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Publication of IPC-8497-1 “Cleaning Methods and
Contamination Assessment for Optical Assembly” and Future
Research Strategy
Dr. Tatiana Berdinskikh, OFC 2006
March 6, 06
1
Presentation OutlinePresentation Outline
• Baseline research used for IPC-8497 “ Cleaning Methods and Contamination Assessment for Optical Assembly”
• Collaboration with the standards bodies• Development of IPC-8497 “ Cleaning Methods and
Contamination Assessment for Optical Assembly”• Future Research Strategy
– iNEMI project “Fiber Connector End-Face Inspection” (progress review)
– Future Plans
2
Past participantsPast participants
• Tatiana Berdinskikh, N. AlbeanuCelestica
• Jennifer Nguyen, Solectron• Yves Pradieu, Solectron-Iphotonics• Randy Manning, Tyco Electronics• Dave Silmser/Heather Tkalec, Alcatel• Tom Mitcheltree, Cisco Systems• Thomas Ronan, Ingrid Levy, Aerotech• Frank (Yi) Zhang, Avanex• Denis Gignac, Nortel Networks• Carla Gleason, ExceLight
Communications Inc/ Sumitomo Electric
• Les Aseere, Sanmina• Matt Brown, USCONEC• Steve Lytle, Westover Scientific• Susan Grant, Corning• Arnaud Nicolas, FCI• Mark Vogel, Trace Labs• David Horat, Diamond• Paul Mohr JDSU
3
Current participantsCurrent participants
• Tatiana Berdinskikh, Celestica• Jose Garcia, JDS Uniphase• Steve Lytle, Westover Scientific• Randy Manning, Tyco Electronics• David Fisher, Tyco Electronics• Tom Mitcheltree, Cisco Systems• Thomas Ronan, Aerotech• Heather Tkalec, Alcatel • Frank (Yi) Zhang, Avanex• Denis Gignac, Nortel Networks• Doug Wilson, PVI Systems• Dr. Chip Kilmer, Sagitta• Dr. Sun-Yuan Huang, Intel• Carla Gleason, ExceLight
Communications Inc/ Sumitomo Electric
• Harvey Stone, Microcare• John Culbert, Megladon Mfg• Yutaka Sadohara, Sumitomo Electric
4
Fiber Optic Signal Performance Fiber Optic Signal Performance
The cleanliness of fiber optics connectors is recognized as an industry wide-problem;
• There was no industry-standard for cleanliness of fiber optics connectors in 2002;
• The cleaning and inspection processes of contaminated connectors affect manufacturing time and therefore increase test and product cost for high density port systems;
• The influence of scratches/particles/oil contamination on optical performance has not been previously investigated in detail
5
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
• Fiber Signal Performance Project: Feb, 02- Sep, 04• Objectives:
– Learn the effects that many anomalies have on the performance of a fiber optic signal
– Identify the severity of optical signal loss due to the most common potential hazards found in supplier and internal manufacturing processes
• Benefits:
– Develop an Industry Standard for cleanliness of fiber optics connectors.
– Improve the cleaning process and prevent fiber endface contamination
6
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
7
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Published by Journal of SMTA, 2003
35
4045
50
5560
65
D44
D54
D55
D56
D57
D601
D614
D621
D625
D30
D262
D320
D45
D603
D604
D613
D615
D616
D617
D626
D050
D728
D323
Connector Number Launch cable & DUTs defects-free
Launch cable defects-free, CUTs S/N D44 to D320 scratches applied to thecaldding area, DUTs S/n D45 to D323 scratches applied to the fiber MFD
8
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Published by Journal of SMTA, 2003
a) Particles on Ferrule and Cladding Area
00.20.40.60.8
11.2
JSC
1
JSC
3
JSC
5
LSC
4
TSC
152
TSC
153
Conn. ID
IL (d
B)
B-IL(1550)B-IL (1310)A-IL(1550)A- IL (1310)
b) Particles on Ferrule and Cladding
020406080
JSC
1
JSC
3
JSC
5
LSC
4
TSC
152
TSC
153
Conn. ID
RL(
dB) B- RL (1550)
B- RL (1310)A RL (1550) A RL (1310)
•IL-1550nm/1310nm(clean)=0.24/0.25dB;
•IL-1550nm/1310nm(contaminated)=0.92/1.07dB;
•RL-1550nm/1310nm (clean)=57.3/55.5dB;
•RL-1550/1310nm (contaminated)=56.5dB/55.6dB
Particle is on the cladding layer
9
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Critical parameters:Distance the particle from the coreSize of the particleType of the particleHardness of the particle/thickness
IL=1550/1310 (contaminated)=0.14/0.15 dB
RL=1550/1310 (contam.)=59.6/58.5 dB
IL=1550/1310 (clean)=0.11/0.11 dB
RL=1550/1310 (clean)=58.6/56.8 dB
IL=1550/1310 (contaminated)=16.77/18.08 dB
RL=1550/1310 (contaminated)=20.3/20.8 dB
IL=1550/1310 (clean)=0.11/0.05 dB
RL=1550/1310(clean)=58.0/57.6dB
10
•Oil application resulted in significant changes of RL:
•RL decreased from 56.3 dB to 43.6 dB (wavelength-1310nm) and from 57.2dB to 45.1 dB (wavelength 1550 nm)
0
10
20
30
40
50
60
70
1 3 5 7 9 11 13 15 17 19
Sample #
Ret
urn
Loss
, dB
Clean, 1310 Clean, 1550 Oil, 1310 nm Oil,155
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
1 3 5 7 9 11 13 15 17 19
Sample #
Inse
rtio
n Lo
ss, d
B
Clean, 1310 nm Clean, 1550 Oil,1310 nm Oil, 155
Oil Contamination
Oil ContaminationOil Contamination
11
Zones definition (Fiber Check Analysis)Zones definition (Fiber Check Analysis)
2005 Research
Clean Fiber
Cladding, 25um<d<120um
Contact Diameter130um<d<250um
Area near the core, d<25um
Ferrule Diameter250um<d<400um
Epoxy Ring Zone, 120um<d<130um
12
60A-3WD-2M
20.4umPublished by APEX 2005
T19-3WD-2M25.5um25um Area contamination ~50um
Initial IL: 0.08dBInitial RL: 53dB
IL after contamination: 0.63dBRL after contamination: 24dB
3 x Standard Deviation of IL: 0.0213dB3 x Standard Deviation of RL: 3.46dB
Failed
13
AnovaAnova Test ResultsTest Results
Statistical Data Analysis- 2005 data
Box-plot graph for the IL of the sample 57A: clean (57A clean) andcontaminated, Subgroup 1 (57A IL 1) and Subgroup 2 (57A IL 2)
14
The Factors Affected on the Optical PerformanceThe Factors Affected on the Optical Performance
Delta IL vs Distance from Core
-0.2
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
0 5 10 15 20 25 30 35 40 45 50
Distance From Core (micron)
Del
ta IL
Delta IL
15
The Factors Affected on Optical PerformanceThe Factors Affected on Optical Performance
Published by APEX 2004
Delta RL vs Distance From Core
-50
-40
-30
-20
-10
0
10
0 5 10 15 20 25 30 35 40 45 50
Distance from Core (micron)
Del
ta R
L
Delta RL
16
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
no non1
dn2, High index layer due to polishing
Connection/contact layer
−= dnRdBRL
λπ 14cos12log10)(
)cos21()cos2( 212
22
1212
22
1 δδ rrrrrrrrR ++++=
hnnnnnr
nnnnr 2
12
122
20
201
4,,λπδ =
+−
=+−
=
17
RL Modeling DataRL Modeling Data
0 10 20 30 40 50 600
50
100
150
200
250
S ample Connector Number
Laye
r Thi
ckne
ss [n
m]
Arizona dust contaminated connectors: estimated contamination layer thickness at 1550 nmParticles trapped in between two endfaces result in air gap
p yPublished by APEX 2005
18
Ferrule Contact Diameter CalculationFerrule Contact Diameter Calculation
• Contact diameter calculations for mated connector pairs– Minimum contact diameter 146 µm, 0.5 kgf, 5 mm end face radii– Maximum contact diameter 195 µm, 0.9 kgf, 30 mm end face
radii– Estimated contact diameter range for test connectors,
156-185 µm• Contact diameter equations
– Ferrule end face deformation h at 0.5 kgf and 0.9 kdf contact force
– Contact Diameter equationh 0.5 R( ) 1918 R 0.795−⋅ h 0.9 R( ) 2368 R 0.795−⋅
d contact R 1 R 2,( ) 2 h R 1( )⋅ R 1⋅ h R 1( )2− 2 h R 2( )⋅ R 2⋅ h R 2( )2−+
19
Receptacles ModulesReceptacles ModulesPublished by Photonics North 2006 conference
Sumitomo/ExceLight experiment for Receptacle Modules
20
Gage R & R StudyGage R & R Study
Per
cent
Part-to-PartReprodRepeatGage R&R
100
50
0
% Contribution
% Study Var% Tolerance
Sam
ple
Ran
ge
4
2
0
_R=1.891
UCL=4.868
LCL=0
Aoki Joe Kaneko
Sam
ple
Mea
n 42
36
30
__X=37.43UCL=39.37
LCL=35.50
Aoki Joe Kaneko
Sample10987654321
40
32
24
OperatorKanekoJoeAoki
40
32
24
SampleA
vera
ge10 9 8 7 6 5 4 3 2 1
42
36
30
Operator
Aoki
JoeKaneko
Components of Variation
R Chart by Operator
Xbar Chart by Operator
ORL by Sample
ORL by Operator
Operator * Sample Interaction
Published by Photonics North 2006 Conferencea o udy
21
Occluded Area ImagesOccluded Area Images--More DetailMore Detail
OFC 2006
Labeled Detected Particles(color coded by annular ring)
Labeled with rings
22
Delta IL Delta IL vsvs Gaussian Weighted % Occluded AreaGaussian Weighted % Occluded Area
Delta IL vs Gaussian Weighted % Occluded Area
y = 0.0009x 2 - 0.0065x + 0.0239
R 2 = 0.8166
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
0 10 20 30 40
GWpOA
delta ILPoly. (delta IL)
The Delta IL for the worse-case defects and scratches based on inspection criteria is less than 0.03 dB
23
PublicationsPublications
“Optical Connector Contamination/ Scratches and its Influence onOptical Signal Performance’, Journal of SMTA, V. 16, issue 3, 2003, pp.40-49“ At the Core:How Scratches, Dust, and Fingerprints Affect Optical Signal Performance’, Connector Specifier, January 2004, pp.10-11“ Degradation of Optical Performance of Fiber Optics Connectors in a Manufacturing Environment’, Proceedings of APEX2004, Anaheim, California, Feb 19-Feb 26, 2004, pp.PS-08-1-PS-08-4“Cleaning Standard for Fiber Optics Connectors Promises to Save Time and Money”, Photonics Spectra, June 2004, pp.66-68“Development of Cleanliness Specification for Single- Mode Connectors”, Proceedings of APEX2005, Anaheim, California, Feb 21-26, 2005, pp. S04-3-1- S04-3-16.“Keeping it clean: A cleanliness specification for single-mode connectors”, Connector Specifier, Aug, 05, pp.8-10.“Contamination Influence on Receptacle Type Optical Data Links”,Photonics North, 2005, Toronto, Canada, Sep, 05.“Development of Cleanliness Specifications for 2.5 mm and 1.25 mmferrules Single- Mode Connectors” – Proceedings of OFC/NFOEC, Anaheim, California, Mar 5-10, 06
8 Papers published by the Project Team
24
Leading the IndustryLeading the Industry
Collaboration with TIA, IEC and IPC• The Project is collaborating with International Electrotechnical
Committee (IEC), Telecommunications Industry Association (TIA) and IPC to develop a cleanliness standard.
iNEMI presentations:• OMI conference, Ottawa, Apr-29-May 1, 2003• IEC meeting, Montreal, Quebec, Canada, Oct 6-13, 2003 (presented by T.
Berdinskikh, Celestica)• APEX2004, Anaheim, California, Feb 19-Feb 26, 2004• IEC meeting, Locarno, Switzerland, Apr, 04 (presented by T. Mitcheltree,
Cisco)• IEC meeting, Warsaw, Poland, Sep, 04 (presented by R. Manning, Tyco)• A draft of IPC-8497-01 “ Cleaning Methods and Contamination Assessment for
Optical Assembly” has been submitted to IPC (June, 04)• APEX2005, Anaheim, California, Feb, 05 • IEC meeting, Charlotte, NC, Apr, 05 (presented by R. Manning, Tyco)• OFC2006, Anaheim, California, Feb, 06
25
Collaboration with the standardization bodiesCollaboration with the standardization bodies
Our Objective:• Update the criteria in IEC doc “61300-3-35: Basic test and
measurement procedures” based on quantitative data• Harmonize our recommendations across all
vendors/CMs/OEMs to achieve a true international standard
Summary from Montreal IEC-2003:• Scratches and particles within 25um diameter definitely affect
SMF performance• Scratches outside of 25um definitely do NOT affect SMF
performance• Further investigation needed on particles outside 25um
26
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Summary from IEC meeting, Locarno, Apr, 04, presented by the iNEMI team
• Small Carbon particles on the ferrule did not show any performance degradation
• Small Carbon particles on the cladding outside the 25 um zone do not significantly impact performance
– e.g., Up to 17 particles on cladding outside of 25um…no impact• Contamination particles can prevent direct physical contact
creating an air gap between two endfaces• Further investigation is needed for contamination located
at cladding and ferrule areas• Investigate the influence on the Arizona dust particles on
the optical signal performance
27
IPCIPC--8497 development8497 development
• Project Team made the initial contacts with IEC, TIA and IPC representatives at OMI conference, Ottawa, May, 2003
• The first- face-to-face meeting of the project team on the standard development was held at Celestica and Cisco facilities in Salem, Jun, 04.
• The final document was submitted to the IPC review in July, 05
• The IPC-8497-1 “ Cleaning Methods and Contamination Assessment of Optical Assembly” was published by IPC in Feb, 2006.
• The acceptance of an industry standard for SM connectors will result in significant cost savings to fiber optics industrydue to the elimination of insufficient cleaning and over cleaning and the reduction of contaminated non-conformance material.
28
IPC IPC --84978497--1 content1 content
1. Scope2. Applicable documents3. Terms and Definitions4. Cleaning Specification5. Contamination6. Inspection Equipment7. Cleaning Methods8. End-caps9. Performance testing10.Electrostatic Charge Effect ( ESD) and Connector
Cleanliness11.The Influence of Scratches/Contamination on Optical
Signal Performance
29
Scope of IPCScope of IPC--84978497
• The scope of the specification is to describe the methods of inspecting and cleaning all optical interfaces so their interconnectivity does not result in loss of optical signal. It also describes methods of contamination prevention
• The target audience for this standard are Manufacturing Operators, Manufacturing Process Engineers, Quality Engineers and Field System Installers
30
Inspection CriteriaInspection Criteria
Inspection Criteria for SMF Pigtail and Patchcord Connectors
anynone > 10 microns130 to 250 microns2 — Contact Zone
anyany120 to 130 micronsAdhesive Zone
none > 3 micronsany < 2 microns
5 from 2 - 5 micronsnone > 5 microns
25 to 120 microns1b — Cladding Zone
nonenone0 to 25 microns1a — Core Zone
Scratches (width)Defects (diameter)DiameterZone/Description
Allowable Defects and Scratches
anynone > 10 microns130 to 250 microns2 — Contact Zone
anyany120 to 130 micronsAdhesive Zone
none > 3 micronsany < 2 microns
5 from 2 - 5 micronsnone > 5 microns
25 to 120 microns1b — Cladding Zone
nonenone0 to 25 microns1a — Core Zone
Scratches (width)Defects (diameter)DiameterZone/Description
Allowable Defects and Scratches
31
Fiber Connector EndFiber Connector End-- Face InspectionFace Inspection
• Objective:• This project is developing requirements for allowable
surface defects, such as scratches, pits, and contamination. Based on experimental data and the results of mathematical modeling, the group plans to define the zone criteria and pass/fail visual requirements for polished connectors, single mode fiber.
32
Phase 1Phase 1
• PHASE 1 ( Completed)• Fiber Optic Connector End-face Anomaly Assessment for
SM fiber• The losses, (IL and RL), which occurs on SC, FC, LC, MU
connectors due to contamination with Arizona road dust and polishing scratches will be examined.
• The DOE (Design of experiment) that was used in the Fiber Optic Signal Performance Project for singlemode SC connectors will be used for this phase of the project. (Ref: Avanex experiments, Optical Signal Performance project )
• Statistical data analysis will be performed.• Results for the influence of scratches and Arizona road
dust for SC connectors will be compared with the results from the other types of connectors (SC, FC, LC, MU)
• Mathematical modeling for the RL results will be provided.• Inspection criteria for SM connectors will be finalized.
33
Phase 2Phase 2
• PHASE 2- In Progress• Fiber Optic Connector End-face Anomaly Assessment for
MM fiber• The loss (IL, RL, and BERT) realized by MM applications
due to fiber optic connector end-face anomalies (polishing scratches and Arizona dust contamination) will be assessed.
• The DOE (Design of experiment) that was used in the Fiber Optic Signal Performance Project for singlemode SC connectors will be used for this phase of the project. (Ref: Avanex experiments, Optical Signal Performance project )
• Perform Gage R & R study• Statistical data analysis will be performed.• Inspection criteria for MM connectors will be developed
34
Phase 3Phase 3
• PHASE 3- In Progress (Sumitomo/ExceLight initiatives)• Fiber Optic Connector End-face Anomaly Assessment for
Receptacle Modules• Data rates to be studied will be chosen (OC-48, OC-192, etc.)• Provide Gage R & R study for test and measurement equipment• A method for application of anomalies will be developed• The influence of the dust and scratches on the optical
performance of receptacle modules will be investigated• Statistical data analysis will be performed• Critical factors such as particle size, distance from the core, type
of particles, will be identified• The correlation between measurements, (RL, BERT and other
tests yet to be determined), and images of the connector end-face will be calculated.
• Criteria for cleanliness of receptacle modules will be developed
35
Phase 4Phase 4
• PHASE 4- In progress• Collaboration with standards bodies• A roadmap for the collaboration with the TIA, IPC, IEC
will be developed.– Collaboration with the IPC will be on standard IPC-8794-
01: "Cleaning methods and contamination assessment for optical assembly" (completed)
– A recommendation to update the IEC doc “61300-3-35: Basic test and measurement procedures” based on quantitative data will be put forth.
• Recommendations will be harmonized across all vendors, EMS providers, and OEMs to achieve a true international standard.
36
Phase 5Phase 5
• PHASE 5- In Progress• Improving the cleaning process and prevention of
contamination• To understand the root causes of contamination and
develop the strategy to prevent or minimize the risk of contamination in the manufacturing environment
– Compare different cleaning materials with improved ESD capability to prevent connector charging during the cleaning process
– Contamination caused by the dust cap– Standardization of the dust cap: developing a
recommendation on materials and design– Investigation of ESD effects for mated optic connectors
37
Phase 6Phase 6
• The following topics require further research to determine if other consortia or standards bodies have not already performed the work.
• Fiber Optic Connector End-face Anomaly Assessment for SM APC
• Estimate of the time & effort needed to investigate SM APC.
• Fiber Optic Connector End-face Anomaly Assessment for MT ferrule
• Estimate of the time & effort needed to investigate SM MT ferrule
38
Future PlansFuture Plans
• Further research will focus on the development of a cleanliness specification for MM connectors and receptacle modules.
• Open discussion
39
Back Up SlidesBack Up Slides
Back up SlidesBack up Slides
40
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Published by Journal of SMTA, 2003
Core is blocked
•IL-1550nm/1310nm(clean)=0.39/0.51dB•IL-1550nm/1310nm(contaminated)=2.88/3.61dB•RL-1550nm/1310nm(clean)=56.2/54.6dB;•RL-1550nm/1310nm(contaminated)=37.1/34.5dB
IL-Particles on Core/Cladding/Ferrule
010203040
JSC1
JSC2
JSC3
JSC4
JSC5
LSC1
TSC138
Conn. ID
IL (d
B)
B-IL(1550)B-IL (1310)A-IL(1550)A- IL (1310)
RL-Particles on Core/Cladding/Ferrule
020406080
JSC1
JSC2
JSC3
JSC4
JSC5
LSC1
TSC138
Conn. ID
RL
(dB
)
B- RL (1550) B- RL (1310)A RL (1550) A RL (1310)
41
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
Published by Journal of SMTA, 2003
Particles on Ferrule only
0
0.2
0.4
0.6
IL (d
B)
B-IL(1550)
B-IL (1310)
A-IL(1550)
A- IL (1310)
Particles on Ferrule only
4550556065
Conn. ID
RL
(dB
)
B- RL(1550) B- RL(1310)A RL (1550)
A RL (1310)
•IL-1550nm/1310nm (clean)=0.19 dB/0.21 dB
•IL-1550 nm/1310nm (contaminated)=0.21dB/021 dB
•RL-1550nm/1310nm (clean)=55.7 dB/54.5 dB
•RL -1550nm/1310nm (contaminated)=55.6 dB/54.5 dB
42
Fiber Optic Signal Performance ProjectFiber Optic Signal Performance Project
IL-1550nm/1310 nm(clean connector)=0.05/0.09 dB,IL -1550nm/1310 nm (contaminated connector)=0.04/0.05 dB,RL-1550/1310 nm (clean connector)=58.2/57.4 dB,RL-1550nm/1310 nm (contaminated connector)=57.3/56.4 dB
Carbon Particles on Cladding / Ferrule AreaDistances calculated with VisionGauge software
43
Occluded Area GraphsOccluded Area Graphs
Data for connector LC07
Incremental occluded area vs radius Cumulative occluded area vs radius
For comparison, core exclusion zone area is about 491 µm2
44
Inspection Criteria ProposalInspection Criteria Proposal
Ideal SMF SC UPC ceramic-ferrule endface
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