can we trust the image?

23
Can we trust the image? So far, OTR is the reference as long as there is no COTR! A very rough summary of an interesting and exiting workshop. The following slides should force a discussion!!!

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Can we trust the image?

So far, OTR is the reference as long as there is no COTR!

A very rough summary of an interesting and exiting workshop.

The following slides should force a discussion!!!

4

Measurement at 130 MeV• Comparison to beam size measurement with optical transition radiation shows good agreement down to

60 µm rms

• Gauss fit to beam size; error bars represent statistical variation in 5 images each

• 200 pC electron beam

Rasmus Ischebeck – Scintillators for SwissFEL

CdWO4 (500µm thick): 13.5 µm

Thickness (µm)

500 400 200 100 5

CdWO4 13.5 10 8 7 -

LuAG - 10 8 - -

P43 - - - - 6

● Nominal electron beam (K=1%)

● constant current

● camera mag = 1

● pixel size 4.65 µm

PSF width for several screens

Screen Resolution Results

Gero Kube, DESY / MDI

Results vertical beam size

horizontal beam size

10-2

10-1

100

101

102

103

25

30

35

40

45

50

55

60

I / nA

σ y / µ

m

BGO 0.5mmPWO 0.3mmLYSO 0.5mmLYSO 0.8mmYAG phosphorYAG 0.2mmYAG 1.0mm

Wire Scanner @ 31 nA

10-2

10-1

100

101

102

103

20

30

40

50

60

70

80

90

100

110

I / nA

σ x / µ

m

BGO 0.5mmPWO 0.3mmLYSO 0.5mmLYSO 0.8mmYAG phosphorYAG 0.2mmYAG 1.0mm

Wire Scanner @ 31 nA

mean values

0 10 20 30 40 50 60

BGO, 0.5mm

PWO, 0.3mm

LYSO, 0.5mm

LYSO, 0.8mm

YAG, 0.2mm

YAG, 1.0mm

YAG phosphor

σy / µ m

WS

0 20 40 60 80 100 120

BGO, 0.5mm

PWO, 0.3mm

LYSO, 0.5mm

LYSO, 0.8mm

YAG, 0.2mm

YAG, 1.0mm

YAG phosphor

σx / µ m

WS

dependency on observation geometry

Workshop on Scintillating Screen Applications, 15.2.2011

14.02.2010 Workshop on Scintillating Screen Applications @ GSI

Eiko Gütlich

Light yield and profile width @ low intensityBeam parameters: 40Ar10+, 11.4MeV/u, 2*109 Ions/Pulse in 100µs, ~30µA, 2.4Hz, 1000 beam pulses

Difference of 14%in profile width is not negligible forquantitative evaluation

Results:

• reproducible behavior

• different light yield and width reading

• light yield does not correlate with beam width

• different beam shape(from higher stat. moments)

Average temperature: ~47°C (backside of ZrO2:Mg)

14.02.2010 Workshop on Scintillating Screen Applications @ GSI

Eiko Gütlich

What is the useful operating range of an Al2O3 Screen?

4.8 MeV/u

4.3*1010 ppp

5ms

11.4 MeV/u

1.8*1010 ppp

1,2 ms

Same pulse energy

(~similar flux [ions/(cm² s)])

Result: Light yield is the same for both energies. For the 11.4 MeV/u case, the imaged beam profile does not math to both reference methods.

14.02.2010 Workshop on Scintillating Screen Applications @ GSI

Eiko Gütlich

Light yield and profile width @ higher intensity

~10 times higher beam current

Results:• light yield and profile width depend on material• different dynamical behavior • possible reasons: material modification and temperature dependency• for the zircon oxides the behavior is clearly temperature dominated

Average temperature: ~200°C (backside of Al2O3)

Beam parameters: Ar10+, 11.4 MeV/u, 3.3*1010 Ions/Pulse in 0.2ms, 260µA, 1.7Hz, 1000 Pulse

Difference of 30%in profile width is not negligible forquantitative evaluation

14.02.2010 Workshop on Scintillating Screen Applications @ GSI Eiko Gütlich

The radial dose distribution of an ion track

Courtesy of Marek Skupinski (Uppsala) Sn < 1% of Stot

Threshold of Michaelian et al. obtained

for CsI:Tl

The camera can see all energies (depth) weighted with a Lambert-Beer absorption

Concept also valid for electron beams?

Results: Profile Reproduction300MeV/u

Beam

wid

thσ(

mm

)

Number of particles

σ of a Gaussian fit

Position(mm)

Position(mm)

CsI:Tl and YAG:Ce shows broad profile P43, Al2O3:Cr, Al2O3→similar profileHerasil→small profile→small width

Position(mm)

13

Spectra of fast (τ < 2 ns) intraband (IBL) luminescence under irradiation by single nanosecond 300-keV electron pulses of the

Kovalchuk-Mesyats-type generator

Spectrum of hole-IBL

Ev

Phot

on e

nerg

y

Intensity

Ec

Ev

Eg

e-IBL

h-IBL

c-band

v-band

Ec > Eg > Ev

non-radiative relaxation

radiative relaxation

Photon Energy (eV)2 3 4 5 6 7

Inte

nsity

0

5

10

Inte

nsity

0

50

100

MgO 730 K

LiF80 K 300 K

A. Lushchik, Ch. Lushchik, M. Kirm, V. Nagirnyi, F. Savikhin, E. Vasil'chenko, Nucl. Instr. and Meth. B 250 330 (2006)

Intraband luminescence (IBL)

14

c-band

v-band

Eid

2

2'1

5

4',5' 11Eg

Ev

4

3'EeEn

ergy

Eid*

1

3

(a) (b) (c) (d)

Three mechanisms of MEE in dielectrics:(a) electron-hole, (b) excitonic and (c, d) solid-state analogue of the Franck-Hertz effect in gases. QY >1

Multiplication of electronic excitations (MEE)

SolutionsSome proposals

Simulation Results. Influence of scintillator matierial

• The best resolution is achieved in BGO crystal with the biggest refractive index among the 3 materials.

• larger refractive index seems to have better resolution (but weak influence)

Collated Powder-Screen Data• Evaluation of reports on beam imaging show trend after

invoking Eq. 1 for determining resolution term.• Collect additional data reports at this workshop.

A.H. Lumpkin Scintillator WS February 14, 2011

17

0 200 400 600 800

0

50

100

150

200

250

300

350

Screen Thickness (µm)

Res

olut

ion

sigm

a (µ

m)

Chromox,EPAC08

Chromox,Linac98

YAG:Ce,FEL10

YAG:Tb,PAC01 YAG:Ce,x

DIPAC09

Motivation• Scintillation screen + gated cameraCamera image: FLASH, 13SMATCH section, 9.Jan.2011

Al coated Si OTR screen, COTR light,Coherent SR

LuAG screen,COTR & scintillation light

LuAG screen+100ns delayOnly scintillation light

Off-axis screen

19

Spectra of fast (τ < 2 ns) intraband (IBL) luminescence under irradiation by single nanosecond 300-keV electron pulses of the

Kovalchuk-Mesyats-type generator

Spectrum of hole-IBL

Ev

Phot

on e

nerg

y

Intensity

Ec

Ev

Eg

e-IBL

h-IBL

c-band

v-band

Ec > Eg > Ev

non-radiative relaxation

radiative relaxation

Photon Energy (eV)2 3 4 5 6 7

Inte

nsity

0

5

10

Inte

nsity

0

50

100

MgO 730 K

LiF80 K 300 K

A. Lushchik, Ch. Lushchik, M. Kirm, V. Nagirnyi, F. Savikhin, E. Vasil'chenko, Nucl. Instr. and Meth. B 250 330 (2006)

Intraband luminescence (IBL)

Use of OTR for highly charged Ion beams possible?

We need High Dynamic Range!With µm resolution!

Log. Intensity (Lux)0.001 0.01 0.1 1 10 100 1000 104 105 106

Resp

onse

CCDCMOS60 dB

Human Eye100 dB

HDR> 120 dB

• And screen material with no degradation (radiation damage) and saturation.

Further Topics

• Common set of parameters for comparison.

• Camera shielding/rad hard devices

• Light yield/efficiency/uniformity of various materials (sorry for not treating in the summary)

Have a save trip home!