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A Direct-Conversion CMOS Radio Receiver for High Speed Paging A thesis submitted to The Hong Kong University of Science and Technology in partial fulfillment of the requirements for the Degree of Doctor of Philosophy in Electrical and Electronic Engineering by Zhiheng Chen Department of Electrical and Electronic Engineering Bachelor of Engineering in Radio Engineering Southeast University, Nanjing, China, 1992 Master of Engineering in Radio Engineering Southeast University, Nanjing, China, 1995 November 2000

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Page 1: A Direct-Conversion CMOS Radio Receiver for High Speed Pagingcc.ee.nchu.edu.tw/~aiclab/public_htm/Wireless/Theses/2000Chen.pdf · A Direct-Conversion CMOS Radio Receiver for High

A Direct-Conversion CMOS Radio Receiver for High Speed Paging

A thesis submitted toThe Hong Kong University of Science and Technology

in partial fulfillment of the requirements forthe Degree of Doctor of Philosophy inElectrical and Electronic Engineering

by

Zhiheng Chen

Department of Electrical and Electronic Engineering

Bachelor of Engineering in Radio EngineeringSoutheast University, Nanjing, China, 1992

Master of Engineering in Radio EngineeringSoutheast University, Nanjing, China, 1995

November 2000

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A Direct-Conversion CMOS Radio Receiver forHigh Speed Paging

by

Zhiheng Chen

Approved by:

Dr. Jack LauThesis Supervisor

Prof. John WeiThesis Examination Committee Member (Chairman)

Prof. Philip C. H. ChanThesis Examination Committee Member

Dr. Roger ChengThesis Examination Committee Member

Prof. Roland ChinThesis Examination Committee Member

Prof. Philip C. H. ChanHead of Department

Department of Electrical and Electronic EngineeringThe Hong Kong University of Science and Technology

November 2000

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A Direct-Conversion CMOS Radio Receiver forHigh Speed Paging

by

Zhiheng Chen

for the Degree ofDoctor of Philosophy in Electrical and Electronic Engineering

at The Hong Kong University of Science and Technologyin November 2000

ABSTRACT

As the radio paging system is upgraded from POCSAG to the high speed FLEX or ERMES

protocol, both the modulation level and the baud rate are increased. What is unchanged is the

available bandwidth. Consequently, the modulation index is decreased and additional difficul-

ties are imposed on the design of a direct-conversion receiver. The main problems are (1) there

are no mature demodulation techniques available for zero-IF M-ary FSK signals, and (2) the

signal contains strong DC/low-frequency energy and hence DC offset cancellation is no longer

an easy task.

In this dissertation, a direct-conversion receiver is designed for high speed 4FSK radio pag-

ing applications. Various design considerations are discussed and analyzed. A zero-crossing

based counting/comparing scheme is chosen for the demodulation. The BER is improved by a

novel zero-crossing interpolation technique. Following official specifications on radio paging

receivers, a high level simulation is carried out to verify the demodulator performance and

derive circuit requirements. The self-mixing-related time-varying offset is suppressed by the

harmonic mixer to the noise level. A differential peak alignment method is developed to cancel

the mismatch-induced static offset. A frame-by-frame scheme is also proposed for further off-

set reduction.

A prototype receiver is fabricated in a 0.35 micron CMOS process, with all major building

blocks included. The front-end consists of a differential LNA and a quadrature harmonic

mixer. In the base-band, an AGC circuit provides over 30 dB gain tuning range. The channel

selection is done by a 5th order gyrator filter. The demodulator is formed by a 1-level zero-

crossing interpolator, clock recovery circuits and decision logics. Main functions of the

receiver has been verified.

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To My Parents

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ACKNOWLEDGEMENTS

Just like any other theses, this one is done with the help from a lot of people. Among them, my

supervisor Dr. Jack Lau is the first one to whom I would like to express my most sincere

thanks. In these years of studies, he has been the most important source of support. What I

have learnt from him is far beyond the scope of academic research. His optimistic character,

unyielding will plus intellectual maturity form the key to success. Our whole research group

has benefited from his foresight and creativity. It is an invaluable experience to have been with

Dr. Jack Lau in the past 5 years.

And I’m very grateful to those nice and talented professors of the EEE department for their

excellent course materials and teaching attitudes. They deserve the greatest respect. It is their

guidance, patience and encouragement that has led me to the exciting world of knowledge and

innovation. During my first semester in HKUST, Dr. Howard Luong showed me the beauty of

analog circuit designs, of which I had never been aware before. Dr. Chi-Ying Tsui, on the other

hand, guided me through CMOS digital designs, from the very bottom to the system level. Dr.

Roger Cheng introduced me to the mysterious world of personal wireless communication sys-

tems. Dr. Curtis Ling taught me the nature of high frequency components and circuits. I also

want to thank Prof. Charlie Sodini of MIT who provided practical yet deep insight of CMOS

analog circuits related issues during his visit at HKUST and Prof. Philip Chan who was my

mentor in the first year of my Ph.D. program.

This thesis could not have been completed without the contribution of Mr. Zhaofeng Zhang

and Mr. Louis Tsui, two of my group-mates. Zhaofeng developed the CMOS harmonic mixer

and Louis designed the differential LNA for my receiver. I’m indebted again to Zhaofeng for

his valuable suggestions on my thesis and the generous help he offered in many other aspects.

I appreciate very much the first class support from Mr. Siu-Fai Luk and Mr. Jack Chan.

With great kindness, they tried their best to satisfy my odd requests on EDA tools and tape-out

matters. The same kindness was also offered by Ms. Wendy Yuen, Ms. Venus Pang and other

ladies of the Department Office who helped me through a lot of administrative matters. And I

am obliged to many other people who supported my work in countless ways. Mr. Allen Ng of

DCL taught me the wire bonding skill; Mr. Joe Lai of WCL and Mr. Hi-Yin Man of the ELEC

storeroom provided the convenience to fulfill my measurements.

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Thanks should also go to my fellow UMEN. As senior UMAN members, Frankie Hui,

Alan Pun, Louis Tsui, Tony Yeung and me shared many memorable days and nights. Keqiang

Shen and Zhiqing Li provided precious advice and suggestions. Wing-Faat Liu shared the

stress with me. Jing-Jung Tang, Cary Cheung, Jackey Cheung and Ricky Choi brought the lab-

oratory a lot of fresh air and fun.

Besides, I would like to take this opportunity to thank some old friends: William Lam,

Felix Wong, Maurice Chan, Andrew Hui, Vincent Cheung, Darwin Yim, Ho-Yin Pang, Lang

Lin, Wei Jin, Corbett R. Rowell and more. I enjoyed very much the time I spent with them. It is

also a good time for me to thank all my thesis examination committee members for their time,

earnestness and challenges.

Finally, I want to say thanks to my wife Maggie Song for her love, encouragement, and

patience as well as the numerous nice figures she created for my thesis. She is the reason for

me to enjoy my life, to take challenges and to be happy.

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Table of Contents

Chapter 1 Introduction 11.1 High Speed Paging Systems and The FLEX Protocol . . . . . . . . . . . . . . . 1

1.1.1 FLEX Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21.1.2 FLEX Signal Structure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

1.2 The Direct-Conversion Technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31.3 Direct-Conversion for FLEX . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51.4 Contributions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61.5 Thesis Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

Chapter 2 FSK Modulation and Demodulation 82.1 The FSK Signal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82.2 The Modulation Index and FSK Spectra . . . . . . . . . . . . . . . . . . . . . . . . . 92.3 The Phasor Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102.4 FSK Demodulation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

2.4.1 The Correlation-Squaring Receiver . . . . . . . . . . . . . . . . . . . . . . 122.4.2 The Quadrature Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 132.4.3 The Digital Phase Comparator. . . . . . . . . . . . . . . . . . . . . . . . . . 14

2.5 ZIFZCD and ZCI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Chapter 3 System Modeling and Circuit Requirements 173.1 The Receiver Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 173.2 Official Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 183.3 Simulation Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

3.3.1 Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203.3.2 Desensitization. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223.3.3 Intermodulation Response Rejection . . . . . . . . . . . . . . . . . . . . . 233.3.4 Phase Mismatch, Frequency Drift and Phase Noise . . . . . . . . . 243.3.5 RF Front-End Budget. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

vii

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CONTENTS viii

Chapter 4 Circuit Design I 294.1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 294.2 LNA and Mixer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

4.2.1 The Differential LNA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 304.2.2 The Harmonic Mixer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

4.3 VGA and AGC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 324.3.1 The Variable Gain Amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . 334.3.2 The Control Circuitry and VGA Gain . . . . . . . . . . . . . . . . . . . . 354.3.3 Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

4.4 Low Pass Filters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 404.4.1 The Gyrator and Gyrator-C Simulated Inductors . . . . . . . . . . . 414.4.2 Simulation of The LC Ladder . . . . . . . . . . . . . . . . . . . . . . . . . . 424.4.3 The Linearized Transconductor . . . . . . . . . . . . . . . . . . . . . . . . . 444.4.4 Simulated Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

4.5 The DC Offset Problem . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Chapter 5 Circuit Design II 515.1 The Overall Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 515.2 Zero-Crossing Interpolator and Hard-Limiters . . . . . . . . . . . . . . . . . . . 525.3 Zero-crossing Pulse Generator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 545.4 Direction and Speed Detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56

5.4.1 The Dual-Input 5-Bit Counter . . . . . . . . . . . . . . . . . . . . . . . . . . 575.4.2 The Direction Comparator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 595.4.3 The Speed Comparator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

5.5 Clock Recovery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 615.5.1 Transition Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 625.5.2 Phase Detector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 705.5.3 VCO and Charge Pump . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 735.5.4 Loop Behavior . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

5.6 An Overall Simulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78

Chapter 6 Measurement Results 806.1 AC Transfer Curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 806.2 Noise Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 816.3 Harmonic Distortion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 836.4 AGC Gain and Dynamics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 886.5 Clock Recovery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 906.6 Demodulation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 916.7 Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94

Chapter 7 Future Work and Conclusion 987.1 Possible Improvements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

7.1.1 DC Offset Cancellation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99

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CONTENTS ix

7.1.2 System Noise Figure and Gain Distribution . . . . . . . . . . . . . . 1007.2 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100

References 103

Appendix A Circuit Details 107A.1 The AGC Loop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108

A.1.1 The Differential Variable MOS Resistor (DiffRes) . . . . . . . . . 109A.1.2 The OPAMP (Opamp1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109A.1.3 The Peak Detector (Rect2). . . . . . . . . . . . . . . . . . . . . . . . . . . . .111A.1.4 The Attenuator (LinAmp) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111

A.2 The Low Pass Filter (Gyt5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112A.2.1 The Gm Cell (Gm). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112

A.3 Offset Cancellation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112A.4 The Demodulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113A.5 Zero-Crossing Interpolators and Pulse Generators . . . . . . . . . . . . . . . .114

A.5.1 The Adder (Iadd_2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115A.5.2 The Limiter (Limiter). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115A.5.3 The Zero-Crossing Pulse Generator (PUL_Gen). . . . . . . . . . . .117

A.6 Clock Recovery . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .118A.6.1 The Delay Element (CRC_delay) . . . . . . . . . . . . . . . . . . . . . . .119A.6.2 The Transition Detector (CRC_RS). . . . . . . . . . . . . . . . . . . . . .119A.6.3 The Phase Detector (CRC_PD) . . . . . . . . . . . . . . . . . . . . . . . . 121A.6.4 The Charge Pump Circuit(CRC_pump). . . . . . . . . . . . . . . . . . 121A.6.5 The VCO (CRC_v2i and CRC_ico) . . . . . . . . . . . . . . . . . . . . 122

A.7 The Decision Logic (DEMOD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122A.7.1 The Zero-Crossing Counter (Counter). . . . . . . . . . . . . . . . . . . 123A.7.2 The Direction Comparator . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123A.7.3 The speed comparator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123

A.8 Building Blocks Using The Transmission Gate Logic. . . . . . . . . . . . . 124A.9 Biasing Circuits and Buffers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125

A.10 List of Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125

Appendix B Base-band Testing 133B.1 Pin Assignment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133B.2 The Testing Circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 134B.3 Testing Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137

B.3.1 Power Supplies, Signal Sources and Analyzers. . . . . . . . . . . . 137B.3.2 Input Setup. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139

B.4 Operation Points. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 140

Appendix C List of Publications 141

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List of Figures

Figure 1.1. FLEX signal structure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3Figure 2.1. Analytical power spectra of both the FLEX and POCSAG signals at dif-

ferent data rates (modulation indices). The y-axis is in dB; x-axis shows the frequency offset from the carrier in kHz. The lines in (a) and (b) arediscrete spectral components. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Figure 2.2. The phasor diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11Figure 2.3. Demodulation of BFSK signals with the correlation-squaring receiver. . . 12Figure 2.4. FM quadrature detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13Figure 2.5. Principle of Vance’s direct conversion radio paging receiver. . . . . . . . . . . 14Figure 2.6. 1-level zero-crossing interpolation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16Figure 2.7. The ZIFZCD with 1-level zero-crossing interpolation. . . . . . . . . . . . . . . . 16Figure 2.8. The zero-crossing pulse generator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16Figure 3.1. The receiver model. The demodulator is shown in Figure 2.7. . . . . . . . . . 17Figure 3.2. BERs at different interpolation levels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21Figure 3.3. Effect of the 2nd order nonlinearity on desensitization. . . . . . . . . . . . . . . . 22Figure 3.4. Effect of the 3rd order nonlinearity on desensitization. . . . . . . . . . . . . . . . 22Figure 3.5. The IMRR is 58 dB when the unwanted signals are 1 and 2 channels

above (m=1) or below (m=-1) the nominal, respectively. The meaningsof m, W and U are defined in Section 3.2. . . . . . . . . . . . . . . . . . . . . . . . . . 24

Figure 3.6. Sensitivity degradation due to I/Q phase mismatch.. . . . . . . . . . . . . . . . . . 25Figure 3.7. Sensitivity degradation due to LO frequency drift. . . . . . . . . . . . . . . . . . . 25Figure 3.8. Constant overall IIP2 curves. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27Figure 3.9. Constant overall IIP3 curves. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27Figure 4.1. Block diagram of the receiver. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29Figure 4.2. The differential low noise amplifier.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31Figure 4.3. The CMOS harmonic mixer with current injection. . . . . . . . . . . . . . . . . . . 32Figure 4.4. The AGC loop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33Figure 4.5. The MOS differential variable resistor (a) and its equivalent (b). . . . . . . . 35Figure 4.6. The peak detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

x

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LIST OF FIGURES xi

Figure 4.7. The level shift network. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36Figure 4.8. VGA gain as a function of the control voltage Vc. . . . . . . . . . . . . . . . . . . . 38Figure 4.9. Response of the AGC to a 2 kHz sinusoidal input decreasing from 2 Vpp

by 6 dB every 10 ms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38Figure 4.10. Response of the AGC to a 4.8 kHz sinusoidal input increasing from 1 mVpp

by 25 dB at 5 ms and 10 ms respectively.. . . . . . . . . . . . . . . . . . . . . . . . . . 39Figure 4.11. The gyrator and its small signal equivalent circuit. . . . . . . . . . . . . . . . . . . 42Figure 4.12. Simulation of inductors using gyrators and capacitors. . . . . . . . . . . . . . . . 43Figure 4.13. The 5th order gyrator-C elliptic low pass filter and its LC ladder prototype.

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43Figure 4.14. The linearized transconductor (a) and its biasing circuit (b). . . . . . . . . . . . 45Figure 4.15. Differential output current and transconductance of the linearized

transconductor. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46Figure 4.16. Frequency response. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46Figure 4.17. Thermal noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47Figure 4.18. Waveforms of the zero-IF 4FSK signal. . . . . . . . . . . . . . . . . . . . . . . . . . . . 49Figure 4.19. A half-wave rectifier. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50Figure 5.1. The 4FSK demodulator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51Figure 5.2. The first level zero-crossing interpolator. . . . . . . . . . . . . . . . . . . . . . . . . . . 53Figure 5.3. The adder schematic. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53Figure 5.4. The transfer characteristic of the adder. . . . . . . . . . . . . . . . . . . . . . . . . . . . 54Figure 5.5. The hard-limiter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54Figure 5.6. The zero-crossing pulse generator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55Figure 5.7. Signal waveforms of the pulse generator. . . . . . . . . . . . . . . . . . . . . . . . . . . 55Figure 5.8. The final detection stage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57Figure 5.9. The dual-input 5-bit counter.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58Figure 5.10. The direction comparator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60Figure 5.11. The speed comparator SCMP.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61Figure 5.12. The clock recovery circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62Figure 5.13. Simple transition detection with a trigger. . . . . . . . . . . . . . . . . . . . . . . . . . 63Figure 5.14. Lee’s synchronization scheme. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63Figure 5.15. Model of the transition detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65Figure 5.16. Waveforms of the transition detector model. . . . . . . . . . . . . . . . . . . . . . . . 65Figure 5.17. Block diagram of the transition detector, the output stage excluded. . . . . . 66Figure 5.18. Working principle of the AC block. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67Figure 5.19. Circuit diagram of the AC block. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68Figure 5.20. The AOA block. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68Figure 5.21. State transition diagram and state transition table of the “11” detector. . . . 69Figure 5.22. Circuit diagram of the “11” detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69Figure 5.23. Output stage of the transition detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70Figure 5.24. The phase detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70Figure 5.25. Dependence of the error signal on input duty cycle (a) and data transitions

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LIST OF FIGURES xii

(b).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71Figure 5.26. Waveforms of the phase detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72Figure 5.27. The complete VCO. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74Figure 5.28. Multivibrator frequency vs. bias current. . . . . . . . . . . . . . . . . . . . . . . . . . . 74Figure 5.29. The charge pump. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75Figure 5.30. Impact of the fout-dependent delay on the acquisition process: fin and fout

are (a) uncorrelated and (b) correlated.. . . . . . . . . . . . . . . . . . . . . . . . . . . . 76Figure 5.31. An overall simulation of the demodulator. . . . . . . . . . . . . . . . . . . . . . . . . . 79Figure 6.1. The die photo of the whole prototype receiver. . . . . . . . . . . . . . . . . . . . . . 80Figure 6.2. Simulated and measured AGC transfer curves at the maximum gain. . . . . 81Figure 6.3. Simulated and measured transfer curves of the LPF. . . . . . . . . . . . . . . . . . 82Figure 6.4. Simulated and measured transfer curves of the offset cancellation stage. . 82Figure 6.5. Cascaded noise voltage spectral densities at the output of the AGC, the

LPF and the offset cancellation stage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83Figure 6.6. Input-referred noise spectral densities. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83Figure 6.7. Noise simulation that estimates the flicker noise parameters by curve fitting.

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84Figure 6.8. Signal spectra of the harmonic distortion measurement. . . . . . . . . . . . . . . 85Figure 6.9. Signal spectra of the harmonic distortion measurement, with the input

inverted. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86Figure 6.10. AGC gain at different input levels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89Figure 6.11. AGC output levels at different input levels. . . . . . . . . . . . . . . . . . . . . . . . . 89Figure 6.12. Measured AGC response to input amplitude variations. The input signal

is at 1.6 kHz and has an amplitude switching between 100 and 200 mV. . 90Figure 6.13. Simulated AGC response to the input signal given in Figure 6.12. . . . . . . 90Figure 6.14. Locking process of the clock recovery circuit. . . . . . . . . . . . . . . . . . . . . . . 91Figure 6.15. Spectra of the clock signal, before and after lock. . . . . . . . . . . . . . . . . . . . 92Figure 6.16. AGC I/Q input and LPF output waveforms.. . . . . . . . . . . . . . . . . . . . . . . . 92Figure 6.17. Signal Q1 (hard-limited version of the Q1 in Figure 5.1 on page 51). . . . . 93Figure 6.18. Signal N1 (see also Figure 5.1 on page 51). . . . . . . . . . . . . . . . . . . . . . . . . 93Figure 6.19. The asynchronous/synchronized direction signal. . . . . . . . . . . . . . . . . . . . 93Figure 6.20. The asynchronous/synchronized speed signal. . . . . . . . . . . . . . . . . . . . . . . 94Figure 6.21. Simulated demodulator input and output waveforms in a 5 ms interval. . . 95Figure 6.22. The incomplete transition detection and its effect on the demodulation. . . 96Figure A.1. The AGC loop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108Figure A.2. The differential variable MOS resistor. . . . . . . . . . . . . . . . . . . . . . . . . . . 109Figure A.3. The OPAMP. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109Figure A.4. The CMFB circuit used in the OPAMP. . . . . . . . . . . . . . . . . . . . . . . . . . . .110Figure A.5. The CMFB buffer.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110Figure A.6. The negative peak detector.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .111Figure A.7. The attenuator and the source follower used in the AGC loop. . . . . . . . . .111Figure A.8. The 5th order gyrator-type elliptic filter. . . . . . . . . . . . . . . . . . . . . . . . . . .112

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LIST OF FIGURES xiii

Figure A.9. The linearized Gm cell.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112Figure A.10. A simple offset cancellation method making use of a peak detector and an

adder.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .112Figure A.11. The demodulator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113Figure A.12. The zero-crossing interpolator, hard-limiters and zero-crossing pulse

generators. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114Figure A.13. The adder. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115Figure A.14. The limiter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115Figure A.15. The first 2 stages of the limiter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116Figure A.16. The self-biased amplifier. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116Figure A.17. The zero-crossing pulse generator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .117Figure A.18. The clock recovery block.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .118Figure A.19. The delay element. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119Figure A.20. The transition detector (the output stage excluded). . . . . . . . . . . . . . . . . . .119Figure A.21. The AC block of the transition detector.. . . . . . . . . . . . . . . . . . . . . . . . . . 120Figure A.22. The AOA block of the transition detector. . . . . . . . . . . . . . . . . . . . . . . . . 120Figure A.23. The “11” detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120Figure A.24. The phase detector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121Figure A.25. The charge pump circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121Figure A.26. The VCO circuit.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122Figure A.27. The decision logic of the demodulator.. . . . . . . . . . . . . . . . . . . . . . . . . . . 122Figure A.28. The zero-crossing counter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123Figure A.29. The direction comparator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123Figure A.30. The speed comparator. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123Figure A.31. Transmission gate based logic gates and their symbols.. . . . . . . . . . . . . . 124Figure A.32. The basic D flip-flop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124Figure A.33. The resetable D flip-flop. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124Figure A.34. The 2 to 1 multiplexor (MUX21) and the 4 to 2 multiplexor (MUX42). . 125Figure A.35. The threshold voltage referenced current source (cell: iRefVth).. . . . . . . 126Figure A.36. The simple circuit for biasing the demodulator (cell: iRefSimp). . . . . . . 126Figure A.37. The analog buffer (cell: follow). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127Figure A.38. The digital buffer (cell: driver). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127Figure B.1. Pin assignment diagram of the base-band circuits. . . . . . . . . . . . . . . . . . . 133Figure B.2. The testing circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 135Figure B.3. The PCB designed for the base-band testing circuit. The size is

98.5mm×123.6mm.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 136Figure B.4. The zero-IF quadrature components of the FSK signal of the “+3−3”

symbol series. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139Figure B.5. Input setups for different types of measurement. The DC voltage is 1.1V.139

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List of Tables

Table 1.1 Main features of POCSAG, FLEX and ERMES. . . . . . . . . . . . . . . . . . . . . . 2Table 3.1 RF Front-End Budget.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28Table 5.1 State transition table of the counter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58Table 5.2 Truth table of the speed comparator.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60Table 5.3 State transition table of the “11” detector. . . . . . . . . . . . . . . . . . . . . . . . . . 69Table 5.4 Truth table of the output stage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69Table 6.1 Cascaded harmonic distortions of the AGC, the LPF and the offset

cancellation stage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88Table 6.2 Performance summary of the base-band circuit.. . . . . . . . . . . . . . . . . . . . . 96Table 6.3 Performance summary of the front-end. . . . . . . . . . . . . . . . . . . . . . . . . . . . 96Table 6.4 Summary of the whole receiver (off-chip matching inductor). . . . . . . . . . 97Table 7.1 Possible gain distribution and signal levels. . . . . . . . . . . . . . . . . . . . . . . . 100Table A.1 List of components.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128Table B.1 Pin assignment of the base-band circuits . . . . . . . . . . . . . . . . . . . . . . . . . 134Table B.2 External components list. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 137Table B.3 Data points of the arbitrary waveform. Frequency = 800 kHz. . . . . . . . . 139Table B.4 Typical DC operation points. Vdd=3.0V, Vdc=1.1V. . . . . . . . . . . . . . . . . 140

xiv

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CHAPTER 1Introduction

The revolutionary advances in solid-state devices and integrated circuits (ICs) has brought the

world of wireless communications into a completely new era. The once bulky and luxury

mobile phones for example, are now handy and common tools for every individual from every-

where. Here new technologies act as the driving force which has been pushing the personal

wireless communications market into today’s boom. In return, the market motivates the tech-

nology by putting even aggressive demands on the performance, cost, form-factor and power

consumption of the mobile receiver/transceiver. Despite the remarkable progress made in the

very large scale integration (VLSI) technology, analog circuit design does not benefit as much

from the scaling-down and other advances, in terms of level of integration, power consumption

etc., as digital circuit design does. To meet these requirements, communication system consid-

erations, receiver/transceiver architecture innovations play the most essential role.

In this dissertation, we discuss the architecture and circuit design of a direct-conversion 4-

level frequency shift keying (FSK) radio receiver. This project is motivated by the new high

speed radio paging standard FLEX and the successful implementation of the direct-conversion

scheme in the binary FSK-based POCSAG paging system.

1.1 High Speed Paging Systems and The FLEX Protocol

For years, traditional pagers have been running in compliance with a standard known as POC-

SAG1 which utilizes the modulation scheme of binary FSK (BFSK) to support the data rate of

1. Post Office Code Standardization Advisory Group

1

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CHAPTER 1 Introduction 2

1200 or 24001 bits per second (bps). The insatiable quest for information and the growth of

new paging markets in rapidly developing countries have called for a more efficient and higher

speed system. Two such systems, ERMES2 in Europe and FLEX3 in America and Asian Pacific

region, both make use of 4FSK and enable comparable top data rates of 6250 and 6400 bps.

We have focused on the latter for its popularity in the interested region but the former can be

treated in very much the same way. Furthermore, the concept also applies to other systems in

which digital frequency modulation is used. Table 1.1 gives a comparison of the 3 mentioned

standards.

1.1.1 FLEX Overview

FLEX is designed to be an adaptive protocol with the ability to adjust its date rate and modula-

tion level according to the channel loading. The idea is to achieve the best quality in low-traffic

hours and/or territories and to maximize the channel capacity when the traffic goes up. At its

top speed, the 6400 bps data rate enables 4 concurrent 1600 bps messages to be sent in a single

channel and thus increases the channel capacity by 4 times. It also offers better error immunity

by applying the Bose-Chadhuri-Hocquenghem (BCH) coding along with an interleaving pro-

cess. More information about this protocol can be found on Motorola’s FLEX web site [1].

1.1.2 FLEX Signal Structure

The FLEX signal is transmitted as a series of 4-minute cycles. Each cycle consists of 128

1.875-second long frames. A pager may be assigned to process any number of these frames

and skips the rest, thus minimizing the power for signal processing. As shown in Figure 1.1,

each FLEX frame has a synchronization portion and a data portion. The synchronization por-

tion consists of:

1. These are typical values. Other options include the low speed 512 bps and high speed but very uncommon 4800 bps.2. European Radio Message System3. An acronym for “FLEXible wide area paging protocol”, also a trademark of Motorola Inc.

Table 1.1 Main features of POCSAG, FLEX and ERMES.

POCSAG FLEX ERMES

Data Rates 1200 or 2400 bps up to 6400 bps 6250 bps

Modulation Binary FSK Binary or 4FSK 4FSK

Frequency Deviation 4.5 kHz 1.6 and 4.8 kHz 1.5625 and 4.6875 kHz

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CHAPTER 1 Introduction 3

• First synchronization signal at 1600 bps for frame lock,

• 11-bit frame information word (7-bit frame number + 4-bit cycle number), and

• Second synchronization signal as the data rate indicator.

The data portion is divided into 11 data blocks, lasting 160 ms each. Thus the synchronization

portion is 115 ms long. This sets the constraint on the settling performance of the receiver.

Figure 1.1 is duplicated from [2] where a detailed description of the signal structure is pro-

vided, as well as other information such as FLEX message word definitions etc.

1.2 The Direct-Conversion Technique

Ever since the introduction of the superheterodyne system, it has been adopted in virtually

every radio receiver. The idea of down-converting the interested spectrum to one or more inter-

mediate frequencies (IFs) makes it possible to process the signal under well-controlled condi-

tions. High selectivity is achieved by inserting high quality filters at each IF strip. With the

need to suppress the image, an image-rejection filter is required at the radio frequency (RF)

front-end. The amount of image being rejected depends on the first IF frequency. Therefore,

conventional superheterodyne receivers have to work at a relatively high IF (say, 10% of the

carrier frequency). As a result, in addition to the RF image-rejection filter, high quality band-

Figure 1.1. FLEX signal structure.

Frame 127

Frame 0

Frame 1

Frame 2

Frame 125

Frame 126

Frame 127

One Cycle = 4 minutes

FrameInfo

Sync2Sync1 Block 0Word 0 to 7

Block 9Word 72 to 79

Block 10Word 80 to 87

One Frame = 1.875 seconds

One Block= 160 ms115 ms

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CHAPTER 1 Introduction 4

pass IF filters must be used for an acceptable selectivity. As the transfer characteristics of these

filters are usually well beyond the capability of today’s IC technology, discrete passive devices

become the most common choice. On the positive side, the performance is guaranteed. On the

negative side, however, the drawback is at least 3-fold:

• higher cost;

• lower integration level;

• higher power consumption.

These points become very unfavorable when price and size is the issue. A lot of effort has

been made to seek an alternative or modified architecture to the conventional one such that the

requirements of the image-rejection and IF filters can be relaxed. The ultimate goal is to com-

pletely eliminate these off-chip filters. The RF filter may be realized in some applications in its

simplest form by utilizing the band-pass properties of the antenna and the low-noise amplifier

(LNA) without the burden of the image-rejection specification. The IF filters should be readily

replaced by their integrated counterparts.

Several receiver architectures have been conceived to implement the idea, each with its

pros and cons. The low-IF and direct-conversion (or zero-IF) are two of the most well-known.

The low-IF solution is based on the fact that theoretically, the image frequency can be

removed by a specially designed mixer (the image-rejection mixer) so that the IF frequency

can be lowered to enable the use of monolithic filters [3]. The problem associated with this

type of architectures is the limited image rejection ratio due to the mismatch in the image-

rejection mixer.

Direct-conversion is believed to be the most simple and straightforward way to build a

radio receiver. That’s why its embryonic form appeared only 6 years later than the non-zero-IF

superheterodyne receiver [13]. By converting the RF signal directly to the base band, the

image frequency no longer exists. The benefits are obvious: no circuitry is needed to do the

task of image-rejection; IF filtering could be performed by low pass filters (LPFs) in the form

of Gm-C or switched-capacitor (SC). Nevertheless, the idea didn’t seem to be much useful in

practical applications until the 80’s when it proved its value in the POCSAG radio paging

receiver[4][5]. Many more examples follow [6-10], including the designs presented in the lat-

est IEEE International Solid-State Circuits Conference (ISSCC) [11][12].

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CHAPTER 1 Introduction 5

The merits and drawbacks of direct-conversion have been investigated intensively since its

success. Common design issues and their possible solutions have been identified and summa-

rized [3][13]. The biggest concern is known to be the DC offset related problems. Undesired

DC components are originated mainly from two different mechanisms: self-mixing and even

order distortion. In a fully balanced design, the latter is a result of device mismatch. When

referred to the output of the mixer, the offset level can easily reach the order of 10 mV. This is

more than enough to corrupt the weak signals (10 to 100 µV) and saturate the following stages.

To avoid the disaster, some kind of offset-cancellation strategy is inevitable. In the pager

example, AC-coupling capacitors are used to block the DC offset. Receivers work in the time-

division multiple access (TDMA) system can make use of the idle time slot to measure the off-

set and perform the cancellation in the coming operation mode. Recently, encouraging

progress has also been made on the reduction of the self-mixing caused offset by means of har-

monic mixing [33].

DC offset is not the only problem, troubles also come from the flicker or 1/f noise which is

found in all active and some passive devices, especially those in the CMOS technology. Just

like the offset, flicker noise can dominate weak signals before enough amplification is pro-

vided. Device size and bias conditions affect the flicker noise spectral density level and thus

can be tuned when necessary. More advanced techniques such as chopper stabilization and cor-

related double sampling (CDS) are very effective in reducing offset and low-frequency noise at

the price of increased complexity, power consumption and thermal noise.

Other things like the local frequency (LO) leakage must also be treated carefully but DC

offset and flicker noise is the main barrier which limits the direct-conversion to only a few type

of practical applications.

1.3 Direct-Conversion for FLEX

Because of its compact and low cost nature, direct-conversion is particularly appealing in low-

to medium-end devices like the pager units. The POCSAG receiver makes a good example.

While the new paging systems are more efficient, they do encounter difficulties during a simi-

lar refinement.

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CHAPTER 1 Introduction 6

The first problem is how to suppress or cancel the DC offset. AC-coupling is no longer a

valid method due to the fact that, unlike POCSAG, the FLEX system incorporates a higher

modulation level with a much higher data rate and consequently creates significant energy in

the vicinity of DC. There is no perfect solution but as the first step we will use the harmonic

mixer to minimize the self-mixing related offset. Possible schemes for the reduction of mis-

match induced offset are also discussed.

The second problem is how to demodulate the zero-IF 4FSK signal. In conventional super-

heterodyne FSK (or FM) receivers, the frequency discriminator is commonly used to convert

frequency domain information to voltage (or current) domain. High sensitivity can be achieved

in this way but the penalty is again increased cost and lowered integration level. At the same

time, this approach works only at a non-zero IF frequency. Therefore it is not an appropriate

choice. Demodulation in the direct-conversion POCSAG receiver employs a phase-compari-

son method which makes a decision by simply observing the phase difference between the

quadrature I and Q components of the down-converted signal. Unfortunately it works only

with the binary FSK. A general M-ary FSK demodulator can be constructed by combining the

phase-comparator with a zero-crossing counter [7] which calculates the number of zero-cross-

ings in a symbol period. Its accuracy can be improved using a technique (termed zero-crossing

interpolation here) which generates additional zero-crossings for detection. It has been demon-

strated [14] that as more additional zero-crossings are generated the error probability

approaches that of the discriminator type demodulator.

1.4 Contributions

The primary contribution of this thesis is the system modeling, analysis, circuit design and

integration of a direct-conversion receiver for high speed radio paging applications. This is, to

the best of the author’s knowledge, the first time that the design of a direct-conversion receiver

for the 4FSK FLEX or ERMES system is reported. A combined solution which incorporates

the harmonic mixing mechanism with a differential peak alignment method is applied to com-

bat the DC offset problem. Information loss due to the use of the conventional DC-block

method [4-6] is thus avoided. The demodulation is done in the digital domain. The combina-

tion of the newly-developed zero-crossing interpolation (ZCI) technique and an effective clock

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CHAPTER 1 Introduction 7

recovery scheme not only improve the bit error rate (BER) degradation resulted from low mod-

ulation indices but also yield a low-cost solution. These features make the receiver a novel and

unique design. Specifically, the thesis work that I have done independently can be summarized

in the list given below:

• a feasibility study on applying the direct-conversion architecture in FLEX paging

receivers [15];

• the modeling of the counter type M-ary FSK demodulator for BER analysis in the

additive white Gaussian noise (AWGN) environment and the derivation of circuit

requirements based on the BER analysis [16];

• the planning, design1 and integration of a CMOS prototype receiver which contains all

major building blocks [17-19];

• the introduction of a possible DC offset reduction method for direct-conversion receivers

working in frequency-modulated systems where AC-coupling is not viable.

1.5 Thesis Layout

A review on the FSK signal and its demodulation methods is given in Chapter 2. The counter

type zero-IF zero-crossing M-FSK demodulator (ZIFZCD) and the ZCI technique are then

introduced. Chapter 3 describes the modeling and performance of the ZIFZCD, followed by a

set of nominal circuit requirements which are necessary to achieve official paging receiver

specifications. Details on the circuit design of a prototype receiver are treated in the following

two chapters, 4 and 5. Chapter 6 presents the measurement results of the prototype receiver and

Chapter 7 concludes the whole design flow and gives suggestions on the future work. In

Appendices A and B detailed circuit parameters and measurement setup are provided.

1. The circuit design work covers the automatic gain control loop, the low-pass channel selection filter, the demodulator and the clock recovery loop. The RF front-end, including the low noise amplifier and the quadrature mixer, are designed by other people, as will be stated in Chapter 4.

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CHAPTER 2FSK Modulation and Demodulation

As one of the basic band-pass modulation formats, FSK is used extensively in modern digital

communication systems because of its better noise immunity (compared to amplitude modula-

tion) and easier implementation (compared to phase modulation). The radio paging and cord-

less phone systems are two of the familiar examples.

In this chapter a review on some important properties of the FSK signal will first be given,

followed by a discussion of different demodulation methods. Finally the counter-type demodu-

lator and the ZCI technique will be introduced.

2.1 The FSK Signal

An FSK modulated signal has a constant envelop and very often a continuous phase (CPFSK).

In the mathematical form, it can be written as

(2.1)

where A0 is the signal amplitude, fc is the carrier frequency which can be either the RF fre-

quency fRF or the IF frequency fIF, α is the random carrier phase and

(2.2)

is the instantaneous phase introduced by the frequency modulation. Here we assumed that

there is no amplitude modulation, the digital symbol train starts from number 0 and the modu-

s t( ) A0 2πfct φ t( ) α+ +[ ]cos⋅=

φ t( ) 2πfd ang τ nT–( )n 0=

∑ τd0

t

∫=

8

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CHAPTER 2 FSK Modulation and Demodulation 9

lation begins at the time t = 0. In equation (2.2) fd is the minimum frequency deviation; T is the

symbol duration; an is the M-ary digital symbol value and

is a rectangular pulse. To use the bandwidth efficiently, the sinusoids used to represent the

symbols are usually evenly distributed over the frequency axis, resulting in a constant tone

spacing. In this case, fd can also be considered as a half tone spacing. Taking the 6400 bps 4-

FSK FLEX signal as an example,

While the carrier frequency affects only the location of the signal spectrum, the data rate and

frequency deviation (or tone spacing) determine the spectrum shape and other important prop-

erties. A specific parameter known as the modulation index is used to describe these proper-

ties.

2.2 The Modulation Index and FSK Spectra

The modulation index h is defined by the tone spacing to symbol rate ratio:

(2.3)

It has a close relationship to the signal spectrum. Higher modulation indices yield better spec-

tral efficiency but risk higher error rates. Power spectra of FSK signals can be obtained by sim-

ulation or measurement. A general analytical computation involves complex mathematical

theories and is beyond the scope of this dissertation. An excellent analysis can be found in

[20]. Here the result is directly applied to the interested cases. Figure 2.1 shows the power

spectra of both the FLEX (4FSK at 6400 bps and BFSK at 3200 bps) and POCSAG (BFSK

2400 and 1200 bps) signals. Assumption is made that the modulating digital bits are statisti-

cally independent. Observing the plots, one comes to the conclusion naturally that the energy

g t( )1 0 t T≤ ≤0 otherwise

=

fd 1.6 kHz=

an 1± 3±, ∈T 3.2 kHz=

h 2fdT=

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CHAPTER 2 FSK Modulation and Demodulation 10

gets more confined to the tone frequencies as h increases. As a result, nulls are formed at DC in

the POCSAG spectra whereas significant DC components exist in the FLEX signals, espe-

cially when 4FSK modulation is used. This imposes additional difficulties to the direct-conver-

sion implementation of the FLEX receiver, as will be discussed later.

2.3 The Phasor Diagram

In a direct conversion FSK receiver, the input signal is down-converted to the base-band in-

phase (I) and quadrature-phase (Q) signals1. As the carrier phase is irrelevant in a non-coherent

detection process which we will focus on, it will be regarded as zero from now on, unless oth-

erwise stated. Thus, these two signals can be written as2

(2.4a)(2.4b)

1. The I and Q signals are also known as the real and imaginary parts of the band-pass RF signal’s complex envelop.2. The Q signal may also be expressed as sQ = −Asinφ(t), as the two quadrature LO signals are switchable.

−15 −10 −5 0 5 10 15−60

−50

−40

−30

−20

−10

0

−15 −10 −5 0 5 10 15−60

−50

−40

−30

−20

−10

0

−15 −10 −5 0 5 10 15−60

−50

−40

−30

−20

−10

0

−15 −10 −5 0 5 10 15−60

−50

−40

−30

−20

−10

0

Figure 2.1. Analytical power spectra of both the FLEX and POCSAG signals at different data rates (modulation indices). The y-axis is in dB; x-axis shows the frequency offset from the carrier in kHz. The lines in (a) and (b) are discrete spectral components.

(a) FLEX 6400, 4FSK; h=1.0 (b) FLEX 3200, BFSK; h=3.0

(d) POCSAG 1200; h=7.5(c) POCSAG 2400; h=3.75

sI A φ t( )cos=sQ A φ t( )sin=

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CHAPTER 2 FSK Modulation and Demodulation 11

(2.4)Here φ(t) is defined in (2.2). The signal paths through which sI and sQ are processed are called

the I-channel and Q-channel, respectively. With these definitions, the FSK signal can be

explained in a more direct way using the phasor diagram shown in Figure 2.2. A phasor dia-

gram provides necessary information on the phase and hence the I/Q signals’ variations. The

phase variation can be characterized by the rotation speed and direction of the phasor:

In a BFSK system, the speed is a constant and the direction becomes the only variable. For M-

ary signals, the phasor rotates at different speeds depending on the instantaneous data value.

Consequently, demodulation of an MFSK signal requires the detection of both the speed and

direction. On the other hand, when the phasor rotates across any of the two axes from one

quadrant to another, a zero-crossing appears in either the I- or Q-channel. Counting both chan-

nels, the nominal number of zero-crossings in one symbol interval can be shown to be

(2.5)

The information a frequency modulated signal carries is solely embodied in the zero-crossings.

This feature will be used later to demodulate the signal.

speed1

2π------ d

dt----- φ t( ) an fd= =

direction an( )sgn=

Figure 2.2. The phasor diagram.

I

Q2πanfd

φ(t)

NZC 2 an h=

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CHAPTER 2 FSK Modulation and Demodulation 12

2.4 FSK Demodulation

Theoretically, coherent detection is the optimal solution. However, a coherent receiver requires

the precise carrier frequency and phase information (fc and α in (2.1)) of the incoming signal.

Thus, a considerable amount of complexity has to be added into the system to achieve a satis-

factory carrier recovery. The problem gets even worse in a mobile fading channel. On the other

hand, non-coherent detection methods are easy to implement and used widely in applications

where a coherent method is not affordable or not necessary.

2.4.1 The Correlation-Squaring Receiver

When the carrier phase is unknown, it can be treated as a uniformly distributed random vari-

able over the [0, 2π] interval. The optimal receiver for FSK signals with such a property in the

AWGN channel is the Correlation-Squaring Receiver [21][22]. Figure 2.3 shows the demodu-

lation of BFSK signals with this receiver. M-ary signals can be handled in the same way but a

linear increase in the complexity with the modulation level M is expected.

Figure 2.3. Demodulation of BFSK signals with the correlation-squaring receiver.

∫0

Τ (∙)2

Σ

∫0

Τ (∙)2

∫0

Τ (∙)2

Σ

∫0

Τ (∙)2

ΣOutputInput

cos2π(fc+fd)t

sin2π(fc+fd)t

cos2π(fc-fd)t

sin2π(fc-fd)t

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CHAPTER 2 FSK Modulation and Demodulation 13

2.4.2 The Quadrature Detector

Although the correlation-squaring receiver yields superior performance, the hardware penalty

and extra design efforts make it a less attractive choice. A class of detectors commonly used in

FM demodulation are known as the quadrature FM detectors or frequency discriminators

[23][24]. The basic circuit is shown in Figure 2.4. The input signal Vin is usually hard limited to

suppress amplitude modulation. The LC tank and the capacitor C1 resonate at the carrier fre-

quency fc. The signal V1 is a phase-shifted version of Vin, with some amplitude difference. The

amount of phase shift in terms of the input frequency f can be shown to be

where is the relative frequency deviation, is the loaded Q of the network. At

the carrier frequency φ(fc) = 90°. As the input frequency deviates from the carrier, additional

phase leading or lagging is resulted. The multiplier acts as a phase detector or comparator. Its

output contains a low frequency portion which is proportional to the phase difference and a

high frequency portion which will be filtered out. Thus, the output voltage will be proportional

to the input frequency variation. This detector is also used in superheterodyne FSK receivers.

Depending on the modulation index, its error performance can be comparable to that of the

correlation-squaring receiver [20].

Figure 2.4. FM quadrature detector.

VinV1

R C

C1

L

LC Tank or

LPFVout

V2

Ceramic Discriminator

φ f( ) 1 ξ+ξ 2 ξ+( )Q-------------------------atan=

ξf fc–

fc-----------= Q R

ω0L----------=

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CHAPTER 2 FSK Modulation and Demodulation 14

2.4.3 The Digital Phase Comparator

The methods stated above operate at certain carrier frequencies. In a direct-conversion FSK

receiver, new detectors must be invented to accommodate the zero-IF. One such device was

presented by I.A.W. Vance in [5] and its simplified diagram is depicted in Figure 2.5. From the

discussion in the previous sections, it is clear that the DFF here works as a phase comparator

which detects the rotation direction of the phasor. The accuracy can be further improved with a

balanced structure [6].

2.5 ZIFZCD and ZCI

Vance’s FSK receiver and its variants detect only the phasor direction and are thus not applica-

ble to M-ary systems such as the FLEX. To extract the speed information, a straightforward

way is to count the zero-crossings symbol by symbol. But from (2.5) we know that as the mod-

ulation index becomes smaller, the number of zero crossings decreases. This will definitely

hurt the error performance. E.K.B. Lee et al. [14][25] discovered a simple method to compen-

sate for the loss. The idea is to generate more zero-crossings in the given symbol interval by

introducing more channels. As shown in Figure 2.6, with 2 additional axes I1 and Q1, the num-

ber of zero-crossings is doubled as the phasor rotates across all the axes. These new channels I1

and Q1 can be created using another pair of quadrature mixers, with the local oscillator (LO)

phase shifted by 45° and 135°, respectively. But a more effective way is to derive the 2

required signals by simple addition and subtraction operations at the base-band:

Figure 2.5. Principle of Vance’s direct conversion radio paging receiver.

90°LO

I-Channel

Q-Channel

Limiter

LNA

D

CLK

Q

DFF

DATAAmplifiers

5

4

3

2

131

2 4

5

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CHAPTER 2 FSK Modulation and Demodulation 15

(2.6a)

(2.6b)

(2.6)The 3 dB amplification can be cancelled out by a gain adjustment. But this is not necessary as

the next stage will be a hard-limiting block. More axes can be generated in the same manner.

This technique is termed Zero-Crossing Interpolation (ZCI) here. The total number of axes in

the phasor diagram is 2i+1 where i is called the interpolation or ZCI level. Equation (2.5) which

calculates the total number of zero-crossings per symbol should also be revised to

(2.7)

A demodulator with 1-level ZCI is shown in Figure 2.7 where two new signals I1 and Q1 are

generated. The demodulation is done in the digital domain by applying hard-limiting to all

these signals. Each of the I/Q pair is then passed to a zero-crossing pulse generator which is

very similar to the BFSK demodulator described in [6] except that the RC differentiator is

replaced by a digital difference block which consists of a delay element and a difference ele-

ment (subtractor), as shown in Figure 2.8. The output of the pulse generator is a series of

pulses with positive or negative polarities to indicate the phase relationship between the I and

Q inputs, one pulse for one zero-crossing. The pulse polarity is used for phasor direction detec-

tion and the number of pulses are counted for speed detection.

In the examples of 0.5 and 1.5 modulation indices CPFSK signals given in [14], the error

probability performances approach those of the LDI (limiter-discriminator with integrator-

dump filter) demodulators as the ZCI level increases.

sQ1 sQ sI– A φ t( )sin A φ t( )cos– 2A φ t( ) π4---+cos= = =

sI1 sQ sI+ A φ t( )sin A φ t( )cos+ 2A φ t( ) π4---+sin= = =

NZC 2 i 1+( ) an h=

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CHAPTER 2 FSK Modulation and Demodulation 16

Figure 2.6. 1-level zero-crossing interpolation.

I

Q

I1

Q1

45°135°

Σ

DirectionDecision

Counter

Σ

I1

1Q

Zero-CrossingPulse Generator

Zero-CrossingPulse Generator

Q

SpeedDecision

Speed

DirectionI

Figure 2.7. The ZIFZCD with 1-level zero-crossing interpolation.

∆t Σ

Σ∆t

Σ

Q

I

Output

Figure 2.8. The zero-crossing pulse generator.

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CHAPTER 3System Modeling and Circuit Requirements

The ZIFZCD discussed in the last chapter is a novel digital M-ary FSK demodulator for direct-

conversion receivers. Before using it in a real system, a number of issues are to be resolved.

This chapter studies the system modeling of the direct-conversion FLEX paging receiver

with ZIFZCD. Official standards issued by the Hong Kong Office of Telecommunications

Authority (HKOFTA) [26] and the Ministry of Post and Telecommunications of China [27] on

radio receivers for public paging service are applied to the model to derive circuit requirements

of the front-end blocks. Issues such as gain, nonlinearity and noise will be examined.

3.1 The Receiver Model

A high level model of the direct-conversion receiver working in the AWGN channel is shown

in Figure 3.1. We first assume the RF section is ideal so that the noise free signal can be

Figure 3.1. The receiver model. The demodulator is shown in Figure 2.7.

90 LOLNA

demodulator

nonlinearity

nonlinearity

Noise FreeRF Signal

~

r tQ( )~

r tQ( )

n tS( )

n tC( ) r tI( )

r tI( )

17

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CHAPTER 3 System Modeling and Circuit Requirements 18

directly down-converted to the base-band quadrature components without distortion. The cor-

responding base-band Gaussian noise terms are added in at the output of the mixer pair. Each

of the I and Q signals is then passed to a polynomial block to model the distortion introduced

by the RF front-end. Finally the channel selection is done by a 11th order Chebyshev filter pair.

Neglecting the high frequency components, at the input of the polynomial block, we have

(3.1a)(3.1b)(3.1)

where nc(t) and ns(t) are the equivalent base-band components of the band-limited input noise.

These signals are amplified and distorted by the polynomial block which has the function of

(3.2)

where x(t) and y(t) are the input and output signals respectively; a1, a2 and a3 are constant gain

factors. The second and third order input intercept points of the front-end are approximated by

(3.3a)

(3.3b)

(3.3)in linear scale. When referred to the 50Ω resistance, their more frequently used dBm equiva-

lents are

(3.4a)

(3.4b)

(3.4)

3.2 Official Specifications

The HKOFTA has defined 5 parameters for very high frequency (VHF) public radio paging

receivers as the minimum performance requirements:

1. reference sensitivity,

2. spurious response rejection,

rI t( ) A φ t( )cos nc t( )+=rQ t( ) A φ t( )sin ns t( )+=

y t( ) a1x t( ) a2x2 t( ) a3x3 t( )+ +=

IIP2a1

a2

----≈

IIP343--- a1

a3

----≈

IIP2 10 10 a1

a2

----2

log=

IIP3 10 1043--- a1

a3

----× log=

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CHAPTER 3 System Modeling and Circuit Requirements 19

3. desensitization,

4. intermodulation response rejection, and

5. radiated spurious emissions.

These are originally defined for the POCSAG system. However, as standards for the paging

service, they should apply equally to the new system. As specifications 2 and 5 are more cir-

cuit-level related issues and can be satisfied with careful circuit design and layout, only the

other three are included in this high level simulation.

By definition, the reference sensitivity is the field strength surrounding the receiver antenna

and is 3 dB above the minimum value required for a successful calling rate of 80%. The equiv-

alent BER for the 80% successful calling rate is 3% in the POCSAG system [28]. In our simu-

lation, we used 1% BER as the borderline and defined the sensitivity as the minimum input

signal power delivered to the LNA to produce this BER. Therefore, the reference sensitivity

and the sensitivity are two related terms with different meanings here. Given the field strength

to calculate the amount of power available for the LNA, one needs to know the efficiency and

the effective aperture of the antenna as well as the carrier frequency [29]. The conversion prob-

lem will be discussed in the next section.

To measure the desensitization, an un-modulated signal which is at least one channel away

from the nominal operating frequency is introduced as the interference. The desired signal

level is adjusted to yield a field strength that is equivalent to the reference sensitivity level

around the antenna. The desensitization is the difference between the interference and the

wanted signal in dB when the successful calling rate is reduced by the interferer to 80%. In the

simulation the interferer is exactly one channel away from the desired signal.

The intermodulation response rejection (IMRR) measurement is a little more complicated.

According to the HKOFTA specification, a testing signal at the nominal operating frequency f0

is first applied to yield a successful calling rate of 80%. Its level U is recorded. The signal fre-

quency is then changed to f0 + 2nfch where n = ±4 and fch is the channel spacing. At the same

time, an un-modulated carrier at f0 + nfch is introduced. The levels of these two signals are kept

the same and increased to a minimum value V at which a false decoder response is obtained.

The IMRR is V − U in dB. An alternative definition is formulated by the Ministry of Post and

Telecommunications of China. It also uses the signal level U as the reference. But unlike the

HKOFTA specification, the level of the first testing signal is increased by 3 dB from U while

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CHAPTER 3 System Modeling and Circuit Requirements 20

its frequency is unchanged. Two equal level unwanted signals are then applied. One of them is

an un-modulated carrier at f0 + mfch (m = ±1, ±2 or ±4) and the other is an FM signal at

f0 + 2m fch. The FM signal is modulated by a 400 Hz sinusoid with a peak frequency offset of 3

kHz. The level of these two signals are increased to W at which the successful calling rate

drops to 80%. The IMRR is W − U in dB. Since the BER is not an intuitive indicator of the

decoder response, we chose the second method for the IMRR simulation.

3.3 Simulation Results

The simulation is carried out to verify the performance of the demodulator, especially the sen-

sitivity and the interference rejection ability, as well as to investigate the circuit requirements

on the RF front-end. It is done with an effort to follow the setup which is suggested in formal

measurements. Besides the specifications described in Section 3.2, impacts of I/Q phase mis-

match and LO frequency drift are also studied. The channel spacing is 25 kHz. Bandwidth of

the channel selection filter is about 8 kHz.

3.3.1 Sensitivity

As shown in Figure 3.2, for the demodulator with 2-level interpolation, the 1% BER level is

achieved at an ES/N0 ratio of about 13.5 dB when the overall front-end IIP2 and IIP3 are 11

dBm and −36 dBm, respectively. Since

(3.5)

where N0 = kT is the thermal noise spectral density; Ps is the signal power; RS = 3200 symbols

per second is the baud rate, we have

(3.6)

at room temperature (300°K). Assume the equivalent noise bandwidth B is 9 kHz, the signal to

noise ratio (SNR) is:

ES

N0

-----Ps RS⁄

N0

--------------=

Ps 10 kT RS⋅( )logES

N0

----- 30+ +=

125.3 (dBm)–≈

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CHAPTER 3 System Modeling and Circuit Requirements 21

(3.7)

At the presence of interference components, as is the case in the desensitization and IMRR

testing, the signal to noise-and-interference ratio (SNIR) should also be kept above this level in

order to maintain the successful calling rate. Neglecting the noise contribution of the base-

band stages, the receiver sensitivity is only limited by the noise performance of the RF front-

end. To achieve 120 dBm sensitivity the front-end noise figure (NF) must therefore be as low

as 5.3 dB. This number will be used in the following section to determine the RF front-end

gain and noise budget. The maximum reference sensitivity required by the HKOFTA is 26

dBmV/m. Using the same antenna parameters given by [29] and assuming perfect LNA input

matching, this field strength is equal to −109 dBm signal power input to the LNA at 280MHz

nominal operating frequency and the equivalent receiver sensitivity is 3 dB lower, i.e. 112

dBm. Hence we have an 8 dB margin to make up for the errors resulted from our simple model.

It is noticeable that a continued increase in the level of interpolation will yield only dimin-

ishing improvement. The extra cost of hardware will probably not justify it.

Figure 3.2. BERs at different interpolation levels.

11 11.5 12 12.5 13 13.5 14 14.5 15 15.5 1610

−3

10−2

10−1

No interpolation1−level interpolation2−level interpolation

Es/N0 (dB)

Bit

Err

or R

ate

SNRES

N0

----- 10RS

B-----

log+ 9 (dB)≈=

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CHAPTER 3 System Modeling and Circuit Requirements 22

3.3.2 Desensitization

The same method that is used in the HKOFTA desensitization testing is applied in the simula-

tion. To provide the reference sensitivity, the ES/N0 ratio is set to 16.5 dB. An un-modulated

interference signal which is 65 dB higher than and one channel apart from the wanted one is

Figure 3.3. Effect of the 2nd order nonlinearity on desensitization.

Figure 3.4. Effect of the 3rd order nonlinearity on desensitization.

−18 −16 −14 −12 −10 −8 −6 −4 −2 0

10−3

10−2

10−1

No interpolation1−level interpolation2−level interpolation

16.915.013.412.110.99.9 19.4 23.0 29.0 ∞IIP2 (dBm)

Bit

Err

or R

ate

a2

−3

10−2

10−1

No interpolation1−level interpolation2−level interpolation

-103-104-105 -102 -101 0 a3

IIP3

-106

(dBm)-6.25-16.25-26.25 3.7 13.7 ∞-36.25

Bit

Err

or R

ate

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CHAPTER 3 System Modeling and Circuit Requirements 23

introduced to verify the performance. Since the minimum desensitization requirement is 65

dB, a BER of 1% or lower is expected. Simulation results at 25 dB gain (a1 = 17.8) are

depicted in Figure 3.3 and Figure 3.4 in the format of BER versus a2 (IIP2) and a3 (IIP3) of the

front-end, respectively. The relationship between the intercept points and the coefficients a2, a3

is given in (3.4). Not surprisingly, the 2nd order distortion plays a critical role because of the

resultant low frequency components which fall into the base-band and therefore can not be fil-

tered out. As a result, the RF front-end must yield at least 11 dBm IIP2 to satisfy the desensiti-

zation requirement.

Figure 3.4 is plotted here as a comparison. One shouldn’t come to the conclusion that the

receiver is able to work at very poor IIP3’s. In fact, as the only interferer in this simulation is

an un-modulated carrier which is one channel away from the nominal, the 3rd order distortion

creates no in-band interference at all. This is different from the case of intermodulation

response.

3.3.3 Intermodulation Response Rejection

As described in Section 3.2, two unwanted signals are present at f0 + mfch and f0 + 2mfch respec-

tively, where f0 and fch are the nominal frequency and the channel spacing; m could be plus or

minus 1, 2, or 4. Figure 3.5 shows that the IMRR is about 58 dB, 3 dB higher than the specifi-

cation, with m= ± 1. Better results are obtained when the unwanted signals get farther.

The IMRR specification can be use to estimate the SFDR (spurious free dynamic range)

and required IIP3. As we already set the sensitivity to be −120 dBm, the 55 dB IMRR implies

55 + (−120) = 65 dBm interference level. If the equivalent noise bandwidth B is restricted to

9 kHz, with 5.3 dB NF the input referred noise floor is

(3.8)

The SFDR can be calculated by

(3.9)

Finally the IIP3 required to achieve this SFDR is

Nfloor 10 kTB( )log NF 30+ +=

129 (dBm)–≈

SFDR 65– Nfloor – 64 (dBm)≈=

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CHAPTER 3 System Modeling and Circuit Requirements 24

(3.10)

This result is close to the −36 dBm value used in the simulation.

3.3.4 Phase Mismatch, Frequency Drift and Phase Noise

It turns out that the demodulator can withstand quite a large phase mismatch between the I and

Q signals. A 10° mismatch results in only about 0.1 dB degradation in the 12 to 16 dB ES/N0

range, as shown in Figure 3.6. Modern IC technology can reduce the mismatch to a much

lower level. At the same time, severe performance degradation is observed when the LO drifts

from the nominal carrier frequency. In Figure 3.7 a 300 Hz drift worsens the sensitivity by 0.25

dB. At the 280 MHz band, this drift translates to about 1 ppm frequency stability. Over the 15

to 35°C temperature range for normal condition test, this is very difficult, if not impossible, to

achieve without careful (and probably expensive) compensation. It is therefore necessary to

apply some kind of automatic frequency control (AFC) and/or adaptive demodulation

schemes. An AFC algorithm proposed in [7] demonstrated the convergence of the drift fre-

quency from 1 to within 1/10 of the symbol rate (about 3 kHz). Another consideration is the

receiver bandwidth. The 8 kHz bandwidth is not supposed to accommodate the drift. In a prac-

Figure 3.5. The IMRR is 58 dB when the unwanted signals are 1 and 2 channels above (m=1) or below (m=−1) the nominal, respectively. The meanings of m, W and U are defined in Section 3.2.

53 54 55 56 57 58 59 60 61 62 6310

−4

10−3

10−2

10−1

100

W − U (dB)

m=+1m=−1

Bit

Err

or R

ate

IIP332---SFDF Nfloor 33 (dBm)–≈+=

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CHAPTER 3 System Modeling and Circuit Requirements 25

tical application, however, some allowance must be provided to alleviate the problem. The bot-

tom line is to maintain an acceptable sensitivity level. Phase noise, on the other hand, is usually

not a problem in paging receivers where crystal oscillators are commonly used. Ultra low

phase noise below −100 dBc/Hz can be achieved at a few hundred hertz [30]. Reciprocal mix-

ing at this level is completely negligible.

Figure 3.6. Sensitivity degradation due to I/Q phase mismatch.

Figure 3.7. Sensitivity degradation due to LO frequency drift.

12 12.5 13 13.5 14 14.5 15 15.5 16

10−2

10−1

Phase Mismatch 0o 10o 20o 30o 40o 50o

Es/N0 (dB)

Bit

Err

or R

ate

11 11.5 12 12.5 13 13.5 14 14.5 15 15.5 1610

−3

10−2

10−1

100

LO drift = ±1KHz

±500Hz

±300Hz

Es/N0 (dB)

Bit

Err

or R

ate

0 Hz

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CHAPTER 3 System Modeling and Circuit Requirements 26

3.3.5 RF Front-End Budget

The sensitivity and desensitization simulation provides important information for the system

planning. Once the overall noise and nonlinearity requirements have been determined, a bud-

get can be given for the front-end including the LNA and the mixer. The 5.3 dB overall NF

which is required to achieve the −120 dBm sensitivity is actually a very stringent number. The

LNA must provide enough gain to suppress the noise contribution from the following stages.

As an example, assume the LNA gain is 16 dB and the mixer NF is 15 dB, the LNA NF is then

given by

(3.11)

Where Ftotal and Fmixer are the noise factors of the front-end and the mixer; GLNA is the LNA

power gain in linear scale.

Although 4 dB NF may seem to be an easy objective, it must be justified with caution

because the designers may want the LNA to be differential. In a superheterodyne receiver the

single-ended LNA is desired because of its superior NF. However, for a direct conversion

receiver like the one under discussion, the differential architecture may be more appropriate for

its excellent cancellation of the 2nd order distortion. In the case of low source impedance, the

equivalent input noise voltage of a differential pair is 3 dB higher than a single common emit-

ter amplifier when their transistors are biased at the same current [31]. The doubled equivalent

input noise power won’t push the NF by the same amount but its contribution is significant. A

straightforward calculation shows 1.4 to 1.8 dB increase in the NF when the original single-

ended value is somewhere between 2 and 3 dB. Taking other important factors like the nonlin-

earity, the input matching and the power consumption into account, the LNA gain and noise

budget is still feasible but may require extra efforts. We then assign 9 dB gain to the mixer so

that an overall gain of 25 dB could be obtained from the RF section. The 9 dB assignment is

somewhat arbitrary and may include a buffer stage.

Having done the gain and NF budget, we can determine the nonlinearity distribution by

using the polynomial approximation. Constant overall IIP2 and IIP3 curves of the front-end are

given in Figure 3.8 and Figure 3.9. The x and y variables are the intercept points of the LNA

and the mixer, respectively. With typical LNA and mixer IP values, the system nonlinearity

NFLNA 10 FtotalFmixer 1–

GLNA

---------------------– log 4.2 (dB)≈=

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CHAPTER 3 System Modeling and Circuit Requirements 27

requirements should be satisfied without any difficulty. Table 3.1 summarizes the planning.

Some design margin has been deliberately made available.

Figure 3.8. Constant overall IIP2 curves.

Figure 3.9. Constant overall IIP3 curves.

10 15 20 25 30 35 4026

28

30

32

34

36

38

40

Overall IIP2 14 dBm 12 dBm 11 dBm 10 dBm

IIP2 of the LNA (dBm)

IIP

2 of

the

Mix

er (

dBm

)

−40 −35 −30 −25 −20 −15 −10−25

−20

−15

−10

−5

0

5

10

Overall IIP3 −26 dBm −30 dBm −36 dBm

IIP3 of the LNA (dBm)

IIP

3 of

the

Mix

er (

dBm

)

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CHAPTER 3 System Modeling and Circuit Requirements 28

Table 3.1 RF Front-End Budget.

LNA Mixer Overall

Gain (dB) 16 9 25

NF (dB) 4 15 5.2

IIP2 (dBm) ≥ 25 ≥ 30 ≥ 12

IIP3 (dBm) ≥ −26 ≥ −12 ≥ −30

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CHAPTER 4Circuit Design I

A prototype 4FSK direct-conversion receiver is designed and built on a 0.35µ CMOS process.

The design details are presented in this and the next chapter. This chapter starts with an over-

view of the receiver. A brief introduction of the RF front-end follows. The rest of this chapter

focuses on the AGC and filtering circuitry. Finally the problem of DC offset and flicker noise

is discussed.

4.1 Overview

The direct-conversion receiver diagram is shown Figure 4.1. Differential structures are used

throughout the design. To minimize the DC offset induced by the self-mixing process, har-

monic mixers are proposed to replace the conventional ones. For this reason, the two LO sig-

Figure 4.1. Block diagram of the receiver.

45°RF

Input

Demod.LO

LNA

HarmonicMixer LPFAGC

29

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CHAPTER 4 Circuit Design I 30

nals driving the mixer pair have 45° phase difference rather than the 90° quadrature phase used

in standard direct-conversion structures.

The automatic gain control (AGC) circuit makes use of the differential variable MOS resis-

tors to construct the variable gain amplifier (VGA). The signal level is sensed by a peak detec-

tor and compared with a reference voltage. The control circuitry adjusts the VGA gain to

minimize the voltage difference.

The low pass filter is a cascade of a biquad and a 5th order gyrator-C filter. The gyrator fil-

ter simulates an LC ladder by using gyrators in place of inductors. LC ladder filters have low

sensitivity to parameter variations and good stability at high orders. These nice properties are

inherited by the gyrator filter. However, another characteristic, the 6 dB loss, that is not so

desired is also retained. This results in a higher input-referred noise level. The biquad provides

not only the filtering function but a certain amount of gain as well and thus reduces the noise.

Unfortunately only the gyrator filter is included in this fabrication due to the large amount of

capacitance required to implement the continuous-time active RC biquad.

Output signals of the low pass filters are processed by the demodulator which has been

introduced in Section 2.5 and is to be further discussed in Chapter 5.

4.2 LNA and Mixer

The RF front-end is designed by Mr. Louis Tsui (the LNA) and Mr. Zhaofeng Zhang (the

mixer) of the UMAN research group. Here only a very brief introduction is provided. For a

more specific and detailed treatment, please refer to their own publications [32] and future dis-

sertations.

4.2.1 The Differential LNA

To minimize the substrate coupling and the second order distortion which creates in-band error

components and corrupts the signal, the LNA is designed to be differential. The differential

input signal can be obtained by re-designing the input matching network which selects the sig-

nal of the desired band from what is collected by the loop antenna and delivers it to the LNA.

The cascoding structure improves the reverse isolation and the frequency response. When

directly connected to the mixer, the input capacitance of the latter resonates with the inductors

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CHAPTER 4 Circuit Design I 31

LL at the desired frequency. The resistance RL sets the output common mode voltage to an

appropriate value. The inductor LS helps improve the common mode rejection ratio (CMRR).

4.2.2 The Harmonic Mixer

Unlike conventional mixers, a harmonic mixer utilizes one of the LO’s harmonics to mix down

the RF signal and is theoretically free of self-mixing, the main DC offset contributor. It has

been reported that a bipolar harmonic mixer is able to suppress the equivalent self-mixing

related DC offset to the noise level [33]. However, due to the much higher flicker noise and

other performance imperfections such as device mismatch and low transconductance, a CMOS

equivalent is more difficult to design and has not been found in the literature.

The CMOS harmonic mixer to be introduced here is shown in Figure 4.3 where the 2nd

order harmonic of the LO is generated by the MOS transistors M3 and M4 in their square-law

operation. The fundamental and odd harmonics are cancelled out at the node X. The desired IF

component is centered at |fRF − 2fLO| where fRF and fLO are the frequencies of the RF carrier and

the LO signal, respectively. About 37.5 dB offset cancellation is achieved and the input-

referred offset level is suppressed close to the noise level.

As the noise currents of M3 and M4 are combined at X and become a common mode sig-

nal, the only way they can appear at the output is through a modulation by the RF signal. While

part of their wide-band noise is down-converted to the base-band, the flicker noise is up-con-

Figure 4.2. The differential low noise amplifier.

LS

LLLL

RL

Bias

in+

in-

Vdd

out-

out+

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CHAPTER 4 Circuit Design I 32

verted and will be rejected by the LPF in the following stage. Therefore, most of the noise is

contributed by the RF part, i.e. the transistors M1 and M2. To minimize the flicker noise, the

current injection technique is used in addition to the large transistor size. The injected current

I0 lowers the bias currents of M1 and M2 and drives them to the moderate or even weak inver-

sion region where the flicker noise coefficient can be orders of magnitude lower than that of

the same transistor working in the strong inversion region. This has be observed from the mea-

surement and is consistent with [34]. More than 20 dB noise figure improvement is achieved.

The overall noise figure at 10 kHz is about 24.5 dB.

4.3 VGA and AGC

In some FSK receivers like those given by [5] and [6], gain control may not be necessary

because most of the gain is provided by the limiting amplifier after low pass filtering and the

circuits preceding the filter stage are safe from overloading or saturation. Nevertheless, when

more gain is needed to boost the signal and suppress the noise contributed by the mixer and the

active channel selection filter, an AGC stage becomes essential to satisfy the dynamic range

and/or intermodulation requirements, as is the case in this design. Also, AGC prevents signal

clipping which is not allowed in the ZCI operation described in equation (2.6).

The AGC loop is shown in Figure 4.4. It consists of a VGA, a peak detector, a Gm-C inte-

grator and a level shifting network. The output signal level is sensed by the peak detector and

compared with a reference voltage. The difference is accumulated at the integrator which

Figure 4.3. The CMOS harmonic mixer with current injection.

I0RL RL

LO-LO+

RF+ RF-

Vdd

M3 M4

M2M1X

IF- IF+

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CHAPTER 4 Circuit Design I 33

serves as the loop filter. The VGA gain is adjusted by the resultant voltage Vc via the level

shifting network to minimize the difference between the peak detector output Vpk and the ref-

erence voltage Vref and hence to keep the output level constant.

4.3.1 The Variable Gain Amplifier

The VGA is constructed as an inverting amplifier whose gain can be adjusted by tuning the

two differential variable resistors. The major advantage of this structure is that the gain of the

VGA is virtually independent of process parameters and thus immune to the substrate cou-

pling. Assuming (1) all the input and output nodes are biased at a common mode voltage Vcm;

(2) the two input nodes of the operational amplifier (opamp) holds at Vcm due to the virtual

ground effect; (3) all transistors in a differential variable resistor have the same process and

geometric parameters and work in the linear region, equivalent value of the differential vari-

able resistor can be derived by equating the gains of the two amplifiers in Figure 4.5. Neglect-

ing the resistance R0 for the time being, the drain current of M1 is

Similar expressions can be written for the other 3 transistors. The current Id1 + Id3 will be forced

through the top Rf and results in a voltage drop:

Figure 4.4. The AGC loop.

PeakDetector

Vc2 Vc3 Vc1 Vc4Vpk

Vref

OPAMP

Differential Variable Resistor

in-

in+

out+

out-

VcLevel Shifting Network Gm

Id1 µCoxWL----- V2 Vcm– Vth–( )vin

+ 12--- vin

+( )2–=

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CHAPTER 4 Circuit Design I 34

Similarly, we have

The output voltage can then be expressed as

(4.1)

The gain can be easily shown to be

(4.2)

Therefore,

(4.3)

A negative (V2 − V1) value just implies a switched connection of the input terminals to the

opamp input nodes rather than a negative resistance. When the differential variable resistor is

used to provide the feedback, it yields the same equivalent value. Finally, gain of the VGA

shown in Figure 4.4 is

(4.4)

which is, to the first order, independent of process variations and substrate coupling.

The equivalent resistance Req given by (4.3) provides sufficient information for gain esti-

mation when the VGA is driven by a pure voltage source. However, as an intermediate stage of

a cascaded chain, its loading effect must be examined more carefully. This is necessary not

only because the finite input resistance can load down the gain of the preceding stage but also

because the input resistance has an expression which is different from Req. Under the same set

of assumptions we made at the beginning of this section and still neglecting R0, the resistance

looking into the positive input node of Figure 4.5 is

Id1 Id3+( )Rf vout-–=

Id2 Id4+( )Rf vout+–=

vout vout+ vout

-– Id1 Id3 Id2– Id4–+( )Rf= =

vout

vin

-------vout

+ vout-–

vin+ vin

-–--------------------- Rf µCox

WL----- V2 V1–( )⋅= =

Req1

µCoxWL----- V2 V1–( )

---------------------------------------=

GVc3 Vc2–Vc4 Vc1–--------------------=

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CHAPTER 4 Circuit Design I 35

(4.5)

For differential input signals, vin+ = vin

− = vin/2, the total input resistance is

(4.6)

where vDSsat = (V1+V2)/2 − Vcm − Vth. In the case of small input signals, Rin depends only on vDSsat

and will be kept constant if V1 and V2 are differential to each other. This can be easily done

with the control circuitry which will be discussed in the next section.

The linear resistor R0 is used to improve the linearity. It takes part of the input voltage drop

such that the MOS resistors stay in the linear region even at relatively large inputs. An interest-

ing property of this linear resistor is that, when applied in both the input and the feedback

branches as shown in Figure 4.4, it doesn’t change the small signal gain. This can be derived

similarly as equation (4.4).

The OPAMP is of the simple two stage type with 80 dB small signal gain at DC.

4.3.2 The Control Circuitry and VGA Gain

Gain of the VGA is tuned by the control circuitry which is formed by the peak detector, the

Gm-C integrator and the level shifting network.

Figure 4.5. The MOS differential variable resistor (a) and its equivalent (b).

Rin+1

vin+∂

∂ Id1 Id2+( )-------------------------------- 1

2µCoxWL----- 1

2--- V1 V2+( ) Vcm– Vth– vin

+–

-------------------------------------------------------------------------------------------= =

Rin1

µCoxWL----- vDSsat

vin2

4vDSsat

---------------–

---------------------------------------------------------=

1V 2V

R f

R0

vin+

cm

R f

vin-

cm

vout+

cmV

vout-

cmV

cmV

R0

M2

M3

M4

M1

R f

R f

R eq

R eq

voutin

(a) (b)

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CHAPTER 4 Circuit Design I 36

The peak detector is shown in Figure 4.6 [35]. When the voltage level of either input node

is lower than Vpk, the difference ∆V is sensed by the corresponding transconductance amplifier

and a current (gm ∆V - I0) is generated to discharge the capacitor C toward the lower level.

When both inputs are above Vpk, C is charged by the current source I0 toward Vdd. Thus this is

a negative peak detector with different tracking speed for positive and negative input transi-

tions. Consequently, the attack time and the release time of the AGC are also different, as will

be seen later.

The difference between Vpk and the reference voltage Vref is passed to the Gm-C integrator

which works as the loop filter. The resultant signal Vc is the control voltage of the VGA. To

obtain proper control voltages for the 2 differential variable resistors, a level shifting network

formed by 4 PMOS source followers is used, which tunes (Vc3 − Vc2) and (Vc4 − Vc1) in the

opposite directions while keeping (Vc3 + Vc2) and (Vc4 + Vc1) constant. In this way, the gain G

given by (4.4) can be adjusted to minimize the difference between Vpk and Vref whereas the

equivalent input resistance Rin will be fixed, and so does the gain of the preceding stage.

Figure 4.6. The peak detector.

Figure 4.7. The level shift network.

gm

gm

I 0

inV

inVpk

C

Vdd

Vc1

Vc3

Vc

V1+∆

V2+∆

Vc2

Vc4

V1+∆

V2+∆c-

kV

c+

kV

Source FollowersAttenuating

Buffer

+

_

Vc4

Vc1Vc2

Vc3V∆ 0

_

ckV

c+

kVV∆ 1

V∆ 2

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CHAPTER 4 Circuit Design I 37

The source followers shift the attenuated control voltage kVc by either ∆V1 or ∆V2, depend-

ing on the transistors’ size, as shown in Figure 4.7. Here k is the gain of the attenuating buffer.

As a result,

(4.7)

And the gain becomes

(4.8)

where ∆V0 = ∆V2 − ∆V1. If Vc is small enough, i.e., Vpk is close to Vref, the gain can be approx-

imated by an exponential function of Vc:

(4.9)

Figure 4.8 shows the simulated and calculated G(Vc) − Vc curves with k ≈ 0.19, ∆V0 ≈ 435mV.

When the control voltage gets larger (positively or negatively), the calculated gain changes

much faster than the simulated value as the effective k, the gain of the attenuating buffer, starts

to saturate. This effect actually helps keep the gain linear in the dB domain.

4.3.3 Performance

The dB-linear gain control characteristic of the VGA is an essential requirement for a constant

loop settling time. In Figure 4.9 the loop response to a 2 kHz sinusoidal input decreasing from

2 Vpp by 6 dB every 10 ms is plotted. The settling time is approximate 8 ms and virtually inde-

pendent of the input signal level. This stays valid until the input goes beyond the dB-linear

region. Nevertheless, the situation is very different when the input signal has an increasing

level due to the unidirectional tracking characteristic of the peak detector. Figure 4.10 shows

the loop response to an signal whose amplitude is initially 1mV and has two 25 dB rising steps

Vc1 kVc+ ∆V1+=

Vc2 kVc - ∆V1+=

Vc3 kVc+ ∆V2+=

Vc4 kVc - ∆V2+=

G Vc( ) Vc3 Vc2–Vc4 Vc1–--------------------

∆V0 kVc+∆V0 kVc–------------------------

1kVc

∆V0

---------+

1kVc

∆V0

---------–-------------------= = =

G Vc( ) e2k

∆V0

----------Vc

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CHAPTER 4 Circuit Design I 38

at 5 and 10 ms respectively. At the first rising step, the output signal is small such that its neg-

ative peak is higher than the reference voltage, the loop settles very quickly. But at the second

step the output is so large that it is saturated. The peak detector output Vpk drops to its mini-

mum level almost immediately. This sets the VGA gain to the minimum and results in a very

small output. Now Vpk starts to increase at a slow speed as the capacitor C of the peak detector

is being discharged by the small current source I0 and so does the output signal. As Vpk

Figure 4.8. VGA gain as a function of the control voltage Vc.

Figure 4.9. Response of the AGC to a 2 kHz sinusoidal input decreasing from 2 Vpp by 6 dB every 10 ms.

−2 −1.5 −1 −0.5 0 0.5 1 1.5 2−20

−15

−10

−5

0

5

10

15

20

Vc [V]

G(V

c) [d

B]

Simulated Calculated

0 5 10 15 20 25 30 35 40 45 50−1

0

1

INP

UT

[V]

0 5 10 15 20 25 30 35 40 45 50−1

0

1

OU

TP

UT

[V]

0 5 10 15 20 25 30 35 40 45 50−2

0

2

Vc

[V]

TIME [ms]

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CHAPTER 4 Circuit Design I 39

approaches Vref, the control voltage Vc at the integrator output starts to increase and finally

flips. The VGA gain and the output signal are then increased with Vc at a higher speed. There-

fore, the attack time or the settling time for a rising step of the signal amplitude can be reduced

by:

• choosing a smaller reference voltage which allows a higher output level,

• optimizing the VGA gain setting such that for the largest possible input the desired

output level is achieved at the minimum possible gain, and

• using larger I0/C ratio in the peak detector if possible;

At large input levels, the MOS transistors will be driven out of the linear region. And the

feedback path is changed to a feedforward path. To prevent this from happening, linear resis-

tors R0 is added to the differential variable MOS resistors. It improves the linearity greatly and

in theory does not change the gain. But it turns out that, by doing this, the opamp noise is

amplified by a large number which is approximately proportional to R0×µCOXW/L. Besides, the

cross-coupled input and feedback structure also degrades the noise performance. The simu-

lated input-referred thermal noise voltage density is about 250 nV/√Hz when the gain is about

18 dB. This is even comparable to that of the active low pass filter to be discussed in the next

Figure 4.10. Response of the AGC to a 4.8 kHz sinusoidal input increasing from 1 mVpp by 25 dB at 5 ms and 10 ms respectively.

0 5 10 15 20 25 30 35 40 45 50−0.4

−0.2

0

0.2

INP

UT

[V]

0 5 10 15 20 25 30 35 40 45 50−1

0

1

OU

TP

UT

[V]

0 5 10 15 20 25 30 35 40 45 50−2

0

2

Vc

[V]

TIME [ms]

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CHAPTER 4 Circuit Design I 40

section. To lower the noise level, the R0COXW/L product should be minimized. In fact, increas-

ing the transistor length L (while W is fixed) results in similar effects as increasing R0, i.e. bet-

ter linearity and higher noise level. Although the linearity improving ability of the former is

not as powerful as the latter, the resultant noise level is moderate and acceptable. With R0 = 0

and W/L = 10µ/20µ, simulation shows about 50 nV/√Hz input-referred thermal noise and less

than 0.1% total harmonic distortion at about 600 mVpp output. The noise can be further reduced

by inserting a low noise fixed gain amplifier between the mixer and the AGC.

In the current design, as expected, very good linearity is achieved. At 800 mVpp output

level (the input signal can be over 2 Vpp), the simulated total harmonic distortion is less than

0.1%. Measurement data is presented in Chapter 6.

Another disadvantage of the AGC circuit is the dependency of the bandwidth on its gain.

This is due to the reduced effective feedback when the gain is increased. It is not a concern in

this design as the signal bandwidth is just at the order of 10 kHz.

4.4 Low Pass Filters

Being able to implement the filtering function on chip is essential to achieve the miniature of

electronic systems, especially the radio receivers due to the selectivity requirement. In the

audio to video frequency range, different techniques are available for the realization of the

same transfer function. Among them, switched-capacitor (SC) filters and Gm-C filters are of

the most popular. SC filters have gained the reputation of very high precision and stability over

process and environment variations and can be found in many receiver designs for channel

selection [35][36]. Without the need of clocking and anti-aliasing filtering, continuous-time

filters, especially the Gm-C type for its simplicity, also find their places in various applica-

tions. However, their transfer characteristics are defined by the absolute process or circuit

parameters (i.g. the transconductance of the Gm-C filter) and can therefore vary significantly

from process to process and from time to time. The remedy is an automatic tuning system

which is able to adjust the circuit parameters until they are locked to a certain reference [37].

The tuning loop usually consists of the reference source, a phase or other types of comparator,

a loop filter and a duplicate of the whole filter or a core element of it such as a resonator. The

overhead could thus be considerable.

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CHAPTER 4 Circuit Design I 41

Besides the physical implementation, a logical, or “high-level”, synthesis approach must be

chosen to realize high-order filters. The most simple way is to decompose the transfer function

down to a product of several second-order ones (including the special case of one first-order

function when the filter is odd-order) and map each of them to a second-order building block,

or biquad in short. Cascading of these biquads restores the original high-order function. As

biquads are well understood and very easy to tune, this method offers great simplicity and flex-

ibility and is suitable for low to medium order systems. For very high order systems, however,

the pass-band characteristic could be too sensitive to component variations. Another approach

which is also based on the biquad technique is known as the multi-loop feedback method. Bet-

ter pass-band sensitivity is achieved by introducing coupling between biquads as the feedback

is applied. One example is the well known leapfrog structure. The best sensitivity performance

is found in filters belong to the LC ladder family. This property is preserved in active filters

which simulate LC ladders by element substitution or using the signal flow graph approach.

When compensated for temperature variations, it allows the automatic tuning system to be

omitted at the audio frequency band in some applications. The gyrator-C filters used in radio

paging receivers [6][38] fall into this category.

In this project, the channel selection is performed mainly by a 5th order gyrator-C filter. An

active RC biquad is also designed to compensate the 6 dB loss due to the matching property of

the LC ladder and to reduce the total input-referred noise and improve the dynamic range.

Nevertheless, as the process does not support large linear resistors and it is also not practical to

utilize MOS resistors, the total capacitance required for the cut-off frequency becomes too

large. Therefore, only the gyrator filter is included in the fabrication.

4.4.1 The Gyrator and Gyrator-C Simulated Inductors

A gyrator is a two-port network with the Y-parameters in the form of

(4.10)

This can be realized by connecting two transconductance amplifiers in a feedback manner as is

shown in Figure 4.11. It is straightforward to show that, with a grounded capacitor, a pure

inductive impedance of a grounded inductor or a floating one can be formed using one or two

Y[ ]0

gm1–

gm2

0=

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CHAPTER 4 Circuit Design I 42

gyrators, respectively. The diagrams are depicted in Figure 4.12. In both cases the same imped-

ance is obtained:

with the equivalent inductance of

(4.11)

The active gyrator-C filter is formed by simply replacing the inductors of an LC ladder with

the simulated ones.

4.4.2 Simulation of The LC Ladder

The LC ladder with normalized parameters can be found in the design tables [40]. Frequency

scaling and impedance scaling are performed to de-normalize the component values. Given the

transfer characteristics, the capacitance is proportional to the termination resistance R0 while

the inductance is inversely proportional to it. In the gyrator-C implementation, for easy biasing

and layout, identical Gm cells with the differential transconductance gm are used. The termina-

tion resistors are also simulated by two Gm cells connected in the unity feedback form:

Figure 4.11. The gyrator and its small signal equivalent circuit.

Z s( ) sC

gm2

-----=

L C

gm2

-----=

V1

m1g

m2g

I 1I 2

V2

g Vm2 2 g V

m1 11V V2

I 2I 1

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CHAPTER 4 Circuit Design I 43

Figure 4.12. Simulation of inductors using gyrators and capacitors.

Figure 4.13. The 5th order gyrator-C elliptic low pass filter and its LC ladder prototype.

gm

gm

C

VI

L

gm

gm

gm

gm

2V

V1

L

VC

CI

I

(a) Grounded Inductor

(b) Floating Inductor

in out

R0

R0

L 2 L 4

C1C2 C4C3 C5

outin

2R01gm

-----=

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CHAPTER 4 Circuit Design I 44

Note that the differential structure doubles the termination resistance. Another Gm cell is

inserted at the input port to provide the Norton equivalent of the source termination.

Simulation of the two floating inductors is given in (4.11). The required capacitance is also

proportional to R0. Consequently, to minimize the capacitance area, it is desirable to use a large

termination resistance and thus a small gm. However, this can cause problems such as the

increased input referred noise. The differential transconductance value used here is 2.5 µS,

which is equivalent to a 5 µS single-ended gm or 200 kΩ R0.

Poly to poly capacitance is used. For a grounded capacitor like C1, C3 or C5, the bottom

plate parasitic capacitance is balanced by splitting the capacitor into halves and connecting

them in the opposite polarity. Parasitics of the floating capacitors also appear at the nodes of

the grounded ones. Thus, all parasitic capacitance can be absorbed by the grounded capacitors.

The total capacitance is about 1 nF.

4.4.3 The Linearized Transconductor

As the simulated inductance is directly related to the transconductance value, it is critical to

keep it constant over the whole input range. In other words, the transconductor should be as

linear as possible. Source degeneration is a simple yet effective linearization technique com-

monly used in amplifier designs. In a differential structure, it can be done by connecting a

resistor or MOS resistor between the source nodes of the input devices which are biased by two

identical but separate current sources. A modified scheme is shown in Figure 4.14 where the

degeneration is provided by two MOS transistors with their source and drain terminals con-

nected in the usual MOS resistor way but their gates connected to the input nodes [39]. Tran-

sistors Mc1 and Mc2 operate in the linear region to stabilize the common mode output.

For a small input signal, M21 and M22 are in the linear region and the whole circuit

behaves similarly to the conventionally degenerated one. Further increase of the input signal

amplitude will drive one of these two transistors into the saturation region and result in a dif-

ferent I-V transfer characteristic. Under this condition, additional output current is supplied by

M21 or M22 to compensate the transconductance degradation due to the non-saturate opera-

tion of M11 and M12. By sizing the transistors correctly, the large signal transconductance can

be kept very close to the small signal transconductance until no more additional current is

available. Authors of [39] have shown that the best linearity performance can be achieved

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CHAPTER 4 Circuit Design I 45

when the ratio (µCoxW/L)1/(µCoxW/L)2 is around 7. Here subscripts 1 and 2 denote transistors

M11/M12 and M21/M22, respectively. With the ratio set to be 6.7 and VGS−Vth > 1 V, gm varia-

tion of ±2.5% over 80% output current range is typical.

4.4.4 Simulated Performance

In Figure 4.15, the differential output current and the transconductance of the linearized

transconductor are given. The nominal gm value is 2.5 µS. Over 800 mV differential input volt-

age range, the transconductance variation is within 1.5%.

Frequency response of the filter is given in Figure 4.16, together with that of the LC ladder

prototype. THD at 700 mVpp output is less than 1%.

The noise performance is shown in Figure 4.17. The pass-band output thermal noise spec-

tral density is between 300 to 400 nV/√Hz. When referred to the input, due to the 6 dB loss, it

is increased to about 700 nV/√Hz or −3 dBµV/√Hz. Although this is comparable to the −4

dBµV/√Hz input spectral noise voltage density reported in the similar work using the bipolar

technology [41], it is still a relatively high value even without the effect of the flicker noise. To

prevent the filter noise from dominating the overall receiver NF, the signal must be boosted

before it is filtered. If the front-end NF is 5 dB, more than 60 dB gain is required to suppress

the filter noise such that the NF degradation is about 1 dB. In this case, AGC becomes an

essential element to preserve the dynamic range.

Figure 4.14. The linearized transconductor (a) and its biasing circuit (b).

Vdd

out-M12M11

M21

M22

Mp1 Mp2

Mc2Mc1

MN1 MN2

out+

in-in+

bias2

bias1Iref

bias2

bias1

Vdd

(a) (b)

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CHAPTER 4 Circuit Design I 46

4.5 The DC Offset Problem

In Chapter 1 we have a brief introduction of the DC offset problem. Besides the self-mixing

effect, the offset is also originated from other sources such as the device mismatch. Although

its impact can be minimized with the help of specific circuit design and layout techniques, mis-

match itself can never be eliminated. The input-referred offset voltage of a simple differential

pair with resistive load is

Figure 4.15. Differential output current and transconductance of the linearized transconductor.

Figure 4.16. Frequency response.

0

200n

400n

600n

800n

1u

1.2u

1.4u

1.6u

1.8u

2u

2.2u

2.4u

2.6u

-2u

-1.5u

-1u

500n

0

500n

1u

1.5u

2u

-1 -500m 0 500m 1

g m [

S]

I OU

T [

A]

Input Differential Voltage [V]

5 10 15 20 25 30−120

−100

−80

−60

−40

−20

0

Frequency [kHz]

|H(f

)| [d

B]

LC ladderGyrator−C

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CHAPTER 4 Circuit Design I 47

(4.12)

A 10 mV level can be easily achieved. When a current mirror is used as the active load, the

equation will be

(4.13)

Here the subscript “L” denotes the loading devices. The additional threshold voltage mismatch

term and the usually worse (compared to the resistive load) active load dimension mismatch

term result in an even larger offset component.

In some applications the offset can be removed by means of AC-coupling. Unfortunately

this is not affordable for modulation schemes which contain significant DC and low frequency

energy. Specifically designed circuits are then required for the task of offset cancellation. Most

of them can be classified into two categories. The first kind of circuits work in a two-phase

manner. During the sampling phase, the offset is measured and memorized. There then comes

the cancelling phase during which the stored offset is subtracted from the signal. Most auto-

zeroing circuits belong to this class. Circuits in the second category avoid DC offset and low

frequency noise by up-converting the signal to a safer frequency band, amplifying it, and

down-converting it back to the base-band for further processing. Both solutions demand con-

Figure 4.17. Thermal noise

5 10 15 20 25 3010

−8

10−7

10−6

10−5

Frequency [kHz]

Output−Referred

Input−Referred

Noi

se V

olta

ge [

Vrm

s / H

z½]

VOS

VGS Vth–2

--------------------- ∆RL

RL

--------- ∆ W L⁄( )W L⁄( )

---------------------+ ∆Vth–=

VOS

VGS Vth–2

--------------------- ∆ W L⁄( )L

W L⁄( )L

----------------------- ∆ W L⁄( )W L⁄( )

---------------------+gm( )L

gm

------------ ∆Vth( )L– ∆Vth–=

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CHAPTER 4 Circuit Design I 48

siderable amount of complexity and will inevitably raise the white noise floor. These are the

price to pay for the improved performance as the DC offset and flicker noise are now rejected.

But in many applications it can cost so much that people would choose the more conventional

and more mature superheterodyne architecture rather than direct-conversion. Moreover, as the

major offset could appear at very early stages (i.g. the mixer output), circuits that can only can-

cel their own offsets won’t help much. And there are still other issues which limit the use of an

offset cancelling approach. One example is systems where there are no idle time slots for offset

measuring. Thus, the high cost and feasibility problem of offset cancellation explain why most,

if not all, successful direct-conversion receivers are designed to handle only signals with negli-

gible frequency components near DC. And we can come to the conclusion that a decent offset

cancellation solution must be able to (1) cancel or reduce early offset; (2) minimize offset from

succeeding stags; (3) be compatible with the system protocol. Suppose the harmonic mixer

functions very well and the offset due to self-mixing becomes negligible, weak signals will

still be corrupted by the mismatch-induced DC offset. Therefore, the cancellation is not com-

plete. We also don’t want to follow the design example of the 2FSK receiver and make use of

AC-coupling or high-pass filtering as the 4FSK high speed signal does have important infor-

mation energy around DC (Figure 2.1). An alternative solution is thus necessary to fulfill the

task.

It’s easy to verify that for two equal-amplitude (sinusoidal) signals, the difference between

their DC levels is equivalent to the difference between their envelops. As the positive and neg-

ative components of a differential signal are equal-amplitude in nature, a peak detector has the

potential to function as an offset detector. The offset can then be subtracted off the signal eas-

ily. We call this technique differential peak alignment. But first of all, answers have to be given

for a number of questions.

The first concern is whether the peak detector is capable of working with signals that are

not DC-free. To answer this question, knowledge of the signal in the time domain will be help-

ful. In Figure 4.18 the waveform of a differential zero-IF 4FSK signal is given, together with

its positive and negative components. It is clear that the peak detector must be able to yield the

correct output even when the signal has only half sinusoidal cycles. A full-wave rectifier meets

this requirement but half-wave rectifiers could also be useful. The idea is, by tracking positive

(increasing) transitions and negative (decreasing) transitions at different speeds, it might be

possible to tolerate several consecutive data symbols each contains a half sinusoidal cycle.

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CHAPTER 4 Circuit Design I 49

Take the one shown in Figure 4.19 for example, which is half of the peak detector used in the

AGC loop, the output voltage leakage at the absence of negative peaks is

Where N is the number of symbols and RS is the symbol rate. The effectiveness of offset can-

cellation depends on both the signal and the rectifier. Assume the rectifier itself does not intro-

duce any offset, ∆V will become a residual offset of the opposite polarity after the cancellation.

To limit ∆V to 10% of the signal amplitude A within 2 symbol intervals, a small I0/C ratio

should be used:

For A = 10 mV and RS = 3200 kbps, the value is 1.6. If the current is 80 nA, the capacitor

will be as large as 50 nF. If the input signal has an ideally constant envelop, the ratio can be

made arbitrarily small. Otherwise, the detector will fail to response to a fast amplitude drop. A

better solution, as just mentioned, will be a full-wave rectifier based approach. In this case, the

voltage leakage will be confined to a single symbol interval. A fast response to amplitude vari-

ation is thus allowed.

This approach is very similar to high-pass filtering but it is intrinsically a nonlinear process.

They both have the slow response problem due to the very low corner frequency or large time

constant requirement and both cause finite low frequency power loss. But due to the nonlinear

Figure 4.18. Waveforms of the zero-IF 4FSK signal.

∆VI0

C---- N

RS

-----⋅=

I0

C----

RS

2----- A

10------⋅≤

OS

VOS

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CHAPTER 4 Circuit Design I 50

operation of the peak detector, a higher harmonic distortion is expected. Within one symbol

period, the location of zero-crossings will be more or less altered but the total number won’t

change. The distortion is therefore has only limited impact on the demodulation.

Another problem is the offset introduced by the peak detector and the subtractor them-

selves, which is a part of the final residual offset. As they can both be optimized for low mis-

match, the offset level can be lowered to several mili-volts or smaller. Here we see a conflict

on the gain applied to the signal: the gain should be as large as possible to overcome the distor-

tion and the residual offset while it can’t be so large as to saturate the circuit. This is a dynamic

range problem except that the offset level should also be considered. One strategy is an early

gain control at the LNA and AC-coupling between the LNA and the mixer.

Figure 4.19. A half-wave rectifier.

∆V

gm

I 0

Vout

in

C

Vdd

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CHAPTER 5Circuit Design II

In last chapter, the RF and base-band building blocks including the LNA, mixer, AGC and the

channel selection filter are introduced. This chapter continues the discussion and deals with the

design of the demodulator. Digital logic designs are mainly involved but analog circuits are

also present in some important building blocks such as the zero-crossing interpolator and part

of the clock recovery circuitry.

5.1 The Overall Structure

The demodulator incorporates a modified version of the ZIFZCD described in Section 2.5 with

a clock recovery loop. According to the high-level simulation results presented in Chapter 3,

while the first level interpolation yields a BER slightly higher than that of the second level

Figure 5.1. The 4FSK demodulator.

DecisionDirectin

1I

1Q

PUL0

PUL1

ClockRecovery

NEG

POS

CounterPC Decision

Speed

direction

CounterNC

I

Qspeed

CLKx

CLK

ZCI

P0

N0

P1

N1

51

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CHAPTER 5 Circuit Design II 52

interpolation, it saves nearly half of the demodulator hardware. Therefore, the interpolator

used here is of the first level. The incoming signals I and Q together with the derived signals I1

and Q1 are converted into the digital domain by four hard-limiters. Series of pulses are then

generated on the zero-crossings of the signals. Depending on the phase relationship of the I/Q

or I1/Q1 components, the pulses are delivered to either the positive channel POS or the negative

channel NEG and counted respectively by two counters PC and NC. The speed decision block

compares the outputs of the counters to a fixed threshold to determine the frequency offset of

the current symbol. The direction decision block, on the other hand, makes a comparison

between the two outputs and detects the I/Q phase difference and thus the phasor direction.

The clock recovery circuit provides clocks for the pulse generator and the decision stage.

CLK has a frequency of the symbol rate while the frequency of CLKx is 16 times higher.

5.2 Zero-Crossing Interpolator and Hard-Limiters

The ZCI is shown in Figure 5.2. Two identical adders are used to implement both the addition

and subtraction operations by simply altering the differential polarity of either input signals. To

achieve a good dynamic range, the adder is source-degenerated by Rs1 and Rs2. Resistors Rc1

and Rc2 provide the common-mode feedback (CMFB) and define the output impedance. The

circuit diagram and its DC transfer curve are given in Figure 5.3 and Figure 5.4, respectively.

The transfer curve is obtained by driving the two input ports with the same source. In other

words, the adder is in its adding mode, as shown in the lower-right corner of the curves. Over 1

Vpp differential input range, the gain variation is less than 0.5 dB.

The hard-limiter consists of 4 cascading stages. The first two stages AMP1 and AMP2 are

differential pairs. The third one AMP3 is a self-biased differential-in single-out amplifier [42],

followed by the fourth stage, a simple digital inverter. A total of about 80 dB gain is provided

by the first 3 stages, among which 24 dB is contributed by AMP1, 15 dB by AMP2 and 41 dB

by AMP3. As there is no offset compensation applied here, the DC offset originated from the

amplifiers themselves must be minimized. Special considerations are made at 3 aspects to

reduce device mismatch: passive resistive loading is provided in AMP1 which is the most crit-

ical stage in terms of offset; NMOS transistors, whose threshold voltage spread is better than

that of its PMOS counterparts in an N-well process, are used exclusively in the first two stages

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CHAPTER 5 Circuit Design II 53

which define the overall offset level; input devices are biased at small (VGS−Vth) voltages to

further reduce other mismatches. Besides, the layout also makes use of the multi-finger struc-

ture and relatively larger WL products to average out process variations.

Figure 5.2. The first level zero-crossing interpolator.

Figure 5.3. The adder schematic.

Σ1

Q -

Q +1

Σ I +1

I -1

I x1

Q x1

Q-

I+

I-

Q+

Ix

Qx

Rc1 Rc2

Vdd

in 2

in 1

Rs2

CMFB

Rs1

out

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CHAPTER 5 Circuit Design II 54

5.3 Zero-crossing Pulse Generator

In Figure 2.8 a conceptual diagram of the zero-crossing pulse generator is given. Here in Fig-

ure 5.6 is an implementation using digital logic gates and flip-flops. The idea is very much

similar to the demodulator in [6]. The combination of a D flip-flop and an exclusive-OR gate

forms a difference circuit which is the digital counterpart of the analog differentiator. For an

incoming signal IX or QX, the resulted signal I' or Q' is a pulse train with the pulse width equal

Figure 5.4. The transfer characteristic of the adder.

Figure 5.5. The hard-limiter.

-3

-2

-1

0

1

2

3

-1

500m

0

500m

1

-1 -500m 0 500m 1

Input Differential Voltage [V]

Out

put V

olta

ge [

V]

Gai

n [d

B]

+−

+ −+−input output

1 Vpp

0.5 dB

out

AMP1 AMP341 dB24 dB

AMP215 dB

in

Vdd

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CHAPTER 5 Circuit Design II 55

to the period of CLKx. Each pulse is situated at a transition edge of the incoming signal.

Unlike the output of the differentiator, these pulses do not have a negative polarity to distin-

guish a falling edge from a rising one. Therefore, a different approach must be taken to extract

the relative phase information between IX and QX. Another XOR gate XS is used for this pur-

pose. Its output Sgn signs a “polarity” to each pulse of I' and Q' by delivering it to either the

positive channel POS or the negative channel NEG. If IX is 90° leading QX, Sgn will be “1” when

there is a transition in IX, or “0” when there is a transition in QX. The value is reversed when IX

lags. It is then a straightforward task to derive the following equations:

Figure 5.6. The zero-crossing pulse generator.

Figure 5.7. Signal waveforms of the pulse generator.

D Q

D Q

Q’

I’

XQ

XS

XIP0

N0

Qx

IxId

Qd

Sgn

’I

’Q

Sgn

POS

NEG

Qx

Ix

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CHAPTER 5 Circuit Design II 56

This is accomplished by the NAND gates in Figure 5.6. Figure 5.7 shows the waveforms of the

input and output signals as well as the internal signals I', Q' and Sgn. The result can be com-

pared to the waveforms shown in Figure 2.5 or Fig. 7 of [6]. As the clock frequency goes

higher, the pulse width becomes narrower and the circuit performs more like the differentiator-

based analog system. Intuitively, a higher clock rate yields a better resolution and a better per-

formance. However, this comes with a hardware penalty, as will be seen in the discussion on

the clock recovery circuit. To choose an optimal clock rate, a high-level simulation is carried

out to compare the BERs under different clock rates. It is observed that a clock runs at 16 times

the symbol rate (16×3.2 kHz or twice the 25 kHz channel spacing) results in negligible degra-

dation from higher clock rates. Hence, CLKx is derived from the same source as the symbol

clock CLK in Figure 5.1 and is 16 times higher.

5.4 Direction and Speed Detection

The positive and negative pulse trains from the pulse generator are passed to the clock recov-

ery block and delayed by 1 symbol period there. The delayed pulses then enter the final detec-

tion stage which is mainly made up of counters and comparators, as shown in Figure 5.8. The

number of positive and negative pulses are counted respectively by two identical 5-bit counters

PC and NC. The outputs are named A and B. The counters are also clocked by the 16× clock

CLKx. A reset signal which is derived from the symbol clock CLK clears A and B at the begin-

ning of each symbol. Three comparators take the A and B from PC and NC to make the final

decision. The direction comparator DCMP compares A with B. Its output direction is “1” if A ≥

B, “0” if A < B. That is, if there are more positive pulses in one symbol interval than negative

ones, the phasor direction is said to be positive, and vice versa. When the number of positive

and negative pulses are equal, the direction is randomly set to be positive. The other two com-

parators, PSCMP and NSCMP, determine the phasor speed by comparing A and B with a preset

threshold. This threshold depends on the interpolation level and can be calculated from (2.7):

(5.1)

POS I′ Sgn⋅ Q′ Sgn⋅+=

NEG I′ Sgn⋅ Q′ Sgn⋅+=

Nth 2 i 1+( )an_AVGh 8= =

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CHAPTER 5 Circuit Design II 57

where i = 1 is the interpolation level, an_AVG = (3+1)/2 = 2 is the average symbol value and h =

1 is the modulation index. Outputs of these two comparators will stay at the “low” level until

the current symbol has a high offset frequency (nominally 4.8 kHz). In that case, one compara-

tor will jump to the “high” level while the other keeps its output low, depending on the polarity

of the offset frequency or the rotation direction of the phasor. The right one is selected by the

direction signal.

5.4.1 The Dual-Input 5-Bit Counter

The simple asynchronous ripple structure is chosen to implement the counter. An important

drawback of this type of counters is that their outputs are not crisp. The undesirable glitches

may cause errors in the following stages. But this is not a problem here due to the globally syn-

chronous design. The combinational logic that reads the counters’ outputs is again followed by

a sequential logic stage. As the total delay of the counter and the combinational logic is orders

Figure 5.8. The final detection stage.

A4A3

A0B4B3B2

A2A1

B0B1

A4A3

A0B4B3B2

A2A1

B0B1

A4A3

A0B4B3B2

A2A1

B0B1

Q3Q2Q1Q0

Q4A

B

RESET

Q3Q2Q1Q0

Q4A

B

RESET

CLK

CLK

P0

P1

N0

Reset

N1

CLKx

B4B3B2

B0B1

A4A3

A0

A2A1

A>=B

A>=B

A>=B

SEL

0

1 speed

direction

Vdd

DCMP

NSCMP

PSCMP

PC

NC

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CHAPTER 5 Circuit Design II 58

of magnitude smaller than the clock cycle, the outputs has more than enough time to settle. The

cost is an increased latency. But still, that is not a concern in a paging receiver.

What makes this counter different from the general binary ripple design is the dual-input

requirement. Due to the 1-level ZCI, the POS channel has 2 parallel pulse trains P0 and P1, and

so does the NEG channel. Pulses from both trains should be counted simultaneously. As a

result, the counter has 2 inputs A and B and 5 outputs Q4 to Q0. D flip-flops with reset terminals

are used as the memory elements. The circuit is shown in Figure 5.9. In fact, only the last 3

Figure 5.9. The dual-input 5-bit counter.

Table 5.1 State transition table of the counter.

A B Q1 Q0 D1 D0

0 0 0 0 0 0

Hold0 0 0 1 0 1

0 0 1 0 1 0

0 0 1 1 1 1

0 1 0 0 0 1

+1

0 1 0 1 1 0

0 1 1 0 1 1

0 1 1 1 0 0

1 0 0 0 0 1

1 0 0 1 1 0

1 0 1 0 1 1

1 0 1 1 0 0

1 1 0 0 1 0

+21 1 0 1 1 1

1 1 1 0 0 0

1 1 1 1 0 1

Q

D Q

RSTQ

D Q

Q

D Q

RST RSTQ

D Q

RSTQ

D Q

RST

D1A

B

Q1 Q2 Q4Q3Q0

DFF0 DFF1 DFF2 DFF3 DFF4

D0

RESET

CLKx

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CHAPTER 5 Circuit Design II 59

flip-flops are connected in the ripple way. DFF0 and DFF1 operate in the synchronous manner.

A state transition table is written for these two elements. By inspection, their inputs D1 and D0

can be expressed as:

It can be further simplified to be:

This is exactly what is shown in the schematic.

5.4.2 The Direction Comparator

This comparator DCMP compares the two 5-bit outputs A and B of the counters PC and NC. If

A > B, or there are more pulses counted in the positive channel, the output is high meaning that

for the current symbol the phasor is rotating at the “positive” direction. If A < B, the output

goes low. The equal case is regarded the same as the larger case.

The comparison is performed on a bit to bit basis. The most significant bit (MSB) has the

highest priority. If A4 is not equal to B4, the result is obtained immediately, which is A4 or B4.

Otherwise, the result of the next bit will be used. The worst case is encountered when A4-1 =

B4-1 and the comparison result of A0 and B0, A0 + B0, have to be passed to the output. The delay

is harmless here, as is discussed in the last section.

Transmission gates are used to pass or block the results of the current and the next bit.

Doing this yields a very simple design.

5.4.3 The Speed Comparator

Outputs of the counters PC and NC are also sent to speed comparators PSCMP and NSCMP

for speed detection. Unlike the direction comparator, a speed comparator reads the input and

compares it to a fixed number, that is, the threshold 8 given by (5.1). Thus, it is much easier to

D1 ABQ1 A B⊕( ) Q1 Q0⊕( ) ABQ1+ +=

D0 ABQ0 A B⊕( )Q0 ABQ0+ +=

D1 A B⊕( )Q0 AB+[ ] Q1⊕=

D0 A B Q0⊕ ⊕=

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CHAPTER 5 Circuit Design II 60

design. The truth table for Z = (A > 8) can be simply written as:

and the logic equation is

A simpler expression is resulted if Z = (A ≥ 8):

Figure 5.10. The direction comparator.

Table 5.2 Truth table of the speed comparator.

A4 A3 A2 A1 A0 Z

1 X X X X 1

0 1 A2 + A1 + A0 = 1 1

0 0 X X X 0

B2

A2

A1

B1

A3

B3

B0

A0

A4

B4

A>=B

Z A4 A3 A2 A1 A0+ +( )+=

Z A4 A3+=

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CHAPTER 5 Circuit Design II 61

For more flexibility, another signal S is introduced to control whether the logic should just be

“greater than” or “greater than and equal to”:

And the final circuit is shown in Figure 5.11. The inverted signals are readily available from

the counters. It works well but a better design might distribute the four lower inputs A2, A1, A0

and S more symmetrically such that the critical path delay is reduced. With more external con-

trol signals, and hence more complex design and more bonding pads, the threshold can be

adjusted over a wider range. But the extra cost buys very little benefit.

5.5 Clock Recovery

In analog limiter-discriminator based FSK demodulators [43] or the digital 2FSK demodula-

tors [4-6][38], no timing signal is needed and clock recovery is a post-demodulation task of the

digital signal processing unit. This is because the demodulation is carried out by detecting the

instantaneous signal frequency or I/Q phase offset, rather than on a symbol by symbol basis. In

the ZIFZCD, however, the knowledge of all zero-crossings over each symbol period is

required. It then calls for an early clock recovery at the demodulation phase. The problem here

is that a proper timing signal must be provided before the correct data is extracted. Thus, a pre-

demodulation process becomes necessary to feed the clock recovery circuit with partially

demodulated data in which the precise clock information is borne. Such a data stream is avail-

able from the zero-crossing pulse generator. Ideally, pulses appear only in either the POS or the

NEG channel. As the symbol changes its sign, the phasor starts to rotate in the opposite direc-

Figure 5.11. The speed comparator SCMP.

Z A4 A3 S A+ 2 A1 A0+ +( )+=

A3

A4

A2

A1A0

S

Z

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CHAPTER 5 Circuit Design II 62

tion. The pulse generator then closes the current channel and pumps pulses into the other one.

Thus, a data transition can be detected without a clock.

The clock recovery circuit consists of a transition detector TD, a phase detector PD, a

charge pump, a voltage-controlled oscillator (VCO) and two frequency dividers (pre-scalers).

The pulse clock CLKx and the symbol clock CLK are obtained by dividing the VCO output

frequency by 8 and 128, respectively. The reset signal which initiates the counters at the begin-

ning of each symbol is derived from CLK.

5.5.1 Transition Detector

The transition detector can be a simple trigger which is set and reset by the rising (or falling)

edges of P0 and N0 respectively. With some kind of trigger circuits, a data transition signal TD

can be generated and used directly for phase comparison. But the simplicity comes with a

price. As shown in Figure 5.13, when a noise induced pulse appears in a closed channel, the

trigger produces a transition by mistake. In response, an error signal will be generated by the

phase detector to tune the VCO. This can temporarily drive the loop off the locked state or

cause other locking problems.

This won’t be too problematic in those 2FSK demodulators because the data will be filtered

before any further processing and the noise can be greatly suppressed. Filtering should also be

applied here to either the pulse trains or the transition signal to minimize the chance of false

triggering. To align the data with the clock, the filtering delay must be compensated. A digital

implementation is thus preferred because its delay can be introduced to the data very accu-

Figure 5.12. The clock recovery circuit.

D Q

÷8÷16

TD

outf

INCP D Charge

Pump

CLK

CLKx

VCO

P0

N0T D

Reset

DEC

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CHAPTER 5 Circuit Design II 63

rately while this is not true for analog filters. Nevertheless, a decent digital filter design may

require a complex structure and become very hardware intensive when compared to the

demodulator itself. Lee et al. proposed an alternative synchronization scheme for the ZIFZCD

[44]. Under the condition of Figure 5.14, a positive to negative transition is most likely

occurred between t4 and t5. The synchronization algorithm specifies the transition time tT with

the following relationship:

tT can then be calculated to be

It is reported that the performance degradation of the ZIFZCD with this algorithm is only 0.1

dB from a perfectly synchronized system at 1% BER. However, the precise computation

required here demands considerable complexity. At the current phase of design, only a very

simple scheme is used. That is, the transition detector produces a “1” if a pulse sequence of “−

1 −1 +1 +1” is detected and a “0” if “+1 +1 −1 −1” is detected. Thus, the false trigger due to

single noise pulse is eliminated.

Figure 5.13. Simple transition detection with a trigger.

Figure 5.14. Lee’s synchronization scheme.

noiseinduced

falsetrigger

N0

P0

Td

t3 t4–t5 t6–----------------

t4 tT–tT t5–---------------- k= =

tTt4 kt5+1 k+

----------------=

1t 2t 3t 4t5t

6t7t

8t9tt10

t11

t12t13

t14t15

t16

t

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CHAPTER 5 Circuit Design II 64

A conceptual diagram describing the detector is shown in Figure 5.15. There are 4 types of

main building blocks: shift registers RP and RN, “11” detectors CP and CN, the combinational

decision logic and the output stage. RP and RN each has 16 taps and is thus 1 symbol long. The

pulses stored in RP and RN are examined by the decision logic. The signal XP is set when two or

more “1”s are found in RP and none is found in the same range of RN. Here “the same range”

refers to the shift register taps starting from P0D and extending toward P0 until both “1”s are

covered. XN is determined in a similar manner. The “11” detector is a simple Moore machine

which checks its input for two “1”s. It is cleared by the CLR signal which is the delayed pulses

in the opposite channel. The signal S sets the output stage while R resets it.

The pulses shown in Figure 5.14 can be used to explain how the detector works. Note that

there are two pulse trains. The positive pulses come from P0 and the negative ones from N0.

Suppose CP and CN are initially at their cleared states. At the time of t5, There are 4 “1”s stored

in RP and none in RN. Therefore, XP = 1, XN = YP = YN = S = R = 0, TD keeps its initial value.

Several clocks later, the pulses at t1 and t2 are detected by CP and YP is set. As there are pulses

in both RP and RN, they reset each other so that XP = XN = 0. TD remains unchanged. When the

positive pulse at t4 is shifted to CP, RP is empty (no pulses), XN becomes “1” and R = YP∙XN = 1

resets TD. The example is also demonstrated graphically in Figure 5.16.

The actual circuit block diagram is shown in Figure 5.17 except the output stage. Part of the

decision logic is merged with the shift register and forms the AC block. The rest is the AOA

block which absorbs the R/S NAND gate. The following paragraphs explain the function and

working principle of each block including the output stage.

The AC Block and AOA Block. The AC block is named after the signals it produces.

Remember that the decision logic checks whether there are two “1”s in one register while the

other register is empty over the same range. The information is provided by signals A and C.

With the auxiliary signal B, the example given in Figure 5.18 helps make things more clear. B

and C can be expressed by:

BQi Qn

n 0=

i

∑=

CQi Qi Qm

m 0=

i 1–

=

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CHAPTER 5 Circuit Design II 65

where Q is just a place holder which should be replaced by P or N and the summation symbol

stands for the “OR” operation. If a register is empty up to the i-th tap, BQ1 to BQi are all “0”.

Thus, B can be used as an “empty indicator”. On the other hand, CQi = 1 means there are two

“1”s detected from Q1 to Qi. As a result, the condition “there are at least two ‘1’s in register RP

while RN is empty over the same range” is equivalent to the statement “there exists an index i

such that CPi = 1 and BNi = 0”. In logic expressions, we have

Figure 5.15. Model of the transition detector.

Figure 5.16. Waveforms of the transition detector model.

1 symbol

PR

CP

CLR

"11" detector

IN

Td

RN

XP

XN

CN

"11" detector

CLR

IN

YP

YN

DP0 (P0 Delayed)

DN0 (N0 Delayed)

Decision Logic

P0

N0

StageOutput

R

S

PX

NX

PY

NY

DP0

DN0

T

R

S

P0

N0

CLKxtransition

D

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CHAPTER 5 Circuit Design II 66

The signal A is nothing but the inverse of B, i.e.

XP and XN can then be re-written as

It follows that

Figure 5.17. Block diagram of the transition detector, the output stage excluded.

A15

A14

A13

A12

A11

A10 A9

A8

A7

A6

A5

A4

A3

A2

A1

C14

C13

C12

C11

C10

C9

C8

C7

C6

C5

C4

C3

C2

C1

C15

A15

A14

A13

A12

A11

A10 A9

A8

A7

A6

A5

A4

A3

A2

A1

A15

A14

A13

A12

A11

A10

A9

A8

A7

A6

A5

A4

A3

A2

A1

C14

C13

C12

C11

C10

C15 C9

C8

C7

C6

C5

C4

C3

C2

C1

A15

A14

A13

A12

A11

A10

A9

A8

A7

A6

A5

A4

A3

A2

A1

C14

C13

C12

C11

C10

C9

C8

C7

C6

C5

C4

C3

C2

C1

C15

C14

C13

C12

C11

C10

C15 C9

C8

C7

C6

C5

C4

C3

C2

C1

AOA S

AOA R

AC P

AC N

Y

Y

CLK

IN

IN

CLK

CPIN

CLK

CLR Y

N0 D

P0 D

CNIN

CLK

CLR Y

Y P

Y N

CLKx

P0

N0

R

S

XP CPiBNi

i

∑=

AQi BQi=

XP CPiANi

i

∑=

XN CNiAPi∑=

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CHAPTER 5 Circuit Design II 67

(5.2)

Circuit diagram of the AC block is given in Figure 5.19. The AOA block which generates the

R/S signal is shown in Figure 5.20. Formed by a pseudo-NMOS AND-OR-AND-NOT gate

and a static inverter, it implements the function given by (5.2).

The “11” Detector. This is a 3-state Moore machine. Its out is set when two or more “1”s, suc-

cessive or not, are found in the IN signal. A synchronuous reset signal CLR resets the output

and the current state. Both the IN and CLR can be treated as input signals but the state transi-

tion diagram will be much simplified by just considering IN first. The state transition diagram

and state transition table are shown in Figure 5.21 and Table 5.3. Using two D flip-flops as the

memory element, their inputs will be:

Figure 5.18. Working principle of the AC block.

R YPXN YP CNiAPi

i

∑ = =

S YNXP YN CPiANi

i

∑ = =

N3 N2 N1 N0

B

BN2CN3

CN2

CN1

D=N0

BN1

01 0 1

=1

=0

=1

=1

=0

=1

CP1

P0P1P2P3

CP2

CP3

BP2

BP3

D=P0

BP1

0 000

=0

=0

=0

=0

=0

=0

NX = 1PX = 0

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CHAPTER 5 Circuit Design II 68

Now the reset signal can be inserted into the logic equations:

The output Z can be directly taken from Q0. The circuit diagram is shown in Figure 5.22.

The Output Stage. Function of this block is to combine R and S to form a single data transi-

tion signal. The truth table of a D flip-flop implementation is shown in Table 5.4. Input to the

flip-flop is simply

Figure 5.19. Circuit diagram of the AC block.

Figure 5.20. The AOA block.

Q

D Q

Q

D Q

Q

D Q

Q

D Q

Q

D Q

Q

D Q

A12

C12

A13

C13

A1

C1

A2

C2

A3

C3

X

A14

C14

A15

C15

CLKx

IN

Z

Vdd

Y

C3

A3

C2

A2

C4

A4

C1

A1

C14

A14 A15

C13

A13

C15

D0 Q0 INQ1+=

D1 IN Q1+=

D0 CLR Q0 INQ1+( )=

D1 CLR IN Q1+( )=

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CHAPTER 5 Circuit Design II 69

The circuit diagram is given in Figure 5.23.

Transition detection does not happen at the precise transition point tT and therefore intro-

duces offset and jitter. But these effects don’t seem to cause serious problems.

Figure 5.21. State transition diagram and state transition table of the “11” detector.

Figure 5.22. Circuit diagram of the “11” detector.

Table 5.4 Truth table of the output stage.

R S D

0 0 Q

0 1 1

1 0 0

1 1 X

00

01 1X

1/0

0/0

1/1

X/1

input/outputTable 5.3 State transition table of the “11” detector.

Q0 Q1 IN Q0+ Q1

+ Z+

X X 0 Q0 Q1 Z

0 0 1 0 1 0

0 1 1 1 X 1

1 X 1 1 X 1

Q

D Q

Q

D QD0D1 Q1 Q0

INZ

CLR

CLKx

D R S Q+( )=

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CHAPTER 5 Circuit Design II 70

Recall that in a FLEX signal structure, a synchronization signal at 1600 bps is provided at

the beginning of each frame. This signal should be more than 100 bits long. Although the clock

recovery circuit designed here is for 3200 bps data rate, it can be easily modified to accommo-

date the low bit rate signal.

5.5.2 Phase Detector

Inputs of the phase detector are the transition detector’s output TD and the system clock fout. As

TD is a non-return-to-zero (NRZ) signal, an edge detector is necessary to “double” its fre-

quency such that it contains a strong component at the symbol rate. The output signals INC and

DEC are connected to the charge pump. The VCO frequency is increased when INC is active or

decreased when DEC is active. The phase error between fin and fout results in an error signal E:

But it is its complement E that is actually generated:

Figure 5.23. Output stage of the transition detector.

Figure 5.24. The phase detector.

Q

D Q TdSR

Q

QD INC

D

Efin

EdgeDetectorDT

foutD

DEC

E finfout=

E fin fout+=

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CHAPTER 5 Circuit Design II 71

As the error signal produced by an XOR phase detector would be

E can be considered as a “half XOR” of fin and fout and the phase detector has a characteristic

similar to that of an XOR gate except a lower gain. An undesired feature of the XOR phase

detector is the dependence of its output on input duty cycle. The problem is more severe here

because it can result in a large dead zone where the output is zero even with a non-zero phase

error as illustrated in Figure 5.25. To avoid this effect, both inputs need to be 50% duty cycle.

This is hard to achieve because neither cycle is constant. But if the pulse width of fin is kept

exactly half the fout cycle, the requirement can be finally satisfied when the loop is locked. The

edge detector shown in Figure 5.24 is used for this purpose, where TD is first delayed by half

fout cycle and then combined by an XOR gate with the original signal to create the fin signal. A

certain amount of correlation is introduced between fin and fout through the delay process. The

effect will be discussed in Section 5.5.4.

Another problem appears as transitions are absent in the input data stream. This is due to

the random nature of the data. It can also happen to the synchronization signal when the SNR

is not high enough. In a full XOR operation, missing transitions will be mistakenly regarded as

phase errors and result in a continuously accumulated error voltage and finally cause serious

lock problem. The half XOR operation is a strategy to handle possible absent data transitions.

As shown in Figure 5.25 (b), the error signal E is allowed to be set only when fin is active.

When there are no transitions, fin stays at the low level and so does E.

Figure 5.25. Dependence of the error signal on input duty cycle (a) and data transitions (b).

EXOR finfout finfout+=

f

f

in

E

data transitionsabsence of fin

fout

E XOR

E

out

(a) (b)

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CHAPTER 5 Circuit Design II 72

The signal D is used to determine whether the VCO should raise its frequency. The idea is

to minimize the distance between the neighboring rising edges of fin and fout in the time axis. It

follows the following rule: at each rising edge of fin, if fout is “1”, then its frequency should be

decreased (D = 1) such that its next rising edge will be delayed and hopefully closer to that of

fin; otherwise its frequency should be increased (D = 0). Now logic expressions can be written

for INC and DEC in terms of E (fin and fout) and D:

Working principle of the phase detector can be explained by Figure 5.26. Initially, fout is slower

than and lags fin. This results in a negative E pulse and a zero D in the first fin cycle. Conse-

quently, INC becomes active and pushes the VCO toward a higher frequency. In the following

several cycles, the frequency error is reduced but the phase error is still accumulated. As a

result, D stays at “0” and INC is activated in each cycle until the frequency of fout is slightly

higher than that of fin. As fout is now leads fin, D becomes “1” and the DEC signal is activated.

Both the frequency error and the phase error are reduced considerably from their initial values.

This is a sign that the loop is on its way to lock.

Figure 5.26. Waveforms of the phase detector.

INC finfoutD ED= =

DEC finfoutD ED= =

fout

fin

TD

E

INC

DEC

D

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CHAPTER 5 Circuit Design II 73

5.5.3 VCO and Charge Pump

The core element of the VCO, as shown in Figure 5.27, is a source-coupled multivibrator. The

transistors M1 and M2 are turned on and off alternatively. As the switching frequency is

directly related to the bias current I, it makes more sense to describe the vibrator as a current

controlled oscillator (ICO) rather than a VCO. Depending on the biasing conditions, the “ON”

mode can either be a saturation mode or linear mode. As the nominal center frequency is only

409.6 kHz, the latter is chosen for the low frequency operation. Analysis of the oscillator cir-

cuit can be done following the bipolar example given in Chapter 10 of [31]. Ideally, the voltage

change over the capacitor C in each half cycle can be approximated by

(5.3)

where

The subscript “1” stands for transistors M1 and M2, “3” for M3 and M4. The output frequency

is easily derived as

(5.4)

Due to the subthreshold conduction and parasitic capacitance (including gate capacitance), ∆V

is about 200 to 300 mV smaller than what is estimated by (5.3). Accordingly, the actual fre-

quency is almost 30% higher. Despite the discrepancy, (5.4) does predict the ICO gain with

high accuracy. In Figure 5.28, the frequencies calculated using (5.4) are compared with simula-

tion results at different bias currents. In both cases the ICO gain KICO is around 32 kHz/µA over

the interested frequency range.

Besides the multivibrator, the complete VCO also consists of a Gm cell, a current mirror

and an output buffer which also serves as a differential to single-ended converter. The Gm cell

∆V ∆VGS3 Vth1 ∆VGS3 Vth1–( )2 4∆VGS1+–+=

∆VGS12I

µCox W1 L⁄ 1( )---------------------------------=

∆VGS32I

12---µCox W3 L⁄ 3( )------------------------------------=

f1

2∆V----------- I

C----=

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CHAPTER 5 Circuit Design II 74

is of the same type as the one used in the gyrator filter except that here its output is single-

ended. The transconductance gm is about 6.5 µS. Thus, the overall VCO gain is

The charge pump circuit is shown in Figure 5.29. By assuming the average current charging

the capacitor to be Ipφe/(2π) where φe is the phase error, natural frequency and damping factor

of the loop will be [45]

Figure 5.27. The complete VCO.

Figure 5.28. Multivibrator frequency vs. bias current.

Gm multivibratormirror

I 0

I∆

Vdd

Vc

Vref

VbI

outputA

C

I

M3 M4

M2M1

8 8.5 9 9.5 10 10.5 11 11.5 12250

300

350

400

450

500

I [uA]

f [k

Hz]

CalculationSimulation

KVCO

gmKICO

scale ratio------------------------ 6.5µ 32k×

8 16×--------------------------≈ 1.625 kHz/V= =

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CHAPTER 5 Circuit Design II 75

Given the current source and VCO gain, passive components can be determined by choosing

ωn and ζ properly:

This results in 16 nF Cp and 86 kΩ Rp at 10 µA Ip when ωn = 1000 rad/s and ζ = 0.7.

5.5.4 Loop Behavior

In normal PLL or clock recovery circuit designs, the reference signal or the incoming data is

independent of the signal whose frequency is to be tuned. But in this one, as presented in above

sections, all timing signals are derived from the same VCO output. As a result, input and out-

put of the clock recovery circuit are highly correlated. This is of course not imperative as the

clock can be generated from an independent source with more stable and accurate frequency

characteristics. But such a signal source will, almost inevitably, be off-chip and a complicated

frequency divider must be designed to obtain the required reference frequency. Making use of

Figure 5.29. The charge pump.

ωn

Ip

Cp

-----KVCO=

ζ Rp

2----- IpCpKVCO=

CpIpKVCO

ωn2

---------------=

Rp2ωnζ

IpKVCO

---------------=

INC

I p

I p

Vdd

Vc

DEC C

R

p

p

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CHAPTER 5 Circuit Design II 76

the VCO output changes the loop behavior in an unknown manner but also eliminates the need

of the additional hardware.

To study the impact of the fout-dependent delay which is introduced in the edge detector of

the PD, the acquisition process is simulated and shown in Figure 5.30 (b), together with that of

the ideal case where fin is independent of fout (a). Both cases have the same initial conditions

and share the same 50% duty cycle 1.6 kHz TD signal. The only difference lies in the way the

edge detector delays TD. In the ideal case (a) TD is delayed by half of its own cycle while in (b)

it is delayed by half the fout cycle, or 8 pulse clock (CLKx) cycles.

Figure 5.30. Impact of the fout-dependent delay on the acquisition process: fin and fout are (a) uncorrelated and (b) correlated.

TD

f out

f inV

CT

Df ou

tf in

VC

(a)

(b)sec

sec

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CHAPTER 5 Circuit Design II 77

Very similar loop dynamics are given by the figures. Initially, fout is about 550 Hz slower

than the 3.2 kHz nominal symbol rate and the phase error is larger than π. In both cases the fre-

quency of fout is further lowered to adjust the phase error such that the loop gain is maintained

at a negative value. Loop (a) then exhibits the behavior of a typical slightly under-damped

PLL. Loop (b) basically repeats this process but with noticeable difference. As shown in the

figure, fin has a variable duty cycle which depends on the instantaneous fout frequency. We can

examine how the duty cycle varies and how this variation affects the loop dynamics in three

aspects:

1. When the frequency of fout is to be increased, as is the case in the 1 to 4.5ms range of the

figure, the duty cycle variation won’t change the error signal and hence the loop behav-

ior. This is because fin is leading fout and the phase error is calculated from the rising edge

of fin to the rising edge of fout. These two points are virtually independent of the duty

cycle of fin.

2. When fout is to be decreased, the phase error is calculated from the falling edge of fout to

that of fin. Depending on the loop parameters and the initial conditions, the duty cycle of

fin could be either stretched or suppressed. In general, the duty cycle is proportional to the

initial phase error and reversely proportional to the initial frequency error (fout − fin). Its

variation changes the average charging current and can be regarded as a variation of the

charge pump current source. As a result, the loop tends to be momentarily under damped

at small phase errors and finite frequency errors while over damped at small frequency

errors and finite phase errors. Both effects can lead to longer settling time.

3. As a special case of condition 2, if TD is not aligned with CLKx, the time that fin stays

high will be less than half fout cycle. At small phase errors, this can lead to a state of false

lock where there is no error signal generated. The situation persists and causes a

permanent static phase error as long as the loop is frequency locked. Otherwise, the

phase error will continue to accumulate and finally break the false lock state. The

waveforms after 6.5 ms demonstrate such a situation.

At the time of 10 ms, loop (a) has reduced its phase error to 2.5° and frequency error to about 4

Hz. Meanwhile, comparable results of 2.24° and −23.5 Hz are achieved by loop (b).

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CHAPTER 5 Circuit Design II 78

One method to eliminate the false locking state described in condition 3 is to synchronize

TD with CLKx. This is what happens in the zero-crossing pulse generator and the transition

detector. But the synchronization has its own problems. In the pulse generator, a pulse has to be

shifted from the actual zero-crossing position by a certain distance. At the same time, the pulse

width and the spacing between pulses have to be integer multiples of the pulse clock period.

This causes the position and spacing of the pulses to vary with the clock rate. In the transition

detector, as the shift register is also clocked by CLKx, the resultant TD signal has a strong cor-

relation to the clock too. As a result, the TD cycle will be forced to follow that of fout tempo-

rarily until it deviates from the nominal value by more than 1 clock cycle. The error is then

reduced by inserting or removing 1 clock cycle from TD. This, together with the similar effect

found in the pulse generator, causes jitter-like but output-dependent errors to appear in fin and

results in longer loop settling time.

5.6 An Overall Simulation

To conclude this chapter, waveforms from an overall simulation is given in Figure 5.31. The

original data is a series of alternate “+3/−3” symbols. The I and Q components of the down-

converted zero-IF signal are shown in the top row. Ix and Qx are the same set of signals after

amplification and low-pass filtering. The amplitude ramp is caused by the AGC during set-

tling. Its impact on the demodulation process can be neglected. Operation of the clock recovery

circuit is presented by the signals fin, fout and Vc as discussed in the last section. The initial fre-

quency error is 440 Hz or about 1.4%. As all nodes are initially set to zero volt, the transition

detector doesn’t have an output until the shift registers are full. The zero initial condition also

results in unequal positive and negative pulses in Vc. Although this does not cause any serious

problems here, it can disable the charge pump when fout is faster than fin. Several methods are

available to solve this problem. By tuning the reference voltage, fout can always be set to a

slightly higher frequency when Vc is zero. Making use of a differential charge pump or a pre-

charge circuit can also help out. The latter sets Vc to a intermediate voltage between ground

and the power supply during the power on process. The demodulation outputs are direction and

speed. The errors at the first 2 or 3 symbols are also resulted from the initial condition.

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CHAPTER 5 Circuit Design II 79

Figure 5.31. An overall simulation of the demodulator.

I/Q

Ix/Q

xf in

f out

dire

ctio

nV

Csp

eed

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CHAPTER 6Measurement Results

Having discussed the design of the AGC, LPF and the demodulator, we report the detailed

measurement results of the base-band circuitry in this chapter. The performance of the RF

front-end as well as that of the whole receiver are also summarized. The die photo is depicted

in Figure 6.1. Please also refer to Appendix B for details on the base-band testing setup.

6.1 AC Transfer Curves

Figure 6.2 shows the simulated and measured transfer curves of the AGC at its maximum gain.

The measured gain is slightly higher at low frequencies and decreases earlier when the fre-

quency increases. This implies that the equivalent feedback resistance of the VGA is relatively

larger in the measurement. It can be caused by a 2 to 3 mV error in the control voltage (Vc4−

Vc1) as shown in (4.4) and Figure 4.7 on page 36.

Figure 6.1. The die photo of the whole prototype receiver.

80

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CHAPTER 6 Measurement Results 81

Figure 6.3 is the transfer curves of the LPF. The matching between the measurement and

the simulation demonstrates the excellent sensitivity property of the LC ladder. The pass-band

is about 9 kHz with a nominal gain of −6.2 dB and a ripple smaller than 0.5 dB. The stop-band

starts from 17.8 kHz. The stop-band attenuation is larger than 63 dB.

In Figure 6.4 the transfer curves of the offset cancellation stage is given. The measured

gain over 1 to 10 kHz is about −2.5 dB, 0.5 dB higher than the simulated value. This is proba-

bly because the charging current I0 is smaller in the real circuit (see Figure 4.19 on page 50). It

can also be seen that when there is an input signal, the harmonic distortion slows down the roll-

off of the transfer curve at low frequencies.

6.2 Noise Performance

Cascaded output noise voltage spectral densities of the AGC, the LPF and the offset cancella-

tion stage are plotted in Figure 6.5. Figure 6.6 shows equivalent input noise spectral densities

of the AGC and LPF, when referred from the LPF output and the AGC output, respectively.

The flicker noise coefficient KF is estimated using the curve-fitting method. It turns out that

KF’s at the order of 10−28 to 10−27 V2F match the simulation well to the measurement. The

results are shown in Figure 6.7 where KFNMOS = 10−27 V2F and KFPMOS = 10−28 V2F are used.

Figure 6.2. Simulated and measured AGC transfer curves at the maximum gain.

102

103

104

105

17

17.5

18

18.5

19

19.5

20

Frequency [Hz]

Gai

n [d

B]

SimulatedMeasured

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CHAPTER 6 Measurement Results 82

These numbers are much lower than the typical value quoted in the literature. This should be

due to the near weak inversion operation of the transistors.

Figure 6.3. Simulated and measured transfer curves of the LPF.

Figure 6.4. Simulated and measured transfer curves of the offset cancellation stage.

0 5 10 15 20 25 30−100

−90

−80

−70

−60

−50

−40

−30

−20

−10

0

Frequency [kHz]

Gai

n [d

B]

Measured Simulated (LC Ladder) Simulated (Gyrator Filter)

101

102

103

104

105

−25

−20

−15

−10

−5

0

5

Frequency [Hz]

Gai

n [d

B]

Simulated AC Transfer Curve Measured without Input Signal Measured with 100 mV Chirp Input

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CHAPTER 6 Measurement Results 83

6.3 Harmonic Distortion

Harmonic distortions of these stages are also measured in the cascaded way. The input signal is

a sin wave with the frequency and differential amplitude of 3.2 kHz and 200 mV (206 mV

actually). The AGC gain is set to be 6 dB. Under these conditions, the outputs of the AGC, the

Figure 6.5. Cascaded noise voltage spectral densities at the output of the AGC, the LPF and the offset cancellation stage.

Figure 6.6. Input-referred noise spectral densities.

101

102

103

104

105

10−7

10−6

10−5

10−4

Frequency [Hz]

Vrm

s/sq

rt(H

z)AGC Output

Offset Cancellation Output

LPF Output

101

102

103

104

105

10−7

10−6

10−5

10−4

10−3

10−2

Frequency [Hz]

Vrm

s/sq

rt(H

z)

(a)

(b)

(c)

(d)

(a) LPF input noise, referred from LPF output(b) AGC input noise, referred from LPF output(c) AGC output noise(d) AGC input noise, referred from AGC output

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CHAPTER 6 Measurement Results 84

LPF and the offset cancellation stage are read as A0, G0 and O0, respectively. The input signal

vin is then changed to −vin by switching its differential terminals. The output signals are

recorded again in order as A1, G1 and O1. Doing so makes it easier to calculate the 2nd order

harmonic distortion parameter, as will be discussed shortly. The spectra of these signals are

depicted in Figure 6.8 and Figure 6.9. It can be seen that the input signal itself contains a cer-

tain amount of harmonic components. These components will be processed by each stage and

Figure 6.7. Noise simulation that estimates the flicker noise parameters by curve fitting.

101

102

103

104

105

10−6

10−5

10−4

Frequency [Hz]

Vrm

s/sq

rt(H

z)Thermal Noise Only

Flicker Noise Included

Measurement

101

102

103

104

105

10−8

10−7

10−6

10−5

10−4

Frequency [Hz]

Vrm

s/sq

rt(H

z)

Thermal Noise Only

Flicker Noise Included

Measurement

101

102

103

104

105

10−8

10−7

10−6

10−5

10−4

Frequency [Hz]

Vrm

s/sq

rt(H

z)

Thermal Noise Only

Flicker Noise Included

Measurement

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CHAPTER 6 Measurement Results 85

appear at the output. To accurately compute the distortion characteristics, their effects should

be minimized.

The 3rd order polynomial is again used to model the nonlinearity. And the function of a

building block can be generally expressed in the time domain as

where x(t) and y(t) are the input and output signals and a1, a2 and a3 are three constants. As the

input already contains 2nd and 3rd harmonics, it may be written as

The 2nd and 3rd harmonics at the output are then approximated by

Figure 6.8. Signal spectra of the harmonic distortion measurement.

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

LPF Output G0Offset Cancellation

Input Signal +vin AGC Output A0

Output O0

y t( ) a1x t( ) a2x2 t( ) a3x3 t( )+ +=

x t( ) A ωt( )cos B 2ωt α+( )cos C 3ωt β+( )cos+ +=

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CHAPTER 6 Measurement Results 86

(6.1a)

(6.1b)

(6.1)For simplicity, here we use the subscripts “2” and “3” to denote the 2nd and 3rd harmonics

respectively. For example, the 2nd harmonic of the signal A0 is A02. From (6.1) we can see that

an output harmonic component such as H2 or H3 consists of two major parts: the one which is

linearly amplified from the corresponding harmonic of the input and the one which is gener-

ated from the fundamental component due to the nonlinearity. There is usually a phase differ-

ence between them and the summation should also result in a finite phase term. Therefore all

these components are better expressed in the complex domain and (6.1) can be re-written in a

general way as

(6.2)

Figure 6.9. Signal spectra of the harmonic distortion measurement, with the input inverted.

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

0 5 10

−100

−80

−60

−40

−20

0

[kHz]

[dB

V]

LPF Output G1Offset Cancellation

Input Signal −vin AGC Output A1

Output O1

H2 a1B 2ωt α+( )cos12---a2A2 2ωt( )cos+≈

H3 a1C 3ωt β+( )cos14---a3A3 3ωt( )cos+≈

Hk a1vink Xk+=

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CHAPTER 6 Measurement Results 87

where the subscript k = 2 or 3 is the harmonic order, vink and Hk are the input and output har-

monic components respectively, Xk is the generated harmonic due to nonlinearity. In a specific

case such as the 2nd harmonic of the AGC we have

(6.3a)(6.3b)(6.3)

for the normal and inverted inputs. Because of the square operation in (6.1a), the generated

term AX2 keeps unchanged in these two cases. It can be derived by adding (6.3a) to (6.3b) and

rearranging the result:

(6.4)

The summation eliminates the need to measure the 2nd harmonic of the input signal and hence

avoids the measurement errors. The magnitude of the generated 2nd harmonic is thus

As A02 and A12 in this equation are complex numbers and their phases are not easy to be mea-

sured accurately, we only make use of their amplitudes:

(6.5)

This is, obviously, of the worst case and applies to the other two generated 2nd harmonics, i.e.,

GX2 and OX2. It is then a straightforward task to calculate the harmonic distortion.

The 3rd harmonic, however, should be treated differently because the polarity of the gener-

ated component changes with the input. Again, take the AGC stage for example, the output 3rd

harmonics under the normal and inverted inputs are

(6.6a)(6.6b)(6.6)

As the amplified input 3rd order components in these two cases can’t be cancelled out and

won’t be exactly the same due to noise, offset and measurement errors, they are identified by

A02 aA1vin2 AX2+=A12 a– A1vin2 AX2+=

AX2A02 A12+

2---------------------=

AX2A02 A12+

2------------------------=

AX2

A02 A12+2

---------------------------≤

A03 aA1vin3( )0 AX3+=A13 aA1vin3( )1– AX3–=

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CHAPTER 6 Measurement Results 88

the additional subscripts “0” and “1”, the same method for defining the output signals. Either

equation can be used to calculate AX3 and its worst case magnitude is

Taking the average we have

(6.7)

Based on equations (6.5) and (6.7), the worst case cascaded 2nd and 3rd harmonic distortion

performance is calculated from the measured data. The results are listed in Table 6.1, together

with simulation results of the cascaded 3rd harmonic distortions. The simulation is reasonably

close to the measurement.

It can be seen that excellent 2nd harmonic distortion performance is achieved. The 3rd har-

monic distortion is also satisfactory. The offset cancellation stage increases the nonlinearity

only slightly.

6.4 AGC Gain and Dynamics

AGC gain is measured at different input levels and frequencies. The results are shown in Fig-

ure 6.10. A close match between the measurement and the simulation is observed. Figure 6.11

shows the output level of the AGC under the same input conditions.

In Figure 6.12 and Figure 6.13, the measured and simulated AGC responses to a 1.6 kHz

input signal whose amplitude switches between 100 and 200 mV are plotted. A longer settling

Table 6.1 Cascaded harmonic distortions of the AGC, the LPF and the offset cancellation stage.a

a. As the LPF has a 2 dB attenuation at the 3rd harmonic (9.6 kHz), the measured output components at this fre-quency are compensated accordingly.

Input Level (dBV)

Cascaded Gain or Worst Case Harmonic Distortion

AGC LPF Offset Cancellation

Fundamental −13.72 6.03 dB (Gain) −0.314 dB (Gain) −2.76 dB (Gain)

2nd Harmonic −87.41 73.87 dBc, 0.020% 72.39 dBc, 0.024% 69.61 dBc, 0.033%

3rd Harmonic −91.88 59.46 dBc, 0.106% 49.30 dBc, 0.343% 48.63 dBc, 0.370%

Simulation (3rd) 65.90 dBc 47.85 dBc 45.88 dBc

AX3 A03 aA1vin3( )0+≤ or AX3 A13 aA1vin3( )1+≤

AX3

A03 A13 aA1vin3( )0 aA1vin3( )1+ + +2

-------------------------------------------------------------------------------------------≤

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CHAPTER 6 Measurement Results 89

time is observed in the measurement, especially when responding to the rising input amplitude.

This can also be explained by a smaller charging current I0 of the peak detector (Figure 4.6 on

page 36), the same reason given in Section 6.1 when discussing the gain discrepancy of the

offset cancellation stage.

Figure 6.10. AGC gain at different input levels.

Figure 6.11. AGC output levels at different input levels.

−35 −30 −25 −20 −15 −10 −5 0 5−10

−5

0

5

10

15

20

Input Signal Amplitude [dBV]

AG

C G

ain

[dB

]

Simulated at 3.2 kHz Measured at 3.2 kHz Measured at 10.24 kHz

−35 −30 −25 −20 −15 −10 −5 0 5−16

−15

−14

−13

−12

−11

−10

−9

−8

−7

Input Signal Amplitude [dBV]

AG

C O

utpu

t [dB

V]

Simulated at 3.2 kHz Measured at 3.2 kHz Measured at 10.24 kHz

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CHAPTER 6 Measurement Results 90

6.5 Clock Recovery

In Figure 6.14 the locking process of the clock recovery circuit is given. The test is done by

changing the reference voltage Vref of the VCO (Figure 5.27 on page 74) and observing the

output voltage VC (Vpmp here) of the charge pump. Vref is a square wave with 224 mV peak to

Figure 6.12. Measured AGC response to input amplitude variations. The input signal is at 1.6 kHz and has an amplitude switching between 100 and 200 mV.

Figure 6.13. Simulated AGC response to the input signal given in Figure 6.12.

10 20 30 40 50 60 70 80 90 100

−0.2

−0.1

0

0.1

0.2IN

PU

T [V

]

10 20 30 40 50 60 70 80 90 100

−0.5

0

0.5

OU

TP

UT

[V]

TIME [ms]

10 20 30 40 50 60 70 80 90 100

−0.2

−0.1

0

0.1

0.2

INP

UT

[V]

10 20 30 40 50 60 70 80 90 100

−0.5

0

0.5

TIME [ms]

OU

TP

UT

[V]

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CHAPTER 6 Measurement Results 91

peak amplitude, which is equivalent to about 360 Hz frequency change. The uneven response

to the rising and falling steps of Vref is resulted from the fact that Vpmp (or VC) is initially at an

unknown voltage, most likely 0 volt. Therefore, to achieve a quick setting after power-on, Vref

is set to be relatively low. The momentary absolute voltage drop over the resistor of the charge

pump is thus different during charging and discharging. Also, as discussed in Section 5.5.4, the

correlation between the input and output of the PLL results in an non-ideal damping property.

Figure 6.15 shows the spectra of the clock signal, before and after it is locked.

6.6 Demodulation

In figures 6.16 to 6.20, measured input and output signals of the demodulator are given. Due to

the limited bandwidth of the SR780 FFT network analyzer, transition edges of the digital sig-

nals are not crisp enough. But this is not a critical issue as the signal frequency is very low. For

a comparison, the waveforms from the simulation are also depicted in Figure 6.21.

In Figure 6.19 we see a number of glitch-like pulses in the asynchronous direction signal.

These can be explained by the simulation results shown in Figure 6.22. As the transition detec-

tion reads only the pulse trains P0D and N0D (Figure 5.17 on page 66), errors could occur in the

alignment of the clock and the interpolated signals P1D and N1D (Figure A.18 on page 118).

Figure 6.14. Locking process of the clock recovery circuit.

0 10 20 30 40 50 60 70 80 90 1000

0.5

1

TIME [ms]

Vre

f and

Vpm

p [V

]

0 10 20 30 40 50 60 70 80 90 1000

0.1

0.2

0.3

0.4

Vre

f [V

]

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CHAPTER 6 Measurement Results 92

When this happens, as shown in Figure 6.22, one pulse of N1D is mistakenly counted as a pos-

itive pulse after the reset signal (not shown in the figure) and results in the temporarily high

output level of the asynchronous direction. To solve this problem, the transition detection

should also take the interpolated pulses into account. Doing this the complexity will be

increased by a limited amount.

Figure 6.15. Spectra of the clock signal, before and after lock.

Figure 6.16. AGC I/Q input and LPF output waveforms.

1.5 2 2.5 3 3.5 4 4.5 5−120

−100

−80

−60

−40

−20

0

20

Frequency [kHz]

Mag

nitu

de [d

BV

]Free Runnning

Locked

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

1

1.1

1.2

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

1.8

1.9

2

AGC

I/Q In

put

LPF

I/Q O

utput

TIME [ms]

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CHAPTER 6 Measurement Results 93

Figure 6.17. Signal Q1 (hard-limited version of the Q1 in Figure 5.1 on page 51).

Figure 6.18. Signal N1 (see also Figure 5.1 on page 51).

Figure 6.19. The asynchronous/synchronized direction signal.

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

Q1

CLO

CK

TIME [ms]

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

N1

CL

OC

K

TIME [ms]

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

CL

OC

K

TIME [ms]

Asyn

chro

nous

Dire

ctio

nC

LO

CK

Sync

hron

ized

Dir

ectio

n

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CHAPTER 6 Measurement Results 94

6.7 Summary

Measurement results of the base-band circuits are summarized in Table 6.2. In Table 6.3 the

front-end performance is reported. For more information on the design and measurement of the

RF front-end please refer to [17] and [32]. The overall performance of the receiver is given in

Table 6.4.

Figure 6.20. The asynchronous/synchronized speed signal.

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5

0

1

2

3

CLO

CK

TIME [ms]

Asyn

chro

nous

Spe

edC

LO

CK

Sync

hron

ized

Sp

eed

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CHAPTER 6 Measurement Results 95

Figure 6.21. Simulated demodulator input and output waveforms in a 5 ms interval.

LPF Output I

LPF Output Q

Cloc

kQ1

N1Di

recti

on(A

sync

hrono

us)

Spee

d(A

sync

hrono

us)

Dire

ction

(Syn

chron

ized)

Spee

d(S

ynch

ronize

d)

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CHAPTER 6 Measurement Results 96

Figure 6.22. The incomplete transition detection and its effect on the demodulation.

Table 6.2 Performance summary of the base-band circuit.

AGCMax.: 18.6 dB, Min.: N/A

HD2 ≤ 0.02%, HD3 ≤ 0.106%

LPF

Pass-band: gain −6.2 dB, ripple ≤ 0.5 dB (≤ 9 kHz)

Stop-band: attenuation ≥ 63 dB (≥ 17.8 kHz)

HD2 ≤ 0.024%, HD3 ≤ 0.343% (cascaded)

Offset Cancellation

Gain: −2.5 dB

Output offset < 2 mV (under ±100 mV input offset)

HD2 ≤ 0.033%, HD3 ≤ 0.37% (cascaded)

Input Referred Noise 600 nV/√Hz at 10 kHz

Clock Recovery Capture range > 550 Hz

Power Dissipation 5.4 mW (including all buffers)

Table 6.3 Performance summary of the front-end.

with off-chip matching inductor with on-chip matching inductor

Gain 51.1 dB 43.3 dB

Noise Figure at 100kHz 5.8 dB 15.0 dB

IIP3 −26.0 dBm −20.7 dBm

P0d

N0d

P1d

N1d

Cloc

kDi

recti

on(A

sync

hrono

us)

TIME

a mis-counted pulse

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CHAPTER 6 Measurement Results 97

IIP2 −10 dBm −5.6 dBm

Operating Frequency 930 MHz

LO Frequency 465 MHz

I/Q Gain Mismatch < 0.3 dB

I/Q Phase Mismatch < 5°

Self-mixing Rejection > 54 dB

Input Matching (S11) < −20 dB

Power Dissipation 52.76 mW

Table 6.4 Summary of the whole receiver (off-chip matching inductor).

Process 0.35 µm 2P4M N-well CMOS

Die Size 1128 × 3955 µm2 (including pads)

Power Supply 3.0 V

Maximum Gain 62 dB (excluding the hard-limiter stage)

Noise Figure at 10 kHz 14.5 dB (including the loss of the balun)

IIP3 > −38.0 dBm

IIP2 > −11.0 dBm

Power Dissipation 58 mW

Table 6.3 Performance summary of the front-end.

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CHAPTER 7Future Work and Conclusion

In the first two chapters, the backgrounds of high speed paging systems, the concept of direc-

tion-conversion and the FSK modulation format as well as different demodulation techniques

are introduced. A high-level analysis is then presented in the third chapter, followed by two

chapters of discussions on the design of the prototype circuit.

In chapter 3, the high-level analysis is preformed under the assumption that the receiver

performance is determined only by the RF front-end while the base-band circuit is ideal and

the demodulator is nearly perfectly synchronized. It thus provides an upper bound of the per-

formance. When mapped to a real circuit, the high-level model has to be revised to accommo-

date imperfections of the base-band. Problems come mainly from the following aspects:

1. the DC offset caused by device mismatch,

2. raised noise floor and lowered linearity due to the active implementation of the originally

passive channel selection filter,

3. further degradation of the signal to noise ratio contributed by the flicker noise.

The situation is especially serious in the CMOS technology as it is not optimized for analog

applications. Although these imperfections can never be eliminated, their impacts can be mini-

mized by means of receiver architecture optimization and circuit design techniques. In the fol-

lowing sections some possible improvements are first discussed, which are also the directions

of our future work. The whole dissertation is then concluded by a summary of the design.

98

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CHAPTER 7 Future Work and Conclusion 99

7.1 Possible Improvements

Based on the experience gained from and the mistakes made in the design of the prototype

receiver, we believe that there are considerable space left for the performance improvement.

Some of the possible approaches are described below.

7.1.1 DC Offset Cancellation

The DC offset problem is still the first concern in the design of a direct-conversion receiver. It

is not simply a circuit issue but also a system-related problem. Therefore, besides the discus-

sion in Section 4.5, a more comprehensive consideration which includes the analysis of the sig-

nal structure is necessary.

Although at its highest data rate of 6400 bps the FLEX signal goes to 4FSK and contains

significant DC and low frequency spectral components, it does sometimes run at only 1600

bps, in the form of binary FSK. Recall the FLEX signal structure given in Section 1.1.2, this

actually occurs at the synchronization portion of each data frame. The synchronization portion

is used for frame lock but is potentially useful in offset cancellation.

As the modulation index of a 2FSK 1600 bps signal is 6, it doesn’t have any power at DC.

The shape of its spectrum is comparable to the that of the 1200 bps POCSAG signal. Thus it

can be safely demodulated with AC-coupling. And it is possible to perform the offset cancella-

tion frame by frame. This can be done in a two-path operation mode. The first path is a DC

path where all the stages are DC-coupled such that the low frequency energy of the signal is

preserved. In the second path AC-coupling is used to block DC and low frequency compo-

nents. The operation proceeds in two steps. At the beginning of a frame, the synchronization

signal will go through both paths. The outputs are compared to each other to calculate the

effective offset level. The result is then stored for future reference. If the data blocks are also at

1600 bps, the DC path can be shut down for power saving. Otherwise, the AC path is shut

down and the signal is processed in the DC path, with the stored offset level subtracted. This

scheme should work very well with the mismatch-induced static offset. However, as each

frame lasts for 1.875 seconds long, it may not be effective enough to handle the dynamic or

time-varying offset produced by the mixing process. This is where the harmonic mixer or

adaptive mixers can help.

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CHAPTER 7 Future Work and Conclusion 100

7.1.2 System Noise Figure and Gain Distribution

The noise contributed by the base-band circuits, especially the active channel selection filter,

can dominate the system noise figure. Therefore the noise and gain distribution of the filter

section must be optimized [46]. Suppose the total input referred noise voltage spectral density

of the AGC and the channel selection filter is 50 nV/√Hz after the optimization and the overall

gain and NF of the RF front-end are 40 dB and 6.2 dB respectively, the system noise figure will

be about 7.3 dB. This is about 2.1 dB higher than the expected value given in chapter 3 but is

still a decent number.

It would also be interesting to have a look at a possible gain distribution plan. If the LNA

gain can be switched between 0 and 20 dB according to the input signal level, the AGC pro-

vides 0 to 40 dB gain range and the filter has 20 dB fixed gain, the output signal amplitude at

different input levels is given in Table 7.1.

7.2 Conclusion

In this dissertation the design of a direct-conversion radio receiver for high speed paging is

described. The system architecture and circuit design issues are discussed and a prototype

receiver is built. Our motivations come from the wide acceptance of the new high speed radio

paging protocol FLEX and the successful implementation of the direct-conversion scheme in

the POCSAG paging system. Advantages of direct-conversion are apparent: very high integra-

tion level, less components to tune and possible low complexity and low power consumption.

DC offset is a problem every direct-conversion receiver designer has to face. It can be sim-

ply removed by AC-coupling, just like what is usually done in discrete circuit designs, as long

as the loss of the signal energy is negligible or affordable. This is the scheme applied in the

direct-conversion POCSAG receiver. Because of the upgraded data rate and hence lowered

modulation index, it is not a practical option in the high speed system. To solve this problem,

Table 7.1 Possible gain distribution and signal levels.

Input LevelGain Distribution Output

AmplitudeFront-End AGC Filter

-120 dBm +40 dB +30 dB +20 dB 10 mV

-80 dBm +40 dB +10 dB +20 dB 100 mV

-40 dBm +20 dB −10 dB +20 dB 100 mV

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CHAPTER 7 Future Work and Conclusion 101

the harmonic mixer is proposed to minimize the self-mixing-related offset. About 37.5 dB off-

set cancellation has been achieved and the input-referred offset level is close to the noise level.

More complicated structures are needed to cancel static offset which is caused by device mis-

match. The differential peak alignment method is developed for this purpose. With an accept-

able amount of distortion and attenuation, the output offset level is limited to the rectifier’s

own mismatch and is no more than several mili-volts, which is about the equivalent input off-

set of a simple differential pair. Based on the analysis of the FLEX signal structure, a more sys-

tematic offset cancellation approach is also proposed in this chapter as an option. It is thus a

reasonable assumption that the DC offset can be suppressed to a safe level such that the

demodulation can be done without taking it into consideration.

A high level simulation is carried out to evaluate the performance of the zero-IF zero-cross-

ing (ZIFZCD) demodulator and to derive circuit requirements of the direct-conversion

receiver. The ZIFZCD is designed for demodulating zero-IF digital frequency-modulated sig-

nals. With the zero-crossing interpolation (ZCI) technique, it is capable of processing signals

with low modulation indices. According to the simulation, 1% BER can be achieved at about

13.8 dB ES/N0 ratio if 1-level interpolation is used. That is an improvement of 1.5 dB when

compared to the case of zero interpolation. If all the noise and nonlinearites are lumped to the

RF front-end, a −120 dBm sensitivity can be achieved with about 5.2 dB noise figure. When

deriving appropriate circuit requirements, official specifications on radio paging receivers are

followed and design margins are reserved.

The prototype receiver is fabricated in a 0.35 micron CMOS process. All major building

blocks are included. The LNA and the harmonic mixer are designed by two of my colleagues.

An AGC stage and a gyrator filter are responsible for the base-band amplification and

channel selection. As an option, the rectifier-based offset detector is also added. The AGC has

about 40 dB gain range and very high linearity. However, due to the cross-coupled structure

used in the VGA, its input-referred noise voltage spectral density is about 250 nV/√Hz. This

can be alleviated by a pre-amplifier stage. The main problem of the low pass filter is also high

input-referred noise, which is about 700 nV/√Hz, mainly due to the inherent 6 dB loss of the

LC ladder from which the gyrator filter is derived. An optimization of gain and noise distribu-

tion is necessary to tackle this problem. Other filter structures may also be considered as alter-

natives.

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CHAPTER 7 Future Work and Conclusion 102

The demodulator consists of a 1-level zero-crossing interpolator, decision logics and a

clock recovery loop. Zero-crossings of the I and Q components of the zero-IF signal are

detected and converted to (nominally) positive and negative pulses according to their phase

offset. These pulses are counted and compared by the decision logic circuit to recover the data.

Timing of the demodulator is provided by the clock recovery circuit which detects data transi-

tions by observing the change of pulses’ polarities.

The prototype receiver verified the function of the design at the same time showed us the

ways to further improvements.

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[36] Paul J. Chang, Ahmadreza Rofougaran and Asad A. Abidi, “A CMOS Channel-Select Filter for a Direct-Conversion Wireless Receiver,” IEEE J. Solid-State Circuits, vol. 32, No. 5, pp. 722-729, May 1997.

[37] Yannis P. Tsividis, “Integrated Continuous-Time Filter Design — An Overview,” IEEE J. Solid-State Circuits, vol. 29, No. 3, pp166-176, March, 1994.

[38] K. Yamasaki, et al., “Compact Size Numeric Display Pager with New Receiving System,” NEC Research and Development, vol. 33, No. 1, pp. 73-81, Jan 1992.

[39] F. Krummenacher and N. Joehl, “A 4-MHz CMOS Continuous-Time Filter with On-Chip Automatic Tuning,” IEEE J. Solid-State Circuits, vol. 23, No. 3, pp. 750-758, June 1988.

[40] Arthur B. Williams & Fred J. Taylor, Electronic Filter Design Handbook: LC, Active, and Digital Filters, 2nd edition, New York: McGraw-Hill, 1988.

[41] P.A. Moore, “High-Performance Integrated Audio-Frequency Gyrator Filters,” IEE 1985 Saraga Colloquium on Electronic Filters, pp. 6/1-6, London: IEE, 1985.

[42] M. Bazes, “Two Novel Full Complementary Self-Biased CMOS Differential Amplifiers,” IEEE J. Solid-State Circuits, vol. 26, No. 2, pp. 165-168, Feb., 1991.

[43] Sony Electronics Inc., CXA1994AM/BM M-ary FSK Demodulating Comparator, data sheet, Rev. E96428-TE.

[44] E.K.B. Lee, C. Powell and H. Kwon, “A Novel Wireless Communication Device and Its Synchronization Scheme,” IEEE GLOBECOM’95, vol. 1, pp 659-63, 1995.

[45] B. Razavi, “Design of Monolithic Phase-Locked Loops and Clock Recovery Circuits—A Tutorial,” Monolithic Phase-Locked Loops and Clock Recovery Circuits: Theory and Design, New York: IEEE Press, 1996.

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References 106

[46] A. Rofougaran, et. al., “A Single-Chip 900-MHz Spread-Spectrum Wireless Transceiver in 1-mm CMOS—Part II: Receiver Design,” IEEE J. Solid-State Circuits, Vol. 33, No. 4, pp. 535-547, April 1998.

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APPENDIX ACircuit Details

Detailed schematics of the prototype receiver are included in this appendix in a hierarchical

way. At the top level, there are the AGC loop, the low pass filter, the demodulator with clock

recovery, as well as biasing and buffering circuits. After the introduction of each block, its sub-

circuits will then be given. This process continues until the transistor level or the gate level is

reached. In some cases, parameters of a sub-circuit could be variables for the sake of flexibil-

ity. Real values should then be provided when the sub-circuit is called.

All the schematics are created in the Analog Artist environment while the simulation is

done using HSPICE for higher efficiency. To keep the consistency between the schematic and

the generated netlist, characters “x” and “_” are used to replace the signs “+” and “−” of a dif-

ferential signal. For example, the differential signal in is expressed as the signal pair (inx, in_)

instead of (in+, in−). But the signs are still used in most of the symbol views.

107

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APPENDIX A Circuit Details 108

A.1 The AGC Loop

The schematic of the AGC loop is shown in Figure A.1, the whole structure is the same as

what is described in Section 4.3 except that another differential variable resistor Rin2 is included

for testing purpose. All the components/sub-circuits are listed in Table A.1.

Figure A.1. The AGC loop.

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APPENDIX A Circuit Details 109

A.1.1 The Differential Variable MOS Resistor (DiffRes)

A.1.2 The OPAMP (Opamp1)

Figure A.2. The differential variable MOS resistor.

Figure A.3. The OPAMP.

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APPENDIX A Circuit Details 110

The Common-Mode Feedback Circuit (CMFBa)

The Buffer Used in The CMFB Circuit (Buffer1)

Figure A.4. The CMFB circuit used in the OPAMP.

Figure A.5. The CMFB buffer.

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APPENDIX A Circuit Details 111

A.1.3 The Peak Detector (Rect2)

A.1.4 The Attenuator (LinAmp)

Figure A.6. The negative peak detector.

Figure A.7. The attenuator and the source follower used in the AGC loop.

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APPENDIX A Circuit Details 112

A.2 The Low Pass Filter (Gyt5)

A.2.1 The Gm Cell (Gm)

A.3 Offset Cancellation

Figure A.8. The 5th order gyrator-type elliptic filter.

Figure A.9. The linearized Gm cell.

Figure A.10. A simple offset cancellation method making use of a peak detector and an adder.

+

+

−Rect2

+

+

−Iadd_2

+

input output

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APPENDIX A Circuit Details 113

A.4 The Demodulator

Figure A.11. The demodulator.

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APPENDIX A Circuit Details 114

A.5 Zero-Crossing Interpolators and Pulse Generators

Figure A.12. The zero-crossing interpolator, hard-limiters and zero-crossing pulse generators.

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APPENDIX A Circuit Details 115

A.5.1 The Adder (Iadd_2)

A.5.2 The Limiter (Limiter)

Figure A.13. The adder.

Figure A.14. The limiter.

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APPENDIX A Circuit Details 116

The First 2 Stages of The Limiter: Amp_L1, Amp_L2

The Self-biased Amplifier (AmpS)

Figure A.15. The first 2 stages of the limiter.

Figure A.16. The self-biased amplifier.

(a) Amp_L1 (b) Amp_L1

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APPENDIX A Circuit Details 117

A.5.3 The Zero-Crossing Pulse Generator (PUL_Gen)

Figure A.17. The zero-crossing pulse generator.

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APPENDIX A Circuit Details 118

A.6 Clock Recovery

Figure A.18. The clock recovery block.

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APPENDIX A Circuit Details 119

A.6.1 The Delay Element (CRC_delay)

A.6.2 The Transition Detector (CRC_RS)1

Figure A.19. The delay element.

Figure A.20. The transition detector (the output stage excluded).

1. The output stage excluded.

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APPENDIX A Circuit Details 120

The AC Block of The Transition Detector (CRC_AC)

The AOA Block Of The Transition Detector (CRC_AOA)

The “11” Detector of The Transition Detector (CRC_c2)

Figure A.21. The AC block of the transition detector.

Figure A.22. The AOA block of the transition detector.

Figure A.23. The “11” detector.

Mp: 1/15Mn0: 1/1

others: 1/0.4

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APPENDIX A Circuit Details 121

A.6.3 The Phase Detector (CRC_PD)

A.6.4 The Charge Pump Circuit(CRC_pump)

Figure A.24. The phase detector.

Figure A.25. The charge pump circuit.

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APPENDIX A Circuit Details 122

A.6.5 The VCO (CRC_v2i and CRC_ico)

A.7 The Decision Logic (DEMOD)

Figure A.26. The VCO circuit.

Figure A.27. The decision logic of the demodulator.

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APPENDIX A Circuit Details 123

A.7.1 The Zero-Crossing Counter (Counter)

A.7.2 The Direction Comparator

A.7.3 The speed comparator

Figure A.28. The zero-crossing counter.

Figure A.29. The direction comparator.

Figure A.30. The speed comparator.

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APPENDIX A Circuit Details 124

A.8 Building Blocks Using The Transmission Gate Logic

The transmission gate (TG) logic is used in some of the basic logic gates, flip-flops and multi-

plexors. Schematics and symbols of these building blocks are shown in the following figures.

Figure A.31. Transmission gate based logic gates and their symbols.

Figure A.32. The basic D flip-flop.

Figure A.33. The resetable D flip-flop.

AA X=ABB

AA X=A+BB

AA X=A⊕BB

(a) AND gate (b) OR gate (c) XOR gate

CLK

CLKb

D Q

DFF-0

Qb

CLK

D Q

R-DFF

QbRESET

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APPENDIX A Circuit Details 125

A.9 Biasing Circuits and Buffers

Operation points of the AGC and the low pass filter are set by the threshold voltage referenced

current source, as shown in Figure A.35. The bias current can be tuned by an external resistor

at the RX node. Circuits of the demodulator, i.g. the ZCI, the limiters and the VCO, are biased

separately by a simple circuit which consists of only two gate-drain connected transistors.

Again, the bias current is controlled by an external resistor connected between vp and vn. The

schematic is given in Figure A.36.

All output signals, analog or digital, are buffered before going off chip. The analog buffer is

formed by two source followers and their biasing circuit. The digital buffer is a cascade of two

inverters with increasing driving power.

A.10 List of Components

Table A.1 serves as a complete list of the components used in the design. In the first two col-

umns the parent cell and its components are given. In the third column the sub-circuit name of

the components can be found. A sub-circuit may have one or more parameters to fill in when it

is used as a component. If the component is an MOS transistor, the third column is empty and

there are two types of parameters: the W/L ratio in microns and the element multiplier M.

Figure A.34. The 2 to 1 multiplexor (MUX21) and the 4 to 2 multiplexor (MUX42).

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APPENDIX A Circuit Details 126

Figure A.35. The threshold voltage referenced current source (cell: iRefVth).

Figure A.36. The simple circuit for biasing the demodulator (cell: iRefSimp).

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APPENDIX A Circuit Details 127

Figure A.37. The analog buffer (cell: follow).

Figure A.38. The digital buffer (cell: driver).

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APPENDIX A Circuit Details 128

Table A.1 List of components.

Cell Components Sub-circuit Parameters Notes

AGC

Rin1, Rin2, Rf DiffRes_R=20kΩ, _w=10µm, _l=4µm

linear resistors

OPAMP Opamp1

Rect2 Rect2 peak detector

sh1, sh2 psh _w=10µm, _l=2µm source followers

sh3, sh4 psh _w=10µm, _l=9µm source followers

Gm Gm

LinAmp LinAmp attenuator

Amp_L1

R1, R2 30 kΩ

M1, M2 W/L=10/2, M=10 NMOST

Mn W/L=10/2, M=6 NMOST

Amp_L2

ML1, ML2 W/L=5/15, M=1 NMOST

M1, M2 W/L=10/2, M=8 NMOST

Mn W/L=10/2, M=2 NMOST

AmpS

M1, M3 W/L=3/2, M=1 PMOST

M2, M4 W/L=3/2, M=1 NMOST

M5 W/L=4.8/2, M=2 PMOST

M6 W/L=3/8, M=1 NMOST

Buffer1

Mb W/L=10/2, M=1 PMOST

M1, M2 W/L=4/1, M=1 PMOST

M3, M4 W/L=2/10, M=1 NMOST

CMFBa

abuf1, abuf2 Buffer1

R1, R2 60 kΩ

Mb, Mb0 W/L=10/2, M=1 PMOST

Ma1, Ma2 W/L=10/1, M=1 PMOST

Ma3, Ma4 W/L=5/5, M=1 NMOST

MC0 W/L=3/7.2, M=1 NMOST

CRC

CRC_RS CRC_RS transition detector

DP1, DN1 CRC_delay

CRC_PD CRC_PD phase detector

Pump CRC_pump charge pump

CRC_v2i CRC_v2itransconductor+ current mirror

CRC_ico multi-vibrator

MUX21 MUX21 clock selection

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APPENDIX A Circuit Details 129

CRC_delay see schematic

CRC_ico

C0 10.15 pF

M1, M2 W/L=5/1, M=2 NMOST

M3, M4 W/L=1.6/6.4, M=1 NMOST

M5, M6 W/L=10/2, M=1 NMOST

AmpS AmpS self-biased amplifier

CRC_PD see schematic

CRC_pump

MP W/L=9.2/2, M=1 PMOST

MP1 W/L=1/0.4, M=1 PMOST

MN1 W/L=1/0.4, M=1 NMOST

MN W/L=10/2, M=1 NMOST

CRC_RS see schematic

CRC_v2i

Mbp1, Mbp2 W/L=4/2, M=1 PMOST

M11, M12 W/L=4/4, M=1 PMOST

M21, M22 W/L=2/12, M=1 PMOST

Mn1, Mn2 W/L=4/2, M=1 NMOST

Mbp3 W/L=10/2, M=1 PMOST

M3 W/L=4/4, M=1 PMOST

Mbn W/L=10/2, M=1 NMOST

DEMOD see schematic

DEMOD_PN

add0, add1 Iadd_2

LI0, LQ0, LI1, LQ1 Limiter

PUL0, PUL1 PUL_Gen

Demodulator

DEMOD_PN DEMOD_PN ZCI + pulse generator

CRC CRC clock recovery circuits

DEMOD DEMOD decision logic

DiffResR1, R2 resistance = _R

M1, M2, M3, M4 W/L=_w/_l, M=1 NMOST

driver (digital buffer)

Mp0 W/L=3/0.4, M=2 PMOST

Mp1 W/L=3/0.4, M=10 PMOST

Mn0 W/L=1/0.4, M=2 NMOST

Mn1 W/L=1/0.4, M=10 NMOST

Table A.1 List of components.

Cell Components Sub-circuit Parameters Notes

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APPENDIX A Circuit Details 130

follow (analog buffer)

Mbp1, Mbp2, Mb1, Mb2

W/L=5/1, M=1 PMOST

Mbn W/L=3/1, M=1 NMOST

M1, M2 W/L=5/1, M=4 PMOST

Gm

Mc1, Mc2 W/L=4/4, M=1 PMOST

Mp1, Mp2 W/L=10/1, M=3 PMOST

M11, M12 W/L=10/10, M=1 PMOST

M21, M22 W/L=3/18, M=1 PMOST

MN11, MN12 W/L=10/20, M=1 NMOST

Iadd_2

MBP1, MBP2, MBP3, MBP4

W/L=10/2, M=2 PMOST

M11, M12, M21, M22 W/L=5/2, M=1 PMOST

MN1, MN2 W/L=10/7, M=1 NMOST

Rs1, Rs2 20 kΩ

Rc1, Rc2 20 kΩ

iRefVth

M01, M02 W/L=10/1, M=10 NMOST

M03, M04 W/L=10/2, M=1 PMOST

M1 W/L=5/5, M=1 PMOST

M2, M4 W/L=10/20, M=1 NMOST

M3 W/L=4/4, M=1 PMOST

M5 W/L=10/1, M=3 PMOST

M6 W/L=10/10, M=1 PMOST

M7 W/L=2.4/20, M=1 NMOST

M8 W/L=5/5, M=10 PMOST

Limiter

Amp1 Amp_L1

Amp2 Amp_L2

Amps AmpS

LinAmp

Mp1, Mp2 W/L=10/2, M=1 PMOST

M11, M12 W/L=4/4, M=1 PMOST

M21, M22 W/L=2/14, M=1 PMOST

Mc1, Mc2 W/L=3/12, M=1 NMOST

MN11, MN12 W/L=5/10, M=1 NMOST

Table A.1 List of components.

Cell Components Sub-circuit Parameters Notes

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APPENDIX A Circuit Details 131

Gyt5

C1 54.66 pF

C2, C2_ 7.06 pF

CL2 55.96 pF

C3 85.0 pF

C4, C4_ 19.25 pF

CL4 49.41 pF

C5 49.38 pF

Gm Gm

MUX21 see schematic

MUX42 see schematic

Opamp1

M7, M82, M9 W/L=10/2, M=2 PMOST

M1, M2 W/L=10/2, M=4 PMOST

M3, M4 W/L=10/5, M=1 NMOST

M5, M6 W/L=10/2.5, M=1 NMOST

Rc1, Rc2 6.4 kΩfor compensation

Cc1, Cc2 1.0 pF

CMFBa CMFBa

pshMb W/L=10/2, M=2 PMOST

Mp W/L=_w/_l, M=1 PMOST, VBS=0

PUL_Gen see schematic

Rect2

M1, M18 W/L=10/2, M=2 PMOST

M2, M3, M16, M17 W/L=20/2, M=2 PMOST

M4, M5, M14, M15 W/L=20/2, M=1 NMOST

M6, M9 W/L=5/5, M=1 PMOST

M7, M8, M77, M88, M10, M11, M12, M13

W/L=10/2, M=1 NMOST

Table A.1 List of components.

Cell Components Sub-circuit Parameters Notes

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APPENDIX BBase-band Testing

This appendix provides information on the testing of the base-band circuitry. The pin assign-

ment is first described. A testing circuit is then given with the layout of its printed circuit board

(PCB). The equipments and testing setup used in the measurement are also introduced. And

finally the typical DC operation points are tabulated for reference.

B.1 Pin Assignment

A total of 53 pins are occupied by the base-band circuitry. Among them the last four (50-53)

are bonded to four internal pads which connect the mixer and the AGC. The bonding was done

with the RF front-end sliced off. The name and description of each pin are listed in Table B.1.

Figure B.1. Pin assignment diagram of the base-band circuits.

121

29 49

53

28

AGCI

AGCQ

Bias(iRefVth)

LPFI

LPFQ

OffsetCancel.

OffsetCancel.

Bias(iRefSimp)

MU

X42

MU

X42

Zero

-cro

ssin

gIn

terp

ola

tion

ClockRecoveryMUX21

Deci

sion

clock

50

22

RF

front-endbase-band

133

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APPENDIX B Base-band Testing 134

B.2 The Testing Circuit

Figure B.2 is a suggested testing circuit diagram. All the external resistors and capacitors and

their values are listed in Table B.2. The size of 1206 is used for capacitors and fixed resistors.

A 2-layer printed circuit board is designed for the testing circuit. Figure B.3 shows the layout

of the PCB. On the top side, devices VDD, VDC, CLKEXT, INPUTS, OUTPUTS0,

OUTPUTS1, OUTPUTS2, DIGIOUT0, DIGIOUT1 are all connectors. Notice that the node

Table B.1 Pin assignment of the base-band circuits

Pin Number(s) Pin Name(s) Description

1, 2, 49, 48 vpxi, vp_i, vpxq, vp_qextra input ports to the AGC, for testing purpose only, normally biased at 1.1 V DC voltage.

3, 4 Axi, A_i differential output of the I-channel AGC stage

5, 45 Vrefi, Vrefq AGC reference voltages

6, 44 Vpki, Vpkq external capacitors for AGC peak detectors

7, 8, 43, 42 int_i, inxi, int_q, intxq external capacitors for AGC integrators

9, 19, 32, 41 vdd! 3 V power supply

10, 29, 33, 40 gnd! ground

11, 12, 39, 38 gxq, g_q, gxi, g_i differential outputs of the low pass filters

13, 14, 37, 36 p_q, pxq, p_i, pxi external capacitors for offset cancellation peak detectors

15 SS offset cancellation selection

16 Vrefd reference voltage of the VCO (clock recovery PLL)

17 Vpmp charge pump output

18 Fo clock recovery output

20 CLKExt external clock input

21 SelExt external clock enable

22 Q1 one of the hard-limited ZCI outputs

23 N1 one of the zero-crossing pulse trains

24 S minor adjustment of the speed comparator

25, 26 spd, dir speed and direction output, synchronous

27, 28 Adir, Aspd speed and direction output, asynchronous

30, 31 vn1!, vp1! external biasing resistor

34, 35 o_i, oxi I-channel offset cancellation output

46 bp1! stabilization capacitor for biasing circuit iRefVth

47 Rx external biasing resistor

50, 51, 52, 53 qinx, qin_, iin_, iinx differential I/Q inputs, zero-IF

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APPENDIX B Base-band Testing 135

Figure B.2. The testing circuit.

iinx

iin_

qinx

qin_

Vdc

Rrefa

Rxa1

Cbp1

Rxa2

vdd

Cpkq

Cintq

Cpq+

Cpq−

vdd

Cpki

Cinti

Cpi+

Cpi−

vdd

Rxd1

Rxd2

Rs1

Rs2

Rs3

Rs4

exte

rnal

cloc

k

CL

KE

xtS

elE

xtS S

S

vdd

CLKExtSelExt

VrefdSS

S

Q1

N1

spd

dir

Adi

rA

spd

o_ioxi

pxi

p_i

g_i

gxi

switc

hes

A_iAxi

pxq

p_q

g_q

gxq

CpmpFo

Rpmp1

Rpmp2

Vrefa

Rra

RrefdRrd

Vre

fdV

refa

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APPENDIX B Base-band Testing 136

Va, which is the via close to the connector OUTPUTS0, is the abbreviation of Vrefa, the refer-

ence voltage for both AGCI and AGCQ.

Figure B.3. The PCB designed for the base-band testing circuit. The size is 98.5mm×123.6mm.

(a) The top layer (b) The bottom layer

(c) Devices on the top side (d) Devices on the bottom side

the die

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APPENDIX B Base-band Testing 137

B.3 Testing Setup

Depending on the purpose of the measurement, different signal sources should be used and dif-

ferent signal analyzers may be needed. This section is about the using of testing equipments in

the signal generation and analysis of the base-band testing. All input signals (not the reference

voltages) are biased at 1.1 V DC and all output signals (not the intermediate signals such as

peak detectors’ outputs) are buffered.

B.3.1 Power Supplies, Signal Sources and Analyzers

Besides the 3-V Vdd, a second 1.1-V power supply Vdc is used to bias unused input terminals

such as vpxi, vp_i, vpxq and vp_q.

The major signal sources are two DS345 300MHz synthesized function and arbitrary wave-

form generators. Their signals can be synchronized to each other and the signal phase can be

tuned in a fine resolution. These features make it very easy to simulate the zero-IF I/Q signals

or differential sine waves. Another important feature of this signal generator is the ability to

create arbitrary waveforms. This, together with the phase tuning function (not for an arbitrary

waveform), allows the simulation of an down-converted FSK signal, as will be discussed later.

The SR780 two-channel FFT network analyzer is a versatile equipment which can do a

number of tasks in both the time domain and the frequency domain. Examples are noise and

distortion measurements. It can handle both single-ended and differential signals. Although it

is not designed for digital signal analysis and its maximum frequency is only 102.4 kHz, it can

still be used to capture digital outputs as the data rate here is much lower.

A general purpose two-channel oscilloscope is also necessary for signal monitoring.

In the following several paragraphs, the generation of various input signals using the above

equipments are described.

Table B.2 External components list.

Resistors Variable Resistors Capacitors

Rpmp1 50 kΩ Rpmp2 50 kΩ Cbp1 1 nF

Rs1-Rs4, Rra, Rrd 33 kΩ × 6 Rrefa, Rrefd 20 kΩ × 2 Cinti, Cintq 100 pF × 2

Rxa1 20 kΩ Rxa2 50 kΩ Cpi+, Cpi−, Cpq+, Cpq−, Cpki, Cpkq

10 nF × 6

Rxd1 100 kΩ Rxd2 50 kΩ Cpmp 15 or 22 nF

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APPENDIX B Base-band Testing 138

Differential Signal Generation

As the circuit is designed to be fully balanced, differential input signals are required when

measuring the harmonic distortion performance. Usually only single-ended signals are avail-

able from a signal generator. Some kind of single-to-differential conversion circuit is thus

needed to obtain a differential signal. But an easier way is to synchronize two signal generators

such that their signals are out of phase. Setting these two signals as the X and Y axes of the

oscilloscope, an 135° straight line will be observed when their phase difference is 180°. Thus,

they can be considered as a differential signal.

I/Q Components Generation

The quadrature components of an down-converted sine wave can be simulated similarly except

that the phase difference is 90° and only single-ended signals can be obtained with two genera-

tors. The latter is acceptable in a function verification. On the oscilloscope two quadrature sig-

nals depict a circle.

FSK Signal Generation

To verify the function of the demodulator, two 1.6 or 4.8 kHz sine waves with +90° or −90°

phase differences are enough. However, signals in which symbol transitions are embraced are

necessary to enable the operation of the clock recovery circuit. Such a quadrature signal pair is

shown in Figure B.4. The I-signal is a pure sine wave while the Q-signal is an arbitrary wave-

form which is created using 25 evenly distributed data points in the vector mode. In this mode

additional points, 9 here, can be inserted between every two neighboring data points by linear

interpolation. The total number of data points per cycle is therefore 250. Table B.3 gives the

addresses and values of the 25 data points. At 800 kHz (sampling) frequency, the waveform

repeats at the symbol rate of 3.2 kHz.

The waveforms in Figure B.4 is derived under the assumption that the LO signal is in phase

with the RF input. As the demodulator is non-coherent, the same result will be obtained when

there is a random phase error.

The Chirp Signal Source

The SR780 network analyzer can also be used as a signal source. Its chirp signal has a flat

spectrum and is suitable for measuring the transfer function of a circuit. However, as the chirp

signal contains no DC offset, an additional voltage must be provided to bias the input.

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APPENDIX B Base-band Testing 139

B.3.2 Input Setup

In different types of measurements, different signal sources are required and thus the input ter-

minals should be configured differently. Figure B.5 shows the input setups for 4 types of mea-

surements, where all DC voltage sources are 1.1 V.

Figure B.4. The zero-IF quadrature components of the FSK signal of the “+3−3” symbol series.

Table B.3 Data points of the arbitrary waveform. Frequency = 800 kHz.

Addresses Values Addresses Values Addresses Values

0 0 90 −509 180 986

10 754 100 −1203 190 1577

20 1401 110 −1728 200 1947

30 1852 120 −2011 210 2043

40 2043 130 −2011 220 1852

50 1947 140 −1728 230 1401

60 1577 150 −1203 240 754

70 986 160 −509 249 77

80 257 170 257

Figure B.5. Input setups for different types of measurement. The DC voltage is 1.1V.

−3 +3 −3

I

Q

Data

iin+

iin−

qin−

qin+

iin+

iin−

180° iin+

iin−

Chirp

DS

34

5

220nF

100kΩ

DS

34

5

iin+

iin−

qin−

qin+

DS

34

5

DS

34

5

90°

SR780

(a) Noise (c) Transfer function(b) Gain/distortion (d) Demodulation andclock recovery(I-Channel)(I-Channel)

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APPENDIX B Base-band Testing 140

B.4 Operation Points

Typical DC operation voltages of several testing points at 3 V supply are given in Table B.4.

Table B.4 Typical DC operation points. Vdd=3.0V, Vdc=1.1V.

Voltage Drop over Biasing Resistors

Node Voltages (V) Node Voltages (V)

Rxa1 (20 kΩ) 200 mV Vrefa 0.9Axi, A_i, gxi, g_i, oxi, o_i, gxq, g_q

1.98Rxd1 (100 kΩ) 1 V Vrefd 0.35

Vbp1 2.0

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APPENDIX CList of Publications

[1] Zhiheng Chen, Zhaofeng Zhang and Jack Lau, “A Novel CMOS Digital 4-FSK Demodulator for Direct-Conversion High Speed Radio Paging Receivers,” submitted to the 2001 IEEE Custom Integrated Circuits Conference.

[2] Keqiang Shen, Zhiheng Chen, Jack Lau, Wallace Wong, Frankie Hui, Philip C. H. Chan, Ping K. Ko, “A Three Terminal SOI Gated Varactor for RF Application”, IEEE Trans. Electron Devices, Feb. 2001

[3] Zhaofeng Zhang, Zhiheng Chen and Jack Lau, “A 930 MHz CMOS DC-Offset Free Direct Conversion 4-FSK Receiver,” IEEE International Solid State Circuit Conference, San Francisco, Feb. 2001

[4] Zhiheng Chen, Jack Lau, “Circuit Requirements of a Direct Conversion Paging Receiver,” IEEE Trans. Circuits Syst. II, vol. 46, no. 6, June 1999, pp.802-827.

[5] Wallace Wong, Frankie Hui, Zhiheng Chen, Keqiang Shen, Jack Lau, Philip C. H. Chan, Ping K. Ko, “A Wide Tuning Range Gated Varactor,” IEEE J. Solid-State Circuits, vol. 35, no. 5, May 2000, pp.773-779.

[6] Zhaofeng Zhang, Zhiheng Chen and Jack Lau, “A 900 MHz CMOS Balanced Harmonic Mixer for Direct Conversion Receivers,” the 2000 IEEE Radio and Wireless Conference, Sep. 2000.

[7] Wallace Wong, Frankie Hui, Keqiang Shen, Zhiheng Chen, Jack Lau, Philip C. H. Chan, Ping K. Ko, “A 2 GHz 300 MHz Tuning Range 200 MHz/V Gain Voltage-Controlled Oscillator Using Gated Varactor in 0.35 µm CMOS,” IEEE Symp. VLSI Circuits, June 1999, Kyoto, Japan.

[8] Frankie Hui, Keqiang Shen, Zhiheng Chen, Jack Lau, Margaret Huang, Mansun Chan, Gongjiu Jin, Ping K. Ko, Philip C. H. Chan, “High-Q SOI Gated Varactor for use in RF ICs,” Proc. IEEE Int. SOI Conf., pp 31-32, Oct. 1998.

[9] Zhiheng Chen, Jack Lau, “Direct Conversion for FLEX Paging Receivers — A Feasibility Study,” Digest of IEEE RFIC Symp., pp293-296, June, 1998.

[10] Tony Yeung, Alan Pun, Jack Lau, Zhiheng Chen, Francois J.R. Clement, “Noise Coupling in Heavily and Lightly Doped Substrate from Planar Spiral Inductor,” Proc. IEEE Int. Symp. Circuits Syst., vol.2, pp. 1405-1408, June, 1997.

141