089009r-itcep07v04-rpt-.l.p-notebook ms-1228, ms-1337

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:[email protected] http://www.quietek.com

CERTIFICATE

Issued Date: Sep. 05, 2008 Report No.: 089009R-ITCEP07V04

This is to certify that the following designated product

Product : Notebook

Trade name : MSI

Model Number : MS-1228, MS-1337

Company Name : MICRO-STAR INT’L Co., LTD.

This product, which has been issued the test report listed as above in QuieTek

Laboratory, is based on a single evaluation of one sample and confirmed to

comply with the requirements of the following EMC standard.

EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003

EN 61000-3-2:2006 IEC 61000-4-2 Edition 1.2: 2001-04

EN 61000-3-3:1995+A1: 2001+A2: 2005 IEC 61000-4-3 Edition 3.0: 2006

IEC 61000-4-4: 2004

IEC 61000-4-5 Edition 2.0: 2005

IEC 61000-4-6 Edition 2.2: 2006

IEC 61000-4-8 Edition 1.1: 2001-03

IEC 61000-4-11 Second Edition: 2004-03

TEST LABORATORY

Vincent Lin / Manager

Appendix Report

Product Name ： Notebook

Model No. ： MS-1228, MS-1337

Applicant ： MICRO-STAR INT’L Co., LTD.

Address ： No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Date of Receipt ： 2008/08/26

Issued Date ： 2008/09/05

Report No. ： 089009R-ITCEP07V04

Version ： V1.0

The test results relate only to the samples tested.The test results shown in the test report are traceable to the national/international standard through the calibration of the equipment and evaluated measurement uncertainty herein. This report must not be used to claim product endorsement by TAF, NVLAP or any agency of the Government. The test report shall not be reproduced except in full without the written approval of QuieTek Corporation.

Declaration of Conformity

The following product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). The listed standards as below were applied: The following Equipment:

Product : Notebook Model Number : MS-1228, MS-1337 Trade Name : MSI

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022: 2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1: 2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1: 2001+A2: 2003 : Product family standard

The following importer/manufacturer is responsible for this declaration:

Company Name :

Company Address :

Telephone : Facsimile :

Person is responsible for marking this declaration:

Name (Full Name) Position/ Title

Date Legal Signature

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601-3789, E-mail: [email protected]

QTK No.: 089009R-ITCEP07V04

S ta tement o f Conformi ty

This certifies that the following designated product:

Product : Notebook Model Number : MS-1228, MS-1337 Trade Name : MSI Company Name : MICRO-STAR INT’L Co., LTD.

This product is herewith confirmed to comply with the requirements set out in the Council Directive on the Approximation of the laws of the Member States relating to Electromagnetic Compatibility Directive (2004/108/EC). For the evaluation regarding EMC, the following standards were applied:

RFI Emission:

EN 55022: 2006, Class B : Product family standard

EN 61000-3-2:2006, Class D : Limits for harmonic current emission

EN 61000-3-3:1995+A1: 2001+A2: 2005 : Limitation of voltage fluctuation and flicker in low-voltage supply system

Immunity:

EN 55024:1998+A1: 2001+A2: 2003 : Product family standard

TEST LABORATORY

Vincent Lin / Manager The verification is based on a single evaluation of one sample of above-mentioned products. It does not imply an assessment of the whole production and does not permit the use of the test lab. Logo.

Report No： 089009R-ITCEP07V04

Page: 2 of 97

Test Report Cert i f icat ion Issued Date : 2008/09/05 Report No. : 089009R-ITCEP07V04

Product Name : Notebook

Applicant : MICRO-STAR INT’L Co., LTD.

Address : No. 69, Li-De St., Jung-He City, Taipei Hsien, Taiwan, R.O.C.

Manufacturer : MICRO-STAR INT’L Co., LTD.

Model No. : MS-1228, MS-1337

Rated Voltage : AC 230 V / 50 Hz

EUT Voltage : AC 100-240V, 50/60Hz

Trade Name : MSI

Applicable Standard : EN 55022: 2006 Class B

EN 55024: 1998+A1: 2001+A2: 2003 EN 61000-3-2:2006

EN 61000-3-3:1995+A1: 2001+A2: 2005

Test Result : Complied

Performed Location : Quietek Corporation (Linkou Laboratory)

No.5-22,Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kuo Shiang,

Taipei, 244 Taiwan, R.O.C.

TEL:+866-2-8601-3788 / FAX:+886-2-8601-3789

Documented By :

( Adm. Specialist / Leven Huang )

Reviewed By :

( Engineer / Elvis Su )

Approved By :

(Manager / Vincent Lin )


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Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that was established the whole facility in our laboratories. The test facility has been accredited/accepted (audited or listed) by the following related bodies in compliance with ISO 17025, EN 45001 and specified testing scopes:

The related certificate for our laboratories about the test site and management system can be downloaded from QuieTek Corporation’s Web Site :http://tw.quietek.com/modules/enterprise/services.php?item=100 The address and introduction of QuieTek Corporation’s laboratories can be founded in our Web site : http://www.quietek.com/ If you have any comments, Please don’t hesitate to contact us. Our contact information is as below: HsinChu Testing Laboratory :

No.75-2, 3rd Lin, Wangye Keng, Yonghxing Tsuen, Qionglin Shiang, Hsinchu County 307, Taiwan, R.O.C. TEL:+886-3-592-8858 / FAX:+886-3-592-8859 E-Mail : [email protected]

LinKou Testing Laboratory :

No. 5-22, Ruei-Shu Valley, Ruei-Ping Tsuen, Lin-Kou Shiang, Taipei, Taiwan, R.O.C. TEL : 886-2-8601-3788 / FAX : 886-2-8601-3789 E-Mail : [email protected]

Suzhou (China) Testing Laboratory :

No. 99 Hongye Rd., Suzhou Industrial Park Loufeng Hi-Tech Development Zone., Suzhou,China.TEL : +86-512-6251-5088 / FAX : +86-512-6251-5098 E-Mail : [email protected]

Taiwan R.O.C. : BSMI, NCC, TAF

Germany : TUV Rheinland

Norway : Nemko, DNV

USA : FCC, NVLAP

Japan : VCCI


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TABLE OF CONTENTS Description Page 1. General Information .................................................................................................... 7 1.1. EUT Description................................................................................................... 7 1.2. Mode of Operation............................................................................................... 8 1.3. Tested System Details ......................................................................................... 9 1.4. Configuration of Tested System......................................................................... 10 1.5. EUT Exercise Software...................................................................................... 11 2. Technical Test ........................................................................................................... 12 2.1. Summary of Test Result..................................................................................... 12 2.2. List of Test Equipment ....................................................................................... 13 2.3. Measurement Uncertainty.................................................................................. 15 2.4. Test Environment ............................................................................................... 17 3. Conducted Emission (Main Terminals)...................................................................... 18 3.1. Test Specification............................................................................................... 18 3.2. Test Setup.......................................................................................................... 18 3.3. Limit ................................................................................................................... 18 3.4. Test Procedure .................................................................................................. 19 3.5. Deviation from Test Standard............................................................................. 19 3.6. Test Result ......................................................................................................... 20 3.7. Test Photograph ................................................................................................ 32 4. Radiated Emission.................................................................................................... 34 4.1. Test Specification............................................................................................... 34 4.2. Test Setup.......................................................................................................... 34 4.3. Limit ................................................................................................................... 34 4.4. Test Procedure .................................................................................................. 35 4.5. Deviation from Test Standard............................................................................. 35 4.6. Test Result ......................................................................................................... 36 4.7. Test Photograph ................................................................................................ 40 5. Harmonic Current Emission ...................................................................................... 42 5.1. Test Specification............................................................................................... 42 5.2. Test Setup.......................................................................................................... 42 5.3. Limit ................................................................................................................... 42 5.4. Test Procedure .................................................................................................. 44 5.5. Deviation from Test Standard............................................................................. 44 5.6. Test Result ......................................................................................................... 45 5.7. Test Photograph ................................................................................................ 49 6. Voltage Fluctuation and Flicker................................................................................. 49


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6.1. Test Specification............................................................................................... 50 6.2. Test Setup.......................................................................................................... 50 6.3. Limit ................................................................................................................... 50 6.4. Test Procedure .................................................................................................. 51 6.5. Deviation from Test Standard............................................................................. 51 6.6. Test Result ......................................................................................................... 52 6.7. Test Photograph ................................................................................................ 54 7. Electrostatic Discharge ............................................................................................. 55 7.1. Test Specification............................................................................................... 55 7.2. Test Setup.......................................................................................................... 55 7.3. Limit ................................................................................................................... 55 7.4. Test Procedure .................................................................................................. 56 7.5. Deviation from Test Standard............................................................................. 56 7.6. Test Result ......................................................................................................... 57 7.7. Test Photograph ................................................................................................ 59 8. Radiated Susceptibility ............................................................................................. 60 8.1. Test Specification............................................................................................... 60 8.2. Test Setup.......................................................................................................... 60 8.3. Limit ................................................................................................................... 60 8.4. Test Procedure .................................................................................................. 61 8.5. Deviation from Test Standard............................................................................. 61 8.6. Test Result ......................................................................................................... 62 8.7. Test Photograph ................................................................................................ 64 9. Electrical Fast Transient/Burst .................................................................................. 65 9.1. Test Specification............................................................................................... 65 9.2. Test Setup.......................................................................................................... 65 9.3. Limit ................................................................................................................... 65 9.4. Test Procedure .................................................................................................. 66 9.5. Deviation from Test Standard............................................................................. 66 9.6. Test Result ......................................................................................................... 67 9.7. Test Photograph ................................................................................................ 69 10. Surge ................................................................................................................. 71 10.1. Test Specification............................................................................................... 71 10.2. Test Setup.......................................................................................................... 71 10.3. Limit ................................................................................................................... 71 10.4. Test Procedure .................................................................................................. 72 10.5. Deviation from Test Standard............................................................................. 72 10.6. Test Result ......................................................................................................... 73


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10.7. Test Photograph ................................................................................................ 75 11. Conducted Susceptibility ................................................................................... 76 11.1. Test Specification............................................................................................... 76 11.2. Test Setup.......................................................................................................... 76 11.3. Limit ................................................................................................................... 77 11.4. Test Procedure .................................................................................................. 77 11.5. Deviation from Test Standard............................................................................. 77 11.6. Test Result ......................................................................................................... 78 11.7. Test Photograph ................................................................................................ 80 12. Power Frequency Magnetic Field ...................................................................... 82 12.1. Test Specification............................................................................................... 82 12.2. Test Setup.......................................................................................................... 82 12.3. Limit ................................................................................................................... 82 12.4. Test Procedure .................................................................................................. 82 12.5. Deviation from Test Standard............................................................................. 82 12.6. Test Result ......................................................................................................... 83 12.7. Test Photograph ................................................................................................ 85 13. Voltage Dips and Interruption............................................................................. 86 13.1. Test Specification............................................................................................... 86 13.2. Test Setup.......................................................................................................... 86 13.3. Limit ................................................................................................................... 86 13.4. Test Procedure .................................................................................................. 87 13.5. Deviation from Test Standard............................................................................. 87 13.6. Test Result ......................................................................................................... 88 13.7. Test Photograph ................................................................................................ 90 14. Attachment ........................................................................................................ 91 　 EUT Photograph ................................................................................................ 91


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1. General Information

1.1. EUT Description

Product Name Notebook Trade Name MSI Model No. MS-1228, MS-1337

Component

Power Adapter MFR: LI SHIN, M/N:0335A1965 Input: AC 100-240V, 50-60Hz,1.7A Output: DC 19V, 3.42A Cable Out: Non-Shielded,1.8m, with one ferrite core bonded. Power Cord: Non-Shielded,1.8m

Keypart List

ITEM Vendor Model Name BISON BN29M5S8-000 Camera ACME 901-0001-14

Note: 1.This appendix report was based on Quietek report No. 084271R-ITCEP07V04. The difference is adding Camera*2 and model name *2 (MS-1228, MS-1337).

2.The different of the each model is shown as below: Model Number Description

MS-1228 12” Panel MS-1337 13” Panel


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1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All the test modes were carried out with the EUT in normal operation, which was shown in this test report and defined as: Pre-Test Mode Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON) Mode 2:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (ACME) Final Test Mode

Emission Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON)Mode 2:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (ACME)

Immunity Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON)Mode 2:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (ACME)

ITEM MODE 1 LCD+HDMI (1280*800/60Hz)

MODE 2 LCD+HDMI (1280*800/60Hz)

CPU Intel Core 2 Duo T9400 2.53GHz Intel Core 2 Duo T9400 2.53GHz

Panel CMO N121I9-L02 CMO N121I9-L02

Inverter SAMPO, YIVNMS0018D11-B SAMPO, YIVNMS0018D11-B

H.D.D Toshiba, 320GB,5400RPM,MK3252GSX Toshiba, 320GB,5400RPM,MK3252GSX

O.D.D. Super Multi, AD-7580S Super Multi, AD-7580S Wireless LAN Card INTEL , 533AN_HMW INTEL , 533AN_HMW Bluetooth Module MSI MS-6837D MSI MS-6837D

Modem Module AGERE D40 AGERE D40

Memory UNIFOSA GU332G0ALEPR8H2F UNIFOSA GU332G0ALEPR8H2F

Battery Well-top, BTY-S25 Well-top, BTY-S25

TV Tuner Digital; DVB-T MC810 Digital; DVB-T MC810

AC Adapter LI SHIN /0335A1965 LI SHIN /0335A1965

Camera BISON / BN29M5S8-000 ACME / 901-0001-14


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1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the tested system (including inserted cards) are: Product Manufacturer Model No. Serial No. Power Cord

1 TS-9980 R&S N/A N/A N/A

2 LCD Monitor CMV CT-730D FNC122F57BA1655 Non-Shielded, 1.8m 3 Printer EPSON StyLus C63 FAPY093590 Non-Shielded, 1.9m 4 Microphone

& Earphone

PCHOME N/A N/A N/A

5 TV VIZIO N/A N/A Non-Shielded, 1.8m 6 USB Mouse Logitech M-BE58 HCA30103299 N/A 7 IPod nano Apple A1199 7R649LBKVQ5 N/A

8 Notebook PC DELL PPT N/A Non-Shielded, 0.8m 9 Exchange

Network

Sun Moon Star PX-4 95170087 Non-Shielded, 1.8m


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1.4. Configuration of Tested System

Connection Diagram

Signal Cable Type Signal cable Description

A LAN Cable Non-Shielded, 3.0m

B D-SUB Cable Shielded, 1.8m, with two ferrite cores bonded

C USB Cable Shielded, 1.5m

D Earphone & Microphone Cable Non-Shielded, 1.5m

E USB Cable Shielded, 1.5m

F HDMI Cable Shielded, 1.0m

G USB Cable Shielded, 1.5m

H Telecom Cable Non-Shielded, 1.5m two PCS

I Coaxial Cable Shielded, 1.8m


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1.5. EUT Exercise Software

1 Setup the EUT and peripheral as shown on Figure

2 Connect the power to EUT and peripherals, then turn on the power of all equipments.

3 Waiting for EUT to enter Window Vista Operating System, and adjust the display resolution to the

test mode.

4 Connect LAN and Telecom to Notebook PC for transmitting data.

5 Activate Wireless interface and Bluetooth function, and perform the wireless data communication

with the other Notebook (write/delete action).

6 Connect 1394 to Slim Combo for transmitting data.

7 Run Windows Media Player program and play a disk with color Bar pattern

8 Run “H” pattern.

9 Begin to test and repeat the above procedure (4)~(8)


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2. Technical Test

2.1. Summary of Test Result

No deviations from the test standards Deviations from the test standards as below description:

Emission

Performed Item Normative References Test

Performed Deviation

Conducted Emission EN 55022: 2006 Class B Yes No

Impedance Stabilization

Network

EN 55022: 2006 Class B No No

Radiated Emission EN 55022: 2006 Class B Yes No

Power Harmonics EN 61000-3-2:2006 Yes No

Voltage Fluctuation and

Flicker

EN 61000-3-3:1995+A1: 2001+A2: 2005 Yes No

Immunity

Performed Item Normative References Test

Performed Deviation

Electrostatic Discharge IEC 61000-4-2 Edition 1.2: 2001-04 Yes No

Radiated susceptibility IEC 61000-4-3 Edition 3.0: 2006 Yes No

Electrical fast transient/burst IEC 61000-4-4:2004 Yes No

Surge IEC 61000-4-5 Edition 2.0: 2005 Yes No

Conducted susceptibility IEC 61000-4-6 Edition 2.2: 2006 Yes No

Power frequency magnetic field IEC 61000-4-8 Edition 1.1: 2001-03 Yes No

Voltage dips and interruption IEC 61000-4-11 2nd Edition: 2004-03 Yes No


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2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No Cal. Date EMI Test Receiver R&S ESCS 30 100366 2007/10/18 LISN R&S ENV4200 833209/007 2008/08/12 LISN R&S ENV216 100085 2008/02/14 Pulse Limiter R&S ESH3-Z2 357.88.10.52 2008/09/04 Radiated Emission / Site3 Instrument Manufacturer Type No. Serial No Cal. Date Bilog Antenna Schaffner Chase CBL6112B 2704 2007/09/15 Broadband Horn Antenna Schwarzbeck BBHA9170 208 2008/07/25 EMI Test Receiver R&S ESCS 30 838251/001 2008/03/22 Horn Antenna Schwarzbeck BBHA9120D 305 2008/08/10 Pre-Amplifier QTK N/A N/A 2008/01/03 Spectrum Analyzer Advantest R3162 101102468 2007/10/24 EMI Test Receiver R&S ESI 26 838786/004 2008/05/25

Pre-Amplifier MITEQ QMF-4D-180400-45-6P 925974 2008/01/03

Power Harmonics / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2008/06/23

Voltage Fluctuation and Flicker / SR3 Instrument Manufacturer Type No. Serial No Cal. Date AC Power Source(Harmonic) Schaffner NSG 1007 HK54148 2008/06/23

IEC1000-4-X Analyzer(Flicker) Schaffner CCN 1000-1 X7 1887 2008/06/23

Electrostatic Discharge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date ESD Simulator System KeyTek MZ-15/EC 0112372 2008/08/02 Horizontal Coupling Plane(HCP) QuieTek HCP AL50 N/A N/A

Vertical Coupling Plane(VCP) QuieTek VCP AL50 N/A N/A

Radiated susceptibility / CB5 Instrument Manufacturer Type No. Serial No Cal. Date AF-BOX R&S AF-BOX ACCUST 100007 N/A Audio Analyzer R&S UPL 16 100137 2008/04/23 Bilog Antenna Schaffner Chase CBL6112B 2450 2008/01/03 Broad-Band Antenna Schwarzbeck VULB 9166 1085 2008/08/02 Biconilog Antenna EMCO 3149 00071675 2008/05/29 CMU200 UNIV.RADIOCOMM R&S CMU200 104846 2008/04/23

Directional Coupler A&R DC 6180 22735 N/A Dual Microphone Supply B&K 5935 2426784 2008/08/04


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Mouth Simulator B&K 4227 2439692 2008/08/04 Power Amplifier A&R 30S1G3 309453 N/A Power Amplifier A&R 100W10000M7 A285000010 N/A Power Amplifier SCHAFFNER CBA9413B 4020 N/A Power Amplifier AR 75A250A 0325371 N/A Power Meter R&S NRVD(P.M) 100219 2008/04/22 Pre-Amplifier A&R 150A220 23067 N/A Probe Microphone B&K 4182 2278070 2008/08/04 Signal Generator R&S SMY02(9K-2080) 825454/028 2007/09/22 Electrical fast transient/burst / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 411225 2007/12/01 Surge / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2007/12/01 Conducted susceptibility / SR6 Instrument Manufacturer Type No. Serial No Cal. Date Schaffner NSG 2070 RF-Generator Schaffner N/A N/A 2008/04/21

Power frequency magnetic field / SR3 Instrument Manufacturer Type No. Serial No Cal. Date Induction Coil Interface Schaffner INA 2141 6002 N/A Magnetic Loop Coil Schaffner INA 702 160 N/A Triaxial ELF Magnetic Field Meter F.B.BELL 4090 9852 2008/05/30

Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC immunity system Thermo EMCPRO PLUS 0411225 2007/12/01 Schaffner NSG 2070 RF-Generator Instrument Manufacturer Type No. Serial No Cal. Date CDN Schaffner CAL U100A 20405 2008/04/21 CDN Schaffner TRA U150 20454 2008/04/21 CDN M016S Schaffner CAL U100A 20410 2008/04/21 CDN M016S Schaffner TRA U150 21167 2008/04/21 CDN T002 Schaffner CAL U100 20491 2008/04/21 CDN T002 Schaffner TRA U150 21169 2008/04/21 CDN T400 Schaffner CAL U100 17735 2008/04/21 CDN T400 Schaffner TRA U150 21166 2008/04/21 Coupling Decoupling Network Schaffner CDN M016S 20822 2008/02/23

Coupling Decoupling Network Schaffner CDN M016S 20823 2008/04/21

Coupling Decoupling Network Schaffner CDN T002 19018 2008/04/21

Coupling Decoupling Network Schaffner CDN T400 21226 2008/04/21

EM-CLAMP Schaffner KEMZ 801 21024 2008/04/21


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2.3. Measurement Uncertainty Conducted Emission

The measurement uncertainty is evaluated as ± 2.26 dB.

Radiated Emission The measurement uncertainty is evaluated as ± 3.19 dB.

Electrostatic Discharge As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in ESD testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant ESD standards. The immunity test signal from the ESD system meet the required specifications in IEC 61000-4-2 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.

Radiated susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in RS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant RS standards. The immunity test signal from the RS system meet the required specifications in IEC 61000-4-3 through the calibration for the uniform field strength and monitoring for the test level with the uncertainty evaluation report for the electrical filed strength as being 2.72 dB.

Electrical fast transient/burst As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in EFT/Burst testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant EFT/Burst standards. The immunity test signal from the EFT/Burst system meet the required specifications in IEC 61000-4-4 through the calibration report with the calibrated uncertainty for the waveform of voltage, frequency and timing as being 1.63 %, 2.8 　 10-10 and

2.76%. Surge

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in Surge testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant Surge standards. The immunity test signal from the Surge system meet the required specifications in IEC 61000-4-5 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


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Conducted susceptibility

As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in CS testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant CS standards. The immunity test signal from the CS system meet the required specifications in IEC 61000-4-6 through the calibration for unmodulated signal and monitoring for the test level with the uncertainty evaluation report for the injected modulated signal level through CDN and EM Clamp/Direct Injection as being 3.72 dB and 2.78 dB.

Power frequency magnetic field As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in PFM testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant PFM standards. The immunity test signal from the PFM system meet the required specifications in IEC 61000-4-8 through the calibration report with the calibrated uncertainty for the Gauss Meter to verify the output level of magnetic field strength as being 2 %.

Voltage dips and interruption As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IEC 17025: 1999[2], the requirements for measurement uncertainty in DIP testing are deemed to have been satisfied, and the testing is reported in accordance with the relevant DIP standards. The immunity test signal from the DIP system meet the required specifications in IEC 61000-4-11 through the calibration report with the calibrated uncertainty for the waveform of voltage and timing as being 1.63 % and 2.76%.


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2.4. Test Environment Performed Item Items Required Actual

Temperature (°C) 15-35 25

Conducted Emission

Humidity (%RH) 25-75 50

Barometric pressure (mbar) 860-1060 950-1000


Radiated Emission




Electrostatic Discharge




Radiated susceptibility




Electrical fast transient/burst




Surge Humidity (%RH) 10-75 54



Conducted susceptibility




Power frequency magnetic field




Voltage dips and interruption




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3. Conducted Emission (Main Terminals)

3.1. Test Specification According to EMC Standard : EN 55022

3.2. Test Setup

3.3. Limit

Limits

Frequency (MHz)

QP (dBuV)

AV (dBuV)

0.15 - 0.50 66 - 56 56 – 46

0.50-5.0 56 46

5.0 - 30 60 50

Remarks: In the above table, the tighter limit applies at the band edges.


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3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance stabilization network (L.I.S.N.). This provides a 50 ohm /50uH coupling impedance for the measuring equipment. The peripheral devices are also connected to the main power through a LISN that provides a 50ohm/50uH coupling impedance with 50ohm termination. (Please refers to the block diagram of the test setup and photographs.) Both sides of A.C. line are checked for maximum conducted interference. In order to find the maximum emission, the relative positions of equipment and all of the interface cables must be changed on conducted measurement. Conducted emissions were invested over the frequency range from 0.15MHz to 30MHz using a receiver bandwidth of 9kHz.

3.5. Deviation from Test Standard No deviation.


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3.6. Test Result Site : SR-1 Time : 2008/08/28 - 00:37

Limit : CISPR_B_00M_QP Margin : 10

EUT : Notebook Probe : ENV-216-L1 - Line1

Power : AC 230V/50Hz Note : MODE 1


Page: 21 of 97

Site : SR-1 Time : 2008/08/28 - 00:38




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.201 9.824 41.270 51.094 -13.449 64.543 QUASIPEAK

2 0.400 9.820 32.660 42.480 -16.377 58.857 QUASIPEAK

3 0.798 9.830 32.130 41.960 -14.040 56.000 QUASIPEAK

4 1.599 9.840 27.770 37.610 -18.390 56.000 QUASIPEAK

5 3.998 9.860 25.400 35.260 -20.740 56.000 QUASIPEAK

6 12.697 10.091 17.090 27.181 -32.819 60.000 QUASIPEAK

Note: 1. All Reading Levels are Quasi-Peak and average value. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 22 of 97

Site : SR-1 Time : 2008/08/28 - 00:38

Limit : CISPR_B_00M_AV Margin : 0



Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.201 9.824 39.640 49.464 -5.079 54.543 AVERAGE

2 0.400 9.820 32.300 42.120 -6.737 48.857 AVERAGE

3 * 0.798 9.830 31.580 41.410 -4.590 46.000 AVERAGE

4 1.599 9.840 26.870 36.710 -9.290 46.000 AVERAGE

5 3.998 9.860 19.240 29.100 -16.900 46.000 AVERAGE

6 12.697 10.091 11.930 22.021 -27.979 50.000 AVERAGE



Page: 23 of 97

Site : SR-1 Time : 2008/08/28 - 00:39


EUT : Notebook Probe : ENV-216-N - Line2



Page: 24 of 97

Site : SR-1 Time : 2008/08/28 - 00:39




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 * 0.201 9.860 41.880 51.740 -12.803 64.543 QUASIPEAK

2 0.334 9.850 32.940 42.790 -17.953 60.743 QUASIPEAK

3 0.798 9.830 31.970 41.800 -14.200 56.000 QUASIPEAK

4 1.931 9.850 25.480 35.330 -20.670 56.000 QUASIPEAK

5 4.599 9.870 21.010 30.880 -25.120 56.000 QUASIPEAK

6 14.146 10.200 18.730 28.930 -31.070 60.000 QUASIPEAK



Page: 25 of 97

Site : SR-1 Time : 2008/08/28 - 00:39




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.201 9.860 36.750 46.610 -7.933 54.543 AVERAGE

2 0.334 9.850 31.650 41.500 -9.243 50.743 AVERAGE

3 * 0.798 9.830 29.550 39.380 -6.620 46.000 AVERAGE

4 1.931 9.850 20.890 30.740 -15.260 46.000 AVERAGE

5 4.599 9.870 10.550 20.420 -25.580 46.000 AVERAGE

6 14.146 10.200 11.840 22.040 -27.960 50.000 AVERAGE



Page: 26 of 97

Site : SR-1 Time : 2008/08/28 - 00:50





Page: 27 of 97

Site : SR-1 Time : 2008/08/28 - 00:51




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.823 40.510 50.333 -14.324 64.657 QUASIPEAK

2 0.400 9.820 32.960 42.780 -16.077 58.857 QUASIPEAK

3 * 0.798 9.830 33.850 43.680 -12.320 56.000 QUASIPEAK

4 3.459 9.860 23.810 33.670 -22.330 56.000 QUASIPEAK

5 8.310 9.900 14.540 24.440 -35.560 60.000 QUASIPEAK

6 23.998 10.230 29.320 39.550 -20.450 60.000 QUASIPEAK



Page: 28 of 97

Site : SR-1 Time : 2008/08/28 - 00:51




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.823 39.460 49.283 -5.374 54.657 AVERAGE

2 0.400 9.820 31.800 41.620 -7.237 48.857 AVERAGE

3 * 0.798 9.830 32.780 42.610 -3.390 46.000 AVERAGE

4 3.459 9.860 19.710 29.570 -16.430 46.000 AVERAGE

5 8.310 9.900 9.460 19.360 -30.640 50.000 AVERAGE

6 23.998 10.230 28.770 39.000 -11.000 50.000 AVERAGE



Page: 29 of 97

Site : SR-1 Time : 2008/08/28 - 00:51





Page: 30 of 97

Site : SR-1 Time : 2008/08/28 - 00:52




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.860 40.670 50.530 -14.127 64.657 QUASIPEAK

2 0.466 9.830 33.970 43.800 -13.171 56.971 QUASIPEAK

3 * 0.798 9.830 33.790 43.620 -12.380 56.000 QUASIPEAK

4 2.263 9.850 26.220 36.070 -19.930 56.000 QUASIPEAK

5 4.127 9.860 22.500 32.360 -23.640 56.000 QUASIPEAK

6 24.002 10.200 28.920 39.120 -20.880 60.000 QUASIPEAK



Page: 31 of 97

Site : SR-1 Time : 2008/08/28 - 00:52




Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV)

Margin

(dB)

Limit

(dBuV)

Detector Type

1 0.197 9.860 36.590 46.450 -8.207 54.657 AVERAGE

2 0.466 9.830 32.670 42.500 -4.471 46.971 AVERAGE

3 * 0.798 9.830 33.020 42.850 -3.150 46.000 AVERAGE

4 2.263 9.850 25.650 35.500 -10.500 46.000 AVERAGE

5 4.127 9.860 14.640 24.500 -21.500 46.000 AVERAGE

6 24.002 10.200 28.080 38.280 -11.720 50.000 AVERAGE



Page: 32 of 97

3.7. Test Photograph Test Mode : Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON)

Description : Front View of Conducted Test

Test Mode : Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON)

Description : Back View of Conducted Test


Page: 33 of 97

Test Mode : Mode 2:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (ACME)

Description : Front View of Conducted Test


Description : Back View of Conducted Test


Page: 34 of 97

4. Radiated Emission

4.1. Test Specification According to EMC Standard : EN 55022

4.2. Test Setup

4.3. Limit

Limits Frequency

(MHz) Distance (m) dBuV/m

30 – 230 10 30

230 – 1000 10 37

Remark: 1. The tighter limit shall apply at the edge between two frequency bands. 2. Distance refers to the distance in meters between the measuring instrument antenna

and the closed point of any part of the device or system.


Page: 35 of 97

4.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above ground. The turn table can rotate 360 degrees to determine the position of the maximum emission level. The EUT was positioned such that the distance from antenna to the EUT was 10 meters. The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level. Both horizontal and vertical polarization of the antenna are set on measurement. In order to find the maximum emission, all of the interface cables must be manipulated on radiated measurement. Radiated emissions were invested over the frequency range from 30MHz to1GHz using a receiver bandwidth of 120kHz. Radiated was performed at an antenna to EUT distance of 10 meters.



Page: 36 of 97

4.6. Test Result Site : OATS-3 Time : 2008/08/28 - 03:00


EUT : Notebook Probe : 2007_Site3(2921)_10M - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 169.250 12.844 6.460 19.303 -10.697 30.000 QUASIPEAK

2 250.000 16.298 12.610 28.908 -8.092 37.000 QUASIPEAK

3 431.992 20.718 10.160 30.878 -6.122 37.000 QUASIPEAK

4 623.980 24.044 9.200 33.244 -3.756 37.000 QUASIPEAK

5 * 799.223 26.310 7.650 33.960 -3.040 37.000 QUASIPEAK

6 1000.000 29.030 4.410 33.440 -3.560 37.000 QUASIPEAK

Note: 1. All Readings below 1GHz are Quasi-Peak, above are performed with peak and/or average measurements as necessary. 2. " * ", means this data is the worst emission level. 3. Measurement Level = Reading Level + Correct Factor


Page: 37 of 97

Site : OATS-3 Time : 2008/08/28 - 03:22


EUT : Notebook Probe : 2007_Site3(2921)_10M - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 59.250 7.859 17.910 25.768 -4.232 30.000 QUASIPEAK

2 155.850 13.465 12.740 26.205 -3.795 30.000 QUASIPEAK

3 250.000 16.298 13.630 29.928 -7.072 37.000 QUASIPEAK

4 566.840 23.214 10.490 33.704 -3.296 37.000 QUASIPEAK

5 * 708.557 25.005 8.940 33.945 -3.055 37.000 QUASIPEAK

6 815.982 26.533 7.220 33.753 -3.247 37.000 QUASIPEAK



Page: 38 of 97

Site : OATS-3 Time : 2008/08/28 - 05:50


EUT : Notebook Probe : 2007_Site3(2921)_10M - HORIZONTAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 138.100 14.506 3.090 17.597 -12.403 30.000 QUASIPEAK

2 163.250 13.085 8.250 21.335 -8.665 30.000 QUASIPEAK

3 425.137 20.577 10.700 31.277 -5.723 37.000 QUASIPEAK

4 * 796.960 26.277 7.280 33.557 -3.443 37.000 QUASIPEAK

5 815.989 26.533 4.100 30.633 -6.367 37.000 QUASIPEAK

6 960.000 28.486 2.300 30.785 -6.215 37.000 QUASIPEAK



Page: 39 of 97

Site : OATS-3 Time : 2008/08/28 - 05:12


EUT : Notebook Probe : 2007_Site3(2921)_10M - VERTICAL


Frequency

(MHz)

Correct Factor

(dB)

Reading Level

(dBuV)

Measure Level

(dBuV/m)

Margin

(dB)

Limit

(dBuV/m)

Detector Type

1 58.920 7.957 16.640 24.598 -5.402 30.000 QUASIPEAK

2 111.250 14.915 10.370 25.285 -4.715 30.000 QUASIPEAK

3 158.900 13.277 13.150 26.427 -3.573 30.000 QUASIPEAK

4 354.277 18.849 6.900 25.749 -11.251 37.000 QUASIPEAK

5 425.137 20.577 12.980 33.557 -3.443 37.000 QUASIPEAK

6 * 566.850 23.215 10.650 33.865 -3.135 37.000 QUASIPEAK

7 798.095 26.298 7.290 33.587 -3.413 37.000 QUASIPEAK

8 815.989 26.533 7.046 33.579 -3.421 37.000 QUASIPEAK



Page: 40 of 97


Description : Front View of Radiated Test


Description : Back View of Radiated Test


Page: 41 of 97


Description : Front View of Radiated Test


Description : Back View of Radiated Test


Page: 42 of 97

5. Harmonic Current Emission

5.1. Test Specification

According to EMC Standard : EN 61000-3-2

5.2. Test Setup

5.3. Limit (a) Limits of Class A Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current

A

Harmonics Order

n


A

Odd harmonics Even harmonics

3 2.30 2 1.08

5 1.14 4 0.43

7 0.77 6 0.30

9 0.40 8 ≤ n ≤ 40 0.23 * 8/n

11 0.33

13 0.21

15 ≤ n ≤ 39 0.15 * 15/n


Page: 43 of 97

(b) Limits of Class B Harmonics Currents

For Class B equipment, the harmonic of the input current shall not exceed the maximum permissible values given in table that is the limit of Class A multiplied by a factor of 1.5.

(c) Limits of Class C Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current Expressed as a percentage of the input current at the fundamental frequency

％

2 2

3 30．λ＊

5 10

7 7

9 5

11 ≤ n ≤ 39 (odd harmonics only)

3

＊λ is the circuit power factor

(d) Limits of Class D Harmonics Currents

Harmonics Order

n

Maximum Permissible harmonic current per watt

mA/W


A

3 3.4 2.30

5 1.9 1.14

7 1.0 0.77

9 0.5 0.40

11 0.35 0.33

11 ≤ n ≤ 39 (odd harmonics only)

3.85/n See limit of Class A


Page: 44 of 97

5.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 45 of 97

5.6. Test Result Product Notebook

Test Item Power Harmonics

Test Mode Mode 1:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (BISON)

Date of Test 2008/08/28 Test Site No.3 Shielded Room

Test Result: Pass Source qualification: Normal

Current & voltage waveforms

-6-4-20246

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 46 of 97


THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.72 Frequency(Hz): 50.00 I_Peak (Amps): 3.649 I_RMS (Amps): 0.725 I_Fund (Amps): 0.281 Crest Factor: 6.323 Power (Watts): 65.4 Power Factor: 0.393

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.006 3 0.256 0.223 0.0 0.272 0.334 0.00 Pass 4 0.007 5 0.247 0.124 0.0 0.262 0.187 0.00 Pass 6 0.007 7 0.234 0.065 0.0 0.247 0.098 0.00 Pass 8 0.008 9 0.217 0.033 0.0 0.229 0.049 0.00 Pass 10 0.009 11 0.197 0.023 0.0 0.208 0.034 0.00 Pass 12 0.009 13 0.176 0.020 0.0 0.185 0.029 0.00 Pass 14 0.009 15 0.153 0.017 0.0 0.160 0.025 0.00 Pass 16 0.009 17 0.130 0.015 0.0 0.136 0.022 0.00 Pass 18 0.009 19 0.107 0.013 0.0 0.112 0.020 0.00 Pass 20 0.008 21 0.086 0.012 0.0 0.089 0.018 0.00 Pass 22 0.007 23 0.066 0.011 0.0 0.068 0.016 0.00 Pass 24 0.006 25 0.049 0.010 0.0 0.050 0.015 0.00 Pass 26 0.004 27 0.034 0.009 0.0 0.035 0.014 0.00 Pass 28 0.003 29 0.022 0.009 0.0 0.023 0.013 0.00 Pass 30 0.002 31 0.014 0.008 0.0 0.014 0.012 0.00 Pass 32 0.002 33 0.009 0.008 0.0 0.010 0.011 0.00 Pass 34 0.001 35 0.008 0.007 0.0 0.010 0.011 0.00 Pass 36 0.001 37 0.009 0.007 0.0 0.010 0.010 0.00 Pass 38 0.001 39 0.009 0.006 0.0 0.010 0.010 0.00 Pass 40 0.001

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 47 of 97

Product Notebook

Test Item Power Harmonics

Test Mode Mode 2:Intel Core 2 Duo CPU [email protected],LCD+HDMI (1280*800/60Hz),Camera (ACME)



Current & voltage waveforms

-6-4-20246

-300-200-1000100200300

Cur

rent

(Am

ps)

Voltage (V

olts)

Harmonics and Class D limit line European Limits

0.000.050.100.150.200.250.300.35

Cur

rent

RM

S(A

mps

)

Harmonic #4 8 12 16 20 24 28 32 36 40

Test result: Pass Worst harmonic was #0 with 0.00% of the limit.


Page: 48 of 97


THC(A): 0.00 I-THD(%): 0.00 POHC(A): 0.000 POHC Limit(A): 0.000 Highest parameter values during test:

V_RMS (Volts): 229.73 Frequency(Hz): 50.00 I_Peak (Amps): 3.780 I_RMS (Amps): 0.792 I_Fund (Amps): 0.326 Crest Factor: 4.782 Power (Watts): 73.1 Power Factor: 0.403

Harm# Harms(avg) 100%Limit %of Limit Harms(max) 150%Limit %of Limit Status 2 0.003 3 0.312 0.249 0.0 0.314 0.373 0.00 Pass 4 0.003 5 0.299 0.139 0.0 0.301 0.208 0.00 Pass 6 0.003 7 0.280 0.073 0.0 0.282 0.110 0.00 Pass 8 0.003 9 0.256 0.037 0.0 0.259 0.055 0.00 Pass 10 0.003 11 0.230 0.026 0.0 0.232 0.038 0.00 Pass 12 0.003 13 0.201 0.022 0.0 0.203 0.032 0.00 Pass 14 0.003 15 0.171 0.019 0.0 0.173 0.028 0.00 Pass 16 0.003 17 0.141 0.017 0.0 0.144 0.025 0.00 Pass 18 0.003 19 0.113 0.015 0.0 0.116 0.022 0.00 Pass 20 0.002 21 0.088 0.013 0.0 0.090 0.020 0.00 Pass 22 0.002 23 0.066 0.012 0.0 0.068 0.018 0.00 Pass 24 0.002 25 0.048 0.011 0.0 0.049 0.017 0.00 Pass 26 0.001 27 0.034 0.010 0.0 0.035 0.016 0.00 Pass 28 0.001 29 0.024 0.010 0.0 0.025 0.015 0.00 Pass 30 0.001 31 0.019 0.009 0.0 0.019 0.014 0.00 Pass 32 0.001 33 0.016 0.008 0.0 0.017 0.013 0.00 Pass 34 0.001 35 0.015 0.008 0.0 0.015 0.012 0.00 Pass 36 0.000 37 0.013 0.008 0.0 0.014 0.011 0.00 Pass 38 0.000 39 0.011 0.007 0.0 0.012 0.011 0.00 Pass 40 0.000

1.Dynamic limits were applied for this test. The highest harmonics values in the above table may not occur at the

same window as the maximum harmonics/limit ratio.

2:According to EN61000-3-2 paragraph 7 the note 1 and 2 are valid for all applications having an active input power

>75W. Others the result should be pass.


Page: 49 of 97


Description : Power Harmonics Test Setup


Description : Power Harmonics Test Setup

6. Voltage Fluctuation and Flicker


Page: 50 of 97


According to EMC Standard : EN 61000-3-3

6.2. Test Setup

6.3. Limit The following limits apply:

－ the value of Pst shall not be greater than 1.0; － the value of Plt shall not be greater than 0.65; － the value of d(t) during a voltage change shall not exceed 3.3 ％ for more than 500

ms; － the relative steady-state voltage change, dc, shall not exceed 3.3 ％; － the maximum relative voltage change, dmax, shall not exceed;

a) 4 ％ without additional conditions; b) 6 ％ for equipment which is:

－ switched manually, or － switched automatically more frequently than twice per day, and also has either a

delayed restart (the delay being not less than a few tens of seconds), or manual restart, after a power supply interruption.

NOTE The cycling frequency will be further limited by the Pst and P1t limit. For example: a dmax of 6％producing a rectangular voltage change characteristic twice per

hour will give a P1t of about 0.65.


Page: 51 of 97

c) 7 ％ for equipment which is: － attended whilst in use (for example: hair dryers, vacuum cleaners, kitchen equipment

such as mixers, garden equipment such as lawn mowers, portable tools such as electric drills), or

－ switched on automatically, or is intended to be switched on manually, no more than

twice per day, and also has either a delayed restart (the delay being not less than a few tens of seconds) or manual restart, after a power supply interruption.

Pst and P1t requirements shall not be applied to voltage changes caused by manual switching.

6.4. Test Procedure

The EUT is supplied in series with power analyzer from a power source having the same normal voltage and frequency as the rated supply voltage and the equipment under test. And the rated voltage at the supply voltage of EUT of 0.94 times and 1.06 times shall be performed.



Page: 52 of 97


Test Item Voltage Fluctuation and Flicker



Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

15:2

2:1

3

Plt and limit line

0.25

0.50

Plt

15:2

2:1

3

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.66 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 53 of 97

Product Notebook

Test Item Voltage Fluctuation and Flicker



Test Result: Pass Status: Test Completed

Psti and limit line European Limits

0.25

0.50

0.75

1.00

Pst

14:5

6:0

3

Plt and limit line

0.25

0.50

Plt

14:5

6:0

3

Parameter values recorded during the test: Vrms at the end of test (Volt): 229.56 Highest dt (%): 0.00 Test limit (%): 3.30 Pass Time(mS) > dt: 0.0 Test limit (mS): 500.0 Pass Highest dc (%): 0.00 Test limit (%): 3.30 Pass Highest dmax (%): 0.00 Test limit (%): 4.00 Pass Highest Pst (10 min. period): 0.160 Test limit: 1.000 Pass Highest Plt (2 hr. period): 0.070 Test limit: 0.650 Pass


Page: 54 of 97


Description : Flicker Test Setup


Description : Flicker Test Setup


Page: 55 of 97

7. Electrostatic Discharge


According to Standard : IEC 61000-4-2

7.2. Test Setup

7.3. Limit

Item Environmental Phenomena

Units Test Specification Performance Criteria

Enclosure Port

Electrostatic Discharge kV(Charge Voltage) ±8 Air Discharge ±4 Contact Discharge

B


Page: 56 of 97

7.4. Test Procedure

Direct application of discharges to the EUT: Contact discharge was applied only to conductive surfaces of the EUT. Air discharges were applied only to non-conductive surfaces of the EUT. During the test, it was performed with single discharges. For the single discharge time between successive single discharges will be keep longer 1 second. It was at least ten single discharges with positive and negative at the same selected point. The selected point, which was performed with electrostatic discharge, was marked on the red label of the EUT.

Indirect application of discharges to the EUT:

Vertical Coupling Plane (VCP): The coupling plane, of dimensions 0.5m x 0.5m, is placed parallel to, and positioned at a distance 0.1m from, the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point. Horizontal Coupling Plane (HCP): The coupling plane is placed under to the EUT. The generator shall be positioned vertically at a distance of 0.1m from the EUT, with the Discharge Electrode touching the coupling plane. The four faces of the EUT will be performed with electrostatic discharge. It was at least ten single discharges with positive and negative at the same selected point.

7.5. Deviation from Test Standard

No deviation.


Page: 57 of 97


Test Item Electrostatic Discharge



Item Amount of Discharge

Voltage Required Criteria

Complied To Criteria (A,B,C)

Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement

Meet criteria A: Operate as intended during and after the test Meet criteria B: Operate as intended after the test Meet criteria C: Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.


Page: 58 of 97

Product Notebook

Test Item Electrostatic Discharge



Item Amount of Discharge

Voltage Required Criteria


Results

Air Discharge 10

10

+8kV

-8kV

B

B

B

B

Pass

Pass

Contact Discharge 25

25

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(HCP)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Front)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Left)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Back)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Indirect Discharge

(VCP Right)

50

50

+4kV

-4kV

B

B

A

A

Pass

Pass

Note: The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. NR: No Requirement


EUT stopped operation and could / could not be reset by operator at kV. No false alarms or other malfunctions were observed during or after the test.

Remark: The Contact discharges were applied at least total 200 discharges at a minimum of four test points.


Page: 59 of 97


Description : ESD Test Setup


Description : ESD Test Setup


Page: 60 of 97

8. Radiated Susceptibility



8.2. Test Setup

8.3. Limit


Units Test Specification

Performance Criteria

Enclosure Port

Radio-Frequency Electromagnetic Field Amplitude Modulated

MHz V/m(Un-modulated, rms)% AM (1kHz)

80-1000 3 80

A


Page: 61 of 97

8.4. Test Procedure

The EUT and load, which are placed on a table that is 0.8 meter above ground, are placed with one coincident with the calibration plane such that the distance from antenna to the EUT was 3 meters. Both horizontal and vertical polarization of the antenna and four sides of the EUT are set on measurement. In order to judge the EUT performance, a CCD camera is used to monitor EUT screen.

All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 3 V/m Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 80MHz - 1000MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s


No deviation.


Page: 62 of 97


Test Item Radiated susceptibility


Date of Test 2008/08/29 Test Site Chamber5

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report.


There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.


Page: 63 of 97

Product Notebook

Test Item Radiated susceptibility


Date of Test 2008/08/29 Test Site Chamber5

Frequency (MHz)

Position (Angle)

Polarity (H or V)

Field Strength

(V/m)

Required Criteria


Results

80-1000 FRONT H 3 A A PASS

80-1000 FRONT V 3 A A PASS

80-1000 BACK H 3 A A PASS

80-1000 BACK V 3 A A PASS

80-1000 RIGHT H 3 A A PASS

80-1000 RIGHT V 3 A A PASS

80-1000 LEFT H 3 A A PASS

80-1000 LEFT V 3 A A PASS

80-1000 UP H 3 A A PASS

80-1000 UP V 3 A A PASS

80-1000 DOWN H 3 A A PASS

80-1000 DOWN V 3 A A PASS

Note:



There was no observable degradation in performance. EUT stopped operation and could / could not be reset by operator at V/m

at frequency MHz. No false alarms or other malfunctions were observed during or after the test.


Page: 64 of 97


Description : Radiated Susceptibility Test Setup


Description : Radiated Susceptibility Test Setup


Page: 65 of 97

9. Electrical Fast Transient/Burst



9.2. Test Setup

9.3. Limit Item Environmental

PhenomenaUnits Test Specification Performance

Criteria I/O and communication ports Fast Transients Common Mode

kV (Peak) Tr/Th ns Rep. Frequency kHz

+0.5 5/50 5

B

Input DC Power Ports Fast Transients Common Mode


+0.5 5/50 5

B

Input AC Power Ports Fast Transients Common Mode


+1 5/50 5

B


Page: 66 of 97

9.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference plane is placed on the table, and uses a 0.1m insulation between the EUT and ground reference plane. The minimum area of the ground reference plane is 1m*1m, and 0.65mm thick min, and projected beyond the EUT by at least 0.1m on all sides. Test on I/O and communication ports: The EFT interference signal is through a coupling clamp device couples to the signal and control lines of the EUT with burst noise for 1minute. Test on power supply ports: The EUT is connected to the power mains through a coupling device that directly couples the EFT/B interference signal. Each of the Line and Neutral conductors is impressed with burst noise for 1 minute. The length of the signal and power lines between the coupling device and the EUT is 0.5m.



Page: 67 of 97


Test Item Electrical fast transient/burst



Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

RequiredCriteria

Complied to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5 kV 60 Clamp B A PASS

Note:


Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information

EUT stopped operation and could / could not be reset by operator at kV of Line .

No false alarms or other malfunctions were observed during or after the test.


Page: 68 of 97

Product Notebook

Test Item Electrical fast transient/burst



Inject Line

Polarity Voltage

kV

Inject Time

(Second)

Inject Method

RequiredCriteria

Complied to

Criteria Result

L+N+PE ± 1kV 60 Direct B A PASS

LAN ± 0.5 kV 60 Clamp B A PASS

Note:






Page: 69 of 97


Description : EFT/B Test Setup


Description : EFT/B Test Setup - Clamp


Page: 70 of 97


Description : EFT/B Test Setup


Description : EFT/B Test Setup - Clamp


Page: 71 of 97

10. Surge



10.2. Test Setup

10.3. Limit Item Environmental Phenomena Units Test Specification Performance

Criteria Signal Ports and Telecommunication Ports(See 1) and 2) ) Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 1 B

Input DC Power Ports Surges Line to Ground

Tr/Th us kV

1.2/50 (8/20) ± 0.5 B

AC Input and AC Output Power Ports Surges Line to Line Line to Ground

Tr/Th us kV kV

1.2/50 (8/20) ± 1 ± 2

B

Notes:

1) Applicable only to ports which according to the manufacturer’s may directly to outdoor cables.

2) Where normal functioning cannot be achieved because of the impact of the CDN on the EUT, no immunity test shall be required.


Page: 72 of 97

10.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal ground plane measured 1m*1m min. and 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The length of power cord between the coupling device and the EUT shall be 2m or less. For Input and Output AC Power or DC Input and DC Output Power Ports: The EUT is connected to the power mains through a coupling device that directly couples the Surge interference signal. The surge noise shall be applied synchronized to the voltage phase at 00, 900, 1800, 2700 and the peak value of the a.c. voltage wave. (Positive and negative) Each of Line-Earth and Line-Line is impressed with a sequence of five surge voltages with interval of 1 min.


No deviation.


Page: 73 of 97


Test Item Surge



Inject Line

Polarity Angle Voltage

kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result

L-N ± 0 1kV 60 Direct B A PASS




L-PE ± 0 2kV 60 Direct B A PASS




N-PE ± 0 2kV 60 Direct B A PASS



N-PE ± 270 2kV 60 Direct B A PASS Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information




Page: 74 of 97

Product Notebook

Test Item Surge



Inject Line

Polarity Angle Voltage

kV

Time Interval

(Second)

Inject Method

Required Criteria

Complied to

Criteria Result












N-PE ± 270 2kV 60 Direct B A PASS Note:

The testing performed is from lowest level up to the highest level as required by standard, but only highest level is shown on the report. Meet criteria A : Operate as intended during and after the test Meet criteria B : Operate as intended after the test Meet criteria C : Loss/Error of function Additional Information




Page: 75 of 97


Description : SURGE Test Setup


Description : SURGE Test Setup


Page: 76 of 97

11. Conducted Susceptibility



11.2. Test Setup CDN Test Mode

EM Clamp Test Mode


Page: 77 of 97

11.3. Limit

Item Environmental Phenomena Units Test Specification


Signal Ports and Telecommunication Ports Radio-Frequency Continuous Conducted

MHz V (rms, Un-modulated) % AM (1kHz)

0.15-80 3 80 A

Input DC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

Input AC Power Ports Radio-Frequency Continuous Conducted


0.15-80 3 80 A

11.4. Test Procedure

The EUT are placed on a table that is 0.8 meter height, and a Ground reference plane on the table, EUT are placed upon table and use a 10cm insulation between the EUT and Ground reference plane. For Signal Ports and Telecommunication Ports The disturbance signal is through a coupling and decoupling networks (CDN) or EM-clamp device couples to the signal and Telecommunication lines of the EUT. For Input DC and AC Power Ports The EUT is connected to the power mains through a coupling and decoupling networks for power supply lines. And directly couples the disturbances signal into EUT. Used CDN-M2 for two wires or CDN-M3 for three wires. All the scanning conditions are as follows: Condition of Test Remarks 1. Field Strength 130dBuV(3V) Level 2 2. Radiated Signal AM 80% Modulated with 1kHz 3. Scanning Frequency 0.15MHz – 80MHz 4 Dwell Time 3 Seconds 5. Frequency step size ∆ f : 1% 6. The rate of Swept of Frequency 1.5 x 10-3 decades/s



Page: 78 of 97


Test Item Conducted susceptibility



Frequency

Range

(MHz)

Voltage Applied dBuV(V)

Inject Method

Tested Port of

EUT

Required Criteria


Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

Note:



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.

No false alarms or other malfunctions were observed during or after the test. The acceptance criteria were met, and the EUT passed the test.


Page: 79 of 97

Product Notebook

Test Item Conducted susceptibility



Frequency

Range

(MHz)

Voltage Applied dBuV(V)

Inject Method

Tested Port of

EUT

Required Criteria


Complied To

Result

0.15~80 130 (3V) CDN AC IN A A PASS

0.15~80 130 (3V) CDN LAN A A PASS

Note:



EUT stopped operation and could / could not be reset by operator at dBuV(V) at frequency MHz.



Page: 80 of 97


Description : Conducted Susceptibility Test Setup


Description : Conducted Susceptibility Test Setup-CDN


Page: 81 of 97


Description : Conducted Susceptibility Test Setup


Description : Conducted Susceptibility Test Setup-CDN


Page: 82 of 97

12. Power Frequency Magnetic Field



12.2. Test Setup

12.3. Limit Item Environmental

Phenomena Units Test Specification Performance

Criteria Enclosure Port Power-Frequency

Magnetic Field Hz A/m (r.m.s.)

50 1

A


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured at least 1m*1m min. The test magnetic field shall be placed at central of the induction coil. The test magnetic Field shall be applied 10 minutes by the immersion method to the EUT.

And the induction coil shall be rotated by 90° in order to expose the EUT to the test field with different orientation (X, Y, Z Orientations).



Page: 83 of 97


Test Item Power frequency magnetic field



Polarization Frequency (Hz)

Magnetic Strength

(A/m)

Required Performance

Criteria


Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS





Page: 84 of 97

Product Notebook

Test Item Power frequency magnetic field



Polarization Frequency (Hz)

Magnetic Strength

(A/m)


Criteria


Complied To

Test Result

X Orientation 50 1 A A PASS

Y Orientation 50 1 A A PASS

Z Orientation 50 1 A A PASS





Page: 85 of 97


Description : Power Frequency Magnetic Field Test Setup


Description : Power Frequency Magnetic Field Test Setup


Page: 86 of 97

13. Voltage Dips and Interruption



13.2. Test Setup

13.3. Limit


Units Test Specification Performance Criteria

Input AC Power Ports

% Reduction Period

30 25

C Voltage Dips

% Reduction Period

>95 0.5

B

Voltage Interruptions % Reduction Period

> 95 250

C


Page: 87 of 97


The EUT and its load are placed on a table which is 0.8 meter above a metal ground plane measured 1m*1m min. And 0.65mm thick min. And projected beyond the EUT by at least 0.1m on all sides. The power cord shall be used the shortest power cord as specified by the manufacturer. For Voltage Dips/ Interruptions test: The selection of test voltage is based on the rated power range. If the operation range is large than 20% of lower power range, both end of specified voltage shall be tested. Otherwise, the typical voltage specification is selected as test voltage. The EUT is connected to the power mains through a coupling device that directly couples to the Voltage Dips and Interruption Generator. The EUT shall be tested for 30% voltage dip of supplied voltage and duration 25 Periods, for 95% voltage dip of supplied voltage and duration 0.5 Periods with a sequence of three voltage dips with intervals of 10 seconds, and for 95% voltage interruption of supplied voltage and duration 250 Periods with a sequence of three voltage interruptions with intervals of 10 seconds. Voltage phase shifting are shall occur at 00, 450, 900 ,1350 ,1800 ,2250, 2700 ,3150 of the voltage.



Page: 88 of 97


Test Item Voltage dips and interruption



Voltage Dips and

Interruption Reduction(%)

Angle Test Duration (Periods)


Criteria


Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C B PASS >95(0V) 45 250 C B PASS >95(0V) 90 250 C B PASS >95(0V) 135 250 C B PASS >95(0V) 180 250 C B PASS >95(0V) 225 250 C B PASS >95(0V) 270 250 C B PASS >95(0V) 315 250 C B PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance

criteria were met, and the EUT passed the test.


Page: 89 of 97

Product Notebook

Test Item Voltage dips and interruption



Voltage Dips and

Interruption Reduction(%)

Angle Test Duration (Periods)


Criteria


Complied To

Test Result

30(161V) 0 25 C A PASS 30(161V) 45 25 C A PASS 30(161V) 90 25 C A PASS 30(161V) 135 25 C A PASS 30(161V) 180 25 C A PASS 30(161V) 225 25 C A PASS 30(161V) 270 25 C A PASS 30(161V) 315 25 C A PASS >95(0V) 0 0.5 B A PASS >95(0V) 45 0.5 B A PASS >95(0V) 90 0.5 B A PASS >95(0V) 135 0.5 B A PASS >95(0V) 180 0.5 B A PASS >95(0V) 225 0.5 B A PASS >95(0V) 270 0.5 B A PASS >95(0V) 315 0.5 B A PASS >95(0V) 0 250 C B PASS >95(0V) 45 250 C B PASS >95(0V) 90 250 C B PASS >95(0V) 135 250 C B PASS >95(0V) 180 250 C B PASS >95(0V) 225 250 C B PASS >95(0V) 270 250 C B PASS >95(0V) 315 250 C B PASS


The nominal voltage of EUT is 230V. EUT stopped operation and could / could not be reset by operator at kV

of Line . No false alarms or other malfunctions were observed during or after the test. The acceptance

criteria were met, and the EUT passed the test.


Page: 90 of 97


Description : Voltage Dips Test Setup


Description : Voltage Dips Test Setup


Page: 91 of 97

14. Attachment EUT Photograph

(1) EUT Photo (M/N: MS-1228)



Page: 92 of 97




Page: 93 of 97


(6) EUT Photo ( M/N:MS-1337)


Page: 94 of 97




Page: 95 of 97




Page: 96 of 97

(11) EUT Photo

(12) EUT Photo


Page: 97 of 97

(13) EUT Photo

089009r-itcep07v04-rpt-.l.p-notebook ms-1228, ms-1337

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