22 septssbcr 1w4 military standard - everyspec.com

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‘El k!!_lMI L- STD-43W)ml ICE 322 Septssbcr 1W4

MILITARY STANDARD

STANDSSDGENERALREWIREPINTS fC4 ELECISDNIC EMJIPF.EH1

10 ALL HOLDERSOF MI L- STO-454N:

1, THE f~LWINC REM21RESENTS OF lSIL-STD-434fl HAVE 2EEH REVISED ASD sWERSEDE IKE REOUIREKEMTS LISTEO:

KU REOUIREIEWTS OATE SWERSEDEO REQUIREIEWIS OATE

25 22 Ssptcllilsr 1994 23 15 Osccnbcr 19S964 22 Scfm!lfmr 1W4 64 SO Octet-w lW171 22 Ssptcdmr 1996 71 so Jw 1992

7s-1/72-2 22 Ssptsntwr 1994 NEWREMJIRENEHT . . .

2. ktAKE IHE fOLLWING PEN AND INK WAMCES:

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o c.

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h.

1.

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k.

Pose vi, contmts. tablss: In tnble 71-II, delete al fxicaes- fran title.

Rewlr==m 2. IWO 2-1. farafr@ 4.2; Delete WI L-U9fPW22- 4 Wtltu:*ffIL-C-3SW6/22=.

;-_~e .5. Pm7e 5-1, pnragra@ 2: Oelete Ymcummt. urd tititura

RsWir-t 5. PWe 5-1: Delete the headiw . ~ormat ion for nuidawe C.nty.. Srd

~tit-e “5. ~.

Re@rsmcnt 7, page 7.1. pwagrafh L.1: In Iim SIX, insert ‘dspnrturen between .withwt-Md .frce.

RSWir_t 11. PWe 11.3, pOrngra#I 4.S: Oelete WIL-P- 79. iflL-P-W7, If IL-P-15037, )flL-P-\934Ffran the CCC- Iim.

Rsqwirarmw 20, fqa 20-2, tnble 20-1, spec type or class M1607S/2: Oalete the valw forama rms wits of -1OOOW m-d St67atitute .lOOO=.

ReWlremnt 39, fmoe 39-2, paragrafAm 5, 6, and 7: Rerurber as ‘4.1, 4.2. m-d 6.3.:parOgra#m 8, 9, 10. and 1!: Rernmtmsr as ‘5, 5.1, 5.2, ad 5.3=, respsctivelyt

n=wfr== 41, puss 41-1 d 41-3, POrawr~ 2:Oelete ‘-SW from ASTM A29/A2Sn-SS: delete ‘-63. from ASTM A22S/A22W-S3; delete ‘-8-fran ASllf #313-87; &lete ‘-W from ASTM 66S2.79; delete ‘-06= frcn ASTM SAEWW-06:dslete ‘-&$- fr- ASTM B122-S6; delete ‘-90. fran ASTM B139/8139fl-90; delete ‘-SS- frOOASTM B194.S4: delete ‘.SSS fran ASTM B19WS1WU-S2: delete ‘-SW iron ASTM 8197/B197M-S9:dslete ‘-S64- frna ASTM B206-SM; Oeleie ‘-8P frccn ASTM 020644-87; d dslete ‘-SW fmnASTM S522-00.

Rqiramtt 46, pase 46-1, P,oorn#i 2: Delete ~lL-F+ 397.. ond s~titute WI L- ff-9397am.i m fMC.e 46-2, pragr~ 4.3: Oelete WI L- F-92VP ad sduttitute %lL-M-939P.

R+ir*t 50, fmse 50-2, table SO-I: Oelete the I ictirsz for ‘Flmrsscmt I---

a Msc WA lofsPISTRIBU71W SIATEKEw t. woved for fmhli. .aleose; distrihtion is tmlimited.

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MI L- STD-454NNOTICE 3

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Requiranent 52, notice 2, page 52-1, paragra@ 2: Delete C,F- F-300U ard substitute‘ASTM F872,, and on psge 52-2, paragra~ 4.1, sixth Lim: DeLete ,,F- F-300US and substitute‘ASTM F873L) .

Requirement 55, page 55-1, paregra@! 2: De(ete “EIA RS-31 O-C-7?, ad substituteUEIA 277., and on page 55-1, par,qgrs~ 4.4, second [ine: Oe(ete ,,E IA RS-310 -CC, ard

Shtitute l:EIA 277,,,

R@wir=t 66. me ~-l, 9.sraers@ 2: Delete title for MI L+22739 ad substitute WireElectrical, Fluorqwlyner-insulated, co~r or co~r Alloy .,,

(1)

(2)

(3)

(4)

Title for III L-u-25038 should read Wire, Electrical, High Temperature and FireResistant, Aircraft and Flight Critical, General Specification for,,.”

Title for 111L-c-27072 should read ‘,Cab[e, Pouer, Electrical and Special Purpose,Electrical, Wlticonductor,,.

Chanse title for ASTM A580 to ,,Staniard Specification for Stainless and HeatResisting Steel Mire,>.

change title for ASTM B33 to read ,,Standard Specification for Timed soft orArneaied Cowr Uire for Electric Purposes,,.

Retirement 76. mm 76-4. mrawad! .4.2: Oelete ,IIEC-693 -80,0 and substitute ,,1Ec-69311 and on oane76-’3, paragrati ;.i: Oe(ete II I~EE; STD-81211 and substitute IIHIL-STD -21961).

3. llcOEX Of APPLICAT ION DOCWEUTS I I -1. MAKE THE FOLLOUING PEN ANO lllK CHANGES:

Page 11-2, Domment: Delete WIL-F-Q3978S and substitute wIL-U.9397,,.

Page 11-8, Docune. t: Delete O,ASTHD3295 -8111 and substitute ,OASIH 03295”.

Pege 11-8, Ocament: Oelete ,01EC-693 -80,S and substitute II IEC-693}1.

Page 11-S., Docunent: Delete ‘lIEEE 200-1973: and substitute ‘SIEEE 200,S.

Pase 11-1 thrcugh 11-8, lrdex 1: Insert the fol lowing documents in nmber sequence:

Hi I itary stn’bdards Reau i rmm”t

MIL-STO-llW1 FhO)fIL-1-2676S 11, 26

Handbooks

HIL-HDBK-179(ER) 64M[L-HDBK-611 25HIL-HDBK-727 7a

NO” Government documents Reauirem?nt

EIA 277 55IEEE 1029 64ASTM Fl12d 77JEDEC-SID -17 64

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❑ IL-S1O.454MNOTICE 3

~ther Govermrenl dactmmt~

HAVSO P- 3A79 ‘mUAvso P-m71 70O& 4245.7fi 7801-EGOS-SSS1l A4

Page 11-1 through 11-8. lmAcx 1: Delete the followlra doctmsntc:

Mllftow stmd.3r@ F-I r-wI

❑ IL-P.79 11, 26MI L-P-W7 11, 26141L-P-15037 11, 26MI L- P-1S047 11MI L-P-19161 11, 26141L- E- S1512 5t.MIL. STD-480 n

ASTM AW090 71EIA-31 O-C 55IEEE 812-84 76

4. RETAIN THIS NOTICE AND INSERT SEFORE lASLE Of COVIENTS.

5. Holdsrs of MI L- SID-454N will verify thot pose chnmsss urd rditlons itiicoted abve have bsen sntersd.This notice pane mill km resoined os a check sheet. lhia iswmm, together with ~ w@es, 1S as-rate ptblicatim. Ec.cfI mtice is to km retolnsd by stccklm points LMtil the HilitOW StsrdOrd isCmmletely revised or carceled.

COMCLWI NC flAIER [Al

Custodians: Preparing activity:Anw - En Air Force - 10Nsvy - L3Air force - 11 ALlmt :

OLA - ESBevim activities:

AI’W - ~. Av, CR, ME, Ml, PI, TE (Projsct mfto-olsz)Navy - EC, 03, SHAir Force - 17, W, 85, W

Other:OLA - ESfAA

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HIL-SID-L5LNMOT1CE 3

REOUIRE)!EM7 .75

ELECTRICAL PI?sIR

1. &f?92S. lhis rqiremcnt establishes criteria for electrical power.

2. Oocunsnts owl i coble to Rc.aulrsmw 8:

MIL- S1O-2DS Freqmrcies for Electric Power.

MI L- STO-255 Electric voltages. Alternating and Oirsct Currsnt.

MI L- SID-7D4 Aircraft Eisctric Power characteristics.

MI L-SID- 1275 Characteristics of 2.9 Volt DC Electrienl Systcss inmilitary Vehicles.

MIL- SID-13W Interface Stardard for Shl$&ard SVSteau.

HIL-SID- 1539 Elsctricol Power, Direct Currsnt, space vehicleOesign R~ircments.

111L-llOBK-4ff Power and the Enviransftt for Sensitive O@ Electronic Equip’sent.

3. Pe finitims. Not awl icoble.

4. Reauiremcnts.

6.1 ~. Except as spulficd below, the electrical pauer source requirsd for electrmic equipm?ntd associated equipu?nt ad for portions of systcun c@oying electronic equipncm shall bs in accordancewith 141L- STO-2DS ard f!l L-s ID-255.

6.2 ~. The electrical power requirements for airborne ad ossocioted qipnmt shall bs inaccordance with MI L- STD-7D4.

4.3 Shis&ea rd. The electrical fm.er requircuents for shipkaard nnd ossocioted equipnmt shall b inaccordance with type I or type II of scctim 300 of MI L- SIO-l SW.

4.4 ~. The elsctricol pmisr rsquircaents for spnce squipm?nt shall Lm in acco~e withMIL- STD-1S39.

6.5 Crowd vehicles. The electrical power rcquircmnts for rnilitarr wmmd vehictss shall Lm inaccordance with ❑ IL- S1O-127S.

S. Jnform!ticm fo r guidance Cnly.

S.1 Critical fi”cd cwrnm Iclltlm OM m Ioted Outm!atic ditto Proccwim foci litie~. The electrical fmuerrequirements for critical cnnmmicotiom and reloted autnu. tic data processing ~ipnmt should be for aIunitwl -68 V & uninterrtqxible pm!cr SIWIY (n accordance with ftl L-lfOBK-&ll.

o Sqxr5cdesREOUIREltENT 2S15 D.xmt.er 19S39 25-1125.2

REMJIREMEM1 2S22 Sept&r 1994


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!IIL-SID-454MNOTICE 3

UEOtilRE~Nl 64

RICROELECIRWIC DEVICES

1. -. This r~irement establishes criterio for the selection am! c$plicat ion of nicroelectrmicIiOvlce$. These criteria we based on the objectives of ochlwlng technologlcol superiority, qlallty,reliability, and .mintainnbility In ❑llltory 8wtcc8.

2. pacurents amt i cnble to Rewlr .?mmt bb:

ffl L-H-3S534

MIL- I-2S5S5

MI L- SID-7S5 ,

MIL- WD-S32

HIL-SID-975

ftl L.srD- 1547

MIL-SID- 1562

HIL-SID-1686

MI L- ELJL-1D2

lfl L- KoBK-217

AflSIllEEE 1076

5flSlf IEEE 1029

HIL-HDBK-179(ER)

JEDEC-STD-17

ol-Ems-so311

Supsrsc.des

o SEWISEMEN1 U30 D5tnbcr lW1

Hybrid Hicrocircults, General Spccifimtion For.

[ntegroted Circuits (H{crc.circuits) ft.arwfocturiw,Cemrol Specfficotlm For.

Reli~ility Prw!rm for Systems cd EwiPtDwel.7fmem d Prc.d.Jcti On.

Test ffethcds ord Proccdmes for Microelectrmics.

NA3A Stondnrd Elcctrlml, Electronic adEtectrcmechmical Parts List.

Electronic Ports, flmeriola, and Processes for Spacead Loimch vehicles, Technicol s~irem?ntn For.

List of Stamlwd Micra ircuits.

Electrostatic Dischz.rse Cmttrol Prwrum for Protectimof Electrical orrl Elect rcmic Parts. nssablles dEWipzent (ExcluJiw Electrically Initiated ExplosiveOoviccs) .

List of Stordardiztd lfilitary Drauings (S!tDs).

Reliability Predictim of Electronic Eqdipncnt.

VHSIC Harduare Description LnmJuage (VHDLI VHSICInteroperability Sunim-ds. Inc.1- Sfmcificotimtfor the In-b, Elm L8n. Pi b.n, ard VHSIC ElectricalSpecification. (Copies C.vailable frcm Novol ResenrchLaboratory, code 5305, Wash DC 20375-5000).

$faveform ord Vector EIch~e S&mcificc.tlon.

)iicrocircuit A@lcatim IW@mok.

Lmch-up in CffOS In:ewated Circ.lts.

wSIC Ilar&are Dcscriptim Lortwwe (VHOL)Docuccntatim.

6L-1REWIREMEM1 t422 Septcnixr 1994


tll L-sTD-f.5LNNOT1CE 3

3. Definitions.

3.1 Microelectronic devices. Ronol ithic, hybrid, rf and micro.ave (h@rid/integrated circuits, uulti chipmicrocircuits, and microcircuit md.les.

3.2 Advanced microcircuit module technology Microcircuit rrcdule fabrication and design technology nhichis ne’dly a.ai IabLe for prototyps designs and w; II be avai Iable for prcducti.a” i“ the mar future (2 to 5years). For digital microcircuits, the performance capabi 1ity can be approximately characterized by theminimm feature size, the ct.acking frequency, and the functional thr.aughWt rate.

3.3 VHSIC hardware descrimicm language (VHDL~. A high level ccmpter Ia”g.age developed tinder he VHSICprogram for describing the signal structure of e(ectr.a”ic hardwre (chips, mcdules., and wbsyscems). Thelmgu.ge describes the sigml flow and the structure of the device in terms of the basic circuit Qwdels,fundamental Logic blocks, and higher level functional ass~lies of logic blocks.

3.6 Oua(if ied device (microcircuit]. Any device or microcircuit nhich has ma the requirements of141L- N-3.S534, or MI L-1-38535 and is listed on the associated 014LfOPL (isti.gs.

3.5 Uaveform and vector excha.qe SDe. ificat ion (WAVES). A high level cmputer language for describingtest vector and Waveform Stinuti for electronic hardware (chips, macbdes, ad subsystems). The WAVES is

ccwatible mith the VHOL simulation language and simiatio” enviromnents..

3.6 Awlicat ion specific integrates circuit (AS IC). Any microcircuit that is c.stein designed w .s”y

pr.w~ble micr.. irc.it (e.9. EpRcu. EEpRW. WEPRW, PLA, PLD, sate array, sea of gates, standard cet L( ibrary, etc. ) that is programnea or personalized to perform a sp+cif ic equipment or cust.an function.

3.7 ~. Very high speed integrated circuit.

6. Retirements.

6.1 Se Lecti.a”.

4.1.1 Techno(oqy. At each stage in neu ard re-engineered system designs, i.e., concept studies,demonstration and val idati o”, and engineering and mnrmfactwing deve(opmmt, the advanced microcircuitmodu(e technologies which meet rel iabi I ity, P.wf.arma”ce, ad cost requirements of the appt icat ion shal I beevaluated for use in the production phase.

6.1.2 Retiabi[iw. Microetectr.a”ic devices in military system which are i“ engineering andmanufacturing development and production shal 1, as a mininun, conform to the applicable product r.ss”rance(e”e( Of MI L-H-38536 0, MI L-I-38535.

6.1.3 Order of Precedence. Un[ess otherwise specified, the order of precedence sha[ L be as fol low:This requiremmt shal 1 be superseded upon @l i cation and DcO/lnd.stry f.1 Iy coordinated acceptance of theproposed DCCIMicrocircuit Appi i cation Handbook c.. Stanjard. This docunent wi I I provide guidance on how theD.XI and its contractors ca” select devices based m cost effective per fornwce, designed in high quality,r.rd reliability for a give” applic.sti cm.

a.

b.

c.

Microcircuits listed i“ table I of MI L-sTD -1562. Microcircuits with dated mi 1itaryspecifications, fully cqliant to the QML (M IL-N-38535 and HIL. H-38534).

Microcircuits Listed in table II of MI L-sTD -1562. Microcircuits ccmpl icmt to the standardMi I itary Drauing Program, and other MI L-H-38536 C?xrpli ant microcircuits “ot I isted i“tnbles 1 e.rd 11 of HIL-sTD -1562.

Other microcircuits (see 4.1.5), subject to acquiring activity approval.

REQUIREMENT6422 Septenber IW4 64-2

SupersedesREQUIREMENT 6430 October lW1 ●


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MIL. SID-4SLNNOT1CE 3

4.1.4 OWalifisddo vices. Mttcn the cmtroct or prchase order for mu dssigns, or rcde5im, or psrtlevel, or qualifisd port mrcda of ❑4ilitory IWduore Spscifi - the use of a fll L-STD-.SS3 class B or S❑icrocircuit, and there Is o q.mlificd dwico of the rewircd E.?nsric chip ard pock.we type or case outlim,the WIiflsd dsviee shall Lm the preferrul dwice authorized In thot denim.

4.1.4.1 $mce Owlic atims. WIm qualified devices ore mt ovoiloble or cannot be cp.mlified by themrufc-cturer, the r~irac+mt of ffl L- STD-W5 or II IL- STO-1547 shall OF+. IY.

4.1.4.2 Qthur nmlicoti cum. kl!m o qualiflsd device .$MS not exist nrsf o 31CJdsvice of tho rswlrsdiwnsric chip ond fmckogo typ or case cutlins doss exist, the SKI dwlce shell ke the preferred dsviceauthorized for thnt desisn.

4.1.5 Other nlcrotircult6. for other thm q.ml if Isd do.less, the follwinn inforcmim shall ka Imlukdin the nmsm.mford FOrt nf.pmval retpmst (excspt here idmtificatlm of a ❑ilitary &toll spscificatim or3ft0 rarber satisfies this requircamt or other dircctim is givm):

a. Oevice —Ioture, unrklfu, cmfiwration. fmttiortnl r~irm?ms, porcemters sndIiaits suf f icism to Insure the rsqvirsd form fwsctims orsl interchameabil iw.

b. RSWirSd SWirMYMtaI. enchtrmce (life) and other design ccqmbility tests.

c. GuOlity ossurnme rtqirmsnts, incluJitu scroenins ad lot qdality cmfonmnce(occeptc+tte) tests. As o ❑inima, devices $holl be pmcursd to all the rq.dremnts ofHIL-S1O-SS3 pOragrt@I 1.2.1. The q@{cable dstoil spscificotlon, WD orverdOr/contractor daunsm shol I km spccif isd for electrical perfor-umce, mschsnical, ardfinnl elsstricol test rWirmem9.

d. m evaluation of the Projectd availability and prtit ossurmce status of the device atthe tiua of productim cd through the wolec ted life of the system

●. Device dcsi.an @ tsst docuusntatlon in the VHDL amf WAVES forcnt (sss 4.5.3 srd 4.5.4).

4.1.6 El trmtotic W1-tsiti e mwta lficrocircuits ore susceptible to electrostatic discharge (E3D)

-90. lsi~oci;cuit wsccpti; ility i; classified in RIL-SID- 12.% ard t-t wthcd 3015 of HIL-S1O-SS3.li?ten dwim susceptibility is not ovailoble, it cm be doteminsd using test cmthcd 3015 or appemlix 8 of❑IL-STD-lbSb. fficroctrcuits frm tho ESOS Ctoss nucm.sary to met ES3 requiremms shall ba selected. EE3susceptibility of ❑icrc.circuits oro listed in the asmciotsd QffL/OPL listin17s of ffl L- H-3S534 or ffl L-1-30335for the itiivifhml devices.

4.1.7 )archtm tes(. Latcht@ test ins shol I bs Perfo- m sF@icable techmtosiss (i. e., SPAYS)perJEOEC-S1O-17 as a ninim.m

4.2 Prowumable dwlces. Use of p$ogrurmble devices, r.?pardlem of type, rqires wroval of theprocuring activity.

L.3 Fusible link devices. bhsn fusible link dsvicss (PRC+fs, PAL8, PLOS, etc. ) are prOQrescEd by theuser, parumstric and fmctimc!l elsctricnl tssts in accordance nith MI L- STO-SS3, nnthcd 5003, grcup A,SUWWU 7 A ~ 0S 0 ❑ini-, *011 h PCrfOI_MCd Oft Or FWOSr_l IW to v@rifY the specific fxo.aranconfisuratim at-d effectiveness of link ftuins.

4.4 ~. Micrc.zircuit devices used in CWipn?m shall ~ herwticnlly scaled in 910ss, MS1OI orceremic (or c~imtims of these) packages. NO orgmic or FOlW8WiC tumeriots such as Incq.!srs, varnishes,cmtinss, or smoses shall b used imids the ❑icrocircuit pnckose, unless otheruise specified. NOdesiccants sholi be cmtained in the ❑icrocircuit pnckose, mless otherwise specified. Orgmic or palwsricmaterials (e.g. cdnesivas) cowlimt to MI L- STD-S2.3, test mmhod 5011, ore Prmitts.d insids the microcircuitpckage uhen specified in the o$prc+wioto .Ilitory spccifi cotion or ~.

Sqersedes

o REMJIREPEN1 6430 Octeber lW1 b4.3

REWIREKENT 6L22 Ssptar 1W4


MI L- STD-454NNOT1CE 3

4.4.1 Use of plastic encapsulated microcircuits. upon specific request and awr.aval by the pr.acur ingact ivity to waive the requirenmnts of 4.1, plastic .mcapsu[ate.d microcircuits may’ be considered for .s. inground fixed (GF) or ground benign (GB) ●nvimnnents as defined in MI L- HD8K-217. They should meet a( ( the

r~i~~nts Of the Wuiwnt %wcif i cation. Tewerat.re mtd humidity shal I ix ccwlete(y controlled intrenslt, storage, and awlicati.a”. This requirement sha( I be wpersedea ~“ @Licat ion end DcOjlndustryfu( (y eo.ardi”ated mceptance of the proposed D& Microcircuit Appl icatio” Handbook or standard. For Amyaw( i cat ions, use of )11L- HDBK-179(ER) is rerxmnendd.

6.5 Device desiq” end test d.awnmtati on.

6.5.1 ASIC docunentatio” i“ VHDL. Digita( Awlicat ion-specific integrated circuits (ASICS) sha(l bedocm”ted by rmam of struct.ra( end behavioral VHSIC hwdwre description language (VHDL) descriptions i“accordance With ANSI IIEEE 1076, (see 5.6). Behaviorn[ VHDL descriptions shall .incl tie functi.m and timingat the pmt. accurate enough to enable the psrforma”ce of test Seneraticm and determination of fau(tdete. tionl fault is.alatim levels at the integrated circuits pins when performing board w subsystemsimulations.

4.5.2 Fauit coveraqe. for al 1 digital nicr.acircu its, fau(t coverage shr. ( ( be documented i“ accordamewith HIL-STD-8E3 test m?thcd 5012 for a[[ manufactwing-[evel logic tests.

4.5.3 Qualified device d.acune”tatio” in VHDL. Digita[ qualified devices used in board 10wL awlic.atiomshal 1 be documented by means of behavioral VHDL descriptions i“ accordance uith ANSI -IEEE 1076, (see 5.6).Behavioral VHDL descriptions sha(l include funcrim” and timing at the port accurate enough to perform test9enerat ion and determine fau(t detect i.nrfault iso(at ian levels at the integrated circuit pins.

4.5.4 ASIC test stinuti docunenrat ion i“ UAVES. Digital ASICS shall have .s11 test vectors and testwaveforms dc-ame.ted and delivered to the Govewm,e.t i“ the UAVES format.

4.6 Cost considerations. !licro electronic devices shall be selectd on the basis of overal( life cyclecost

5. Information for guidance o“[y.

5.1 Techno( c.qv Dro9ress ion. The use of advanced rnicrocirc.ir technology shoutd be considered amievaluated i“ the design of all systems jequipmmt. For critica[ weapon systems awticat ions, and for systemdevelopne”t schedules projected to be longer than fow years, the per forrra”ce dw.ntages provided byadvanced techno(.agies should be evaluated early in the system development @ases for use in the procurementstage.

5.2 Reliability.

5.2.1 Reliability Dredict ion. men required, microcirmit reliability predicri.m shm[d be prepared inaccordance with I! IL- HDBK-217, or uith pr.acuri”g activity awrova( by using specific test andlor field ratedsts.

5.2.2 Rekiabi[ity assurance. A plan shw[d be i“ p[ace to assure that microelectronic devices meet therel iabi Iity requirement of paragraph 4.1.2 m the time of engimering and man. factwing development. Thisplan shcm(d provide for resubmission of parts 1ist, if so invoked by contract, through DESC/HPCAG prior toprocurerrent of parts to be used in actual producticm ro assure the.t all evaluations are based o“ the mostrecent standard izmion status.

5.3 Microcircuit obsolescence. Due to rapid techm[ogy admnces, rra”y rni [ itary and cmmerc inkmicrocircuits I isted i“ specifications ONI catalogs are either obwtete w are nearing obsolescence. Theuse of these devices wi I I affect the mission objectives of the using equipnr. For Navy equipmmt, currentin fomtim on micrmircuits that my be nearing .absotesceme may be obtained frm the Naval Air UarfareCenter, Code L35, Indiannpdis, IN C.621Q-2189, te[e#mne (317) 353-3767.

I REQUIREMENT6422 Sept.zmt.er 1W4 64-4

SupersedesREQu1REMENT6430 October 1991 ●


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HIL-STD-654UNOTICE 3

5.4 Jesrobili~. NSU cd ~rsdcd system shmld exploit chip level LmIiIt-in-test features to erdmncethe testability cd operatimol availability of the mx%ule w system. Uhen ndvnnced digital mG&lss orboards are de.elcped, rnicrccircuits incorproting the E1lf-mls or TN-BUS should be used.

5.5 Life cvcle cost evpluntim. The follouiw fmtors should be rmnsidersd In sstitcating life cvclecusts asmciatcd uith selsctim of ❑icrocircuit devices or tschnologiss:

e. Effect of Luilr. in-test m rcpnir, mintoinability, Operat iawl nvoilnbility. nndrecmfigurability.

b. value of VHOL descriptions of chips. -lea, ond tonrds in resLwly, mltiple source128velc+=erlr, m-d design Upgrode.

5.6 ASIC & UTlm; ntim refercl-lc~. Oota item description, 01. ECOS-WS1l provides the dacuncntatimWwmratirn * aliverY inStrIK1i _ for ASIC docwentotim.

o SupersedesREWIRCfIH1 6A22 Ssptsu2xr 1W4 $4-5

REWIRE)EENT 6430 Octc&r lW1


. .

111L- STD-45bNMOT[ CE 3

REOUIREHENT 71

CA2LE MM wIRE, INTERCONNECTION

1. ~. This r~imment establishes criteria for the selectlrn and aF@lcatim of electric cableand nire used for Intercc+-mectlon bctwsn ~its.

2. poctmems ad icoble to Rewlrm!em 71:

m-w-so

NIL-C-17

fft L-ii-76

lfl L-C-442

f!l L- C-S432

HIL-u-50&

MI L-u-5246

HIL-C-707S

o

fll L-U-EW77

lfl L-C-13777

M[L-U-1~72

MI L-U-19150

MI L-C-19S47

MI L-U.227SV

fllL-C-2.S437

)IIL-c-24U0

t41L-u-25022

lfl L-C-27072

PIIL-C-27SO0

MIL-C.5S021

Wm. Electrical, C-r Wninsulatsd).

Cobles, Rodio Frequsncr. flexible mid SerJ. Rioid, Generals~ificotim For.

Wire ad Cable, Hmkt+, Electrical, Insulated, GsnaralSpecificailon For.

Cable, Uire, Tw Ccductor, Parallel.

coblss, (Poner sd Spcclal purpose) and Wire, Electrical (3Wal-d 600 volts).

wire, Elsctric, Polwinyl chloride Imulated, c-r or CqIerAlloy.

wire, Electrical, Chrcmsl d Aluacl, lher.mco@e.

Cnble, Electrlc, Aerospace Vehicte, General Spuiflcetim for.

wire, Electrical, Silicam- lnsulc. ted, C-r, 600 Volt. 200”C.

Cable, Specie.1 Purpose. Eleccricol, Ccrdstors, GmcralSpssificatim For.

uire, Electrical, [nsuloted, General Speclficatim For.

Wire, Ins.lat cd, Hard Orcdm C-r.

Ctile, Electrical, Special Purpme, Shore Use.

Wire, Electrical, fluorapolymw- lns.loted. Ce$fmr or c-rAlloy.

Cable, S@cinl Purpose, Electrical.

Cable, Elsctricol, L19htwiL!ht for Shirbamd Use. GsneralSpuificatim for.

Uim. Electrical, Hi@! Tsmpsrature & Fire Resiatmt, Gmsralspecification for.

Ctile, Pm-w, Electrical and Cable, Special Purpem, Elcctrlcol.KtAticqtor ad Sir@e Shit.lded, Generat Spccificatim for.

Cable, Potter, Eloclr ical I@ Coble Spscial FurpQm, Electrical,Shielded ord Vnshlelded, Gsmr.1 Speciflcatlm for.

Csble, Etsctricol. 2hialded Simles. Shieltkd srd Jacketsdsinsles, Iuistsd Pairs md Triples, Internal HOOkI+, GeneralSpuiflcotim for.

a EqxrsedesREwIRENEILT 7130 Jwm 1W2 71-1

RES121RENEN17122 Septer 1W4


. .

HIL-!J-81OL6

HIL-u-81381

HS25471

w27110

A8TI! A580

ASTM-B33

3. Definitions.

RI L- STD-L54NNOTICE 3

Uire, E(ectric, Cross li”k.?d P.a(yalkene, Cross.l inked A(kane-irnidePolymer, or Poly.wylene Imu(ated, Cqpr or Cqper ALIw

Uire, EL.?ctric, Polyitmi de-lnsuL ated, Copper or c.awer Alloy.

Uire, Electrical, Silicone I.su( ated, copper, 600 volt, ZOO-C,Polyester Jacket.

Uire, Electrical, Si(icme [mukated, Copper, 600 Volt, 200 SC,FEP Jacket.

Stardard specification for Stainless end Heat Resistant SteelUire.

Standard Specification for Tinned Soft or Annea Led copper Wirefor Eiectrica( Purposes.

3.1 lnterc.nnectin9 wire. [m. tated, single-c.arductor wire used to carry eLectric current between units.

3.2 Interconnecting cable. TWO or more imdated conductors contained in a c-n covering or cme mmore insu[ ated conductors with a gross metallic shield outer conductor used to carry electrical cmrentbetueen tmi ts.

4. Rmuiremnts.

4.1 wire setect ion. Selection of wire for imereonnect ion between units shal 1 be in nccordmce “ithtable 71-I.

4.2 Hultic.mdwt.ar cable setectim. selection of nulti conductor cable for interconnection betwen unitsshalt be in accordance .ith table 71-11.

L.3 Armlicati.m restrict ims.

a.

b.

c.

d.

e.

f.

HIL-U-76 shaLl be med for Amy applimtim onty (see 4.3.3).

hlIL-U- 16878 shal I mat be used for Air Force or N.w nerospace a~licat ions.

Cable or wire with polyvinyl chloride insulation shaL( not b used in aerospaceapplications. Use of these Mires m cables in my other aw( icotim requires priorapprovai of the procuring activity.

141L-U-22739 Wire with only sing[e ~[ytetraf luoroethy[ene insulation used i“ Air Forcespace ad missi Ie appi imtims shal I mqui.e the awrova L of the procuring e.cti,vity.

Use of alminm wire requires specific approval by the procuring activity.

Silver plated Cowr Mire shal( mat be used in aWiicatims involving Amy inissilesystem.

5. Information for auidance onty.

5.1 Rf sima[s. All interconnecting cables carrying rf sisnals should be coaxial cables or uaveguidesand should be tennimted, tien pmsible, i“ the characteristic irpedmm of the trmmitting media.

REQu1REMENT 7122 September 1W4 71-2

SupersedesREQLJ1REUEIIT 71 ●30 Jtms 1W2


141L. SID-454NNO1l EE 3

- 1:

(5

SwrsedeiEEOUIREHENT 7130 Jtme 1W2 71.1

>

>

REGIJIREMENT7122 Sem-r 19?4


TA

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E71

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00

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,11

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mu

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600

HW

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/15

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125

1000

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0

nm

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IA,

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30

00

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u

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18

105

1000

See

foo

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do

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.


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-I.

Uir

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.

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oo

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lM72

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US

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UIA

.10

00

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SA

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suso

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A

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130.

$/26

0~

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ca

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2701

29m

o

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878/

30C

UIA

Sn

Str

615

0

M16

W2/

3110

00

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s721

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U20

0

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270/

33C

UJA

,CW

‘MS

,str

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640

mlt

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34C

ulA

AU

Str

3820

010

00

M16

07W

3SH

i26

0

IIL

-U-1

9150

wir

e,C

WH

2A8

insu

late

d,

har

d-d

rmm

c-r


,.

REQUIREHENT 7122 Septmt.er 1994 71-6

Supersedes

REOUlREHENT 7130 June 1992


@o

IAS

LE

71.

[.ti

e.et

ectr

fcal

.ln

terc

mtf

~-

Cm

tiru

sd.

Co

nst

ruct

im

CO

@.4

ct0r

~lm

ula

tlm

~M

ax

Spec

m.

cdM

axSp

scty

pe

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mar

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itle

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.xl

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ass

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ter

ial

coat

irm

T*

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yco

ver

t~n

at“c

volt

sR

nn

wks

411-

U-2

2739

Uir

e,nz

2n91

\bC

uJA

[cm

td)

Sn18

elec

tric

al,

150

600

Lish

tw

isht

fluor

ofm

l~r

n22n

9\\7

IISA

Agkd

imei

ght

-Ins

”tat

ed,

cwr

orm

22n9

mCU

IASn

LiE

fIt

uel

gh

t

c-r

allo

ym

22n9

/19

kgL

ish

tw

sifi

t

fi22n

9f20

200

100a

u22n

9f2

IH3

Au

i3A

260

❑22

nvf

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2U0

r422

n9n3

Ni

260

m22

nv12

8CU

IAhg

Str

200

H227

3912

9!ii

3A7s

2M

)(227

39/3

0HS

AAg

200

n22n

9f3

IIII

m2n

9n2

CUIA

Sn15

060

0

f422

n9f3

3H

SA

A9

200

m22

n9w

CUIA

Sn15

0

n22n

9f35

HSA

M20

20

u22n

914

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IANi

u22n

9i42

HS

A20

0

u22n

9143

CUIA

A9

See

fmtn

ote

sat

sfd

of

tab

le.

,,,.

.


TA

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E71

-[.

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on

tin

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.

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ale.


. .

MI L- SID-454NNOTICE 3

TABLE 71-1. Uire. electrical. interconnection - Continued.

NOTES:

Conductor Cede Descrim i mmterial CUIA Comer. annealed

CU;H ‘Copper, hard-dramCcu CoFr covered steelHSA High strength copper alloyAl Atminm

Coat ing S. Tin

AU Silverfli Nicket

Tyw s Sok idSt, St rmded

ZI lnsuLnt iOn Code Description

REWI REMENT 7122 Septenber IW4

12A2s2C3A383C3D4A4B567A7s89A9s10111213A13B14151617181920

PoLyvinyl chloridelextrudedPolyethylenelext rudedPolya I kenelcmss - 1inked ext mdedPolyethyl enelcross- linkedlfncdi fiedle.xtrudedPolytet rafluoroethyle”elext rtiti (TFE Teflon)Polytetraf l”oroethylene/ta~Polytetraf (uoroethyle”e/mineral f i 1led/ex. trtiedPo[ytetraf luoroethyle”e iWregmted g(ass typeFluorinated-ethylene propylenelextrcded (FEP Teflon)Ftuorir!ated-ethy lene propyleneldi spers ionUonochLorotri fLuoroethy[ ene/extrtid (Ke(-F)Si Licone rutberlextrtiedFEPlpolyirnide f i Lm (Kapton)Polymide lacquer (Pure lfL )Pcdymide/extmder (fiyton)Polwinylidene fl.oridelextruded (Kynar)Potywinylidene f t.oridelextrddlcross- 1inkedSraid/synthetic yamilacquer impregnatedSraid/ny[onli Wreg”at4Braid/ply esterliWregnatdSraidlglass fiber~itrpregmted8raid/TFE coated glms fiber/TFE finishBrr, idlasbestoslTFE impregnatedBraid, b’cave or .arpli..argmic fiberALkane-imide wlmr/extrd4/cross- linkdModified emmtic po[yimideEthylene- tetraf Luoroethyl ene/extrudsd (TefzeL)Pol yary~enelext rudedCrms-linked, extrded, modified ethylene- totraflucmwthyle”e

~1 Uhen specified o“ purchase order,

$/ Wire intended for use in electrmic equipnmt hook-up e#imtiom. It my OISO be used s.san interconnecting wire when m additional jacket or other mechanical protection is provided.

v Various ccabinations of primary, primry cover, cd jacket insulations and unshielded,shie(ded, etc, constructions are ❑vai Iable to m?et eW(icat ion requirenmts. See detai I wirespecification.

71-10

SupersedesREWIREMENT 71

●30 J- 1W2


MI L-STD-654MM071LE3

stmersedesREiiWS2i(ENT 7130 Jwm 1W2 71-11

RE@JlsEl(ENl 7122 Sept5ter 1?94


MI L-sm-f.51.NNOT1CE 3

supersedesREOUIREHENT 7122 September 1W4

REQUIREMENT 7171-12 30 Jme 1W2


‘e

o

a

UIL-STD-454NNOTICE 3

Supers*REWIREI!2W 7130 Juno 1W2 71-13

REM21REMEN17122 !$epterber 1W4


TA

BL

E71

-11.

Cab

Le.

W(t

ico

rdu

cto

r.in

terc

on

nec

tio

n-

con

tin

ued

*c.

no

.

41L

-C-

2730

0

IllL

-C.

5502

1

Tit

le

Cab

[e,

po

wer

,el

ectr

ical

and

cab

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tp

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se,

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ield

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eria

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atin

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ater

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ype

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ed

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ener

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ace

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atio

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ed

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260”

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rious

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ated

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lass

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m

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us

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ou

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rud

ed

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i0.s

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ario

us

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2-3

600

rO-4

0SC

No

ne

or

Tin

,90

No

ne

I687

a10

00E

xtru

ded

to+1

05”C

Co

wr

silv

ero

rP

vc,

0,-6

5‘C

Nic

ke(

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on

to+2

00”C

TF

E-T

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nea

tru

ded

or

tap

e

See

foo

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tes

ater

ao

fta

bke

.


l.-

MI L-sTo.b54MNOTICE 3

lASLE 71-11. $ab\e. nult!cc+vktor. intermfmect Ion - Ccmtirued.

fLUTES:sea Wiic*ledetOil cpecificatim sheet !or.rateric.ls cmtrol of specific cablecanf igurat ions.

See ~licble datoil speciflcotim sheet for tcaperature Ilmltatlons.

Polyester: PolvetfIyltne tere$hthalateTFE-teflm: Polytetrof luoroethylemm: Polyvinyl chloride (mt to km used in alrkarm *licatims)2EL-F: Pol~hlorotriblmrwthyl-FEP-teflOn: Fltmrlmted ethylene prOF@emWF : P01vvir@!d4n0 fluoride

Althou@! the specificmim d!x$ mt limit the nmbcr of cmd.ictors in e cnbl.?, the Size,witit, d flexibility are determining foctors.

wai(cble in three clc.ss{ficatims:

class L: light duty: TO .ithstmd severe flexlrm and fr.?rwem mniwlatim.

Class M: !kdiun *w: To withstc.rd severe flexlr’a ard nechattical akwse.

Class H: Heavy duty: 10 withstand severe f leaiw ad ncchmical oLmm ad obil itY to uithstordsevere cm-vice IUSIC.C!Ssuch os to km m over by treks or trucks.

Sea a@ Icc.ble detail SFQCif icot im sheet for mchnnicol test requirements for cold bend,cold bed torque, iuwIct bend. ad twist.

for use trder tie nechmicol cditims end where resistmce to umber, oil ad momare requirements.

o SqersedesREO121REI(ENT7130 Juna 1W2 71-15

REM21REIIENT 7122 Sept-r 1994


fll L-sTD-45bMU071CE 3

REWIREftENl 72

PRtOUCIBILIIY

1. m.m!sfl. This requlranent offers ouideme es to prcdxibllity requirements *ich shodd be ccits.idcred*M preparing contractual *um2nts. lt dces m{ establish requirements, and -t mt be referenmtd inemtrattualdccu?entc.Prtiibility program talks, qantitatlve re@ronents, ad verification or~trntico requirements mat km directly speclficd In the cmtroct or the $Ystem and/Or cquikmentspecification, 0s mapri ata.

2. Pocu-nents EL911 cobl e to ReQUIrcmettt ~:

Da 4245.7u lrnnsition frcm Development to Pr*tiOn.

NAvso P-3679 Prdxibil Ity Ifeasurtumt Guldellnea.

fiAvso P-6071 nest Practices.

MIL-lm8K-n7 OesiW Guidance for Prcd.cibility.

3. pefinitionq. Not I@icrlble.

4. Rec-.Jirements.. Not [email protected](e.

s. Jnfommt ion for mlidancfl only.

5.1 Pr d!cibilitv Droarwq. Pro@cibility ertgiM8rinE ond plom?ing tosks aimed ot presetting, detecti!w,ad correcting cmufacturabllity dmiw deflclenciea ord providi~ Prcducibillty related inf.mmt ianessmt ial to ecwis itim, operatim, aml s~rt umnascamt shculd t8 i~ltdect in cmtroct rqirmmts withthe objective of establishlnE ad nnintoinlng m efficient prtiibility progrmn occordiw to proerma @aSe.flAvSO P-3679 is the overal I prosrmn dom.tmnt for the s~ject. The ticessful creation and memasc!m?nt of apraducibltity progrmn is d.atoi Ied in Section 2.

5.2 Prc&c ibility mmmurtmwtl. Pra&sibility ueosurtucnt and osacssment too18 are a critical part ofinsuritts a p+--t is reedy for Pr-ticn. Secticns 3 cd 4 of NAVSOP.367P give tuo irw$.mtry exanples ofKs?c.sur-t and as%essuent tools.

5.3 Owntitative retiwiremente. Quantitative producibility rwirarents ard verification or dcnuntrattmreWir~ts sfmuld be este.bl i shed as ~cpriate tO WWr~ @IOSe. Prcdcibi I i ty ncasurement is emessential part of the design process uf!ish can demmmirn the probability of successfu( Pr-tim. !4inimaltailoring shmld ke recwi red #ten flAVSO P-3d7P is aRIl ied to a pro.arsda. Other protkcibility dacwn?nts b+lichuay km cited directly as n &sic for contract rqirtnnws Inclda O@ 4245.7M, NAVSO P-6071, adMIL-H08K.727.

o ml 76-1/72.2REEUI REflEu1 7222 Sept*r 1P94


22 septssbcr 1w4 military standard - everyspec.com

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