atomic layer deposition for scrf rf in the mta 11/15/10 j. norem anl/hep
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Atomic Layer Deposition for SCRF
RF in the MTA 11/15/10
J. NoremANL/HEP
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Atomic Layer Deposition
Atomic Layer by Layer Synthesis Method similar to MOCVD Used Industrially
– Semiconductor Manufacture for “high K” gate dielectrics• “Abrupt” oxide layer interfaces• Pinhole free at 1 nm film thicknesses• Conformal, flat films with precise thickness control
– Electroluminescent displays• No line of sight requirement• Large area parallel deposition
Parallel film growth technique; Inside of large tubes can be done at once.
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ALD Reaction Scheme
•ALD involves the use of a pair of reagents.• each reacts with the surface completely• each will not react with itself
•This setup eliminates line of site requirments•Application of this AB Scheme
•Reforms the surface•Adds precisely 1 monolayer
•Pulsed Valves allow atomic layer precision in growth•Viscous flow (~1 torr) allows rapid growth
•~1 m / 1-4 hours0
500
1000
1500
2000
2500
3000
3500
4000
0 500 1000 1500 2000 2500 3000AB Cycles
Th
ick
nes
s (Å
)
Ellipsometry Atomic Force Microscopy
• Film growth is linear with AB Cycles• RMS Roughness = 4 Å (3000 Cycles)• ALD Films Flat, Pinhole freeFlat, Pinhole-Free Film
Seagate, Stephen Ferro
• No uniform line of sight requirement!• Errors do not accumulate with film
thickness.• Fast! ( m’s in 1-3 hrs ) and parallel• Pinholes seem to be removed.• Bulk
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Apparatus
Hot wall reactor (RT-400 C) Always coat the wall – now it will be useful
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Demonstrated ALD A/B Reactions
Oxide Nitride S/Se/Te Ph/As C FElement
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Aerogels coated with W
Conformal Coating and “sharp” points Aerogels are low density nanoporous materials consisting of bundles of
nm scale filaments ALD can be used to deposit W metal atomic layer by layer on this
filaments
10 nm filaments
150 nm
Overall Reaction: WF6 + Si2H6 → W + products
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• Aerogel filament diameter increases with ALD W Cycles
SEM
TEM
80 nm
3 c W 7 c W
80 nm
Microscopy of W-Coated Carbon Aerogels
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Goal of ALD SCRF
Build “nanolaminates” of superconducting materials
~ 10- 30 nm layer thicknesses
Nb, Pb
Insulating layers
Higher-TcSC: NbN, Nb3Sn, etc
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Conclusions
ALD is an intriguing synthesis technique with many useful properties
Conformal coating means increased radius of curvature
Parallel (non-line of sight) method
– Flat samples directly map to complex shape samples even with high aspect ratios
– Layer by layer growth on complex shapes
Useful for higher field gradients in SRF and NCRF