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CC13x0 Temperature Measurements

Application ReportSWRA589–November 2017


FredGrønnerød

ABSTRACTThis application report describes how to use the integrated 12-bit analog-to-digital converter (ADC) tomeasure ambient temperature by sampling an internal current source (ISRC). The ISRC is Proportional tothe Absolute Temperature (PTAT), and thus gives a linear response as the ambient temperature changes.Sampling the ISRC is an alternative to existing temperature sensing using the BATMON 6-bit ADC, andresults in increased resolution and better accuracy.

Contents1 Introduction ................................................................................................................... 32 Analog Peripherals .......................................................................................................... 4

2.1 12-Bit, SAR ADC.................................................................................................... 42.2 ISRC Output ......................................................................................................... 52.3 Limitations ........................................................................................................... 5

3 Characterization Measurements ........................................................................................... 64 Production Calibration ..................................................................................................... 105 Sensor Controller Studio (SCS) .......................................................................................... 11

5.1 Setting Up the Project in SCS ................................................................................... 115.2 Task Testing Panel................................................................................................ 15

Appendix A Characterization Results ......................................................................................... 17

List of Figures

1 Test Results: 6 DUTs, 20 µs at 50 kΩ, VDDS = 1.83 V .................................................................. 72 Test Results: 6 DUTs, 20 µs at 50 kΩ, VDDS = 3.0 V .................................................................... 73 Test Results: 6 DUTs, 20 µs at 50 kΩ, VDDS = 3.6 V .................................................................... 84 DUT 5 Measurement Results Across VDDS Voltage Levels ............................................................. 95 SCS Task Name ........................................................................................................... 116 SCS Task Properties ...................................................................................................... 127 SCS Peripherals............................................................................................................ 128 SCS Add Data Structure Member........................................................................................ 139 Task Testing ................................................................................................................ 1510 Task Testing Output Window ............................................................................................. 1611 Characterization Results Overview ...................................................................................... 17

List of Tables

1 6-Bit BATMON Data Sheet Numbers ..................................................................................... 32 ADC_SAMPLING_TIME .................................................................................................... 43 ISRC Current Defines ....................................................................................................... 54 ISRC Resistor Defines ...................................................................................................... 55 DUT5 Measurement Results Across Voltage Levels ................................................................... 96 Result of Production Calibrated Test Device 1......................................................................... 107 Result of Production Calibrated Test Device 2......................................................................... 108 DUT 1 Characterization Results, Two Samples Per Voltage Level ................................................. 18

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9 DUT 2 Characterization Results, Two Samples Per Voltage Level ................................................. 1810 DUT 3 Characterization Results, Two Samples Per Voltage Level ................................................. 1811 DUT 4 Characterization Results, Two Samples Per Voltage Level ................................................. 1912 DUT 5 Characterization Results, Two Samples Per Voltage Level ................................................. 1913 rDUT 6 Characterization Results, Two Samples Per Voltage Level................................................. 19

TrademarksLaunchPad, SimpleLink are trademarks of Texas Instruments.All other trademarks are the property of their respective owners.

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www.ti.com Introduction




1 IntroductionCC13x0 and CC26x0 devices have an on-chip battery monitoring and temperature sensor, BATMON,which is a 6-bit, SAR-like ADC that performs alternate measurements of both temperature and supplyvoltage. BATMON is listed in the data sheet with the following specifications (see Table 1).

Table 1. 6-Bit BATMON Data Sheet Numbers

Parameter Test Conditions MIN TYP MAX UNITResolution Tc = 25°C, VDDS = 3.0 V 4Range Tc = 25°C, VDDS = 3.0 V –40 85Accuracy ±5°C

This application note shows how to use the on-chip, 12-bit ADC to sample an internal current, proportionalto absolute temperature (PTAT), through the on-chip Sensor Controller Engine. The result is improvedaccuracy and resolution compared to the BATMON numbers, shown in Table 1.

Accuracy and resolution depend on the following:• ADC input voltage scaling – enabled or disabled• ISRC current strength and resistor value• Production calibration scheme

This application report:• Describes the various circuitry involved in measuring temperature with the 12-bit ADC.• Presents a use case with measurement results and describes how users can calculate the accuracy

for their solution• Shows how to set up a temperature sensor project in the Sensor Controller Studio

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Analog Peripherals www.ti.com




2 Analog Peripherals

2.1 12-Bit, SAR ADCThe ADC peripheral is a 12-bit, general purpose, successive-approximation type which can be used tosample analog-capable I/O pins or internal chip voltages up to 200 kSps with manual GPIO and COMPA,or a periodical timer trigger – synchronous or asynchronous.

The ADC input and reference voltages are scaled down by a factor of 1408/4095, giving increasedresolution at the cost of reduced input range. Down-scaling can be disabled by using theadcDisableInputScaling() function in the sensor controller.

NOTE: Disabling down-scaling changes the maximum input rating of the ADC input, and that highervoltage may damage the ADC.

The ADC sampling time can be set in certain increments from 2.7 µs to 10.9 ms, see Table 2. Minimumsampling time can theoretically be calculated if you know all the R and C in the circuitry. However, thebest approach in practice is to start with a reference measurement at a high sampling time, reduce thesampling time until there is a difference in the result, and then increase the sampling time to the nextincrement to add some margin.

Table 2. ADC_SAMPLING_TIME

Defines Sample Time (µs)ADC_SAMPLE_TIME_2P7_US 2.7ADC_SAMPLE_TIME_5P3_US 5.3ADC_SAMPLE_TIME_10P6_US 10.6ADC_SAMPLE_TIME_21P3_US 21.3ADC_SAMPLE_TIME_42P6_US 42.6ADC_SAMPLE_TIME_85P3_US 85.3ADC_SAMPLE_TIME_170_US 170ADC_SAMPLE_TIME_341_US 341ADC_SAMPLE_TIME_682_US 682ADC_SAMPLE_TIME_1P37_MS 1370ADC_SAMPLE_TIME_2P73_MS 2730ADC_SAMPLE_TIME_5P46_MS 5460

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2.2 ISRC OutputThe ISRC is a PTAT current. The primary application for the ISRC peripheral is capacitive touch sensing.However, because the ISRC output is also temperature dependent, it can be used to measuretemperature by running it through an internal resistor, valued between 2 and 100 kΩ, and sample theresulting voltage using the 12-bit ADC. The ISRC current and resistor values must be set in the SensorController Studio.

The ISRC current can be set from 0.25 µA to 20 µA, in specific increments defined in Table 3.

Table 3. ISRC Current Defines

Defines Current Added to Source Output (µA)BV_ISRC_CURR_0P25U 0.25BV_ISRC_CURR_0P5U 0.5BV_ISRC_CURR_1P0U 1.0BV_ISRC_CURR_2P0U 2.0BV_ISRC_CURR_4P5U 4.5BV_ISRC_CURR_11P75U 11.75

The following expression equals an ISRC current value of 18.25 µA in the Sensor Controller Studio:U16 current = (BV_ISRC_CURR_2P0U | BV_ISRC_CURR_4P5U) |BV_ISRC_CURR_11P75U;

The ISRC resistor value ranges from 2 kΩ to 100 kΩ, see Table 4.

Table 4. ISRC Resistor Defines

Defines ISRC Resistor Value (kΩ)ISRC_TEMP_MEAS_RES_2_KOHM 2ISRC_TEMP_MEAS_RES_10_KOHM 10ISRC_TEMP_MEAS_RES_20_KOHM 20ISRC_TEMP_MEAS_RES_50_KOHM 50ISRC_TEMP_MEAS_RES_100_KOHM 100

Unlike the current value, only one argument is allowed. The following expression equals an ISRC resistorvalue of 50 kΩ in the Sensor Controller Studio:U16 resistor = ISRC_TEMP_MEAS_RES_50_KOHM;

This application report looks at the temperature response for ISRC = 20 µA, measured over a resistorvalue of 50 kΩ.

2.3 LimitationsNone of the following analog peripherals can be used for other purposes while measuring temperaturewith the 12-bit ADC:• ADC• COMPA• COMPB• ISRC

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Characterization Measurements www.ti.com




3 Characterization MeasurementsThis chapter presents the characterization results and average slope number, which are used for thecalibration test later on in this application note.

Device setup – ADC and ISRC:• Disable ADC input scaling• ADC sampling time = 341 µs• ISRC = 20 µA measured over a resistor value of 50 kΩ• Each reported sample value averaged over four samples

Test setup follows:• Six DUTs: CC1310EM-XD7• Supply voltage (VDDS): 1.83, 3.0, and 3.6 V• Temperature range: –30 to +90°C, increments of 10°C, per temperature measurement stop• Three consecutive measurements (samples) per temperature, per voltage, per device• 10-minute temperature soak time before measurement is performed• Power down devices between temperatures

The goal of this specific characterization is to find a linear response throughout the temperature rangeacross the voltage range, which provides the highest slope number possible.

NOTE: For a reduced temperature range, it is possible to gain better accuracy with this solution byadjusting the ISRC current strength and resistor value. Be aware that with ADC input scalingdisabled, higher voltages may damage the ADC.

By using the general slope number found in these characterization measurements, only a one-pointcalibration is required to determine the accuracy for our solution.

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The characterization results are plotted into graphs for each of the supply voltages (see Figure 1, Figure 2,and Figure 3). The numerical value of the y-axis represents the ADC value read at the correspondingtemperature of the x-axis. The average slope value for these six devices is 6.45. The slope numberindicates the number of numerical ADC values per °C.

Figure 1. Test Results: 6 DUTs, 20 µs at 50 kΩ, VDDS = 1.83 V


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1.83 Vdc3.00 Vdc3.60 Vdc

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Table 5 shows the specific test results from characterization of DUT 5 (ADC value read at specifiedtemperature) across voltage levels.

Table 5. DUT5 Measurement Results Across Voltage Levels

VDDS = 1.83 V VDDS = 3.00 V VDDS = 3.60 VTemperature (°C) ADC Value Temperature (°C) ADC Value Temperature (°C) ADC Value

90 3105 90 3124 90 313980 3041 80 3061 80 307470 2977 70 2996 70 300960 2912 60 2931 60 294350 2845 50 2863 50 287540 2780 40 2797 40 281130 2715 30 2733 30 274520 2650 20 2666 20 267910 2583 10 2601 10 26140 2521 0 2540 0 2552

–10 2457 –10 2474 –10 2486–20 2394 –20 2409 –20 2423–30 2331 –30 2345 –30 2358

As shown in Figure 4, the relationship between numerical values and supply voltage is quite linear,therefore it should be possible to compensate for different voltage levels by reading the VDDS supplymonitor function of the BATMON before doing an ADC conversion. This has not been tested or describedin this application report.

Figure 4. DUT 5 Measurement Results Across VDDS Voltage Levels

The results for all the DUTs are listed in Appendix A.

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Production Calibration www.ti.com




4 Production CalibrationCalibration during production is required because every chip has gain and offset variations. With nocalibration in place, this solution offers the same accuracy stated for the BATMON solution in the datasheet (±5°C). Accuracy depends on the ISRC and resistor settings discussed in Section 2, and thecalibration scheme chosen for the production line.• Offset: one-point temperature calibration• Gain: two-point calibration scheme to determine both offset and slope number• Supply voltage compensation

In Section 3, the characterization results gave an average slope number of 6.45 (for ISRC = 20 µAmeasured over 50 kΩ). This number, along with a one-point calibration value for a give temperature,enables you to calculate the estimated temperature response across the temperature range.

The one-point production calibration test:• One-point offset calibration at 0°C (red numbers)• Test devices: CC1310 LaunchPad™ (x2)• Slope number: 6.45 (see Section 3)• Temperature range: –30° to 90°C• Measurement increments of 10°C• 10-minute temperature diffusion time (soak time)

Table 6 and Table 7 list the results of two production calibrated test devices.

Table 6. Result of Production Calibrated Test Device 1

X (°C) Y = 6.45x + 2576 ADC Value |ADC Value - Y| |ADC Value - Y| (°C)-30 2382.5 2398 15.5 2.4-20 2447 2453 6 0.9-10 2511.5 2512 0.5 0.10 2576 2572 4 0.610 2640.5 2633 7.5 1.220 2705 2696 9 1.430 2769.5 2754 15.5 2.440 2834 2823 11 1.750 2898.5 2881 17.5 2.760 2963 2951 12 1.970 3027.5 3009 18.5 2.980 3092 3077 15 2.390 3156.5 3141 15.5 2.4

Table 7. Result of Production Calibrated Test Device 2

X (°C) Y = 6.45x + 2594 ADC Value |ADC Value - Y| |ADC Value - Y| (°C)-30 2400.5 2414 13.5 2.1-20 2465 2472 7 1.1-10 2529.5 2530 0.5 0.10 2594 2593 1 0.210 2658.5 2653 5.5 0.920 2723 2717 6 0.930 2787.5 2781 6.5 1.040 2852 2844 8 1.250 2916.5 2910 6.5 1.060 2981 2971 10 1.6

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www.ti.com Sensor Controller Studio (SCS)




Table 7. Result of Production Calibrated Test Device 2 (continued)X (°C) Y = 6.45x + 2594 ADC Value |ADC Value - Y| |ADC Value - Y| (°C)

70 3045.5 3038 7.5 1.280 3110 3103 7 1.190 3174.5 3167 7.5 1.2

The results are as expected – the reported numbers are more accurate the closer you are to thecalibration point. Therefore, accuracy increases the more you decrease the temperature rangespecification for your application.

The production calibration tests in this application report are based on a characterization over atemperature range of 120°C (–30°C to +90°C). For a reduced temperature range, it is possible to samplea higher voltage by sampling through a resistor of 100 kΩ instead of 50 kΩ. This would produce a higherslope number, given that the response (sampled ADC values) is linear. If you experience nonlinearity athigher temperatures, it is most likely because the ISRC current source is saturated. In this scenario youmust either reduce the required temperature range, or return to sampling over a resistor value of 50 kΩ. Inany case, characterize your own design based on your requirements by adjusting the ISRC current,resistor value, and sampling time, as well as enabling or disabling the ADC input scaling.

5 Sensor Controller Studio (SCS)This section describes how to set up the Sensor Controller Studio to perform temperature measurementswith the 12-bit ADC and ISRC current. If you have no prior knowledge of the Sensor Controller Studio, TIrecommends that you complete the two basic SimpleLink™ Academy training sessions located on the TIResource Page. Download Sensor Controller Studio.

5.1 Setting Up the Project in SCS1. Create a new project, under properties. State the project name, description, operating system, and chip

and chip package. Then add a new Sensor Controller Task called ConvertISRC2TEMP, as shown inFigure 5.

Figure 5. SCS Task Name

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2. Next, select the properties of the task, by clicking on ConvertISRC2TEMP, as shown in Figure 6.

Figure 6. SCS Task Properties

3. Enable the ADC, ISRC, System CPU Alert, and RTC-Based Execution Scheduling. Your task resourceview should look like Figure 7.

Figure 7. SCS Peripherals

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Under the ConvertISRC2TEMP task, there are three code sections.4. Click on the first section called Initialization Code.5. Click on the Add button, and choose Data structure = output, Member name = adcOutVal, Value = 0,

and then click OK (see Figure 8).

Figure 8. SCS Add Data Structure Member

The defined task has three main code sections: Initialization, Execution, and Termination code. Seethe help file in the Sensor Controller Studio and the training in SimpleLink Academy for detailedexplanations of the syntax.

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6. Copy the following code into your project:Initialization Code:// Schedule the first executionfwScheduleTask(1); //x*250ms

Execution Code:// Enable ISRC with 20 µA output, and then enable the temperature measurement with a// 50 kΩ resistor. This gives a nominal output voltage of 1 V, which will// vary with temperature.

U16 current = ((BV_ISRC_CURR_0P25U | BV_ISRC_CURR_0P5U) | (BV_ISRC_CURR_1P0U +BV_ISRC_CURR_2P0U)) | (BV_ISRC_CURR_4P5U | BV_ISRC_CURR_11P75U);

//Only one resistor value allowed

U16 resistor = ISRC_TEMP_MEAS_RES_50_KOHM;

isrcEnable(current);isrcEnableTempMeasWithAdc(resistor);

// For better precision, we can disable the ADC input scaling if this does not// violate the maximum input rating of the ADC.adcDisableInputScaling();

// Sample the temperature dependent voltage using the ADC. For better precision,// perform multiple ADC measurements and calculate the sum or average of the// resulting ADC values.U16 adcVal;adcReadFifo(adcVal);adcGenManualTrigger();

output.adcOutVal= adcVal;

// Disable ADC, temperature measurement, and ISRC.

// - isrcDisableTempMeasWithAdc() MUST always be called after temperature// measurement.// - isrcDisableTempMeasWithAdc() MUST be called before isrcDisable().

adcDisable();isrcDisableTempMeasWithAdc();isrcDisable();

fwGenAlertInterrupt();fwScheduleTask(1);

We are now ready to test our code with the built-in task testing panel.

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5.2 Task Testing PanelThe Task Testing panel is used to test a single Sensor Controller task on a physical CC13xx device.Sensor Controller Studio takes over the role of the System CPU application and interacting with theSensor Controller task through an XDS100, XDS110, or XDS200 JTAG debug probe.

All data structure variables are captured after each task iteration, and can be saved to CSV files forexternal analysis. It is also possible to load and apply new data structure variables between taskiterations.1. To test your project, click on the Task testing section (ctrl + t).2. On this page, ensure that your project and task are selected, and also ensure that Run Execution

Code is listed in the Task iteration action sequence listbox. Your setup should be similar to Figure 9.

Figure 9. Task Testing

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3. Click on the connect button (F12) and then click on the run button (F5). You should see a graph similarto Figure 10.

Figure 10. Task Testing Output Window

Test the application by either lowering or increasing the temperature – observe that the value changesaccordingly.

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Appendix ASWRA589–November 2017

Characterization Results

A.1 OverviewThe results of the characterization measurements described in Section 3 follow.

Figure 11. Characterization Results Overview


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Table 8. DUT 1 Characterization Results, Two Samples Per Voltage Level

Temperature °C DUT 1 at 1.83 V DUT 1 at 3.00 V DUT 1 at 3.60 V90 3186 3188 3208 3210 3224 322180 3122 3123 3145 3145 3157 315870 3059 3061 3077 3080 3093 309360 2996 2994 3016 3016 3031 303050 2931 2931 2952 2952 2966 296440 2864 2865 2887 2886 2898 290030 2801 2803 2822 2821 2836 283520 2738 2738 2758 2758 2770 276910 2673 2673 2690 2692 2706 27050 2607 2610 2628 2627 2641 2639

-10 2545 2545 2563 2565 2576 2578-20 2480 2482 2500 2500 2512 2513-30 2416 2415 2435 2434 2449 2449


Temperature °C DUT 2 at 1.83 V DUT 2 at 3.00 V DUT 2 at 3.60 V90 3104 3105 3121 3120 3133 313480 3039 3039 3053 3056 3067 306970 2973 2972 2989 2988 3000 300060 2907 2908 2924 2923 2935 293450 2841 2842 2856 2856 2868 286940 2773 2774 2789 2789 2802 280030 2709 2709 2724 2724 2736 273620 2644 2641 2660 2657 2669 267010 2578 2576 2591 2590 2603 26040 2512 2512 2526.5 2525 2539 2539

-10 2446 2447 2462 2461 2475 2472-20 2383 2383 2397 2395 2407 2407-30 2315 2317 2330 2329 2342 2340



-10 2459 2460 2478 2478 2490 2490-20 2398 2397 2414 2415 2428 2428-30 2334 2333 2351 2351 2364 2364

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-10 2509 2511 2526 2525 2539 2539-20 2447 2449 2464 2465 2477 2477-30 2383 2383 2399 2401 2411 2412


Temperature °C DUT 5 at 1.83 V DUT 5 at 3.00 V DUT 5 at 3.60 V90 3105 3106 3124 3124 3139 313980 3041 3043 3061 3061 3074 307470 2977 2977 2996 2994 3009 300960 2912 2912 2931 2930 2943 294350 2845 2846 2863 2862 2875 287640 2780 2780 2797 2797 2811 280930 2715 2715 2733 2732 2745 274520 2650 2650 2666 2668 2679 268110 2583 2586 2601 2601 2614 26160 2521 2521 2540 2536.5 2552 2550

-10 2457 2459 2474 2472 2486 2486-20 2394 2394 2409 2409 2423 2421-30 2331 2329 2345 2345 2358 2357

Table 13. rDUT 6 Characterization Results, Two Samples Per Voltage Level


-10 2470 2467 2485 2487 2497 2502-20 2405 2405 2419 2421 2434 2433-30 2338 2338 2354 2356 2368 2368

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