brookhaven national laboratory march 2 th 2012 the cdf run ii silicon vertex detectors: operational...
TRANSCRIPT
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Brookhaven National Laboratory March 2th 2012
The CDF Run II Silicon Vertex Detectors:
operational experience, aging studies and
trigger applications
Benedetto Di Ruzza
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Introduction
I’m working in CDF since 2004.
I had my Ph.D. working in the measurement of the branching ratio of the Bs to phi, phi decay in CDFII:
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the decay
the measurement method
the result
event selection
…..but this talk I will describe the other things I have done in CDFII
http://www-cdf.fnal.gov/physics/new/bottom/090618.blessed-Bsphiphi2.9/
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OUTLINE
1) The CDF II detector
2) The CDF II silicon sub-detectors
3) Silicon sensors aging studies
4) The Secondary Vertex online Trigger (SVT) at CDFII
5) Impact on the physics results
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The Tevatron and the CDFII detector
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– Delivered: 11.995 fb-1– Live: 9.977 fb-1(83.2%)
The Tevatron and the CDFII detector
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The CDFII Detector
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L00
1 Layer
(ISL)
The Silicon Detectors
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The CDFII Silicon detectors
L00: Single-sided strips: “Narrows” (SGS Thomson and 2 Microns)
“Wides” (Hamamatsu).
SVX: Double-sided strips: Layers 0,1,3 (Hamamatsu) perpendicular strips,
Layers 2,4 (Micron) small angled strips.
ISL: Double-sided strips: (Hamamatsu+Micron) small angled strips
OVERVIEW
All the sensors were silicon microstrips with barrel geometry, no pixel, no forward disks.In all the ladders the readout chip was the custom designed chip SVX3D.
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<== X-Y (r-phi) and Y-Z (r-z) views
The Silicon Detectors
L00 detail ==>
Beam pipe
Cooling linesnarrow sensors
wide sensorscarbon support
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The Silicon Detectors: SVXII
SVXII detail:3 barrels5 layers12 wedges
SVXII: the readout is used directly in the trigger.
R
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The Silicon Detectors: ISL
ISL central
ISLforward:(inner and external barrels)
1 m
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Radiation damage
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Aging studies: variables of interest
Information on integrated radiation dose in a sensor is obtained by evolution of bias current: evolution of bias current: provides “direct” information on the crystal
condition, due to increase in leakage current. Change in leakage current is linear with the absorbed dose ∆Ileak = α ∆Φeq , measured in 1-MeV neutron equivalent fluence [cm−2] (α is the damage factor)
evolution of depletion voltage: evolution of depletion voltage: gives information on our ability to deplete the sensors in the future. Its extrapolation predicts the need to raise applied bias voltage and its limit.
Signal-over-noise (S/N) studies:Signal-over-noise (S/N) studies: provide estimates of usability of the detector in charged particle tracking and in turn for physics analyses.
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Evolution of bias current
Expected behaviour of bias current in a silicon strip during data taking at fixed temperature:
Even if the bias voltage is constant the current increase due to radiation damage
Bias current ( A)
Bias voltage (V)
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Depletion VoltageDepletion voltage is the bias voltage required to get rid of free carriers in the
bulk of the detector.
The expected evolution depends on the dose (Hamburg Model):
Before type inversion the depletion voltage decreases due to the reduction in the amount of free carriers
After type inversion, depletion voltage steadily increases.
Sensor can operate while the Bias Voltage is below the Breaking Voltage Sensor can operate while the Bias Voltage is below the Breaking Voltage
R. Wunstorf, Ph.D thesis, Hamburg University (1992)
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Parametrization of the variation of
Depletion Voltage evolution
See: RD50 Collaboration http://rd50.web.cern.ch/rd50
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Depletion voltage Measurement
From charge (signal) collection efficiency:From charge (signal) collection efficiency:Charge collection is proportional to the depleted
volume.Fully depleted sensor charge collection
efficiency saturates.Extracted track residual information.Can be performed on single sided and double
sided microstrips.This measurement is beam-time consuming.
From the noise at the n-side:From the noise at the n-side:Thermal noise from free carriers on the n-side is
reduced with depletion (on the p-side)Is possible only on double sided microstrips
before the inversion.This measurement is not beam-time consuming
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Depletion Voltage study – Signal Vs. Bias
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Plot charge collected for different bias voltages
CDF defines depletion voltage, Vd, as the minimum voltage that collects 95% of the charge at the plateau
Depletion Voltage as a function of integrated luminosity
3rd order polynomial fit around the inversion point Linear fit to extrapolate to the future
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Depletion Voltage study: Signal Vs. Bias Voltage
More details in R. Ballarin Ph.D. thesis: http://lss.fnal.gov/archive/thesis/fermilab-thesis-2011-28.shtml
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Depletion Voltage evolution observed in L00 and SVX-L0
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Preliminary results for L00 Preliminary results for L00 Preliminary Preliminary
results for SVX-results for SVX-L0L0
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Preliminary result on L00:
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We are trying to see the behavior of different vendors: Studies still ongoing
Dose (Mrad)
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Signal / Noise projection
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Not only the sensors are in a radiation environment
VME crates
CAEN SY527
SEU requires FPGA and fuse replacement on FIBS (~2/year)
• Power Supplies need replacement capacitors every ~4 years
● DOIM TX light output decreases linearly with radiation dose
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Radiation Field inside the detectorMeasured using ~1000 thermo-luminescent dosimeters (TLDs)
See:R.J. Tesarek et al., "A Measurement of the Radiation Environment in the CDF Tracking Volume", Proceedings RESMDD02 conference, 10-13 July 2002, Florence, ITALYSee also:http://cdf-radmon.fnal.gov
Location of the dosimeters
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The radiation intensity change during thecollider operation:
dose rate during beam injection and data taking
Dose rate
Beam injection
Data taking
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Beam dose during beam injection and data taking
beam injection Data taking
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Beam losses
beam injection data takingBeam intensity measurement
(fly wire scans)
beams lossesabort gap losses
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Dose rate during beam dump
Clean abort Quench
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The annealing
This is what happens to the bias current stopping the irradiation andincreasing the temperature: test beam studies shows that the bias currentstart to decrease for a fixed bias voltage.
M.Moll (RD50 Coll.) Ph.D. thesis, Hamburg University 1999https://mmoll.web.cern.ch/mmoll/thesis/pdf/moll-thesis.pdf
R. Wunstorf, Ph.D thesisHamburg University 1992
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The annealing: effects on the Depletion Voltage
M.Moll et al, NIMA 439, 282-292 (2000)
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Preliminary results in CDF:
PRELIMINARY
cooling system trip
Operative temperature: -5 degree CelsiusMeasurement Temperature: +18 degree Celsius, Vbias = fixed
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Preliminary results
PRELIMINARY
cooling system trip
Operative temperatute: -5 degree CelsiusMeasurement temperature +18 degree Celsius, Vbias =fixed
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Wirebond Resonances
See: Gino Bolla et al.http://www-cdf.fnal.gov/upgrades/silicon/TASK-Force/line3/line3.html
Problems induced by trigger rates:
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Effect of the readout chips heatingIn SVXII the readout chip is in touch with the cooling line, the sensor is not cooled directly: simply switch ON/OFF the chips the bias current in the ladder change a lot.
Bias current ( A)
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EDIT 2012 Benedetto Di Ruzza 35
Effect of the readout chips heating
This effect was not observed in L00 ladders where the sensor itself is cooled and the chip is far from the sensor.
Bias current ( A)
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SVT trigger in CDFII:how use silicon information to trigger
secondary vertex events
A trigger on secondary vertex: required if we want to look for events with no leptons
in the final state, but only tracks.SVT idea: trigger on events with high impact parameter tracks.
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The SVT trigger in CDFII
Silicon input: r-phi hits from SVXII
Drift chamber tracks parameters
1 5SiliconSVX R/OISL R/OL00 R/OSVTLoad in L3
Time Since L1 trigger Accept (sec)
Digitizer-phi
20 25
R/OR/O (16us Read-All)
r-z
SVT Processing
10 15Setup
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Boards implementation
Hit Finder boards
Merger board
Associative Memory++ board:512 kpatterns stored
Hit Buffer board
Track Fitter board
to Level 2
tracks parameter s
From drift chanber
12 fibers
hits
roads
hits
x 12 phi sectors
Pulsar board:Sequencer & duplicate Road Warriorraw data from
SVXII front end
road& hits
tracks
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FF FF FF FF
FF FF FF FF
FF
FF
FF
FF
FF FF FF FF
word word word word
Layer 1 Layer 2 Layer 3 Layer 4
HIT
Patt 0
Patt 1
Patt 2
Patt 3
Output B
us
HIT HIT HIT
The matching algorithm require at least 4 match over 5
Pattern
Associative memory: parallel patter recognition
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Some results
Semi leptonic component Only hadronic component
Bs/Bsbar oscillation measurement:Phys.Rev. Lett. 97, 242003 (2006)
www-cdf.fnal.gov/physics/new/bottom/060831.blessed-Bsmix/
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Some results
B cascade observation:Phys. Rev. D 80, 072003 (2009)
http://www-cdf.fnal.gov/physics/new/bottom/110714.blessed-Xib0/
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Conclusions
The CDF Run II silicon detectors were still in quite good shapeafter 10 years of operation.
The inner layers were showing consistent post-inversion behavior.
The SVXII r-phi readout was successfully used in a hardware secondary vertex trigger (SVT) and allowed to collect huge sample of all hadronic Bs decays.
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Benedetto Di Ruzza 43
Back-up slides
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Fermilab accelerators chain
44 Benedetto Di Ruzza
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Benedetto Di Ruzza 45
The Tevatron
BS=Beam sync ticks =132ns
Bunches structure
Available Pbars (10+10)
Initial luminosity record: 4.05 x10+32 (cm-2 s-1)Mean Pbar production efficiency: ~ 22 x10-6
Mean Pbar Accumulation rate: ~ 25x10+10 (hr-1)
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Benedetto Di Ruzza 46
Other Operational Challenges
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Measured Radiation Field
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• Radiation field measured with TLDs outside the silicon volume in 2002-2003.• NIM A514 188 (2003)• Bias current evolution 2002-2004 consistent with this radiation dose
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Benedetto Di Ruzza 48
Inversion point
(SGS Thomson)
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Benedetto Di Ruzza 49
Silicon D.A.Q. for SVX II
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Benedetto Di Ruzza 50
Evolution of Bias currents
(R. J. Tesarek et al. NSS 2003)
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Benedetto Di Ruzza 51
ISL cooling lines
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52
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Benedetto Di Ruzza 53
SVXII.
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Benedetto Di Ruzza 54
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