adjusting a microscope 1center components on optic axis 2focus objective 3focus condenser 4adjust...
TRANSCRIPT
Adjusting a Microscope1 Center components on optic axis2 Focus objective3 Focus condenser4 Adjust illumination
• lamp voltage (intensity)• iris diaphragm
brightness
resolution contrast
Sample Preparation fixation
• organic solvents (acetone, alcohols)
• formaldehyde• glutaraldehyde
sectioning • for tissues or thick samples• embed in parrafin or resin• cut with microtome
staining• dyes differentially bind to
DNA, RNA and protein• provides more contrast
Light Microscopy Modifications
• Phase Contrast• Differential Interference
Contrast (Normarski)• Confocal Scanning• Fluorescence• Dark Field (diffracted light)• Image Enhancement
Phase Contrast and Differential Interference Contrast
• requires special objective and condenser lens• phase differences are converted
into intensity differences• distinguish objects that only
differ slightly in refractive index or thickness
Light Microscopy Modifications
• Phase Contrast• Differential Interference
Contrast (Normarski)• Confocal Scanning• Fluorescence• Dark Field (diffracted light)• Image Enhancement
Image Enhancement• video cameras + computers used to
enhance images• correct imperfections in optical systems• overcome limitations of human eye• seeing image in dim light• seeing small intensity differences
against bright background• does not increase actual resolution
brightness
resolution contrast
Limit of Resolution
• distance at which two objects can be resolved• resolution limit = 0.61/numerical aperture • (NA is a lens property)
of visible light = 0.4-0.8 m
Electron Microscopy
• samples are analyzed with electrons• particles traveling near the speed of light
behave as a wave • wavelength with velocity• resolutions of 2 nm or less
Sample Preparation
• Fixation• glutaraldehyde• osmium tetroxide
• Dehydration• ethanol (step-wise)
• Embedding• plastic resins
• Sectioning• ultramicrotome
(50-100 nm thick)• Staining• heavy metals
Variations of Electron Microscopy
• Transmission (TEM)• Scanning (SEM)• Shadow-casting• Freeze-fracture• Freeze-etching• CryoEM• Negative Staining