analytiCs and quality assuranCe

F R A U N H O F E R I N S T I T U T E F O R

S U R F A c E E N g I N E E R I N g A N d T H I N F I l m S I S T

a n a ly T I c S a n d q u a l I T y a S S u r a n c E

analytiCs and testing teCh-nology at FraunhoFer ISt

Thin, precision films are becoming increasingly important because

they allow perfectly matched and customizable functionalities

to be realized with low usage of material resources. Effective

characterization of the films ensures product quality and is vitally

important for film development work.

Rapid and precision analytics are one main area of expertise of

Fraunhofer IST. In the Analytics and Quality Assurance Depart-

ment an experienced team is available to take on a wide range of

tasks relating to surface and thin film analytics.

Often, a combination of diverse analytical methods is able to give

detailed insight into film structure, potential applications, and the

functional reliability of film systems.

Challenge us. The more demanding the task, the better!

Film and surFaCe analysis

c h E m I c a l c h a r a c T E r I z aT I O n

X-ray spectroscopy (EdX, WdX)

1 μm resolution, film thickness determination, multilayers,

failure analyses

Secondary ion mass spectroscopy (SImS)

Depth profiling with 1-2 nm depth resolution, multilayers,

interfaces, trace analysis, hydrogen, adhesion problems

Photoelectron spectroscopy (XPS / ESca)

Binding states and chemical composition of surfaces

Glow discharge optical emission spectroscopy (GdOES)

Chemical composition as a function of the depth for thick layers

and bulk materials

X-ray fluorescence (RFA / XRF)

Measurement in air, thickness determination of films

Optical spectroscopy (FTIr / raman)

Characterization of molecular bindings and chemical groups

a n a ly T I c S a n d q u a l I T y a S S u r a n c E

S u r F a c E I m a G I n G

Scanning electron microscopy (SEm)

High resolution imaging of surfaces

Focused ion beam (FIB)

Local cross-sections, point defects, TEM lamellas

Optical microscopy

Confocal laser scanning microscopy (LSM), high resolution 2D

and 3D imaging, individual (fluorescence) colorant contrasts,

fluorescence microscopy, fluorescence reader

atomic force microscopy (aFm)

3D imaging with ultra-high vertical and lateral resolution

c r y S Ta l S T r u c T u r E

X-ray diffraction (Xrd)

Crystalline phase analysis, grain size determination, texture

evaluation, internal stresses in thin films

X-ray reflectivity (XRR)

Thickness, density, and roughness of ultrathin films

and multilayers

a n a ly T I c S a n d q u a l I T y a S S u r a n c E

test methods For thin Films

Optical properties

� UV/Vis/IR spectroscopy: reflection, transmission, absorption, and refractive index as a function of the wavelength, angle of incidence, polarization

� FTIR spectroscopy: ATR, IRRAS, transmission, reflexion, microscopy

� Raman spectroscopy, Raman AFM coupling (TERS)

� Spectroscopic ellipsometry (190 - 2500 nm)

� Color measurement: CIE, L-a-b

� Scattered light measurement (Haze)*: diffuse backscattered light

� Photovoltaics: IU characteristics, quantum yields, defect density, efficiency

� Particle analysis: particle density on surfaces

mechanical properties

� Film thickness: profilometric analysis, cross-sections, micro-scale abrasion test, XRF, EPMA, XRR

� Film adhesion: Scratch*, Rockwell*, cross-cut*, pull-off test*

� Hardness and modulus of elasticity: micro* and nano indentation*

The test methods marked with a * can be carried out to

DIN / ISO / ASTM standards.

measurement and testing methods

for friction and wear

� Pin-on-disc* (adhesive), high-load and

high-temperature tribometer*

� Ball-cratering* (abrasive)

� Taber abraser test*, rubbing test*

� Microtribology

� Impact test, sand blasting test*

� Salt spraying test*, climate test*, sun test*

Other methods

� Photocatalytic activity: dirt test*, degradation of methylene

blue*, nitrogen oxides*, and volatile organic compounds*

� Contact angle measurement for the determination of the

surface energy*

� Vibrating Sample Magnetometer (VSM): coercive field

strength, remanence, permeability

� Metallography: specimen preparation, cross-sections,

precision cut

The Fraunhofer IST possesses state-of-the-art analytical facilities

and has worked closely with industry for many years in areas

such as:

� Materials and process development

� Quality assurance in production

� Failure analyses

� Development of customized testing technology

Our services

� Advice on the optimal use of analytics and test methods

� Contract work using the latest analysis and testing equipment

� Analysis of surfaces and coatings, also on technical objects such as components, tools, and consumer goods

� Quick service, even within 24 hours

ContaCt

Fraunhofer Institute for Surface Engi-

neering and Thin Films IST

Bienroder Weg 54E

38108 Braunschweig

Dr. Kirsten Ingolf Schiffmann

Head of Department

Analytics und Quality Assurance

kirsten.schiffmann@ist.fraunhofer.de

Phone +49 531 2155-577

www.ist.fraunhofer.de

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