5 kv = 0.5 nm atomic resolution tem image ebpg (electron beam pattern generator) 100 kv = 0.12 nm

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Page 1: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

5 kV = 0.5 nm

Ato

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res

olut

ion

M im

age

EBPG (Electron beam pattern generator)

100 kV = 0.12 nm

SNOM

To locate single molecules:Optical microscopy:-fluorescence (labeling)-particle tagging(-electron microscopy)

http://tnweb.tn.utwente.nl/ot/nfo/nfo.html

Page 7: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Piezoelectric (Voltage – Displacement)

Precise tip control is achieved with Piezoelectrics

Displacement accurate to ± .05 Å

PZT = (Pb,Zr)TiO3

Page 8: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Basic Principles of STM

Electrons tunnel between the tip and sample, a small current I is generated (10 pA to 1 nA).

I proportional to e-2κd, I decreases by a factor of 10 when d is increased by 1 Å.

d ~ 6 Å Bias voltage:mV – V range

Page 9: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Copper Surface

Silicon

Page 10: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Silicium-oppervlak met stappen

(Bron: Sandia Nat.Labs.)

Si(100)

Page 11: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Two Modes of Scanning

Constant Height Mode

Constant Current Mode

Usually, constant current mode is superior.

Page 12: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Instrumental Design Continued

TipsCut platinum – iridium wires

Tungsten wire electrochemically etched

Tungsten sharpened with ion milling

Best tips have a point a few hundred nm wide

Vibration Control

Coiled spring suspension with magnetic damping

Stacked metal plates with dampers between them

Page 13: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Interpreting STM Images

Hydrogen on Gadolinium

“Topography” model good for large scale images, but not for the atomic level.

Electron charge density model more accurate for atomic level images.

Best model requires complex quantum mechanical considerations

Page 14: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Atomic Force microscope(Scanning Force Microscope)

PiezoElectric

positioner

Feedbackelectronics

Laser diodeDeflection detector

Flexible cantilever

Probe tip

display

Page 15: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

AFM Tip

Page 16: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

ylL

z 3 l ~ 100m

L ~ 3 cm

z ~ 1000 y !!!

Detection: beam deflection

Optical lever amplification

Page 17: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Scanning modes

Constant height Constant force

Contact mode Tapping mode

High friction No friction forces

Page 18: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Resolution: scanning probe microscope

object tip geometry image

Tip convolution is not linear: results DO NOT add upResolution is depends on tip AND sample

Page 19: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

Imaging and manipulationof Carbon nanotubes

Page 20: 5 kV = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV = 0.12 nm

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