capacitance tomograph for dynamic process imaging piotr brzeski, jacek mirkowski, tomasz olszewski...

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Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN Institute of Radioelectronics Division of Medical and Nuclear Electronics Warsaw University of Technology ul. Nowowiejska 15/19, 00-665 Warsaw, POLAND

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Page 1: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Capacitance Tomographfor Dynamic Process

Imaging

Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI,

Waldemar SMOLIK, Roman SZABATIN

Institute of RadioelectronicsDivision of Medical and Nuclear Electronics

Warsaw University of Technologyul. Nowowiejska 15/19, 00-665 Warsaw,

POLAND

Page 2: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

• The aim of the work – real time dynamic process imaging– configurable work mode

• 8, 12, 16, 32 electrodes tomographic probe• 4 planes * 8 electrodes tomographic probe• 32 electrodes capacitance meter

• Tools– modern instrumentation amplifiers– programmable logic devices

Page 3: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Capacitance Tomograph Modular Design

Serial

Interface RS-422

Analogue to Digital Processing

To the Host PC

Power Management Card

Logic Control

Main Sequencing PLD ALTERA EP1K50TC144

Power Supply

Process Control Card

Signal Card PLDs ALTERA EPM7064AETC44

Motherboard PLDs ALTERA EPM7064AETC44

Motherboard

16 Signal Cards

Page 4: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Signal card schematic diagram

Scale Sheet

Size FCSM No. DWG No. Rev

2 of 4

C 0 O.K.

Electronic Capacitance Meter ECM1WARSAW UNIVERSITY OF TECHNOLOGYINSTITUTE OF RADIOELECTRONICSNowowiejska 15/1900-665 Warsaw, Poland phone/fax +48 22 825 13 63

Measuring Card (1 of 16)

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

P1

PHOENIX 1862713

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16P2

PHOENIX 1862713

AGND

AGND

+12V

C1110nAGND

-12VC1310n

C123u3

AGND

AGND

C22100n

C21100n

AGND

EL_2

C234n7

R1

VCC

C26

33n

R3

C31

1u0

C151u0

TDI

1

i/o2

i/o3

GN

DIO

4

i/o5

i/o6

TMS

7

i/o8

Vcc

IO9

i/o10

i/o11

i/o12

i/o13

i/o14

i/o15

GNDINT16

VccINT17

i/o18

i/o19

i/o20

i/o21

i/o22

i/o23

GN

DIO

24i/o

25TC

K26

i/o27

i/o28

Vcc

IO29

i/o30

i/o31

TDO

32i/o

33

i/o34

i/o35

GNDINT36

GCLK137

OE138

GCLRn39

OE2/GCLK240

VccINT41

i/o42

i/o43

i/o44

U1

EPM7064ATC44

EL_1

WAV2WAV 3

nRSELnTSELnCSELMAD3

MAD2MAD1MAD0

RESC0

VCC3

DGND

C1100n

C2100n

C4100n

C3100n

VCC3

AGNDDGND

A0A1

+12V

-12V

C37

10n

C36

3u3

C39

10n

C38

3u3

AGNDAGND

AGND AGND

C103u3

3

21

84

U3A

AD826

5

67

U3B

AD826

1514

16

U4BADG442BR

1011

9U4CADG442BR

+15V

AGND

S5

S6

V-3

S1A4

S2A5

S3A6

S4A7

DA8

V+

14

DGND15

A01

A116

EN2

U6A

ADG409

DGND

-12V

+12V

VCC3

SFB0SFB1

AGND

C32

1u0

AGND

R2

DB9

S4B10

S3B11

S2B12

S1B13

U6B

ADG409

R4

C254n7

DGND

SFB2

C2433n

ENA

12345678910

JP1BBlaster

DGND

DGNDVCC3

C5100n

TDI

TMSTDOTCK

R211k

R241k

R221k

R231k

VCC3

VCC3 VCC3

VCC3

S5

S6

S12

S5

S6

AM

1S

KW

20

SK

W10

AM0S12

EN

AS

FB0

SFB

1

SFB

2

A0A1

DGND

VCC

AGND AGND

AGNDAGND

VDD

VEE

C46

4u7

C47

4u7

C48

4u7

C49

4u7

C42

4u7

C43

4u7

C44

4u7

C45

4u7

AGND AGND AGND AGND

AGNDAGNDAGNDAGND

+5V +12V

-12V-5V

A015

A116

FB12IN-

4

IN+5

REF10

Vout11

Vo1

1Vo

29

Vos

6

Vos

7

DGND14

+Vcc

13-V

ee8

U8PGA206U

AGND

DGND

+15V

23

1

135 4

U 1 3 AA D G 4 4 2 BR

1514

16

U 1 3 BA D G 4 4 2 BR

CW Z1

C

AGND

2 3

1

1354

U 1 4 AA D G 6 1 2 YRU

AGNDDGND

SK W 1

SK W 2

C6 1 u 0

AGND

CW Z2

C

15 1416 U 1 4 B

A D G 6 1 2 YRU

SCW1

SCW2

DGND

SK W 5

SK W 6

-5V

C7

1 u 0

AGND+5V

C8

1 u 0

AGND

SK W 1SK W 2SPA RE

SK W 5

SK

W6

CH A R_ 1

2 3

1

1354

U 5 AA D G 4 4 2

+12V

C19

1u0

AGND

DGND

C20

1u0

AGND

-12V

A N _ O U T

A N _ O U T

MA D 3

MA D 2

MA D 1

MA D 0

RESC0DGND

WA

V1

AGNDWAV 1

DGNDWAV 2

AGNDWAV 3

WAV 4

AGNDn RSEL

DGNDn TSEL

AGNDn CSEL

AGND

VDD

VEE

+15V

WAV 4

C17

1u0

V-3

S1A4

S2A5

S3A6

S4A7

DA8

V+

14

DGND15

A01

A116

EN2

U15A

ADG409

DGND

-12V

+12V

VCC3

AM0AM1

AGND

C18

1u0

AGND

2 3

1

1354

U4AADG442BR

+15V

DGND AGND

C1610n

AGND

S12

AGND

EL_ 2EL_ 1

SCW1SCW2

O U T_ MU X CH A R_ 2

76

8

U 1 3 DA D G 4 4 2 BR

1011

9

U 1 3 CA D G 4 4 2 BR

AGND

SK W 1 0

SK W 2 0

C9 1 0 n

AGND

SPARE

IN8

OUT1

GN

D2

GN

D3

GN

D6

GN

D7

U9 LM78L05ACM

IN8

OUT1

GN

D2

GN

D3

GN

D6

GN

D7

U10 LM78L12ACM

IN2

OUT1

IN3

IN6

IN7

GN

D5

U11 LM79L05ACM

IN2

OUT1

IN3

IN6

IN7

GN

D5

U12 LM79L12ACM

IN7

OUT1

SD5

GN

D4

NR

3

ERR6

IN8

OUT2

U2 ADP3301AR-3.3

C41

0u47

DGNDDGND

C40

4u7

V-3

S1A4

S2A5

S3A6

S4A7

DA8

V+

14

DGND15

A01

A116

EN2

U7A

ADG409

C33

1u0

+12V

AGND

-12V

C34

1u0

AGND

VCC3

AGND

DB9

S4B10

S3B11

S2B12

S1B13

U7B

ADG409

AGND

Page 5: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Capacitance tomograph – ET2

Page 6: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Sensors

Page 7: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Measurement error in channel std/avg[%]

measured value = 3,3 pF, N = 100avg - average value from N=100 measurements,

std - standard deviation

0,00

0,01

0,02

1 4 7 10 13 16 19 22 25 28 31 34

Page 8: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

ET2 software main window

Page 9: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Images from the ET2 tomograph

One, two and three Teflon rods.

Page 10: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Flow images of oil in a shaken probe

Page 11: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Images of 7 rods

Page 12: Capacitance Tomograph for Dynamic Process Imaging Piotr BRZESKI, Jacek MIRKOWSKI, Tomasz OLSZEWSKI Andrzej PLĄSKOWSKI, Waldemar SMOLIK, Roman SZABATIN

Conclusions– real time dynamic process imaging

(300 frames/s)– reconfiguration for different work mode

Future work– optimisation of a capacitance measuring

circuit to achieve improved signal to noise ratio

– controlled amplification for electrode pairs– iterative algorithms for image

reconstruction to improve image quality