1 a behavioral and temperature measurements- based modeling of an operational amplifier using...
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A Behavioral and Temperature Measurements-Based Modeling of an Operational Amplifier
Using VHDL-AMS
Sahbi Baccar12, Timothée Lévi1, Dominique Dallet1, Vladimir Shitikov2, François Barbara2
1 IMS Laboratory- Université Bordeaux 1, France2 Schlumberger Riboud Product Center (SRPC), Clamart, France
17th IEEE International Conference on Electronics, Systems and SystemsAthens-13th December 2010
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Outlines
Outline
Motivation and Context
Op-amp Description and Characterization
Development of HT Op-amp Models
Conclusion and Prospects
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HTE (high temperature electronics), a recent growing market with specific circuit requirements
Validity of SPICE industrial components models in HT?
Outlines
Motivation and Context
Reviewing transistor factors in HT
??
Market Temperature (°C)
Down-hole Instruments 150-300
Turbine Engine 200-300
Internal Combustion Engine
>150
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Outlines
Motivation and Context
SPICE: among first simulator for ICs
Working conditions effect modeling in
SPICE macro-model?
VHDL-AMS language: modern tool for
AMS and multi-domain modeling and
simulating
huge time of computation: 23.5 hours for simulating a feedback of a
PLL loop!!
Emergence of: - new simulators
- new modeling approaches
HTE Behavioral Modeling
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Outlines
Outline
Motivation and Context
Op-amp Description and Characterization
Development of HT Op-amp Models
Conclusion and Prospects
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High Temperature Front End
Op-amp Description and Characterization
Amplifier Anaog Filter
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Outlines
Op-amp Description and Characterization
Input Stage Gain Stage Output Stage
Vos , Ios, PSRR,
CMRR, Rin,Cin, Zcm… Aol, GBPW, fol,
SR-, SR+..Voutlimp, Voutlimn,
Rout…
Op-amp
Stage 1 Stage 2 Stage 3
performance parameters
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Outlines
Outline
Motivation and Context
Op-amp Description and Characterization
Development of HT Op-amp Models
Conclusion and Prospects
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Outlines
Development of HT op-amp ModelsParameter Measurement(T1,
T2,..)
Fitting by Mathematical Functions
Simulation
HT Behavioral Model Development
Error Evaluation
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Outlines
Development of HT op-amp Models
Input Stage Model
2Zcm
Ios(T)
2Zcm
CinRin
Ib(T)/2
Vos(T)Vcm+(T)
CMRR(T) PSRR+(T)
Vs(T)
inp+
inp-
inpo1
inpo2PSRR-(T)
Vs(T)Vcm-(T)
CMRR(T)
Ib(T)/2
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Outlines
Development of HT op-amp Models
Middle Stage Model
inp+
inp-
inp_po1
inp_po2
1
KLTF
s
First Order LPF
K=Aol(T)fol(T).Aol(T)=GBW(T)
wol(T)=2 .fol(T)
Slew rate, Transconductance
SR+(T), SR-(T),
Vine VgIg=Vine.gm
Ig
Vop
Iomax(T),gm
11 . op
g OL opOL
dVV A V
dt
sub-stage 1 sub-stage 2
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Outlines
Development of HT op-amp Models
Output Stage Model
Voutlimp(T)
Voutlimn(T)
Rout
inp_out
inn_out
output
Iout
Vout
Impedance StageVoltage limiter sub-stage
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Outlines
Simulation Results and Discussions
Voltage Offset and Saturation Voltage
T=25°C
T=150°C
Rl=1K
Vin
Rs=1K
Op Amp Developed Model
Test-bench circuit
Voutlimp (T1=25°C)Voutlimp (T2=150°C)
Voutlimn (T1=25°C)
Voutlimn (T2=150°C)
Slo
pe1
=A
ol(
T1=
25°C
)
Slo
pe2=
Aol
(T2=
150°
C)Vos (T1=25°C) Vos (T2=150°C)
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Outlines
Simulation Results and Discussions
Voltage Offset and Saturation Voltage
T=25°C
T=150°CInput Voltage
Rl=1K
Vin=1V
Rs=1K
Op Amp Developed Model
Rf=10K
Test-bench circuit
15V
T=25°C
T=150°C
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Outlines
Simulation Results and Discussions Frequency Response and Open-Loop Gain
Rl=1K
Vin
Rs=1K
Op Amp Developed Model
Test-bench circuit
1
2
100 ( , 25 )
100 ( , 150 )
dB Aol dB T C
dB Aol dB T C
Temperature Increases
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Outlines
Parameter Extraction and Model Validation
Title: Comparison of measured and simulated voltage offset for different temperatures
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Outlines
Outlines
Motivation and Context
Op-amp Description and Characterization
Development of HT Op-amp Models
Conclusion and Prospects
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Outlines
Conclusion and Prospects
A novel behavioral op-amp model in HT
Simulation of major op-amp performance parameters
Modeling methodology based on measurement of
performance parameters
Confirmation of VHDL-AMS abilities as a useful and
modern modeling language
A first step to model the whole analog-front end of a data
acquisition system: Op-amp, Filter and ADC
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Outlines
References[1] E. Bruls, M. Verstraelen, T. Zwemstra, and P. Meijer, “Analogue fault simulation in standard VHDL,” IEE Proc. Circuits, Devices and Systems, vol. 143, 1996, pp. 380.
[2] F. Pecheux, C. Lallement and A. Vachoux, “VHDL-AMS and Verilog- AMS as alternative hardware description languages for efficient modeling of multidiscipline systems,” Computer-Aided Design of Integrated Circuits and Systems, IEEE Trans. on, vol. 24, n. 2005, pp. 204-225.
[3] R. Kirschman, High-Temperature Electronics, Wiley-IEEE Press, 1998.
[4] R. Johnson, J. Evans, P. Jacobsen, J. Thompson and M. Christopher, “The changing automotive environment: high-temperature electronics,” Electronics Packaging Manufacturing, IEEE Trans. on, vol. 27, 2004, pp. 164-176.
[5] S. Baccar, S.M. Qaisar, D. Dallet, T. Levi, V. Shitikov and F. Barbara, “Analog to digital converters for high temperature applications: The modeling approach issue,” Instrumentation and Measurement Technology Conf. (I2MTC) IEEE, pp. 550-554, Austin, 3-6 May 2010
[6] G.B. Clayton et S. Winder, Operational Amplifiers, Fifth Edition, Newnes, 2003.
[7] P.J. Ashenden, G.D. Peterson and D.A. Teegarden, The System Designer's Guide to VHDL-AMS: Analog, Mixed-Signal, and Mixed- Technology Modeling, Morgan Kaufmann, 2002.
[8] H. Qin, F. Wang, “ Modeling of Operational Amplifier based on VHDLAMS”, in Proc. IEEE International Conference on Electronics Circuits and Systems 2006, pp. 894-897, Nice, 10-13 December 2010
THANK YOU FOR YOUR ATTENTION
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