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FLUKA Rechnungen für das FLUKA Rechnungen für das CBM Experiment an FAIRCBM Experiment an FAIR

Anna SengerFAIR@GSI, CBM Detektoren

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OutlookOutlook

• FLUKA tool and radiation environment predictions

• The CBM experiment

• FLUKA calculations for the CBM detector

development

• Conclusions• FLUKA

– "The FLUKA code: Description and benchmarking" G. Battistoni, S. Muraro, P.R. Sala, F. Cerutti, A. Ferrari, S. Roesler, A. Fasso`, J. Ranft, Proceedings of the Hadronic Shower Simulation Workshop 2006, Fermilab 6--8 September 2006, M. Albrow, R. Raja eds., AIP Conference Proceeding 896, 31-49, (2007)

– "FLUKA: a multi-particle transport code" A. Fasso`, A. Ferrari, J. Ranft, and P.R. Sala, CERN-2005-10 (2005), INFN/TC_05/11, SLAC-R-773

• FLAIR– V.Vlachoudis "FLAIR: A Powerful But User Friendly Graphical Interface For FLUKA“ Proc. Int. Conf. on Mathematics, Computational

Methods & Reactor Physics (M&C 2009), Saratoga Springs, New York, 2009

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FLUKA is a general purpose tool for calculations of particle transport and interactions with matter, covering an extended range of applications spanning from proton and electron accelerator shielding to target design, calorimetry, activation, dosimetry, detector design, Accelerator Driven Systems, cosmic rays, neutrino physics, radiotherapy etc.

Transport limits: Secondary particles Primary particles charged hadrons 1 keV-20 TeV * 100 keV-20 TeV * ** neutrons thermal-20 TeV * thermal-20 TeV * antineutrons 1 keV-20 TeV * 10 MeV-20 TeV * muons 1 keV-1000 TeV 100 keV-1000 TeV ** electrons 1 keV-1000 TeV 70 keV-1000 TeV (low-Z materials) ** 150 keV-1000 TeV (high-Z materials) ** photons 100 eV-1000 TeV 1 keV-10000 TeV heavy ions <10000 TeV/n <10000 TeV/n

* upper limit 10 PeV with the DPMJET interface ** lower limit 10 keV in single scattering mode thermal ~ 10-5 eV

www.fluka.org

FLUKAFLUKA

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MATERIAL CAUSE RADIATION EFFECT

Semiconductors Electron-hole pair dose ionizationPhoton interaction photon absorption

Lattice displacement nuclear collision

Polymers Main and side chain rupture dose ionizationcross-linking degradation dose ionizationgas evolution, radical production dose rate

Ceramics Lattice displacements nuclear collisiontrapped charge carriers dose ionizationcolor centers dose ionization

Metals Lattice displacements nuclear collisionnuclear reactions producing clusters nuclear collision voids and bubbles nuclear collision

Radiation EffectsRadiation Effects

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Radiation environment during the Radiation environment during the experimentsexperiments

• Dose in shielded areas (where the electronics is usually located) is mainly due to neutrons (and associated photons)

• Dose and neutron fluxes have a very close correlation

• Cumulative damage comes from

– Energy deposition (ionizing dose)

– Lattice displacement (1-MeV n equivalent particle fluxes)

• Stochastic failures can occur (SEU) and are mostly due to “high” energy hadrons (“E>20 MeV”)

• No safe limit exists, only a risk level can be determined

• Risk level for commercial electronics is poorly known and varies by orders of magnitude between different devices and series

• Only a combination of the following can assure safe operation:

– Simulation studies of related radiation levels (Dose, 1MeV, 20MeV)

– Careful selection and testing of required electronics

– Shielding and displacement considerations

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Radiation EffectsRadiation Effects

Displacement Damage. Hadrons can interact and cause significant damage to the crystal lattice. The amount and type of damage depends on the particle type and energy. The damage is usually quantified by the amount of Non-Ionizing Energy Loss

Ionizing Radiation is of high energy, capable to penetrate in the matter, to produce ionization of the atoms and to break chemical bonds.

microscopic effect(detectors)

macroscopic effect(electronics)

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CBM experiment @ FAIRCBM experiment @ FAIR

MVDMVD++

STSSTSRICHRICH TRDTRD ToFToF ECALECAL PSDPSD

MuChMuChSTSSTS TRDTRD ToFToF PSDPSD

Experimental tasks and detector systems

• tracking, momentum determination, vertex reconstruction: silicon pixel/strip detectors (MVD+STS) in a magnetic dipole field

• hadron identification: Time-of-Flight (ToF) measurements

• lepton identification: Muon detection system, RICH, TRD and ECAL for electrons (alternative measurements)

• determination of collision centrality and event plane: projectile spectator detector (PSD)

• high speed DAQ and online event selection

Experimental and technical challenges• high multiplicities (up to 1000 particles per reaction)• high reaction rates (up to 10 MHz)

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FLUKA CBM geometryFLUKA CBM geometryC

BM

@ S

IS30

0fu

ll se

tup

CB

M @

SIS

100

star

t ve

rsio

n

FLAIR

FLAIR

MVDMVD++

STSSTSRICHRICH

TRDTRD

ToFToF

PSDPSD He bags

vacuum beam pipeMVDMVD

++STSSTS

RICHRICH

TRDTRD ToFToF

PSDPSD

side view

side view

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CAVECAVE

neq/cm2/2months

CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1099 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1099 Au/s Au/s

Non-Ionizing Energy Loss (NIEL)

CB

M @

SIS

300

CB

M @

SIS

100

He bags

vacuum beam pipe

side view

side view

10

Gy/2months

CAVECAVECBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1099 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1099 Au/s Au/s

Ionizing dose

CB

M @

SIS

300

CB

M @

SIS

100

He bags

vacuum beam pipe

side view

side view

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MVDMVD

Gy/2months

Ionizing dose

5 cm 10 cm 15 cm

CB

M @

SIS

300

CB

M @

SIS

100

CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s

10 cm 18.6 cm 22.8 cm

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neq/cm2/2months

Non-Ionizing Energy Loss (NIEL)

MVDMVD

5 cm 10 cm 15 cm

CB

M @

SIS

300

CB

M @

SIS

100

CBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s

10 cm 18.6 cm 22.8 cm

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STSSTSCBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s

CB

M @

SIS

300

CB

M @

SIS

100

30 cm 100 cm

48 40 cm2 96 100 cm2

Gy/2months

Ionizing dose

electronics

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STSSTSCBM @ SIS100: Au+Au @ 10 GeV/u, 10CBM @ SIS100: Au+Au @ 10 GeV/u, 1077 Au/s Au/s

CBM @ SIS300: Au+Au @ 35 GeV/u, 10CBM @ SIS300: Au+Au @ 35 GeV/u, 1077 Au/s Au/s

CB

M @

SIS

300

CB

M @

SIS

100

Non-Ionizing Energy Loss (NIEL)

30 cm 100 cm neq/cm2/2months

48 40 cm2 96 100 cm2

electronics

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Detector damagesDetector damages

1014 n/cm2

104 Gy

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ConclusionsConclusions

detectors beam intensity (s-1) live time without/mild damages

MVD 107 6 months *

STS

109

10 months *

RICH 2 years **

MuCh 6 months **

TRD2 years **

ToF

PSD 108 1 year **

estimated CBM detector live time (only for hot regions)

* sensitive to the NIEL** sensitive to the ionizing dose