎜⎜

⎛⎟⎟⎟

⎜⎜⎜

⎟⎟⎟

⎜⎜⎜

( ) ( )

sio2

depXoxTsit0l

bsVtabEta0Et0LeffL

VT1De2t0L*2

effLVT1D

e6thV eff

ε

ε

Δ

⋅⋅

⋅⋅⎟⎟⎟

⎜⎜⎜

=

++=⎟⎟⎟

⎜⎜⎜

⎟⎟⎟

⎜⎜⎜

⎛ ⋅⋅

5CMOS transistors models evolution (3)

BSIM5 - new physical effects

))oxacc

VCIGBACC(1

)oxacc

VBIGBACC(AIGBACCTOXEBexp(aux1

V

thV2TOVE

1NTOX

TOXETOXREF

AeffLeffW=hI

⋅⋅

⋅⋅⋅⋅⋅⋅

⋅⋅⋅⎟⎠⎞

⎜⎝⎛⋅⋅

+

−−

))oxdep

VACCINVCIGB(1

)oxdep

VBIGBINV(AIGBINVTOXEDexp(aux2

V

thV2TOVE

1NTOX

TOXETOXREF

C¿ýýL¿ýýW=hI

⋅⋅⋅

⋅⋅⋅⋅⋅⋅

⋅⋅⋅⎟⎠⎞⎜

⎝⎛⋅⋅⋅

+

−−

))ûxde

VACCINVCIGB(1

)oxde

VBIGC(AIGCTOXEFexp(

tV*NIGC

VTH0gseVexp1log

tV

NIGCgse

V2TOVE

1NTOX

TOXETOXREF

E¿ýýL¿ýýW=hI

⋅⋅⋅

⋅⋅⋅⋅⋅

⋅⎟⎟

⎜⎜

⎟⎟⎠

⎞⎜⎜⎝

⎛⋅⋅

⋅⋅⋅⋅⎟⎠⎞

⎜⎝⎛⋅⋅⋅

+

−−

−+

oxCLW

21

sC

sC ⋅⋅⋅==

oxCLW

32

chC ⋅⋅⋅=

0=³ñC=³ÏCûùëǹCLW=Ñá.ѳC ⋅⋅

h.bC+

d.bC+

s.bC=

dbC

CUI ⋅⋅= ω

6Results of CMOS transistors models evolution

New physical effect

BSIM1 BSIM4tmash 1,5-2 times

BSIM1 BSIM4tmash 1,7-2,5 times

Web-site: http://www.intel.com/technology/silicon/mooreslaw/index.htm

Analysis complexity Parameters

number growth IC elements

number growth

Need in increase of model speed and accuracy

ModelEquation

Complication

7

Computational gates application flow

bsVcU+2)ox)/TbseffVgs((VbU)ox)/TbseffVgs((VaU+10μ

=¿ýýμ⋅+++⋅ mobmod=1

2)/Tox)thV+gsteff((VbU+)/Tox)thV2+gsteff((V)bseffVcU+a(U+11μ

=¿ýýμ⋅⋅⋅ mobmod=2

Input parameters

Calculation equation

Calculation equation

Calculation equation

Calculation equation

Output results

K1

K2

Kn

1. Trade-off between number of operations and achieved accuracy in avery computational case

Proposed approaches for model speed and accuracy increase (1)

8

L8

L0

L1

L2

L3

L4

L5

L6

L7gm

CMRRr»Éù

W LNSS T NSUB Tûx

Cûx

GAMMA

PHI

egap

Vth

Id

PHIms

VFB

VT0

2. Elimination of information lack and excess during calculations

Proposed approaches for model speed and accuracy increase (2)

9

Transistor model computation flow

Proposed approaches for model speed and accuracy increase (3)

10

Trees of computational gates

Proposed approaches for model speed and accuracy increase (4)

11

3. Different accuracy for transitions depending on demands occurring during current computational situation

4. Model universality: independency from modelin circuit, technological process, circuit base, etc.

5. CMOS transistor compatibility with other electrical elements’ models (diodes, resistors, etc): no need in recalculations during modeling with such models

Hierarchy of adaptation criteria used in CMOS transistor’s model

Proposed approaches for model speed and accuracy increase

12

Target function

→machE min

Limitation

Δ Δ<calc alow ε ε<calc alow&

S1,2...,iiii ,bPa =≤≤

Δ = −r r

calc calc realY Y

ε −=

r r

rcalc realcalc

calc

Y YY

= == =r

calc ij ij i 1,2,...,t;j 1,2,...,qY F(AC f(G ))

= ==

= = Ψ =∑n

mach mach ij ij i 1,2....,t;j 1,2,...,qd 1

E t (AC f(G )),

= == − < Δr

ij ij i 1,2,...,t;j 1,2,...,q real alowF(AC f(G )) Y

ε= == −<

r

rij ij i 1,2,...,t;j 1,2,...,q Çñ³ Ï .alow

real

F(AC f(G )) YY

S1,2...,iiii ,bpa =≤≤

ψ = == = →mach ij ij i 1,2....,t;j 1,2,...,qE (AC f(G )), min

Target function definition for CMOS model speed and accuracy increase

13

Definition of CMOS model and number of models in hierarchy of equations

Designed IC preliminary and fast simulation with low accuracy

Simulation results for designed IC meet specification

Definition of model flags for designed and reference circuit

Designed and reference circuit description formation

Simulation of reference circuit

Simulation results for reference IC meet specification

Simulation of designed IC

Technological information, simulation condition and specification input

9

1

2

3

4

5

6

7

8

Start

End

yes

yes no

no

Proposed flow for model speed and accuracy increase

14Example

Accuracy and speed increase flow application (1)

M1

VDD

VDDIO

IN

VSS

DOUT

M2

M3

M4

M5 M6

M8M7

VDD

M9

M10M11

M12

Low to high level shifter

Parameters Typical Min Max Dimension

Core supply (VDD) 1,2 1,08 1,32 V

I/O supply (VDDIO) 2,5 2,25 2,75 V

Clock frequency 240 120 - MHc

Temperature 25 125 -40 ûC

Power dissipation 10 - 11 uWt

Level shifter operating conditions

15

parameters typical min max Dimension

Simulation time 64 - 70 s

Calculations results

accurse 99 97 - %

Technology TSMC65 - - -

Thick oxide transistor yes - - -

Thin oxide transistor yes - - -

Channel length - 65 - nm

Level shifter specification and technology information

Simplified simulation results

Example Accuracy and speed increase flow application (2)

16

Simulation time dependence from number of computational gates for TSMC65

Frequency simulation results for gate capacitive and tunneling currents

Example Accuracy and speed increase flow application (3)

17

0,0248 % 1,7%

57,14 í 84.97 í

FLAG BSIM 4.4.0

More accurate results need more time

Gain

1,67%

27.83 s/47%

Accuracy and speed increase flow application results

Average relative error with this model

Time needed for simulation with this model

18CMOS model speed and accuracy increase software structure and

functionality

Control subsystem

Database of values for CMOS IC typical units’ computational gates

Subsystem of fast and low accuracy simulation

Subsystem of technological information input

User graphical interfaceSubsystem of final calculation of computational gates

Gate switch formation for typical units

Process of calculation equation selection

Structure of model accuracy and speed increase FLAG software

Estimation of technological process

Estimation of working frequencies

Accounting parameters for threshold voltage

Supply voltage accounting

19FLAG software graphical interface

Input of model separate parameter

IC simulation parameter selection

20FLAG efficiency estimation (1)

Processing steps Synopsys Cadence FLAG

Comparative

gain

(%)

Synopsys/ Cadence

Preliminary model

construction- - 3,2ñ -

IC preliminary

simulation- - 61,21ñ -

Model switch

optimizations - - 1,12ñ

IC simulation time

18,4Å 21,2Ä 6,2Å 61,12%/ 73,4%

IC simulation

accuracy96,1% 96,2% 98,4% 2,3%/2,2%

USB TX block-diagram

USB TX simulation time comparison

21

Processing steps Synopsys Cadence FLAG

Comparative gain(%)

Synopsys/

Cadence

Preliminary model

construction- - 30,3min -

IC preliminary

simulation- - 10,46h -

Model switch

optimizations - - 39min

IC simulation time

10,6day 10,2day 1,5day 81,1%/ 79,8%

IC simulation

accuracy82,5% 82,2% 96,9% 14,4%/ 14,7%

Simulated digital unit

Digital unit’s simulation results1` Real chip measurements, 2` simulated with FLAG, 3` simulated with Nanosim

FLAG efficiency estimation (2)

22

Thank you