ata8520e production and eol testing - microchip...

ATAN0160

ATA8520E Production and EOL Testing

APPLICATION NOTE

Features

• Test applies for EU and US version of the kits• Test application for production and EOL testing of ATA8520-EK1-F/

-EK3-F/-EK4-E/-EK6-E evaluation kits• PCB component tests, i.e., MCU, temperature sensor, button, LEDs,

power switch• ATA8520E device test for transmit/receive RF frequency, power level

and receive RF sensitivity• Crystal offset adjustment at room temperature (between 16°C to 32°C)• RSSI adjustment for SIGFOX receive mode• Configuration for 3V supply mode

Description

This application note explains the production and end-of-line (EOL) testing ofthe Atmel evaluation kits for the ATA8520E device. It can be used to adaptthe ATA8520E to other production environments and other MCU hostcontrollers, such as when the application is coded in ‘C’ and uses the SPIcommand set for the ATA8520E device.

The application tests the hardware components of the evaluation kit andextension boards. For the ATA8520E device the RF output power and RFreceiving sensitivity are measured. In addition, the crystal frequency offset ismeasured and the corrected temperature coefficients for the crystal arestored in the device. These coefficients are used for the RF calibration of thetemperature drift of the crystal.

Finally, the configuration data is written into the device, i.e., to select 3Vsupply and to enable or disable the downlink operating mode (datareception) and the RSSI value is adjusted with the gain for the externalcircuitry in the RX path of the ATA8520E.

Atmel-9415A-ATAN0160_Application Note-05/2016

Table of Contents

Features.......................................................................................................................... 1

Description.......................................................................................................................1

1. ATAB0102A/B PCB....................................................................................................31.1. Production RF Test Setup.............................................................................................................41.2. ATA8520-EK1-F and ATA8520-EK4-E Standalone Kit................................................................. 51.3. ATA8520-EK3-F and ATA8520-EK6-E Xplained PRO Extension Board.................................... 14

2. Crystal Frequency Compensation........................................................................... 22

3. ATA8520E – TX Operation Testing.......................................................................... 23

4. ATA8520E – RX Operation Testing..........................................................................24

5. Test Software...........................................................................................................25

6. References.............................................................................................................. 26

Atmel ATA8520E Production and EOL Testing [APPLICATION NOTE]Atmel-9415A-ATAN0160_Application Note-05/2016

2

1. ATAB0102A/B PCBThe ATAB0102A V1.0 is used for the ATA8520-EK1-F/-EK3-F US kits and the ATAB0102B V1.0 is usedfor the ATA8520-EK4-E/-EK6-E EU kits with the ATA8520E device. The kits and extension boards differonly in their BOM with mounted MCU and connectors. The test points relevant for kit manufacturing areshown in Figure 1-1 and are identical for the ATAB0102A and ATAB0102B PCB.

All connections marked in green are relevant for:

• SPI connections for ATA8520-EK3-F/EK6-E testing• Control signals for ATA8520-EK3-F/EK6-E testing• UART signals for ATA8520-EK1-F/EK4-E testing• Power supply for ATA8520-EK1-F/EK4-E testing• RF performance testing

The connection marked with red solid line is used for ISP programming of the ATmega328P device (ISP-µC/XISP1), test programs and EOL programming. The ATA8520E device is delivered preprogrammedand memory-locked, i.e., ISP connection (ISP-TRX/XISP2) is used for maintenance only. SPI commandshave to be used to read out the ID and PAC codes for SIGFOX registration. These ID and PAC codeshave to be printed on a label placed on the bottom of the PCB.

Figure 1-1. ATAB0102 PCB Layout with Test Points

The following table summarizes the test points and their purpose.


3

Table 1-1. Test Point Summary for PCB

Test Point Type Description

X1/1 Supply 3.3V supply voltage

X1/2 Supply GND


X2/19 Supply GND

X2/18 Digital SPI signal SCK

X2/17 Digital SPI signal MISO

X2/16 Digital SPI signal MOSI

X2/15 Digital SPI signal NSS

X2/14 Digital TxD signal

X2/13 Digital RxD signal

X2/9 Digital RF_EVENT

X2/6 Digital RF_PWRON

X2/5 Digital RF_NRES

XAnt RF analog RF antenna RX/TX

1.1. Production RF Test SetupThe test setup for the production RF testing is shown in Figure 1-2. The DUT should be shielded toachieve reliable results for the RX sensitivity measurements. The test setup requires the followingcomponents:

• RF Spectrum Analyzer up to 3GHz and 25dBm input• RF Signal Generator with data input for FSK modulation up to 1GHz• Arbitrary Waveform Generator to generate the data packet for FSK modulation• Alternatively an RF Test Signal Generator can be used, i.e., an ATAB0101A with test application• 3dB splitter and 20dB attenuator

The spectrum analyzer is required to calibrate the RF frequency and program the calibrated crystalcoefficients while the RF generator or RF test signal generator is required to measure the RX sensitivity.


4

Figure 1-2. Production RF Test Setup

1.2. ATA8520-EK1-F and ATA8520-EK4-E Standalone KitThe ATA8520-EK1-F and ATA8520-EK4-E kits are equipped with the ATmega328P and ATA8520Edevice. Figure 1-3 describes the test connections required for programming and testing. The ISPconnector XISP1 marked in red is used for programming the ATmega328P device using an Atmel-ICEJTAG debugger. The pins marked in green are used for power supply, for connection to a USB-2-COMport converter and for the RF signal. The following components are used for test flow control:

• the SW1 user button and the LEDs LED1 (red) and Power (green) for the ATAB0102A• the SW1 user button and the LEDs LED1 (red), Sensor Power (green) and Module Power (yellow)

for the ATAB0102B


5

Figure 1-3. ATA8520-EK1-F and ATA8520-EK4-E Test Points

The following table summarizes the test points and their purpose.

Table 1-2. ATA8520-EK1-F and ATA8520-EK4-E Test Point Summary

Test Point Type Description


X1/2 Supply GND

X2/14 Digital TxD signal

X2/13 Digital RxD signal

XAnt RF analog RF antenna TX/RX


6

1.2.1. ATA8520-EK1-F and ATA8520-EK4-E - ATMega328P Test ProgrammingThe ATmega328P is programmed using an Atmel-ICE JTAG debugger with a 6-pin ISP cable connectionto the ISP-µC connector XISP1. The PCB is powered with 3V supply through pins X2/20 with +3.0VX2/19 with GND.

The following steps have to be performed for programming:

1. Connect the debugger ISP cable to the ISP-µC connector2. Disable the CLKDIV8 fuse in the Fuses settings to support 8MHz MCU clock operation3. Program the Flash application

– ATA8520E_TXRX_US_ProdTest.hex for US kit ATA8520-EK1-F or– ATA8520E_TXRX_EU_ProdTest.hex for EU kit ATA8520-EK4-E

1.2.2. ATAB8520-EK1-F TestingFor testing the ATA8520-EK1-F an RS232 3VTTL-to-USB converter must be connected to the PCB andused as shown in Figure 1-4.

A test fixture provides the connections to the pins marked in green and to the reset pin on the connectorISP-µC using an external 3.0V/300mA power supply and the RS232 (3VTTL)-to-USB converter. The PCterminal software application is used with the virtual COM port connection and the UART settings:38.4Kbaud, 8bit, 1stop, no parity.

When pressing the reset button, the terminal shows an initialization screen with the ID and PAC code ofthe ATA8520E device. Pressing the SW1 button starts the test sequence.


7

Figure 1-4. ATA8520-EK1-F Test Setup

Table 1-3 shows the test sequence with areas which need to be checked in case a failure occurs. In Figure 1-5 an example of the PC Terminal output window is shown and Figure 1-6 shows the typicalspectrum and settings used for the RF testing.

Table 1-3. ATA8520-EK1-F Test Application Flow

TestStep

Action Description Terminal Output (Figure 1-5)Measurement Result (Figure 1-6)

Check PCBATAB0102A

or{ATAB8520E-V1.0 FCC}

1 Press theReset button

ATA8520E device version “ATA8520E-V2.3” U1, {U1 SPIoperation}

ATA8520E ID code for label “ID=000BFA3F” (example) U1, {U1 SPIoperation}

ATA8520E PAC code forlabel

“PAC=B23456DFB8C7A39A”(example)

U1, {U1 SPIoperation}

Supply voltage in mV “Usens = 2970mV” (example) or“Vsup error!”

U1, Q1, R21,R22


8

TestStep


Check PCBATAB0102A


Temperature value in °C “T_ext = 23°C” (example) or “Tsensor error!”

Q1, U3

LEDs are flashing LD1, LD2

2 Press SW1 Transmit RF CW test signal902.2MHz and performfrequency offsetcompensation

“TX-Test: f = 902.200 MHz”“measure 902.xxxMHz - ”

{XTAL1,IC1}, SW1

Enter RF freq. [kHz] part “188” (example) (see Figure 1-6) {XTAL1,IC1}, SW1

Check TX frequency afteroffset compensation

“Check TX: f = 902.2MHzP = 22 to 23dBm "(see Figure 1-6)

{XTAL1,IC1}, SW1

Receive RF signal from testtransmitter

“RX-Test: f = 905.2Hz” {SAW1, IC1}

Show receive result "+++++++++++ ok (0 of 1001 bitsfailed)"

{SAW1, IC1}

Test result “Test PASSED” or “Test FAILED”

If one of the terminal output messages is missing or does not show a value or the measurement result isnot correct, the listed PCB areas and components have to be checked in detail.


9

Figure 1-5. ATA8520-EK1-F Test – PC Terminal Output

The spectrum during the RF TX testing is shown in Figure 1-6 as a conducted measurement like the RXsensitivity testing with test setup shown in Figure 1-2. The RF spectrum shows the CW RF signal at thetarget RF frequency of 902.2MHz with a RF power level of 22 to 23dBm

Figure 1-6. ATA8520-EK1-F Test – RF Spectrum


10

1.2.3. ATAB8520-EK4-E TestingFor testing the ATA8520-EK4-E an RS232 3VTTL-to-USB converter must be connected to the PCB andused as shown in Figure 1-7.

A test fixture provides the connections to the pins marked in green and to the reset pin on the connectorISP-µC using an external 3.0V/100mA power supply and the RS232 (3VTTL)-to-USB converter. The PCterminal software application is used with the virtual COM port connection and the UART settings:38.4Kbaud, 8bit, 1stop, no parity.

When pressing the reset button, the terminal shows an initialization screen with the ID and PAC code ofthe ATA8520E device. Pressing the SW1 button starts the test sequence.

Figure 1-7. ATA8520-EK4-E Test Setup

Table 1-4 shows the test sequence with areas which need to be checked in case a failure occurs. In Figure 1-8 an example of the PC Terminal output window is shown and Figure 1-9 shows the typicalspectrum and settings used for the RF testing.


11

Table 1-4. ATA8520-EK4-E Test Application Flow

TestStep


Check PCBATAB0102B

or{ATAB8520E-V2.0 ETSI}

1 Press theReset button

ATA8520E device version “ATA8520E-V2.3” U1, {U1 SPIoperation}

ATA8520E ID code for label “ID=000BFA3F” (example) U1, {U1 SPIoperation}



U1, {U1 SPIoperation}

Supply voltage in mV “Usens = 2970mV” (example) or“Vsup error!”

U1, Q1, R21,R22

Temperature value in °C “T_ext = 23°C” (example) or “Tsensor error!”

Q1, U3

LEDs are flashing LD1, LD2,LD3


“TX-Test: f = 868.130 MHz”“measure 868.xxxMHz -”

XTAL1, SW1,SAW2, U9

Enter RF freq. [kHz] part “135” (example) (see Figure 1-6) {XTAL1, IC1}


“Check TX: f = 868.130MHzP = 12 to 13dBm "(see Figure 1-6)

{XTAL1, IC1}


“RX-Test: f = 869.525MHz” {SAW1, IC1}

Show receive result “+++++++++++ ok (0 of 1001 bitsfailed)” (example)

{SAW1, IC1}




12

Figure 1-8. ATA8520-EK4-E Test – PC Terminal Output

The spectrum during the RF TX testing is shown in Figure 1-9 as a conducted measurement like the RXsensitivity testing with test setup shown in Figure 1-2. The RF spectrum shows the CW RF signal at thetarget RF frequency of 868.13MHz with a RF power level of 11 to 12dBm.

Figure 1-9. ATA8520-EK4-E Test – RF Spectrum


13

1.2.4. ATA8520-EK1-F and ATA8520-EK4-E - ATmega328P EOL Programming and Kit PackagingFor the ATmega328P EOL programming, apply 3V supply through pins X1/1 with +3.0V and X1/2 withGND. The following steps have to be performed for programming:

1. Connect the debugger ISP cable to the ISP-microcontroller connector2. Program the Flash application

– ATA8520-EK1-F.hex for the US kit or– ATA8520-EK4-E.hex for the EU kit

3. Print the sticker with the ID and PAC4. Place the ID/PAC sticker on the bottom of the PCB5. Affix the sticker with “ATA8520-EK1-F” or “ATA8520-EK4-E” printed on it to the bottom of the PCB6. Package the PCB in the ESD bag7. Put the 868MHz (ATA8520-EK4-E kit) or 916MHz (for ATA8520-EK1-F kit) whip antenna into the

box8. Place two labels (Kit and Atmel) on the box9. Store ID, PAC and test result in log file10. Store ID in separate log file

1.3. ATA8520-EK3-F and ATA8520-EK6-E Xplained PRO Extension BoardThe ATA8520-EK3-F and ATA8520-EK6-E kits are equipped with the ATA8520E device and requires anXplained PRO kit with SAMD20 or SAMD21 for testing. Figure 1-10 shows the setup with the XplainedProkit and the ATA8520-EK6-E board. Figure 1-11 the setup with the XplainedPro kit and the ATA8520-EK3-Fboard. For the testing of the ATA8520-EK3-F board an external power supply with 3V/300mA must besupplied to connector X1. The pin marked in green is used for the RF signal and the SW1 user button andthe LEDs LED1 (red) and Power (green) are used for test flow control. The SAMD20 Xplained PRO kithas to be programmed with EK3_TXRXProdTest.hex for the ATA8520-EK3-F testing or with theEK6_TXRXProdTest.hex for the ATA8520-EK6-E testing before starting the testing.


14

Figure 1-10. ATA8520-EK6-E Test Setup with XplainedPro SAMD20


15

Figure 1-11. ATA8520-EK3-F Test Setup with XplainedPro SAMD20

1.3.1. ATAB8520-EK3-F TestingFor testing of the ATA8520-EK3-F kit, it must be connected to the Xplained Pro test kit on the connectorEXT1 as shown in Figure 1-11. After connecting to the USB cable, the PC Terminal has to be connectedto the virtual COM port of the Xplained PRO using the UART settings: 38.4Kbaud, 8bit, 1stop, no parity. Inaddition to the USB connection a 3V/300mA supply has to be connected to connector X1 which willsupply the RF module.

When pressing the SW1 button, the terminal shows an initialization screen with the ID and PAC code ofthe ATA8520E device. Pressing the SW1 button again starts the test sequence. Table 1-5 shows the testsequence with tested areas which need to be checked in case a failure occurs.

After finishing the test application according to Table 1-5 an additional script "write_id.bat " has to beexecuted to program the ID code into the ID device U4.


16

Table 1-5. ATA8520-EK3-F Test Application Flow

TestStep


Check PCBATAB0102A


1 ConnectUSB cable

Atmel Studio 7 identifies theATA8520-EK3-F

Atmel Studio 7 – ATA8520-EK3-Fpage opens (Figure 1-12)

D1, U4

2 PressRESET

ATA8520E device version “ATA8520E-V2.3” (example) {U1 SPIoperation}

ATA8520E ID code for label “ID=000BFA3F” (example) {U1 SPIoperation}



{U1 SPIoperation}

Supply voltage in mV “U = 2970mV” (example)(“Vsup error!”)

Q1, R21,R22

Temperature value in °C “T_ext = 23°C” (example)(“T sensor error!”)

Q1, U3



“TX-Test: f = 902.200MHz”“measure 902.xxxMHz -"

{XTAL1,IC1}, SW1

Enter RF freq. [kHz] part “188” (example) (see Figure 1-6) {XTAL1,IC1}, SW1


“Check TX: f = 902.2MHz P = 22 to23dBm " (see Figure1-6)

{XTAL1,IC1}, SW1




{SAW1, IC1}



After completing testing successfully, do the following steps:

1. Print the sticker with the ID and PAC


17

2. Place the ID/PAC sticker on the bottom of the PCB3. Affix the sticker with “ATA8520-EK3-F” printed on it to the bottom of the PCB4. Package the PCB in the ESD bag5. Put the 916MHz whip antenna into the box6. Place two labels (Kit and Atmel) on the box7. Store ID, PAC and test result in log file8. Store ID in separate log file

Figure 1-12 shows the product page when the extension board is connected to Atmel Studio 7. Thisindicates the correct operation of the ID device U4.

Figure 1-12. ATA8520-EK3-F Atmel Studio 7 Product Page


18

1.3.2. ATAB8520-EK6-E Testing"For testing of the ATA8520-EK6-E kit, it must be connected to the Xplained Pro test kit on the connectorEXT1 as shown in Figure 1-10. After connecting to the USB cable, the PC Terminal has to be connectedto the virtual COM port of the Xplained PRO using the UART settings: 38.4Kbaud, 8bit, 1stop, no parity.

When pressing the SW1 button, the terminal shows an initialization screen with the ID and PAC code ofthe ATA8520E device. Pressing the SW1 button again starts the test sequence. Table 1-5 shows the testsequence with tested areas which need to be checked in case a failure occurs.

After finishing the test application according to Table 1-6 an additional script "write_id.bat " has to beexecuted to program the ID code into the ID device U4.

Table 1-6. ATA8520-EK6-E Test Application Flow

TestStep


Check PCBATAB0102B


1 ConnectUSB cable

Atmel Studio 7 identifies theATA8520-EK6-E

Atmel Studio 7 – ATA8520-EK6-Epage opens (Figure 1-13)

D1, U4

2 PressRESET

ATA8520E device version “ATA8520E-V2.3” (example) {U1 SPIoperation}

ATA8520E ID code for label “ID=000BFA3F” (example) {U1 SPIoperation}



{U1 SPIoperation}

Supply voltage in mV “U = 2970mV” (example)(“Vsup error!”)

Q1, R21,R22

Temperature value in °C “T_ext = 23°C” (example)(“T sensor error!”)

Q1, U3



“TX-Test: f = 868.130 MHz”“measure 868.xxxMHz -"

{XTAL1,IC1}, SW1

Enter RF freq. [kHz] part “135” (example) (see Figure 1-9 {XTAL1,IC1}, SW1


“Check TX: f = 868.130MHz P = 8to 10dBm ”(see Figure 1-9

{XTAL1,IC1}, SW1




19

TestStep


Check PCBATAB0102B



{SAW1, IC1}



After completing testing successfully, do the following steps:

1. Print the sticker with the ID and PAC2. Place the ID/PAC sticker on the bottom of the PCB3. Affix the sticker with “ATA8520-EK6-E” printed on it to the bottom of the PCB4. Package the PCB in the ESD bag5. Put the 868MHz whip antenna into the box6. Place two labels (Kit and Atmel) on the box7. store ID, PAC and test result in log file8. store ID in separate log file

Figure 1-12 shows the product page when the extension board is connected to Atmel Studio 7. Thisindicates the correct operation of the ID device U4.


20

Figure 1-13. ATA8520-EK6-E Atmel Studio 7 Product Page


21

2. Crystal Frequency CompensationThe ATA8520E device has built-in temperature drift compensation for the crystal frequency. The crystalrequired for SIGFOX operation is a 24.305MHz type [3], [4] with the following drift characteristics

• ±10ppm frequency tolerance at 25°C• ±15ppm frequency drift between −40°C and +85°C• ±5ppm frequency drift due to aging (5 years at 25°C)

For the compensation, the temperature drift coefficients of the crystal are stored in EEPROM andcalibration is performed with the internal temperature sensor. The SPI command “Start Supply andTemperature Measurement” performs this internal calibration process.

During the production test with the application software described in the sections above, a compensationof the frequency tolerance at 25°C is performed. This is done at the center frequency of 868.13MHz forthe EU kits and 902.2MHz for the US kits. The deviation dF of the measured peak frequency fmeas in[Hz] from this center frequency is

dF = fmeas [Hz] − 868130000Hz (1)

and the crystal correction values coeffr[i] (in ppm) are calculated according to

coeffr[i] = coeffo[i] + dF / 868.130Hz (2)

with coeffo[i] crystal correction value from datasheet

dF frequency deviation to 868.13MHz in [Hz]

The typical crystal correction values over temperature are listed in the following table.

Table 2-1. Typical Crystal Temperature Compensation Values

CompensationValue in [ppm]

−15 −8 −1 3 6 7 7 5 3 0 −3 −6 −8 −10 −10 −9 −7 −3

Temperature in[°C]

−48 −40 −32 −24 −16 −8 0 8 16 24 32 40 48 56 64 72 80 88

A detailed description of the calibration process is available in [6].

The current version of the production test software performs the crystal compensation within atemperature range of 16°C to 32°C. The ambient temperature is measured and the crystal coefficients areadjusted to the device internal temperature measurement compared to the ambient temperature.


22

3. ATA8520E – TX Operation TestingThis section describes the measurements which need to be done with the ATA8520E device for TXoperation in the uplink direction. TX testing requires a spectrum analyzer to observe the transmitted testsignal and to check the RF frequency and RF output power level.

The TX test signal is a random data signal generated within the ATA8520E device and triggered by the0x15 SPI command (see datasheet section 2). A CW TX test signal without modulation can also begenerated within the ATA8520E device using the 0x17 SPI command (see datasheet section 2).

Table 3-1. ATA8520E TX Testing Parameters

Device TX Frequency SIGFOX Bandwidth RF Output Power

ATA8520 EU 868.13MHz ±96kHz with10kHz guard band

14.0dBm radiated12.5 dBm conducted

ATA8520 US 902.20MHz ±96kHz 23.5dBm radiated22.0 dBm conducted

Figure 3-1 shows the spectrum measured for ATA8520E with modulated random data for a) 600bps at902.2MHz and b) 100bps at 868.13MHz.

Figure 3-1. ATA8520E TX Spectrum at a) 902.2MHz and b) 868.13MHz

For the ATA8520E TX testing an Atmel Studio solution with ETSI and FCC tests is available to performCW and random modulated data tests at the border and center frequencies (indicated by LED1 andLED2):

• LED1 and LED2: lower RF at 868.044MHz (ETSI) and 902.114MHz (FCC)• LED2: center at 868.130MHz (ETSI) and 903.4MHz (FCC)• LED1: upper RF at 868.216MHz (ETSI) and 904.686MHz (FCC)

The RF transmission occurs for 2s (ETSI) and 0.35s (FCC) separated by a 0.5s gap.


23

4. ATA8520E – RX Operation TestingThis section describes the measurements which need to be done with the ATA8520E device for RXoperation in the downlink direction. RX testing requires a test transmitter which transmits an RF signalwith payload data within a SIGFOX data frame similar to downlink operation.

The RX test mode within the ATA8520E device is triggered by the 0x08 SPI command (enable test mode)followed by the 0x18 SPI command for starting the RX test mode (see datasheet section 2).

The test transmitter sends a SIGFOX data frame with a gap of 0.5s as indicated in Table 4-1. The outputlevel is around −21dBm conducted with an FSK data signal at a data rate of 600bps.

Table 4-1. ATA8520E RX Testing Parameters

Device RX Frequency SIGFOX Bandwidth RF Sensitivity Level

ATA8520 EU 869.525MHz ±96kHz −121dBm device−126dBm with LNA

ATA8520 US 905.20MHz ±96kHz −121dBm device−126dBm with LNA

Figure 4-1 shows the FSK-modulated spectrum of the test transmitter. For more information about thereceiver and sensitivity testing, see [7].

Figure 4-1. RF Test Transmitter Output Signal for a) 869.525MHz and b) 905.2MHz

The ATA8520E RX testing can be performed within the production test application. The RS232 3VTTL-to-USB converter shown in Figure 1-4 must also be connected.


24

5. Test SoftwareAn Atmel Studio 6 Solution ATA8520E_ProdTest is available [5] for carrying out the tests with theATA8520-EK1-F and ATA8520-EK4-E kit running on the ATmega328P MCU. A similar production testsolution is available for the SAM D20/D21 XplainePro kit to test the ATA8520-EK3-F and ATA8520-EK6-Ekits.

The solution includes several projects to perform tests together with a production test for

• ATA8520E_TXRX_US_ProdTest - test software for the ATA8520-EK1-F and ATA8520-EK3-F kit• ATA8520E_TXRX_EU_ProdTest - test software for the ATA8520-EK4-E and ATA8520-EK6-E kit

Figure 5-1 shows a screenshot of the Atmel Studio 6 solution.

Figure 5-1. ATA8520E_ProdTest Atmel Studio 6 Solution


25

6. References[1] ATA8520E transceiver datasheet

[2] ATAN0158 - ATA8520E reference designs

[3] NDK crystal datasheet EXS10B-22817 for 24.305MHz (type EXS00A-CS08559)

[4] KDS crystal datasheet 1C324305AB0B for 24.305MHz (type DSX321G)

[5] ATAN0160_ToolPack_V1.0.zip

[6] ATAN0142 - ATA8520D Crystal Calibration

[7] ATAN0141 - ATA8520D Sensitivity Measurement


26

Atmel Corporation 1600 Technology Drive, San Jose, CA 95110 USA T: (+1)(408) 441.0311 F: (+1)(408) 436.4200 | www.atmel.com

© 2016 Atmel Corporation. / Rev.: Atmel-9415A-ATAN0160_Application Note-05/2016

Atmel®, Atmel logo and combinations thereof, Enabling Unlimited Possibilities®, and others are registered trademarks or trademarks of Atmel Corporation in U.S. andother countries. Other terms and product names may be trademarks of others.

DISCLAIMER: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to anyintellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS ANDCONDITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIEDOR STATUTORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY,FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT,CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS AND PROFITS, BUSINESSINTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISEDOF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of thisdocument and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment toupdate the information contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, automotiveapplications. Atmel products are not intended, authorized, or warranted for use as components in applications intended to support or sustain life.

SAFETY-CRITICAL, MILITARY, AND AUTOMOTIVE APPLICATIONS DISCLAIMER: Atmel products are not designed for and will not be used in connection with anyapplications where the failure of such products would reasonably be expected to result in significant personal injury or death (“Safety-Critical Applications”) withoutan Atmel officer's specific written consent. Safety-Critical Applications include, without limitation, life support devices and systems, equipment or systems for theoperation of nuclear facilities and weapons systems. Atmel products are not designed nor intended for use in military or aerospace applications or environmentsunless specifically designated by Atmel as military-grade. Atmel products are not designed nor intended for use in automotive applications unless specificallydesignated by Atmel as automotive-grade.

https://www.facebook.com/AtmelCorporationhttps://twitter.com/Atmelhttp://www.linkedin.com/company/atmel-corporationhttps://plus.google.com/106109247591403112418/postshttp://www.youtube.com/user/AtmelCorporationhttp://en.wikipedia.org/wiki/Atmelhttp://www.atmel.com

FeaturesDescriptionTable of Contents1. ATAB0102A/B PCB1.1. Production RF Test Setup1.2. ATA8520-EK1-F and ATA8520-EK4-E Standalone Kit1.2.1. ATA8520-EK1-F and ATA8520-EK4-E - ATMega328P Test Programming1.2.2. ATAB8520-EK1-F Testing1.2.3. ATAB8520-EK4-E Testing1.2.4. ATA8520-EK1-F and ATA8520-EK4-E - ATmega328P EOL Programming and Kit Packaging

1.3. ATA8520-EK3-F and ATA8520-EK6-E Xplained PRO Extension Board1.3.1. ATAB8520-EK3-F Testing1.3.2. ATAB8520-EK6-E Testing

2. Crystal Frequency Compensation3. ATA8520E – TX Operation Testing4. ATA8520E – RX Operation Testing5. Test Software6. References

ata8520e production and eol testing - microchip...

Documents