CCC MeetingCCC Meeting

Cryogenic Current Comparatorin the FAIR Project

Overview of FAIR / current status

Beam diagnostics work package

Tasks and installation locations for CCCs

Boundary conditions / requirements

Example: SIS100 extraction beam line

Jena, 7. April 2008

Marcus Schwickert, GSI Beam Diagnostics

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 2

FAIR OverviewFAIR Overview

Existing UNILAC & SIS as injector after upgrade

p-LINAC: high current 70 mA, 70 MeV

SIS100: Superconducting, 100 Tm, 1-10 GeV/uhigh current operation p to Udesign: p:4*1013, U28+: 5*1011

SIS300: 300 Tm, stretcher or acceleration up to 30 GeV/u

CR: stochastic cooling of RIB and pbar

RESR: accumulation of pbar, deceleration of RIB

NESR: versatile experimental ring for stable ions, RIB, pbar cooling, gas-target, e-A collider

HESR: storage and acceleration of pbar to 14 GeV/u

HEBT: for fast & slow extraction and low & high currents.

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 3

Current StatusCurrent Status

FAIR Kick-Off Event 7. November 2007International partners signed communiqué:

At the moment: FAIR Technical Meetings on EoIs

In total 21 Expressions of Interest were submitted, i.e. international partners express their interest to take over responsibility for a FAIR work package

Two possibilities for contributions: 1. In-kind, i.e. delivery of accelerator parts

2. cash

Austria, Germany, Spain, Finland, France, Poland, Romania, Russia, Sweden, Great Britain and State of Hesse

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 4

Work Breakdown StructureWork Breakdown Structure

∙94 WPs defined according to WBS, FBTR and Cost Book schematics

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 5

Beam Diagnostic System DefinitionBeam Diagnostic System Definition

as given in the Work Breakdown Structure (WBS-Code 2.5.6)

Constituents of a Beam Diagnostic System:

• Vacuum chamber• Detector / Sensor • Mechanics / Actuators / Feed-throughs• Analog and front-end Electronics• Cabling („short“ and „long“)• All Sub-systems (High voltage, Pressured air and Stepping motor control etc.)• Data Acquisition (VME, cPCI, PXI, ..)

What is not included?

• Vacuum infrastructure: pumps, pressure measurement

• Technical infrastructure: electricity, Pressured Air distribution, etc.• Controls infrastructure: Ethernet, timing distribution

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 6

Work Package StructureWork Package Structure

Detector

Drive

Mechanics

Digitization

Long Cables

Embedded Controller

Analog-Electronics

Analog-Elektronics

Network

Subsystems:HV / Gases /

Compressed Air Step. motor ctrl.

• NO common scheme valid FOR ALL ~30 different beam diagnostic systems

Accelerator Tunnel Electronics room

Schematic for Beam Diagnostic Device

Accelerator Control System

• ADC• Scaler/Counter• Digitizer• I/O-board• Controller• Data concentrator/DSP• DAQ software

Common Realization:GSI Contribution

Data AcquisitionEoI 13

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 7

Overview CR Beam DiagnosticsOverview CR Beam Diagnostics

Device QuantityStartphase Phase B

Measured Parameter Remark

DC Transformer 1 - DC current stored current, beam lifetime

AC Transformer 1 - pulse current Injection efficiency

Cryogenic Current Comparator 1 - pulse current high intensities, ongoing R&D

Beam Position Monitor (warm) 18 - centre-of-mass closed orbit, turn-by-turn variation, R&D

Tune Measurement 1 - centre-of-mass after excitation

Tune by BTF, Tune by noise excitation, PLL tune tracking

Schottky Pick-Up 1 - Momentum distribution, Transverse Schottky

p/p determination, tune, chromaticity

Quadrupolar BPM 0 +1 quadr. Moment x2- y

2 2nd beam moments, Inj. matching, R&D

Wall Current Monitor 1 - broadband bunch structure longit. emittance, bunch gymnastics, R&D

Residual Gas Profile Monitor 0 +1 transverse profile profile & position, high intensities, R&D

Beam Loss Monitor 8 +28 Beam loss mis-steering of magnets, halo detection at scrapers

Scintillation Screen 2 - transverse profile profile & position, low intensities

SEM-Grid (PG) 2 - transverse profile profile & position ongoing R&D

Faraday-Cup / Beam stopper 2 - First turn diagnostics

Scraper (hor./vert.) 8/4 - beam profile Transverse profile, beam alignment

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 8

Overlaping Systems of Beam DiagnosticsOverlaping Systems of Beam Diagnostics

BD System HEBT SIS100

SIS300

CR RESR NESR SFRS PBar HESR pLinac

DC Transformer Pulse Transformer Cryogenic Current Comparator Beam Position Monitor (warm) Tune Measurement Schottky Pick-Up Residual Gas Profile Monitor Beam Loss Monitor Scintillation Screen SEM-Grid Faraday-Cup / Beam stopper Data Acquisition

Goal: Use similar diagnostic devices for all machines to maximum extent !

Comprehensive Data Acquisition : common realization is essential

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 9

Expressions of Interest (EoI)Expressions of Interest (EoI)

Only 2 expressions of interest related to beam diagnostics:

•Who will build the rest ??

•Fear of "Heidelberg-Syndrome"

•No EoI for CCC yet

• ~700 MEuro german contribution to FAIR

• ?? MEuro for civil construction

• ~15 MEuro for "data acquisition"

• NO margin left for additional workpackage, e.g. CCC !!

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 10

CCC Installation LocationsCCC Installation Locations

Extraction SIS100/300

Beam dump

S-FRS target

Extraction SIS18

6 CCC are foreseen for transmission determination

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 11

Installation Locations in HEBTInstallation Locations in HEBT

bl# rig.[Tm] part. ex. RT WCM BPM GRID SCR BIF CCC PDC MWPC SH SV1 1-18 i, p s, f 2 1 3 4 4 1 1 2 4 4 76 27-100 i, p s, f 1 1 2 3 1 1 1 1 3 3 2

10 64-300 i s 0 0 0 0 2 1 1 1 2 3 323 18-100 i s, f 1 1 1 1 1 1 1 1 1 1 124 64-300 i s 0 0 0 0 1 1 1 1 2 0 047 27-100 i,p s,f 1 1 1 1 1 1 1 1 1 1 1

Equipment of HEBT-beamlines with beam diagnostic devices (only beamlines including CCC are shown)

End of 2007: Detailed study of ion optical requirements for installation of beam diagnostic devices in HEBT by F. Hagenbuck (FAIR-SYN)Problem: Layout changed recently from superconducting to nc magnets!

Beam parameters of beams passing beamline #6:

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 12

Example: Beamline # 6Example: Beamline # 6SIS100 – DUMP (hor.) Variante 1

RT, PDC

GRIDMWPC

GRIDMWPC

M6_3

BPMBPMBPM, BIF

BPM

GRID, MWPC SCR, BIF

M9_1 M9_2 M9_3

S6_1 S9_2S6_3 S9_1

WCM, CCC

M6_1

RT, PDCWCM, CCC

hor, verhor, ver hor ver hor

M6_2

GRIDMWPC

GRIDMWPC

S6_2

#6 (fast,slow) #9 (fast, slow) AS9_1(ver.)

Dip9 (hor.)

Dip9 (ver.)

SIS100

SCR

#9#6

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 13

Requirements SIS100 ExtractionRequirements SIS100 Extraction

Mechanics: - very little space, closed packed installations (magnets, cryogenic infrastructure, beamlines...)

- restricted access (radiation safety)

... but: cryo-infrastructure is available

Electronics:

- problematic EMV (strong el.-magn. fields)

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 14

Achievements SIS18-CCCAchievements SIS18-CCC

7x109 Ar11+ at 300 MeV/u within 1.2 s, readout 20 μs:

Prototype tested at GSI in the 90ies Improvement:

Nb instead Pb for the flux transducer

less temperature drift reached 0.25 nA/√Hz 8 nA @ 1 kHz R&D: GSI, DESY, MPI-K, Uni-Jena.

GSI prototype in 1997: HEBT: slow extraction online transmission control Rings: low stored current e.g. RIB.

Cryogenic Current Comparators:

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 15

Goals for further developmentGoals for further development

The new CCC should have:- low noise characteristic- resolution possibly in sub nA-range (1 nA 2E08 pps U28+)- good magnetic shielding- installation volume as small as possible - standardized mechanical layout, matched also for SIS100 injection line- optimized He-cryostat for long term operation between refills- standardized electronics with defined interfaces for current signal and I/O

CCC Meeting, CCC for FAIR , M. Schwickert, April 7, 2008 16

SummarySummary

• FAIR project started, expressions of interest are being discussed

• Definition of beam diagnostic workpackage

• Standardization as basic concept for overlapping systems

• Beam diagnostic layout of HEBT beam lines

• Special requirements for SIS100 injection

• High resolution, good noise shielding, small insertion length as goals for future CCC prototype

Thank you for your attention.